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WO2015034048A1 - Three-dimensional shape measurement method and three-dimensional shape measurement device - Google Patents

Three-dimensional shape measurement method and three-dimensional shape measurement device Download PDF

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Publication number
WO2015034048A1
WO2015034048A1 PCT/JP2014/073495 JP2014073495W WO2015034048A1 WO 2015034048 A1 WO2015034048 A1 WO 2015034048A1 JP 2014073495 W JP2014073495 W JP 2014073495W WO 2015034048 A1 WO2015034048 A1 WO 2015034048A1
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WO
WIPO (PCT)
Prior art keywords
light
dark
code
dimensional shape
pattern
Prior art date
Application number
PCT/JP2014/073495
Other languages
French (fr)
Japanese (ja)
Inventor
宏 涌田
Original Assignee
アルプス電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by アルプス電気株式会社 filed Critical アルプス電気株式会社
Publication of WO2015034048A1 publication Critical patent/WO2015034048A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings

Definitions

  • the present invention captures a measurement target onto which pattern light has been projected from a projection apparatus such as a projector with an imaging apparatus such as a camera, and measures a three-dimensional shape of the measurement target by image processing and 3
  • the present invention relates to a three-dimensional shape measuring apparatus.
  • a spatial coding method is known as a method for measuring a three-dimensional shape of a measurement target by projecting and photographing a pattern once.
  • this spatial coding method a three-dimensional shape for reconstructing a three-dimensional shape by projecting a pattern in which black and white graphic codes having a circular shape are arranged in a two-dimensional series onto a measurement target and photographing the measurement target A measurement method has been proposed (see, for example, Patent Document 1).
  • the present invention has been made in view of the above points, and a three-dimensional shape measurement method capable of measuring a three-dimensional shape of a measurement object by one projection and photographing operation of pattern light while ensuring spatial resolution. And it aims at providing a three-dimensional shape measuring device.
  • the three-dimensional shape measurement method of the present invention includes a projecting step of projecting pattern light on which a plurality of light and dark codes are arranged onto a measurement object, a photographing step of photographing the measurement object onto which the pattern light is projected, and the measurement object
  • a three-dimensional shape measuring method comprising: a dimension position calculating step, wherein the light / dark code includes a central element and one or a plurality of peripheral elements arranged around the central element, and the arrangement of the peripheral elements Thus, the type of the light / dark code is identified.
  • the central element and the peripheral elements arranged around the central element are used for the pattern light used when measuring the three-dimensional shape of the measurement target by projecting and photographing the pattern once.
  • the type of the light / dark code is identified by the arrangement of the peripheral elements.
  • chord for a detection and identification can be reduced.
  • the number of codes that can be detected per unit area by the image sensor can be increased, and the spatial resolution can be improved.
  • the pattern light may include a code group in which a predetermined number of the light and dark codes are arranged in the first direction as a structural unit, and the structural unit is in the first direction. It is preferable that the pattern is repeatedly arranged in a second direction perpendicular to the vertical direction.
  • the pattern light includes a code group in which a predetermined number of the light and dark codes are arranged in a first direction parallel to the epipolar plane, and the structural unit includes the first direction and the epipolar plane. It is preferable that the pattern is configured by being repeatedly arranged in a second direction perpendicular to the first direction.
  • the two directions orthogonal to the epipolar plane (such as a two-dimensional array pattern)
  • the number of codes can be reduced as compared with the case of encoding in a direction parallel to and perpendicular to the epipolar plane, the number of bits necessary to represent all codes can be reduced.
  • the code when the code moves in the direction parallel to the epipolar plane (first direction) after projection, it can be distinguished from the same code in the adjacent code group (disparity between the parallax deviation between the projection pattern and the shooting pattern)
  • the discriminable width can be long with a small number of bits. As a result, a long measurement range in the depth direction can be secured, and an increase in calculation cost can be suppressed.
  • the pattern light has the common peripheral element disposed between the central elements of the adjacent light and dark codes, and the adjacent light and dark codes are continuously connected. It is preferable that In this case, since neighboring elements are shared by adjacent light and dark codes, the density of the light and dark codes arranged in the pattern light can be increased. Thereby, the number of codes that can be detected by the image sensor can be increased, and the spatial resolution can be further improved.
  • the central element of the light / dark code is extracted and the position information of the light / dark code is acquired from the position of the central element.
  • the position information of the light / dark code is acquired based on the position of the central element, it is not necessary to recognize the entire shape of the light / dark code, and the processing for this can be omitted, thereby further suppressing an increase in calculation cost. Is possible.
  • the light / dark code has four positions where the peripheral elements are arranged around the central element.
  • the peripheral elements since four peripheral elements can be arranged around the central element, it is possible to realize a 4-bit code with one light / dark code depending on the presence or absence of these peripheral elements.
  • the light and dark code may be arranged such that the peripheral element is oblique to the arrangement direction of the light and dark code when viewed from the central element.
  • the peripheral elements are arranged so as to be oblique to the light / dark code arrangement direction when viewed from the central element, the direction of the peripheral elements is parallel or perpendicular to the light / dark code arrangement direction.
  • the length of the peripheral elements can be ensured as compared with the case where they are arranged in any direction. Thereby, it becomes possible to improve the discriminability of the presence / absence of peripheral elements in the light / dark code.
  • the pattern light projected in the projection step has a wavelength other than visible light.
  • an invisible wavelength band such as infrared light for the pattern light
  • it is possible to measure a three-dimensional shape without hindering the action of a person or the like to be measured for example, driving operation of a vehicle or the like).
  • the three-dimensional shape measurement apparatus of the present invention includes a projection unit that projects pattern light on which a plurality of light and dark codes are arranged onto a measurement target, an imaging unit that captures the measurement target on which the pattern light is projected, and the measurement target. 3 based on the extraction unit for extracting the light / dark code from the photographed image, the identification unit for identifying the type of the light / dark code extracted by the extraction unit, and the position information of each light / dark code identified by the identification unit.
  • a three-dimensional shape measuring apparatus comprising: a calculation unit that calculates a dimensional position, wherein the light / dark code includes a central element and one or a plurality of peripheral elements arranged around the central element; The type of the light / dark code is identified by the arrangement of the elements.
  • the central element and the peripheral elements arranged around the central element are used for pattern light used when measuring the three-dimensional shape of the measurement target by projecting and photographing the pattern once.
  • a plurality of light / dark codes consisting of are arranged, and the type of the light / dark code is identified by the arrangement of the peripheral elements. For this reason, compared with the case where a figure code is used, the number of pixels required for one code
  • the pattern light projected by the projection unit includes a code group in which a predetermined number of the plurality of bright and dark codes are arranged in a first direction as a structural unit, and the structural unit is the A pattern that is repeatedly arranged in a second direction perpendicular to the first direction is preferable.
  • the pattern light projected by the projection unit includes a code group in which a predetermined number of light and dark codes are arranged in a first direction parallel to the epipolar plane, and the structural unit is the first light. It is preferable that the pattern is configured by being repeatedly arranged in the first direction and the second direction perpendicular to the epipolar plane.
  • the pattern light is encoded in two directions orthogonal to the epipolar plane (a direction parallel to and perpendicular to the epipolar plane) as in a two-dimensional array pattern
  • the encoding is performed only in the direction parallel to the surface (first direction)
  • the maximum discriminable width that can discriminate the parallax deviation between the projection pattern and the imaging pattern can be increased with a small number of bits.
  • a long measurement range in the depth direction can be secured, and an increase in calculation cost can be suppressed.
  • the present invention it is possible to measure the three-dimensional shape of the measurement object by one projection and photographing operation of the pattern light while ensuring the spatial resolution.
  • the present invention relates to a peripheral element that is arranged around a central element and a central element in the pattern light in a spatial coding method of capturing a measurement target onto which the pattern light is projected and measuring a three-dimensional shape based on the captured image.
  • a spatial coding method of capturing a measurement target onto which the pattern light is projected and measuring a three-dimensional shape based on the captured image are arranged, and the type of the light / dark code is identified by the arrangement of peripheral elements, thereby reducing the number of pixels required for one code and ensuring spatial resolution.
  • FIG. 1 is a block diagram showing a configuration of a three-dimensional shape measuring apparatus according to an embodiment of the present invention. Note that the three-dimensional shape measuring apparatus shown in FIG. 1 is simplified for explaining the present invention.
  • the three-dimensional shape measuring apparatus according to the present invention is not limited to the structure shown in FIG. 1, but is a structure necessary for measuring a three-dimensional shape (for example, a display device for confirming a photographed measurement object) Etc.) may be provided separately.
  • the three-dimensional shape measurement apparatus according to the present embodiment is applied to, for example, a gesture motion input apparatus that is mounted on an automobile and receives an operation of a desired device by detecting the movement of a driver's hand or finger.
  • the three-dimensional shape measurement apparatus 10 is configured to project a projection apparatus 11 that projects pattern light onto a measurement object 20, an imaging apparatus 12 that captures the measurement object 20, and a captured image captured by the imaging apparatus 12. And a processing device 13 that performs image processing and the like.
  • the projection device 11 and the imaging device 12 constitute a projection unit and an imaging unit in the claims, respectively.
  • Projection device 11 is constituted by, for example, a projector.
  • the projection device 11 projects a predetermined pattern light onto the measurement target 20 under the control of the projection device control unit 131 of the processing device 13 described later.
  • the predetermined pattern light will be described later.
  • the imaging device 12 is configured with, for example, a camera.
  • the imaging device 12 images the measurement target 20 onto which a predetermined pattern light is projected.
  • the imaging device 12 outputs the image data (captured image) of the measured measurement target 20 to the image capturing unit 132 of the processing device 13 described later.
  • the projection apparatus 11 and the imaging apparatus 12 fixed at predetermined positions are used. That is, the projection device 11 is arranged so that the pattern light can be projected at a predetermined position.
  • the photographing device 12 is arranged so that a certain range including the position where the pattern light is projected by the projection device 11 can be photographed. It is assumed that the projection device 11 and the photographing device 12 have previously obtained internal and external parameters and secured time synchronization.
  • the processing device 13 includes a projection device control unit 131 that controls the projection device 11, an image capture unit 132 that captures image data from the imaging device 12, and a computation unit that performs computations necessary to measure the three-dimensional shape of the measurement target 20.
  • the calculation unit 133 includes a code extraction unit 133a, a code identification unit 133b, a corresponding point calculation unit 133c, and a three-dimensional position calculation unit 133d.
  • the code extracting unit 133a and the code identifying unit 133b constitute an extracting unit and an identifying unit in the claims, respectively, and the corresponding point calculating unit 133c and the three-dimensional position calculating unit 133d are calculated in the claims. Parts.
  • Projection device control unit 131 controls projection device 11.
  • the projection device control unit 131 controls the projection device 11 in response to an instruction from the control unit of the device main body on which the three-dimensional shape measurement device 10 is mounted.
  • the projection device 11 is controlled in accordance with an instruction from an electronic control unit (ECU) that controls the entire vehicle.
  • ECU electronice control unit
  • Examples of the control target in the projection device control unit 131 include the type of pattern light projected on the measurement target 20 and the projection timing thereof.
  • the image capturing unit 132 captures image data (captured image) of the measurement target 20 input from the imaging device 12. In addition, the image capturing unit 132 outputs the captured image data to the arithmetic unit 133. Specifically, image data obtained by photographing the measurement target 20 onto which a predetermined pattern light is projected is captured, and the image data is output to the calculation unit 133. The calculation unit 133 performs a predetermined calculation process on the image data (captured image of the measurement target 20 onto which a predetermined pattern light is projected) input from the image capturing unit 132, thereby obtaining a three-dimensional shape of the measurement target 20. Perform necessary calculations to measure.
  • FIG. 2 is a diagram illustrating an example of pattern light used in the three-dimensional shape measurement apparatus 10 according to the present embodiment. Note that FIG. 2 shows a case where the pattern light is composed of visible light for convenience of explanation. In the pattern light shown in FIG. 2, the light projection position by the projection device 11 is shown in black, and the light non-projection position is shown in white. The same applies to the following drawings showing pattern light.
  • the pattern light used in the three-dimensional shape measurement apparatus 10 preferably has a wavelength other than visible light.
  • an invisible wavelength band such as infrared light for the pattern light, it is possible to perform measurement of a three-dimensional shape without making the person to be measured 20 or the person in the vicinity thereof aware of it.
  • the pattern light shown in FIG. 2 includes a light / dark code in which the presence / absence of light projected at a predetermined position is coded. Specifically, in the pattern light shown in FIG. 2, a plurality of light and dark codes are arranged. These light and dark codes are arranged according to a predetermined rule. As will be described in detail later, the light and dark codes constituting the pattern light share a part with the adjacent light and dark codes and are configured continuously.
  • FIG. 3 is an explanatory diagram of the light / dark code 30 constituting the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment.
  • FIG. 3A shows one light / dark code 30 constituting the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment
  • FIG. 3B shows a basic pattern of the light / dark code 30.
  • FIG. 3 also shows a central element 31 of adjacent light and dark codes 30.
  • each light / dark cord 30 includes a central element 31 and a plurality (four in this embodiment) of arms 32 (32a to 32d) arranged around the central element 31. It consists of.
  • the central element 31 has a circular shape
  • the arm 32 has a rectangular shape.
  • the shapes of the central element 31 and the arm 32 are not limited to these and can be changed as appropriate. In the following description, it is assumed that the center element 31 has a circular shape and the arm 32 has a rectangular shape.
  • the arms 32a to 32d are continuously arranged at predetermined positions on the outer edge of the central element 31 having a circular shape.
  • the arms 32a to 32d are arranged at equal intervals (specifically, 90 ° intervals) from the outer edge of the central element 31.
  • the arm 32a extends from the center point of the center element 31 obliquely upward to the right as shown in FIG. 3A with reference to a horizontal plane passing through the center point of the center element 31, and the arm 32b is a horizontal plane passing through the center point of the center element 31. Is defined as a diagonally lower right portion shown in FIG. 3A from the center point of the center element 31.
  • the arm 32c extends obliquely downward to the left as shown in FIG.
  • the tips of the arms 32a to 32d are connected to the central element 31 of the adjacent light / dark cord 30.
  • the arm 32a is connected to the central element 31 of the light / dark cord 30 located diagonally upward to the right shown in FIG. 3A
  • the arm 32b is connected to the central element 31 of the light / dark cord 30 located diagonally downward to the right shown in FIG. 3A.
  • the arm 32c is connected to the central element 31 of the light / dark cord 30 located diagonally downward to the left shown in FIG. 3A
  • the arm 32d is connected to the central element 31 of the light / dark cord 30 located diagonally upward to the left shown in FIG. 3A.
  • the central element 31 of the adjacent light and dark cords 30 is indicated as “central element 31 ′”.
  • the light / dark code 30 is a code (4-bit code) that can express 16 types of information depending on the presence / absence of the four arms 32a to 32d connected to the central element 31. (See FIG. 3B).
