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WO2015062213A1 - Quick wafer transmission method for coating device - Google Patents

Quick wafer transmission method for coating device Download PDF

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Publication number
WO2015062213A1
WO2015062213A1 PCT/CN2014/075450 CN2014075450W WO2015062213A1 WO 2015062213 A1 WO2015062213 A1 WO 2015062213A1 CN 2014075450 W CN2014075450 W CN 2014075450W WO 2015062213 A1 WO2015062213 A1 WO 2015062213A1
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WO
WIPO (PCT)
Prior art keywords
wafer
development
glue
area
coating
Prior art date
Application number
PCT/CN2014/075450
Other languages
French (fr)
Chinese (zh)
Inventor
胡延兵
郑春海
卢继奎
Original Assignee
沈阳芯源微电子设备有限公司
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Publication date
Application filed by 沈阳芯源微电子设备有限公司 filed Critical 沈阳芯源微电子设备有限公司
Publication of WO2015062213A1 publication Critical patent/WO2015062213A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67276Production flow monitoring, e.g. for increasing throughput

Definitions

  • the present invention relates to the field of semiconductor technology and relates to a method of fast transfer wafers for a glue applicator for use in conjunction with a lithography machine during integrated circuit production.
  • the standard process flow of the glue applicator that is connected to the lithography machine is unidirectional, and is described as: Unloading the wafer from the wafer cassette - thickening treatment - pre-coating cooling treatment - coating treatment - coating Post-glue soft bake treatment - soft bake after cooling process - wafer edge exposure process - wafer transfer buffer storage process - sent to the lithography machine carrier, wafer removal from the lithography machine - wafer buffer storage process - Post-exposure bake treatment - pre-development cooling treatment - development treatment - post-development hard bake treatment - hard bake and post-cooling treatment - loading wafers into the product.
  • the glue-coated developing machine connected with the lithography machine needs to be configured with a corresponding processing module and configured to transfer the wafer.
  • the robot is composed of a slide area, a glue application area, a development area, and an interface area, and each area is composed of a regional function module and a regional robot. Wafer transfer in a glue applicator is divided between transfer and functional areas between process modules.
  • the transfer wafer is mainly completed by a slide robot, a glue application robot, a development robot, and an interface robot.
  • the wafer in the carrier area enters the glued area through a dedicated channel. After coating, exposure, and development, the wafer is returned to the carrier area through a dedicated channel.
  • the wafer supply in the glued area is completed by the slide area through a dedicated channel.
  • the wafer enters the development area through a dedicated channel, and then is transferred to the interface area through a dedicated channel.
  • the wafer is also transferred to the carrier area through a dedicated channel; the wafer supply in the development area It is completed by the interface area through a dedicated channel.
  • the wafer After the development process is completed, the wafer enters the glue application area through a dedicated channel, and then is transferred to the carrier area through a dedicated channel. After the glue is applied to the development area, the wafer is also passed through a dedicated channel. Transfer to the interface area; the robot in the interface area takes the wafer after the glue application process out of the dedicated channel of the development area, feeds it to the entrance table of the exposure machine, and obtains the exposed wafer from the exposure stage of the exposure machine, and sends it to the developing area.
  • Dedicated channel Transfer to the interface area; the robot in the interface area takes the wafer after the glue application process out of the dedicated channel of the development area, feeds it to the entrance table of the exposure machine, and obtains the exposed wafer from the exposure stage of the exposure machine, and sends it to the developing area.
  • the wafer must be glued and developed in this area, and the wafer transfer between the areas must pass through a dedicated channel. Therefore, the coated wafer should be processed without any process in the developing area, and the developed wafer should be processed without any process in the coating area. There must be several conveying channel modules in the coating developing machine, which will affect the coating. The wafer transfer efficiency of the developing machine.
