WO2013035787A1 - 重合体及びそれを含む組成物並びに接着剤用組成物 - Google Patents
重合体及びそれを含む組成物並びに接着剤用組成物 Download PDFInfo
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- WO2013035787A1 WO2013035787A1 PCT/JP2012/072747 JP2012072747W WO2013035787A1 WO 2013035787 A1 WO2013035787 A1 WO 2013035787A1 JP 2012072747 W JP2012072747 W JP 2012072747W WO 2013035787 A1 WO2013035787 A1 WO 2013035787A1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J179/00—Adhesives based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen, with or without oxygen, or carbon only, not provided for in groups C09J161/00 - C09J177/00
- C09J179/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/26—Di-epoxy compounds heterocyclic
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/32—Epoxy compounds containing three or more epoxy groups
- C08G59/3236—Heterocylic compounds
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/0622—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms
- C08G73/0633—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms with only two nitrogen atoms in the ring
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G73/0638—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms with at least three nitrogen atoms in the ring
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/0666—Polycondensates containing five-membered rings, condensed with other rings, with nitrogen atoms as the only ring hetero atoms
- C08G73/0677—Polycondensates containing five-membered rings, condensed with other rings, with nitrogen atoms as the only ring hetero atoms with only two nitrogen atoms in the ring
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
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- C08K5/07—Aldehydes; Ketones
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/10—Printing inks based on artificial resins
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- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/10—Printing inks based on artificial resins
- C09D11/102—Printing inks based on artificial resins containing macromolecular compounds obtained by reactions other than those only involving unsaturated carbon-to-carbon bonds
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/02—Non-macromolecular additives
- C09J11/06—Non-macromolecular additives organic
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/094—Multilayer resist systems, e.g. planarising layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02118—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Definitions
- the present invention relates to a novel polymer. Furthermore, it is related with the composition used for uses, such as an adhesive agent containing the said polymer, an insulating film formation, and a resist underlayer film formation.
- the present invention also relates to an adhesive composition for adhering laminates in a process of manufacturing a semiconductor device typified by an optical device such as an LED or a CMOS image sensor, an IC chip, or the like.
- Patent Document 1 discloses an isocyanuric ring-containing polymer used for an optical semiconductor adhesive and a composition containing the polymer.
- the isocyanuric ring-containing polymer is obtained by reacting N-monosubstituted isocyanuric acid with a dihalogen compound in the presence of an alkali metal compound or hydrosilylating a N, N ′, N ′′ -trisubstituted isocyanuric acid with a silane compound.
- the composition can be bonded as an adhesive for an optical semiconductor by heating in an oven at 50 ° C. to 250 ° C. for 30 minutes to 4 hours. Has been.
- a liquid crystal display uses a glass substrate as the base material of the display panel.
- PET resin, PEN resin, and PC resin which are known as resin materials used for known plastic substrates, have a heat resistance of only about 250 ° C., which has been conventionally required for thin film transistor (TFT) formation processes at 250 ° C. or higher.
- TFT thin film transistor
- the thin film transistor forming process includes an insulating film forming process such as a gate insulating film.
- Patent Document 2 discloses a gate insulating film forming agent for a thin film transistor capable of forming a gate insulating film at a temperature of 180 ° C. or lower.
- the cured product prepared from the composition described in Patent Document 1 has a light transmittance of 470 nm measured and is evaluated to be 90% or more, and is further evaluated for heat resistance. However, it is described that the transmittance at 470 nm after the cured product was left in an oven at 150 ° C. for 120 hours was measured, but the heat resistance at a temperature of 250 ° C. or higher is unknown.
- the isocyanuric ring-containing polymer of Patent Document 1 does not exclude having a hydroxy group, and the oligomer compound or polymer compound contained in the gate insulating film forming agent described in Patent Document 2 contains a hydroxy group in the repeating unit. A group has been introduced.
- the polymer has a hydroxy group, the desired insulating property may not be obtained in applications where hygroscopicity is exhibited and insulation is important.
- the isocyanuric ring-containing polymer of Patent Document 1 contains silicon, when a film formed on a substrate such as a silicon wafer is reworked and processed by a photolithography process, a fluorine-based gas is used as an etching gas. There is a problem that they must be mixed and can damage the substrate.
- the first aspect of the present invention is a polymer having a weight average molecular weight of 1,000 to 100,000 having a structural unit represented by the following formula (1).
- Q is the following formula (2) or formula (3):
- Q 1 represents an alkyl group having 1 to 6 carbon atoms, an allyl group, a vinyl group, an epoxy group, or a glycidyl group
- Q 2 and Q 3 are each independently a hydrogen atom, or 1 to 6 carbon atoms.
- R 1 is an alkylene group having 1 to 10 carbon atoms, an alkenylene group or alkynylene group having 2 to 10 carbon atoms, an arylene group having 6 to 14 carbon atoms, a cyclic alkylene group having 4 to 10 carbon atoms, or the following formula: (4) or formula (5): (Wherein A 1 , A 2 and A 3 each independently represents an arylene group having 6 to 14 carbon atoms or a cyclic alkylene group having 4 to 10 carbon atoms, and R 2 represents a sulfonyl group, a carbonyl group or
- the second aspect of the present invention is a polymer having a weight average molecular weight of 1,000 to 100,000 having a structural unit represented by the following formula (6).
- Q 4 represents an allyl group, a vinyl group, an epoxy group or a glycidyl group
- R 5 represents a main chain consisting of only carbon atoms or a main chain consisting of carbon atoms and at least one of oxygen, nitrogen and sulfur atoms. Represents a divalent organic group having a chain.
- the third aspect of the present invention is a composition comprising the polymer according to the present invention.
- the fourth aspect of the present invention is a composition for an adhesive comprising a polymer having a structural unit represented by the formula (6) according to the present invention and an organic solvent.
- composition containing the polymer having the structural unit represented by the formula (1) of the present invention it has high heat resistance, high visible light transmittance, excellent reworkability, adhesiveness and A cured film having a desired insulating property can be obtained.
- the cured film formed from the adhesive composition of the present invention has a transmittance of 95% or more (wavelength of 500 nm), heat resistance at 250 ° C. or more, adhesion and solvent resistance.
- the weight average molecular weight of the polymer (polymer) having the structural unit represented by the formula (1) according to the present invention is a standard polystyrene conversion value by gel permeation chromatography (hereinafter abbreviated as GPC) analysis described later. And 1,000 to 100,000, preferably 1,000 to 50,000. When the weight average molecular weight is greater than 100,000, the solubility in a solvent is deteriorated. Conversely, when the weight average molecular weight is less than 1,000, the problem of occurrence of cracks in the resulting film and the coating property of the composition are deteriorated. There is a problem.
- the terminal of the polymer is a hydrogen atom or a halogen atom if the raw material monomer of the polymer is, for example, a mono-substituted isocyanuric acid and a dihalogen compound.
- the alkyl group and the alkylene group may be either linear or branched.
- the alkenylene group and alkynylene group include ethene-1,2-diyl group (—CH ⁇ CH-group), 2-butene-1,4-diyl group (—CH 2 —CH ⁇ CH—CH 2 — group) and ethyne-1,2-diyl group (—C ⁇ C— group)
- the arylene group include a phenylene group, a naphthylene group, and an anthrylene group
- examples of the cyclic alkylene group include a cyclohexylene group.
- the halogen atom in which at least one hydrogen atom of the alkylene group is substituted include a fluorine atom, a chlorine atom and a bromine atom.
- the polymer may be a polymer composed of only one type of structural unit represented by the formula (1), or two or more types of structural units represented by the formula (1).
- the polymer (copolymer) to contain may be sufficient.
- the polymer having the structural unit represented by the formula (6) according to the present invention may be a polymer composed of only one type of the structural unit represented by the formula (6). It may be a polymer (copolymer) containing two or more types of structural units represented by (6).
- the weight average molecular weight of the polymer is, for example, 1,000 to 100,000 in terms of standard polystyrene converted by GPC analysis.
- a divalent organic group having no silicon atom in the main chain such as a divalent hydrocarbon group having 1 to 10 carbon atoms or a group represented by the following formula (7).
- two m's each independently represent 0 or 1
- Q 5 represents a divalent organic group.
- examples of the divalent hydrocarbon group include an alkylene group, and can contain a phenylene group or a carbonyl group within the range of 1 to 10 carbon atoms.
- Q 5 is, for example, an arylene group having 6 to 14 carbon atoms, an alicyclic hydrocarbon group having 4 to 10 carbon atoms, an alkenylene group or alkynylene group having 2 to 6 carbon atoms, Or represents the group represented by following formula (8).
- a 4 and A 5 each independently represent an arylene group having 6 to 14 carbon atoms or an alicyclic hydrocarbon group having 4 to 10 carbon atoms
- Q 6 represents a sulfonyl group, a carbonyl group, or a group represented by the following formula: (9):
- R 6 and R 7 each independently represents an alkyl group having 1 or 2 carbon atoms, and at least one hydrogen atom of the alkyl group may be substituted with a halogen atom).
- the arylene group is, for example, a phenylene group and the alicyclic hydrocarbon group is, for example, a cyclohexylene group, but is not necessarily limited to these groups.
- norbornene and adamantane are also a kind of alicyclic hydrocarbon
- examples of the alicyclic hydrocarbon group include a norbornene-2,3-diyl group and an adamantane-1,3-diyl group.
