WO2021109193A1 - 一种阵列基板、阵列基板制程方法及显示面板 - Google Patents
一种阵列基板、阵列基板制程方法及显示面板 Download PDFInfo
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- WO2021109193A1 WO2021109193A1 PCT/CN2019/124812 CN2019124812W WO2021109193A1 WO 2021109193 A1 WO2021109193 A1 WO 2021109193A1 CN 2019124812 W CN2019124812 W CN 2019124812W WO 2021109193 A1 WO2021109193 A1 WO 2021109193A1
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- Prior art keywords
- layer
- metal layer
- section
- transparent electrode
- array substrate
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- 239000000758 substrate Substances 0.000 title claims abstract description 58
- 238000003672 processing method Methods 0.000 title 1
- 239000010410 layer Substances 0.000 claims abstract description 285
- 229910052751 metal Inorganic materials 0.000 claims abstract description 179
- 239000002184 metal Substances 0.000 claims abstract description 179
- 239000011241 protective layer Substances 0.000 claims abstract description 63
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 59
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 15
- 239000011521 glass Substances 0.000 claims description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 7
- 229910052782 aluminium Inorganic materials 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical group [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 7
- 229910052802 copper Inorganic materials 0.000 claims description 7
- 239000010949 copper Substances 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 5
- 230000001681 protective effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 238000005530 etching Methods 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/441—Interconnections, e.g. scanning lines
- H10D86/443—Interconnections, e.g. scanning lines adapted for preventing breakage, peeling or short circuiting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/13439—Electrodes characterised by their electrical, optical, physical properties; materials therefor; method of making
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
Definitions
- the present application relates to the field of panel manufacturing technology, and in particular to an array substrate, an array substrate manufacturing method, and a display panel.
- LCD(Liquid Crystal displays) are a kind of flat panel displays that are widely used.
- the usual method is to use transparent electrode vias to achieve this. Since there are an insulating layer, an amorphous silicon layer, a second metal layer, and a protective layer between the first metal layer and the transparent electrode layer, the depth of this hole is particularly deep, which easily leads to transparency at the edge of the second metal layer. The electrode layer is broken.
- the embodiments of the present application provide an array substrate, a manufacturing method of the array substrate, and a display panel. In order to solve the problem that the transparent electrode layer is easily broken in the prior art.
- An embodiment of the present application provides an array substrate, which includes:
- the first metal layer has a first surface and a second surface disposed opposite to each other;
- An insulating layer arranged on the first surface
- An amorphous silicon layer arranged on the side of the insulating layer away from the first metal layer;
- An amorphous silicon doped layer disposed on the side of the amorphous silicon layer away from the insulating layer;
- the second metal layer includes a first part and a second part, the first part is arranged on the side of the amorphous silicon doped layer away from the amorphous silicon layer, and the second part is arranged on the The first surface is in contact with the first metal layer;
- a protective layer is provided on the first metal layer and the second metal layer, a first via hole is provided at a position where the protective layer is in contact with the first metal layer, and the protective layer is connected to the first part The contact position is provided with a second via hole;
- the second transparent electrode passes through the second via hole and is connected to the second metal layer.
- the material used for the first metal layer is copper, and the material used for the second metal layer is aluminum.
- the first transparent electrode and the second transparent electrode are located on both sides of the second part.
- the first transparent electrode includes a first section and a second section, the first section is connected to the second section, the first section is located on the surface of the protective layer, and the second section extends The first via hole is in contact with the first metal layer.
- the second transparent conductive electrode includes a third section and a fourth section, the third section is located on the surface of the protective layer, and the fourth section extends into the second via hole and the The first part of contact.
- a glass substrate is further included, and the glass substrate is disposed on the second surface of the first metal layer.
- the first transparent electrode includes a first section and a second section, the first section is located on the surface of the protective layer, and the second section extends into the first via hole and the second section.
- a metal layer is in contact
- the second transparent conductive electrode includes a third section and a fourth section, the third section is located on the surface of the protective layer, and the fourth section extends into the second via hole and the first section. Part of the contact.
- An embodiment of the present application also provides a manufacturing method of an array substrate, which includes:
- the insulating layer, the amorphous silicon layer and the amorphous silicon doped layer are patterned and etched, and a second metal is provided on the side of the amorphous silicon doped layer away from the amorphous silicon layer and on the first metal layer Floor;
- a protective layer is provided on the first metal layer and the second metal layer, a first via is provided at a position where the protective layer is in contact with the first metal layer, and the protective layer is connected to the A second via hole is provided at the contact position of the second metal layer;
- a second transparent electrode is connected to the second metal layer through the second via hole.