  • the light / dark code 30a in which all the four arms 32a to 32d exist is specified by the bit information of “1111”.
  • the light / dark code 30b in which all of the four arms 32a to 32d do not exist is specified by bit information “0000”, and the light / dark code 30c in which only the arms 32a and 32c exist is specified by bit information “0101”.
  • such a light / dark code 30 is continuously arranged in the X-axis and Y-axis directions shown in FIG.
  • the light / dark code 301 shown in FIG. 2 is continuous with the light / dark codes 302 to 305 arranged in the periphery.
  • the light / dark code 302 is disposed on the upper right side of the light / dark code 301
  • the light / dark code 303 is disposed on the lower right side of the light / dark code 301.
  • the light / dark code 304 is disposed on the lower left side of the light / dark code 301
  • the light / dark code 305 is disposed on the upper left side of the light / dark code 301.
  • the arm 32a of the light / dark cord 301 constitutes an arm 32c of the light / dark cord 302
  • the arm 32b of the light / dark cord 301 constitutes an arm 32d of the light / dark cord 303.
  • the arm 32c of the light / dark cord 301 constitutes an arm 32a of the light / dark cord 304
  • the arm 32d of the light / dark cord 301 constitutes an arm 32b of the light / dark cord 305. That is, the arms 32a to 32d of the light / dark cord 301 are shared with a part of the arms 32 of the light / dark cords 302 to 305 arranged in the periphery.
  • the density of the light / dark code 30 arranged in the pattern light can be increased.
  • a predetermined number (15 in the present embodiment) of a plurality of light and dark codes 20 are arranged in the X-axis direction shown in FIG.
  • the code group 300 is configured in a pattern in which the code group 300 is repeatedly arranged in the X-axis direction. In the code group 300 shown in FIG. 2, 15 different light and dark codes 30 are arranged in a predetermined order.
  • the light / dark code 30 specified by the bit information “1001” is arranged on the rightmost side. Then, toward the left side, bit information “0100”, “1100”, “1101”, “0111”, “1101”, “1000”, “0110”, “0010”, “0001”, “1111” , “1110”, “0101”, “0011”, and the light / dark code 30 specified by the bit information “1010” are arranged on the leftmost side.
  • the code group 300 has a width that can be distinguished from the same code in the adjacent code group 300 when the code moves in the X-axis direction after projection (a discriminable width that can distinguish the parallax deviation between the projection pattern and the imaging pattern). Constitute. That is, the parallax deviation after the projection of the pattern light can be specified within the range of the width of the code group 300 (discriminable width).
  • a pattern in which such code groups 300 are repeatedly arranged in the X-axis direction is repeatedly arranged in the Y-axis direction. That is, the pattern light shown in FIG. 2 is configured by pattern light in which the code group 300 is repeatedly arranged in both the X-axis and Y-axis directions. In other words, the pattern light shown in FIG. 2 is encoded only in a certain range in the X-axis direction (a range corresponding to 15 light / dark codes 30), and is not encoded in the Y-axis direction. In the three-dimensional shape measurement apparatus 10, the pattern light shown in FIG. 2 is projected from the projection apparatus 11 onto the measurement object 20, and the measurement object 20 onto which the pattern light is projected is imaged by the imaging apparatus 12.
  • FIG. 4 is a schematic diagram for explaining the relationship between the light / dark code 30 and the number of pixels used in the three-dimensional shape measuring apparatus 10 according to the present embodiment.
  • the light / dark code 30 according to the present embodiment can be represented by a total of 36 pixels, for example, 6 pixels arranged in the vertical direction and 6 pixels arranged in the horizontal direction. it can.
  • the light / dark code 30 according to the present embodiment since the type is detected based on the light and darkness of these pixels, the light / dark code 30 is used even in a situation where the outline is not clearly identified due to the small number of pixels. Can be detected appropriately. As a result, the number of codes that can be detected per unit area by the image sensor can be increased, and the spatial resolution can be improved.
  • the code when detecting a pattern in which a graphic code is arranged in a two-dimensional series, the code is identified by applying a graphic code (for example, a graphic code having an elliptical shape as in Patent Document 1 described in Background Art). Therefore, for example, it is necessary to appropriately represent a curve or the like included in the graphic code. For this reason, there is a certain limitation on the reduction of the number of pixels representing the graphic code. For this reason, the number of figure codes that can be detected per unit area by the image sensor cannot be increased, and it is difficult to improve the spatial resolution.
  • a graphic code for example, a graphic code having an elliptical shape as in Patent Document 1 described in Background Art
  • the calculation unit 133 includes the code extraction unit 133a, the code identification unit 133b, the corresponding point calculation unit 133c, and the three-dimensional position calculation unit 133d, and is necessary for measuring the three-dimensional shape of the measurement target 20. Perform the operation.
  • the code extraction unit 133a extracts the central element 31 of the light / dark code 30 from the image data input from the image capturing unit 132 (a captured image of the measurement target 20 onto which a predetermined pattern light is projected). For example, the code extraction unit 133a extracts center point information (center coordinate information) of the center element 31 of the light / dark code 30 based on luminance information in the captured image. More specifically, the code extraction unit 133a extracts center point information (center coordinate information) of the center element 31 of the light / dark code 30 from the maximum luminance point in the captured image. For example, the code extraction unit 133a acquires the position information of the corresponding light / dark code 30 from the central point information of the central element 31 of the extracted light / dark code 30. The code extraction unit 133a outputs the acquired position information of the light / dark code 30 to the code identification unit 133b.
  • the code identifying unit 133b identifies the type of the light / dark code 30 based on the position information of the light / dark code 30 input from the code extracting unit 133a from the image data input from the image capturing unit 132. Specifically, the type of the light / dark code 30 is identified by the presence / absence of the arms 32a to 32d arranged around the central element 31. Moreover, the code identification part 133b specifies the position in the code group 300 of the light / dark code 30 to be identified. For example, the code identifying unit 133b identifies the position of the light / dark code 30 to be identified by comparison with the arrangement of the light / dark code 30 of the code group 300 held in advance.
  • the code identifying unit 133b identifies the light / dark code 30 to be identified by the bit information “1111” shown in FIG. 3A. 30a is identified. In this case, the code identifying unit 133b identifies the position of the light / dark code 30 to be identified as the fifth position from the left in the code group 300 illustrated in FIG. The code identification unit 133b outputs the identified type of the light / dark code 30 and the position in the identified code group 300 to the corresponding point calculation unit 133c.
  • the corresponding point calculation unit 133c calculates the corresponding point of the light / dark code 30 to be calculated in the projection image projected by the projection device 131 based on the type of the light / dark code 30 input from the code identification unit 133b and the position in the code group 300. To do. Specifically, the corresponding point of the light / dark code 30 to be calculated in the projection image is calculated by comparing the position of the corresponding light / dark code 30 in the code group 300 in the projection image with the position of the light / dark code 30 from the code identification unit 133b. To do. The corresponding point calculation unit 133c outputs information about the calculated corresponding point (hereinafter referred to as “corresponding point information”) to the three-dimensional position calculation unit 133d.
  • corresponding point information information about the calculated corresponding point
  • the three-dimensional position calculation unit 133d calculates a three-dimensional position corresponding to the light / dark code 30 to be calculated based on the corresponding point information input from the corresponding point calculation unit 133c. Specifically, the three-dimensional position calculation unit 133d acquires the depth coordinate from the positional deviation before and after the projection (deviation due to parallax) in the central element 31 of the corresponding light / dark code 30, and the brightness / darkness to be calculated from the depth coordinate. A three-dimensional position corresponding to the code 30 is calculated. The three-dimensional position calculation unit 133d outputs the calculated three-dimensional position to the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 is mounted. It is possible to measure the three-dimensional shape of the measurement target 20 by calculating the three-dimensional positions for all the light and dark codes 30 projected on the measurement target 20.
  • FIG. 5 is an explanatory diagram of depth information regarding an arbitrary point P of the measurement target 20 in the three-dimensional shape measurement apparatus 10 according to the present embodiment.
  • FIG. 5A the positional relationship between the measurement target 20 and the projection device 11 and the imaging device 12 in the three-dimensional shape measurement device 10 according to the present embodiment is shown.
  • FIG. 5B schematically shows a light receiving surface of a CCD (Charge Coupled Device) image sensor 121 included in the photographing apparatus 12.
  • CCD Charge Coupled Device
  • the imaging device 12 is disposed at a position on the opposite side across the projection position of the pattern light with respect to the measurement target 20 by the projection device 11.
  • the X axis (see FIG. 2) of the pattern light projected by the projection device 11 is the three points of the principal point C1 of the projection device 11, the principal point C2 of the photographing device 12, and an arbitrary point P on the measurement target 20. It is arranged in parallel with the epipolar surface EP formed by
  • the photographing apparatus 12 includes a CCD image sensor 121 in which imaging elements are arranged in parallel with the X-axis and Y-axis directions of the pattern light shown in FIG.
  • the X axis of the CCD image sensor 121 shown in FIG. 5B is arranged in parallel with the X axis of the pattern light shown in FIG. 2, and the Y axis of the image sensor shown in FIG. 5B is parallel to the Y axis of the pattern light shown in FIG. Is arranged.
  • the imaging device on the X axis of the imaging device 12 includes an epipolar plane EP formed by three points: a principal point C1 of the projection device 11, a principal point C2 of the imaging device 12, and an arbitrary point P on the measurement target 20. They are arranged in parallel.
  • Such a deviation between the reflection value Xmin and the reflection value Xa is acquired as depth information at point P (depth distance from the virtual reference plane Zmin).
  • a line (epipolar line) EL connecting the reflection value Xmin and the reflection value Xa used when obtaining depth information regarding an arbitrary point P on the measurement target 20 is, as shown in FIG. It changes only in the X-axis direction without changing in the Y-axis direction, and forms a straight line parallel to the X-axis.
  • FIG. 6 is a flowchart for explaining the operation of the three-dimensional shape measuring apparatus 10 according to the present embodiment.
  • FIG. 6 shows the operation of the processing device 13 of the three-dimensional shape measuring apparatus 10.
  • FIG. 6 it is assumed that three-dimensional shape measurement is instructed from the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 according to the present embodiment is mounted.
  • the captured image captured by the image capturing unit 132 is output to the computing unit 133.
  • the code extraction unit 133a extracts the center point information (center coordinate information) of the center element 31 of the light / dark code 30 included in the captured image (ST602).
  • the code extraction unit 133a acquires the position information of the corresponding light / dark code 30 from the center point information of the central element 31 of the extracted light / dark code 30.
  • the position information of the light / dark code 30 extracted by the code extraction unit 133a is output to the code identification unit 133b.
  • the central element 31 of the light / dark code 30 is extracted by the code extraction unit 133a, and the position information of the light / dark code 30 is obtained from the central point information of the central element 31. get.
  • the position information of the light / dark code 30 is acquired based on the position of the central element 31, so that it is not necessary to recognize the shape of the entire light / dark code 30, and the processing for this can be omitted, so it is necessary for detecting and identifying the code It is possible to further suppress the increase in the calculation cost.
  • the code identifying unit 133b Upon receiving the position information of the light / dark code 30, the code identifying unit 133b identifies the type of the light / dark code 30 (ST603).
  • the code identification unit 133b identifies the type of the light / dark code 30 based on the presence / absence of the arms 32a to 32d arranged around the central element 31. In this case, the code identifying unit 133b identifies the position in the code group 300 of the light / dark code 30 to be identified.
  • the type of the light / dark code 30 and the position of the light / dark code 30 in the code group 300 are output to the corresponding point calculation unit 133c.
  • the corresponding point calculation unit 133c Upon receiving information such as the position of the light / dark code 30 in the code group 300, the corresponding point calculation unit 133c calculates the corresponding point of the light / dark code 30 to be calculated in the projection image projected by the projection device 131 (ST604). In this case, the corresponding point of the light / dark code 30 to be calculated in the projection image is calculated by comparing the position of the corresponding light / dark code 30 in the code group 300 in the projection image with the position of the light / dark code 30 from the code identification unit 133b. . Then, the corresponding point information calculated by the corresponding point calculating unit 133c is output to the three-dimensional position calculating unit 133d.
  • the three-dimensional position calculation unit 133d calculates a three-dimensional position corresponding to the light / dark code 30 to be calculated (ST605).
  • the three-dimensional position calculation unit 133d acquires the depth coordinate from the deviation between the reflection value from the virtual reference plane and the reflection value from the actual position in the center element 31 of the corresponding light / dark code 30, and calculates the calculation target from the depth coordinate.
  • a three-dimensional position corresponding to the light / dark code 30 is calculated.
  • the three-dimensional position calculated by the three-dimensional position calculation unit 133d is output to the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 is mounted.
  • the calculation unit 133 determines whether the processing has been completed for the entire captured image (that is, all the light / dark codes 30) (ST606). If the process has not been completed for the entire captured image, operation unit 133 returns the process to ST602 and repeats the processes of ST602 to ST606. On the other hand, when the process has been completed for the entire surface of the captured image, the arithmetic unit 133 ends the process.
  • a plurality of light / dark codes 30 including arms 32 arranged around the central element 31 are arranged, and the type of the light / dark code 30 is identified by the arrangement of the arms 32.
  • chord for a detection and identification can be reduced.
  • the number of codes (code density) that can be detected per unit area by the image sensor can be increased, and the spatial resolution can be improved.
  • the pattern light projected onto the measurement target 20 is a direction parallel to the epipolar plane of the plurality of light / dark codes 30 (X-axis direction shown in FIG. 2).
  • a code group 300 arranged in a predetermined number is used as a constituent unit, and the constituent unit 300 is repeatedly arranged.
  • the pattern light is encoded only in a direction parallel to the epipolar plane, two directions orthogonal to the epipolar plane (two-dimensional array pattern (two-dimensional random point cloud pattern)) ( Since the number of codes can be reduced as compared with the case of encoding in a direction parallel to and perpendicular to the epipolar plane, the number of bits necessary to represent all codes can be reduced.
  • the code when the code moves in the direction parallel to the epipolar plane (first direction) after projection, it can be distinguished from the same code in the adjacent code group (disparity between the parallax deviation between the projection pattern and the shooting pattern)
  • the discriminable width can be long with a small number of bits. As a result, a long measurement range in the depth direction can be secured, and an increase in calculation cost can be suppressed.
  • the pattern light projected onto the measurement target 20 has a common arm 32 disposed between the central elements 31 of the adjacent light and dark codes 30 and is continuous. It is connected to.
  • the arm 32 is shared between the adjacent light and dark cords 30, the density of the light and dark cords 30 arranged in the pattern light can be increased.
  • the number of codes that can be detected by the CCD image sensor 121 of the photographing apparatus 12 can be increased, and the spatial resolution can be further improved.
  • the light / dark cord 30 has the extending direction of the arms 32a to 32d viewed from the central element 31 in the arrangement direction of the light / dark cord 30 (X-axis direction shown in FIG. 2).