  • the present invention provides A fast wafer transfer method, which flattens the wafer transfer path processed by the glue coating and development process, reduces the loop transfer path, improves the transfer efficiency of the wafer, and removes the wafer transfer channel in the glue coater. Increase the wafer transfer speed to increase the operating capacity of the glue applicator.
  • the technical solution adopted by the present invention to achieve the above object is: a quick transfer wafer method of a glue applicator, flattening a wafer transfer path of a glue coating and a development process, and removing crystals in the glue applicator The circular transmission channel link.
  • the wafer transfer path processed by the gluing process is flatly distributed, specifically:
  • the soft-baked wafer in the gluing process is sent to the development zone for cooling treatment after soft baking.
  • the wafer transfer path processed by the development process is flattened, specifically:
  • the developed wafer in the development process is sent to the glue application area, and the hard baking treatment after development is performed.
  • the step of removing the wafer transfer channel in the glue applicator is specifically:
  • the dedicated wafer transfer channel module in the glue applicator that is connected to the lithography machine is removed, instead of this is the bake heat treatment module.
  • the present invention disperses the entire process of the development process into the development area and the glue application area, and the annular wafer transfer path in the development area is combined with the plated path in the glue application area to enhance the wafer in the four process areas. Transmission efficiency
  • the invention removes the dedicated wafer transfer channel module in the glue coating and developing machine which is connected with the lithography machine, reduces the type of the process module and the space occupied in the glue coating and developing machine, and reduces the outer shape of the machine. , improve wafer transfer speed.
  • Figure 1 is a schematic view of a wafer flow sheet in the glue applicator of the present invention
  • FIG. 2 is a schematic view showing the path of the transfer wafer of the robot in the glue applicator of the present invention.
  • LP/OUT is wafer unloading treatment
  • ADB is tackifying treatment
  • CPC/BC is for pre-coating cooling treatment
  • SCR is for gluing treatment
  • LTB/AC is for soft baking after coating
  • CPC/AC is soft drying.
  • EE is the wafer edge exposure processing
  • BUF is the wafer buffer storage processing
  • TU/IN is the lithography machine inlet stage
  • TU/OUT is the lithography machine exit stage
  • AEB is the post-exposure baking process.
  • CPC/BD is the pre-development cooling process
  • SDC is the development process
  • LTB/AD is the post-development hard bake process
  • CPC/AD is the hard bake after the cooling process
  • LP/IN is the wafer loading process
  • CSR is the cassette robot
  • CR For the glue application robot DR is the development robot
  • IFR is the interface robot.
  • FIG. 1 depicts the process flow of a wafer of the present invention in a glue applicator which is unidirectional.
  • the glue development equipment connected to the lithography machine needs to be equipped with LP/OUT wafer unloading treatment, ADB thickening treatment, CPC/BC pre-coating cooling treatment, SCR coating treatment, LTB/ Soft baking after AC coating, cooling treatment after CPC/AC soft baking, EE wafer edge exposure processing, BUF wafer buffer storage processing, TU/IN lithography machine inlet stage, TU/OUT lithography machine exit stage , AEB post-exposure baking treatment, CPC/BD pre-development cooling treatment, SDC development processing, LTB/AD development post-hardening treatment, CPC/AD development post-cooling treatment, LP/IN wafer loading processing and other process processing modules, It is necessary to configure a wafer transfer process module such as a CSR cassette robot, a CR glue robot, a DR development robot, an IFR interface robot, etc., to complete the transfer of wafers between the various process modules.
  • Figure 2 depicts the robot transfer wafer path within the glue applicator of the present
  • the CSR cassette robot takes out the wafer from the LP/OUT wafer unloading processing module and feeds it into the ADB thickening process.
  • the CR coating robot takes the wafer from the ADB tackifying module and sends it to the CPC/BC coating. Before the glue is cooled, the wafer is taken out from the cooling module before the CPC/BC coating, sent to the SCR glue processing, and then the wafer is taken out from the SCR glue processing module, and then sent to the LTB/AC for soft drying.
