WO2024139572A1 - Optical microphone and manufacturing method therefor - Google Patents
Optical microphone and manufacturing method therefor Download PDFInfo
- Publication number
- WO2024139572A1 WO2024139572A1 PCT/CN2023/125475 CN2023125475W WO2024139572A1 WO 2024139572 A1 WO2024139572 A1 WO 2024139572A1 CN 2023125475 W CN2023125475 W CN 2023125475W WO 2024139572 A1 WO2024139572 A1 WO 2024139572A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- layer
- grating
- vibration film
- electrode
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 67
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 25
- 238000006243 chemical reaction Methods 0.000 claims abstract description 47
- 239000000758 substrate Substances 0.000 claims description 119
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 29
- 239000000463 material Substances 0.000 claims description 29
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 29
- 238000000034 method Methods 0.000 claims description 25
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 21
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 21
- 238000005530 etching Methods 0.000 claims description 19
- 239000000853 adhesive Substances 0.000 claims description 10
- 230000001070 adhesive effect Effects 0.000 claims description 10
- 150000002500 ions Chemical class 0.000 claims description 10
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000010703 silicon Substances 0.000 claims description 7
- 239000007788 liquid Substances 0.000 claims description 6
- 238000000059 patterning Methods 0.000 claims description 6
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 5
- 229920005591 polysilicon Polymers 0.000 claims description 5
- 238000005452 bending Methods 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 4
- 238000001704 evaporation Methods 0.000 claims description 4
- 230000003647 oxidation Effects 0.000 claims description 3
- 238000007254 oxidation reaction Methods 0.000 claims description 3
- 238000005229 chemical vapour deposition Methods 0.000 claims description 2
- 239000012528 membrane Substances 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 16
- 230000035945 sensitivity Effects 0.000 description 10
- 239000002184 metal Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000001154 acute effect Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R23/00—Transducers other than those covered by groups H04R9/00 - H04R21/00
- H04R23/008—Transducers other than those covered by groups H04R9/00 - H04R21/00 using optical signals for detecting or generating sound
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R31/00—Apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R2231/00—Details of apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor covered by H04R31/00, not provided for in its subgroups
- H04R2231/003—Manufacturing aspects of the outer suspension of loudspeaker or microphone diaphragms or of their connecting aspects to said diaphragms
Definitions
- an optical microphone comprising:
- the photoelectric conversion component is arranged on the side of the grating away from the vibration film, and the photoelectric conversion component includes a light source and a detector.
- the light source is used to emit light toward the microphone diaphragm
- the detector is used to receive the light reflected from the microphone diaphragm and convert the optical signal into an electrical signal.
- the microphone diaphragm and the photoelectric conversion component are connected so that the photoelectric conversion component is arranged on a side of the grating away from the vibration film to obtain an optical microphone.
- FIG. 1 is a schematic diagram of the structure of an optical microphone provided in an embodiment of the present application.
- FIG. 4 is a bottom view schematic diagram of the first inorganic layer provided in an embodiment of the present application.
- FIG. 5 is a schematic diagram of a partial structure of a photoelectric conversion component provided in an embodiment of the present application.
- FIG. 6 is a schematic top view of a photoelectric conversion component provided in an embodiment of the present application.
- FIG. 7 is a flow chart of a method for manufacturing an optical microphone provided in an embodiment of the present application.
- FIG8 is a schematic diagram after a first inorganic layer is formed on a first substrate according to an embodiment of the present application.
- FIG. 10 is a schematic diagram after a first electrode is formed on a first inorganic layer according to an embodiment of the present application.
- FIG. 11 is a schematic diagram after a sacrificial layer is deposited on a first electrode and a first substrate according to an embodiment of the present application.
- FIG. 12 is a schematic diagram of the sacrificial layer after being patterned according to an embodiment of the present application.
- FIG. 13 is a schematic diagram of a vibrating film formed on a sacrificial layer according to an embodiment of the present application.
- FIG. 15 is a schematic diagram of the first substrate after patterning according to an embodiment of the present application.
- FIG. 16 is a schematic diagram of etching the sacrificial layer using an etching solution according to an embodiment of the present application.
- FIG. 18 is a schematic diagram of a light source disposed on a second substrate according to an embodiment of the present application.
- a first reflection layer 61 is provided on the side of the grating 225 away from the vibration film 40, and a second reflection layer 62 is provided on the side of the vibration film 40 facing the grating 225.
- the reflectivity of the surface of the vibration film 40 and the surface of the grating 225 to light can be increased respectively, thereby enhancing the intensity of the light signal received by the detector 330, which is conducive to improving the sensitivity of the detector 330 when detecting changes in the light signal, thereby improving the sensitivity of the optical microphone 100.
- the material of the first reflective layer 61 and the material of the second reflective layer 62 are both metals, such as gold (Au).
- the thickness of the first reflective layer 61 and the thickness of the second reflective layer 62 can both be 30 nanometers to 80 nanometers, such as 30 nanometers, 40 nanometers, 50 nanometers, 60 nanometers, 70 nanometers, 80 nanometers, etc.
- the support member 30 plays a role in supporting and fixing the vibration film 40.
- the support member 30 may be ring-shaped.
- the first inorganic layer 20 includes a first silicon oxide layer 21 and a first silicon nitride layer 22 sequentially stacked on a first substrate 10 , a grating 225 is located on the first silicon nitride layer 22 , and a hollow 215 is formed on the first silicon oxide layer 21 corresponding to the position of the grating 225 .
- the material of the first substrate 10 includes silicon, and the first silicon oxide layer 21 can be obtained by performing thermal oxidation treatment on the surface of the first substrate 10. It can be understood that since the first silicon oxide layer 21 is directly grown on the first substrate 10, the first silicon oxide layer 21 has a strong adhesion to the first substrate 10.
- a bending portion 42 bent toward the first inorganic layer 20 is provided on the vibration film 40, and the orthographic projection of the bending portion 42 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10. It can be understood that by providing the bending portion 42 bent toward the first inorganic layer 20 on the vibration film 40, the elasticity and flexibility of the vibration film 40 can be improved, and when the vibration film 40 vibrates under the action of sound waves, the vibration film 40 can be prevented from breaking during the vibration process, thereby improving the service life of the vibration film 40.
- a first electrode layer 51 is provided on a side of the first inorganic layer 20 away from the first substrate 10
- a second electrode layer 52 is provided on a side of the vibration film 40 away from the first inorganic layer 20.
- the thickness of the first silicon oxide layer 21 may be 100 nm to 900 nm, for example, 100 nm, 200 nm, 300 nm, 400 nm, 500 nm, 600 nm, 700 nm, 800 nm,
- the thickness of silicon nitride can be 650 nanometers to 950 nanometers, for example, 650 nanometers, 700 nanometers, 750 nanometers, 800 nanometers, 850 nanometers, 900 nanometers, 950 nanometers, etc.
- the thickness of the first electrode layer 51 may be in the range of 100 nanometers to 500 nanometers, for example, 100 nanometers, 200 nanometers, 300 nanometers, 400 nanometers, 500 nanometers, etc.
- a sound inlet hole 41 is provided on the vibrating film 40, and the sound inlet hole 41 penetrates the vibrating film 40.
- the orthographic projection of the sound inlet hole 41 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10. It should be noted that by providing the sound inlet hole 41 on the vibrating film 40, sound waves can enter the gap between the vibrating film 40 and the grating 225 from the sound inlet hole 41, thereby causing the vibration of the vibrating film 40.
- the sound inlet hole 41 can be circular.
- the first inorganic layer 20 is provided with a vent hole 23, the vent hole 23 penetrates the first inorganic layer 20, and the orthographic projection of the vent hole 23 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10; it should be noted that by providing the vent hole 23 on the first inorganic layer 20, it is more conducive to the transmission of sound waves into the optical microphone 100, improving the vibration effect of the vibration film 40, and thus improving the sensitivity of the optical microphone 100. It can be understood that, since the area of the vent hole 23 is related to the transmission effect of the sound wave, the best sound wave transmission effect can be obtained by adjusting the area of the vent hole 23, thereby improving the vibration effect of the vibration film 40.
- the first inorganic layer 20 may include a grating 225, a first enclosure 25 surrounding the grating 225, a second enclosure 26 disposed outside the second enclosure 26, and a plurality of support arms 24 connecting the first enclosure 25 and the second enclosure 26, wherein the plurality of support arms 24 define a plurality of air holes 23 between the first enclosure 25 and the second enclosure 26.
- the grating 225 is composed of a first silicon nitride layer 22
- the first surrounding frame 25 , the second surrounding frame 26 and the plurality of support arms 24 are all composed of a first silicon oxide layer 21 and a first silicon nitride layer 22 which are stacked.
- the plurality may be two or more, for example, three, four, five, six, seven, eight, etc.
- the overall shape of the grating 225 may be circular, and the diameter of the grating 225 may be 100 microns to 900 microns, for example, 100 microns, 200 microns, 300 microns, 400 microns, 500 microns, 600 microns, 700 microns, 800 microns, 900 microns, etc.
- the overall shape of the vibration film 40 may be circular, and the diameter of the vibration film 40 may be 100 mm to 900 mm, for example, 100 mm, 200 mm, 300 mm, 400 mm, 500 mm, 600 mm, 700 mm, 800 mm, 900 mm, etc.
- the detector 330 may include a photodiode.
- a vibration film 40 is formed on the sacrificial layer 31 ;
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- Manufacturing & Machinery (AREA)
- Electrostatic, Electromagnetic, Magneto- Strictive, And Variable-Resistance Transducers (AREA)
Abstract
An optical microphone and a manufacturing method therefor. The optical microphone comprises a microphone diaphragm and a photoelectric conversion assembly; the microphone diaphragm comprises a vibration membrane and a grating which are spaced apart from each other; and a sound inlet hole is formed in the vibration membrane. The photoelectric conversion assembly is provided on the side of the grating away from the vibration film; the photoelectric conversion assembly comprises a light source and a detector; the light source is used for emitting light towards the microphone diaphragm; and the detector is used for receiving the light reflected from the microphone diaphragm and converting an optical signal into an electric signal.
Description
本申请要求于2022年12月28日提交中国专利局、申请号为202211701711.2、发明名称为“光学麦克风及其制作方法”的中国专利申请的优先权,其全部内容通过引用结合在本申请中。This application claims the priority of the Chinese patent application filed with the China Patent Office on December 28, 2022, with application number 202211701711.2 and invention name “Optical Microphone and Its Manufacturing Method”, the entire contents of which are incorporated by reference in this application.
本申请涉及电子技术领域,特别涉及一种光学麦克风及其制作方法。The present application relates to the field of electronic technology, and in particular to an optical microphone and a method for manufacturing the same.
麦克风是一种人们日常生活中较为常见的声音信号采集工具,随着麦克风技术的逐步发展,麦克风的应用领域也不断扩大,已经开始承担诸如声学传感、语音识别、声呐探测、超声无损检测等多种新型应用,在民生、科研、医疗、工业、国防等领域都有了不可忽视的作用。Microphone is a common sound signal collection tool in people's daily life. With the gradual development of microphone technology, the application fields of microphones are also expanding. It has begun to undertake many new applications such as acoustic sensing, speech recognition, sonar detection, ultrasonic non-destructive testing, etc., and has played an important role in people's livelihood, scientific research, medical care, industry, national defense and other fields.