  • the arms 32a to 32d are arranged in an oblique direction.
  • the length of the arm 32 can be secured as compared with the case where the extending direction of the arm 32 is arranged in a direction parallel or perpendicular to the arrangement direction of the light and dark cords 30. This makes it possible to improve the discrimination of the position of the central element 31 in the light / dark code 30 and the presence / absence of the arms 32a to 32d.
  • this invention is not limited to the said embodiment, It can implement by changing variously.
  • the configuration and the like illustrated in the accompanying drawings are not limited to this, and can be appropriately changed within a range in which the effect of the present invention is exhibited.
  • various modifications can be made without departing from the scope of the object of the present invention.
  • each light / dark code 30 is constituted by a 4-bit code.
  • the configuration of each light / dark code 30 is not limited to this, and can be changed as appropriate.
  • the light / dark code 30 may be composed of a 3-bit code capable of expressing eight types of information or an 8-bit code capable of expressing 256 types of information according to the amount of information to be expressed.
  • the number of light / dark codes 30 constituting the code group 300 can be adjusted as appropriate according to the amount of information that the light / dark code 30 can express (that is, the distinguishable width can be adjusted).
  • the case where the light / dark code 30 included in the pattern light includes a plurality of arms 32 as peripheral elements has been described.
  • the configuration of the peripheral elements of the light / dark code 30 is not limited to this and can be appropriately changed.
  • the case where the light-and-dark code 30 contained in pattern light is provided with the circular center element 31 is demonstrated.
  • the configuration of the central element 31 of the light / dark cord 30 is not limited to this and can be changed as appropriate.
  • FIG. 7 is an explanatory diagram of a light / dark code 30 according to a modification of the present embodiment.
  • the light / dark cord 30 in a mode not connected to the central element 31 of the adjacent light / dark cord 30 is shown.
  • 7B and 7C show an aspect in which the central element constituting the light / dark cord 30 and the peripheral elements arranged around the central element have the same shape.
  • FIG. 7B shows a case where both the central element and the peripheral element have a circular shape
  • FIG. 7C shows a case where both the central element and the peripheral element have a square shape.
  • FIG. 7D shows a case where eight peripheral elements are arranged around the central element 31. That is, in FIG.
  • an 8-bit code light / dark code 30 is shown. Even when the form of the light / dark code 30 is modified as described above, the three-dimensional shape of the measurement object is measured by one pattern light projection and photographing operation while ensuring the spatial resolution, as in the above embodiment. It becomes possible to do.
  • a three-dimensional shape measurement method for measuring a three-dimensional shape at the moment by one imaging is described.
  • dynamic measurement (motion input) of a three-dimensional shape by measuring the three-dimensional shape at a predetermined time interval by such a three-dimensional shape measurement method.
  • the arrangement direction of the light / dark code 30 is parallel to the epipolar plane.
  • the arrangement direction of the light / dark code 30 is not limited to this and can be changed as appropriate.
  • the light / dark code 30 may be arranged along a direction slightly inclined with respect to the epipolar plane. Even in the case of such changes, the same effects as in the above embodiment can be obtained.

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Abstract

[Problem] To measure the three-dimensional shape of an object to be measured using projection of a one-time pattern light and an imaging operation while maintaining spatial resolution. [Solution] A three-dimensional shape measurement device (10) in which: pattern light having a plurality of light-dark codes aligned therein is projected onto an object to be measured (20) from a projection device (11); an image of the object to be measured having the pattern light projected thereonto is captured by an imaging device (12); the light-dark codes are extracted by a processing device (13) from the captured image obtained by capturing an image of the object to be measured; the types of the extracted light-dark codes are identified; and a three-dimensional position is calculated from position information for each of the identified light-dark codes. The three-dimensional shape measurement device (10) is characterized in that the light-dark codes comprise a central element and one or more peripheral elements that are arranged at the periphery of the central element, and the types of the light-dark codes are identified from the arrangement of the peripheral elements.

Description

３次元形状計測方法及び３次元形状計測装置3D shape measuring method and 3D shape measuring apparatus
　本発明は、プロジェクタ等の投影装置からパターン光が投影された計測対象を、カメラ等の撮像装置で撮影し、画像処理により計測対象の３次元形状を計測するための３次元形状計測方法及び３次元形状計測装置に関する。 The present invention captures a measurement target onto which pattern light has been projected from a projection apparatus such as a projector with an imaging apparatus such as a camera, and measures a three-dimensional shape of the measurement target by image processing and 3 The present invention relates to a three-dimensional shape measuring apparatus.
　従来、１回のパターンの投影及び撮影により計測対象の３次元形状を計測する方法として、空間コード化法が知られている。例えば、この空間コード化法においては、円形状を有する白黒の図形コードを２次元系列に配列したパターンを計測対象に投影し、その計測対象を撮影することで３次元形状を復元する３次元形状計測方法が提案されている（例えば、特許文献１参照）。 Conventionally, a spatial coding method is known as a method for measuring a three-dimensional shape of a measurement target by projecting and photographing a pattern once. For example, in this spatial coding method, a three-dimensional shape for reconstructing a three-dimensional shape by projecting a pattern in which black and white graphic codes having a circular shape are arranged in a two-dimensional series onto a measurement target and photographing the measurement target A measurement method has been proposed (see, for example, Patent Document 1).
特開２０１１－２３７２９６号公報JP 2011-237296 A
　しかしながら、上述した特許文献１に記載の３次元形状計測方法においては、図形コードを２次元系列に配列したパターンを用いることから、検出及び識別のために１つのコードに必要となる画素数が多くなる。この結果、撮像素子にて単位面積当たりに検出できるコードの数を増やすことができず、空間分解能を向上することが困難であるという問題がある。 However, in the three-dimensional shape measurement method described in Patent Document 1 described above, since a pattern in which graphic codes are arranged in a two-dimensional series is used, a large number of pixels are required for one code for detection and identification. Become. As a result, there is a problem in that it is difficult to increase the number of codes that can be detected per unit area by the imaging device, and it is difficult to improve the spatial resolution.
　本発明は、かかる点に鑑みてなされたものであり、空間分解能を確保しつつ、１回のパターン光の投影及び撮影動作により計測対象の３次元形状を計測することができる３次元形状計測方法及び３次元形状計測装置を提供することを目的とする。 The present invention has been made in view of the above points, and a three-dimensional shape measurement method capable of measuring a three-dimensional shape of a measurement object by one projection and photographing operation of pattern light while ensuring spatial resolution. And it aims at providing a three-dimensional shape measuring device.
　本発明の３次元形状計測方法は、複数の明暗コードが配列されたパターン光を計測対象に投影する投影ステップと、前記パターン光が投影された前記計測対象を撮影する撮影ステップと、前記計測対象を撮影した撮影画像から前記明暗コードを抽出するコード抽出ステップと、抽出した前記明暗コードの種類を識別するコード識別ステップと、識別したそれぞれの前記明暗コードの位置情報より３次元位置を算出する３次元位置算出ステップと、を具備する３次元形状計測方法であって、前記明暗コードは、中心要素と前記中心要素の周りに配置される１つ又は複数の周辺要素からなり、前記周辺要素の配置により当該明暗コードの種類が識別されることを特徴とする。 The three-dimensional shape measurement method of the present invention includes a projecting step of projecting pattern light on which a plurality of light and dark codes are arranged onto a measurement object, a photographing step of photographing the measurement object onto which the pattern light is projected, and the measurement object A code extracting step for extracting the light / dark code from the photographed image, a code identifying step for identifying the type of the extracted light / dark code, and calculating a three-dimensional position from position information of each identified light / dark code 3 A three-dimensional shape measuring method comprising: a dimension position calculating step, wherein the light / dark code includes a central element and one or a plurality of peripheral elements arranged around the central element, and the arrangement of the peripheral elements Thus, the type of the light / dark code is identified.
　上記３次元形状計測方法によれば、１回のパターンの投影及び撮影により計測対象の３次元形状を計測する際に利用されるパターン光に、中心要素と中心要素の周りに配置される周辺要素とからなる複数の明暗コードが配列され、その明暗コードの種類が周辺要素の配置により識別される。このため、図形コードを用いる場合と比べて検出及び識別のために１つのコードに必要となる画素数を低減できる。これにより、撮像素子にて単位面積当たりに検出できるコードの数を増やすことができ、空間分解能を向上できる。この結果、空間分解能を確保しつつ、１回のパターン光の投影及び撮影動作により計測対象の３次元形状を計測することが可能となる。 According to the above three-dimensional shape measurement method, the central element and the peripheral elements arranged around the central element are used for the pattern light used when measuring the three-dimensional shape of the measurement target by projecting and photographing the pattern once. Are arranged, and the type of the light / dark code is identified by the arrangement of the peripheral elements. For this reason, compared with the case where a figure code is used, the number of pixels required for one code | cord | chord for a detection and identification can be reduced. Thereby, the number of codes that can be detected per unit area by the image sensor can be increased, and the spatial resolution can be improved. As a result, it is possible to measure the three-dimensional shape of the measurement object by one projection and photographing operation of pattern light while ensuring the spatial resolution.
例えば、上記３次元形状計測方法において、前記パターン光は、複数の前記明暗コードを第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向に対して垂直な第２の方向に繰り返し配列されてなるパターンであることが好ましい。特に、前記パターン光は、複数の前記明暗コードをエピポーラ面に対して平行な第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向及びエピポーラ面に対して垂直な第２の方向に繰り返し配列されてなるパターンで構成されることが好ましい。この場合には、パターン光が、エピポーラ面に対して平行な方向（第１の方向）のみにコード化されることから、２次元配列パターンのように、エピポーラ面に対して直交する２方向（エピポーラ面に対して平行な方向及び垂直な方向）にコード化される場合と比較して、コード数を少なくできるので、全てのコードを表すために必要なビット数を低減できる。これに伴い、投影後にコードがエピポーラ面に対して平行な方向（第１の方向）に動いた時に隣のコード群における同一のコードと区別できる幅（投影パターンと撮影パターンとの視差ずれを弁別できる弁別可能幅）を少ないビット数で長く取ることができる。これにより、奥行き方向の計測レンジを長く確保でき、演算コストの上昇を抑制することが可能となる。 For example, in the above three-dimensional shape measurement method, the pattern light may include a code group in which a predetermined number of the light and dark codes are arranged in the first direction as a structural unit, and the structural unit is in the first direction. It is preferable that the pattern is repeatedly arranged in a second direction perpendicular to the vertical direction. In particular, the pattern light includes a code group in which a predetermined number of the light and dark codes are arranged in a first direction parallel to the epipolar plane, and the structural unit includes the first direction and the epipolar plane. It is preferable that the pattern is configured by being repeatedly arranged in a second direction perpendicular to the first direction. In this case, since the pattern light is encoded only in the direction parallel to the epipolar plane (first direction), the two directions orthogonal to the epipolar plane (such as a two-dimensional array pattern) ( Since the number of codes can be reduced as compared with the case of encoding in a direction parallel to and perpendicular to the epipolar plane, the number of bits necessary to represent all codes can be reduced. Along with this, when the code moves in the direction parallel to the epipolar plane (first direction) after projection, it can be distinguished from the same code in the adjacent code group (disparity between the parallax deviation between the projection pattern and the shooting pattern) The discriminable width) can be long with a small number of bits. As a result, a long measurement range in the depth direction can be secured, and an increase in calculation cost can be suppressed.
　特に、上記３次元形状計測方法において、前記パターン光は、隣り合う前記明暗コードの前記中心要素間に配置される共通の前記周辺要素を有し、隣り合う前記明暗コードが連続的につながって配列されていることが好ましい。この場合には、隣り合う明暗コードにおいて周辺要素が共有されることから、パターン光に配列される明暗コードの密度を増やすことができる。これにより、撮像素子にて検出できるコードの数を増やすことができ、空間分解能を更に向上することが可能となる。 In particular, in the three-dimensional shape measurement method, the pattern light has the common peripheral element disposed between the central elements of the adjacent light and dark codes, and the adjacent light and dark codes are continuously connected. It is preferable that In this case, since neighboring elements are shared by adjacent light and dark codes, the density of the light and dark codes arranged in the pattern light can be increased. Thereby, the number of codes that can be detected by the image sensor can be increased, and the spatial resolution can be further improved.
　また、上記３次元形状計測方法においては、前記コード抽出ステップにおいて、前記明暗コードの前記中心要素を抽出し、当該中心要素の位置より前記明暗コードの位置情報を取得することが好ましい。この場合には、中心要素の位置により明暗コードの位置情報が取得されることから、明暗コード全体形状を認識する必要がなく、そのための処理を省略できるので、演算コストの上昇を更に抑制することが可能となる。 In the three-dimensional shape measurement method, it is preferable that in the code extraction step, the central element of the light / dark code is extracted and the position information of the light / dark code is acquired from the position of the central element. In this case, since the position information of the light / dark code is acquired based on the position of the central element, it is not necessary to recognize the entire shape of the light / dark code, and the processing for this can be omitted, thereby further suppressing an increase in calculation cost. Is possible.
　例えば、上記３次元形状計測方法において、前記明暗コードは、前記中心要素の周りに前記周辺要素が配置される位置を４箇所有する。この場合には、中心要素の周りに４つの周辺要素を配置できるので、これらの周辺要素の有無により１つの明暗コードで４ビットコードを実現することが可能となる。 For example, in the above three-dimensional shape measurement method, the light / dark code has four positions where the peripheral elements are arranged around the central element. In this case, since four peripheral elements can be arranged around the central element, it is possible to realize a 4-bit code with one light / dark code depending on the presence or absence of these peripheral elements.
　また、上記３次元形状計測方法において、前記明暗コードは、前記中心要素からみた前記周辺要素の方向が前記明暗コードの配列方向に対して斜め方向となるように前記周辺要素が配置されることが好ましい。この場合には、中心要素から見て、明暗コードの配列方向に対して斜め方向となるように周辺要素が配置されることから、周辺要素の方向が明暗コードの配列方向に対して平行又は垂直な方向に配置される場合と比べて周辺要素の長さを確保できる。これにより、明暗コードにおける周辺要素の有無の識別性を向上することが可能となる。 In the three-dimensional shape measurement method, the light and dark code may be arranged such that the peripheral element is oblique to the arrangement direction of the light and dark code when viewed from the central element. preferable. In this case, since the peripheral elements are arranged so as to be oblique to the light / dark code arrangement direction when viewed from the central element, the direction of the peripheral elements is parallel or perpendicular to the light / dark code arrangement direction. The length of the peripheral elements can be ensured as compared with the case where they are arranged in any direction. Thereby, it becomes possible to improve the discriminability of the presence / absence of peripheral elements in the light / dark code.