  • the DR developing robot takes out the wafer from the LTB/AC glued soft bake processing module, and sends it to the CPC/AC soft bake and then cools it; the IFR interface robot takes out the wafer from the CPC/AC soft bake and post-cooling process module.
  • the EE wafer edge exposure processing is sent, and the wafer is taken out from the EE wafer edge exposure processing module, sent to the BUF wafer buffer storage processing, and then the wafer is taken out from the BUF wafer buffer storage processing module, and sent to the TU/ The IN lithography machine inlet stage completes the gluing process.
  • the IFR interface robot takes the wafer from the TU/OUT lithography exit stage and feeds it into the AEB exposure post-baking process.
  • the DR developing robot takes the wafer from the AEB exposure post-baking module and feeds it to the CPC/BD. Cooling treatment before development, taking out the wafer from the CPC/BD pre-development cooling processing module, feeding it to SDC development processing, then taking out the wafer from the SDC development processing module, feeding it to LTB/AD for development and hard baking; CR coating
  • the glue robot takes out the wafer from the hard-baking module after LTB/AD development, and sends it to the CPC/AD for development and cooling.
  • the CSR cassette robot takes the wafer from the CPC/AD development and cooling module and sends it to the LP/IN.
  • the wafer loading processing module completes the development process.
  • the above coating process and development process are respectively carried out in the glue coating and developing machine, and an exposure process is added in the middle, that is, the glue coating process-exposure process-development process is connected in series, so that the glue coating machine has the same The ability of the lithography machine to produce lines.
  • the fast transfer wafer method of the invention can effectively improve the transfer efficiency of the wafer in the process area of the glue applicator, reduce the outer dimensions of the machine, and increase the transfer speed of the wafer.

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  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

Provided is a quick wafer transmission method for a spreading and developing machine conducting an online operation with a photoetching machine during the production of an integrated circuit. The method comprises: conducting planarization distribution on transmission paths of wafers which are processed by means of spreading and developing processes, thereby reducing circular transmission paths and improving the wafer transmission efficiency; and omitting a link of a wafer transmission channel in a spreading and developing machine, so that the wafer transmission speed is increased, thereby improving the operation productivity of the spreading and developing machine.

Description

一种涂敷装置的怏捷传送晶圆方法 技术领域  Method for transferring wafer by coating device
本发明涉及半导体技术领域, 涉及用以在集成电路生产时与光刻机联 线作业的涂胶显影机的快捷传送晶圆方法。  The present invention relates to the field of semiconductor technology and relates to a method of fast transfer wafers for a glue applicator for use in conjunction with a lithography machine during integrated circuit production.
背景技术  Background technique
与光刻机联线作业的涂胶显影机的标准工艺处理流程是单向的, 具体 描述为: 从晶圆盒中卸载晶圆-增粘处理-涂胶前冷却处理 -涂胶处理-涂胶后 软烘处理-软烘后冷却处理-晶圆边缘曝光处理-晶圆传送缓冲存储处理 -送入 光刻机载片台,从光刻机卸载台取晶圆-晶圆缓冲存储处理-曝光后烘烤处理 -显影前冷却处理 -显影处理-显影后硬烘处理-硬烘后冷却处理 -装载晶圆入 品.。  The standard process flow of the glue applicator that is connected to the lithography machine is unidirectional, and is described as: Unloading the wafer from the wafer cassette - thickening treatment - pre-coating cooling treatment - coating treatment - coating Post-glue soft bake treatment - soft bake after cooling process - wafer edge exposure process - wafer transfer buffer storage process - sent to the lithography machine carrier, wafer removal from the lithography machine - wafer buffer storage process - Post-exposure bake treatment - pre-development cooling treatment - development treatment - post-development hard bake treatment - hard bake and post-cooling treatment - loading wafers into the product.
