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Plett, 2009 - Google Patents

Efficient battery pack state estimation using bar-delta filtering

Plett, 2009

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Document ID
14656074047012336838
Author
Plett G
Publication year
Publication venue
EVS24 international battery, hybrid and fuel cell electric vehicle symposium

External Links

Snippet

Accurate state-of-charge (SOC) estimation is critical for xEV applications but involves considerable computational complexity. We argue that battery-pack SOC is undefined, and that individual estimates of all cell SOCs are required to compute available power and …
Continue reading at mocha-java.uccs.edu (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
    • G01R31/3644—Various constructional arrangements
    • G01R31/3648—Various constructional arrangements comprising digital calculation means, e.g. for performing an algorithm
    • G01R31/3651—Software aspects, e.g. battery modeling, using look-up tables, neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
    • G01R31/3644—Various constructional arrangements
    • G01R31/3675—Various constructional arrangements for compensating for temperature or ageing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
    • G01R31/3644—Various constructional arrangements
    • G01R31/3662—Various constructional arrangements involving measuring the internal battery impedance, conductance or related variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
    • G01R31/3606—Monitoring, i.e. measuring or determining some variables continuously or repeatedly over time, e.g. current, voltage, temperature, state-of-charge [SoC] or state-of-health [SoH]
    • G01R31/3624—Monitoring, i.e. measuring or determining some variables continuously or repeatedly over time, e.g. current, voltage, temperature, state-of-charge [SoC] or state-of-health [SoH] based on combined voltage and current measurement
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations

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