[go: up one dir, main page]

Swindlehurst et al., 2019 - Google Patents

An 8-bit 10-GHz 21-mW time-interleaved SAR ADC with grouped DAC capacitors and dual-path bootstrapped switch

Swindlehurst et al., 2019

Document ID
2992884049440109767
Author
Swindlehurst E
Jensen H
Petrie A
Song Y
Kuan Y
Chang M
Wu J
Chiang S
Publication year
Publication venue
IEEE Solid-State Circuits Letters

External Links

Snippet

An 8-bit 10-GHz 8× time-interleaved SAR ADC in 28-nm CMOS incorporates an aggressively scaled DAC with grouped capacitors in a symmetrical comb structure to afford a threefold reduction in the bottom-plate parasitic capacitance. A dual-path bootstrapped …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain
    • H03M1/066—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain by continuously permuting the elements used, i.e. dynamic element matching
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
    • H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0626—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by filtering
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
    • H03M1/682—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits both converters being of the unary decoded type
    • H03M1/685—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits both converters being of the unary decoded type the quantisation value generators of both converters being arranged in a common two-dimensional array
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0614—Continuously compensating for, or preventing, undesired influence of physical parameters of harmonic distortion
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0863—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of switching transients, e.g. glitches
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE

Similar Documents

Publication Publication Date Title
Swindlehurst et al. An 8-bit 10-GHz 21-mW time-interleaved SAR ADC with grouped DAC capacitors and dual-path bootstrapped switch
Kull et al. A 24–72-GS/s 8-b time-interleaved SAR ADC with 2.0–3.3-pJ/conversion and> 30 dB SNDR at Nyquist in 14-nm CMOS FinFET
Huang et al. A non-interleaved 12-b 330-MS/s pipelined-SAR ADC with PVT-stabilized dynamic amplifier achieving sub-1-dB SNDR variation
Devarajan et al. A 12-b 10-GS/s interleaved pipeline ADC in 28-nm CMOS technology
Nam et al. A 12-bit 1.6, 3.2, and 6.4 GS/s 4-b/cycle time-interleaved SAR ADC with dual reference shifting and interpolation
Doris et al. A 480 mW 2.6 GS/s 10b time-interleaved ADC with 48.5 dB SNDR up to Nyquist in 65 nm CMOS
Min et al. A 69-mW 10-bit 80-MSample/s pipelined CMOS ADC
Swindlehurst et al. An 8-bit 10-GHz 21-mW time-interleaved SAR ADC with grouped DAC capacitors and dual-path bootstrapped switch
Huang et al. A 1.2-GS/s 8-bit two-step SAR ADC in 65-nm CMOS with passive residue transfer
O'Sullivan et al. A 12-bit 320-MSample/s current-steering CMOS D/A converter in 0.44 mm/sup 2
Kim et al. A 10-b, 100-ms/s cmos a/d converter
Wu et al. A 12-bit, 300-MS/s single-channel pipelined-SAR ADC with an open-loop MDAC
Yu et al. A 1-V 1.25-GS/S 8-bit self-calibrated flash ADC in 90-nm digital CMOS
Kim et al. A 65 nm CMOS 7b 2 GS/s 20.7 mW flash ADC with cascaded latch interpolation
Levski et al. A 1-$\mu $ s Ramp Time 12-bit Column-Parallel Flash TDC-Interpolated Single-Slope ADC With Digital Delay-Element Calibration
Moon et al. A 9.1-ENOB 6-mW 10-bit 500-MS/s pipelined-SAR ADC with current-mode residue processing in 28-nm CMOS
Zhu et al. A 38-GS/s 7-bit pipelined-SAR ADC with speed-enhanced bootstrapped switch and output level shifting technique in 22-nm FinFET
El-Chammas et al. 15.8 90dB-SFDR 14b 500MS/S BiCMOS switched-current pipelined ADC
Akkaya et al. An 8-bit 800 MS/s loop-unrolled SAR ADC with common-mode adaptive background offset calibration in 28 nm FDSOI
Gulati et al. A highly integrated CMOS analog baseband transceiver with 180 MSPS 13-bit pipelined CMOS ADC and dual 12-bit DACs
US11101814B2 (en) Time-interleaved successive approximation register analog to digital converter with grouped digital to analog capacitors
Wang et al. A 43.6-dB SNDR 1-GS/s 3.2-mW SAR ADC with background-calibrated fine and coarse comparators in 28-nm CMOS
Ferragina et al. Gain and offset mismatch calibration in time-interleaved multipath A/D sigma-delta modulators
Kumar et al. A 0.065-mm 2 19.8-mW single-channel calibration-free 12-b 600-MS/s ADC in 28-nm UTBB FD-SOI using FBB
Chen et al. A 3GS/s highly linear energy efficient constant-slope based voltage-to-time converter