　例えば、上記３次元形状計測方法において、前記投影ステップで投影される前記パターン光は、可視光以外の波長を有する。このようにパターン光に赤外光等の不可視の波長帯を使用することにより、計測対象となる人物や、その周辺の人物に意識させることなく３次元形状の計測を行うことができる。これにより、計測対象となる人物等の行動（例えば、車両等の運転動作）を阻害することなく３次元形状の計測を行うことが可能となる。 For example, in the above three-dimensional shape measurement method, the pattern light projected in the projection step has a wavelength other than visible light. As described above, by using an invisible wavelength band such as infrared light for the pattern light, it is possible to perform measurement of a three-dimensional shape without making the person to be measured or the surrounding person aware of it. As a result, it is possible to measure a three-dimensional shape without hindering the action of a person or the like to be measured (for example, driving operation of a vehicle or the like).
　本発明の３次元形状計測装置は、複数の明暗コードが配列されたパターン光を計測対象に投影する投影部と、前記パターン光が投影された前記計測対象を撮影する撮影部と、前記計測対象を撮影した撮影画像から前記明暗コードを抽出する抽出部と、前記抽出部で抽出した前記明暗コードの種類を識別する識別部と、前記識別部で識別したそれぞれの前記明暗コードの位置情報より３次元位置を算出する算出部と、を具備する３次元形状計測装置であって、前記明暗コードは、中心要素と前記中心要素の周りに配置される１つ又は複数の周辺要素からなり、前記周辺要素の配置により当該明暗コードの種類が識別されることを特徴とする。 The three-dimensional shape measurement apparatus of the present invention includes a projection unit that projects pattern light on which a plurality of light and dark codes are arranged onto a measurement target, an imaging unit that captures the measurement target on which the pattern light is projected, and the measurement target. 3 based on the extraction unit for extracting the light / dark code from the photographed image, the identification unit for identifying the type of the light / dark code extracted by the extraction unit, and the position information of each light / dark code identified by the identification unit. A three-dimensional shape measuring apparatus comprising: a calculation unit that calculates a dimensional position, wherein the light / dark code includes a central element and one or a plurality of peripheral elements arranged around the central element; The type of the light / dark code is identified by the arrangement of the elements.
　上記３次元形状計測装置によれば、１回のパターンの投影及び撮影により計測対象の３次元形状を計測する際に利用されるパターン光に中心要素と中心要素の周りに配置される周辺要素とからなる複数の明暗コードが配列され、その明暗コードの種類が周辺要素の配置により識別される。このため、図形コードを用いる場合と比べて検出及び識別のために１つのコードに必要となる画素数を低減できる。これにより、撮像素子にて検出できるコードの数を増やすことができ、空間分解能を向上できる。この結果、空間分解能を確保しつつ、１回のパターン光の投影及び撮影動作により計測対象の３次元形状を計測することが可能となる。 According to the above three-dimensional shape measurement apparatus, the central element and the peripheral elements arranged around the central element are used for pattern light used when measuring the three-dimensional shape of the measurement target by projecting and photographing the pattern once. A plurality of light / dark codes consisting of are arranged, and the type of the light / dark code is identified by the arrangement of the peripheral elements. For this reason, compared with the case where a figure code is used, the number of pixels required for one code | cord | chord for a detection and identification can be reduced. Thereby, the number of codes that can be detected by the image sensor can be increased, and the spatial resolution can be improved. As a result, it is possible to measure the three-dimensional shape of the measurement object by one projection and photographing operation of pattern light while ensuring the spatial resolution.
　例えば、上記３次元形状計測装置において、前記投影部が投影する前記パターン光は、複数の前記明暗コードを第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向に対して垂直な第２の方向に繰り返し配列されてなるパターンであることが好ましい。特に、前記投影部が投影する前記パターン光は、複数の前記明暗コードをエピポーラ面に対して平行な第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向及びエピポーラ面に対して垂直な第２の方向に繰り返し配列されてなるパターンで構成されることが好ましい。この場合には、パターン光が、２次元配列パターンのように、エピポーラ面に対して直交する２方向（エピポーラ面に対して平行な方向及び垂直な方向）にコード化される場合と異なり、エピポーラ面に対して平行な方向（第１の方向）のみにコード化されることから、投影パターンと撮影パターンとの視差ずれを弁別できる弁別可能最大幅を少ないビット数で長く取ることができる。これにより、奥行き方向の計測レンジを長く確保でき、演算コストの上昇を抑制することが可能となる。 For example, in the three-dimensional shape measurement apparatus, the pattern light projected by the projection unit includes a code group in which a predetermined number of the plurality of bright and dark codes are arranged in a first direction as a structural unit, and the structural unit is the A pattern that is repeatedly arranged in a second direction perpendicular to the first direction is preferable. In particular, the pattern light projected by the projection unit includes a code group in which a predetermined number of light and dark codes are arranged in a first direction parallel to the epipolar plane, and the structural unit is the first light. It is preferable that the pattern is configured by being repeatedly arranged in the first direction and the second direction perpendicular to the epipolar plane. In this case, unlike the case where the pattern light is encoded in two directions orthogonal to the epipolar plane (a direction parallel to and perpendicular to the epipolar plane) as in a two-dimensional array pattern, Since the encoding is performed only in the direction parallel to the surface (first direction), the maximum discriminable width that can discriminate the parallax deviation between the projection pattern and the imaging pattern can be increased with a small number of bits. As a result, a long measurement range in the depth direction can be secured, and an increase in calculation cost can be suppressed.
　本発明によれば、空間分解能を確保しつつ、１回のパターン光の投影及び撮影動作により計測対象の３次元形状を計測することが可能となる。 According to the present invention, it is possible to measure the three-dimensional shape of the measurement object by one projection and photographing operation of the pattern light while ensuring the spatial resolution.
本実施の形態に係る３次元形状計測装置の構成を示すブロック図である。It is a block diagram which shows the structure of the three-dimensional shape measuring apparatus which concerns on this Embodiment. 本実施の形態に係る３次元形状計測装置で用いられるパターン光の一例を示す図である。It is a figure which shows an example of the pattern light used with the three-dimensional shape measuring apparatus which concerns on this Embodiment. 本実施の形態に係る３次元形状計測装置で用いられるパターン光を構成する明暗コードの説明図である。It is explanatory drawing of the light-and-dark code which comprises the pattern light used with the three-dimensional shape measuring apparatus which concerns on this Embodiment. 本実施の形態に係る３次元形状計測装置で用いられる明暗コードと画素数との関係の説明図である。It is explanatory drawing of the relationship between the light / dark code used with the three-dimensional shape measuring apparatus which concerns on this Embodiment, and the number of pixels. 本実施の形態に係る３次元形状計測装置における計測対象の任意の点Ｐに関する奥行き情報の説明図である。It is explanatory drawing of the depth information regarding the arbitrary points P of the measuring object in the three-dimensional shape measuring apparatus which concerns on this Embodiment. 本実施の形態に係る３次元形状計測装置の動作について説明するためのフロー図である。It is a flowchart for demonstrating operation | movement of the three-dimensional shape measuring apparatus which concerns on this Embodiment. 本実施の形態の変形例に係る明暗コードの説明図である。It is explanatory drawing of the light / dark code which concerns on the modification of this Embodiment.
　以下、本発明の実施の形態について添付図面を参照して詳細に説明する。本発明は、パターン光が投影された計測対象を撮影し、その撮影画像に基づいて３次元形状を計測する空間コード化法において、パターン光に中心要素と中心要素の周りに配置される周辺要素とからなる複数の明暗コードを配列すると共に、その明暗コードの種類を周辺要素の配置により識別することで、１つのコードに必要となる画素数を低減して空間分解能を確保するものである。 Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. The present invention relates to a peripheral element that is arranged around a central element and a central element in the pattern light in a spatial coding method of capturing a measurement target onto which the pattern light is projected and measuring a three-dimensional shape based on the captured image. Are arranged, and the type of the light / dark code is identified by the arrangement of peripheral elements, thereby reducing the number of pixels required for one code and ensuring spatial resolution.
　図１は、本発明の一実施の形態に係る３次元形状計測装置の構成を示すブロック図である。なお、図１に示す３次元形状計測装置においては、本発明を説明するために簡略化されている。本発明に係る３次元形状計測装置においては、図１に示す構成に限定されるものではなく、３次元形状を計測するために必要な構成（例えば、撮影した計測対象を確認するための表示装置等）を別途備えるようにしてもよい。本実施の形態に係る３次元形状計測装置は、例えば、自動車に搭載され、運転者の手や指の動作を検出することで所望の機器の操作を受け付けるジェスチャーモーション入力装置に適用される。 FIG. 1 is a block diagram showing a configuration of a three-dimensional shape measuring apparatus according to an embodiment of the present invention. Note that the three-dimensional shape measuring apparatus shown in FIG. 1 is simplified for explaining the present invention. The three-dimensional shape measuring apparatus according to the present invention is not limited to the structure shown in FIG. 1, but is a structure necessary for measuring a three-dimensional shape (for example, a display device for confirming a photographed measurement object) Etc.) may be provided separately. The three-dimensional shape measurement apparatus according to the present embodiment is applied to, for example, a gesture motion input apparatus that is mounted on an automobile and receives an operation of a desired device by detecting the movement of a driver's hand or finger.
　図１に示すように、３次元形状計測装置１０は、計測対象２０にパターン光を投影する投影装置１１と、計測対象２０を撮影する撮影装置１２と、撮影装置１２で撮影された撮影画像に対する画像処理等を行う処理装置１３とを含んで構成されている。なお、図１に示す３次元形状計測装置１０において、投影装置１１及び撮影装置１２は、それぞれ特許請求の範囲における投影部及び撮影部を構成する。 As illustrated in FIG. 1, the three-dimensional shape measurement apparatus 10 is configured to project a projection apparatus 11 that projects pattern light onto a measurement object 20, an imaging apparatus 12 that captures the measurement object 20, and a captured image captured by the imaging apparatus 12. And a processing device 13 that performs image processing and the like. In the three-dimensional shape measuring apparatus 10 shown in FIG. 1, the projection device 11 and the imaging device 12 constitute a projection unit and an imaging unit in the claims, respectively.
　投影装置１１は、例えば、プロジェクタ等で構成される。投影装置１１は、後述する処理装置１３の投影装置制御部１３１の制御の下、所定のパターン光を計測対象２０に投影する。なお、この所定のパターン光については後述する。撮影装置１２は、例えば、カメラ等で構成される。撮影装置１２は、所定のパターン光が投影された計測対象２０を撮影する。撮影装置１２は、撮影した計測対象２０の画像データ（撮影画像）を、後述する処理装置１３の画像取込部１３２に出力する。 Projection device 11 is constituted by, for example, a projector. The projection device 11 projects a predetermined pattern light onto the measurement target 20 under the control of the projection device control unit 131 of the processing device 13 described later. The predetermined pattern light will be described later. The imaging device 12 is configured with, for example, a camera. The imaging device 12 images the measurement target 20 onto which a predetermined pattern light is projected. The imaging device 12 outputs the image data (captured image) of the measured measurement target 20 to the image capturing unit 132 of the processing device 13 described later.
　なお、本実施の形態に係る３次元形状計測装置１０においては、所定位置に固定された投影装置１１及び撮影装置１２を用いる。すなわち、投影装置１１は、予め定められた位置にパターン光を投影できるように配置されている。また、撮影装置１２は、投影装置１１によりパターン光が投影される位置を含む一定範囲を撮影できるように配置されている。なお、投影装置１１と撮影装置１２とは、予め両者間の内部・外部パラメータが求められており、時間同期が確保されているものとする。 In the three-dimensional shape measurement apparatus 10 according to the present embodiment, the projection apparatus 11 and the imaging apparatus 12 fixed at predetermined positions are used. That is, the projection device 11 is arranged so that the pattern light can be projected at a predetermined position. The photographing device 12 is arranged so that a certain range including the position where the pattern light is projected by the projection device 11 can be photographed. It is assumed that the projection device 11 and the photographing device 12 have previously obtained internal and external parameters and secured time synchronization.
　処理装置１３は、投影装置１１を制御する投影装置制御部１３１、撮影装置１２から画像データを取り込む画像取込部１３２及び計測対象２０の３次元形状を計測するために必要な演算を行う演算部１３３を有する。演算部１３３は、コード抽出部１３３ａ、コード識別部１３３ｂ、対応点算出部１３３ｃ及び３次元位置算出部１３３ｄを有する。なお、これらのコード抽出部１３３ａ及びコード識別部１３３ｂは、それぞれ特許請求の範囲における抽出部及び識別部を構成し、対応点算出部１３３ｃ及び３次元位置算出部１３３ｄは、特許請求の範囲における算出部を構成する。 The processing device 13 includes a projection device control unit 131 that controls the projection device 11, an image capture unit 132 that captures image data from the imaging device 12, and a computation unit that performs computations necessary to measure the three-dimensional shape of the measurement target 20. 133. The calculation unit 133 includes a code extraction unit 133a, a code identification unit 133b, a corresponding point calculation unit 133c, and a three-dimensional position calculation unit 133d. The code extracting unit 133a and the code identifying unit 133b constitute an extracting unit and an identifying unit in the claims, respectively, and the corresponding point calculating unit 133c and the three-dimensional position calculating unit 133d are calculated in the claims. Parts.
　投影装置制御部１３１は、投影装置１１を制御する。例えば、投影装置制御部１３１は、３次元形状計測装置１０が搭載される装置本体の制御部からの指示に応じて投影装置１１を制御する。３次元形状計測装置１０が車両運転者のジェスチャーモーション入力装置に適用される場合、車両全体の制御を行う電子制御ユニット（ＥＣＵ：Electronic　Control　Unit）からの指示に応じて投影装置１１を制御する。投影装置制御部１３１における制御対象としては、例えば、計測対象２０に投影するパターン光の種類や、その投影タイミング等が挙げられる。 Projection device control unit 131 controls projection device 11. For example, the projection device control unit 131 controls the projection device 11 in response to an instruction from the control unit of the device main body on which the three-dimensional shape measurement device 10 is mounted. When the three-dimensional shape measurement device 10 is applied to a gesture motion input device for a vehicle driver, the projection device 11 is controlled in accordance with an instruction from an electronic control unit (ECU) that controls the entire vehicle. Examples of the control target in the projection device control unit 131 include the type of pattern light projected on the measurement target 20 and the projection timing thereof.
画像取込部１３２は、撮影装置１２から入力される計測対象２０の画像データ（撮影画像）を取り込む。また、画像取込部１３２は、取り込んだ画像データを演算部１３３に出力する。具体的には、所定のパターン光が投影された計測対象２０を撮影した画像データを取り込み、その画像データを演算部１３３に出力する。演算部１３３は、画像取込部１３２から入力された画像データ（所定のパターン光が投影された計測対象２０の撮像画像）に対して所定の演算処理を施して計測対象２０の３次元形状を計測するために必要な演算を行う。 The image capturing unit 132 captures image data (captured image) of the measurement target 20 input from the imaging device 12. In addition, the image capturing unit 132 outputs the captured image data to the arithmetic unit 133. Specifically, image data obtained by photographing the measurement target 20 onto which a predetermined pattern light is projected is captured, and the image data is output to the calculation unit 133. The calculation unit 133 performs a predetermined calculation process on the image data (captured image of the measurement target 20 onto which a predetermined pattern light is projected) input from the image capturing unit 132, thereby obtaining a three-dimensional shape of the measurement target 20. Perform necessary calculations to measure.
