Ionel et al., 2023 - Google Patents
Considerations on Boundary Scan integration in industrial dedicated test stationsIonel et al., 2023
- Document ID
- 11408768971798654178
- Author
- Ionel R
- Dărăbuț A
- Căleanu C
- Publication year
- Publication venue
- 2023 46th International Spring Seminar on Electronics Technology (ISSE)
External Links
Snippet
This paper describes a Boundary Scan Test (BST, IEEE Std. 1149.1) test station designed and implemented with a requirement of full parallel evaluation for 8 Devices Under Test (DUTs). The suggested guidelines can function as reference for the implementation of an …
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