WO2014036747A1 - 一种烤箱和可调式烘烤系统 - Google Patents
一种烤箱和可调式烘烤系统 Download PDFInfo
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- WO2014036747A1 WO2014036747A1 PCT/CN2012/081289 CN2012081289W WO2014036747A1 WO 2014036747 A1 WO2014036747 A1 WO 2014036747A1 CN 2012081289 W CN2012081289 W CN 2012081289W WO 2014036747 A1 WO2014036747 A1 WO 2014036747A1
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- oven
- glass substrate
- baked
- developing machine
- module
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- 239000011521 glass Substances 0.000 claims abstract description 106
- 239000000758 substrate Substances 0.000 claims abstract description 84
- 238000011144 upstream manufacturing Methods 0.000 claims abstract description 20
- 238000001514 detection method Methods 0.000 claims abstract description 18
- 230000005540 biological transmission Effects 0.000 claims abstract description 13
- 238000002360 preparation method Methods 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 7
- 238000000605 extraction Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
Definitions
- the present invention relates to the field of production of flat panel displays, and more particularly to an oven and an adjustable baking system. Background technique
- the production line of general flat panel displays requires the use of baking equipment to bake the glass substrate of the flat display as a process for soft-baked or hard-baked photoresist.
- all soft-baked and hard-baked equipment adopts a fixed baking time in the flat-panel display process, that is, when the fixed time set by the oven arrives, the oven will discharge the baked glass substrate. The state of completion of baking is achieved.
- the oven will preferentially deliver the product inside the oven after the product has been baked, so that it may not take the product in the upstream developing machine.
- the conventional production line will be provided with a physical buffer (Buffer) upstream, and the glass substrate transported by the developing machine will be received in the Buffer in time to avoid the loss of the upstream developing machine product.
- the color film photoresist hardening of the glass substrate has a time interval required for the hard baking to complete, and in this interval, the baking after the photoresist hardening is completed does not affect the quality of the glass substrate.
- the upstream developing machine exits the glass substrate (Glass)
- the sensor A sensor A
- the developing machine will send a Send signal to the downstream oven (Oven).
- the Receiver will send a Receive signal.
- Glass will start to transmit to Oven.
- Oven's automatic controller robot
- Glass will wait for the robot to pick up and place the product at the entrance of Oven.
- the glass in the upstream developing machine will be finished. Will receive the entity Buffer first.
- the present invention provides an oven and an adjustable baking system having a virtual buffer function.
- the oven provided by the invention comprises:
- a signal receiving module configured to receive a ready transmission signal sent to the developing device at the upstream of the oven to prepare to transmit the glass substrate to be baked
- a baking module for baking the glass substrate
- a detecting module configured to detect whether the automatic controller performs a take-out operation on the glass substrate in the baking module
- a signal feedback module configured to determine, according to the detection result of the detecting module, whether to send a feedback signal to the developing machine to instruct the developing machine to transmit the glass substrate to be baked thereto.
- the signal feedback module sends a feedback signal to the developing machine.
- the signal feedback module sends a feedback signal to the developing machine.
- the signal feedback module waits for the automatic controller to take out the After baking the finished glass substrate, a feedback signal is sent back to the developing machine.
- the present invention also provides an adjustable baking system comprising: a developing machine, an oven, an automatic controller;
- the developing machine is provided with a glass sensor for sensing a glass substrate, and when a glass sensor senses a glass substrate to be sent to the oven for baking on the developing machine, sends a ready transmission signal to the oven;
- the developing machine receives a feedback signal sent back by the oven, and transmits the glass substrate to be baked to the oven.
- the oven when the oven detects that the automatic controller does not perform an operation of taking out the baked glass substrate, the oven sends back a feedback signal to the developing machine;
- the automatic controller After the developing machine transports the glass substrate to be baked to the oven, the automatic controller performs an operation of removing the baked glass substrate in the oven.
- the oven when the oven detects that the automatic controller has performed an operation of taking out the baked glass substrate, the oven sends back a feedback signal to the developing machine;
- the processor then receives a feedback signal from the oven to transfer the glass substrate to be baked to the oven.
