Granda et al., 2015 - Google Patents
What do we know about the defect types detected in conceptual models?Granda et al., 2015
View PDF- Document ID
- 2730362356232853286
- Author
- Granda M
- Condori-Fernández N
- Vos T
- Pastor O
- Publication year
- Publication venue
- 2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS)
External Links
Snippet
In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level …
- 238000004458 analytical method 0 abstract description 15
Classifications
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- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
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