Do et al., 1999 - Google Patents
Application of parallel factor analysis and x‐ray photoelectron spectroscopy to the initial stages in oxidation of aluminium. I. The Al 2p photoelectron lineDo et al., 1999
View PDF- Document ID
- 11314060324980218524
- Author
- Do T
- McIntyre N
- Harshman R
- Lundy M
- Splinter S
- Publication year
- Publication venue
- Surface and interface analysis
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Snippet
Three‐way parallel factor analysis (PARAFAC) has been used to decompose a set of x‐ray photoelectron spectroscopy (XPS) spectra that result during the oxidation of aluminium surfaces. The Al 2p core‐level photoelectron lines have been used to follow oxide film …
- 238000004833 X-ray photoelectron spectroscopy 0 title abstract description 55
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