目前, 为满足大规模集成电路生产线对涂胶显影机的各种要求, 并适 应以上工艺流程, 与光刻机联线作业的涂胶显影机需要配置相应的工艺处 理模块, 并配置传送晶圆的机器人, 机台是由载片区域、 涂胶区域、 显影 区域、 接口区域串接组成, 各个区域是由区域功能模块及区域机器人组成。 涂胶显影机内的晶圆传送分为工艺处理模块间的传送与功能区域间的传 递。  At present, in order to meet the various requirements of the large-scale integrated circuit production line for the coating and developing machine, and to adapt to the above process, the glue-coated developing machine connected with the lithography machine needs to be configured with a corresponding processing module and configured to transfer the wafer. The robot is composed of a slide area, a glue application area, a development area, and an interface area, and each area is composed of a regional function module and a regional robot. Wafer transfer in a glue applicator is divided between transfer and functional areas between process modules.
传送晶圆主要由载片机器人、 涂胶机器人、 显影机器人和接口机器人 来完成。 载片区域的晶圆通过专用通道进入涂胶区域, 涂胶、 曝光、 显影 后晶圆通过专用通道返回载片区域; 涂胶区域的晶圆供应是由载片区域通 过专用通道完成的, 完成涂胶工艺后的晶圆通过专用通道进入显影区域后, 再通过专用通道转送至接口区域, 进入涂胶区域的显影后晶圆也是要通过 专用通道转送至载片区域; 显影区域的晶圆供应是由接口区域通过专用通 道完成的, 完成显影工艺后的晶圆通过专用通道进入涂胶区域后, 再通过 专用通道转送至载片区域, 进入显影区域的涂胶后晶圆也是要通过专用通 道转送至接口区域; 接口区域的机器人将涂胶工艺后的晶圆从显影区域专 用通道取出, 送入曝光机入口载台, 并从曝光机出口载台取得曝光后晶圆, 送入显影区域的专用通道。  The transfer wafer is mainly completed by a slide robot, a glue application robot, a development robot, and an interface robot. The wafer in the carrier area enters the glued area through a dedicated channel. After coating, exposure, and development, the wafer is returned to the carrier area through a dedicated channel. The wafer supply in the glued area is completed by the slide area through a dedicated channel. After the glue coating process, the wafer enters the development area through a dedicated channel, and then is transferred to the interface area through a dedicated channel. After the development into the glued area, the wafer is also transferred to the carrier area through a dedicated channel; the wafer supply in the development area It is completed by the interface area through a dedicated channel. After the development process is completed, the wafer enters the glue application area through a dedicated channel, and then is transferred to the carrier area through a dedicated channel. After the glue is applied to the development area, the wafer is also passed through a dedicated channel. Transfer to the interface area; the robot in the interface area takes the wafer after the glue application process out of the dedicated channel of the development area, feeds it to the entrance table of the exposure machine, and obtains the exposed wafer from the exposure stage of the exposure machine, and sends it to the developing area. Dedicated channel.
通过以上传送晶圆的描述可以看出, 晶圆必须在本区域内完成涂胶和 显影处理工艺,区域之间的晶圆传送必须通过专用通道。 因此, 涂胶后的晶 圆要在显影区域无工艺处理穿行, 显影后的晶圆要在涂胶区域无工艺处理 穿行, 涂胶显影机内必须有若干个传送通道模块, 这些势必影响涂胶显影 机的晶圆传送效率。  As can be seen from the above description of the transfer wafer, the wafer must be glued and developed in this area, and the wafer transfer between the areas must pass through a dedicated channel. Therefore, the coated wafer should be processed without any process in the developing area, and the developed wafer should be processed without any process in the coating area. There must be several conveying channel modules in the coating developing machine, which will affect the coating. The wafer transfer efficiency of the developing machine.