- the oven when the oven detects that the automatic controller is performing an operation of taking out the baked glass substrate, the oven waits for the automatic controller to take out the baked glass substrate, and then Sending a feedback signal to the developing machine;
- the processor then receives a feedback signal from the oven to transfer the glass substrate to be baked to the oven.
- the oven and the adjustable baking system provided by the invention can be adjusted, and the film speed of the glass substrate to be baked can be adjusted by the upstream developing machine, and the buffer is not required, which greatly saves the equipment cost and can also be adjusted.
- the baking time of the oven improves the baking efficiency.
- FIG. 1 is a schematic diagram of a production line of a flat panel display provided by the prior art.
- Embodiment 1 of the adjustable baking system provided by the present invention.
- FIG. 3 is a schematic structural view of Embodiment 2 of the adjustable baking system provided by the present invention.
- FIG. 4 is a schematic view showing the structure of an oven provided by the present invention. detailed description
- the present invention provides an adjustable baking system and an oven that regulates the transfer speed of a glass substrate to be baked by an upstream developing machine.
- FIG. 2 is a schematic structural view of an adjustable baking system provided by the present invention.
- the invention provides an adjustable baking system, comprising: a developing machine 1, an oven 2, an automatic controller
- the developing machine 1 is provided with a glass sensor for sensing a glass substrate, and when the glass sensor senses that the developing machine 1 has a glass substrate to be sent to the oven 2 for baking, it sends the glass substrate to the oven 2 Prepare to transmit signals (Send Ready);
- the oven 2 receives the ready transmission signal, and detects whether the automatic controller 3 is performing an operation of taking out the glass substrate, and determines whether to send back a feedback signal to the developing machine 1 according to the detection result (Reset Ok );
- the developing machine 1 receives a feedback signal (Receive Ok) sent back from the oven 2, and conveys the glass substrate to be baked to the oven 2.
- a feedback signal (Receive Ok) sent back from the oven 2, and conveys the glass substrate to be baked to the oven 2.
- one implementation manner is:
- the oven 2 When the oven 2 detects that the automatic controller 3 has not performed an operation of taking out the baked glass substrate therein, the oven 2 sends back a feedback signal to the developing machine 1;
- the automatic controller 3 After the developing machine 1 transports the glass substrate to be baked to the oven 2, the automatic controller 3 performs an operation of taking away the baked glass substrate in the oven 2.
- the second implementation is:
- the oven 2 detects that the automatic controller 3 has performed an operation of taking out the baked glass substrate therein, the oven 2 sends a feedback signal to the developing machine 1;
- the developing machine 1 receives a feedback signal sent back from the oven 2, and conveys the glass substrate to be baked to the oven 2.
- the oven 2 When the oven 2 detects that the automatic controller 3 is performing an operation of taking out the baked glass substrate therein, the oven 2 waits for the automatic controller 3 to take out the baked glass substrate. And sending back a feedback signal to the developing machine 1;
- the developing machine 1 receives a feedback signal sent back from the oven 2, and conveys the glass substrate to be baked to the oven 2.
- a feedback signal sent back from the oven 2 is shown in FIG. 3.
- the adjustable oven system provided by the present invention is improved in both hardware and software to achieve adjustable baking.
- a glass sensor (sensor B) is added.
- the developing machine will give The downstream oven (Oven) sends a ready to send signal (Send ready), the purpose is to tell Oven in advance, the developer will have Glass to transmit; Oven will also add a signal Receive Ok, when the detector Send Ready signal is detected In the "On" state, if the robot does not finish the glass in the pick-and-place, Oven will send a feedback signal (Receive Ok) to the upstream processor, and the robot will no longer pick and place the baked product.
- the robot will wait for the development of the processor and Oven Glass to complete the removal of the baked glass from Oven; if the Robot is picking up the baked glass, then after the Glass is finished, Oven Sending the Receive OK signal to the processor, the developer will transfer the glass to be baked to Oven, and the Robot will wait for the processor and Oven to complete the Glass transmission.
- the upstream transmission of the Glass stream is detected in time, and the communication plus signal is added: Send Ready signal and Receive OK signal to achieve priority acquisition.
