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Humeres et al., 2008 - Google Patents

The use of XPS spectra for the study of reaction mechanisms: the atom inventory method

Humeres et al., 2008

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Document ID
2267216863529162468
Author
Humeres E
de Castro K
Moreira R
Schreiner W
Aliev A
Canle M
Santaballa J
Fernandez I
Publication year
Publication venue
Journal of Physical Organic Chemistry

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X‐ray photoelectron spectroscopy (XPS) allows the analysis of the surface atomic composition of a solid and can be used for mechanistic studies of solid–gas and solid–liquid reactions. The change of atomic composition of a surface after a reaction can be calculated …
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