传统的麦克风包括背板和与背板间隔设置的振膜,振膜在声波的作用下发生振动,通过改变背板与振膜之间的距离产生电压变化,从而实现声电转换。A traditional microphone includes a back plate and a diaphragm spaced apart from the back plate. The diaphragm vibrates under the action of sound waves, and voltage changes are generated by changing the distance between the back plate and the diaphragm, thereby achieving sound-to-electricity conversion.
发明内容Summary of the invention
本申请实施例提供一种光学麦克风及其制作方法,该光学麦克风可以将声信号转换为光信号,再将光信号转换为电信号,从而实现声电转换,并且,该光学麦克风的灵敏度大于100mV/Pa,远超传统麦克风的灵敏度,另外,该光学麦克风的体积较小,便于携带。An embodiment of the present application provides an optical microphone and a method for manufacturing the same. The optical microphone can convert an acoustic signal into an optical signal, and then convert the optical signal into an electrical signal, thereby realizing acoustic-electrical conversion. Moreover, the sensitivity of the optical microphone is greater than 100mV/Pa, far exceeding the sensitivity of traditional microphones. In addition, the optical microphone is small in size and easy to carry.
第一方面,本申请实施例提供一种光学麦克风,包括:In a first aspect, an embodiment of the present application provides an optical microphone, comprising:
麦克风振膜,所述麦克风振膜包括间隔设置的振动薄膜和光栅,所述振动薄膜上设有进声孔;A microphone diaphragm, the microphone diaphragm comprising a vibrating film and a grating arranged at intervals, and a sound inlet hole is provided on the vibrating film;
光电转换组件,设置于所述光栅远离所述振动薄膜的一侧,所述光电转换组件包括光源和探测器,所述光源用于朝向所述麦克风振膜发射光线,所述探测器用于接收从所述麦克风振膜反射回的光线并且将光信号转换为电信号。The photoelectric conversion component is arranged on the side of the grating away from the vibration film, and the photoelectric conversion component includes a light source and a detector. The light source is used to emit light toward the microphone diaphragm, and the detector is used to receive the light reflected from the microphone diaphragm and convert the optical signal into an electrical signal.
第二方面,本申请实施例提供一种光学麦克风的制作方法,包括:In a second aspect, an embodiment of the present application provides a method for manufacturing an optical microphone, comprising:
提供麦克风振膜以及提供光电转换组件,所述麦克风振膜包括间隔设置的振动薄膜和光栅,所述振动薄膜上设有进声孔;所述光电转换组件包括光源和探测器,所述光源用于朝向所述麦克风振膜发射光线,所述探测器用于接收从所述麦克风振膜反射回的光线并且将光信号转换为电信号;
A microphone diaphragm and a photoelectric conversion component are provided, wherein the microphone diaphragm includes a vibration film and a grating arranged at intervals, and a sound inlet hole is provided on the vibration film; the photoelectric conversion component includes a light source and a detector, wherein the light source is used to emit light toward the microphone diaphragm, and the detector is used to receive light reflected from the microphone diaphragm and convert the light signal into an electrical signal;
对所述麦克风振膜和所述光电转换组件进行连接,使所述光电转换组件设置于所述光栅远离所述振动薄膜的一侧,得到光学麦克风。The microphone diaphragm and the photoelectric conversion component are connected so that the photoelectric conversion component is arranged on a side of the grating away from the vibration film to obtain an optical microphone.
为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单的介绍。In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following is a brief introduction to the drawings required for describing the embodiments.
图1为本申请实施例提供的光学麦克风的结构示意图。FIG. 1 is a schematic diagram of the structure of an optical microphone provided in an embodiment of the present application.
图2为本申请实施例提供的麦克风振膜的结构示意图。FIG. 2 is a schematic diagram of the structure of a microphone diaphragm provided in an embodiment of the present application.
图3为本申请实施例提供的振动薄膜的俯视示意图。FIG. 3 is a schematic top view of a vibrating film provided in an embodiment of the present application.
图4为本申请实施例提供的第一无机层的仰视示意图。FIG. 4 is a bottom view schematic diagram of the first inorganic layer provided in an embodiment of the present application.
图5为本申请实施例提供的光电转换组件的部分结构的示意图。FIG. 5 is a schematic diagram of a partial structure of a photoelectric conversion component provided in an embodiment of the present application.
图6为本申请实施例提供的光电转换组件的俯视示意图。FIG. 6 is a schematic top view of a photoelectric conversion component provided in an embodiment of the present application.
图7为本申请实施例提供的光学麦克风的制作方法的流程图。FIG. 7 is a flow chart of a method for manufacturing an optical microphone provided in an embodiment of the present application.
图8为本申请实施例提供的在第一衬底上形成第一无机层之后的示意图。FIG8 is a schematic diagram after a first inorganic layer is formed on a first substrate according to an embodiment of the present application.
图9为本申请实施例提供的对第一无机层进行图形化处理之后的示意图。FIG. 9 is a schematic diagram of the first inorganic layer after patterning according to an embodiment of the present application.
图10为本申请实施例提供的在第一无机层上形成第一电极之后的示意图。FIG. 10 is a schematic diagram after a first electrode is formed on a first inorganic layer according to an embodiment of the present application.
图11为本申请实施例提供的在第一电极和第一衬底上沉积牺牲层之后的示意图。FIG. 11 is a schematic diagram after a sacrificial layer is deposited on a first electrode and a first substrate according to an embodiment of the present application.
图12为本申请实施例提供的对牺牲层进行图形化处理之后的示意图。FIG. 12 is a schematic diagram of the sacrificial layer after being patterned according to an embodiment of the present application.
图13为本申请实施例提供的在牺牲层上形成振动薄膜之后的示意图。FIG. 13 is a schematic diagram of a vibrating film formed on a sacrificial layer according to an embodiment of the present application.
图14为本申请实施例提供的在振动薄膜上形成第二电极之后的示意图。FIG. 14 is a schematic diagram of a second electrode formed on a vibrating film according to an embodiment of the present application.
图15为本申请实施例提供的对第一衬底进行图形化处理之后的示意图。FIG. 15 is a schematic diagram of the first substrate after patterning according to an embodiment of the present application.
图16为本申请实施例提供的采用蚀刻液对牺牲层进行刻蚀之后的示意图。FIG. 16 is a schematic diagram of etching the sacrificial layer using an etching solution according to an embodiment of the present application.
图17为本申请实施例提供的在第二衬底上设置光源之前的示意图。FIG. 17 is a schematic diagram before a light source is arranged on a second substrate according to an embodiment of the present application.
图18为本申请实施例提供的在第二衬底上设置光源之后的示意图。FIG. 18 is a schematic diagram of a light source disposed on a second substrate according to an embodiment of the present application.
下面将结合本申请实施例中的附图1至附图18,对本申请实施例中的技术方案进行清楚、完整的描述。显然,所描述的实施例仅仅是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。
The following will be combined with Figures 1 to 18 in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of this application.
请参阅图1,图1为本申请实施例提供的光学麦克风的结构示意图。本申请实施例提供一种光学麦克风100,包括麦克风振膜200和光电转换组件300,麦克风振膜200包括间隔设置的振动薄膜40和光栅225,振动薄膜40上设有进声孔41;光电转换组件300设置于光栅225远离振动薄膜40的一侧,光电转换组件300包括光源320和探测器330,光源320用于朝向麦克风振膜200发射光线,探测器330用于接收从麦克风振膜200反射回的光线并且将光信号转换为电信号。Please refer to Figure 1, which is a schematic diagram of the structure of an optical microphone provided in an embodiment of the present application. The embodiment of the present application provides an optical microphone 100, including a microphone diaphragm 200 and a photoelectric conversion component 300, wherein the microphone diaphragm 200 includes a vibration film 40 and a grating 225 arranged at intervals, and a sound inlet hole 41 is provided on the vibration film 40; the photoelectric conversion component 300 is arranged on a side of the grating 225 away from the vibration film 40, and the photoelectric conversion component 300 includes a light source 320 and a detector 330, wherein the light source 320 is used to emit light toward the microphone diaphragm 200, and the detector 330 is used to receive light reflected from the microphone diaphragm 200 and convert the light signal into an electrical signal.
本申请实施例提供的光学麦克风100在使用时,声波通过振动薄膜40的进声孔41进入并且使振动薄膜40发生振动,从而可以改变振动薄膜40与光栅225之间的距离,光源320发出的光线一部分经光栅225衍射后照射于振动薄膜40的表面并经振动薄膜40反射回探测器330,一部分经光栅225表面直接反射回探测器330,这两部分光线到达探测器330时具有一定的光程差和相位差,该光程差和相位差与振动薄膜40和光栅225之间的距离有关,从而可以根据探测器330检测到的光信号的光程差和相位差等相关参数推算出振动薄膜40和光栅225之间的距离的变化幅度,进而依据振动薄膜40和光栅225之间的距离的变化幅度推算出声信号的变化幅度,实现声信号与光信号之间的转换;在性能方面,本申请实施例提供的光学麦克风100的灵敏度大于100mV/Pa,远超传统麦克风的灵敏度,并且,该光学麦克风100的体积较小,便于携带。When the optical microphone 100 provided in the embodiment of the present application is in use, sound waves enter through the sound inlet hole 41 of the vibrating film 40 and cause the vibrating film 40 to vibrate, thereby changing the distance between the vibrating film 40 and the grating 225. A portion of the light emitted by the light source 320 is diffracted by the grating 225 and irradiates the surface of the vibrating film 40 and is reflected back to the detector 330 by the vibrating film 40, and a portion of the light is directly reflected back to the detector 330 by the surface of the grating 225. When these two portions of light arrive at the detector 330, they have a certain optical path difference and phase difference. The optical path difference and phase difference are different from the distance between the vibrating film 40 and the grating 225. The optical microphone 100 of the embodiment of the present application has a sensitivity greater than 100 mV/Pa, which is far higher than the sensitivity of a conventional microphone. In addition, the optical microphone 100 is small in size and easy to carry.
请参阅图1与图2,光栅225背离振动薄膜40的一侧设有第一反射层61,振动薄膜40朝向光栅225的一侧设有第二反射层62。可以理解的是,通过在光栅225背离振动薄膜40一侧设置第一反射层61以及在振动薄膜40朝向光栅225的一侧设置第二反射层62,可以分别提高振动薄膜40表面和光栅225表面对光线的反射率,进而增强探测器330所接收的光信号的强度,有利于提升探测器330在检测光信号变化时的灵敏度,进而提升光学麦克风100的灵敏度。Referring to FIG. 1 and FIG. 2 , a first reflection layer 61 is provided on the side of the grating 225 away from the vibration film 40, and a second reflection layer 62 is provided on the side of the vibration film 40 facing the grating 225. It can be understood that by providing the first reflection layer 61 on the side of the grating 225 away from the vibration film 40 and the second reflection layer 62 on the side of the vibration film 40 facing the grating 225, the reflectivity of the surface of the vibration film 40 and the surface of the grating 225 to light can be increased respectively, thereby enhancing the intensity of the light signal received by the detector 330, which is conducive to improving the sensitivity of the detector 330 when detecting changes in the light signal, thereby improving the sensitivity of the optical microphone 100.