- the material used for the first metal layer is copper, and the material used for the second metal layer is aluminum.
- the first transparent electrode and the second transparent electrode are located on both sides of the second part.
- the first transparent electrode includes a first section and a second section, the first section is connected to the second section, the first section is located on the surface of the protective layer, and the second section extends The first via hole is in contact with the first metal layer.
- the second transparent conductive electrode includes a third section and a fourth section, the third section is located on the surface of the protective layer, and the fourth section extends into the second via hole and the The first part of contact.
- the glass substrate is disposed on the second surface of the first metal layer.
- the first transparent electrode includes a first section and a second section, the first section is located on the surface of the protective layer, and the second section extends into the first via hole and the second section.
- a metal layer is in contact
- the second transparent conductive electrode includes a third section and a fourth section, the third section is located on the surface of the protective layer, and the fourth section extends into the second via hole and the first section. Part of the contact.
- An embodiment of the present application further provides a display panel, which includes an array substrate, and the array substrate includes:
- the first metal layer has a first surface and a second surface disposed opposite to each other;
- An insulating layer arranged on the first surface
- An amorphous silicon layer arranged on the side of the insulating layer away from the first metal layer;
- An amorphous silicon doped layer disposed on the side of the amorphous silicon layer away from the insulating layer;
- the second metal layer includes a first part and a second part, the first part is arranged on the side of the amorphous silicon doped layer away from the amorphous silicon layer, and the second part is arranged on the The first surface is in contact with the first metal layer;
- a protective layer is provided on the first metal layer and the second metal layer, a first via hole is provided at a position where the protective layer is in contact with the first metal layer, and the protective layer is connected to the first part The contact position is provided with a second via hole;
- the second transparent electrode passes through the second via hole and is connected to the second metal layer.
- the material used for the first metal layer is copper, and the material used for the second metal layer is aluminum.
- the first transparent electrode and the second transparent electrode are located on both sides of the second part.
- the first transparent electrode includes a first section and a second section, the first section is located on the surface of the protective layer, and the second section extends into the first via hole and the second section. A metal layer contact.
- the second transparent conductive electrode includes a third section and a fourth section, the third section is located on the surface of the protective layer, and the fourth section extends into the second via hole and the The first part of contact.
- the display panel further includes a glass substrate disposed on the second surface of the first metal layer.
- the array substrate includes a first metal layer having a first surface and a second surface disposed opposite to each other; an insulating layer is disposed on the first surface; an amorphous silicon layer is disposed on the insulating layer away from the first metal The amorphous silicon doped layer is arranged on the side of the amorphous silicon layer away from the insulating layer; the second metal layer includes a first part and a second part, and the first part is arranged on the amorphous silicon layer.
- a side of the silicon doped layer away from the amorphous silicon layer, the second part is provided on the first side and in contact with the first metal layer;
- the protective layer is provided on the first metal layer and the second metal layer Layer, the protective layer is provided with a first via hole at the position where the protective layer is in contact with the first metal layer, the protective layer is provided with a second via hole at the position where the protective layer is in contact with the first part, and the first transparent electrode passes through the The first via hole is connected to the first metal layer; the second transparent electrode passes through the second via hole and is connected to the second metal layer. Due to the structure of the present application, the first metal layer and the second metal layer are in direct contact, so that the first metal layer and the second metal layer can be electrically connected.
- first transparent electrode and the second transparent electrode respectively pass through the Shallow first and second vias, so that the first transparent electrode and the first metal layer and the second transparent electrode and the second metal layer are electrically connected, because the first and second vias only pass through With the protective layer, the via hole is shallow, and therefore, the first transparent electrode and the second transparent electrode are not easily broken when they extend into the via hole.
- FIG. 1 is a schematic diagram of the structure of an array substrate provided by an embodiment of the application.
- FIG. 2 is another schematic diagram of the structure of the array substrate provided by the embodiment of the application.
- FIG. 3 is a schematic flowchart of a manufacturing method of an array substrate provided by an embodiment of the application.
- the embodiments of the present application provide an array substrate, an array substrate manufacturing method, and a display panel.
- the following is a detailed introduction to the array substrate.
- FIG. 1 is a schematic structural diagram of an array substrate 100 provided by an embodiment of the application.
- FIG. 2 is another schematic diagram of the structure of the array substrate 100 provided by an embodiment of the application.