- the products on the Oven inlet flexibly regulate the Oven baking time and realize the virtual Buffer function, which can save the cost of one Buffer and reduce the transmission stagnation of the production line.
- FIG. 4 there is shown a schematic structural view of an oven provided by the present invention.
- the signal receiving module 20 is configured to receive a preparation transmission signal sent to the developing machine 1 (shown in FIG. 3) upstream of the oven to prepare to transmit the glass substrate to be baked;
- the detecting module 22 is configured to detect whether the automatic controller 3 (shown in FIG. 3) performs a take-out operation on the glass substrate in the baking module 20;
- the signal feedback module 23 is configured to determine whether to send a feedback signal to the developing machine according to the detection result of the detecting module 22 to instruct the developing machine 1 to transmit the glass substrate to be baked thereto.
- the automatic controller 3 may be a separate entity with respect to the oven 2 or a functional part of the oven 2.
- the signal feedback module 23 sends a feedback signal to the developing machine 1 during the operation of taking out the baked glass substrate in the baking module 21.
- the signal feedback module 23 A feedback signal is sent back to the developing machine 1.
- the detecting module 22 detects that the automatic controller 3 is performing an operation of taking out the baked glass substrate in the baking module 21, the signal feedback module 23 After the automatic controller 3 takes out the baked glass substrate, it sends back a feedback signal to the developing machine 1.
- the adjustable baking system and the oven provided by the invention can adjust the film conveying speed of the glass substrate to be baked by the upstream developing machine, and the special buffer is not needed, which greatly saves the equipment cost and can also be adjusted.
