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Shazli et al., 2010 - Google Patents

Using boolean satisfiability for computing soft error rates in early design stages

Shazli et al., 2010

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Document ID
17903866935100558779
Author
Shazli S
Tahoori M
Publication year
Publication venue
Microelectronics Reliability

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Snippet

Soft errors, due to cosmic radiations, are one of the major reliability barriers for VLSI designs. The vulnerability of such systems to soft errors grows exponentially with technology scaling. To meet reliability constraints in a cost-effective way, it is critical to assess soft error …
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Classifications

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