- examples of the alkenylene group or alkynylene group include ethene-1,2-diyl group (—CH ⁇ CH— group), 2-butene-1,4-diyl group (—CH 2 —CH). ⁇ CH—CH 2 — group) and ethyne-1,2-diyl group (—C ⁇ C— group).
- the alkyl group is, for example, a methyl group in which at least one hydrogen atom may be substituted with a fluorine atom.
- the methyl group in which at least one hydrogen atom is substituted with a fluorine atom include a —CF 3 group.
- the polymer having the structural unit represented by the formula (6) has, for example, structural units represented by the following formulas (6-1) to (6-9), and R 5 in the formula (6)
- a polymer having a structural unit represented by the formula (7) corresponds to a polymer having a structural unit represented by the following formulas (6-2) to (6-8).
- composition containing the polymer having the structural unit represented by the above formula (1) according to the present invention includes, in addition to the polymer, at least one of a surfactant, a thermal acid generator, and a solvent as necessary. You may contain.
- a surfactant examples include polyoxyethylene such as polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene cetyl ether, and polyoxyethylene oleyl ether.
- Alkyl ethers such as polyoxyethylene alkyl aryl ethers such as polyoxyethylene octylphenol ether, polyoxyethylene nonylphenol ether, polyoxyethylene / polyoxypropylene block copolymers, sorbitan monolaurate, sorbitan monopalmitate, sorbitan monostearate Sorbitan fatty acid esters such as sorbitan monooleate, sorbitan trioleate, sorbitan tristearate, polyoxyethylene Nonionic surfactants such as polyoxyethylene sorbitan fatty acid esters such as bitane monolaurate, polyoxyethylene sorbitan monopalmitate, polyoxyethylene sorbitan monostearate, polyoxyethylene sorbitan trioleate, polyoxyethylene sorbitan tristearate Agent, EFTOP (registered trademark) EF301, EF303, EF352 (Mitsubishi Materials Electronics Chemicals Co., Ltd.
- EFTOP registered trademark
- fluorine-based surfactants such as the SC 106 (manufactured by Asahi Glass Co., Ltd.), and organosiloxane polymer KP341 (manufactured by Shin-Etsu Chemical Co.). These surfactants may be added alone or in combinations of two or more.
- the blending amount is, for example, 0.01% by mass to 10% by mass in the total solid content excluding the solvent.
- the thermal acid generator include p-toluenesulfonic acid, trifluoromethanesulfonic acid, pyridinium-p-toluenesulfonate, salicylic acid, 5-sulfosalicylic acid, Acidic compounds such as citric acid, benzoic acid and hydroxybenzoic acid and / or 2,4,4,6-tetrabromocyclohexadienone, benzoin tosylate, 2-nitrobenzyl tosylate and the like can be blended.
- a compounding quantity is 0.02 mass% thru
- the solvent is not particularly limited as long as it is an organic solvent that can be used in the semiconductor device manufacturing process.
- ketones such as cyclohexanone, methyl isoamyl ketone, 2-butanone, 2-heptanone, etc.
- Ethylene glycol ethylene glycol monoacetate, diethylene glycol, diethylene glycol monoacetate, propylene glycol, propylene glycol monoacetate, dipropylene glycol or dipropylene glycol monoacetate, and their monomethyl ether, monoethyl ether, monopropyl ether, monobutyl ether
- Polyhydric alcohols such as monophenyl ether and derivatives thereof; cyclic ethers such as dioxane; lactones such as ⁇ -butyrolactone; Le, ethyl lactate, methyl acetate, ethyl acetate, butyl acetate, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, be used esters such as ethyl ethoxypropionate preferred.
- the organic solvent when the component obtained by removing the organic solvent from the composition of the present invention is defined as a solid content, the proportion of the solid content in the composition is, for example, 1% by mass to 70% by mass.
- composition containing the polymer according to the present invention is not necessarily required, but may further contain additives such as an inorganic filler, a silane coupling agent, a rheology modifier, and a crosslinking agent if necessary.
- Examples of the inorganic filler include aluminum nitride, boron nitride, alumina, and silica.
- Examples of the silane coupling agent include vinyltrimethoxysilane, vinyltriethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-methacryloxypropyltriethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3 -Glycidoxypropyltriethoxysilane, 3-aminopropyltrimethoxysilane and 3-aminopropyltriethoxysilane.
- rheology modifier examples include phthalic acid derivatives such as dimethyl phthalate, diethyl phthalate, diisobutyl phthalate, dihexyl phthalate, butyl isodecyl phthalate, adipine such as dinormal butyl adipate, diisobutyl adipate, diisooctyl adipate, octyl decyl adipate, etc.
- phthalic acid derivatives such as dimethyl phthalate, diethyl phthalate, diisobutyl phthalate, dihexyl phthalate, butyl isodecyl phthalate, adipine such as dinormal butyl adipate, diisobutyl adipate, diisooctyl adipate, octyl decyl adipate, etc.
- Acid derivatives maleic acid derivatives such as dinormal butyl maleate, diethyl maleate, dinonyl maleate, oleic acid derivatives such as methyl oleate, butyl oleate, tetrahydrofurfuryl oleate, or stearic acid derivatives such as normal butyl stearate, glyceryl stearate Can be mentioned.
- crosslinking agent examples include nitrogen-containing compounds having a nitrogen atom substituted with an alkoxymethyl group such as a methoxymethyl group, an ethoxymethyl group, a butoxymethyl group, a hexyloxymethyl group, or a hydroxymethyl group.
- an epoxy group-containing compound, an epoxy group-containing polymer, an allyl group-containing compound, an allyl group-containing polymer, an isocyanate group-containing compound, an isocyanate group-containing polymer, or an azide group (azi group) -containing compound can be used as a crosslinking agent.
- nitrogen-containing compound examples include hexamethoxymethyl melamine, tetramethoxymethyl benzoguanamine, 1,3,4,6-tetrakis (butoxymethyl) glycoluril, 1,3,4,6-tetrakis (hydroxymethyl) glycoluril. 1,3-bis (hydroxymethyl) urea, 1,1,3,3-tetrakis (butoxymethyl) urea, 1,1,3,3-tetrakis (methoxymethyl) urea, 1,3-bis (hydroxymethyl) ) -4,5-dihydroxy-2-imidazolinone, 1,3-bis (methoxymethyl) -4,5-dimethoxy-2-imidazolinone.
- azide group (azi group) -containing compound examples include 2,6-bis (4-azidobenzylidene) -4-methylcyclohexanone and 2,6-bis (4-azidobenzylidene) cyclohexanone.
- crosslinking agent examples include methoxymethyl type melamine compounds (trade names: CYMEL (registered trademark) 300, 301, 303, 350) manufactured by Nippon Cytec Industries, Ltd., butoxymethyl type melamine compounds (trade name: My Coat (registered trademark) 506, 508), glycoluril compound (trade name: CYMEL (registered trademark) 1170, POWDERLINK (registered trademark) 1174), methylated urea resin (trade name: UFR65), butylated urea resin ( Product names: UFR300, U-VAN10S60, U-VAN10R, U-VAN11HV), urea / formaldehyde resin manufactured by DIC Corporation (high condensation type, product names: Beccamin (registered trademark) J-300S, P-955, N) and other commercially available compounds can be mentioned.
- methoxymethyl type melamine compounds trade names: CYMEL (registered trademark) 300, 301, 303, 350)
- crosslinking agent containing an epoxy group for example, a compound having 1 to 6 or 2 to 4 epoxy rings can be used, for example, 1,4-butanediol diglycidyl ether, 1 , 2-epoxy-4- (epoxyethyl) cyclohexane, glycerol triglycidyl ether, diethylene glycol diglycidyl ether, 2,6-diglycidylphenyl glycidyl ether, 1,1,3-tris [p- (2,3-epoxypropoxy ) Phenyl] propane, 1,2-cyclohexanedicarboxylic acid diglycidyl ester, 4,4′-methylenebis (N, N-diglycidylaniline), 3,4-epoxycyclohexylmethyl-3,4-epoxycyclohexanecarboxylate, tri Methylolethane triglycidylate , Triglycidyl-p-
- crosslinking agent only one kind of compound can be used, or two or more kinds of compounds can be used in combination. 1% to 50% by weight, or 8% to 40% by weight, or 15% to 30% by weight of a crosslinking agent can be used with respect to the polymer contained in the composition of the present invention.
- the composition containing the polymer according to the present invention may contain a crosslinking catalyst.
- a crosslinking catalyst By using a crosslinking catalyst, the reaction of the crosslinking agent is promoted.
- the crosslinking catalyst include p-toluenesulfonic acid, trifluoromethanesulfonic acid, methanesulfonic acid, pyridinium-p-toluenesulfonate, salicylic acid, camphorsulfonic acid, 5-sulfosalicylic acid, citric acid, benzoic acid, and hydroxybenzoic acid. 4-chlorobenzenesulfonic acid, 4-hydroxybenzenesulfonic acid, benzenedisulfonic acid, and 1-naphthalenesulfonic acid.
- the said crosslinking catalyst can use only 1 type, and can also be used in combination of 2 or more type. 0.01 mass% to 10 mass%, or 0.05 mass% to 8 mass%, or 0.1 mass% to 5 mass%, or 0.3 mass% with respect to the polymer contained in the composition of the present invention. % To 3% by weight, or 0.5% to 1% by weight of a crosslinking catalyst can be used.