- the baking time of the oven improves the baking efficiency.
- the storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Baking, Grill, Roasting (AREA)
- Waste-Gas Treatment And Other Accessory Devices For Furnaces (AREA)
Abstract
一种烤箱(2)和可调式烘烤系统,所述烤箱(2)包括:信号接收模块(20),用于接收位于该烤箱(2)上游的显影机(1)向其发送的准备传输待烘烤的玻璃基板的准备传输信号;烘烤模块(21),用于对玻璃基板进行烘烤;侦测模块(22),用于侦测自动控制器(3)是否在对所述烘烤模块(21)中的玻璃基板执行取出操作;信号反馈模块(23),用于根据所述侦测模块(22)的侦测结果决策是否向所述显影机(1)发回反馈信号以指示所述显影机(1)向其传输待烘烤的玻璃基板。该烤箱(2)和可调式烘烤系统可以对上游显影机(1)传输待烘烤的玻璃基板的传片速度进行调节,不需要专门配备缓冲器,大大节省了设备成本,同样也可以调节烤箱的烘烤时间,从而提高烘烤效率。
Description
一种烤箱和可调式烘烤系统 本申请要求于 2012年 9月 6日提交中国专利局、 申请号为 201210326813.0 、 发明名称为 "一种烤箱和可调式烘烤系统" 的中国专利申请的优先权, 上述 专利的全部内容通过引用结合在本申请中。
技术领域
本发明涉及一种平面显示器的生产技术领域, 尤其涉及一种烤箱和可调式 烘烤系统。 背景技术
目前一般平面显示器的生产线, 均需要使用烘烤设备烘烤平面显示器的玻 璃基板, 作为光阻软烤或硬烤的制程需求。 而目前所有的软烤及硬烤设备, 在 平面显示器制程上, 均是采用固定式的烘烤时间, 即在烤箱设定的固定时间到 达时, 烤箱即会将烘烤完成的玻璃基板排出, 达到烘烤完成的状态。
举例来讲, 传统的平面显示器的生产线, 其烤箱会在产品完成烘烤后, 优 先将炉子里面的产品送出, 这样会发生来不及取上游显影机内的产品。
参见图 1 , 传统的生产线都会在上游设置一个实体緩沖器(Buffer ), 及时将 显影机传输的玻璃基板收到 Buffer 内, 从而避免上游显影机产品无法及时排出 发生的损失。 玻璃基板的彩膜光阻硬化有一个硬烤完成所需时间区间, 在这个 区间内, 光阻硬化完成后多烘烤一段时间不会对玻璃基板的品质有影响。
具体的, 当上游显影机出口有玻璃基板(Glass ) 时, 显影机出口的感应器 A ( sensor A )就会出现 "ON" 信号, 同时显影机将会给下游的烤箱 (Oven )发 送 Send信号, 此时 Oven的入口上如果没有 Glass, 就会给显影机发送 Receive 信号, 当显影机收到该 Receive信号时, Glass就开始向 Oven传输, 传统 Oven 经常会遇到的问题是: 当 Glass传输完毕时, Oven的自动控制器(robot ) 已经 在取放烘烤完成的产品, 这时就会造成 Glass在 Oven的入口上等待 Robot取放 产品完毕, 而此时, 上游显影机内的 Glass就会先收到实体 Buffer内。
现有技术存在的缺点如下:
第一, 在生产线的上游设置实体 Buffer的成本非常高;
第二, 现有技术的烤箱的烘烤时间是固定的, 上游显影机传送的玻璃基板 必须等待烤箱达到该固定时间之后,将待烘烤的玻璃基板排出至实体 Buffer, 因 此烘烤效率低下。 发明内容
为解决现有技术中存在的问题, 本发明提供一种具有虚拟緩沖器功能的可 烤箱及可调式烘烤系统。
本发明提供的烤箱, 包括:
信号接收模块, 用于接收位于该烤箱上游的显影机向其发送的准备传输待 烘烤的玻璃基板的准备传输信号;
烘烤模块, 用于对玻璃基板进行烘烤;
侦测模块, 用于侦测自动控制器是否在对所述烘烤模块中的玻璃基板执行 取出操作;
信号反馈模块, 用于根据所述侦测模块的侦测结果决策是否向所述显影机 发回反馈信号以指示所述显影机向其传输待烘烤的玻璃基板。
其中, 当所述侦测模块侦测到所述自动控制器未执行将所述烘烤模块中烘 烤完成的玻璃基板取出的操作时, 所述信号反馈模块向所述显影机发回反馈信 号。
