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Zjajo, 2013 - Google Patents

Random process variation in deep-submicron CMOS

Zjajo, 2013

Document ID
1720095038485922428
Author
Zjajo A
Publication year
Publication venue
Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms

External Links

Snippet

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key parameters affecting performance of integrated circuits. Although scaling made controlling extrinsic variability more complex, nonetheless, the most …
Continue reading at link.springer.com (other versions)

Classifications

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    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
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