发明内容  Summary of the invention
为了提高晶圆的传送效率, 提升涂胶显影机的运行产能, 本发明提供 一种快捷的晶圆传送方法, 将涂胶、 显影工艺处理的晶圆传送路径平坦化 分布, 减少环形传送路径, 提升晶圆的传送效率; 去除涂胶显影机内的晶 圆传送通道环节, 提高晶圆传送速度, 从而提升涂胶显影机的运行产能。 In order to improve the transfer efficiency of the wafer and improve the operating capacity of the glue applicator, the present invention provides A fast wafer transfer method, which flattens the wafer transfer path processed by the glue coating and development process, reduces the loop transfer path, improves the transfer efficiency of the wafer, and removes the wafer transfer channel in the glue coater. Increase the wafer transfer speed to increase the operating capacity of the glue applicator.
本发明为实现上述目的所采用的技术方案是: 一种涂胶显影机的快捷 传送晶圆方法, 将涂胶、 显影工艺处理的晶圆传送路径平坦化分布, 去除 涂胶显影机内的晶圆传送通道环节。  The technical solution adopted by the present invention to achieve the above object is: a quick transfer wafer method of a glue applicator, flattening a wafer transfer path of a glue coating and a development process, and removing crystals in the glue applicator The circular transmission channel link.
所述将涂胶工艺处理的晶圆传送路径平坦化分布, 具体为:  The wafer transfer path processed by the gluing process is flatly distributed, specifically:
将涂胶工艺中软烘后的晶圆送到显影区域内, 进行软烘后的冷却处理。 所述将显影工艺处理的晶圆传送路径平坦化分布, 具体为:  The soft-baked wafer in the gluing process is sent to the development zone for cooling treatment after soft baking. The wafer transfer path processed by the development process is flattened, specifically:
将显影工艺中显影后的晶圆送到涂胶区域内, 进行显影后的硬烘处理。 所述去除涂胶显影机内的晶圆传送通道环节, 具体为:  The developed wafer in the development process is sent to the glue application area, and the hard baking treatment after development is performed. The step of removing the wafer transfer channel in the glue applicator is specifically:
将与光刻机联线作业的涂胶显影机内的专用晶圆传送通道模块去除, 代替这一功能的是烘焙热处理模块。  The dedicated wafer transfer channel module in the glue applicator that is connected to the lithography machine is removed, instead of this is the bake heat treatment module.
本发明具有以下优点及有益效果:  The invention has the following advantages and beneficial effects:
1、 本发明将涂胶工艺的全过程分散到涂胶区域和显影区域进行, 涂胶 区域内的环形晶圆传送途径与显影区域内平台化途径组合, 提升晶圆在四 个工艺处理区域内的传送效率;  1. The whole process of the gluing process is dispersed into the glue coating area and the development area, and the annular wafer transfer path in the glue application area is combined with the platformization path in the development area to raise the wafer in the four process processing areas. Transmission efficiency
2、 本发明将显影工艺的全过程分散到显影区域和涂胶区域进行, 显影 区域内的环形晶圆传送途径与涂胶区域内平台化途径组合, 提升晶圆在四 个工艺处理区域内的传送效率;  2. The present invention disperses the entire process of the development process into the development area and the glue application area, and the annular wafer transfer path in the development area is combined with the plated path in the glue application area to enhance the wafer in the four process areas. Transmission efficiency
3、 本发明将与光刻机联线作业的涂胶显影机内的专用晶圆传送通道模 块去除, 减少了涂胶显影机内的工艺模块种类及占位空间, 缩小了机台的 外形尺寸, 提高晶圆传送速度。  3. The invention removes the dedicated wafer transfer channel module in the glue coating and developing machine which is connected with the lithography machine, reduces the type of the process module and the space occupied in the glue coating and developing machine, and reduces the outer shape of the machine. , improve wafer transfer speed.
附图说明  DRAWINGS
图 1是本发明的涂胶显影机内晶圆流片示意图;  Figure 1 is a schematic view of a wafer flow sheet in the glue applicator of the present invention;
图 2是本发明的涂胶显影机内机器人传递晶圆路径示意图。  2 is a schematic view showing the path of the transfer wafer of the robot in the glue applicator of the present invention.