其中, 当所述侦测模块侦测到所述自动控制器已经执行将所述烘烤模块中 烘烤完成的玻璃基板取出的操作时, 所述信号反馈模块向所述显影机发回反馈 信号。
其中, 当所述侦测模块侦测到所述自动控制器正在执行将所述烘烤模块中 烘烤完成的玻璃基板取出的操作时, 所述信号反馈模块等待所述自动控制器取 出所述烘烤完成的玻璃基板后, 再向所述显影机发回反馈信号。
相应地, 本发明还提供一种可调式烘烤系统, 包括: 显影机、 烤箱、 自动 控制器;
所述显影机, 其设置有用于感应玻璃基板的玻璃感应器, 当其玻璃感应器 感应到该显影机上有待送至所述烤箱烘烤的玻璃基板时, 向所述烤箱发送准备 传输信号;
所述烤箱接收到所述准备传输信号, 并侦测所述自动控制器是否在进行取
出玻璃基板的操作, 并根据侦测结果决策是否向所述显影机发回反馈信号; 所述显影机接收到所述烤箱发回的反馈信号, 向所述烤箱传输待烘烤的玻 璃基板。
其中, 当所述烤箱侦测到所述自动控制器未执行将其中烘烤完成的玻璃基 板取出的操作时, 所述烤箱向所述显影机发回反馈信号;
所述显影机向所述烤箱传输完待烘烤的玻璃基板之后, 所述自动控制器再 执行将所述烤箱中的烘烤完成的玻璃基板取走的操作。
其中, 当所述烤箱侦测到所述自动控制器已经执行将其中烘烤完成的玻璃 基板取出的操作时, 所述烤箱向所述显影机发回反馈信号;
则所述显影机接收到所述烤箱发回的反馈信号, 向所述烤箱传输待烘烤的 玻璃基板。
其中, 当所述烤箱侦测到所述自动控制器正在执行将其中烘烤完成的玻璃 基板取出的操作时, 所述烤箱等待所述自动控制器取出所述烘烤完成的玻璃基 板后, 再向所述显影机发回反馈信号;
则所述显影机接收到所述烤箱发回的反馈信号, 向所述烤箱传输待烘烤的 玻璃基板。
实施本发明提供的烤箱和可调式烘烤系统, 其可以对上游显影机传输待烘 烤的玻璃基板的传片速度进行调节, 不需要专门配备緩沖器, 大大节省了设备 成本, 同样也可以调节烤箱的烘烤时间, 从而提高烘烤效率。 附图说明 例或现有技术描述中所需要使用的附图作筒单地介绍, 显而易见地, 下面描述 中的附图仅仅是本发明的一些实施例, 对于本领域普通技术人员来讲, 在不付 出创造性劳动的前提下, 还可以根据这些附图获得其他的附图。
图 1为现有技术提供的平面显示器的生产线的示意图。
图 2为本发明提供的可调式烘烤系统实施例一的结构示意图。
图 3为本发明提供的可调式烘烤系统实施例二的结构示意图。
图 4为本发明提供的烤箱的结构示意图。
具体实施方式
本发明提供一种可调式烘烤系统和烤箱, 其可以对上游显影机传输待烘烤 的玻璃基板的传片速度进行调节。
图 2为本发明提供的可调式烘烤系统的结构示意图。
本发明提供的一种可调式烘烤系统, 包括: 显影机 1、 烤箱 2、 自动控制器
3;
所述显影机 1 , 其设置有用于感应玻璃基板的玻璃感应器, 当其玻璃感应器 感应到该显影机 1上有待送至所述烤箱 2烘烤的玻璃基板时, 向所述烤箱 2发 送准备传输信号 (Send Ready );
所述烤箱 2接收到所述准备传输信号, 并侦测所述自动控制器 3是否在进 行取出玻璃基板的操作, 并根据侦测结果决策是否向所述显影机 1 发回反馈信 号 ( Receive Ok );
所述显影机 1接收到所述烤箱 2发回的反馈信号 (Receive Ok ), 向所述烤 箱 2传输待烘烤的玻璃基板。
具体实现中, 一种实施方式是:
当所述烤箱 2侦测到所述自动控制器 3未执行将其中烘烤完成的玻璃基板 取出的操作时, 所述烤箱 2向所述显影机 1发回反馈信号;
所述显影机 1向所述烤箱 2传输完待烘烤的玻璃基板之后, 所述自动控制 器 3再执行将所述烤箱 2中的烘烤完成的玻璃基板取走的操作。
第二种实施方式是:
当所述烤箱 2侦测到所述自动控制器 3 已经执行将其中烘烤完成的玻璃基 板取出的操作时, 所述烤箱 2向所述显影机 1发回反馈信号;
则所述显影机 1接收到所述烤箱 2发回的反馈信号, 向所述烤箱 2传输待 烘烤的玻璃基板。
第三种实施方式是:
当所述烤箱 2侦测到所述自动控制器 3正在执行将其中烘烤完成的玻璃基 板取出的操作时, 所述烤箱 2等待所述自动控制器 3取出所述烘烤完成的玻璃 基板后, 再向所述显影机 1发回反馈信号;
则所述显影机 1接收到所述烤箱 2发回的反馈信号, 向所述烤箱 2传输待 烘烤的玻璃基板。
一个具体实现如图 3 所示, 本发明提供的可调式烤箱系统从硬件和软件两 个方面改进来实现可调式烘烤。