示例性地,第一反射层61的材料和第二反射层62的材料均为金属,例如金(Au)。示例性地,第一反射层61的厚度和第二反射层62的厚度可以均为30纳米~80纳米,例如30纳米、40纳米、50纳米、60纳米、70纳米、80纳米等。Exemplarily, the material of the first reflective layer 61 and the material of the second reflective layer 62 are both metals, such as gold (Au). Exemplarily, the thickness of the first reflective layer 61 and the thickness of the second reflective layer 62 can both be 30 nanometers to 80 nanometers, such as 30 nanometers, 40 nanometers, 50 nanometers, 60 nanometers, 70 nanometers, 80 nanometers, etc.
请参阅图1与图2,麦克风振膜200包括依次层叠设置的第一衬底10、第一无机层20、支撑件30以及振动薄膜40,第一无机层20设置于第一衬底10上,支撑件30设置于第一无机层20和振动薄膜40之间,第一无机层20包括光栅225,支撑件30对应于光栅225的外围设置。
Please refer to Figures 1 and 2. The microphone diaphragm 200 includes a first substrate 10, a first inorganic layer 20, a support member 30 and a vibration film 40 which are stacked in sequence. The first inorganic layer 20 is arranged on the first substrate 10, the support member 30 is arranged between the first inorganic layer 20 and the vibration film 40, the first inorganic layer 20 includes a grating 225, and the support member 30 is arranged corresponding to the periphery of the grating 225.
可以理解的是,支撑件30起到支撑和固定振动薄膜40的作用,示例性地,支撑件30可以呈环形。It can be understood that the support member 30 plays a role in supporting and fixing the vibration film 40. For example, the support member 30 may be ring-shaped.
请参阅图1与图2,第一无机层20包括在第一衬底10上依次层叠设置的第一氧化硅层21和第一氮化硅层22,光栅225位于第一氮化硅层22上,第一氧化硅层21上对应于光栅225的位置形成镂空215。示例性地,第一衬底10的材料包括硅,第一氧化硅层21可以通过对第一衬底10的表面进行热氧化处理得到,可以理解的是,由于第一氧化硅层21是直接生长于第一衬底10上的,因此第一氧化硅层21与第一衬底10之间具有较强的粘接力,另外,由于第一氧化硅层21与第一氮化硅层22之间的粘接力大于第一氮化硅层22与第一衬底10(硅)之间的粘接力,也即是说,本申请实施例通过在第一衬底10和第一氮化硅层22之间设置第一氧化硅层21,可以提升第一氮化硅层22与第一衬底10之间的附着力;另外,本申请实施例选择氮化硅作为光栅225的材料,由于氮化硅具有较好的刚性,因此可以提升光栅225的强度。1 and 2 , the first inorganic layer 20 includes a first silicon oxide layer 21 and a first silicon nitride layer 22 sequentially stacked on a first substrate 10 , a grating 225 is located on the first silicon nitride layer 22 , and a hollow 215 is formed on the first silicon oxide layer 21 corresponding to the position of the grating 225 . Exemplarily, the material of the first substrate 10 includes silicon, and the first silicon oxide layer 21 can be obtained by performing thermal oxidation treatment on the surface of the first substrate 10. It can be understood that since the first silicon oxide layer 21 is directly grown on the first substrate 10, the first silicon oxide layer 21 has a strong adhesion to the first substrate 10. In addition, since the adhesion between the first silicon oxide layer 21 and the first silicon nitride layer 22 is greater than the adhesion between the first silicon nitride layer 22 and the first substrate 10 (silicon), that is to say, the embodiment of the present application can improve the adhesion between the first silicon nitride layer 22 and the first substrate 10 by arranging the first silicon oxide layer 21 between the first substrate 10 and the first silicon nitride layer 22; in addition, the embodiment of the present application selects silicon nitride as the material of the grating 225. Since silicon nitride has good rigidity, the strength of the grating 225 can be improved.
请参阅图1与图2,振动薄膜40上设有朝向第一无机层20弯曲的弯曲部42,弯曲部42在第一衬底10上的正投影位于支撑件30在第一衬底10上的正投影和光栅225在第一衬底10上的正投影之间。可以理解的是,通过在振动薄膜40上设置朝向第一无机层20弯曲的弯曲部42,可以提升振动薄膜40的弹性和柔韧性,当振动薄膜40在声波的作用下发生振动时,可以避免振动薄膜40在振动的过程中发生断裂,从而可以提升振动薄膜40的使用寿命。Referring to FIG. 1 and FIG. 2 , a bending portion 42 bent toward the first inorganic layer 20 is provided on the vibration film 40, and the orthographic projection of the bending portion 42 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10. It can be understood that by providing the bending portion 42 bent toward the first inorganic layer 20 on the vibration film 40, the elasticity and flexibility of the vibration film 40 can be improved, and when the vibration film 40 vibrates under the action of sound waves, the vibration film 40 can be prevented from breaking during the vibration process, thereby improving the service life of the vibration film 40.
请参阅图1与图2,第一无机层20背离第一衬底10的一侧设有第一电极层51,振动薄膜40背离第一无机层20的一侧设有第二电极层52。需要说明的是,本申请实施例通过在第一无机层20背离第一衬底10的一侧设置第一电极层51以及在振动薄膜40背离第一无机层20的一侧设置第二电极层52,可以通过在第一电极层51和/或第二电极层52上施加电压,使得第一电极层51和第二电极层52之间形成电压差,进而可以使第一电极层51和第二电极层52在电压差的作用下相互靠近或远离,从而实现对第一电极层51和第二电极层52之间的距离的调节,进而可以实现对振动薄膜40和光栅225之间的距离的调节,通过调节振动薄膜40和光栅225之间的距离,可以调整光学麦克风100的灵敏度,使得光学麦克风100达到最佳灵敏度。Referring to FIG. 1 and FIG. 2 , a first electrode layer 51 is provided on a side of the first inorganic layer 20 away from the first substrate 10, and a second electrode layer 52 is provided on a side of the vibration film 40 away from the first inorganic layer 20. It should be noted that, in the embodiment of the present application, by providing the first electrode layer 51 on a side of the first inorganic layer 20 away from the first substrate 10 and providing the second electrode layer 52 on a side of the vibration film 40 away from the first inorganic layer 20, a voltage difference can be formed between the first electrode layer 51 and the second electrode layer 52 by applying a voltage to the first electrode layer 51 and/or the second electrode layer 52, and the first electrode layer 51 and the second electrode layer 52 can be moved closer to or away from each other under the action of the voltage difference, thereby adjusting the distance between the first electrode layer 51 and the second electrode layer 52, and thus adjusting the distance between the vibration film 40 and the grating 225. By adjusting the distance between the vibration film 40 and the grating 225, the sensitivity of the optical microphone 100 can be adjusted, so that the optical microphone 100 achieves the best sensitivity.
示例性地,第一无机层20中,第一氧化硅层21的厚度可以为100纳米~900纳米,例如100纳米、200纳米、300纳米、400纳米、500纳米、600纳米、700纳米、800纳米、
900纳米等,氮化硅的厚度可以为650纳米~950纳米,例如650纳米、700纳米、750纳米、800纳米、850纳米、900纳米、950纳米等。For example, in the first inorganic layer 20, the thickness of the first silicon oxide layer 21 may be 100 nm to 900 nm, for example, 100 nm, 200 nm, 300 nm, 400 nm, 500 nm, 600 nm, 700 nm, 800 nm, The thickness of silicon nitride can be 650 nanometers to 950 nanometers, for example, 650 nanometers, 700 nanometers, 750 nanometers, 800 nanometers, 850 nanometers, 900 nanometers, 950 nanometers, etc.
示例性地,支撑件30的厚度可以为2微米~8微米,例如2微米、4微米、6微米、8微米等。Exemplarily, the thickness of the support member 30 may be 2 micrometers to 8 micrometers, such as 2 micrometers, 4 micrometers, 6 micrometers, 8 micrometers, etc.
示例性地,振动薄膜40的厚度可以为600纳米~1000纳米,例如600纳米、700纳米、800纳米、900纳米、1000纳米等。Exemplarily, the thickness of the vibration film 40 may be 600 nanometers to 1000 nanometers, such as 600 nanometers, 700 nanometers, 800 nanometers, 900 nanometers, 1000 nanometers, etc.
示例性地,第一电极层51的材料和第二电极层52的材料均包括多晶硅,例如低温多晶硅(LTPS),示例性地,多晶硅中还可以掺杂N型杂质(例如磷)或P型杂质(例如硼)。Exemplarily, the material of the first electrode layer 51 and the material of the second electrode layer 52 both include polysilicon, such as low temperature polysilicon (LTPS). Exemplarily, the polysilicon may also be doped with N-type impurities (such as phosphorus) or P-type impurities (such as boron).
示例性地,第一电极层51的厚度可以为100纳米~500纳米,例如100纳米、200纳米、300纳米、400纳米、500纳米等。Exemplarily, the thickness of the first electrode layer 51 may be in the range of 100 nanometers to 500 nanometers, for example, 100 nanometers, 200 nanometers, 300 nanometers, 400 nanometers, 500 nanometers, etc.
示例性地,第二电极层52的厚度可以为1微米~3微米,例如1微米、2微米、3微米等。Exemplarily, the thickness of the second electrode layer 52 may be 1 micrometer to 3 micrometers, such as 1 micrometer, 2 micrometers, 3 micrometers, etc.
示例性地,振动薄膜40的材料可以包括氮化硅,由于氮化硅具有较好的刚性,因此提升振动薄膜40的强度。For example, the material of the vibration film 40 may include silicon nitride. Since silicon nitride has good rigidity, the strength of the vibration film 40 is improved.
请参阅图1与图3,振动薄膜40上设有进声孔41,进声孔41贯穿振动薄膜40,进声孔41在第一衬底10上的正投影位于支撑件30在第一衬底10上的正投影和光栅225在第一衬底10上的正投影之间。需要说明的是,通过在振动薄膜40上设置进声孔41,可以使声波从该进声孔41进入振动薄膜40与光栅225之间的间隙,进而引起振动薄膜40的振动。如图3所示,进声孔41可以为圆形。Referring to FIG. 1 and FIG. 3 , a sound inlet hole 41 is provided on the vibrating film 40, and the sound inlet hole 41 penetrates the vibrating film 40. The orthographic projection of the sound inlet hole 41 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10. It should be noted that by providing the sound inlet hole 41 on the vibrating film 40, sound waves can enter the gap between the vibrating film 40 and the grating 225 from the sound inlet hole 41, thereby causing the vibration of the vibrating film 40. As shown in FIG. 3 , the sound inlet hole 41 can be circular.
请参阅图1、图2和图4,第一无机层20上设有透气孔23,透气孔23贯穿第一无机层20,透气孔23在第一衬底10上的正投影位于支撑件30在第一衬底10上的正投影和光栅225在第一衬底10上的正投影之间;需要说明的是,通过在第一无机层20上设置透气孔23,更有利于声波传入光学麦克风100中,提升振动薄膜40的振动效果,进而提升光学麦克风100的灵敏度。可以理解的是,由于透气孔23的面积与声波的传输效果有关,因此可以通过调整透气孔23的面积来获得最佳的声波传输效果,从而提升振动薄膜40的振动效果。Please refer to FIG. 1 , FIG. 2 and FIG. 4 , the first inorganic layer 20 is provided with a vent hole 23, the vent hole 23 penetrates the first inorganic layer 20, and the orthographic projection of the vent hole 23 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10; it should be noted that by providing the vent hole 23 on the first inorganic layer 20, it is more conducive to the transmission of sound waves into the optical microphone 100, improving the vibration effect of the vibration film 40, and thus improving the sensitivity of the optical microphone 100. It can be understood that, since the area of the vent hole 23 is related to the transmission effect of the sound wave, the best sound wave transmission effect can be obtained by adjusting the area of the vent hole 23, thereby improving the vibration effect of the vibration film 40.