- a miscible additive for example, an additional resin or an adhesive for improving the performance of the composition, as long as the essential characteristics of the present invention are not impaired.
- a miscible additive for example, an additional resin or an adhesive for improving the performance of the composition, as long as the essential characteristics of the present invention are not impaired.
- Commonly used agents such as an imparting agent, a plasticizer, an adhesion assistant, a stabilizer, a colorant, and an antifoaming material can be added.
- Additional resins (polymers) for improving the performance of the above composition include addition polymerization of polyester, polystyrene, polyimide, acrylic polymer, methacrylic polymer, polyvinyl ether, phenol novolac, naphthol novolac, polyether, polyamide, polycarbonate, etc.
- a polymer or a polycondensation polymer can be used, and a polymer having an aromatic ring structure such as a benzene ring, a naphthalene ring, an anthracene ring, a triazine ring, a quinoline ring, or a quinoxaline ring is preferably used.
- Examples of the additional resin (polymer) as described above include benzyl acrylate, benzyl methacrylate, phenyl acrylate, naphthyl acrylate, anthryl methacrylate, anthryl methyl methacrylate, styrene, hydroxystyrene, benzyl vinyl ether, and N-phenylmaleimide.
- Examples thereof include addition polymerization polymers containing an addition polymerizable monomer as a structural unit, and polycondensation polymers such as phenol novolac and naphthol novolak.
- the additional resin (polymer) a polymer having no aromatic ring structure can be used as the additional resin (polymer).
- a polymer for example, only an addition polymerizable monomer having no aromatic ring structure such as alkyl acrylate, alkyl methacrylate, vinyl ether, alkyl vinyl ether, acrylonitrile, maleimide, N-alkylmaleimide, maleic anhydride, etc.
- An addition polymerization polymer containing as a unit is mentioned.
- the polymer may be a homopolymer or a copolymer.
- the molecular weight of the additional resin (polymer) used in the composition containing the polymer according to the present invention is, for example, 1,000 to 1,000,000, or 3,000 to 300,000 as a weight average molecular weight. Or 5,000 to 200,000, or 10,000 to 100,000.
- the content thereof is, for example, 40% by mass or less, or 20% by mass or less, or 1% by mass to 19% by mass in the solid content.
- the tackifier is added to control the elastic modulus, viscosity and surface condition.
- the type of the tackifier is preferably determined in consideration of viscosity. Specifically, aliphatic petroleum resins, aromatic petroleum resins, aliphatic / aromatic copolymer petroleum resins, alicyclic Hydrogenated petroleum resin, alkylphenol resin, xylene resin, coumarone indene resin, terpene resin, terpene phenol resin, aromatic modified terpene resin, hydrogenated terpene resin, rosin resin, hydrogenated rosin resin, disproportionated rosin resin , Single type of dimerized rosin resin, esterified rosin resin, or a combination of two or more types.
- This tackifier can be contained, for example, in a proportion of 100% by mass or less or 50% by mass or less with respect to the polymer contained in the composition of the present invention.
- the composition containing the polymer according to the present invention is used for an adhesive, an insulating film, or a resist underlayer film.
- adhesives for example, in a process of forming a three-dimensional laminate such as an IC chip, it is an application for adhering laminates.
- “For insulating film formation” is, for example, an application for forming a gate insulating film or an interlayer insulating film of a thin film transistor.
- resist underlayer film formation for example, a resist underlayer film is formed between a substrate and a resist film in order to form a resist pattern having a desired shape on the substrate.
- the composition contains a solvent, it is used for insulating ink.
- the insulating ink is an ink that forms an insulating film by a method such as screen printing or inkjet in a manufacturing process of a flexible display using a plastic substrate.
- composition for adhesives of this invention contains the polymer and solvent which have a structural unit represented by the said Formula (6) as an essential component.
- the polymer may be a polymer composed of only one type of structural unit represented by the formula (6), or a polymer containing two or more types of structural units represented by the formula (6) (co-polymer). Polymer).
- the weight average molecular weight of the polymer is, for example, 1,000 to 100,000 in terms of standard polystyrene converted by GPC analysis.
- the definition of each group in the structural unit represented by Formula (6) is as described above.
- the adhesive composition of the present invention is spin-coating within the range where the polymer represented by the above formula (6) is dissolved in an organic solvent and the solution viscosity is from 0.001 to 5,000 Pa ⁇ s. It can be set as the coating liquid which shows.
- the organic solvent is not particularly limited as long as it is a solvent that can be used in the semiconductor device manufacturing process.
- ketones such as cyclohexanone, methyl isoamyl ketone, 2-butanone, and 2-heptanone; ethylene glycol, ethylene glycol monoacetate, Diethylene glycol, diethylene glycol monoacetate, propylene glycol, propylene glycol monoacetate, dipropylene glycol or dipropylene glycol monoacetate, and polyhydric alcohols such as monomethyl ether, monoethyl ether, monopropyl ether, monobutyl ether, monophenyl ether, etc.
- esters such as ethyl ethoxypropionate preferred.
- esters such as ethyl ethoxypropionate preferred.
- the adhesive composition of the present invention further contains additives such as a surfactant, a thermal acid generator, an inorganic filler, a silane coupling agent, a rheology modifier, a crosslinking agent, and a crosslinking catalyst as necessary. Also good.
- additives such as a surfactant, a thermal acid generator, an inorganic filler, a silane coupling agent, a rheology modifier, a crosslinking agent, and a crosslinking catalyst as necessary.
- additives various kinds of surfactants, thermal acid generators, inorganic fillers, silane coupling agents, rheology modifiers, crosslinking agents, and crosslinking catalysts specifically mentioned in the above-mentioned [Composition containing polymer]. The compounds can be used in the stated amounts used.
- the adhesive composition of the present invention further includes miscible additives such as additional resins and tackifiers for improving the performance of the adhesive as long as the essential characteristics of the present invention are not impaired.
- miscible additives such as additional resins and tackifiers for improving the performance of the adhesive as long as the essential characteristics of the present invention are not impaired.
- agents such as an agent, a plasticizer, an adhesion assistant, a stabilizer, a colorant, and an antifoaming agent can be added.
- the compounds specifically mentioned in the above-mentioned [Composition containing polymer] can be used in the described usage amount.
- the GPC (gel permeation chromatography) analysis of the polymers obtained in the synthesis examples described below uses the following apparatus, and the measurement conditions are as follows.
- the solution was cooled to room temperature, filtered to collect the filtrate, and a mixed solution having a volume ratio of N-methyl-2-pyrrolidone and 1 mol / L hydrochloric acid of 90:10 was added until the pH became acidic. Thereafter, it was poured into methanol and reprecipitation purification was performed to obtain a polymer having a structural unit represented by the following formula [D].
- the weight average molecular weight was 9,500 in standard polystyrene conversion.
- the solution was cooled to room temperature, filtered to collect the filtrate, and a mixed solution having a volume ratio of N-methyl-2-pyrrolidone and 1 mol / L hydrochloric acid of 90:10 was added until the pH became acidic. Thereafter, the mixture is poured into a two-layer separated solution of ethyl acetate and water to perform a liquid separation operation, whereby only the target polymer is extracted into the ethyl acetate layer, and the ethyl acetate is distilled by an evaporator. A polymer having the structural unit represented was obtained. When the GPC analysis of the obtained polymer was conducted, the weight average molecular weight was 5,600 in standard polystyrene conversion.
- the solution was cooled to room temperature, filtered to collect the filtrate, and a mixed solution having a volume ratio of N-methyl-2-pyrrolidone and 1 mol / L hydrochloric acid of 90:10 was added until the pH became acidic. Thereafter, the mixture is poured into a two-layer separated solution of ethyl acetate and water to perform a liquid separation operation, whereby only the target polymer is extracted into the ethyl acetate layer, and the ethyl acetate is distilled by an evaporator. A polymer having the structural unit represented was obtained. When the GPC analysis of the obtained polymer was conducted, the weight average molecular weight was 11,300 in standard polystyrene conversion.
- the solution was cooled to room temperature, filtered to collect the filtrate, and a mixed solution having a volume ratio of N-methyl-2-pyrrolidone and 1 mol / L hydrochloric acid of 90:10 was added until the pH became acidic. Thereafter, the mixture is poured into a two-layer separated solution of ethyl acetate and water to perform a liquid separation operation, whereby only the target polymer is extracted into the ethyl acetate layer, and the ethyl acetate is distilled by an evaporator. A polymer having the structural unit represented was obtained. When the GPC analysis of the obtained polymer was conducted, the weight average molecular weight was 10,600 in standard polystyrene conversion.
- the solution was cooled to room temperature, filtered to collect the filtrate, and a mixed solution having a volume ratio of N-methyl-2-pyrrolidone and 1 mol / L hydrochloric acid of 90:10 was added until the pH became acidic. Thereafter, it was poured into methanol and reprecipitation purification was performed to obtain a polymer having a structural unit represented by the following formula [J].
- the weight average molecular weight was 2,400 in standard polystyrene conversion.
- the solution was cooled to room temperature, filtered to collect the filtrate, and a mixed solution having a volume ratio of N-methyl-2-pyrrolidone and 1 mol / L hydrochloric acid of 90:10 was added until the pH became acidic. Thereafter, it was poured into methanol and reprecipitation purification was performed to obtain a polymer having a structural unit represented by the following formula [K].