- an embodiment of the present application provides an array substrate 100.
- the array substrate 100 includes a first metal layer 20, an insulating layer 30, an amorphous silicon layer 40, an amorphous silicon doped layer 50, a second metal layer 60, and a protective layer 70.
- the first transparent electrode 81 and the second transparent electrode 82 The first metal layer 20 has a first surface 20a and a second surface 20b disposed opposite to each other.
- the insulating layer 30 is provided on the first surface 20a.
- the amorphous silicon layer 40 is disposed on the side of the insulating layer 30 away from the first metal layer 20.
- the amorphous silicon doped layer 50 is disposed on the side of the amorphous silicon layer 40 away from the insulating layer 30.
- the second metal layer 60 includes a first portion 61 and a second portion 62.
- the first portion 61 is disposed on the side of the amorphous silicon doped layer 50 away from the amorphous silicon layer 40, and the second portion 62 is disposed on the side of the amorphous silicon doped layer 50.
- the first surface 20a is in contact with the first metal layer.
- a protective layer 70 is provided on the first metal layer 20 and the second metal layer 60, a first via 71 is provided at a position where the protective layer 70 is in contact with the first metal layer 20, and the protective layer A second via 72 is provided at a position where 70 is in contact with the first portion 61.
- the first transparent electrode 81 passes through the first via 71 and is connected to the first metal layer 20.
- the second transparent electrode 82 passes through the second via 72 and is connected to the second metal layer 60.
- the array substrate 100 further includes a glass substrate 10, and the glass substrate 10 is disposed on the second surface 20 b of the first metal layer 20.
- the first transparent electrode 81 includes a first section 811 and a second section 812.
- the first section 811 is connected to the second section 812.
- the first section 811 is located on the surface of the protective layer 70.
- Two segments 812 extend into the first via 71 to contact the first metal layer 20.
- the second transparent conductive electrode 82 includes a third segment 821 and a fourth segment 822.
- the third segment 821 is located in the On the surface of the protection layer 70, the fourth section 822 extends into the second via 72 and contacts the first portion 61.
- the first metal layer 20 has a first surface 20a and a second surface 20b disposed opposite to each other.
- the insulating layer 30 is provided on the first surface 20a.
- the conductive channel layer 40 is disposed on the side of the insulating layer 30 away from the first metal layer 20.
- the amorphous silicon layer 50 is disposed on the side of the conductive channel layer 40 away from the insulating layer 30.
- the second metal layer 60 is disposed on the side of the amorphous silicon layer 50 away from the conductive channel layer 40.
- a protective layer 70 is provided on the first metal layer 20 and the second metal layer 60, a first via 71 is provided at a position where the protective layer 70 is in contact with the first metal layer 20, and the protective layer A second via 72 is provided at a position where 70 is in contact with the second metal layer 60.
- the first transparent electrode 81 passes through the first via 71 and is connected to the first metal layer 20.
- the second transparent electrode 82 passes through the second via 72 and is connected to the second metal layer 60. Due to the structure of the present application, the first metal layer 20 is in direct contact with the second metal layer 60, so the first metal layer 20 and the second metal layer 60 can be electrically connected.
- first transparent electrode 81 and the second transparent electrode 82 respectively pass through the shallower first via 71 and the second via 72, so as to realize the electrical connection between the first transparent electrode and the first metal layer 20 and the second transparent electrode and the second metal layer 60, because the first transparent electrode is electrically connected to the first metal layer 20 and the second transparent electrode is electrically connected to the second metal layer 60.
- the via 71 and the second via 72 only pass through the protective layer 70, so the via is shallow. Therefore, the first transparent electrode 81 and the second transparent electrode 82 are not easily broken when they extend into the via.
- FIG. 3 is a schematic flowchart of an array substrate manufacturing method according to an embodiment of the application.
- an embodiment of the present application provides a manufacturing method of an array substrate, including:
- a protective layer is provided on the first metal layer and the second metal layer, a first via is provided at a position where the protective layer is in contact with the first metal layer, and the protective layer is The contact position of the second metal layer is provided with a second via hole.
- the first metal layer and the second metal layer are two different metal materials.
- the material used for the first metal layer is copper
- the material used for the second metal layer is aluminum.
- the acid of the second metal layer cannot be etched due to the different materials of the first metal layer and the second metal layer
- the first metal layer can thereby form the pattern of the second metal layer without affecting the first metal layer.
- the glass substrate is arranged on the second surface of the first metal layer.
