[go: up one dir, main page]

Kuo et al., 2006 - Google Patents

A period tracking based on-chip sinusoidal jitter extraction technique

Kuo et al., 2006

View PDF
Document ID
15873150721770448474
Author
Kuo C
Huang J
Publication year
Publication venue
24th IEEE VLSI Test Symposium

External Links

Snippet

In this paper, an on-chip sinusoidal jitter extraction technique based on period tracking is presented. The proposed technique is a viable on-chip solution. It utilizes a variable delay line and a phase comparator to track the signal's cycle lengths without external reference …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; Arrangements for supplying electrical power along data transmission lines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio Measuring jitter, i.e. phase noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L7/00—Arrangements for synchronising receiver with transmitter
    • H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods

Similar Documents

Publication Publication Date Title
US7158899B2 (en) Circuit and method for measuring jitter of high speed signals
Chan et al. A jitter characterization system using a component-invariant Vernier delay line
JP4989840B2 (en) Capture and evaluate high-speed data streams
US8024142B1 (en) Method and system for analyzing signal waveforms
JPWO2007123055A1 (en) Test apparatus, test method, jitter filter circuit, and jitter filter method
US7085668B2 (en) Time measurement method using quadrature sine waves
Levine et al. High-resolution flash time-to-digital conversion and calibration for system-on-chip testing
WO2008009316A1 (en) Undersampling of a repetitive signal for measuring transistion times to reconstruct an analog waveform
Kuo et al. A period tracking based on-chip sinusoidal jitter extraction technique
US6931349B2 (en) Jitter measuring system in high speed data output device and total jitter measuring method
Jeeradit et al. Characterizing sampling aperture of clocked comparators
US20070250279A1 (en) Digital data signal analysis by evaluating sampled values in conjunction with signal bit values
US20060020412A1 (en) Analog waveform information from binary sampled measurements
EP1847843B1 (en) Digital data sampling by applying a plurality of time delayed trigger signals
Cheng et al. Recent advances in analog, mixed-signal, and RF testing
US7778319B2 (en) Jitter measuring apparatus, jitter measuring method and test apparatus
US8068538B2 (en) Jitter measuring apparatus, jitter measuring method and test apparatus
Jiang et al. A 2.5-GHz built-in jitter measurement system in a serial-link transceiver
US20120102353A1 (en) Data processing apparatus, data processing system, measurement system, data processing method, measurement method, electronic device and recording medium
EP1845385B1 (en) Time interval analysis of digital data
Liang et al. Jitter injection for on-chip jitter measurement in PI-based CDRs
Ishida et al. On-chip circuit for measuring data jitter in the time or frequency domain
Ong et al. A scalable on-chip jitter extraction technique
Ichiyama et al. Novel CMOS circuits to measure data-dependent jitter, random jitter, and sinusoidal jitter in real time
CN115327191B (en) A circuit and method for improving the test accuracy of chip testing equipment