Lu et al., 2017 - Google Patents
High-performance double-gate $\alpha $-InGaZnO ISFET pH sensor using a HfO2 gate dielectricLu et al., 2017
- Document ID
- 15299475077520280892
- Author
- Lu C
- Hou T
- Pan T
- Publication year
- Publication venue
- IEEE Transactions on Electron Devices
External Links
Snippet
In this paper, we present a high-performance double-gate (DG) amorphous indium-gallium- zinc-oxide (α-InGaZnO) ion-sensitive field-effect transistor (ISFET) using three HfO 2 gate dielectric thicknesses as a top gate (TG). The DG structure α-InGaZnO TFTs with a 40-nm TG …
- CJNBYAVZURUTKZ-UHFFFAOYSA-N hafnium(IV) oxide 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O=[Hf]=O 0 title abstract description 3
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- G01N33/48—Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
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- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
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