　ここで、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光について説明する。図２は、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光の一例を示す図である。なお、図２においては、説明の便宜上、パターン光が可視光で構成される場合について示している。また、図２に示すパターン光においては、投影装置１１による光の投影位置を黒色で示し、光の非投影位置を白色で示している。パターン光を示す以下の図面においても同様である。 Here, the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment will be described. FIG. 2 is a diagram illustrating an example of pattern light used in the three-dimensional shape measurement apparatus 10 according to the present embodiment. Note that FIG. 2 shows a case where the pattern light is composed of visible light for convenience of explanation. In the pattern light shown in FIG. 2, the light projection position by the projection device 11 is shown in black, and the light non-projection position is shown in white. The same applies to the following drawings showing pattern light.
　なお、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光は、可視光以外の波長を有することが好ましい。このようにパターン光に赤外光等の不可視の波長帯を使用することにより、計測対象２０となる人物や、その周辺の人物に意識させることなく３次元形状の計測を行うことができる。これにより、計測対象２０となる人物等の行動（例えば、車両等の運転動作）を阻害することなく３次元形状の計測を行うことが可能となる。 Note that the pattern light used in the three-dimensional shape measurement apparatus 10 according to the present embodiment preferably has a wavelength other than visible light. As described above, by using an invisible wavelength band such as infrared light for the pattern light, it is possible to perform measurement of a three-dimensional shape without making the person to be measured 20 or the person in the vicinity thereof aware of it. As a result, it is possible to measure a three-dimensional shape without hindering the action of a person or the like to be measured 20 (for example, driving operation of a vehicle or the like).
　図２に示すパターン光においては、予め定められた位置に投影される光の有無をコード化した明暗コードを含んでいる。具体的にいうと、図２に示すパターン光においては、複数の明暗コードが配列されている。これらの明暗コードは、予め定められた規則に従って配列されている。詳細について後述するように、パターン光を構成する明暗コードは、その一部を隣り合う明暗コードと共有し、互いに連続して構成されている。 The pattern light shown in FIG. 2 includes a light / dark code in which the presence / absence of light projected at a predetermined position is coded. Specifically, in the pattern light shown in FIG. 2, a plurality of light and dark codes are arranged. These light and dark codes are arranged according to a predetermined rule. As will be described in detail later, the light and dark codes constituting the pattern light share a part with the adjacent light and dark codes and are configured continuously.
　図３は、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光を構成する明暗コード３０の説明図である。図３Ａにおいては、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光を構成する１つの明暗コード３０を示し、図３Ｂにおいては、明暗コード３０の基本パターンを示している。なお、説明の便宜上、図３においては、隣り合う明暗コード３０の中心要素３１も示している。 FIG. 3 is an explanatory diagram of the light / dark code 30 constituting the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment. FIG. 3A shows one light / dark code 30 constituting the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment, and FIG. 3B shows a basic pattern of the light / dark code 30. For convenience of explanation, FIG. 3 also shows a central element 31 of adjacent light and dark codes 30.
　図３Ａの破線Ａ内に示すように、各明暗コード３０は、中心要素３１と、この中心要素３１の周りに配置される複数（本実施の形態では４つ）のアーム３２（３２ａ～３２ｄ）とから構成される。例えば、中心要素３１は円形状を有し、アーム３２は矩形状を有する。しかしながら、中心要素３１及びアーム３２の形状については、これらに限定されるものではなく適宜変更が可能である。以下においては、中心要素３１が円形状を有し、アーム３２が矩形状を有するものとして説明する。 As shown in a broken line A in FIG. 3A, each light / dark cord 30 includes a central element 31 and a plurality (four in this embodiment) of arms 32 (32a to 32d) arranged around the central element 31. It consists of. For example, the central element 31 has a circular shape, and the arm 32 has a rectangular shape. However, the shapes of the central element 31 and the arm 32 are not limited to these and can be changed as appropriate. In the following description, it is assumed that the center element 31 has a circular shape and the arm 32 has a rectangular shape.
　アーム３２ａ～３２ｄは、円形状を有する中心要素３１の外縁部の所定位置に連続して配置される。アーム３２ａ～３２ｄは、中心要素３１の外縁部から等間隔（具体的には、９０°間隔）に配置されている。アーム３２ａは、中心要素３１の中心点を通過する水平面を基準として、中心要素３１の中心点から図３Ａに示す右斜め上方に延出し、アーム３２ｂは、中心要素３１の中心点を通過する水平面を基準として、中心要素３１の中心点から図３Ａに示す右斜め下方に延出する。同様に、アーム３２ｃは、中心要素３１の中心点を通過する水平面を基準として、中心要素３１の中心点から図３Ａに示す左斜め下方に延出し、アーム３２ｄは、中心要素３１の中心点を通過する水平面を基準として、中心要素３１の中心点から図３Ａに示す左斜め上方に延出する。なお、詳細について後述するように、中心要素３１の中心点を通過する水平面は、後述するエピポーラ面ＥＰと平行に配置される（図４参照）。 The arms 32a to 32d are continuously arranged at predetermined positions on the outer edge of the central element 31 having a circular shape. The arms 32a to 32d are arranged at equal intervals (specifically, 90 ° intervals) from the outer edge of the central element 31. The arm 32a extends from the center point of the center element 31 obliquely upward to the right as shown in FIG. 3A with reference to a horizontal plane passing through the center point of the center element 31, and the arm 32b is a horizontal plane passing through the center point of the center element 31. Is defined as a diagonally lower right portion shown in FIG. 3A from the center point of the center element 31. Similarly, the arm 32c extends obliquely downward to the left as shown in FIG. 3A from the center point of the center element 31 with reference to a horizontal plane passing through the center point of the center element 31, and the arm 32d extends the center point of the center element 31. With reference to the passing horizontal plane, it extends from the center point of the center element 31 obliquely upward to the left shown in FIG. 3A. As will be described in detail later, the horizontal plane that passes through the center point of the central element 31 is arranged in parallel with the epipolar surface EP described later (see FIG. 4).
　各アーム３２ａ～３２ｄの先端は、隣り合う明暗コード３０の中心要素３１に接続されている。アーム３２ａは、図３Ａに示す右斜め上方に位置する明暗コード３０の中心要素３１に接続され、アーム３２ｂは、図３Ａに示す右斜め下方に位置する明暗コード３０の中心要素３１に接続される。同様に、アーム３２ｃは、図３Ａに示す左斜め下方に位置する明暗コード３０の中心要素３１に接続され、アーム３２ｄは、図３Ａに示す左斜め上方に位置する明暗コード３０の中心要素３１に接続される。なお、図３Ａにおいては、説明の便宜上、隣り合う明暗コード３０の中心要素３１を「中心要素３１´」と示している。 The tips of the arms 32a to 32d are connected to the central element 31 of the adjacent light / dark cord 30. The arm 32a is connected to the central element 31 of the light / dark cord 30 located diagonally upward to the right shown in FIG. 3A, and the arm 32b is connected to the central element 31 of the light / dark cord 30 located diagonally downward to the right shown in FIG. 3A. . Similarly, the arm 32c is connected to the central element 31 of the light / dark cord 30 located diagonally downward to the left shown in FIG. 3A, and the arm 32d is connected to the central element 31 of the light / dark cord 30 located diagonally upward to the left shown in FIG. 3A. Connected. In FIG. 3A, for convenience of explanation, the central element 31 of the adjacent light and dark cords 30 is indicated as “central element 31 ′”.
　このように本実施の形態に係る３次元形状計測装置１０において、明暗コード３０は、中心要素３１に連続する４つのアーム３２ａ～３２ｄの有無により１６種類の情報を表現可能なコード（４ビットコード）で構成される（図３Ｂ参照）。例えば、アーム３２ａ～３２ｄをそれぞれ第１～第４のビット情報に関連付ける場合、図３Ｂに示すように、４つのアーム３２ａ～３２ｄの全てが存在する明暗コード３０ａは「１１１１」のビット情報で特定され、４つのアーム３２ａ～３２ｄの全てが存在しない明暗コード３０ｂは「００００」のビット情報で特定され、アーム３２ａ及びアーム３２ｃのみが存在する明暗コード３０ｃは「０１０１」のビット情報で特定される。 As described above, in the three-dimensional shape measuring apparatus 10 according to the present embodiment, the light / dark code 30 is a code (4-bit code) that can express 16 types of information depending on the presence / absence of the four arms 32a to 32d connected to the central element 31. (See FIG. 3B). For example, when associating the arms 32a to 32d with the first to fourth bit information, as shown in FIG. 3B, the light / dark code 30a in which all the four arms 32a to 32d exist is specified by the bit information of “1111”. The light / dark code 30b in which all of the four arms 32a to 32d do not exist is specified by bit information “0000”, and the light / dark code 30c in which only the arms 32a and 32c exist is specified by bit information “0101”. .
　本実施の形態に係る３次元形状計測装置１０で用いられるパターン光においては、このような明暗コード３０を図２に示すＸ軸及びＹ軸方向に連続して配列している。例えば、図２に示す明暗コード３０１においては、周辺に配置される明暗コード３０２～３０５に連続している。ここで、明暗コード３０２は明暗コード３０１の右上方側に配置され、明暗コード３０３は明暗コード３０１の右下方側に配置される。また、明暗コード３０４は明暗コード３０１の左下方側に配置され、明暗コード３０５は明暗コード３０１の左上方側に配置される。 In the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment, such a light / dark code 30 is continuously arranged in the X-axis and Y-axis directions shown in FIG. For example, the light / dark code 301 shown in FIG. 2 is continuous with the light / dark codes 302 to 305 arranged in the periphery. Here, the light / dark code 302 is disposed on the upper right side of the light / dark code 301, and the light / dark code 303 is disposed on the lower right side of the light / dark code 301. The light / dark code 304 is disposed on the lower left side of the light / dark code 301, and the light / dark code 305 is disposed on the upper left side of the light / dark code 301.
　この場合において、明暗コード３０１のアーム３２ａは、明暗コード３０２のアーム３２ｃを構成し、明暗コード３０１のアーム３２ｂは、明暗コード３０３のアーム３２ｄを構成する。また、明暗コード３０１のアーム３２ｃは、明暗コード３０４のアーム３２ａを構成し、明暗コード３０１のアーム３２ｄは、明暗コード３０５のアーム３２ｂを構成する。すなわち、明暗コード３０１のアーム３２ａ～３２ｄは、周辺に配置される明暗コード３０２～３０５のアーム３２の一部と共通化されている。このように明暗コード３０のアーム３２を隣り合う明暗コード３０のアーム３２と共有することにより、パターン光に配列される明暗コード３０の密度を増やすことができる。 In this case, the arm 32a of the light / dark cord 301 constitutes an arm 32c of the light / dark cord 302, and the arm 32b of the light / dark cord 301 constitutes an arm 32d of the light / dark cord 303. Further, the arm 32c of the light / dark cord 301 constitutes an arm 32a of the light / dark cord 304, and the arm 32d of the light / dark cord 301 constitutes an arm 32b of the light / dark cord 305. That is, the arms 32a to 32d of the light / dark cord 301 are shared with a part of the arms 32 of the light / dark cords 302 to 305 arranged in the periphery. Thus, by sharing the arm 32 of the light / dark code 30 with the arm 32 of the adjacent light / dark code 30, the density of the light / dark code 30 arranged in the pattern light can be increased.
　また、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光においては、複数の明暗コード２０を図２に示すＸ軸方向に所定の数（本実施の形態では１５個）だけ配列したコード群３００を構成単位として、このコード群３００がＸ軸方向に繰り返し配列されるパターンで構成されている。図２に示すコード群３００においては、予め定められた順番で異なる１５個の明暗コード３０が配列されている。 Further, in the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment, a predetermined number (15 in the present embodiment) of a plurality of light and dark codes 20 are arranged in the X-axis direction shown in FIG. The code group 300 is configured in a pattern in which the code group 300 is repeatedly arranged in the X-axis direction. In the code group 300 shown in FIG. 2, 15 different light and dark codes 30 are arranged in a predetermined order.
　より具体的にいうと、図２に示すコード群３００においては、最も右方側にビット情報「１００１」で特定される明暗コード３０が配置されている。そして、左方側に向かって、ビット情報「０１００」、「１１００」、「１１０１」、「０１１１」、「１１０１」、「１０００」、「０１１０」、「００１０」、「０００１」、「１１１１」、「１１１０」、「０１０１」、「００１１」で特定される明暗コード３０が配置され、最も左方側にビット情報「１０１０」で特定される明暗コード３０が配置されている。 More specifically, in the code group 300 shown in FIG. 2, the light / dark code 30 specified by the bit information “1001” is arranged on the rightmost side. Then, toward the left side, bit information “0100”, “1100”, “1101”, “0111”, “1101”, “1000”, “0110”, “0010”, “0001”, “1111” , “1110”, “0101”, “0011”, and the light / dark code 30 specified by the bit information “1010” are arranged on the leftmost side.
このように異なる１５個の明暗コード３０が配列されることから、コード群３００の中で特定の明暗コード３０を識別できるように構成されている。なお、このコード群３００は、投影後にコードがＸ軸方向に動いた時に隣のコード群３００における同一のコードと区別できる幅（投影パターンと撮影パターンとの視差ずれを弁別できる弁別可能幅）を構成する。すなわち、パターン光の投影後における視差ずれは、このコード群３００の幅（弁別可能幅）の範囲内で特定できる。 Since the 15 different light / dark codes 30 are arranged in this manner, the specific light / dark code 30 can be identified in the code group 300. The code group 300 has a width that can be distinguished from the same code in the adjacent code group 300 when the code moves in the X-axis direction after projection (a discriminable width that can distinguish the parallax deviation between the projection pattern and the imaging pattern). Constitute. That is, the parallax deviation after the projection of the pattern light can be specified within the range of the width of the code group 300 (discriminable width).
　さらに、本実施の形態に係る３次元形状計測装置１０で用いられるパターン光においては、このようなコード群３００がＸ軸方向に繰り返し配列されたパターンがＹ軸方向に繰り返し配列されている。すなわち、図２に示すパターン光においては、コード群３００がＸ軸及びＹ軸方向の双方に繰り返し配列されたパターン光で構成される。言い換えると、図２に示すパターン光においては、Ｘ軸方向の一定範囲（１５個の明暗コード３０に相当する範囲）でのみコード化されており、Ｙ軸方向にはコード化されていない。３次元形状計測装置１０においては、投影装置１１から図２に示すパターン光が計測対象２０に投影され、撮影装置１２にてパターン光が投影された計測対象２０が撮影される。 Furthermore, in the pattern light used in the three-dimensional shape measuring apparatus 10 according to the present embodiment, a pattern in which such code groups 300 are repeatedly arranged in the X-axis direction is repeatedly arranged in the Y-axis direction. That is, the pattern light shown in FIG. 2 is configured by pattern light in which the code group 300 is repeatedly arranged in both the X-axis and Y-axis directions. In other words, the pattern light shown in FIG. 2 is encoded only in a certain range in the X-axis direction (a range corresponding to 15 light / dark codes 30), and is not encoded in the Y-axis direction. In the three-dimensional shape measurement apparatus 10, the pattern light shown in FIG. 2 is projected from the projection apparatus 11 onto the measurement object 20, and the measurement object 20 onto which the pattern light is projected is imaged by the imaging apparatus 12.