首先上游显影机在出口处, 在原有的 sensor A的基础上, 增加一颗玻璃感 应器( sensor B ), 当 Sensor B感应到显影机上有待烘烤的玻璃基板 ( Glass )时, 显影机将给下游烤箱的 (Oven )发送准备传输信号 (Send ready ), 目的是提前 告诉 Oven, 显影机将会有 Glass要传输; 同时 Oven也会增加一个信号 Receive Ok, 当侦测到显影机 Send Ready信号处于 "On" 状态时, 自动控制器(Robot ) 如果没有在取放烘烤完成 Glass, Oven将发送反馈信号(Receive Ok )信号给上 游的显影机, 同时 Robot将不再取放烘烤完成产品, 此时 robot将会等待显影机 和 Oven Glass传输完成后, 才将烘烤完成的 Glass从 Oven中取走; 如果 Robot 正在取放烘烤完成的 Glass ,那么等这片 Glass取放完成后, Oven发送 Receive OK 信号给显影机,显影机才会传输待烘烤的 Glass给 Oven, Robot将等待显影机和 Oven完成 Glass传输。
本实施中, 通过在上游的显影机的硬体增加玻璃感应器(Sensor B ), 来及 时侦测上游传输 Glass流片状况, 再增通讯加信号: Send Ready信号和 Receive OK信号来实现优先取 Oven入口上的产品, 从而灵活调控 Oven烘烤时间, 实 现虚拟 Buffer功能, 这样既可节省一台 Buffer的费用, 又可减少生产线的传输 停滞。
参见图 4, 为本发明提供的烤箱的结构示意图。
本实施例提供的烤箱, 包括:
信号接收模块 20, 用于接收位于该烤箱上游的显影机 1 (如图 3所示) 向 其发送的准备传输待烘烤的玻璃基板的准备传输信号;
烘烤模块 21 , 用于对玻璃基板进行烘烤;
侦测模块 22, 用于侦测自动控制器 3 (如图 3所示)是否在对所述烘烤模 块 20中的玻璃基板执行取出操作;
信号反馈模块 23 ,用于根据所述侦测模块 22的侦测结果决策是否向显影机 发回反馈信号以指示所述显影机 1向其传输待烘烤的玻璃基板。
需要说明的是, 所述自动控制器 3可以是相对于所述烤箱 2的独立实体, 也可以是烤箱 2的一个功能部分。
一种实现方式中, 当所述侦测模块 22侦测到所述自动控制器 3未执行将所
述烘烤模块 21 中烘烤完成的玻璃基板取出的操作时, 所述信号反馈模块 23向 所述显影机 1发回反馈信号。
第二种实现方式中, 当所述侦测模块 22侦测到所述自动控制器 3已经执行 将所述烘烤模块 21中烘烤完成的玻璃基板取出的操作时,所述信号反馈模块 23 向所述显影机 1发回反馈信号。
第三种实现方式中, 当所述侦测模块 22侦测到所述自动控制器 3正在执行 将所述烘烤模块 21中烘烤完成的玻璃基板取出的操作时,所述信号反馈模块 23 等待所述自动控制器 3取出所述烘烤完成的玻璃基板后, 再向所述显影机 1发 回反馈信号。
实施本发明提供的可调式烘烤系统和烤箱, 其可以对上游显影机传输待烘 烤的玻璃基板的传片速度进行调节, 不需要专门配备緩沖器, 大大节省了设备 成本, 同样也可以调节烤箱的烘烤时间, 从而提高烘烤效率。
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程, 是可以通过计算机程序来指令相关的硬件来完成, 所述的程序可存储于一计算 机可读取存储介质中, 该程序在执行时, 可包括如上述各方法的实施例的流程。 其中, 所述的存储介质可为磁碟、 光盘、 只读存储记忆体(Read-Only Memory, ROM )或随机存储记忆体(Random Access Memory, RAM )等。
以上内容是结合具体的优选实施方式对本发明所作的进一步详细说明, 不 能认定本发明的具体实施只局限于这些说明。 对于本发明所属技术领域的普通 技术人员来说, 在不脱离本发明构思的前提下, 还可以做出若干筒单推演或替 换, 都应当视为属于本发明的保护范围。
Claims
1、 一种烤箱, 包括:
信号接收模块,用于接收位于该烤箱上游的显影机向其发送的准备传输 待烘烤的玻璃基板的准备传输信号;
烘烤模块, 用于对玻璃基板进行烘烤;
侦测模块,用于侦测自动控制器是否在对所述烘烤模块中的玻璃基板执 行取出操作;
信号反馈模块,用于根据所述侦测模块的侦测结果决策是否向所述显影 机发回反馈信号以指示所述显影机向其传输待烘烤的玻璃基板。