其中, LP/OUT为晶圆卸载处理, ADB为增粘处理, CPC/BC为涂胶 前冷却处理, SCR为涂胶处理, LTB/AC为涂胶后软烘处理, CPC/AC为软 烘后冷却处理, EE为晶圆边缘曝光处理, BUF为晶圆缓冲存放处理, TU/IN 为光刻机入口载台, TU/OUT为光刻机出口载台, AEB为曝光后烘烤处理, CPC/BD为显影前冷却处理, SDC为显影处理, LTB/AD为显影后硬烘处理, CPC/AD为硬烘后冷却处理, LP/IN为晶圆装载处理, CSR为片盒机器人, CR为涂胶机器人, DR为显影机器人, IFR为接口机器人。  Among them, LP/OUT is wafer unloading treatment, ADB is tackifying treatment, CPC/BC is for pre-coating cooling treatment, SCR is for gluing treatment, LTB/AC is for soft baking after coating, and CPC/AC is soft drying. After the cooling treatment, EE is the wafer edge exposure processing, BUF is the wafer buffer storage processing, TU/IN is the lithography machine inlet stage, TU/OUT is the lithography machine exit stage, and AEB is the post-exposure baking process. CPC/BD is the pre-development cooling process, SDC is the development process, LTB/AD is the post-development hard bake process, CPC/AD is the hard bake after the cooling process, LP/IN is the wafer loading process, CSR is the cassette robot, CR For the glue application robot, DR is the development robot, and IFR is the interface robot.
具体实施方式  detailed description
下面结合附图及实施例对本发明做进一歩的详细说明。  The present invention will be further described in detail below with reference to the accompanying drawings and embodiments.
晶圆在涂胶显影机的晶圆盒中卸载后, 经过涂胶的几种工艺处理后, 进入光刻机中进行曝光处理; 完成曝光工艺的晶圆返回涂胶显影机后, 经 过显影的几种工艺处理后, 晶圆最终被装载回晶圆盒。 附图 1 描述本发明 的晶圆在涂胶显影机内工艺处理流程, 该工艺处理流程是单向的。 After the wafer is unloaded in the wafer cassette of the glue applicator, after several processes of gluing, After entering the lithography machine for exposure processing; after the wafers that have completed the exposure process are returned to the glue applicator, after several processes of development, the wafer is finally loaded back to the wafer cassette. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 depicts the process flow of a wafer of the present invention in a glue applicator which is unidirectional.
为完成上述工艺处理流程, 与光刻机联线作业的涂胶显影设备需要配 置 LP/OUT晶圆卸载处理、 ADB增粘处理、 CPC/BC涂胶前冷却处理、 SCR 涂胶处理, LTB/AC涂胶后软烘处理、 CPC/AC软烘后冷却处理、 EE晶圆 边缘曝光处理、 BUF晶圆缓冲存放处理、 TU/IN光刻机入口载台、 TU/OUT 光刻机出口载台, AEB 曝光后烘烤处理, CPC/BD显影前冷却处理, SDC 显影处理, LTB/AD显影后硬烘处理, CPC/AD显影后冷却处理, LP/IN晶 圆装载处理等工艺处理模块, 还需要配置 CSR片盒机器人、 CR涂胶机器 人、 DR显影机器人、 IFR接口机器人等晶圆传送工艺模块, 来完成晶圆在 各个工艺模块之间的传送。 附图 2描述本发明的涂胶显影机内机器人传递 晶圆路径, 该路径是不可逆的。  In order to complete the above process, the glue development equipment connected to the lithography machine needs to be equipped with LP/OUT wafer unloading treatment, ADB thickening treatment, CPC/BC pre-coating cooling treatment, SCR coating treatment, LTB/ Soft baking after AC coating, cooling treatment after CPC/AC soft baking, EE wafer edge exposure processing, BUF wafer buffer storage processing, TU/IN lithography machine inlet stage, TU/OUT lithography machine exit stage , AEB post-exposure baking treatment, CPC/BD pre-development cooling treatment, SDC development processing, LTB/AD development post-hardening treatment, CPC/AD development post-cooling treatment, LP/IN wafer loading processing and other process processing modules, It is necessary to configure a wafer transfer process module such as a CSR cassette robot, a CR glue robot, a DR development robot, an IFR interface robot, etc., to complete the transfer of wafers between the various process modules. Figure 2 depicts the robot transfer wafer path within the glue applicator of the present invention, which path is irreversible.