　図４は、本実施の形態に係る３次元形状計測装置１０で用いられる明暗コード３０と画素数との関係を説明するための模式図である。図４の枠Ａ内に示すように、本実施の形態に係る明暗コード３０は、例えば、縦方向に並んだ６画素と、横方向に並んだ６画素の合計３６個の画素で表すことができる。本実施の形態に係る明暗コード３０においては、これらの画素における明暗によりその種別が検出されることから、画素数が少ないことに起因してその輪郭が明確に識別されない状況下においても明暗コード３０の種別を適切に検出することができる。この結果、撮像素子にて単位面積当たりに検出できるコードの数を増やすことができ、空間分解能を向上することが可能となる。 FIG. 4 is a schematic diagram for explaining the relationship between the light / dark code 30 and the number of pixels used in the three-dimensional shape measuring apparatus 10 according to the present embodiment. As shown in frame A of FIG. 4, the light / dark code 30 according to the present embodiment can be represented by a total of 36 pixels, for example, 6 pixels arranged in the vertical direction and 6 pixels arranged in the horizontal direction. it can. In the light / dark code 30 according to the present embodiment, since the type is detected based on the light and darkness of these pixels, the light / dark code 30 is used even in a situation where the outline is not clearly identified due to the small number of pixels. Can be detected appropriately. As a result, the number of codes that can be detected per unit area by the image sensor can be increased, and the spatial resolution can be improved.
　これに対し、図形コードを２次元系列に配列したパターンを検出する場合には、図形コード（例えば、背景技術で説明した特許文献１のような楕円形状を有する図形コード）を当てはめてコード識別することから、例えば、図形コードに含まれる曲線等を適切に表す必要がある。このため、図形コードを表す画素数の低減には一定の制限が存在する。このため、撮像素子にて単位面積当たりに検出できる図形コードの数を増やすことができず、空間分解能を向上することが困難である。 On the other hand, when detecting a pattern in which a graphic code is arranged in a two-dimensional series, the code is identified by applying a graphic code (for example, a graphic code having an elliptical shape as in Patent Document 1 described in Background Art). Therefore, for example, it is necessary to appropriately represent a curve or the like included in the graphic code. For this reason, there is a certain limitation on the reduction of the number of pixels representing the graphic code. For this reason, the number of figure codes that can be detected per unit area by the image sensor cannot be increased, and it is difficult to improve the spatial resolution.
　図１に戻り、本実施の形態に係る３次元形状計測装置１０の処理装置１３が有する演算部１３３の構成について説明する。上述のように、演算部１３３は、コード抽出部１３３ａ、コード識別部１３３ｂ、対応点算出部１３３ｃ及び３次元位置算出部１３３ｄを有し、計測対象２０の３次元形状を計測するために必要な演算を行う。 Referring back to FIG. 1, the configuration of the calculation unit 133 included in the processing device 13 of the three-dimensional shape measurement apparatus 10 according to the present embodiment will be described. As described above, the calculation unit 133 includes the code extraction unit 133a, the code identification unit 133b, the corresponding point calculation unit 133c, and the three-dimensional position calculation unit 133d, and is necessary for measuring the three-dimensional shape of the measurement target 20. Perform the operation.
　コード抽出部１３３ａは、画像取込部１３２から入力される画像データ（所定のパターン光が投影された計測対象２０の撮像画像）から明暗コード３０の中心要素３１を抽出する。例えば、コード抽出部１３３ａは、撮像画像における輝度情報に基づいて明暗コード３０の中心要素３１の中心点情報（中心座標情報）を抽出する。より具体的には、コード抽出部１３３ａは、撮像画像における輝度の最大点より明暗コード３０の中心要素３１の中心点情報（中心座標情報）を抽出する。例えばコード抽出部１３３ａは、抽出した明暗コード３０の中心要素３１の中心点情報から、該当する明暗コード３０の位置情報を取得する。コード抽出部１３３ａは、取得した明暗コード３０の位置情報をコード識別部１３３ｂに出力する。 The code extraction unit 133a extracts the central element 31 of the light / dark code 30 from the image data input from the image capturing unit 132 (a captured image of the measurement target 20 onto which a predetermined pattern light is projected). For example, the code extraction unit 133a extracts center point information (center coordinate information) of the center element 31 of the light / dark code 30 based on luminance information in the captured image. More specifically, the code extraction unit 133a extracts center point information (center coordinate information) of the center element 31 of the light / dark code 30 from the maximum luminance point in the captured image. For example, the code extraction unit 133a acquires the position information of the corresponding light / dark code 30 from the central point information of the central element 31 of the extracted light / dark code 30. The code extraction unit 133a outputs the acquired position information of the light / dark code 30 to the code identification unit 133b.
　コード識別部１３３ｂは、画像取込部１３２から入力される画像データから、コード抽出部１３３ａから入力される明暗コード３０の位置情報に基づいて、明暗コード３０の種類を識別する。具体的には、中心要素３１の周辺に配置されるアーム３２ａ～３２ｄの有無により明暗コード３０の種類を識別する。また、コード識別部１３３ｂは、識別対象の明暗コード３０のコード群３００における位置を特定する。例えば、コード識別部１３３ｂは、予め保持したコード群３００の明暗コード３０の配列との比較により識別対象の明暗コード３０の位置を特定する。例えば、中心要素３１の周囲に４本のアーム３２ａ～３２ｄを検出する場合、コード識別部１３３ｂは、識別対象の明暗コード３０を、図３Ａに示す「１１１１」のビット情報で特定される明暗コード３０ａと識別する。この場合、コード識別部１３３ｂは、識別対象の明暗コード３０の位置を、図２に示すコード群３００における左側から５番目の位置と特定する。コード識別部１３３ｂは、識別した明暗コード３０の種類及び特定したコード群３００における位置を対応点算出部１３３ｃに出力する。 The code identifying unit 133b identifies the type of the light / dark code 30 based on the position information of the light / dark code 30 input from the code extracting unit 133a from the image data input from the image capturing unit 132. Specifically, the type of the light / dark code 30 is identified by the presence / absence of the arms 32a to 32d arranged around the central element 31. Moreover, the code identification part 133b specifies the position in the code group 300 of the light / dark code 30 to be identified. For example, the code identifying unit 133b identifies the position of the light / dark code 30 to be identified by comparison with the arrangement of the light / dark code 30 of the code group 300 held in advance. For example, when detecting four arms 32a to 32d around the central element 31, the code identifying unit 133b identifies the light / dark code 30 to be identified by the bit information “1111” shown in FIG. 3A. 30a is identified. In this case, the code identifying unit 133b identifies the position of the light / dark code 30 to be identified as the fifth position from the left in the code group 300 illustrated in FIG. The code identification unit 133b outputs the identified type of the light / dark code 30 and the position in the identified code group 300 to the corresponding point calculation unit 133c.
　対応点算出部１３３ｃは、コード識別部１３３ｂから入力される明暗コード３０の種類及びコード群３００における位置に基づいて、投影装置１３１が投影した投影画像における算出対象の明暗コード３０の対応点を算出する。具体的には、投影画像におけるコード群３００の該当する明暗コード３０の位置と、コード識別部１３３ｂからの明暗コード３０の位置との比較により投影画像における算出対象の明暗コード３０の対応点を算出する。対応点算出部１３３ｃは、算出した対応点に関する情報（以下、「対応点情報」という）を３次元位置算出部１３３ｄに出力する。 The corresponding point calculation unit 133c calculates the corresponding point of the light / dark code 30 to be calculated in the projection image projected by the projection device 131 based on the type of the light / dark code 30 input from the code identification unit 133b and the position in the code group 300. To do. Specifically, the corresponding point of the light / dark code 30 to be calculated in the projection image is calculated by comparing the position of the corresponding light / dark code 30 in the code group 300 in the projection image with the position of the light / dark code 30 from the code identification unit 133b. To do. The corresponding point calculation unit 133c outputs information about the calculated corresponding point (hereinafter referred to as “corresponding point information”) to the three-dimensional position calculation unit 133d.
　３次元位置算出部１３３ｄは、対応点算出部１３３ｃから入力される対応点情報に基づいて、算出対象となる明暗コード３０に対応する３次元位置を算出する。具体的には、３次元位置算出部１３３ｄは、対応する明暗コード３０の中心要素３１における投影前後での位置ずれ（視差によるずれ）から奥行き座標を取得し、その奥行き座標から算出対象となる明暗コード３０に対応する３次元位置を算出する。３次元位置算出部１３３ｄは、算出した３次元位置を、３次元形状計測装置１０が搭載される装置本体の制御部に出力する。計測対象２０上に投影された全ての明暗コード３０に対して３次元位置を算出することにより、計測対象２０の３次元形状を計測することが可能となる。 The three-dimensional position calculation unit 133d calculates a three-dimensional position corresponding to the light / dark code 30 to be calculated based on the corresponding point information input from the corresponding point calculation unit 133c. Specifically, the three-dimensional position calculation unit 133d acquires the depth coordinate from the positional deviation before and after the projection (deviation due to parallax) in the central element 31 of the corresponding light / dark code 30, and the brightness / darkness to be calculated from the depth coordinate. A three-dimensional position corresponding to the code 30 is calculated. The three-dimensional position calculation unit 133d outputs the calculated three-dimensional position to the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 is mounted. It is possible to measure the three-dimensional shape of the measurement target 20 by calculating the three-dimensional positions for all the light and dark codes 30 projected on the measurement target 20.
　ここで、本実施の形態に係る３次元形状計測装置１０における計測対象２０の任意の点Ｐに関する奥行き情報について説明する。図５は、本実施の形態に係る３次元形状計測装置１０における計測対象２０の任意の点Ｐに関する奥行き情報の説明図である。図５Ａにおいては、本実施の形態に係る３次元形状計測装置１０における投影装置１１及び撮影装置１２と、計測対象２０との位置関係を示している。図５Ｂにおいては、撮影装置１２が有するＣＣＤ（Charge　Coupled　Device）イメージセンサ１２１の受光面を模式的に示している。なお、図４Ａに示すｆ１、ｆ２は、それぞれ投影装置１１、撮影装置１２（ＣＣＤイメージセンサ１２１）における焦点距離を示している。 Here, depth information regarding an arbitrary point P of the measurement target 20 in the three-dimensional shape measurement apparatus 10 according to the present embodiment will be described. FIG. 5 is an explanatory diagram of depth information regarding an arbitrary point P of the measurement target 20 in the three-dimensional shape measurement apparatus 10 according to the present embodiment. In FIG. 5A, the positional relationship between the measurement target 20 and the projection device 11 and the imaging device 12 in the three-dimensional shape measurement device 10 according to the present embodiment is shown. FIG. 5B schematically shows a light receiving surface of a CCD (Charge Coupled Device) image sensor 121 included in the photographing apparatus 12. Note that f 1 and f 2 shown in FIG. 4A indicate focal lengths in the projection device 11 and the imaging device 12 (CCD image sensor 121), respectively.
　図５Ａに示すように、撮影装置１２は、投影装置１１による計測対象２０に対するパターン光の投影位置を挟んで反対側の位置に配置されている。この場合において、投影装置１１が投影するパターン光のＸ軸（図２参照）は、投影装置１１の主点Ｃ１、撮影装置１２の主点Ｃ２及び計測対象２０上の任意の点Ｐの３点で形成されるエピポーラ面ＥＰと平行に配置されている。 As shown in FIG. 5A, the imaging device 12 is disposed at a position on the opposite side across the projection position of the pattern light with respect to the measurement target 20 by the projection device 11. In this case, the X axis (see FIG. 2) of the pattern light projected by the projection device 11 is the three points of the principal point C1 of the projection device 11, the principal point C2 of the photographing device 12, and an arbitrary point P on the measurement target 20. It is arranged in parallel with the epipolar surface EP formed by
　一方、撮影装置１２は、図２に示すパターン光のＸ軸及びＹ軸方向とそれぞれ平行に撮像素子が配列されたＣＣＤイメージセンサ１２１を備えている。図５Ｂに示すＣＣＤイメージセンサ１２１のＸ軸は、図２に示すパターン光のＸ軸と平行に配置され、図５Ｂに示すイメージセンサのＹ軸は、図２に示すパターン光のＹ軸と平行に配置されている。すなわち、撮影装置１２のＸ軸上の撮像素子は、投影装置１１の主点Ｃ１、撮影装置１２の主点Ｃ２及び計測対象２０上の任意の点Ｐの３点で形成されるエピポーラ面ＥＰと平行に配列されている。 On the other hand, the photographing apparatus 12 includes a CCD image sensor 121 in which imaging elements are arranged in parallel with the X-axis and Y-axis directions of the pattern light shown in FIG. The X axis of the CCD image sensor 121 shown in FIG. 5B is arranged in parallel with the X axis of the pattern light shown in FIG. 2, and the Y axis of the image sensor shown in FIG. 5B is parallel to the Y axis of the pattern light shown in FIG. Is arranged. In other words, the imaging device on the X axis of the imaging device 12 includes an epipolar plane EP formed by three points: a principal point C1 of the projection device 11, a principal point C2 of the imaging device 12, and an arbitrary point P on the measurement target 20. They are arranged in parallel.