2、 如权利要求 1所述烤箱, 其中, 当所述侦测模块侦测到所述自动控 制器未执行将所述烘烤模块中烘烤完成的玻璃基板取出的操作时,所述信号 反馈模块向所述显影机发回反馈信号。
3、 如权利要求 1所述烤箱, 其中, 当所述侦测模块侦测到所述自动控 制器已经执行将所述烘烤模块中烘烤完成的玻璃基板取出的操作时,所述信 号反馈模块向所述显影机发回反馈信号。
4、 如权利要求 1所述烤箱, 其中, 当所述侦测模块侦测到所述自动控 制器正在执行将所述烘烤模块中烘烤完成的玻璃基板取出的操作时,所述信 号反馈模块等待所述自动控制器取出所述烘烤完成的玻璃基板后,再向所述 显影机发回反馈信号。
5、 一种烤箱, 包括:
信号接收模块,用于接收位于该烤箱上游的显影机向其发送的准备传输 待烘烤的玻璃基板的准备传输信号;
烘烤模块, 用于对玻璃基板进行烘烤;
侦测模块,用于侦测自动控制器是否在对所述烘烤模块中的玻璃基板执 行取出操作;
信号反馈模块,用于根据所述侦测模块的侦测结果决策是否向所述显影 机发回反馈信号以指示所述显影机向其传输待烘烤的玻璃基板;
其中, 当所述侦测模块侦测到所述自动控制器正在执行将所述烘烤模块 中烘烤完成的玻璃基板取出的操作时,所述信号反馈模块等待所述自动控制
器取出所述烘烤完成的玻璃基板后, 再向所述显影机发回反馈信号。
6、 一种可调式烘烤系统, 包括: 显影机、 烤箱、 自动控制器; 所述显影机, 其设置有用于感应玻璃基板的玻璃感应器, 当其玻璃感应 器感应到该显影机上有待送至所述烤箱烘烤的玻璃基板时,向所述烤箱发送 准备传输信号;
所述烤箱接收到所述准备传输信号,并侦测所述自动控制器是否在进行 取出玻璃基板的操作, 并根据侦测结果决策是否向所述显影机发回反馈信 号;
所述显影机接收到所述烤箱发回的反馈信号,向所述烤箱传输待烘烤的 玻璃基板。
7、 如权利要求 6所述可调式烘烤系统, 其中, 当所述烤箱侦测到所述 自动控制器未执行将其中烘烤完成的玻璃基板取出的操作时,所述烤箱向所 述显影机发回反馈信号;
所述显影机向所述烤箱传输完待烘烤的玻璃基板之后,所述自动控制器 再执行将所述烤箱中的烘烤完成的玻璃基板取走的操作。
8、 如权利要求 6所述可调式烘烤系统, 其中, 当所述烤箱侦测到所述 自动控制器已经执行将其中烘烤完成的玻璃基板取出的操作时,所述烤箱向 所述显影机发回反馈信号;
则所述显影机接收到所述烤箱发回的反馈信号,向所述烤箱传输待烘烤 的玻璃基板。
9、 如权利要求 6所述可调式烘烤系统, 其中, 当所述烤箱侦测到所述 自动控制器正在执行将其中烘烤完成的玻璃基板取出的操作时,所述烤箱等 待所述自动控制器取出所述烘烤完成的玻璃基板后,再向所述显影机发回反 馈信号;
则所述显影机接收到所述烤箱发回的反馈信号,向所述烤箱传输待烘烤 的玻璃基板。
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US6461986B2 (en) * | 2000-07-24 | 2002-10-08 | Tokyo Electron Limited | Substrate processing method apparatus and substrate carrying method |
JP2004304003A (ja) * | 2003-03-31 | 2004-10-28 | Tokyo Electron Ltd | 処理システム |
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JPS59171135A (ja) * | 1983-03-18 | 1984-09-27 | Hitachi Ltd | ウエハ搬送装置 |
US20120004753A1 (en) * | 2004-12-06 | 2012-01-05 | Tokyo Electron Limited | Substrate processing apparatus and substrate transfer method adopted in substrate processing apparatus |
CN1979338A (zh) * | 2005-12-08 | 2007-06-13 | 东京毅力科创株式会社 | 涂敷显影装置及方法、计算机程序及记录有其的记录介质 |
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