- the first transparent electrode includes a first section and a second section, the first section is connected to the second section, the first section is located on the surface of the protective layer, and the second section extends into the first section.
- a via is in contact with the first metal layer
- the second transparent conductive electrode includes a third section and a fourth section, the third section is located on the surface of the protective layer, and the fourth section extends into the first section.
- Two via holes are in contact with the first part.
- the first metal layer and the second metal layer are in direct contact, so the first metal layer and the second metal layer can be electrically connected.
- the first transparent electrode and the second transparent electrode respectively pass through The shallower first and second vias, so as to realize the electrical connection between the first transparent electrode and the first metal layer and the second transparent electrode and the second metal layer, because the first and second vias are only Passing through the protective layer, the via hole is shallow. Therefore, the first transparent electrode and the second transparent electrode are not easily broken when they extend into the via hole.
- An embodiment of the present application also provides a display panel, which includes the above-mentioned array substrate. Since the array substrate has been described in detail in the above embodiments. Here, I won't repeat them too much.
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Abstract
一种阵列基板(100),包括第一金属层(20),绝缘层(30)设置在第一金属层(20)上,非晶硅层(40)设置在绝缘层(30)远离第一金属层(20)的一面,非晶硅掺杂层(50)设置在非晶硅层(40)远离绝缘层(30)的一面,第二金属层(60)的第一部分(61)设置在非晶硅掺杂层(50)远离非晶硅层(40)的一面、第二部分(62)设置在第一面(20a)且与第一金属层(20)接触,保护层(70)设置在第一金属层(20)和第二金属层(60)上,第一透明电极(81)穿过保护层(70)与第一金属层(20)连接,第二透明电极(82)穿过保护层(70)与第二金属层(60)连接。
Description
本申请涉及面板制造技术领域,特别涉及一种阵列基板、阵列基板制程方法及显示面板。
LCD(Liquid
crystal displays,液晶显示器)是一种被广泛应用的平板显示器。当前液晶显示面板的周边布线技术中经常需要由透明电电极层向第二金属层或第一金属层传输电讯号,通常的办法是利用透明电极过孔来实现。由于第一金属层和透明电极层之间存在着绝缘层、非晶硅层、第二金属层、保护层,故而此孔的深度特别深,很容易导致第二金属层边缘爬坡处的透明电极层断裂。
因此,提供一种新的阵列基板使得透明电极层不容易断裂,降低深浅孔接触电阻,为本领域技术人员亟待解决的技术问题。
本申请实施例提供一种阵列基板、阵列基板制程方法及显示面板。以解决现有技术中透明电极层容易断裂的问题。
本申请实施例提供一种阵列基板,其中,包括:
第一金属层,具有相对设置第一面以及第二面;
绝缘层,设置在所述第一面;
非晶硅层,设置在所述绝缘层远离所述第一金属层的一面;
非晶硅掺杂层,设置在所述非晶硅层远离所述绝缘层的一面;
第二金属层,所述第二金属层包括第一部分和第二部分,所述第一部分设置在所述非晶硅掺杂层远离非晶硅层的一面,所述第二部分设置在所述第一面且与所述第一金属层接触;
