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Liao et al., 2003 - Google Patents

New observance and analysis of various guard-ring structures on latch-up hardness by backside photo emission image

Liao et al., 2003

Document ID
14884673865377050606
Author
Liao S
Niou C
Chien K
Guo A
Dong W
Huang C
Publication year
Publication venue
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.

External Links

Snippet

In this paper, the influence of different guard-ring structures on latch-up susceptibility has been studied on four standard test structures fabricated on a standard twin well CMOS process. The test structures include the non-, single, double, and multi-double guard-rings …
Continue reading at ieeexplore.ieee.org (other versions)

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