[go: up one dir, main page]

Schulz, 1950 - Google Patents

An interferometric method for accurate thickness measurements of thin evaporated films

Schulz, 1950

View HTML
Document ID
14932684830052482027
Author
Schulz L
Publication year
Publication venue
Journal of the Optical Society of America

External Links

Snippet

A method is described in which a Fabry-Perot interferometer is used to measure the thickness of uniform thin films to an accuracy of±15A. The separation of the D-lines of sodium light is used as a standard of length. The method is evaluated by comparison with …
Continue reading at opg.optica.org (HTML) (other versions)

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B6/00Light guides
    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B27/00Other optical systems; Other optical apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colour
    • G01J3/12Generating the spectrum; Monochromators
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B21/00Microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B3/00Simple or compound lenses
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/30Information retrieval; Database structures therefor; File system structures therefor

Similar Documents

Publication Publication Date Title
Zernike A precision method for measuring small phase differences
Peck A new principle in interferometer design
Ramsay Automatic control of the spacing of Fabry–Perot interferometers
Post Characteristics of the series interferometer
Kagarise et al. Simple Interferometer for Dispersion Measurements of Liquids in the 2–22 μ Region
Schulz An interferometric method for accurate thickness measurements of thin evaporated films
Hariharan et al. Triangular path macro-interferometer
Rank et al. Problem of phase variation with wavelength in dielectric films. Extension of interferometric standards into the infrared
Koehler Multiple-Beam Fringes of Equal Chromatic Order. Part I. Phase Change Considerations
Ennos et al. Birefringence of natural quartz
Tolansky The measurement of thin film thickness by interferometry
Fochs A method of determining concurrently the thickness and refractive index of a thin film or Lamina
Stroke Interferometry with rotation-insensitive “corner-cube” systems and lasers
Hariharan et al. New gauge interferometer
Burns et al. Effect of thin-film thickness on Abelès-type index measurements
Lang et al. Resolution limits in multiple-beam interferometry
Hariharan et al. Half-shade setting system for the Michelson interferometer
Saunders In-line interferometer
Mooney et al. Etalon used in Series with a Michelson Interferometer
Stewart Polarization interferometer for the determination of spectral modulation transfer functions of monochromators
Forrest et al. Autocollimating spectrometer
Michelson Instrument Section On the Limit of Accuracy on Optical Measurement
Osterberg et al. Modified method of Fizeau fringes for thickness measurements
Hariharan et al. Achromatic fringes formed in a triangular path interferometer
Saunders An Alignment Interferometer