请结合图4,第一无机层20可以包括光栅225、环绕光栅225设置的第一围框25、设置于第二围框26外围的第二围框26以及连接第一围框25和第二围框26的多个支撑臂24,多个支撑臂24在第一围框25和第二围框26之间限定出多个透气孔23。请结合图1与图2,
光栅225由第一氮化硅层22构成,第一围框25、第二围框26以及多个支撑臂24均由层叠设置的第一氧化硅层21和第一氮化硅层22构成。4 , the first inorganic layer 20 may include a grating 225, a first enclosure 25 surrounding the grating 225, a second enclosure 26 disposed outside the second enclosure 26, and a plurality of support arms 24 connecting the first enclosure 25 and the second enclosure 26, wherein the plurality of support arms 24 define a plurality of air holes 23 between the first enclosure 25 and the second enclosure 26. The grating 225 is composed of a first silicon nitride layer 22 , and the first surrounding frame 25 , the second surrounding frame 26 and the plurality of support arms 24 are all composed of a first silicon oxide layer 21 and a first silicon nitride layer 22 which are stacked.
需要说明的是,本申请实施例中,多个可以为两个或两个以上,例如三个、四个、五个、六个、七个、八个等。It should be noted that, in the embodiments of the present application, the plurality may be two or more, for example, three, four, five, six, seven, eight, etc.
请结合图4,光栅225的整体形状可以呈圆形,光栅225的直径可以为100微米~900微米,例如100微米、200微米、300微米、400微米、500微米、600微米、700微米、800微米、900微米等。4 , the overall shape of the grating 225 may be circular, and the diameter of the grating 225 may be 100 microns to 900 microns, for example, 100 microns, 200 microns, 300 microns, 400 microns, 500 microns, 600 microns, 700 microns, 800 microns, 900 microns, etc.
示例性地,光栅225包括间隔设置的多个栅片,每个栅片的宽度为1微米~3微米(例如1微米、2微米、3微米等),任意两个栅片之间的间隔宽度为1微米~3微米(例如1微米、2微米、3微米等),光栅225的周期(1个栅片的宽度与1个间隔的宽度之和)为2微米~6微米(例如2微米、3微米、4微米、5微米、6微米等)。Exemplarily, the grating 225 includes a plurality of grating plates arranged at intervals, the width of each grating plate is 1 micron to 3 microns (for example, 1 micron, 2 microns, 3 microns, etc.), the width of the interval between any two grating plates is 1 micron to 3 microns (for example, 1 micron, 2 microns, 3 microns, etc.), and the period of the grating 225 (the sum of the width of one grating plate and the width of one interval) is 2 microns to 6 microns (for example, 2 microns, 3 microns, 4 microns, 5 microns, 6 microns, etc.).
请结合图3,振动薄膜40的整体形状可以呈圆形,振动薄膜40的直径可以为100毫米~900毫米,例如100毫米、200毫米、300毫米、400毫米、500毫米、600毫米、700毫米、800毫米、900毫米等。3 , the overall shape of the vibration film 40 may be circular, and the diameter of the vibration film 40 may be 100 mm to 900 mm, for example, 100 mm, 200 mm, 300 mm, 400 mm, 500 mm, 600 mm, 700 mm, 800 mm, 900 mm, etc.
请参阅图5和图6,光电转换组件300还包括第二衬底310,光源320和探测器330均设置于第二衬底310上。Please refer to FIG. 5 and FIG. 6 , the photoelectric conversion component 300 further includes a second substrate 310 , and the light source 320 and the detector 330 are both disposed on the second substrate 310 .
示例性地,第二衬底310的材料包括硅。Exemplarily, the material of the second substrate 310 includes silicon.
示例性地,探测器330可以包括光电二极管。By way of example, the detector 330 may include a photodiode.
示例性地,光源320可以为垂直腔表面发射激光器(VCSEL)。Exemplarily, the light source 320 may be a vertical cavity surface emitting laser (VCSEL).
示例性地,光源320的整体形状可以为圆形或矩形(长方形或正方形),圆形的直径、矩形的长或宽可以各自为100微米~900微米,例如100微米、200微米、300微米、400微米、500微米、600微米、700微米、800微米、900微米等。Exemplarily, the overall shape of the light source 320 can be circular or rectangular (rectangular or square), and the diameter of the circle and the length or width of the rectangle can each be 100 microns to 900 microns, for example, 100 microns, 200 microns, 300 microns, 400 microns, 500 microns, 600 microns, 700 microns, 800 microns, 900 microns, etc.
示例性地,探测器330的整体形状可以为圆形或矩形(长方形或正方形),圆形的直径、矩形的长或宽可以各自为100微米~900微米,例如100微米、200微米、300微米、400微米、500微米、600微米、700微米、800微米、900微米等。Exemplarily, the overall shape of the detector 330 can be circular or rectangular (rectangular or square), and the diameter of the circle and the length or width of the rectangle can each be 100 microns to 900 microns, for example, 100 microns, 200 microns, 300 microns, 400 microns, 500 microns, 600 microns, 700 microns, 800 microns, 900 microns, etc.
请参阅图5和图6,第二衬底310上还设有第一连接件321、第二连接件322、驱动电路323和第一接地电极324,驱动电路323与第二连接件322电性连接,第一接地电极324与第一连接件321电性连接;光源320具有第一电极和第二电极;光源320的第一电极与第一连接件321连接,光源320的第二电极通过导线325与第二连接件322连接。可以理
解的是,驱动电路323用于对光源320施加驱动电压,从而驱动光源320朝向光栅225发射光线。Referring to FIG. 5 and FIG. 6 , the second substrate 310 is further provided with a first connector 321, a second connector 322, a driving circuit 323 and a first grounding electrode 324. The driving circuit 323 is electrically connected to the second connector 322, and the first grounding electrode 324 is electrically connected to the first connector 321. The light source 320 has a first electrode and a second electrode. The first electrode of the light source 320 is connected to the first connector 321, and the second electrode of the light source 320 is connected to the second connector 322 via a wire 325. It is understood that the driving circuit 323 is used to apply a driving voltage to the light source 320 , thereby driving the light source 320 to emit light toward the grating 225 .
请参阅图5和图6,第二衬底310上设有多个探测器330,第二衬底310上还设有多个滤波电路331、多个放大电路332、差分电路333和第二接地电极334;多个探测器330分别连接多个滤波电路331,多个滤波电路331分别连接多个放大电路332,多个放大电路332均连接至差分电路333,多个探测器330均连接至第二接地电极334。Please refer to Figures 5 and 6. A plurality of detectors 330 are provided on the second substrate 310. A plurality of filter circuits 331, a plurality of amplifier circuits 332, a differential circuit 333 and a second ground electrode 334 are also provided on the second substrate 310. The plurality of detectors 330 are respectively connected to the plurality of filter circuits 331, the plurality of filter circuits 331 are respectively connected to the plurality of amplifier circuits 332, the plurality of amplifier circuits 332 are all connected to the differential circuit 333, and the plurality of detectors 330 are all connected to the second ground electrode 334.
示例性地,多个探测器330所接收的光信号的强度不同。需要说明的是,探测器330将接收的光信号转换为电信号之后,滤波电路331可以对电信号中的干扰信号进行滤除,降低噪音,放大电路332可以对电信号的强度进行放大,提升检测灵敏度,多个探测器330输出的电信号经过滤除噪音以及放大后接入差分电路333,差分电路333对多个探测器330的电信号进行两两相减,从而进一步滤除干扰信号,具体的,差分电路333的工作原理为:如果多个探测器330的电信号均受到噪音信号干扰,那么噪音信号对多个探测器330的电信号的干扰程度基本相同,那么,通过对两个探测器330的电信号进行相减,将两个电信号的差值作为有效输入信号,可以使噪音信号的输入基本上降低为零,从而达到了抗干扰的目的。Exemplarily, the intensity of the optical signals received by the multiple detectors 330 is different. It should be noted that after the detector 330 converts the received optical signal into an electrical signal, the filter circuit 331 can filter out the interference signal in the electrical signal to reduce the noise, and the amplifier circuit 332 can amplify the intensity of the electrical signal to improve the detection sensitivity. The electrical signals output by the multiple detectors 330 are connected to the differential circuit 333 after filtering out the noise and amplifying. The differential circuit 333 performs two-by-two subtraction on the electrical signals of the multiple detectors 330, thereby further filtering out the interference signal. Specifically, the working principle of the differential circuit 333 is: if the electrical signals of the multiple detectors 330 are all interfered by the noise signal, then the interference degree of the noise signal on the electrical signals of the multiple detectors 330 is basically the same, then, by subtracting the electrical signals of the two detectors 330 and taking the difference of the two electrical signals as the effective input signal, the input of the noise signal can be basically reduced to zero, thereby achieving the purpose of anti-interference.
示例性地,驱动电路323、滤波电路331、放大电路332和差分电路333可以通过在第二衬底310上注入N型离子或P型离子形成。Exemplarily, the driving circuit 323 , the filtering circuit 331 , the amplifying circuit 332 , and the differential circuit 333 may be formed by implanting N-type ions or P-type ions on the second substrate 310 .
示例性地,第一接地电极324和第二接地电极334可以通过电镀的方式形成,第一接地电极324的材料和第二接地电极334的材料可以均为金属,例如铜。Exemplarily, the first ground electrode 324 and the second ground electrode 334 may be formed by electroplating, and the material of the first ground electrode 324 and the material of the second ground electrode 334 may both be metal, such as copper.
示例性地,第一连接件321的材料和第二连接件322的材料可以均为金属,例如锡。Exemplarily, the material of the first connection member 321 and the material of the second connection member 322 may both be metal, such as tin.
请结合图1,光源320的出射光线与光栅225背离振动薄膜40一侧的表面之间为非垂直关系。可以理解的是,当光源320的出射光线与光栅225背离振动薄膜40一侧的表面相互垂直时,光源320的出射光线会被光栅225直接反射回光源320中从而导致光源320被烧毁。1, the outgoing light of the light source 320 is not perpendicular to the surface of the grating 225 on the side away from the vibration film 40. It is understandable that when the outgoing light of the light source 320 is perpendicular to the surface of the grating 225 on the side away from the vibration film 40, the outgoing light of the light source 320 will be directly reflected back to the light source 320 by the grating 225, thereby causing the light source 320 to be burned.
请结合图5,光源320的出光面与第二衬底310之间的夹角为锐角,光源320的发射光线垂直于光源320的出光面。示例性地,第一衬底10和第二衬底310相互平行。在一些实施例中,光源320的出光面与第二衬底310之间的夹角为6°~8°,例如6°、7°、8°等。5, the angle between the light emitting surface of the light source 320 and the second substrate 310 is an acute angle, and the light emitted by the light source 320 is perpendicular to the light emitting surface of the light source 320. Exemplarily, the first substrate 10 and the second substrate 310 are parallel to each other. In some embodiments, the angle between the light emitting surface of the light source 320 and the second substrate 310 is 6° to 8°, for example, 6°, 7°, 8°, etc.