- the weight average molecular weight was 8,900 in terms of standard polystyrene.
- Example 1 1 g of the polymer obtained in Synthesis Example 1 and 0.01 g of Megafac (registered trademark) R-30 (manufactured by DIC Corporation) as a surfactant are 2.0 g of propylene glycol monomethyl ether and 2.0 g of propylene glycol monomethyl ether acetate. And dissolved in 1 g of ⁇ -butyrolactone to prepare a solution. Then, it filtered using the polyethylene micro filter with the hole diameter of 0.10 micrometer, and prepared the composition.
- Megafac registered trademark
- R-30 manufactured by DIC Corporation
- Example 2 A composition was prepared in the same manner as in Example 1 except that the polymer obtained in Synthesis Example 2 was used instead of the polymer obtained in Synthesis Example 1.
- Example 3 1 g of the polymer obtained in Synthesis Example 3, 0.01 g of Megafac (registered trademark) R-30 (manufactured by DIC Corporation) as a surfactant, and TAG-N (Sanshin Chemical Industry Co., Ltd.) as a thermal acid generator (0.03 g) was dissolved in 2.0 g of propylene glycol monomethyl ether, 2.0 g of propylene glycol monomethyl ether acetate and 1 g of ⁇ -butyrolactone to obtain a solution. Then, it filtered using the polyethylene micro filter with the hole diameter of 0.10 micrometer, and prepared the composition.
- Megafac registered trademark
- R-30 manufactured by DIC Corporation
- TAG-N Sanshin Chemical Industry Co., Ltd.
- Example 4 The polymer obtained in Synthesis Example 4 was dissolved in cyclohexanone, and then filtered using a microfilter made of polytetrafluoroethylene (hereinafter abbreviated as PTFE) having a pore size of 1.0 ⁇ m to obtain a solid content of 35% by mass. A containing composition was prepared.
- PTFE polytetrafluoroethylene
- Example 5 A composition was prepared in the same manner as in Example 4 except that the polymer obtained in Synthesis Example 5 was used instead of the polymer obtained in Synthesis Example 4.
- Example 6 A composition was prepared in the same manner as in Example 4 except that the polymer obtained in Synthesis Example 6 was used instead of the polymer obtained in Synthesis Example 4.
- Example 7 A composition was prepared in the same manner as in Example 4 except that the polymer obtained in Synthesis Example 7 was used instead of the polymer obtained in Synthesis Example 4.
- Example 8 A composition was prepared in the same manner as in Example 4 except that the polymer obtained in Synthesis Example 8 was used instead of the polymer obtained in Synthesis Example 4.
- Comparative example 2 The polymer obtained in Comparative Synthesis Example 1 was dissolved in cyclohexanone, and then 1% by mass of a thermal acid generator K-PURE TAG2689 (manufactured by King Industries) was added to the polymer mass, and a PTFE micro having a pore size of 1.0 ⁇ m. It filtered using the filter and the composition which contains 35.35 mass% as solid content was prepared.
- a thermal acid generator K-PURE TAG2689 manufactured by King Industries
- the film obtained from the composition of the present invention has a higher transmittance than the film obtained from the composition of the comparative example, and has a high transmittance with little coloration even at a high temperature of 260 ° C. The result of maintaining and suggesting heat resistance was obtained.
- Example 3 [Elution test in solvent] The composition prepared in Example 3 and Comparative Example 1 was applied onto a silicon wafer using a spin coater, and baked on a hot plate at 200 ° C. for 5 minutes to form a film having a thickness of 1 ⁇ m. This film was immersed in acetone, N-methyl-2-pyrrolidone, 2-propanol, and 2-heptanone at 23 ° C. for 10 minutes, respectively. In the film obtained from the composition of Example 3, it was confirmed that the film thickness change before and after immersion was 5% or less, but in the film obtained from the composition of Comparative Example 1, N-methyl-2-pyrrolidone. After soaking, all dissolved.
- the film obtained from the composition of the present invention can be easily removed by etching and has excellent reworkability, whereas the film obtained from the composition of the comparative example can be almost removed. As a result, it was found that reworkability was lacking.
- a dilute solution was prepared by adding cyclohexanone to the compositions prepared in Examples 4 to 8 and Comparative Example 4 so that the film thickness was 500 nm when a film was formed on a silicon wafer using a spin coater. .
- the prepared diluted solution is applied onto a silicon wafer using a spin coater, baked on a hot plate at 100 ° C. and 150 ° C. for 2 minutes, respectively, and further baked at 250 ° C. for 1 hour in an oven purged with nitrogen to form a film. Formed.
- a leakage current value was measured when a voltage of 2 MV / cm was applied using a mercury probe (CVmap92-B, manufactured by Four Dimensions).
- Heat resistance evaluation Heat resistance of films formed by applying the compositions prepared in Examples 4 to 8 and Comparative Example 4 on a silicon wafer using a spin coater and baking on a hot plate at 100 ° C. and 150 ° C. for 2 minutes, respectively.
- the properties were evaluated with TG-DTA (manufactured by Bruker AXS, TG / DTA2010SR) from the temperature at which the temperature was increased at 10 ° C./min to cause a mass reduction of 5% by mass.
- the results are shown in Table 5 below.
- Table 5 the film obtained from the composition of the present invention has a high mass reduction temperature of 5% by mass, and shows the result that it exhibits higher heat resistance than the film obtained from the composition of the comparative example. It was.
- Adhesion evaluation (Preparation of adhesive strength evaluation sample) The compositions prepared in Example 4 and Example 5 were applied on a silicon wafer having a wafer diameter of 4 inches so that the film thickness was 5 ⁇ m when the film was formed using a spin coater. A film was formed by baking at 100 ° C. for 2 minutes and 150 ° C. for 2 minutes. Thereafter, a film and a wafer formed on the silicon wafer using a bonding apparatus (VJ-300, manufactured by Ayumi Industry Co., Ltd.) under the conditions of a vacuum of 10 Pa or less, a temperature of 160 ° C., and a bonding pressure of 400 kg. A glass wafer having a diameter of 4 inches was adhered.
- VJ-300 manufactured by Ayumi Industry Co., Ltd.
- the bonded wafer was baked in an oven at 250 ° C. for 1 hour, and cut into 1 cm square using a dicing saw (DAD321, manufactured by DISCO Corporation) to prepare a sample for evaluating adhesive strength. Further, the composition prepared in Comparative Example 4 was applied on a silicon wafer having a wafer diameter of 4 inches so as to have a film thickness of 5 ⁇ m when the film was formed using a spin coater. A film is formed by baking for 2 minutes and at 200 ° C. for 2 minutes.
- the degree of vacuum is 10 Pa or less
- the temperature is 270 ° C.
- the bonding pressure is Under the condition of 400 kg
- the film formed on the silicon wafer and a glass wafer having a wafer diameter of 4 inches were bonded.
- the sample was cut into 1 cm square using a dicing saw (manufactured by DISCO Corporation, DAD321) to prepare a sample for evaluating adhesive force.
- Example 9 The solution containing the polymer obtained in Synthesis Example 15 was filled with a cation exchange resin (15JWET, Organo Corporation) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.). Poured into and allowed to stir for 4 hours. Then, it filtered using the polyethylene micro filter with a hole diameter of 3 micrometers, and prepared the composition for adhesive agents.
- a cation exchange resin (15JWET, Organo Corporation) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.
- Example 10 The solution containing the polymer obtained in Synthesis Example 16 was filled with a cation exchange resin (15JWET, Organo Co., Ltd.) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.). Poured into and allowed to stir for 4 hours. Then, it filtered using the polyethylene micro filter with a hole diameter of 3 micrometers, and prepared the composition for adhesive agents.
- a cation exchange resin (15JWET, Organo Co., Ltd.
- an anion exchange resin Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.
- Example 11 The solution containing the polymer obtained in Synthesis Example 17 was filled with a cation exchange resin (15JWET, Organo Co., Ltd.) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.). Poured into and allowed to stir for 4 hours. Then, it filtered using the polyethylene micro filter with a hole diameter of 3 micrometers, and prepared the composition for adhesive agents.
- a cation exchange resin (15JWET, Organo Co., Ltd.
- an anion exchange resin Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.
- Example 12 5 g of the powdery polymer obtained in Synthesis Example 18 was added to 45 g of cyclohexanone and stirred for 4 hours. Then, it filtered using the polyethylene micro filter with a hole diameter of 3 micrometers, and prepared the composition for adhesive agents.
- Example 13 The solution containing the polymer obtained in Synthesis Example 15 was filled with a cation exchange resin (15JWET, Organo Corporation) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.). Poured into and allowed to stir for 4 hours. Then, it filtered using the polyethylene micro filter with a hole diameter of 3 micrometers. A composition for an adhesive is added to the filtrate with an organosilica sol (MEK-AC-2101, manufactured by Nissan Chemical Industries, Ltd.) having a mass of 1/9 of the polymer (solid content) in the solution. Was prepared.
- a cation exchange resin (15JWET, Organo Corporation) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.).
