[go: up one dir, main page]

Macfarlane et al., 2000 - Google Patents

Linewidth of a resistively shunted high-temperature-superconductor Josephson heterodyne oscillator

Macfarlane et al., 2000

Document ID
11914843500049069343
Author
Macfarlane J
Hao L
Peden D
Gallop J
Publication year
Publication venue
Applied Physics Letters

External Links

Snippet

High-temperature-superconducting (HTS) resistively shunted superconducting quantum interference devices, consisting of two yttrium–barium–copper–oxide (YBCO) grain boundary junctions shunted by gold-film resistors of∼ 20 μΩ, have been prepared and …
Continue reading at pubs.aip.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G01R33/0354—SQUIDS
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/22—Devices comprising a junction of dissimilar materials, e.g. Josephson-effect devices
    • H01L39/223—Josephson-effect devices
    • H01L39/225—Josephson-effect devices comprising high Tc ceramic materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/34—Constructional details, e.g. resonators, specially adapted to MR
    • G01R33/34015—Temperature-controlled RF coils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/02—Details
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y10S505/843—Electrical
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

Similar Documents

Publication Publication Date Title
Tsai et al. High-precision test of the universality of the Josephson voltage-frequency relation
Koelle et al. High-transition-temperature superconducting quantum interference devices
Hamilton et al. Operation of NIST Josephson array voltage standards
Ohkubo et al. Standard measurement method for normal state resistance and critical current of resistively shunted Josephson junctions
KR100546017B1 (en) Acquisition method of frequency information
Macfarlane et al. Linewidth of a resistively shunted high-temperature-superconductor Josephson heterodyne oscillator
Mygind et al. Properties of autonomous and injection locked flux flow oscillators
Divin et al. Terahertz spectral analysis by ac Josephson effect in high-T/sub c/bicrystal junctions
Niemeyer et al. Present status of Josephson voltage metrology
Konopka et al. Emission of microwaves from dc-biased Y-Ba-Cu-O thin films
Niemeyer et al. High precision measurement of a possible resistive slope of Josephson array voltage steps
Lee et al. Nonequilibrium Microwave Emission from DC-Biased High Tc YBa2Cu3O7-y Junctions
Bi et al. Radiation linewidth of phase‐locked distributed array in the submillimeter wave range
Niemeyer et al. A New Josephson Voltage Standard with Tunnel-Junction Series Arrays
US3622881A (en) Voltage measuring apparatus employing a josephson junction
Macfarlane et al. Simulation and measurement of HTS Josephson heterodyne oscillator
Polushkin et al. Investigation of rf SQUID Behavior at Liquid Nitrogen Temperatures
Ivanyuta et al. Microwave detection using Josephson junction arrays integrated in a resonator
LEE et al. Comparison of Josephson Microwave Self-Radiation and Linewidth Properties in Various YBa 2 Cu 3 O y Grain Boundary Junctions
Lo-Hive et al. Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays
Hao et al. Characterization of YBCO/Au/YBCO resistors for HTS Josephson noise thermometry
Niemeyer et al. Comparison of Josephson series-array voltage standards
Kirschman et al. Current noise in weak superconductors
Caputo et al. Radiation emission from triangular arrays of Josephson junctions
Zhuang et al. Negative resistance effects in NbN HEB devices