保护层,设置在所述第一金属层和所述第二金属层上,所述保护层与所述第一金属层接触的位置设有第一过孔,所述保护层与所述第一部分接触的位置设有第二过孔;
第一透明电极,穿过所述第一过孔与所述第一金属层连接;
第二透明电极,穿过所述第二过孔与所述第二金属层连接。
在一些实施例中,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。
在一些实施例中,所述第一透明电极和第二透明电极位于所述第二部分的两侧。
在一些实施例中,所述第一透明电极包括第一段和第二段,所述第一段与第二段连接,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触。
在一些实施例中,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
在一些实施例中,还包括玻璃基板,所述玻璃基板设置在所述第一金属层的第二面。
在一些实施例中,所述第一透明电极包括第一段和第二段,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
本申请实施例还提供一种阵列基板的制程方法,其中,包括:
提供第一金属层;
在第一金属层上设置绝缘层;
在所述绝缘层上设置非晶硅层;
在所述导电沟道层上设置非晶硅掺杂层;
对所述绝缘层、非晶硅层以及非晶硅掺杂层进行图案化蚀刻,在所述非晶硅掺杂层远离非晶硅层的一面以及所述第一金属层上设置第二金属层;
在所述第一金属层和所述第二金属层上设有保护层,在所述保护层与所述第一金属层接触的位置设有第一过孔,在所述保护层与所述第二金属层接触的位置设有第二过孔;
将第一透明电极穿过所述第一过孔与所述第一金属层连接;
将第二透明电极穿过所述第二过孔与所述第二金属层连接。
在一些实施例中,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。
在一些实施例中,所述第一透明电极和第二透明电极位于所述第二部分的两侧。
在一些实施例中,所述第一透明电极包括第一段和第二段,所述第一段与第二段连接,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触。
在一些实施例中,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
在一些实施例中,玻璃基板设置在所述第一金属层的第二面。
在一些实施例中,所述第一透明电极包括第一段和第二段,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
本申请实施例还提供一种显示面板,其中,包括阵列基板,所述阵列基板包括:
第一金属层,具有相对设置第一面以及第二面;
绝缘层,设置在所述第一面;
非晶硅层,设置在所述绝缘层远离所述第一金属层的一面;
非晶硅掺杂层,设置在所述非晶硅层远离所述绝缘层的一面;
第二金属层,所述第二金属层包括第一部分和第二部分,所述第一部分设置在所述非晶硅掺杂层远离非晶硅层的一面,所述第二部分设置在所述第一面且与所述第一金属层接触;
保护层,设置在所述第一金属层和所述第二金属层上,所述保护层与所述第一金属层接触的位置设有第一过孔,所述保护层与所述第一部分接触的位置设有第二过孔;
第一透明电极,穿过所述第一过孔与所述第一金属层连接;
第二透明电极,穿过所述第二过孔与所述第二金属层连接。
在一些实施例中,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。
在一些实施例中,所述第一透明电极和第二透明电极位于所述第二部分的两侧。
在一些实施例中,所述第一透明电极包括第一段和第二段,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触。
在一些实施例中,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
在一些实施例中,显示面板还包括玻璃基板,所述玻璃基板设置在所述第一金属层的第二面。
本申请实施例中,阵列基板包括第一金属层具有相对设置第一面以及第二面;绝缘层设置在所述第一面;非晶硅层设置在所述绝缘层远离所述第一金属层的一面;非晶硅掺杂层设置在所述非晶硅层远离所述绝缘层的一面;所述第二金属层包括第一部分和第二部分,所述第一部分设置在所述非晶硅掺杂层远离非晶硅层的一面,所述第二部分设置在所述第一面且与所述第一金属层接触;保护层设置在所述第一金属层和所述第二金属层上,所述保护层与所述第一金属层接触的位置设有第一过孔,所述保护层与所述第一部分接触的位置设有第二过孔,第一透明电极穿过所述第一过孔与所述第一金属层连接;第二透明电极穿过所述第二过孔与所述第二金属层连接。由于采用本申请结构,第一金属层与第二金属层直接接触,故而可以实现第一金属层和第二金属层电性连接,此外,通过第一透明电极和第二透明电极分别穿过较浅的第一过孔和第二过孔,从而实现第一透明电极与第一金属层和第二透明电极与第二金属层电性连接,因为第一过孔和第二过孔只是穿过了保护层,因此过孔较浅,因此,第一透明电极和第二透明电极伸入过孔时不容易断裂。
为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1为本申请实施例提供的阵列基板的结构示意图。
图2为本申请实施例提供的阵列基板的另一个结构示意图。
图3为本申请实施例提供的阵列基板制程方法的流程示意图。
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述。显然,所描述的实施例仅仅是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。