请结合图1,光学麦克风100还包括承载件400,光电转换组件300的第二衬底310与
承载件400连接,麦克风振膜200的第一衬底10通过粘合胶500与承载件400连接,粘合胶500对应光电转换组件300的外围设置。可以看出,光电转换组件300被封闭在由麦克风振膜200、粘合胶500和承载件400围出的空间内,从而可以避免光电转换组件300被外界水氧侵袭,因此可以延长光电转换组件300的使用寿命。示例性地,粘合胶500可以包括环氧树脂。示例性地,承载件400呈平板状,承载件400的材料可以为金属,例如铜。1 , the optical microphone 100 further includes a carrier 400, a second substrate 310 of the photoelectric conversion component 300 and The first substrate 10 of the microphone diaphragm 200 is connected to the carrier 400, and the first substrate 10 of the microphone diaphragm 200 is connected to the carrier 400 through an adhesive 500, and the adhesive 500 is arranged corresponding to the periphery of the photoelectric conversion component 300. It can be seen that the photoelectric conversion component 300 is enclosed in a space surrounded by the microphone diaphragm 200, the adhesive 500 and the carrier 400, so that the photoelectric conversion component 300 can be prevented from being invaded by external water and oxygen, thereby extending the service life of the photoelectric conversion component 300. Exemplarily, the adhesive 500 may include epoxy resin. Exemplarily, the carrier 400 is in the shape of a plate, and the material of the carrier 400 may be metal, such as copper.
示例性地,振动薄膜40和光栅225之间的距离可以为0.5mm~3mm,例如0.5mm、1mm、1.5mm、2mm、2.5mm、3mm等。Exemplarily, the distance between the vibration film 40 and the grating 225 may be 0.5 mm to 3 mm, such as 0.5 mm, 1 mm, 1.5 mm, 2 mm, 2.5 mm, 3 mm, etc.
请参阅图7,图7为本申请实施例提供的光学麦克风的制作方法的流程图。本申请实施例还提供一种光学麦克风的制作方法,可以用于制作上述任一实施例中的光学麦克风100,该制作方法可以包括:Please refer to FIG. 7 , which is a flow chart of a method for manufacturing an optical microphone provided in an embodiment of the present application. The present application also provides a method for manufacturing an optical microphone, which can be used to manufacture the optical microphone 100 in any of the above embodiments. The manufacturing method may include:
S100,提供麦克风振膜以及提供光电转换组件,麦克风振膜包括间隔设置的振动薄膜和光栅,振动薄膜上设有进声孔;光电转换组件包括光源和探测器,光源用于朝向麦克风振膜发射光线,探测器用于接收从麦克风振膜反射回的光线并且将光信号转换为电信号。S100, providing a microphone diaphragm and a photoelectric conversion component, the microphone diaphragm includes a vibration film and a grating arranged at intervals, and the vibration film is provided with a sound inlet hole; the photoelectric conversion component includes a light source and a detector, the light source is used to emit light toward the microphone diaphragm, and the detector is used to receive light reflected from the microphone diaphragm and convert the optical signal into an electrical signal.
S200,对麦克风振膜和光电转换组件进行连接,使光电转换组件设置于光栅远离振动薄膜的一侧,得到光学麦克风。S200, connecting the microphone diaphragm and the photoelectric conversion component, so that the photoelectric conversion component is arranged on the side of the grating away from the vibration film, to obtain an optical microphone.
请参阅图8至图16,“提供麦克风振膜200”具体可以包括:Please refer to FIG. 8 to FIG. 16 , “providing a microphone diaphragm 200 ” may specifically include:
请参阅图8,提供第一衬底10,在第一衬底10上形成第一无机层20,请参阅图9,对第一无机层20进行图形化处理,形成光栅图案201;Referring to FIG. 8 , a first substrate 10 is provided, and a first inorganic layer 20 is formed on the first substrate 10 . Referring to FIG. 9 , the first inorganic layer 20 is patterned to form a grating pattern 201 .
请参阅图10,在第一无机层20上形成第一电极层51;Please refer to FIG. 10 , a first electrode layer 51 is formed on the first inorganic layer 20 ;
请参阅图11,在第一电极层51和第一衬底10上沉积牺牲层31,请参阅图12,对牺牲层31进行图形化处理,在牺牲层31上形成填充部311、支撑部312以及位于支撑部312与填充部311之间的沟槽313,填充部311对应于光栅图案201设置,支撑部312设置于填充部311的外围,沟槽313贯穿牺牲层31并且将支撑部312与填充部311间隔开;Referring to FIG. 11 , a sacrificial layer 31 is deposited on the first electrode layer 51 and the first substrate 10. Referring to FIG. 12 , the sacrificial layer 31 is patterned to form a filling portion 311, a supporting portion 312, and a groove 313 between the supporting portion 312 and the filling portion 311 on the sacrificial layer 31. The filling portion 311 is arranged corresponding to the grating pattern 201, the supporting portion 312 is arranged at the periphery of the filling portion 311, and the groove 313 penetrates the sacrificial layer 31 and separates the supporting portion 312 from the filling portion 311.
请参阅图13,在牺牲层31上形成振动薄膜40;Please refer to FIG. 13 , a vibration film 40 is formed on the sacrificial layer 31 ;
请参阅图14,在振动薄膜40上形成第二电极层52;Please refer to FIG. 14 , a second electrode layer 52 is formed on the vibration film 40 ;
请参阅图15,对第一衬底10进行图形化处理,在第一衬底10上形成对应于光栅图案201的第一缺口27;Please refer to FIG. 15 , the first substrate 10 is patterned to form a first notch 27 corresponding to the grating pattern 201 on the first substrate 10 ;
请参阅图16,采用蚀刻液对牺牲层31进行刻蚀,蚀刻液经由第一缺口27对填充部311进行腐蚀,去除填充部311,在振动薄膜40和光栅图案201之间形成间隙;牺牲层31的
支撑部312未被蚀刻,形成用于支撑振动薄膜40的支撑件30。16, the sacrificial layer 31 is etched by an etching solution, and the etching solution corrodes the filling portion 311 through the first notch 27, removes the filling portion 311, and forms a gap between the vibration film 40 and the grating pattern 201; The support portion 312 is not etched, and forms the support member 30 for supporting the vibration film 40 .
示例性地,第一电极层51的材料和第二电极层52的材料可以均为多晶硅,在一些实施例中,可以采用低压力化学气相沉积法(LPCVD,Low Pressure Chemical Vapor Deposition)来制备第一电极层51和第二电极层52。Illustratively, the material of the first electrode layer 51 and the material of the second electrode layer 52 can both be polysilicon. In some embodiments, the first electrode layer 51 and the second electrode layer 52 can be prepared by low pressure chemical vapor deposition (LPCVD).
请结合图2,在采用蚀刻液对牺牲层31进行刻蚀之后,“提供麦克风振膜200”具体还可以包括:采用蒸镀(例如电子束蒸发)的方法在光栅225背离振动薄膜40的一侧形成第一反射层61以及在振动薄膜40朝向光栅225的一侧形成第二反射层62,以提高光栅225表面和振动薄膜40表面的反射率,示例性地,第一反射层61的材料和第二反射层62的材料均为金属,例如金(Au)。可以理解的是,由于蒸镀的过程中,金属材料以气态的方式移散至光栅225表面形成第一反射层61,并且,气态的金属材料可以穿过光栅225的间隙进而到达振动薄膜40表面形成第二反射层62,也即是说,第一反射层61和第二反射层62可以在同一个蒸镀制程中形成。Please refer to FIG. 2 . After the sacrificial layer 31 is etched with an etching solution, “providing a microphone diaphragm 200 ” may further include: forming a first reflection layer 61 on the side of the grating 225 away from the vibration film 40 and forming a second reflection layer 62 on the side of the vibration film 40 facing the grating 225 by evaporation (e.g., electron beam evaporation) to improve the reflectivity of the surface of the grating 225 and the surface of the vibration film 40. Exemplarily, the material of the first reflection layer 61 and the material of the second reflection layer 62 are both metals, such as gold (Au). It can be understood that, during the evaporation process, the metal material is dispersed in a gaseous state to the surface of the grating 225 to form the first reflection layer 61, and the gaseous metal material can pass through the gap of the grating 225 and then reach the surface of the vibration film 40 to form the second reflection layer 62. That is to say, the first reflection layer 61 and the second reflection layer 62 can be formed in the same evaporation process.
请结合图8与图9,第一衬底10的材料包括硅,第一无机层20包括第一衬底10上依次层叠设置的第一氧化硅层21和第一氮化硅层22。8 and 9 , the material of the first substrate 10 includes silicon, and the first inorganic layer 20 includes a first silicon oxide layer 21 and a first silicon nitride layer 22 which are sequentially stacked on the first substrate 10 .
示例性地,“在第一衬底10上形成第一无机层20”具体可以包括:Exemplarily, “forming a first inorganic layer 20 on a first substrate 10” may specifically include:
对第一衬底10的表面进行氧化处理,得到第一氧化硅层21;The surface of the first substrate 10 is oxidized to obtain a first silicon oxide layer 21;
采用化学气相沉积的方法在第一氧化硅层21上形成第一氮化硅层22。The first silicon nitride layer 22 is formed on the first silicon oxide layer 21 by chemical vapor deposition.
示例性地,可以对第一衬底10的表面进行热氧化处理,以得到第一氧化硅层21。By way of example, a thermal oxidation process may be performed on the surface of the first substrate 10 to obtain the first silicon oxide layer 21 .
示例性地,可以采用低压力化学气相沉积法(LPCVD,Low Pressure Chemical Vapor Deposition)在第一氧化硅层21上形成第一氮化硅层22。For example, a first silicon nitride layer 22 can be formed on the first silicon oxide layer 21 by low pressure chemical vapor deposition (LPCVD).
示例性地,牺牲层31的材料为氧化硅;采用蚀刻液经由第一缺口27对牺牲层31的填充部311进行刻蚀的同时,蚀刻去除光栅图案201表面的第一氧化硅层21。可以理解的是,由于牺牲层31的材料(氧化硅)和第一氧化硅层21相同,因此,牺牲层31和第一氧化硅层21可以采用相同的蚀刻液进行刻蚀。Exemplarily, the material of the sacrificial layer 31 is silicon oxide; while the filling portion 311 of the sacrificial layer 31 is etched through the first notch 27 by an etching solution, the first silicon oxide layer 21 on the surface of the grating pattern 201 is etched away. It is understandable that, since the material (silicon oxide) of the sacrificial layer 31 is the same as that of the first silicon oxide layer 21, the sacrificial layer 31 and the first silicon oxide layer 21 can be etched by the same etching solution.
示例性地,可以采用化学机械抛光(CMP)的方法去除光栅图案201表面的第一氧化硅层21,从而在第一氧化硅层21上形成对应于光栅225的镂空215。可以理解的是,CMP是化学作用和机械作用相结合的技术,即采用蚀刻液刻蚀以及机械抛光相结合的技术手段来去除光栅图案201表面的第一氧化硅层21。For example, the first silicon oxide layer 21 on the surface of the grating pattern 201 may be removed by chemical mechanical polishing (CMP), thereby forming a hollow 215 corresponding to the grating 225 on the first silicon oxide layer 21. It is understood that CMP is a technology that combines chemical action and mechanical action, that is, the first silicon oxide layer 21 on the surface of the grating pattern 201 is removed by a combination of etching liquid etching and mechanical polishing.