　このような構成を有する３次元形状計測装置１０で図２に示すパターン光を投影する場合において、計測対象２０上の任意の点Ｐに関する奥行き情報を求める場合について考える。例えば、計測対象２０上の任意の点Ｐに対して図２に示すパターン光を投影した場合において、エピポーラ面ＥＰ上の仮想的な基準面（以下、「仮想基準面」という）Ｚｍｉｎからの反射値は、撮影装置１２のＣＣＤイメージセンサ１２１において反射値Ｘｍｉｎとして測定される。一方、撮像画像から検出される実際の位置Ｚａからの反射値は、撮影装置１２のＣＣＤイメージセンサ１２１において反射値Ｘａとして測定される。このような反射値Ｘｍｉｎと反射値Ｘａとのずれが点Ｐにおける奥行き情報（仮想基準面Ｚｍｉｎからの奥行き距離）として取得される。この場合、計測対象２０上の任意の点Ｐに関する奥行き情報を求める際に利用される反射値Ｘｍｉｎと反射値Ｘａとを結ぶ線（エピポーラ線）ＥＬは、図５Ｂに示すように、撮影装置１２のＹ軸方向に変化せず、Ｘ軸方向のみに変化し、Ｘ軸と平行な直線を構成する。 Consider the case of obtaining depth information regarding an arbitrary point P on the measurement target 20 when the pattern light shown in FIG. 2 is projected by the three-dimensional shape measurement apparatus 10 having such a configuration. For example, when the pattern light shown in FIG. 2 is projected onto an arbitrary point P on the measurement target 20, the reflection from a virtual reference plane (hereinafter referred to as “virtual reference plane”) Zmin on the epipolar plane EP. The value is measured as a reflection value Xmin in the CCD image sensor 121 of the photographing apparatus 12. On the other hand, the reflection value from the actual position Za detected from the captured image is measured as the reflection value Xa by the CCD image sensor 121 of the photographing apparatus 12. Such a deviation between the reflection value Xmin and the reflection value Xa is acquired as depth information at point P (depth distance from the virtual reference plane Zmin). In this case, a line (epipolar line) EL connecting the reflection value Xmin and the reflection value Xa used when obtaining depth information regarding an arbitrary point P on the measurement target 20 is, as shown in FIG. It changes only in the X-axis direction without changing in the Y-axis direction, and forms a straight line parallel to the X-axis.
　これは、仮想基準面（反射面）Ｚｍｉｎでのパターン反射光（予想位置）に対して、実際に検出されたＸ軸方向におけるパターン位置が、視差ずれと表され、この視差ずれから奥行き座標を取得することにより、算出対象となる明暗コード３０に対応する３次元位置を算出できることを意味する。 This is because the pattern position in the X-axis direction actually detected with respect to the pattern reflected light (expected position) on the virtual reference plane (reflecting surface) Zmin is expressed as a parallax shift, and the depth coordinate is calculated from this parallax shift. This means that the three-dimensional position corresponding to the light / dark code 30 to be calculated can be calculated.
　以下、本実施の形態に係る３次元形状計測装置１０の動作について説明する。図６は、本実施の形態に係る３次元形状計測装置１０の動作について説明するためのフロー図である。特に、図６においては、３次元形状計測装置１０の処理装置１３の動作について示している。なお、図６に示すフローにおいては、本実施の形態に係る３次元形状計測装置１０が搭載される装置本体の制御部から３次元形状計測が指示されるものとする。 Hereinafter, the operation of the three-dimensional shape measurement apparatus 10 according to the present embodiment will be described. FIG. 6 is a flowchart for explaining the operation of the three-dimensional shape measuring apparatus 10 according to the present embodiment. In particular, FIG. 6 shows the operation of the processing device 13 of the three-dimensional shape measuring apparatus 10. In the flow shown in FIG. 6, it is assumed that three-dimensional shape measurement is instructed from the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 according to the present embodiment is mounted.
　本実施の形態に係る３次元形状計測装置１０が搭載される装置本体の制御部から３次元形状計測が指示されると、投影装置１１から図２に示すパターン光が計測対象２０に投影され、パターン光が投影された計測対象２０が撮影装置１２により撮影される。撮影装置１２によって撮影された画像データ（撮影画像）は、画像取込部１３２に出力される。これにより、処理装置１３において、撮影画像が取得される（ステップ（以下、「ＳＴ」という）６０１）。 When the three-dimensional shape measurement is instructed from the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 according to the present embodiment is mounted, the pattern light shown in FIG. The measurement target 20 onto which the pattern light is projected is photographed by the photographing device 12. Image data (captured image) captured by the imaging device 12 is output to the image capturing unit 132. As a result, a captured image is acquired in the processing device 13 (step (hereinafter referred to as “ST”) 601).
　画像取込部１３２により取り込まれた撮影画像は、演算部１３３に出力される。撮影画像を受け取ると、演算部１３３においては、コード抽出部１３３ａが撮影画像に含まれる明暗コード３０の中心要素３１の中心点情報（中心座標情報）を抽出する（ＳＴ６０２）。コード抽出部１３３ａは、抽出した明暗コード３０の中心要素３１の中心点情報から、該当する明暗コード３０の位置情報を取得する。コード抽出部１３３ａにより抽出された明暗コード３０の位置情報は、コード識別部１３３ｂに出力される。 The captured image captured by the image capturing unit 132 is output to the computing unit 133. When the captured image is received, in the calculation unit 133, the code extraction unit 133a extracts the center point information (center coordinate information) of the center element 31 of the light / dark code 30 included in the captured image (ST602). The code extraction unit 133a acquires the position information of the corresponding light / dark code 30 from the center point information of the central element 31 of the extracted light / dark code 30. The position information of the light / dark code 30 extracted by the code extraction unit 133a is output to the code identification unit 133b.
　このように本実施の形態に係る３次元形状計測装置１０においては、コード抽出部１３３ａにより明暗コード３０の中心要素３１を抽出し、当該中心要素３１の中心点情報より明暗コード３０の位置情報を取得する。これにより、中心要素３１の位置により明暗コード３０の位置情報が取得されることから、明暗コード３０全体の形状を認識する必要がなく、そのための処理を省略できるので、コードの検出及び識別に必要となる演算コストの上昇を更に抑制することが可能となる。 As described above, in the three-dimensional shape measuring apparatus 10 according to the present embodiment, the central element 31 of the light / dark code 30 is extracted by the code extraction unit 133a, and the position information of the light / dark code 30 is obtained from the central point information of the central element 31. get. As a result, the position information of the light / dark code 30 is acquired based on the position of the central element 31, so that it is not necessary to recognize the shape of the entire light / dark code 30, and the processing for this can be omitted, so it is necessary for detecting and identifying the code It is possible to further suppress the increase in the calculation cost.
　明暗コード３０の位置情報を受け取ると、コード識別部１３３ｂは、明暗コード３０の種類を識別する（ＳＴ６０３）。コード識別部１３３ｂは、中心要素３１の周辺に配置されるアーム３２ａ～３２ｄの有無により明暗コード３０の種類を識別する。この場合、コード識別部１３３ｂは、識別対象の明暗コード３０のコード群３００における位置を特定する。明暗コード３０の種類及びコード群３００における明暗コード３０の位置は、対応点算出部１３３ｃに出力される。 Upon receiving the position information of the light / dark code 30, the code identifying unit 133b identifies the type of the light / dark code 30 (ST603). The code identification unit 133b identifies the type of the light / dark code 30 based on the presence / absence of the arms 32a to 32d arranged around the central element 31. In this case, the code identifying unit 133b identifies the position in the code group 300 of the light / dark code 30 to be identified. The type of the light / dark code 30 and the position of the light / dark code 30 in the code group 300 are output to the corresponding point calculation unit 133c.
　コード群３００における明暗コード３０の位置等の情報を受け取ると、対応点算出部１３３ｃは、投影装置１３１が投影した投影画像における算出対象の明暗コード３０の対応点を算出する（ＳＴ６０４）。この場合、投影画像におけるコード群３００の該当する明暗コード３０の位置と、コード識別部１３３ｂからの明暗コード３０の位置との比較により投影画像における算出対象の明暗コード３０の対応点が算出される。そして、対応点算出部１３３ｃにより算出された対応点情報は、３次元位置算出部１３３ｄに出力される。 Upon receiving information such as the position of the light / dark code 30 in the code group 300, the corresponding point calculation unit 133c calculates the corresponding point of the light / dark code 30 to be calculated in the projection image projected by the projection device 131 (ST604). In this case, the corresponding point of the light / dark code 30 to be calculated in the projection image is calculated by comparing the position of the corresponding light / dark code 30 in the code group 300 in the projection image with the position of the light / dark code 30 from the code identification unit 133b. . Then, the corresponding point information calculated by the corresponding point calculating unit 133c is output to the three-dimensional position calculating unit 133d.
　対応点情報を受け取ると、３次元位置算出部１３３ｄは、算出対象となる明暗コード３０に対応する３次元位置を算出する（ＳＴ６０５）。３次元位置算出部１３３ｄは、対応する明暗コード３０の中心要素３１における仮想基準面からの反射値と実際の位置からの反射値とのずれから奥行き座標を取得し、その奥行座標から算出対象となる明暗コード３０に対応する３次元位置を算出する。３次元位置算出部１３３ｄによって算出された３次元位置は、３次元形状計測装置１０が搭載される装置本体の制御部に出力される。 When the corresponding point information is received, the three-dimensional position calculation unit 133d calculates a three-dimensional position corresponding to the light / dark code 30 to be calculated (ST605). The three-dimensional position calculation unit 133d acquires the depth coordinate from the deviation between the reflection value from the virtual reference plane and the reflection value from the actual position in the center element 31 of the corresponding light / dark code 30, and calculates the calculation target from the depth coordinate. A three-dimensional position corresponding to the light / dark code 30 is calculated. The three-dimensional position calculated by the three-dimensional position calculation unit 133d is output to the control unit of the apparatus main body on which the three-dimensional shape measurement apparatus 10 is mounted.
　撮像画像におけるある明暗コード３０に対するＳＴ６０２～ＳＴ６０５の処理が完了すると、演算部１３３においては、撮影画像の全面（すなわち、全ての明暗コード３０）について処理を完了したかを判定する（ＳＴ６０６）。撮影画像の全面について処理が完了していない場合、演算部１３３は、処理をＳＴ６０２に戻し、ＳＴ６０２～ＳＴ６０６の処理を繰り返す。一方、撮影画像の全面について処理が完了している場合、演算部１３３は、処理を終了する。 When the processing of ST602 to ST605 for a certain light / dark code 30 in the captured image is completed, the calculation unit 133 determines whether the processing has been completed for the entire captured image (that is, all the light / dark codes 30) (ST606). If the process has not been completed for the entire captured image, operation unit 133 returns the process to ST602 and repeats the processes of ST602 to ST606. On the other hand, when the process has been completed for the entire surface of the captured image, the arithmetic unit 133 ends the process.
　このように本実施の形態に係る３次元形状計測装置１０においては、１回のパターン光の投影及び撮影により計測対象２０の３次元形状を計測する際に利用されるパターン光に中心要素３１と中心要素３１の周りに配置されるアーム３２とからなる複数の明暗コード３０が配列され、その明暗コード３０の種類がアーム３２の配置により識別される。このため、図形コードを用いる場合と比べて検出及び識別のために１つのコードに必要となる画素数を低減できる。これにより、撮像素子にて単位面積当たりに検出できるコードの数（コードの密度）を増やすことができ、空間分解能を向上できる。この結果、空間分解能を確保しつつ、１回のパターン光の投影及び撮影動作により計測対象２０の３次元形状を計測することが可能となる。 Thus, in the three-dimensional shape measurement apparatus 10 according to the present embodiment, the central element 31 and the pattern light used when measuring the three-dimensional shape of the measurement target 20 by projecting and photographing the pattern light once. A plurality of light / dark codes 30 including arms 32 arranged around the central element 31 are arranged, and the type of the light / dark code 30 is identified by the arrangement of the arms 32. For this reason, compared with the case where a figure code is used, the number of pixels required for one code | cord | chord for a detection and identification can be reduced. Thereby, the number of codes (code density) that can be detected per unit area by the image sensor can be increased, and the spatial resolution can be improved. As a result, it is possible to measure the three-dimensional shape of the measurement target 20 by one pattern light projection and photographing operation while ensuring spatial resolution.
　また、本実施の形態に３次元形状計測装置１０においては、計測対象２０に投影されるパターン光が、複数の明暗コード３０をエピポーラ面に対して平行な方向（図２に示すＸ軸方向）に所定の数だけ配列したコード群３００を構成単位として、この構成単位３００が繰り返し配列されてなるパターンで構成されている。このため、パターン光が、エピポーラ面に対して平行な方向のみにコード化されることから、２次元配列パターン（２次元ランダム点群パターン）のように、エピポーラ面に対して直交する２方向（エピポーラ面に対して平行な方向及び垂直な方向）にコード化される場合と比較して、コード数を少なくできるので、全てのコードを表すために必要なビット数を低減できる。これに伴い、投影後にコードがエピポーラ面に対して平行な方向（第１の方向）に動いた時に隣のコード群における同一のコードと区別できる幅（投影パターンと撮影パターンとの視差ずれを弁別できる弁別可能幅）を少ないビット数で長く取ることができる。これにより、奥行き方向の計測レンジを長く確保でき、演算コストの上昇を抑制することが可能となる。 Further, in the three-dimensional shape measuring apparatus 10 according to the present embodiment, the pattern light projected onto the measurement target 20 is a direction parallel to the epipolar plane of the plurality of light / dark codes 30 (X-axis direction shown in FIG. 2). A code group 300 arranged in a predetermined number is used as a constituent unit, and the constituent unit 300 is repeatedly arranged. For this reason, since the pattern light is encoded only in a direction parallel to the epipolar plane, two directions orthogonal to the epipolar plane (two-dimensional array pattern (two-dimensional random point cloud pattern)) ( Since the number of codes can be reduced as compared with the case of encoding in a direction parallel to and perpendicular to the epipolar plane, the number of bits necessary to represent all codes can be reduced. Along with this, when the code moves in the direction parallel to the epipolar plane (first direction) after projection, it can be distinguished from the same code in the adjacent code group (disparity between the parallax deviation between the projection pattern and the shooting pattern) The discriminable width) can be long with a small number of bits. As a result, a long measurement range in the depth direction can be secured, and an increase in calculation cost can be suppressed.
　特に、本実施の形態に３次元形状計測装置１０において、計測対象２０に投影されるパターン光は、隣り合う明暗コード３０の中心要素３１間に配置される共通のアーム３２を有し、連続的につながって配列されている。これにより、隣り合う明暗コード３０間においてアーム３２が共有されることから、パターン光に配列される明暗コード３０の密度を増やすことができる。これにより、撮影装置１２のＣＣＤイメージセンサ１２１にて検出できるコードの数を増やすことができ、空間分解能を更に向上することが可能となる。 In particular, in the three-dimensional shape measuring apparatus 10 according to the present embodiment, the pattern light projected onto the measurement target 20 has a common arm 32 disposed between the central elements 31 of the adjacent light and dark codes 30 and is continuous. It is connected to. Thereby, since the arm 32 is shared between the adjacent light and dark cords 30, the density of the light and dark cords 30 arranged in the pattern light can be increased. Thereby, the number of codes that can be detected by the CCD image sensor 121 of the photographing apparatus 12 can be increased, and the spatial resolution can be further improved.
