[go: up one dir, main page]

Van Silfhout et al., 2020 - Google Patents

White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window

Van Silfhout et al., 2020

View HTML
Document ID
164982405613211622
Author
Van Silfhout R
Pothin D
Martin T
Publication year
Publication venue
Synchrotron Radiation

External Links

Snippet

Collecting back-scattered X-rays from vacuum windows using a pinhole X-ray camera provides an efficient and reliable method of measuring the beam shape and position of the white synchrotron beam. In this paper, measurements are presented that were conducted at …
Continue reading at journals.iucr.org (HTML) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and forming a picture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24495—Signal processing, e.g. mixing of two or more signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes

Similar Documents

Publication Publication Date Title
Stampanoni et al. TOMCAT: A beamline for TOmographic Microscopy and Coherent rAdiology experimenTs
Alkire et al. Design of a vacuum-compatible high-precision monochromatic beam-position monitor for use with synchrotron radiation from 5 to 25 keV
JP5350478B2 (en) Apparatus including direct impact detector and secondary detector used in electron microscope
Zhao et al. CCD camera as feasible large-area-size x-ray detector for x-ray fluorescence spectroscopy and imaging
JP2019035744A (en) Diffraction pattern detection in transmission type charged particle microscope
Valdivia et al. Implementation of a Talbot–Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser
JP2025087750A (en) Method for manufacturing a charged particle detector
Van Silfhout et al. White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window
Gao et al. Absolute calibration of a time-resolved high resolution x-ray spectrometer for the National Ignition Facility
Kummer et al. Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines
Send et al. Energy-dispersive Laue diffraction by means of a frame-store pnCCD
JP4757383B2 (en) CCD camera for transmission electron microscope
Tate et al. Area x-ray detector based on a lens-coupled charge-coupled device
Nowak et al. Six-circle diffractometer with atmosphere-and temperature-controlled sample stage and area and line detectors for use in the G2 experimental station at CHESS
Houghton et al. A direct experimental comparison of single-crystal CVD diamond and silicon carbide X-ray beam position monitors
Van Silfhout et al. In situ high-speed synchrotron X-ray beam profiling and position monitoring
Marchal et al. Synchrotron applications of pixel and strip detectors at Diamond Light Source
Renner et al. Design and performance of the ALS diagnostic beamline
Zaluzec et al. Two-dimensional CCD arrays as parallel detectors in electron-energy-loss and x-ray wavelength-dispersive spectroscopy
Kyele et al. A transparent two-dimensional in situ beam-position and profile monitor for synchrotron X-ray beamlines
Taya et al. Development of a parallel detection and processing system using a multidetector array for wave field restoration in scanning transmission electron microscopy
Kim et al. The early development of a combined micro-and full-field X-ray fluorescence analysis system using white X-rays at PLS-II
Walker et al. Development of an operando characterization stage for multi-modal synchrotron x-ray experiments
Kashyap et al. Characterization of pyrocarbon coated materials using laboratory based x-ray phase contrast imaging technique
JP3663439B2 (en) X-ray imaging apparatus and method