本申请实施例提供一种阵列基板、阵列基板制程方法以及显示面板。以下对阵列基板做详细介绍。
请参阅图1和图2所示,图1为本申请实施例提供的阵列基板100的结构示意图。图2为本申请实施例提供的阵列基板100的另一个结构示意图。其中,本申请实施例提供一种阵列基板100,阵列基板100包括第一金属层20、绝缘层30、非晶硅层40、非晶硅掺杂层50、第二金属层60、保护层70、第一透明电极81以及第二透明电极82。第一金属层20具有相对设置第一面20a以及第二面20b。绝缘层30设置在所述第一面20a。非晶硅层40设置在所述绝缘层30远离所述第一金属层20的一面。非晶硅掺杂层50设置在所述非晶硅层40远离所述绝缘层30的一面。所述第二金属层60包括第一部分61和第二部分62,所述第一部分61设置在所述非晶硅掺杂层50远离非晶硅层40的一面,所述第二部分62设置在所述第一面20a且与所述第一金属层接触。保护层70设置在所述第一金属层20和所述第二金属层60上,所述保护层70与所述第一金属层20接触的位置设有第一过孔71,所述保护层70与所述第一部分61接触的位置设有第二过孔72。第一透明电极81穿过所述第一过孔71与所述第一金属层20连接。第二透明电极82穿过所述第二过孔72与所述第二金属层60连接。
在本申请的描述中,需要理解的是,术语“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本申请和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本申请的限制。此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本申请的描述中,“多个”的含义是两个或两个以上,除非另有明确具体的限定。
其中,阵列基板100还包括玻璃基板10,所述玻璃基板10设置在所述第一金属层20的第二面20b。
其中,所述第一透明电极81包括第一段811和第二段812,所述第一段811与第二段812连接,所述第一段811位于所述保护层70表面,所述第二段812伸入所述第一过孔71与所述第一金属层20接触,所述第二透明导电极82包括第三段821和第四段822,所述第三段821位于所述保护层70表面,所述第四段822伸入所述第二过孔72与所述第一部分61接触。
本申请实施例中,第一金属层20具有相对设置第一面20a以及第二面20b。绝缘层30设置在所述第一面20a。导电沟道层40设置在所述绝缘层30远离所述第一金属层20的一面。非晶硅层50设置在所述导电沟道层40远离所述绝缘层30的一面。第二金属层60,设置在所述非晶硅层50远离导电沟道层40的一面。保护层70设置在所述第一金属层20和所述第二金属层60上,所述保护层70与所述第一金属层20接触的位置设有第一过孔71,所述保护层70与所述第二金属层60接触的位置设有第二过孔72。第一透明电极81穿过所述第一过孔71与所述第一金属层20连接。第二透明电极82穿过所述第二过孔72与所述第二金属层60连接。由于本申请结构,第一金属层20与第二金属层60直接接触,故而可以实现第一金属层20和第二金属层60电性连接,此外,通过第一透明电极81和第二透明电极82分别穿过较浅的第一过孔71和第二过孔72,从而实现实现第一透明电极与第一金属层20和第二透明电极与第二金属层60电性连接,因为第一过孔71和第二过孔72只是穿过了保护层70,因此过孔较浅,因此,第一透明电极81和第二透明电极82伸入过孔时不容易断裂。
请参阅图3,图3为本申请实施例提供的阵列基板制程方法的流程示意图。其中,本申请实施例提供一种阵列基板的制程方法,包括:
101、提供第一金属层。
102、在第一金属层上设置绝缘层。
103、在所述绝缘层上设置非晶硅层。
104、在导电沟道层上设置非晶硅掺杂层。
105、对所述绝缘层、非晶硅层以及非晶硅掺杂层进行图案化蚀刻,在所述非晶硅掺杂层远离非晶硅层的一面以及所述第一金属层上设置第二金属层。
106、在所述第一金属层和所述第二金属层上设有保护层,在所述保护层与所述第一金属层接触的位置设有第一过孔,在所述保护层与所述第二金属层接触的位置设有第二过孔。
107、将第一透明电极穿过所述第一过孔与所述第一金属层连接。
108、将第二透明电极穿过所述第二过孔与所述第二金属层连接。
其中,第一金属层和第二金属层为两种不同的金属材料。具体的,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。在第二金属层蚀刻的过程中,虽然第一金属层与第二金属层均可与蚀刻液接触,但是由于第一金属层与第二金属层的材质不同,第二金属层的酸无法蚀刻第一金属层,从而可以形成第二金属层的图形而对第一金属层层无影响。
其中,所述玻璃基板设置在所述第一金属层的第二面。
其中,所述第一透明电极包括第一段和第二段,所述第一段与第二段连接,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
由于本采用申请的方法,第一金属层与第二金属层直接接触,故而可以实现第一金属层和第二金属层电性连接,此外,通过第一透明电极和第二透明电极分别穿过较浅的第一过孔和第二过孔,从而实现实现第一透明电极与第一金属层和第二透明电极与第二金属层电性连接,因为第一过孔和第二过孔只是穿过了保护层,因此过孔较浅,因此,第一透明电极和第二透明电极伸入过孔时不容易断裂。
本申请实施例还提供一种显示面板,显示面板包括上述所述的阵列基板。由于阵列基板已经在上述实施例中做了详细描述。在此,不再过多赘述。