　さらに、本実施の形態に３次元形状計測装置１０において、明暗コード３０は、中心要素３１からみたアーム３２ａ～３２ｄの延出方向が明暗コード３０の配列方向（図２に示すＸ軸方向）に対して斜め方向となるようにアーム３２ａ～３２ｄが配置されている。これにより、アーム３２の延出方向が明暗コード３０の配列方向に対して平行又は垂直な方向に配置される場合と比べてアーム３２の長さを確保できる。これにより、明暗コード３０における中心要素３１の位置やアーム３２ａ～３２ｄの有無の識別性を向上することが可能となる。 Furthermore, in the three-dimensional shape measuring apparatus 10 according to the present embodiment, the light / dark cord 30 has the extending direction of the arms 32a to 32d viewed from the central element 31 in the arrangement direction of the light / dark cord 30 (X-axis direction shown in FIG. 2). On the other hand, the arms 32a to 32d are arranged in an oblique direction. Thereby, the length of the arm 32 can be secured as compared with the case where the extending direction of the arm 32 is arranged in a direction parallel or perpendicular to the arrangement direction of the light and dark cords 30. This makes it possible to improve the discrimination of the position of the central element 31 in the light / dark code 30 and the presence / absence of the arms 32a to 32d.
　なお、本発明は上記実施の形態に限定されず、様々に変更して実施可能である。上記実施の形態において、添付図面に図示されている構成などについては、これに限定されず、本発明の効果を発揮する範囲内で適宜変更が可能である。その他、本発明の目的の範囲を逸脱しない限りにおいて適宜変更して実施可能である。 In addition, this invention is not limited to the said embodiment, It can implement by changing variously. In the above-described embodiment, the configuration and the like illustrated in the accompanying drawings are not limited to this, and can be appropriately changed within a range in which the effect of the present invention is exhibited. In addition, various modifications can be made without departing from the scope of the object of the present invention.
　例えば、上記実施の形態においては、各明暗コード３０が４ビットコードで構成される場合について説明している。しかしながら、各明暗コード３０の構成については、これに限定されるものではなく適宜変更が可能である。例えば、表現する情報量に応じて、８種類の情報を表現可能な３ビットコードや、２５６種類の情報を表現可能な８ビットコードで明暗コード３０を構成しても良い。この場合、明暗コード３０が表現可能な情報量に応じてコード群３００を構成する明暗コード３０の数も適宜調整できる（すなわち、弁別可能幅を調整できる）。 For example, in the above-described embodiment, the case where each light / dark code 30 is constituted by a 4-bit code has been described. However, the configuration of each light / dark code 30 is not limited to this, and can be changed as appropriate. For example, the light / dark code 30 may be composed of a 3-bit code capable of expressing eight types of information or an 8-bit code capable of expressing 256 types of information according to the amount of information to be expressed. In this case, the number of light / dark codes 30 constituting the code group 300 can be adjusted as appropriate according to the amount of information that the light / dark code 30 can express (that is, the distinguishable width can be adjusted).
　また、上記実施の形態においては、パターン光に含まれる明暗コード３０が複数のアーム３２を周辺要素として備える場合について説明している。しかしながら、明暗コード３０の周辺要素の構成については、これに限定されるものではなく適宜変更が可能である。例えば、周辺要素として単一のアーム３２を備える構成としてもよい。また、上記実施の形態においては、パターン光に含まれる明暗コード３０が円形状の中心要素３１を備える場合について説明している。しかしながら、明暗コード３０の中心要素３１の構成については、これに限定されるものではなく適宜変更が可能である。例えば、矩形状の中心要素３１を備える構成としてもよい。 In the above embodiment, the case where the light / dark code 30 included in the pattern light includes a plurality of arms 32 as peripheral elements has been described. However, the configuration of the peripheral elements of the light / dark code 30 is not limited to this and can be appropriately changed. For example, it is good also as a structure provided with the single arm 32 as a peripheral element. Moreover, in the said embodiment, the case where the light-and-dark code 30 contained in pattern light is provided with the circular center element 31 is demonstrated. However, the configuration of the central element 31 of the light / dark cord 30 is not limited to this and can be changed as appropriate. For example, it is good also as a structure provided with the rectangular-shaped center element 31. FIG.
　その他、明暗コード３０については、様々な態様が考えられる。図７は、本実施の形態の変形例に係る明暗コード３０の説明図である。図７Ａにおいては、隣り合う明暗コード３０の中心要素３１と接続されない態様の明暗コード３０を示している。図７Ｂ及び図７Ｃは、明暗コード３０を構成する中心要素と、その周囲に配置される周辺要素とが同一形状を有する態様について示している。図７Ｂにおいては、中心要素と周辺要素とがいずれも円形状を有する場合について示し、図７Ｃにおいては、中心要素と周辺要素とがいずれも正方形状を有する場合について示している。図７Ｄにおいては、中心要素３１の周囲に８個の周辺要素が配置される場合について示している。すなわち、図７Ｄにおいては、８ビットコードの明暗コード３０を示している。これらのように明暗コード３０の態様を変形した場合においても、上記実施の形態と同様に、空間分解能を確保しつつ、１回のパターン光の投影及び撮影動作により計測対象の３次元形状を計測することが可能となる。 In addition, various modes can be considered for the light / dark code 30. FIG. 7 is an explanatory diagram of a light / dark code 30 according to a modification of the present embodiment. In FIG. 7A, the light / dark cord 30 in a mode not connected to the central element 31 of the adjacent light / dark cord 30 is shown. 7B and 7C show an aspect in which the central element constituting the light / dark cord 30 and the peripheral elements arranged around the central element have the same shape. FIG. 7B shows a case where both the central element and the peripheral element have a circular shape, and FIG. 7C shows a case where both the central element and the peripheral element have a square shape. FIG. 7D shows a case where eight peripheral elements are arranged around the central element 31. That is, in FIG. 7D, an 8-bit code light / dark code 30 is shown. Even when the form of the light / dark code 30 is modified as described above, the three-dimensional shape of the measurement object is measured by one pattern light projection and photographing operation while ensuring the spatial resolution, as in the above embodiment. It becomes possible to do.
　なお、上記実施の形態においては、１回の撮像によって、その瞬間における３次元形状を計測する３次元形状計測方法について説明している。しかしながら、このような３次元形状計測方法により所定時間間隔で３次元形状を計測することにより、３次元形状の動的計測（モーション入力）を実現することも可能である。 In the above embodiment, a three-dimensional shape measurement method for measuring a three-dimensional shape at the moment by one imaging is described. However, it is also possible to realize dynamic measurement (motion input) of a three-dimensional shape by measuring the three-dimensional shape at a predetermined time interval by such a three-dimensional shape measurement method.
　また、上記実施の形態においては、明暗コード３０の配列方向が、エピポーラ面に対して平行な方向である場合について説明している。しかしながら、明暗コード３０の配列方向については、これに限定されるものではなく適宜変更が可能である。例えば、エピポーラ面に対して僅かに傾斜した方向に沿って明暗コード３０を配列してもよい。このように変更する場合においても、上記実施の形態と同様の効果を得ることができる。 In the above embodiment, the case where the arrangement direction of the light / dark code 30 is parallel to the epipolar plane has been described. However, the arrangement direction of the light / dark code 30 is not limited to this and can be changed as appropriate. For example, the light / dark code 30 may be arranged along a direction slightly inclined with respect to the epipolar plane. Even in the case of such changes, the same effects as in the above embodiment can be obtained.
　１０　３次元形状計測装置
　１１　投影装置
　１２　撮影装置
　１３　処理装置
　１３１　投影装置制御部
　１３２　画像取込部
　１３３　演算部
　１３３ａ　コード抽出部
　１３３ｂ　コード識別部
　１３３ｃ　対応点算出部
　１３３ｄ　３次元位置算出部
　２０　計測対象
　３０、３０ａ～３０ｃ　明暗コード
　３１　中心要素
　３２、３２ａ～３２ｄ　アーム
　３００　コード群
　３０１～３０５　明暗コード DESCRIPTION OF SYMBOLS 10 3D shape measuring device 11 Projection device 12 Imaging device 13 Processing device 131 Projection device control part 132 Image taking part 133 Calculation part 133a Code extraction part 133b Code identification part 133c Corresponding point calculation part 133d 3D position calculation part 20 Measurement object 30, 30a-30c Light / dark code 31 Central element 32, 32a-32d Arm 300 Cord group 301-305 Light / dark code

Claims (11)

  1. 　複数の明暗コードが配列されたパターン光を計測対象に投影する投影ステップと、前記パターン光が投影された前記計測対象を撮影する撮影ステップと、前記計測対象を撮影した撮影画像から前記明暗コードを抽出するコード抽出ステップと、抽出した前記明暗コードの種類を識別するコード識別ステップと、識別したそれぞれの前記明暗コードの位置情報より３次元位置を算出する３次元位置算出ステップと、を具備する３次元形状計測方法であって、
    　前記明暗コードは、中心要素と前記中心要素の周りに配置される１つ又は複数の周辺要素からなり、前記周辺要素の配置により当該明暗コードの種類が識別されることを特徴とする３次元形状計測方法。     A projection step of projecting pattern light on which a plurality of light and dark codes are arranged onto a measurement object, a photographing step of photographing the measurement object onto which the pattern light is projected, and the light and dark code from a photographed image obtained by photographing the measurement object A code extracting step for extracting, a code identifying step for identifying the type of the extracted light / dark code, and a three-dimensional position calculating step for calculating a three-dimensional position from position information of each identified light / dark code. A dimension shape measuring method,
    The light / dark code is composed of a central element and one or a plurality of peripheral elements arranged around the central element, and the type of the light / dark code is identified by the arrangement of the peripheral elements. Measurement method.
  2. 　前記パターン光は、複数の前記明暗コードを第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向に対して垂直な第２の方向に繰り返し配列されてなるパターンであることを特徴とする請求項１記載の３次元形状計測方法。 The pattern light includes a code group in which a predetermined number of light and dark codes are arranged in a first direction as a constituent unit, and the constituent units are repeatedly arranged in a second direction perpendicular to the first direction. The three-dimensional shape measuring method according to claim 1, wherein the pattern is a formed pattern.
  3. 　前記パターン光は、複数の前記明暗コードをエピポーラ面に対して平行な前記第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向及びエピポーラ面に対して垂直な前記第２の方向に繰り返し配列されてなるパターンであることを特徴とする請求項２記載の３次元形状計測方法。 The pattern light includes, as a structural unit, a code group in which a predetermined number of the light and dark codes are arranged in the first direction parallel to the epipolar plane, and the structural unit is arranged in the first direction and the epipolar plane. 3. The three-dimensional shape measuring method according to claim 2, wherein the pattern is a pattern that is repeatedly arranged in the second direction perpendicular to the second direction.
  4. 　前記パターン光は、隣り合う前記明暗コードの前記中心要素間に配置される共通の前記周辺要素を有し、隣り合う前記明暗コードが連続的につながって配列されていることを特徴とする請求項１から請求項３のいずれかに記載の３次元形状計測方法。 The pattern light has the common peripheral element arranged between the central elements of the adjacent light and dark codes, and the adjacent light and dark codes are continuously connected and arranged. The three-dimensional shape measuring method according to any one of claims 1 to 3.
  5. 　前記コード抽出ステップにおいて、前記明暗コードの前記中心要素を抽出し、当該中心要素の位置より前記明暗コードの位置情報を取得することを特徴とする請求項１から請求項４のいずれかに記載の３次元形状計測方法。 5. The code extraction step according to claim 1, wherein the central element of the light / dark code is extracted and position information of the light / dark code is acquired from a position of the central element. 3D shape measurement method.
  6. 　前記明暗コードは、前記中心要素の周りに前記周辺要素が配置される位置を４箇所有することを特徴とする請求項１から請求項５のいずれかに記載の３次元形状計測方法。 The three-dimensional shape measuring method according to any one of claims 1 to 5, wherein the light / dark code has four positions where the peripheral elements are arranged around the central element.
  7. 　前記明暗コードは、前記中心要素からみた前記周辺要素の方向が前記明暗コードの配列方向に対して斜め方向となるように前記周辺要素が配置されることを特徴とする請求項１から請求項６のいずれかに記載の３次元形状計測方法。 7. The light and dark code, wherein the peripheral elements are arranged such that a direction of the peripheral elements viewed from the central element is an oblique direction with respect to an arrangement direction of the light and dark codes. The three-dimensional shape measurement method according to any one of the above.
  8. 　前記投影ステップで投影される前記パターン光は、可視光以外の波長を有することを特徴とする請求項１から請求項７のいずれかに記載の３次元形状計測方法。 The three-dimensional shape measuring method according to any one of claims 1 to 7, wherein the pattern light projected in the projecting step has a wavelength other than visible light.
  9. 　複数の明暗コードが配列されたパターン光を計測対象に投影する投影部と、前記パターン光が投影された前記計測対象を撮影する撮影部と、前記計測対象を撮影した撮影画像から前記明暗コードを抽出する抽出部と、前記抽出部で抽出した前記明暗コードの種類を識別する識別部と、前記識別部で識別したそれぞれの前記明暗コードの位置情報より３次元位置を算出する算出部と、を具備する３次元形状計測装置であって、
    　前記明暗コードは、中心要素と前記中心要素の周りに配置される１つ又は複数の周辺要素からなり、前記周辺要素の配置により当該明暗コードの種類が識別されることを特徴とする３次元形状計測装置。     A projection unit that projects pattern light on which a plurality of light and dark codes are arranged onto a measurement target, a photographing unit that photographs the measurement target onto which the pattern light is projected, and the light and dark code from a photographed image obtained by photographing the measurement target. An extraction unit for extraction, an identification unit for identifying the type of the light / dark code extracted by the extraction unit, and a calculation unit for calculating a three-dimensional position from position information of each of the light / dark codes identified by the identification unit, A three-dimensional shape measuring apparatus comprising:
    The light / dark code is composed of a central element and one or a plurality of peripheral elements arranged around the central element, and the type of the light / dark code is identified by the arrangement of the peripheral elements. Measuring device.
  10. 　前記投影部が投影する前記パターン光は、複数の前記明暗コードを第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向に対して垂直な第２の方向に繰り返し配列されてなるパターンであることを特徴とする請求項９記載の３次元形状計測装置。 The pattern light projected by the projection unit includes a code group in which a predetermined number of the light and dark codes are arranged in a first direction as a constituent unit, and the constituent unit is perpendicular to the first direction. The three-dimensional shape measuring apparatus according to claim 9, wherein the three-dimensional shape measuring apparatus is a pattern that is repeatedly arranged in two directions.
  11. 　前記投影部が投影する前記パターン光は、複数の前記明暗コードをエピポーラ面に対して平行な前記第１の方向に所定の数だけ配列したコード群を構成単位として、前記構成単位が前記第１の方向及びエピポーラ面に対して垂直な前記第２の方向に繰り返し配列されてなるパターンであることを特徴とする請求項１０記載の３次元形状計測装置。 The pattern light projected by the projection unit includes a code group in which a predetermined number of the plurality of bright and dark codes are arranged in the first direction parallel to the epipolar plane, and the structural unit is the first light. The three-dimensional shape measuring apparatus according to claim 10, wherein the three-dimensional shape measuring apparatus is a pattern repeatedly arranged in the second direction perpendicular to the direction and the epipolar plane.
PCT/JP2014/073495 2013-09-05 2014-09-05 Three-dimensional shape measurement method and three-dimensional shape measurement device WO2015034048A1 (en)

Applications Claiming Priority (2)

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