请结合图11,在第一电极层51和第一衬底10上沉积牺牲层31之后,牺牲层31上对
应于透气孔23的位置形成凹槽314,凹槽314未贯穿填充部311,并且凹槽314对应于光栅225的外围设置;11, after the sacrificial layer 31 is deposited on the first electrode layer 51 and the first substrate 10, the sacrificial layer 31 is A groove 314 should be formed at the position of the air hole 23, the groove 314 does not penetrate the filling portion 311, and the groove 314 is arranged corresponding to the periphery of the grating 225;
请结合图13,在牺牲层31上形成振动薄膜40时,振动薄膜40于凹槽314处形成弯曲部42。Referring to FIG. 13 , when the vibration film 40 is formed on the sacrificial layer 31 , the vibration film 40 forms a bent portion 42 at the groove 314 .
请结合图9至图11,由于第一无机层20上透气孔23的位置存在凹陷,因此,在沉积牺牲层31的过程中,沉积材料需要首先填充透气孔23,从而导致牺牲层31上对应于透气孔23的位置的厚度较低,从而相对于周围的区域形成凹槽314。Please refer to Figures 9 to 11. Since there is a depression at the position of the air hole 23 on the first inorganic layer 20, during the deposition of the sacrificial layer 31, the deposition material needs to first fill the air hole 23, resulting in a lower thickness at the position corresponding to the air hole 23 on the sacrificial layer 31, thereby forming a groove 314 relative to the surrounding area.
请结合图8与图9,对第一无机层20进行图形化处理之后,在形成光栅225的同时,还可以在第一无机层20上形成透气孔23,透气孔23贯穿第一无机层20,并且,透气孔23设置于光栅225的外围;8 and 9 , after the first inorganic layer 20 is patterned, while forming the grating 225, a vent hole 23 may be formed on the first inorganic layer 20, the vent hole 23 penetrates the first inorganic layer 20, and the vent hole 23 is disposed at the periphery of the grating 225;
请结合图15,对第一衬底10进行图形化处理之后,在第一衬底10上形成对应于光栅图案201的第一缺口27的同时,在第一衬底10上形成对应于透气孔23的第二缺口28;15 , after the first substrate 10 is patterned, a first notch 27 corresponding to the grating pattern 201 is formed on the first substrate 10 , and a second notch 28 corresponding to the air hole 23 is formed on the first substrate 10 ;
请结合图16,采用蚀刻液对牺牲层31进行刻蚀时,在蚀刻液经由第一缺口27对填充部311进行腐蚀的同时,蚀刻液还经由第二缺口28对填充部311上位于透气孔23内的部分进行腐蚀。16 , when the sacrificial layer 31 is etched with an etching solution, while the etching solution corrodes the filling portion 311 through the first notch 27 , the etching solution also corrodes the portion of the filling portion 311 located within the vent hole 23 through the second notch 28 .
请结合图13与图3,在牺牲层31上形成振动薄膜40之后,对振动薄膜40进行图形化处理,形成进声孔41,进声孔41贯穿振动薄膜40,进声孔41在第一衬底10上的正投影位于支撑件30在第一衬底10上的正投影和光栅225在第一衬底10上的正投影之间。Please combine Figure 13 with Figure 3. After the vibration film 40 is formed on the sacrificial layer 31, the vibration film 40 is patterned to form a sound inlet hole 41. The sound inlet hole 41 penetrates the vibration film 40. The orthographic projection of the sound inlet hole 41 on the first substrate 10 is located between the orthographic projection of the support member 30 on the first substrate 10 and the orthographic projection of the grating 225 on the first substrate 10.
请结合图5,“提供光电转换组件300”具体可以包括:提供第二衬底310上,在第二衬底310上形成探测器330以及在第二衬底310上设置光源320。Referring to FIG. 5 , “providing a photoelectric conversion component 300 ” may specifically include: providing a second substrate 310 , forming a detector 330 on the second substrate 310 , and arranging a light source 320 on the second substrate 310 .
请结合图5,第二衬底310的材料包括硅,探测器330包括光电二极管;5 , the material of the second substrate 310 includes silicon, and the detector 330 includes a photodiode;
“在第二衬底310上形成探测器330”具体可以包括:在第二衬底310中注入P型离子和N型离子,形成PN结,PN结构成光电二极管。“Forming the detector 330 on the second substrate 310 ” may specifically include: injecting P-type ions and N-type ions into the second substrate 310 to form a PN junction, and the PN junction forms a photodiode.
请结合图6,“提供光电转换组件300”具体还可以包括:Please refer to FIG. 6 , “providing a photoelectric conversion component 300 ” may further include:
在第二衬底310上形成第一连接件321、第二连接件322、驱动电路323和第一接地电极324,驱动电路323与第二连接件322电性连接,第一接地电极324与第一连接件321电性连接;A first connection member 321, a second connection member 322, a driving circuit 323 and a first ground electrode 324 are formed on the second substrate 310, the driving circuit 323 is electrically connected to the second connection member 322, and the first ground electrode 324 is electrically connected to the first connection member 321;
请参阅图17和图18,“在第二衬底310上设置光源320”具体可以包括:提供光源320,光源320具有第一电极和第二电极,使光源320的第一电极与第一连接件321连接,
以及,采用导线325连接光源320的第二电极与第二连接件322。Referring to FIGS. 17 and 18 , “arranging a light source 320 on the second substrate 310 ” may specifically include: providing a light source 320 , wherein the light source 320 has a first electrode and a second electrode, connecting the first electrode of the light source 320 to a first connecting member 321 , Furthermore, a wire 325 is used to connect the second electrode of the light source 320 and the second connecting member 322 .
示例性地,可以采用焊接或键合的方式使光源320的第一电极层51与第一连接件321连接。Exemplarily, the first electrode layer 51 of the light source 320 may be connected to the first connecting member 321 by welding or bonding.
示例性地,可以通过向第二衬底310中注入P型离子或N型离子的方法在第二衬底310上形成驱动电路323。For example, the driving circuit 323 may be formed on the second substrate 310 by implanting P-type ions or N-type ions into the second substrate 310 .
示例性地,可以采用电镀的方法在第二衬底310上形成第一连接件321、第二连接件322和第一接地电极324。By way of example, the first connection member 321 , the second connection member 322 , and the first ground electrode 324 may be formed on the second substrate 310 by electroplating.
示例性地,导线325的材料可以为金属,例如铝(Al)。Exemplarily, the material of the wire 325 may be metal, such as aluminum (Al).
请结合图6,第二衬底310上设有多个探测器330,“提供光电转换组件300”具体还可以包括:在第二衬底310上形成多个滤波电路331、多个放大电路332、差分电路333和第二接地电极334;多个探测器330分别连接多个滤波电路331,多个滤波电路331分别连接多个放大电路332,多个放大电路332均连接至差分电路333,多个探测器330均连接至第二接地电极334。Please refer to Figure 6. A plurality of detectors 330 are provided on the second substrate 310. “Providing a photoelectric conversion component 300” may specifically include: forming a plurality of filter circuits 331, a plurality of amplifier circuits 332, a differential circuit 333 and a second ground electrode 334 on the second substrate 310; the plurality of detectors 330 are respectively connected to the plurality of filter circuits 331, the plurality of filter circuits 331 are respectively connected to the plurality of amplifier circuits 332, the plurality of amplifier circuits 332 are all connected to the differential circuit 333, and the plurality of detectors 330 are all connected to the second ground electrode 334.
示例性地,可以通过向第二衬底310中注入P型离子或N型离子的方法在第二衬底310上形成滤波电路331、放大电路332和差分电路333。For example, the filter circuit 331 , the amplifier circuit 332 , and the differential circuit 333 may be formed on the second substrate 310 by implanting P-type ions or N-type ions into the second substrate 310 .
示例性地,可以采用电镀的方法在第二衬底310上形成第二接地电极334。By way of example, the second ground electrode 334 may be formed on the second substrate 310 by electroplating.
请结合图1,“对麦克风振膜200和光电转换组件300进行连接”具体可以包括:Referring to FIG. 1 , “connecting the microphone diaphragm 200 and the photoelectric conversion component 300 ” may specifically include:
提供承载件400,将光电转换组件300的第二衬底310固定于承载件400上;Providing a carrier 400, fixing the second substrate 310 of the photoelectric conversion component 300 on the carrier 400;
将麦克风振膜200的第一衬底10通过粘合胶500固定于承载件400上,粘合胶500对应光电转换组件300的外围设置。The first substrate 10 of the microphone diaphragm 200 is fixed on the carrier 400 by means of adhesive 500 , and the adhesive 500 is arranged corresponding to the periphery of the photoelectric conversion component 300 .
以上对本申请实施例提供的光学麦克风及其制作方法进行了详细介绍。本文中应用了具体个例对本申请的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本申请。同时,对于本领域的技术人员,依据本申请的思想,在具体实施方式及应用范围上均会有改变之处,综上所述,本说明书内容不应理解为对本申请的限制。
The optical microphone and its manufacturing method provided in the embodiment of the present application are introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the present application. At the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.
Claims (25)
- 一种光学麦克风,包括:An optical microphone, comprising:麦克风振膜,所述麦克风振膜包括间隔设置的振动薄膜和光栅,所述振动薄膜上设有进声孔;A microphone diaphragm, the microphone diaphragm comprising a vibrating film and a grating arranged at intervals, and a sound inlet hole is provided on the vibrating film;光电转换组件,设置于所述光栅远离所述振动薄膜的一侧,所述光电转换组件包括光源和探测器,所述光源用于朝向所述麦克风振膜发射光线,所述探测器用于接收从所述麦克风振膜反射回的光线并且将光信号转换为电信号。The photoelectric conversion component is arranged on the side of the grating away from the vibration film, and the photoelectric conversion component includes a light source and a detector. The light source is used to emit light toward the microphone diaphragm, and the detector is used to receive the light reflected from the microphone diaphragm and convert the optical signal into an electrical signal.
- 根据权利要求1所述的光学麦克风,其中,所述光栅背离所述振动薄膜的一侧设有第一反射层,所述振动薄膜朝向所述光栅的一侧设有第二反射层。The optical microphone according to claim 1, wherein a first reflection layer is provided on a side of the grating facing away from the vibration film, and a second reflection layer is provided on a side of the vibration film facing the grating.
- 根据权利要求1所述的光学麦克风,其中,所述麦克风振膜包括依次层叠设置的第一衬底、第一无机层、支撑件以及振动薄膜,所述第一无机层设置于所述第一衬底上,所述支撑件设置于所述第一无机层和所述振动薄膜之间,所述第一无机层包括所述光栅,所述支撑件对应于所述光栅的外围设置。The optical microphone according to claim 1, wherein the microphone diaphragm includes a first substrate, a first inorganic layer, a support member and a vibration film which are stacked in sequence, the first inorganic layer is arranged on the first substrate, the support member is arranged between the first inorganic layer and the vibration film, the first inorganic layer includes the grating, and the support member is arranged corresponding to the periphery of the grating.
- 根据权利要求3所述的光学麦克风,其中,所述第一无机层包括在所述第一衬底上依次层叠设置的第一氧化硅层和第一氮化硅层,所述光栅位于所述第一氮化硅层上,所述第一氧化硅层上对应于所述光栅的位置形成镂空。The optical microphone according to claim 3, wherein the first inorganic layer comprises a first silicon oxide layer and a first silicon nitride layer stacked in sequence on the first substrate, the grating is located on the first silicon nitride layer, and a hollow is formed on the first silicon oxide layer at a position corresponding to the grating.