- Example 14 The solution containing the polymer obtained in Synthesis Example 16 was filled with a cation exchange resin (15JWET, Organo Co., Ltd.) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.). Poured into and allowed to stir for 4 hours. Then, it filtered using the polyethylene micro filter with a hole diameter of 3 micrometers. A composition for an adhesive is added to the filtrate with an organosilica sol (MEK-AC-2101, manufactured by Nissan Chemical Industries, Ltd.) having a mass of 1/9 of the polymer (solid content) in the solution. Was prepared.
- a cation exchange resin (15JWET, Organo Co., Ltd.) and an anion exchange resin (Monosphere (registered trademark) 550A, Muromachi Technos Co., Ltd.).
- the adhesive composition prepared in Examples 9, 10, 11, 13, 14 and Comparative Example 5 was applied onto a quartz substrate using a spin coater, and baked on a hot plate at 200 ° C. for 5 minutes. A film having a thickness of 1 ⁇ m was formed. This film was measured for transmittance at a wavelength of 500 nm using an ultraviolet-visible spectrophotometer UV-2550 (manufactured by Shimadzu Corporation). Furthermore, after the films formed from the adhesive compositions prepared in Examples 9 and 10 and Comparative Example 5 were baked at 270 ° C. for 5 minutes, the transmittance at a wavelength of 500 nm was measured. The measurement results are shown in Table 7 below.
- the film formed from the adhesive composition prepared in Examples 9 and 10 showed a higher transmittance than the film formed from the adhesive composition prepared in Comparative Example 5, and A high transmittance was maintained even after baking at 270 ° C., and a result suggesting that it had heat resistance was obtained.
- the adhesive composition prepared in Examples 9, 10, and 11 was applied onto a silicon wafer using a spin coater, and baked at 100 ° C. and 160 ° C. for 4 minutes, respectively, to form a film with a thickness of 5 ⁇ m. Formed. Thereafter, using a bonding apparatus (Ayumi Kogyo Co., Ltd., VJ-300), the film and the wafer formed on the silicon wafer under the conditions of a vacuum of 10 Pa or less, a temperature of 160 ° C., and a bonding pressure of 800 kg. A glass wafer having a diameter of 4 inches was adhered.
- the bonded wafer was cut into a 1 cm square with a dicing apparatus (DAD321, manufactured by DISCO Corporation) to prepare an adhesive strength evaluation sample.
- Araldite (registered trademark) 2014 manufactured by Huntsman Advanced Materials
- the adhesive strength (shear) was evaluated and tested by Shimadzu Corp., Autograph AGS-100NX).
- the adhesive force was measured at a pulling speed of 1 mm / min.
- Table 8 an adhesive strength value of 1000 N or more indicates that the adhesive strength measuring instrument is at least the measurement limit. It was confirmed that the samples obtained using the adhesive compositions prepared in Examples 9, 10, and 11 have sufficient adhesiveness.
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Abstract
Description
また本発明は、LED、CMOSイメージセンサなどの光学デバイス、ICチップなどに代表される半導体デバイスを製造する工程において、被積層物間を接着する接着剤用組成物に関する。
で表される二価の基であって、前記Qが前記式(2)で表される二価の基又は式(3)で表され且つnが1を表す二価の基である場合、該式(2)及び式(3)の一部を構成するカルボニル基は前記式(1)の窒素原子と結合し、
R1は炭素原子数1乃至10のアルキレン基、炭素原子数2乃至10のアルケニレン基若しくはアルキニレン基、炭素原子数6乃至14のアリーレン基、炭素原子数4乃至10の環状アルキレン基、又は下記式(4)若しくは式(5):
で表される基を表す。}
本発明に係る前記式(1)で表される構造単位を有する重合体(ポリマー)の重量平均分子量は、後述するゲルパーミエーションクロマトグラフィ(以下、GPCと略称する。)分析による、標準ポリスチレン換算値で、1,000乃至100,000であり、好ましくは1,000乃至50,000ある。重量平均分子量が100,000より大きいと、溶剤に対する溶解性が悪くなり、逆に重量平均分子量が1,000より小さいと、得られる膜に対するクラックの発生という問題及び組成物の塗布性が悪くなるという問題がある。前記重合体の末端は、該重合体の原料モノマーが、例えば、モノ置換イソシアヌル酸とジハロゲン化合物なら、水素原子及びハロゲン原子である。
また本発明において、前記重合体は、前記式(1)で表される構造単位1種類のみからなる重合体であってもよいし、前記式(1)で表される構造単位を2種類以上含む重合体(共重合体)であってもよい。
本発明に係る上記式(1)で表される構造単位を有する重合体を含む組成物は、前記重合体以外に、必要に応じて界面活性剤、熱酸発生剤及び溶剤の少なくとも一つを含有してもよい。
本発明の組成物が界面活性剤を含む場合、その界面活性剤としては、例えば、ポリオキシエチレンラウリルエーテル、ポリオキシエチレンステアリルエーテル、ポリオキシエチレンセチルエーテル、ポリオキシエチレンオレイルエーテル等のポリオキシエチレンアルキルエーテル類、ポリオキシエチレンオクチルフェノールエーテル、ポリオキシエチレンノニルフェノールエーテル等のポリオキシエチレンアルキルアリールエーテル類、ポリオキシエチレン・ポリオキシプロピレンブロックコポリマー類、ソルビタンモノラウレート、ソルビタンモノパルミテート、ソルビタンモノステアレート、ソルビタンモノオレエート、ソルビタントリオレエート、ソルビタントリステアレート等のソルビタン脂肪酸エステル類、ポリオキシエチレンソルビタンモノラウレート、ポリオキシエチレンソルビタンモノパルミテート、ポリオキシエチレンソルビタンモノステアレート、ポリオキシエチレンソルビタントリオレエート、ポリオキシエチレンソルビタントリステアレート等のポリオキシエチレンソルビタン脂肪酸エステル類等のノニオン系界面活性剤、エフトップ(登録商標)EF301、同EF303、同EF352(三菱マテリアル電子化成(株)(旧(株)ジェムコ)製)、メガファック(登録商標)F171、同F173、同R30(DIC(株)製)、フロラードFC430、同FC431(住友スリーエム(株)製)、アサヒガード(登録商標)AG710、サーフロン(登録商標)S-382、同SC101、同SC102、同SC103、同SC104、同SC105、同SC106(旭硝子(株)製)等のフッ素系界面活性剤、及びオルガノシロキサンポリマーKP341(信越化学工業(株)製)を挙げることができる。これらの界面活性剤は単独で添加してもよいし、二種以上の組合せで添加することもできる。配合量は溶剤を除く全固形分中で例えば0.01質量%乃至10質量%である。
本発明の組成物が熱酸発生剤を含む場合、その熱酸発生剤としては、例えば、p-トルエンスルホン酸、トリフルオロメタンスルホン酸、ピリジニウム-p-トルエンスルホナート、サリチル酸、5-スルホサリチル酸、クエン酸、安息香酸、ヒドロキシ安息香酸などの酸性化合物及び/又は、2,4,4,6-テトラブロモシクロヘキサジエノン、ベンゾイントシラート、2-ニトロベンジルトシラート等を配合することができる。配合量は溶剤を除く全固形分中で、例えば、0.02質量%乃至10質量%であり、又は0.04質量%乃至5質量%である。
