[go: up one dir, main page]

Crama et al., 2002 - Google Patents

Initial estimates of Wiener and Hammerstein systems using multisine excitation

Crama et al., 2002

Document ID
10134363645823868810
Author
Crama P
Schoukens J
Publication year
Publication venue
IEEE transactions on Instrumentation and Measurement

External Links

Snippet

This paper presents fast methods to get an initial estimate of Wiener or Hammerstein systems. For this purpose, a special excitation signal is introduced: the random phase multisine. Its properties are briefly stated and used in both methods. The methods are tested …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/165—Spectrum analysis; Fourier analysis using filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio Measuring jitter, i.e. phase noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
    • G01R33/46—NMR spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response

Similar Documents

Publication Publication Date Title
Crama et al. Initial estimates of Wiener and Hammerstein systems using multisine excitation
Novak et al. Nonlinear system identification using exponential swept-sine signal
Chen et al. Extended real model of Kalman filter for time-varying harmonics estimation
Tomic et al. A new power system digital harmonic analyzer
Schoukens et al. Robustness issues of the best linear approximation of a nonlinear system
CN107102255B (en) Single ADC acquisition channel dynamic characteristic test method
US7099417B2 (en) Trace video filtering using wavelet de-noising techniques
Ando et al. An exact direct method of sinusoidal parameter estimation derived from finite Fourier integral of differential equation
Bjorsell et al. Measuring Volterra kernels of analog-to-digital converters using a stepped three-tone scan
Liu A wavelet based model for on-line tracking of power system harmonics using Kalman filtering
Crama et al. First estimates of Wiener and Hammerstein systems using multisine excitation
Rabijns et al. Spectrally pure excitation signals: Only a dream?
Belega et al. Statistical performance of the effective-number-of-bit estimators provided by the sine-fitting algorithms
Borkowski LIDFT-the DFT linear interpolation method
Candy Multipaper Spectral Estimation: An Alternative to the Welch Periodogram Approach
Rees et al. Design and application of non-binary low peak factor signals for system dynamic measurement
Attivissimo et al. A study on nonlinear averagings to perform the characterization of power spectral density estimation algorithms
Blanchette et al. An F-test for polynomial frequency modulation
Moschitta et al. Measurements of transient phenomena with digital oscilloscopes
CN114184099B (en) A method and device for measuring fuze delay
Van Moer et al. An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer
CN117665423A (en) Phase noise measurement apparatus and method
Ong et al. Multisine with optimal phase-plane uniformity for ADC testing
Takeuchi et al. Performance evaluation of a minicomputer
Yurasova et al. Dynamic measurement errors correction adaptive to noises of a sensor