Lin et al., 2023 - Google Patents
Fine-Pitch $30\\mu\mathrm {m} $ Cu-Cu Bonding using Electroless Nano-AgLin et al., 2023
- Document ID
- 10202639748243671928
- Author
- Lin Y
- Chiang C
- Hung Y
- Kao C
- Hsieh P
- Hsu C
- Lin I
- Publication year
- Publication venue
- 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
External Links
Snippet
The development of direct Cu-to-Cu bonding technologies has attracted increasing attention due to the increased requirement for advanced high-density packaging. For Cu-Cu bonding, the main issue is that the surface roughness of the Cu pad is not uniform, and the uneven …
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13005—Structure
- H01L2224/13009—Bump connector integrally formed with a via connection of the semiconductor or solid-state body
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
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