涂胶路径: CSR片盒机器人从 LP/OUT晶圆卸载处理模块中取出晶圆, 送入 ADB增粘处理; CR涂胶机器人从 ADB增粘处理模块中取出晶圆,送 入 CPC/BC涂胶前冷却处理, 再从 CPC/BC涂胶前冷却处理模块中取出晶 圆,送入 SCR涂胶处理,再从 SCR涂胶处理模块中取出晶圆,送入 LTB/AC 涂胶后软烘处理; DR显影机器人从 LTB/AC涂胶后软烘处理模块中取出晶 圆, 送入 CPC/AC软烘后冷却处理; IFR接口机器人从 CPC/AC软烘后冷 却处理模块中取出晶圆, 送入 EE晶圆边缘曝光处理, 再从 EE晶圆边缘曝 光处理模块中取出晶圆,送入 BUF晶圆缓冲存放处理,再从 BUF晶圆缓冲 存放处理模块中取出晶圆, 送入 TU/IN光刻机入口载台, 完成涂胶工艺流 程。  Gluing path: The CSR cassette robot takes out the wafer from the LP/OUT wafer unloading processing module and feeds it into the ADB thickening process. The CR coating robot takes the wafer from the ADB tackifying module and sends it to the CPC/BC coating. Before the glue is cooled, the wafer is taken out from the cooling module before the CPC/BC coating, sent to the SCR glue processing, and then the wafer is taken out from the SCR glue processing module, and then sent to the LTB/AC for soft drying. The DR developing robot takes out the wafer from the LTB/AC glued soft bake processing module, and sends it to the CPC/AC soft bake and then cools it; the IFR interface robot takes out the wafer from the CPC/AC soft bake and post-cooling process module. The EE wafer edge exposure processing is sent, and the wafer is taken out from the EE wafer edge exposure processing module, sent to the BUF wafer buffer storage processing, and then the wafer is taken out from the BUF wafer buffer storage processing module, and sent to the TU/ The IN lithography machine inlet stage completes the gluing process.
显影路径: IFR接口机器人从 TU/OUT光刻机出口载台中取出晶圆, 送入 AEB曝光后烘烤处理; DR显影机器人从 AEB曝光后烘烤处理模块中 取出晶圆, 送入 CPC/BD显影前冷却处理, 再从 CPC/BD显影前冷却处理 模块中取出晶圆,送入 SDC显影处理,再从 SDC显影处理模块中取出晶圆, 送入 LTB/AD显影后硬烘处理; CR涂胶机器人从 LTB/AD显影后硬烘处理 模块中取出晶圆, 送入 CPC/AD 显影后冷却处理; CSR 片盒机器人从 CPC/AD显影后冷却处理模块中取出晶圆, 送入 LP/IN晶圆装载处理模块, 完成显影工艺流程。  Development path: The IFR interface robot takes the wafer from the TU/OUT lithography exit stage and feeds it into the AEB exposure post-baking process. The DR developing robot takes the wafer from the AEB exposure post-baking module and feeds it to the CPC/BD. Cooling treatment before development, taking out the wafer from the CPC/BD pre-development cooling processing module, feeding it to SDC development processing, then taking out the wafer from the SDC development processing module, feeding it to LTB/AD for development and hard baking; CR coating The glue robot takes out the wafer from the hard-baking module after LTB/AD development, and sends it to the CPC/AD for development and cooling. The CSR cassette robot takes the wafer from the CPC/AD development and cooling module and sends it to the LP/IN. The wafer loading processing module completes the development process.