本発明の組成物が溶剤を含む場合、その溶剤としては半導体デバイス製造工程で使用できる有機溶剤であれば特に限定はないが、例えばシクロヘキサノン、メチルイソアミルケトン、2-ブタノン、2-ヘプタノン等のケトン類;エチレングリコール、エチレングリコールモノアセテート、ジエチレングリコール、ジエチレングリコールモノアセテート、プロピレングリコール、プロピレングリコールモノアセテート、ジプロピレングリコール又はジプロピレングリコールモノアセテート、並びにこれらのモノメチルエーテル、モノエチルエーテル、モノプロピルエーテル、モノブチルエーテル、モノフェニルエーテル等の多価アルコール類及びその誘導体;ジオキサン等の環式エーテル類;γ-ブチロラクトン等のラクトン類;及び乳酸メチル、乳酸エチル、酢酸メチル、酢酸エチル、酢酸ブチル、ピルビン酸メチル、ピルビン酸エチル、メトキシプロピオン酸メチル、エトキシプロピオン酸エチル等のエステル類を用いることが好ましい。これらは単独で用いてもよく、二種以上を混合して用いてもよい。上記有機溶剤を含む場合、本発明の組成物から該有機溶剤を除いた成分を固形分とすると、該固形分の前記組成物に占める割合は例えば1質量%乃至70質量%である。
上記シラン系カップリング剤としては、例えば、ビニルトリメトキシシラン、ビニルトリエトキシシラン、3-メタクリロキシプロピルトリメトキシシラン、3-メタクリロキシプロピルトリエトキシシラン、3-グリシドキシプロピルトリメトキシシラン、3-グリシドキシプロピルトリエトキシシラン、3-アミノプロピルトリメトキシシラン及び3-アミノプロピルトリエトキシシランが挙げられる。
上記レオロジー調整剤としては、例えば、ジメチルフタレート、ジエチルフタレート、ジイソブチルフタレート、ジヘキシルフタレート、ブチルイソデシルフタレート等のフタル酸誘導体、ジノルマルブチルアジペート、ジイソブチルアジペート、ジイソオクチルアジペート、オクチルデシルアジペート等のアジピン酸誘導体、ジノルマルブチルマレート、ジエチルマレート、ジノニルマレート等のマレイン酸誘導体、メチルオレート、ブチルオレート、テトラヒドロフルフリルオレート等のオレイン酸誘導体、又はノルマルブチルステアレート、グリセリルステアレート等のステアリン酸誘導体を挙げることができる。
上記含窒素化合物としては、例えば、ヘキサメトキシメチルメラミン、テトラメトキシメチルベンゾグアナミン、1,3,4,6-テトラキス(ブトキシメチル)グリコールウリル、1,3,4,6-テトラキス(ヒドロキシメチル)グリコールウリル、1,3-ビス(ヒドロキシメチル)尿素、1,1,3,3-テトラキス(ブトキシメチル)尿素、1,1,3,3-テトラキス(メトキシメチル)尿素、1,3-ビス(ヒドロキシメチル)-4,5-ジヒドロキシ-2-イミダゾリノン、1,3-ビス(メトキシメチル)-4,5-ジメトキシ-2-イミダゾリノンが挙げられる。アジド基(アジ基)含有化合物としては、例えば、2,6-ビス(4-アジドベンジリデン)-4-メチルシクロヘキサノン、2,6-ビス(4-アジドベンジリデン)シクロヘキサノンが挙げられる。
上記架橋剤としては、また、日本サイテックインダストリーズ(株)製メトキシメチルタイプメラミン化合物(商品名:CYMEL(登録商標)300、同301、同303、同350)、ブトキシメチルタイプメラミン化合物(商品名:マイコート(登録商標)506、同508)、グリコールウリル化合物(商品名:CYMEL(登録商標)1170、POWDERLINK(登録商標)1174)、メチル化尿素樹脂(商品名:UFR65)、ブチル化尿素樹脂(商品名:UFR300、U-VAN10S60、U-VAN10R、U-VAN11HV)、DIC(株)製尿素/ホルムアルデヒド系樹脂(高縮合型、商品名:ベッカミン(登録商標)J-300S、同P-955、同N)等の市販されている化合物を挙げることができる。
エポキシ基を含有する架橋剤としては、例えば、1個乃至6個、又は2個乃至4個のエポキシ環を有する化合物を使用することができ、例えば、1,4-ブタンジオールジグリシジルエーテル、1,2-エポキシ-4-(エポキシエチル)シクロヘキサン、グリセロールトリグリシジルエーテル、ジエチレングリコールジグリシジルエーテル、2,6-ジグリシジルフェニルグリシジルエーテル、1,1,3-トリス[p-(2,3-エポキシプロポキシ)フェニル]プロパン、1,2-シクロヘキサンジカルボン酸ジグリシジルエステル、4,4’-メチレンビス(N,N-ジグリシジルアニリン)、3,4-エポキシシクロヘキシルメチル-3,4-エポキシシクロヘキサンカルボキシレート、トリメチロールエタントリグリシジルエーテル、トリグリシジル-p-アミノフェノール、テトラグリシジルメタキシレンジアミン、テトラグリシジルジアミノジフェニルメタン、テトラグリシジル-1,3-ビスアミノメチルシクロヘキサン、ビスフェノール-A-ジグリシジルエーテル、ビスフェノール-S-ジグリシジルエーテル、ペンタエリスリトールテトラグリシジルエーテルレゾルシノールジグリシジルエーテル、フタル酸ジグリシジルエステル、ネオペンチルグリコールジグリシジルエーテル、ポリプロピレングリコールジグリシジルエーテル、テトラブロモビスフェノール-A-ジグリシジルエーテル、ビスフェノールヘキサフルオロアセトンジグリシジルエーテル、ペンタエリスリトールジグリシジルエーテル、トリス-(2,3-エポキシプロピル)イソシアヌレート、モノアリルジグリシジルイソシアヌレート、ジグリセロールポリジグリシジルエーテル、ペンタエリスリトールポリグリシジルエーテル、1,4-ビス(2,3-エポキシプロポキシパーフルオロイソプロピル)シクロヘキサン、ソルビトールポリグリシジルエーテル、トリメチロールプロパンポリグリシジルエーテル、レゾルシンジグリシジルエーテル、1,6-へキサンジオールジグリシジルエーテル、ポリエチレングリコールジグリシジルエーテル、フェニルグリシジルエーテル、p-ターシャリーブチルフェニルグリシジルエーテル、アジピン酸ジグリシジルエーテル、o-フタル酸ジグリシジルエーテル、ジブロモフェニルグリシジルエーテル、1,2,7,8-ジエポキシオクタン、1,6-ジメチロールパーフルオロヘキサンジグリシジルエーテル、4,4’-ビス(2,3-エポキシプロポキシパーフルオロイソプロピル)ジフェニルエーテル、2,2-ビス(4-グリシジルオキシフェニル)プロパン、3,4-エポキシシクロヘキシルメチル-3’,4’-エポキシシクロヘキサンカルボキシレート、3,4-エポキシシクロヘキシルオキシラン、2-(3,4-エポキシシクロヘキシル)-3’,4’-エポキシ-1,3-ジオキサン-5-スピロシクロヘキサン、1,2-エチレンジオキシ-ビス(3,4-エポキシシクロヘキシルメタン)、4’,5’-エポキシ-2’-メチルシクロヘキシルメチル-4,5-エポキシ-2-メチルシクロヘキサンカルボキシレート、エチレングリコール-ビス(3,4-エポキシシクロヘキサンカルボキシレート)、ビス-(3,4-エポキシシクロヘキシルメチル)アジペート、及びビス(2,3-エポキシシクロペンチル)エーテルを挙げることができる。
上記架橋剤は、一種の化合物のみを使用することができ、また、二種以上の化合物を組み合わせて用いることもできる。本発明の組成物に含まれる重合体に対して、1質量%乃至50質量%、又は8質量%乃至40質量%、又は15質量%乃至30質量%の架橋剤を使用することができる。
架橋触媒を使用することにより、上記架橋剤の反応が促進される。架橋触媒としては、例えば、p-トルエンスルホン酸、トリフルオロメタンスルホン酸、メタンスルホン酸、ピリジニウム-p-トルエンスルホナート、サリチル酸、カンファースルホン酸、5-スルホサリチル酸、クエン酸、安息香酸、ヒドロキシ安息香酸、4-クロロベンゼンスルホン酸、4-ヒドロキシベンゼンスルホン酸、ベンゼンジスルホン酸、及び1-ナフタレンスルホン酸を挙げることができる。
上記架橋触媒は、一種のみを使用することができ、また、二種以上を組み合わせて用いることもできる。本発明の組成物に含まれる重合体に対して0.01質量%乃至10質量%、又は0.05質量%乃至8質量%、又は0.1質量%乃至5質量%、又は0.3質量%乃至3質量%、又は0.5質量%乃至1質量%の架橋触媒を使用することができる。
本発明の接着剤用組成物は、前記式(6)で表される構造単位を有する重合体及び溶剤を必須の成分として含む。該重合体は、前記式(6)で表される構造単位1種類のみからなる重合体であってもよいし、前記式(6)で表される構造単位を2種類以上含む重合体(共重合体)であってもよい。該重合体の重量平均分子量は、GPC分析による、標準ポリスチレン換算値で、例えば1,000乃至100,000である。式(6)で表される構造単位における各基の定義は前述したとおりである。
上記有機溶剤としては、半導体デバイス製造工程で使用できる溶剤であれば特に限定はないが、例えばシクロヘキサノン、メチルイソアミルケトン、2-ブタノン、2-ヘプタノン等のケトン類;エチレングリコール、エチレングリコールモノアセテート、ジエチレングリコール、ジエチレングリコールモノアセテート、プロピレングリコール、プロピレングリコールモノアセテート、ジプロピレングリコール又はジプロピレングリコールモノアセテート、並びにこれらのモノメチルエーテル、モノエチルエーテル、モノプロピルエーテル、モノブチルエーテル、モノフェニルエーテル等の多価アルコール類及びその誘導体;ジオキサン等の環式エーテル類;γ-ブチロラクトン等のラクトン類;及び乳酸メチル、乳酸エチル、酢酸メチル、酢酸エチル、酢酸ブチル、ピルビン酸メチル、ピルビン酸エチル、メトキシプロピオン酸メチル、エトキシプロピオン酸エチル等のエステル類を用いることが好ましい。これらは単独で用いてもよく、二種以上を混合して用いてもよい。
本発明の接着剤用組成物から上記有機溶剤を除いた成分を固形分とすると、該固形分の前記接着剤組成物に占める割合は例えば1質量%乃至70質量%である。
これら添加剤として、前述の[重合体を含む組成物]において界面活性剤、熱酸発生剤、並びに無機フィラー、シランカップリング剤、レオロジー調整剤、架橋剤、架橋触媒として具体的に挙げた各種化合物を、当該記載された使用量にて用いることができる。
これらの添加剤についても、前述の[重合体を含む組成物]において具体的に挙げた化合物を、当該記載された使用量にて用いることができる。
装置:一体型高速GPCシステム HLC-8220GPC 東ソー(株)製
カラム:KF-G,KF804L
カラム温度:40℃
溶媒:テトラヒドロフラン(THF)
流量:1.0mL/分
標準試料:ポリスチレン
ディテクター:RI
水素化ナトリウム(油状パラフィン中に60質量%含有)10.0gをN-メチル-2-ピロリドン200g中に懸濁させた後、モノブチルイソシアヌル酸21.9gを分割添加し、40℃に加温し1時間攪拌した。その後、1,4-ジブロモブタン25.5gをゆっくり添加した後、100℃で2時間反応させた。その後、水にて反応を停止かつポリマーを析出させた。その後再沈殿作業を行って下記式[A]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は7,100であった。
