Murray et al., 1981 - Google Patents
Ejection dynamics and electronic processes governing secondary particle emission in SIMSMurray et al., 1981
- Document ID
- 3009531837543737448
- Author
- Murray P
- Rabalais J
- Publication year
- Publication venue
- Journal of the American Chemical Society
External Links
Snippet
A qualitative model for secondary particle emission from simple materials based on the ejection dynamics and electronic charge exchange processes occurring during sputtering is developed andapplied to the interpretationof specific cluster types observed in secondary …
- 238000000034 method 0 title abstract description 59
Classifications
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- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
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