以上对本申请实施例提供的一种阵列基板、阵列基板制程方法及显示面板进行了详细介绍。本文中应用了具体个例对本申请的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本申请。同时,对于本领域的技术人员,依据本申请的思想,在具体实施方式及应用范围上均会有改变之处,综上,本说明书内容不应理解为对本申请的限制。
Claims (20)
- 一种阵列基板,其中,包括:第一金属层,具有相对设置第一面以及第二面;绝缘层,设置在所述第一面;非晶硅层,设置在所述绝缘层远离所述第一金属层的一面;非晶硅掺杂层,设置在所述非晶硅层远离所述绝缘层的一面;第二金属层,所述第二金属层包括第一部分和第二部分,所述第一部分设置在所述非晶硅掺杂层远离非晶硅层的一面,所述第二部分设置在所述第一面且与所述第一金属层接触;保护层,设置在所述第一金属层和所述第二金属层上,所述保护层与所述第一金属层接触的位置设有第一过孔,所述保护层与所述第一部分接触的位置设有第二过孔;第一透明电极,穿过所述第一过孔与所述第一金属层连接;第二透明电极,穿过所述第二过孔与所述第二金属层连接。
- 根据权利要求1所述的阵列基板,其中,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。
- 根据权利要求1所述的阵列基板,其中,所述第一透明电极和第二透明电极位于所述第二部分的两侧。
- 根据权利要求1所述的阵列基板,其中,所述第一透明电极包括第一段和第二段,所述第一段与第二段连接,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触。
- 根据权利要求1所述的阵列基板,其中,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
- 根据权利要求1所述的阵列基板,其中,还包括玻璃基板,所述玻璃基板设置在所述第一金属层的第二面。
- 根据权利要求1所述的阵列基板,其中,所述第一透明电极包括第一段和第二段,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
- 一种阵列基板的制程方法,其中,包括:提供第一金属层;在第一金属层上设置绝缘层;在所述绝缘层上设置非晶硅层;在所述导电沟道层上设置非晶硅掺杂层;对所述绝缘层、非晶硅层以及非晶硅掺杂层进行图案化蚀刻,在所述非晶硅掺杂层远离非晶硅层的一面以及所述第一金属层上设置第二金属层;在所述第一金属层和所述第二金属层上设有保护层,在所述保护层与所述第一金属层接触的位置设有第一过孔,在所述保护层与所述第二金属层接触的位置设有第二过孔;将第一透明电极穿过所述第一过孔与所述第一金属层连接;将第二透明电极穿过所述第二过孔与所述第二金属层连接。
- 根据权利要求8所述的阵列基板的制程方法,其中,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。
- 根据权利要求8所述的阵列基板的制程方法,其中,所述第一透明电极和第二透明电极位于所述第二部分的两侧。
- 根据权利要求8所述的阵列基板的制程方法,其中,所述第一透明电极包括第一段和第二段,所述第一段与第二段连接,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触。
- 根据权利要求8所述的阵列基板的制程方法,其中,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
- 根据权利要求8所述的阵列基板的制程方法,其中,玻璃基板设置在所述第一金属层的第二面。
- 根据权利要求13所述的阵列基板的制程方法,其中,所述第一透明电极包括第一段和第二段,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
- 一种显示面板,其中,包括阵列基板,所述阵列基板包括:第一金属层,具有相对设置第一面以及第二面;绝缘层,设置在所述第一面;非晶硅层,设置在所述绝缘层远离所述第一金属层的一面;非晶硅掺杂层,设置在所述非晶硅层远离所述绝缘层的一面;第二金属层,所述第二金属层包括第一部分和第二部分,所述第一部分设置在所述非晶硅掺杂层远离非晶硅层的一面,所述第二部分设置在所述第一面且与所述第一金属层接触;保护层,设置在所述第一金属层和所述第二金属层上,所述保护层与所述第一金属层接触的位置设有第一过孔,所述保护层与所述第一部分接触的位置设有第二过孔;第一透明电极,穿过所述第一过孔与所述第一金属层连接;第二透明电极,穿过所述第二过孔与所述第二金属层连接。
- 根据权利要求15所述的显示面板,其中,所述第一金属层采用的材料为铜,所述第二金属层采用的材料为铝。
- 根据权利要求15所述的显示面板,其中,所述第一透明电极和第二透明电极位于所述第二部分的两侧。
- 根据权利要求15所述的显示面板,其中,所述第一透明电极包括第一段和第二段,所述第一段位于所述保护层表面,所述第二段伸入所述第一过孔与所述第一金属层接触。
- 根据权利要求15所述的显示面板,其中,所述第二透明导电极包括第三段和第四段,所述第三段位于所述保护层表面,所述第四段伸入所述第二过孔与所述第一部分接触。
- 根据权利要求15所述的显示面板,其中,还包括玻璃基板,所述玻璃基板设置在所述第一金属层的第二面。
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5883682A (en) * | 1997-03-19 | 1999-03-16 | Lg Electronics, Inc. | Structure of a liquid crystal display and method of manufacturing the same |