水素化ナトリウム(油状パラフィン中に60質量%含有)10.0gをN-メチル-2-ピロリドン200g中に懸濁させた後、モノアリルイソシアヌル酸19.5gを分割添加し、40℃に加温し1時間攪拌した。その後、1,4-ジクロロブタン15.0gをゆっくり添加した後、90℃で24時間反応させた。その後、水にて反応を停止かつポリマーを析出させた。その後再沈殿作業を行って下記式[B]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は4,000であった。
合成例2で得られたポリマー8gを塩化メチレン32gに溶解させ、その後m-クロロ過安息香酸9.3g(0.054mol)を分割添加し、窒素中、室温で2日間反応させた。その後、得られた反応溶液をジエチルエーテル/メタノール混合溶媒に滴下し、析出した沈殿物を濾過し、白色粉末を得た。反応生成物のGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は5,200であった。また、アリルからエポキシへの転化率は52%であった。得られた反応生成物は下記式[C]に示す2つの式で表される構造単位を有するポリマーである。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸67.66g、1,2-ジブロモエタン74.39g、炭酸カリウム121.62g及びN-メチル-2-ピロリドン213.07gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って下記式[D]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は9,500であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸67.66g、1,4-ジブロモブタン77.73g、炭酸カリウム121.62g及びN-メチル-2-ピロリドン581.53gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って下記式[E]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は9,500であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸67.66g、1,6-ジブロモヘキサン87.83g、炭酸カリウム121.62g及びN-メチル-2-ピロリドン621.94gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後酢酸エチルと水の二層分離溶液に投入して分液操作を行うことで、目的のポリマーのみを酢酸エチル層に抽出し、酢酸エチルをエバポレーターで蒸留させることで、下記式[F]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は5,600であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸11.84g、1,8-ジブロモオクタン17.14g、炭酸カリウム21.28g及びN-メチル-2-ピロリドン115.91gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後酢酸エチルと水の二層分離溶液に投入して分液操作を行うことで、目的のポリマーのみを酢酸エチル層に抽出し、酢酸エチルをエバポレーターで蒸留することで、下記式[G]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は11,300であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸11.84g、1,10-ジブロモデカン17.14g、炭酸カリウム21.28g及びN-メチル-2-ピロリドン115.91gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後酢酸エチルと水の二層分離溶液に投入して分液操作を行うことで、目的のポリマーのみを酢酸エチル層に抽出し、酢酸エチルをエバポレーターで蒸留することで、下記式[H]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は10,600であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸11.84g、p-ジクロロキシレン12.13g、炭酸カリウム21.28g及びN-メチル-2-ピロリドン95.89gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って、下記式[I]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は17,000であった。
攪拌装置、還流器及び温度計を備えたフラスコにジエチルバルビツール酸12.89g、1,4-ジブロモエタン13.02g、炭酸カリウム21.28g及びN-メチル-2-ピロリドン103.65gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って、下記式[J]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は2,400であった。
攪拌装置、還流器、温度計を備えたフラスコにモノアリルイソシアヌル酸11.84g、1,4-ジブロモ-2-ブテン14.83g、炭酸カリウム21.28g 、N-メチル-2-ピロリドン106.65gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って、下記式[K]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は8,900であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸16.91g、1,3-ジクロロ-2-プロパノン12.57g、炭酸カリウム30.41g及びN-メチル-2-ピロリドン88.45gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って、下記式[L]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は1,300であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸25.37g、o-ジクロロキシレン22.32g、炭酸カリウム45.61g及びN-メチル-2-ピロリドン111.28gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って、下記式[M]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は7,800であった。
攪拌装置、還流器及び温度計を備えたフラスコにモノアリルイソシアヌル酸84.57g、m-ジクロロキシレン39.38g、1,5-ジブロモペンタン45.99g、アリルブロミド6.05g、炭酸カリウム106.62g及びN-メチル-2-ピロリドン410.66gを入れた。その後フラスコ内を窒素置換した後、70℃まで加熱し20時間反応させた。その後溶液を室温まで冷却させた後、ろ過してろ液を回収し、N-メチル-2-ピロリドンと1mol/L塩酸の体積比が90:10の混合液をpHが酸性となるまで加えた。その後メタノールに投入し再沈精製を行って、下記[N]に示す2つの式で表される構造単位を50:50のモル比で有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は3,900であった。
攪拌装置、還流器及び温度計を備えたフラスコに、ジアリルモノグリシジルイソシアヌル酸21.22g、1,1,3,3-テトラメチルジシロキサン10.64g、及びカルステッド触媒(白金(0)-1,3-ジビニル-1,1,3,3-テトラメチルジシロキサン錯体の0.1Mキシレン溶液)20μLを入れた。その後フラスコ内を窒素置換した後、70℃で1時間及び90℃で20時間反応させることで、下記式[X]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は7,800であった。
攪拌装置、還流器及び温度計を備えたフラスコに、ジアリルモノグリシジルイソシアヌル酸18.57g、1,1,3,3,5,5,7,7-オクタメチルテトラシロキサン19.59g、及びカルステッド触媒(白金(0)-1,3-ジビニル-1,1,3,3-テトラメチルジシロキサン錯体の0.1Mキシレン溶液)20μLを入れた。その後フラスコ内を窒素置換した後、70℃で1時間及び150℃で20時間反応させることで、下記式[Y]で表される構造単位を有するポリマーを得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は5,500であった。
合成例1で得られたポリマー1g、界面活性剤としてメガファック(登録商標)R-30(DIC(株)製)0.01gをプロピレングリコールモノメチルエーテル2.0g、プロピレングリコールモノメチルエーテルアセテート2.0g及びγ-ブチロラクトン1gに溶解させ溶液とした。その後、孔径0.10μmのポリエチレン製ミクロフィルターを用いてろ過して組成物を調製した。
合成例1で得られたポリマーにかえて合成例2で得られたポリマーを用いた以外は、上記実施例1と同様に組成物を調製した。
合成例3で得られたポリマー1g、界面活性剤としてメガファック(登録商標)R-30(DIC(株)製)0.01g、熱酸発生剤としてTAG-N(三新化学工業(株)製)0.03gをプロピレングリコールモノメチルエーテル2.0g、プロピレングリコールモノメチルエーテルアセテート2.0g及びγ-ブチロラクトン1gに溶解させ溶液とした。その後、孔径0.10μmのポリエチレン製ミクロフィルターを用いてろ過して組成物を調製した。
合成例4で得られたポリマーをシクロヘキサノンに溶解させ、その後、孔径1.0μmのポリテトラフルオロエチレン(以下、PTFEと略称する。)製ミクロフィルターを用いてろ過して、固形分として35質量%含有する組成物を調製した。
合成例4で得られたポリマーにかえて合成例5で得られたポリマーを用いた以外は、上記実施例4と同様に組成物を調製した。
合成例4で得られたポリマーにかえて合成例6で得られたポリマーを用いた以外は、上記実施例4と同様に組成物を調製した。
合成例4で得られたポリマーにかえて合成例7で得られたポリマーを用いた以外は、上記実施例4と同様に組成物を調製した。
合成例4で得られたポリマーにかえて合成例8で得られたポリマーを用いた以外は、上記実施例4と同様に組成物を調製した。