以上涂胶工艺流程、 显影工艺流程是在涂胶显影机内分别进行的, 中 间加了一个曝光工艺过程, 即涂胶工艺 -曝光工艺-显影工艺串接而成, 使得 涂胶显影机具有与光刻机联线生产的能力。  The above coating process and development process are respectively carried out in the glue coating and developing machine, and an exposure process is added in the middle, that is, the glue coating process-exposure process-development process is connected in series, so that the glue coating machine has the same The ability of the lithography machine to produce lines.
本发明的快捷传送晶圆方法可以有效地提升晶圆在涂胶显影机工艺处 理区域内的传送效率, 缩小机台的外形尺寸, 提高晶圆传送速度。  The fast transfer wafer method of the invention can effectively improve the transfer efficiency of the wafer in the process area of the glue applicator, reduce the outer dimensions of the machine, and increase the transfer speed of the wafer.

Claims

1. 一种涂胶显影机的快捷传送晶圆方法, 其特征在于, 将涂胶、 显影 工艺处理的晶圆传送路径平坦化分布, 去除涂胶显影机内的晶圆传送通道 环节。 A quick transfer wafer method for a glue applicator, characterized in that a wafer transfer path of a glue coating and a development process is flattened to remove a wafer transfer path in a glue applicator.
2. 根据权利要求 1所述的涂胶显影机的快捷传送晶圆方法, 其特征在 于, 所述将涂胶工艺处理的晶圆传送路径平坦化分布, 具体为:  2 . The method of claim 1 , wherein the wafer transfer path processed by the gluing process is flattened, specifically:
将涂胶工艺中软烘后的晶圆送到显影区域内, 进行软烘后的冷却处理。 The soft-baked wafer in the gluing process is sent to the development zone for cooling treatment after soft baking.
3. 根据权利要求 1所述的涂胶显影机的快捷传送晶圆方法, 其特征在 于, 所述将显影工艺处理的晶圆传送路径平坦化分布, 具体为: 3 . The method of claim 1 , wherein the wafer transfer path processed by the development process is flattened, specifically:
将显影工艺中显影后的晶圆送到涂胶区域内, 进行显影后的硬烘处理。 The developed wafer in the development process is sent to the glue application area, and the hard baking treatment after development is performed.
4. 根据权利要求 1所述的涂胶显影机的快捷传送晶圆方法, 其特征在 于, 所述去除涂胶显影机内的晶圆传送通道环节, 具体为: 4. The method of claim 1, wherein the step of removing a wafer transfer channel in the glue applicator is:
将与光刻机联线作业的涂胶显影机内的专用晶圆传送通道模块去除, 代替这一功能的是烘焙热处理模块。  The dedicated wafer transfer channel module in the glue applicator that is connected to the lithography machine is removed, instead of this is the bake heat treatment module.
PCT/CN2014/075450 2013-10-29 2014-04-16 Quick wafer transmission method for coating device WO2015062213A1 (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1904730A (en) * 2005-07-27 2007-01-31 沈阳芯源先进半导体技术有限公司 Structure of gluing developing apparatus and chip transmission process
CN101615561A (en) * 2008-06-25 2009-12-30 沈阳芯源微电子设备有限公司 The process wall of glue-spreading development equipment
CN102314081A (en) * 2010-07-09 2012-01-11 东京毅力科创株式会社 Coating and developing apparatus, coating developing method and storage medium

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1904730A (en) * 2005-07-27 2007-01-31 沈阳芯源先进半导体技术有限公司 Structure of gluing developing apparatus and chip transmission process
CN101615561A (en) * 2008-06-25 2009-12-30 沈阳芯源微电子设备有限公司 The process wall of glue-spreading development equipment
CN102314081A (en) * 2010-07-09 2012-01-11 东京毅力科创株式会社 Coating and developing apparatus, coating developing method and storage medium

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