- 根据权利要求3所述的光学麦克风,其中,所述振动薄膜上设有朝向所述第一无机层弯曲的弯曲部,所述弯曲部在所述第一衬底上的正投影位于所述支撑件在所述第一衬底上的正投影和所述光栅在所述第一衬底上的正投影之间。The optical microphone according to claim 3, wherein the vibration film is provided with a bent portion bent toward the first inorganic layer, and the orthographic projection of the bent portion on the first substrate is located between the orthographic projection of the support member on the first substrate and the orthographic projection of the grating on the first substrate.
- 根据权利要求3所述的光学麦克风,其中,所述第一无机层背离所述第一衬底的一侧设有第一电极层,所述振动薄膜背离所述第一无机层的一侧设有第二电极层。The optical microphone according to claim 3, wherein a first electrode layer is provided on a side of the first inorganic layer facing away from the first substrate, and a second electrode layer is provided on a side of the vibration film facing away from the first inorganic layer.
- 根据权利要求6所述的光学麦克风,其中,所述第一电极层的材料和所述第二电极层的材料均包括多晶硅,所述振动薄膜的材料包括氮化硅。The optical microphone according to claim 6, wherein the material of the first electrode layer and the material of the second electrode layer both include polysilicon, and the material of the vibration film includes silicon nitride.
- 根据权利要求3所述的光学麦克风,其中,所述振动薄膜上设有进声孔,所述进声孔贯穿所述振动薄膜,所述进声孔在所述第一衬底上的正投影位于所述支撑件在所述第一衬底上的正投影和所述光栅在所述第一衬底上的正投影之间;The optical microphone according to claim 3, wherein the vibration film is provided with a sound inlet hole, the sound inlet hole penetrates the vibration film, and the orthographic projection of the sound inlet hole on the first substrate is located between the orthographic projection of the support member on the first substrate and the orthographic projection of the grating on the first substrate;所述第一无机层上设有透气孔,所述透气孔贯穿所述第一无机层,所述透气孔在所述第一衬底上的正投影位于所述支撑件在所述第一衬底上的正投影和所述光栅在所述第一衬底上的正投影之间。The first inorganic layer is provided with air holes, the air holes penetrate the first inorganic layer, and the orthographic projection of the air holes on the first substrate is located between the orthographic projection of the support member on the first substrate and the orthographic projection of the grating on the first substrate.
- 根据权利要求1所述的光学麦克风,其中,所述光电转换组件还包括第二衬底,所 述光源和所述探测器均设置于所述第二衬底上;The optical microphone according to claim 1, wherein the photoelectric conversion component further comprises a second substrate. The light source and the detector are both disposed on the second substrate;所述第二衬底上还设有第一连接件、第二连接件、驱动电路和第一接地电极,所述驱动电路与所述第二连接件电性连接,所述第一接地电极与所述第一连接件电性连接;The second substrate is also provided with a first connection member, a second connection member, a driving circuit and a first grounding electrode, the driving circuit is electrically connected to the second connection member, and the first grounding electrode is electrically connected to the first connection member;所述光源具有第一电极和第二电极;所述光源的所述第一电极与所述第一连接件连接,所述光源的所述第二电极通过导线与所述第二连接件连接。The light source has a first electrode and a second electrode; the first electrode of the light source is connected to the first connecting member, and the second electrode of the light source is connected to the second connecting member through a wire.
- 根据权利要求9所述的光学麦克风,其中,所述第二衬底上设有多个所述探测器,所述第二衬底上还设有多个滤波电路、多个放大电路、差分电路和第二接地电极;多个所述探测器分别连接多个所述滤波电路,多个所述滤波电路分别连接多个所述放大电路,多个所述放大电路均连接至所述差分电路,多个所述探测器均连接至所述第二接地电极。The optical microphone according to claim 9, wherein a plurality of the detectors are provided on the second substrate, and a plurality of filter circuits, a plurality of amplifier circuits, a differential circuit and a second ground electrode are also provided on the second substrate; the plurality of the detectors are respectively connected to a plurality of the filter circuits, the plurality of the filter circuits are respectively connected to a plurality of the amplifier circuits, the plurality of the amplifier circuits are all connected to the differential circuit, and the plurality of the detectors are all connected to the second ground electrode.
- 根据权利要求1所述的光学麦克风,其中,所述光源的出射光线与所述光栅背离所述振动薄膜一侧的表面之间为非垂直关系。The optical microphone according to claim 1, wherein the outgoing light of the light source is in a non-perpendicular relationship with the surface of the grating facing away from the vibration film.
- 根据权利要求1所述的光学麦克风,其中,所述光学麦克风还包括承载件,所述光电转换组件与所述承载件连接,所述麦克风振膜通过粘合胶与所述承载件连接,所述粘合胶对应所述光电转换组件的外围设置。The optical microphone according to claim 1, wherein the optical microphone further comprises a carrier, the photoelectric conversion component is connected to the carrier, and the microphone diaphragm is connected to the carrier via an adhesive, and the adhesive is arranged corresponding to the periphery of the photoelectric conversion component.
- 一种光学麦克风的制作方法,包括:A method for manufacturing an optical microphone, comprising:提供麦克风振膜以及提供光电转换组件,所述麦克风振膜包括间隔设置的振动薄膜和光栅,所述振动薄膜上设有进声孔;所述光电转换组件包括光源和探测器,所述光源用于朝向所述麦克风振膜发射光线,所述探测器用于接收从所述麦克风振膜反射回的光线并且将光信号转换为电信号;A microphone diaphragm and a photoelectric conversion component are provided, wherein the microphone diaphragm includes a vibration film and a grating arranged at intervals, and a sound inlet hole is provided on the vibration film; the photoelectric conversion component includes a light source and a detector, wherein the light source is used to emit light toward the microphone diaphragm, and the detector is used to receive light reflected from the microphone diaphragm and convert the light signal into an electrical signal;对所述麦克风振膜和所述光电转换组件进行连接,使所述光电转换组件设置于所述光栅远离所述振动薄膜的一侧,得到光学麦克风。The microphone diaphragm and the photoelectric conversion component are connected so that the photoelectric conversion component is arranged on a side of the grating away from the vibration film to obtain an optical microphone.
- 根据权利要求13所述的光学麦克风的制作方法,其中,所述提供麦克风振膜包括:The method for manufacturing an optical microphone according to claim 13, wherein providing a microphone diaphragm comprises:提供第一衬底,在所述第一衬底上形成第一无机层,对所述第一无机层进行图形化处理,形成光栅图案;Providing a first substrate, forming a first inorganic layer on the first substrate, and performing patterning on the first inorganic layer to form a grating pattern;在所述第一无机层上形成第一电极层;forming a first electrode layer on the first inorganic layer;在所述第一电极层和所述第一衬底上沉积牺牲层,并对所述牺牲层进行图形化处理,在所述牺牲层上形成填充部、支撑部以及位于所述支撑部与所述填充部之间的沟槽,所述填充部对应于所述光栅图案设置,所述支撑部设置于所述填充部的外围,所述沟槽贯穿所述牺牲层并且将所述支撑部与所述填充部间隔开;Depositing a sacrificial layer on the first electrode layer and the first substrate, and patterning the sacrificial layer to form a filling portion, a supporting portion, and a groove between the supporting portion and the filling portion on the sacrificial layer, wherein the filling portion is arranged corresponding to the grating pattern, the supporting portion is arranged at the periphery of the filling portion, and the groove penetrates the sacrificial layer and separates the supporting portion from the filling portion;在所述牺牲层上形成振动薄膜; forming a vibration film on the sacrificial layer;在所述振动薄膜上形成第二电极层;forming a second electrode layer on the vibration film;对所述第一衬底进行图形化处理,在所述第一衬底上形成对应于所述光栅图案的第一缺口;Performing a patterning process on the first substrate to form a first notch corresponding to the grating pattern on the first substrate;采用蚀刻液对所述牺牲层进行刻蚀,所述蚀刻液经由所述第一缺口对所述填充部进行腐蚀,去除所述填充部,在所述振动薄膜和所述光栅图案之间形成间隙;所述牺牲层的所述支撑部未被蚀刻,形成用于支撑所述振动薄膜的支撑件。The sacrificial layer is etched by an etching liquid, and the etching liquid corrodes the filling part through the first notch to remove the filling part, thereby forming a gap between the vibration film and the grating pattern; the supporting part of the sacrificial layer is not etched, thereby forming a supporting member for supporting the vibration film.
- 根据权利要求14所述的光学麦克风的制作方法,其中,所述第一衬底的材料包括硅,所述第一无机层包括所述第一衬底上依次层叠设置的第一氧化硅层和第一氮化硅层;The method for manufacturing an optical microphone according to claim 14, wherein the material of the first substrate comprises silicon, and the first inorganic layer comprises a first silicon oxide layer and a first silicon nitride layer sequentially stacked on the first substrate;所述在所述第一衬底上形成第一无机层包括:The forming of a first inorganic layer on the first substrate comprises:对所述第一衬底的表面进行氧化处理,得到第一氧化硅层;performing oxidation treatment on the surface of the first substrate to obtain a first silicon oxide layer;采用化学气相沉积的方法在所述第一氧化硅层上形成第一氮化硅层。A first silicon nitride layer is formed on the first silicon oxide layer by chemical vapor deposition.
- 根据权利要求15所述的光学麦克风的制作方法,其中,所述牺牲层的材料为氧化硅;采用蚀刻液经由所述第一缺口对所述牺牲层的所述填充部进行刻蚀的同时,蚀刻去除所述光栅图案表面的所述第一氧化硅层,得到光栅。According to the method for manufacturing an optical microphone according to claim 15, the material of the sacrificial layer is silicon oxide; while etching the filling portion of the sacrificial layer through the first notch using an etching solution, the first silicon oxide layer on the surface of the grating pattern is etched away to obtain a grating.
- 根据权利要求14所述的光学麦克风的制作方法,其中,对所述第一无机层进行图形化处理之后,在形成光栅的同时,在所述第一无机层上形成透气孔,所述透气孔贯穿所述第一无机层,并且,所述透气孔设置于所述光栅的外围;The method for manufacturing an optical microphone according to claim 14, wherein, after the first inorganic layer is patterned, while forming the grating, an air hole is formed on the first inorganic layer, the air hole penetrates the first inorganic layer, and the air hole is arranged at the periphery of the grating;对所述第一衬底进行图形化处理之后,在所述第一衬底上形成对应于所述光栅图案的第一缺口的同时,在所述第一衬底上形成对应于所述透气孔的第二缺口;After patterning the first substrate, a first notch corresponding to the grating pattern is formed on the first substrate, and a second notch corresponding to the air hole is formed on the first substrate;采用蚀刻液对所述牺牲层进行刻蚀时,在所述蚀刻液经由所述第一缺口对所述填充部进行腐蚀的同时,所述蚀刻液还经由所述第二缺口对所述填充部上位于所述透气孔内的部分进行腐蚀。When the sacrificial layer is etched by an etching liquid, while the etching liquid corrodes the filling portion through the first notch, the etching liquid also corrodes the portion of the filling portion located in the air hole through the second notch.
