Sugo et al., 2016 - Google Patents
A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connectionsSugo et al., 2016
- Document ID
- 148874672627531411
- Author
- Sugo H
- Wakashima S
- Kuroda R
- Yamashita Y
- Sumi H
- Wang T
- Chou P
- Hsu M
- Sugawa S
- Publication year
- Publication venue
- 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)
External Links
Snippet
An almost 100% temporal aperture (dead-time free) global shutter (GS) stacked CMOS image sensor (CIS) with in-pixel lateral overflow integration capacitor (LOFIC), ADC and DRAM is developed using pixel-wise connections. The prototype chip with 6.6 µm-pitch VGA …
- 229920002574 CR-39 0 title abstract description 18
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/374—Addressed sensors, e.g. MOS or CMOS sensors
- H04N5/3745—Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N5/37452—Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising additional storage means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/374—Addressed sensors, e.g. MOS or CMOS sensors
- H04N5/3745—Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N5/37457—Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising amplifiers shared between a plurality of pixels, e.g. at least one part of the amplifier has to be on the sensor array itself
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/351—Control of the SSIS depending on the scene, e.g. brightness or motion in the scene
- H04N5/355—Control of the dynamic range
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/378—Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems
- H04N3/10—Scanning details of television systems by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/357—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N5/359—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N5/3597—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels being the residual charges remaining after reading an image, e.g. ghost images or after images
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems
- H04N3/10—Scanning details of television systems by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/1506—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Sugo et al. | A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections | |
| US11595600B2 (en) | Method, apparatus and system providing a storage gate pixel with high dynamic range | |
| US8026969B2 (en) | Pixel for boosting pixel reset voltage | |
| US10566379B2 (en) | Image sensor with a gated storage node linked to transfer gate | |
| US7728892B2 (en) | Image sensor with a capacitive storage node linked to transfer gate | |
| US7829832B2 (en) | Method for operating a pixel cell using multiple pulses to a transistor transfer gate | |
| US8558931B2 (en) | Method and image sensor pixel without address transistor | |
| US20050110093A1 (en) | Anti-blooming storage pixel | |
| US20120200752A1 (en) | Solid-state image pickup device | |
| US7612819B2 (en) | CMOS image sensor and method of operating the same | |
| CN102007594A (en) | Globally reset image sensor pixels | |
| CN117293150B (en) | High dynamic range CMOS image sensor pixels | |
| Takahashi et al. | A 4.1 Mpix 280fps stacked CMOS image sensor with array-parallel ADC architecture for region control | |
| US20210084247A1 (en) | Cmos image sensor and method of operating pixel array by cmos image sensor | |
| US20090008685A1 (en) | Image Sensor and Controlling Method Thereof | |
| US11282891B2 (en) | Image sensor with a gated storage node linked to transfer gate | |
| Belenky et al. | Global shutter CMOS image sensor with wide dynamic range | |
| US20220060646A1 (en) | Solid-state imaging apparatus and electronic device | |
| CN116112815B (en) | Pixel circuit, CMOS image sensor and control method | |
| Chu et al. | An Extremely High-Speed and Low-Power Digital Pixel Sensor with Advanced Sensor Architecture | |
| Ji et al. | A CMOS image sensor for low light applications | |
| US20050237404A1 (en) | Jfet charge control device for an imager pixel | |
| Kuroda et al. | A dead-time free global shutter stacked CMOS image sensor with in-pixel LOFIC and ADC using pixel-wise connections | |
| Sarhangnejad | Per-Pixel Coded-Exposure CMOS Image Sensors | |
| Fish et al. | Low Power CMOS Imager Circuits |