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Taatizadeh, 2017 - Google Patents

On Using Hardware Assertion Checkers for Bit-flip Detection in Post-Silicon Validation

Taatizadeh, 2017

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Document ID
15985741917791879438
Author
Taatizadeh P
Publication year

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Snippet

With the rising demand for integrating more features in a single product, modern designs feature more and more functionality on a single die. The complexity resulted from this growth makes it more difficult to guarantee that all errors are detected and fixed before the product …
Continue reading at macsphere.mcmaster.ca (PDF) (other versions)

Classifications

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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
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    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
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