- 根据权利要求17所述的光学麦克风的制作方法,其中,在所述第一电极和所述第一衬底上沉积牺牲层之后,所述牺牲层上对应于所述透气孔的位置形成凹槽;The method for manufacturing an optical microphone according to claim 17, wherein after depositing a sacrificial layer on the first electrode and the first substrate, a groove is formed on the sacrificial layer at a position corresponding to the air hole;在所述牺牲层上形成振动薄膜时,所述振动薄膜于所述凹槽处形成弯曲部。When a vibration film is formed on the sacrificial layer, a bending portion is formed on the vibration film at the groove.
- 根据权利要求14所述的光学麦克风的制作方法,其中,在所述牺牲层上形成振动薄膜之后,对所述振动薄膜进行图形化处理,形成进声孔,所述进声孔贯穿所述振动薄膜,所述进声孔在所述第一衬底上的正投影位于所述支撑件在所述第一衬底上的正投影和所述光栅在所述第一衬底上的正投影之间。According to the manufacturing method of the optical microphone according to claim 14, after the vibration film is formed on the sacrificial layer, the vibration film is patterned to form a sound inlet hole, the sound inlet hole penetrates the vibration film, and the orthographic projection of the sound inlet hole on the first substrate is located between the orthographic projection of the support member on the first substrate and the orthographic projection of the grating on the first substrate.
- 根据权利要求14所述的光学麦克风的制作方法,其中,在采用蚀刻液对所述牺牲 层进行刻蚀之后,所述提供麦克风振膜还包括:采用蒸镀的方法在所述光栅背离所述振动薄膜的一侧形成第一反射层以及在所述振动薄膜朝向所述光栅的一侧形成第二反射层。The method for manufacturing an optical microphone according to claim 14, wherein the sacrificial After the layer is etched, the providing of the microphone diaphragm further comprises: forming a first reflection layer on a side of the grating away from the vibration film and forming a second reflection layer on a side of the vibration film facing the grating by using an evaporation method.
- 根据权利要求13所述的光学麦克风的制作方法,其中,所述提供光电转换组件包括:提供第二衬底上,在所述第二衬底上形成探测器以及在所述第二衬底上设置光源。According to the method for manufacturing an optical microphone according to claim 13, wherein providing a photoelectric conversion component comprises: providing a second substrate, forming a detector on the second substrate, and arranging a light source on the second substrate.
- 根据权利要求21所述的光学麦克风的制作方法,其中,所述第二衬底的材料包括硅,所述探测器包括光电二极管;The method for manufacturing an optical microphone according to claim 21, wherein the material of the second substrate comprises silicon, and the detector comprises a photodiode;所述在所述第二衬底上形成探测器包括:在所述第二衬底中注入P型离子和N型离子,形成PN结,所述PN结构成所述光电二极管。The forming of the detector on the second substrate includes: implanting P-type ions and N-type ions into the second substrate to form a PN junction, and the PN junction constitutes the photodiode.
- 根据权利要求21所述的光学麦克风的制作方法,其中,所述提供光电转换组件还包括:在所述第二衬底上形成第一连接件、第二连接件、驱动电路和第一接地电极,所述驱动电路与所述第二连接件电性连接,所述第一接地电极与所述第一连接件电性连接;The method for manufacturing an optical microphone according to claim 21, wherein providing a photoelectric conversion component further comprises: forming a first connector, a second connector, a drive circuit and a first ground electrode on the second substrate, wherein the drive circuit is electrically connected to the second connector, and the first ground electrode is electrically connected to the first connector;所述在所述第二衬底上设置光源包括:The step of arranging a light source on the second substrate comprises:提供光源,所述光源具有第一电极和第二电极;使所述光源的所述第一电极与所述第一连接件连接,以及,采用导线连接所述光源的所述第二电极与所述第二连接件。A light source is provided, wherein the light source has a first electrode and a second electrode; the first electrode of the light source is connected to the first connecting member, and the second electrode of the light source is connected to the second connecting member by a wire.
- 根据权利要求21所述的光学麦克风的制作方法,其中,所述第二衬底上设有多个所述探测器,所述在所述提供光电转换组件还包括:在所述第二衬底上形成多个滤波电路、多个放大电路、差分电路和第二接地电极;多个所述探测器分别连接多个所述滤波电路,多个所述滤波电路分别连接多个所述放大电路,多个所述放大电路均连接至所述差分电路,多个所述探测器均连接至所述第二接地电极。According to the manufacturing method of the optical microphone according to claim 21, a plurality of the detectors are provided on the second substrate, and the providing of the photoelectric conversion component also includes: forming a plurality of filter circuits, a plurality of amplifier circuits, a differential circuit and a second ground electrode on the second substrate; the plurality of the detectors are respectively connected to the plurality of the filter circuits, the plurality of the filter circuits are respectively connected to the plurality of the amplifier circuits, the plurality of the amplifier circuits are all connected to the differential circuit, and the plurality of the detectors are all connected to the second ground electrode.
- 根据权利要求13所述的光学麦克风的制作方法,其中,所述对所述麦克风振膜和所述光电转换组件进行连接包括:The method for manufacturing an optical microphone according to claim 13, wherein the step of connecting the microphone diaphragm and the photoelectric conversion component comprises:提供承载件,将所述光电转换组件固定于所述承载件上;Providing a carrier, and fixing the photoelectric conversion component on the carrier;将所述麦克风振膜通过粘合胶固定于所述承载件上,所述粘合胶对应所述光电转换组件的外围设置。 The microphone diaphragm is fixed on the carrier by adhesive, and the adhesive is arranged corresponding to the periphery of the photoelectric conversion component.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211701711.2 | 2022-12-28 | ||
CN202211701711.2A CN116074715A (en) | 2022-12-28 | 2022-12-28 | Optical microphone and manufacturing method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2024139572A1 true WO2024139572A1 (en) | 2024-07-04 |
Family
ID=86174188
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2023/125475 WO2024139572A1 (en) | 2022-12-28 | 2023-10-19 | Optical microphone and manufacturing method therefor |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN116074715A (en) |
WO (1) | WO2024139572A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116074715A (en) * | 2022-12-28 | 2023-05-05 | Oppo广东移动通信有限公司 | Optical microphone and manufacturing method thereof |
WO2025091159A1 (en) * | 2023-10-30 | 2025-05-08 | 瑞声声学科技(深圳)有限公司 | Microphone and method for manufacturing same |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003049494A1 (en) * | 2001-12-07 | 2003-06-12 | Epivalley Co., Ltd. | Optical microphone |
JP2006186792A (en) * | 2004-12-28 | 2006-07-13 | Casio Comput Co Ltd | Optical microphone system |
CN111263283A (en) * | 2020-02-17 | 2020-06-09 | 瑞声声学科技(深圳)有限公司 | Optical microphone |
CN112449295A (en) * | 2019-08-30 | 2021-03-05 | 华为技术有限公司 | Microphone chip, microphone and terminal equipment |
WO2022156888A1 (en) * | 2021-01-21 | 2022-07-28 | Huawei Technologies Co., Ltd. | An optical microphone with a lightguide |
CN116074715A (en) * | 2022-12-28 | 2023-05-05 | Oppo广东移动通信有限公司 | Optical microphone and manufacturing method thereof |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9410931B1 (en) * | 2013-10-17 | 2016-08-09 | Sandia Corporation | Miniaturized photoacoustic spectrometer |
CN206164826U (en) * | 2016-08-31 | 2017-05-10 | 歌尔股份有限公司 | Sensitive membrane and MEMS microphone |
CN107247269B (en) * | 2017-06-11 | 2020-02-18 | 宁波飞芯电子科技有限公司 | Detection device, pixel unit and array for collecting and processing laser signals |
CN110388980A (en) * | 2019-07-31 | 2019-10-29 | 山东大学 | A Micro Acoustic Sensor Based on Diffraction Grating Structure |
EP3793216B1 (en) * | 2019-09-13 | 2023-12-06 | ams International AG | Membrane structure, transducer device and method of producing a membrane structure |
CN214315603U (en) * | 2020-11-30 | 2021-09-28 | 瑞声科技(南京)有限公司 | Piezoelectric MEMS Microphone and Its Array |
CN217240934U (en) * | 2021-12-21 | 2022-08-19 | 荣成歌尔微电子有限公司 | Microphone packaging structure, MEMS microphone and electronic equipment |
-
2022
- 2022-12-28 CN CN202211701711.2A patent/CN116074715A/en active Pending
-
2023
- 2023-10-19 WO PCT/CN2023/125475 patent/WO2024139572A1/en unknown
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003049494A1 (en) * | 2001-12-07 | 2003-06-12 | Epivalley Co., Ltd. | Optical microphone |
JP2006186792A (en) * | 2004-12-28 | 2006-07-13 | Casio Comput Co Ltd | Optical microphone system |
CN112449295A (en) * | 2019-08-30 | 2021-03-05 | 华为技术有限公司 | Microphone chip, microphone and terminal equipment |
CN111263283A (en) * | 2020-02-17 | 2020-06-09 | 瑞声声学科技(深圳)有限公司 | Optical microphone |
WO2022156888A1 (en) * | 2021-01-21 | 2022-07-28 | Huawei Technologies Co., Ltd. | An optical microphone with a lightguide |
CN116074715A (en) * | 2022-12-28 | 2023-05-05 | Oppo广东移动通信有限公司 | Optical microphone and manufacturing method thereof |
Also Published As
Publication number | Publication date |
---|---|
CN116074715A (en) | 2023-05-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2024139572A1 (en) | Optical microphone and manufacturing method therefor | |
KR100437142B1 (en) | Optical microphone | |
CN104891423B (en) | Double barrier film MEMS microphones without backboard | |
WO2018207578A1 (en) | Piezoelectric microphone chip and piezoelectric microphone | |
KR100637563B1 (en) | Optical acoustic-electric inverter | |
US11240607B2 (en) | Optical microphone assembly | |
US7894618B2 (en) | Apparatus comprising a directionality-enhanced acoustic sensor | |
CN110220584A (en) | Optics acoustic sensor and optics sonic transducer including it | |
US11510012B2 (en) | Integrated optical transducer and method for fabricating an integrated optical transducer | |
KR100629048B1 (en) | Acoustic-electric converter using optical element | |
JPS61220600A (en) | Ultrasonic wave sensor | |
CN112697262B (en) | Hydrophone and method for manufacturing same | |
US12041415B2 (en) | Apparatus for sound detection, sound localization and beam forming and method of producing such apparatus | |
JP3481180B2 (en) | Acoustic-electric converter | |
WO2024108867A1 (en) | Optical microphone | |
JP3481179B2 (en) | Acoustic-electric converter | |
JP4249875B2 (en) | Acoustoelectric converter | |
JP3639484B2 (en) | Acoustoelectric converter | |
US20240069195A1 (en) | Displacement detector, array of displacement detectors and method of manufacturing a displacement detector | |
JP2009206217A (en) | Manufacturing method of light emitting device | |
JP2001296310A (en) | Optical sensor and its manufacturing method | |
Suzuki et al. | Optical sensing directional acoustic transducer with grating diaphragm using complementary metal oxide semiconductor compatible micromachining techniques | |
TW202441980A (en) | Optical transducer package and method for producing an optical transducer package | |
JP2001245396A (en) | Acoustoelectric transducer | |
JP2001169397A (en) | Acoustoelectric transducer |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 23909506 Country of ref document: EP Kind code of ref document: A1 |