CN1992291A (zh) * | 2005-12-30 | 2007-07-04 | Lg.菲利浦Lcd株式会社 | 薄膜晶体管基板及其制造方法 |
CN107454981A (zh) * | 2016-07-25 | 2017-12-08 | 深圳市柔宇科技有限公司 | 阵列基板及阵列基板的制造方法 |
CN110085600A (zh) * | 2018-01-25 | 2019-08-02 | 鸿富锦精密工业(深圳)有限公司 | 电连接结构及其制作方法、tft阵列基板及其制备方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6008872A (en) * | 1998-03-13 | 1999-12-28 | Ois Optical Imaging Systems, Inc. | High aperture liquid crystal display including thin film diodes, and method of making same |
US6380559B1 (en) * | 1999-06-03 | 2002-04-30 | Samsung Electronics Co., Ltd. | Thin film transistor array substrate for a liquid crystal display |
JP2006171610A (ja) * | 2004-12-20 | 2006-06-29 | Toshiba Matsushita Display Technology Co Ltd | 液晶表示装置及びその製造方法 |
JP5062558B2 (ja) * | 2006-07-25 | 2012-10-31 | Nltテクノロジー株式会社 | アクティブマトリクス基板の製造方法 |
CN101436601A (zh) * | 2008-12-18 | 2009-05-20 | 上海广电光电子有限公司 | 薄膜晶体管阵列基板 |
CN101520584B (zh) * | 2009-03-30 | 2012-06-27 | 昆山龙腾光电有限公司 | 液晶显示面板、液晶显示装置及其制造方法 |
CN102751276B (zh) * | 2012-06-01 | 2015-11-25 | 京东方科技集团股份有限公司 | 一种阵列基板的制造方法、阵列基板及显示装置 |
CN102854643B (zh) * | 2012-09-04 | 2015-11-25 | 深圳市华星光电技术有限公司 | 一种液晶显示面板及其制造方法 |
CN103021940B (zh) * | 2012-12-12 | 2015-04-08 | 京东方科技集团股份有限公司 | 阵列基板及其制造方法、显示装置 |
CN103489824B (zh) * | 2013-09-05 | 2016-08-17 | 京东方科技集团股份有限公司 | 一种阵列基板及其制备方法与显示装置 |
CN103676382B (zh) * | 2013-12-26 | 2017-03-08 | 京东方科技集团股份有限公司 | 阵列基板及显示装置 |
CN105161505B (zh) * | 2015-09-28 | 2018-11-23 | 京东方科技集团股份有限公司 | 一种阵列基板及其制作方法、显示面板 |
CN105789117B (zh) * | 2016-03-23 | 2019-02-01 | 深圳市华星光电技术有限公司 | Tft基板的制作方法及制得的tft基板 |
CN106842751B (zh) * | 2017-04-11 | 2020-06-23 | 京东方科技集团股份有限公司 | 阵列基板及其修复方法、显示装置 |
CN109459894A (zh) * | 2018-12-24 | 2019-03-12 | 深圳市华星光电半导体显示技术有限公司 | 像素电极结构及其制作方法 |
-
2019
- 2019-12-02 CN CN201911213977.0A patent/CN110941124B/zh active Active
- 2019-12-12 US US16/627,291 patent/US11201177B2/en active Active
- 2019-12-12 WO PCT/CN2019/124812 patent/WO2021109193A1/zh active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5883682A (en) * | 1997-03-19 | 1999-03-16 | Lg Electronics, Inc. | Structure of a liquid crystal display and method of manufacturing the same |
CN1992291A (zh) * | 2005-12-30 | 2007-07-04 | Lg.菲利浦Lcd株式会社 | 薄膜晶体管基板及其制造方法 |
CN107454981A (zh) * | 2016-07-25 | 2017-12-08 | 深圳市柔宇科技有限公司 | 阵列基板及阵列基板的制造方法 |
CN110085600A (zh) * | 2018-01-25 | 2019-08-02 | 鸿富锦精密工业(深圳)有限公司 | 电连接结构及其制作方法、tft阵列基板及其制备方法 |
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