ポリイミド前駆体である、ポリ(ピロメリット酸二無水物-co-4,4’-オキシジアニリン)アミック酸溶液(Pyre-ML RC-5019 16質量%N-メチル-2-ピロリドン溶液、シグマアルドリッチジャパン(株)))5gに、界面活性剤としてメガファック(登録商標)R-30(DIC(株)製)0.01gを加え溶液とした。その後、孔径0.10μmのポリエチレン製ミクロフィルターを用いてろ過して組成物を調製した。
比較合成例1で得られたポリマーをシクロヘキサノンに溶解させ、その後、熱酸発生剤K-PURE TAG2689(キングインダストリーズ社製)をポリマー質量に対して1質量%加え、孔径1.0μmのPTFE製ミクロフィルターを用いてろ過して、固形分として35.35質量%含有する組成物を調製した。
比較合成例2で得られたポリマーをシクロヘキサノンに溶解させ、その後、熱酸発生剤K-PURE TAG2689(キングインダストリーズ社製)をポリマー質量に対して1質量%加え、孔径1.0μmのPTFE製ミクロフィルターを用いてろ過して、固形分として40.40質量%含有する組成物を調製した。
アクリル樹脂であるポリメタクリル酸メチル(和光純薬工業(株)製)をシクロヘキサノン中に溶解させ、その後、孔径1.0μmのPTFE製ミクロフィルターを用いてろ過して、固形分として20質量%含有する組成物を調製した。
実施例1乃至実施例3、及び比較例1で調製した組成物を、石英基板上にスピンコーターを用いて塗布し、ホットプレート上において、200℃で5分間ベークを行い、膜厚0.75μmの膜を形成した。この膜を紫外線可視分光光度計UV-2550((株)島津製作所製)を用いて波長400nmの透過率を測定した。さらにこの膜を260℃で3分間加熱した後、波長400nmの透過率を測定した。測定結果を下記表1に示す。表1に示すように、本発明の組成物から得られた膜は、比較例の組成物から得られた膜と比べて透過率が高く、260℃という高温でもほとんど着色せず高い透過率を維持し、耐熱性を有することを示唆するという結果が得られた。
実施例1乃至実施例3で調製した組成物を、スピンコーターにより石英板上に塗布した。ホットプレート上において220℃で5分間ベークし、膜厚0.75μmの膜を形成した。そして、これらの膜をキセノンアークランプによる耐光性試験(JIS B7754)を24時間行い、この膜を紫外線可視分光光度計UV-2550((株)島津製作所製)を用いて波長400nmの透過率を測定した。測定結果を下記表2に示す。表2に示すように、本発明の組成物から得られた膜は紫外線照射後も透過率が高く、耐光性が高い(着色しにくい)とする結果が得られた。
実施例3及び比較例1で調製した組成物を、シリコンウェハー上にスピンコーターを用いて塗布し、ホットプレート上において200℃で5分間ベークを行い、膜厚1μmの膜を形成した。この膜を、アセトン、N-メチル-2-ピロリドン、2-プロパノール、及び2-ヘプタノンに、それぞれ23℃にて10分間浸漬した。実施例3の組成物から得られた膜では浸漬前後での膜厚変化が5%以下であることを確認したが、比較例1の組成物から得られた膜ではN-メチル-2-ピロリドンに浸漬後、全部溶解してしまった。
実施例4乃至実施例6及び比較例2及び比較例3で調製した組成物をシリコンウェハー上にスピンコーターを用いて塗布し、ホットプレート上で100℃及び150℃でそれぞれ2分間ベークし、更に窒素置換されたオーブンにおいて250℃で1時間ベークして膜を形成した。この膜のリワーク性について、反応性イオンエッチング装置(サムコ(株)製、RIE-10NR)にて酸素流量50sccm、圧力12Pa、RF出力250Wの条件下で、2分間エッチングを行い、1分間当たりに減少した膜厚量から評価した。その結果を下記表3に示す。表3に示すように、本発明の組成物から得られた膜は、エッチングにより容易に除去可能であり、リワーク性に優れるのに対し、比較例の組成物から得られた膜ではほとんど除去できずリワーク性に欠けるとする結果が得られた。
実施例4乃至実施例8及び比較例4で調製した組成物に、シリコンウェハー上にスピンコーターを用いて膜を形成した際に膜厚が500nmとなるよう、シクロヘキサノンを加えて希釈溶液を作製した。作製した希釈溶液をシリコンウェハー上にスピンコーターを用いて塗布し、ホットプレート上で100℃及び150℃でそれぞれ2分間ベークし、更に窒素置換されたオーブンにおいて250℃で1時間ベークして膜を形成した。この膜の絶縁性について、水銀プローバ(Four Dimensions社製、CVmap92-B)による2MV/cmの電圧をかけた際のリーク電流値を測定した。その結果を下記表4に示す。表4に示すように、本発明の組成物から得られた膜はリーク電流値が低く、絶縁性が高いのに対し、比較例の組成物から得られた膜はリーク電流値が高く、絶縁性に乏しいとする結果が得られた。
実施例4乃至実施例8及び比較例4で調製した組成物をシリコンウェハー上にスピンコーターを用いて塗布し、ホットプレート上において100℃及び150℃でそれぞれ2分間ベークして形成した膜の耐熱性について、TG-DTA(ブルカーエイエックスエス社製、TG/DTA2010SR)にて、10℃/分で昇温し5質量%の質量減少を生ずる温度から評価した。その結果を下記表5に示す。表5に示すように、本発明の組成物から得られた膜は5質量%質量減少温度が高く、比較例の組成物から得られた膜よりも高い耐熱性を示すとする結果が得られた。
(接着力評価サンプルの作製)
実施例4及び実施例5で調製した組成物を、ウェハー径4インチのシリコンウェハー上に、スピンコーターを用いて膜を形成した際の膜厚が5μmとなるようそれぞれ塗布し、ホットプレート上において100℃で2分間及び150℃で2分間ベークして膜を形成した。その後、貼り合せ装置(アユミ工業(株)製、VJ-300)を使用して、真空度10Pa以下、温度160℃、貼り合せ圧力400Kgの条件下で、前記シリコンウェハー上に形成した膜とウェハー径4インチのガラスウェハーとを接着させた。その後、接着したウェハーをオーブンにて250℃で1時間ベークし、ダイシングソー((株)ディスコ製、DAD321)を使用して1cm角に切断し、接着力評価用サンプルを作製した。
さらに、比較例4で調製した組成物を、ウェハー径4インチのシリコンウェハー上に、スピンコーターを用いて膜を形成した際に膜厚が5μmとなるよう塗布し、ホットプレート上において100℃で2分間及び200℃で2分間ベークして膜を形成し、その後、貼り合せ装置(アユミ工業(株)製、VJ-300)を使用して、真空度10Pa以下、温度270℃、貼り合せ圧力400Kgの条件下で、前記シリコンウェハー上に形成した膜とウェハー径4インチのガラスウェハーとを接着させた。その後、ダイシングソー((株)ディスコ製、DAD321)を使用して1cm角に切断し、接着力評価用サンプルを作製した。
実施例4、実施例5及び比較例4の組成物を用いて得られた接着力評価サンプルの両面に、アラルダイト(登録商標)2014(ハンツマン・アドバンスト・マテリアルズ社製)を塗布し、接着力(せん断)測定用専用冶具に両面を接着後、オートグラフ((株)島津製作所製、オートグラフAGS-100NX)で接着力(せん断)を評価試験した。接着力は1mm/分の引っ張り速度で測定した。その結果を下記表6に示す。表6中、接着力の値が1000N以上とは、上記接着力測定機(試験装置)の測定限界以上であることを示す。実施例4及び実施例5の組成物を用いて得られたサンプルは、比較例4の組成物から得られたサンプルより、高い接着力を示した。
1,2-シクロヘキサンジカルボン酸グリシジルエステル25.00g、モノアリルイソシアヌル酸15.43g、及びベンジルトリエチルアンモニウムクロリド0.93gをシクロヘキサノン62.05gに溶解させた後、140℃で4時間反応させポリマーを含む溶液を得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は5,500であった。なお、得られたポリマーは、下記式[O]で表される構造単位を有し且つポリマー末端に水素原子を有するポリマーであると考えられる。
1,2-シクロヘキサンジカルボン酸15.86g、モノアリルジグリシジルイソシアヌル酸25.00g、及びエチルトリフェニルホスホニウムブロミド3.35gをシクロヘキサノン54.03gに溶解させた後、140℃で4時間反応させポリマーを含む溶液を得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は3,300であった。得られたポリマーは、下記式[P]で表される構造単位を有し且つポリマー末端にカルボキシル基を有するポリマーであると考えられる。なお、本合成例で得られたポリマーと合成例15で得られたポリマーとは、末端が相違する。
2,2-ビス(4-グリシジルオキシシクロヘキサン)プロパン25.00g、モノアリルイソシアヌル酸9.67g、及びエチルトリフェニルホスホニウムブロミド1.04gをシクロヘキサノン53.57gに溶解させた後、140℃で4時間反応させポリマーを含む溶液を得た。得られたポリマーのGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は8,200であった。なお、得られたポリマーは、下記式[Q]で表される構造単位を有し且つポリマー末端に水素原子を有するポリマーであると考えられる。
モノアリルジグリシジルイソシアヌル酸2.0g及びモノアリルイソシアヌル酸1.2gをシクロヘキサノン13.2gに溶解させた後、120℃に加温して、ベンジルトリエチルアンモニウムクロリド0.08gを添加し、窒素雰囲気下120℃で21時間反応させた。その後、得られた反応溶液をメタノールに滴下し、析出した沈殿物をろ過し、白色粉末を得た。反応生成物のGPC分析を行ったところ、標準ポリスチレン換算にて重量平均分子量は5,800であった。得られた反応生成物は下記式[R]で表される構造単位を有するポリマーである。
合成例15で得られたポリマーを含む溶液を、陽イオン交換樹脂(15JWET、オルガノ(株))及び陰イオン交換樹脂(モノスフィアー(登録商標)550A、ムロマチテクノス(株))が充填されたボトル中に注入し、4時間撹拌させた。その後、孔径3μmのポリエチレン製ミクロフィルターを用いてろ過して、接着剤用組成物を調製した。
合成例16で得られたポリマーを含む溶液を、陽イオン交換樹脂(15JWET、オルガノ(株))及び陰イオン交換樹脂(モノスフィアー(登録商標)550A、ムロマチテクノス(株))が充填されたボトル中に注入し、4時間撹拌させた。その後、孔径3μmのポリエチレン製ミクロフィルターを用いてろ過して、接着剤用組成物を調製した。
合成例17で得られたポリマーを含む溶液を、陽イオン交換樹脂(15JWET、オルガノ(株))及び陰イオン交換樹脂(モノスフィアー(登録商標)550A、ムロマチテクノス(株))が充填されたボトル中に注入し、4時間撹拌させた。その後、孔径3μmのポリエチレン製ミクロフィルターを用いてろ過して、接着剤用組成物を調製した。
合成例18で得られた粉末状のポリマー5gをシクロヘキサノン45gに投入し、4時間攪拌させた。その後、孔径3μmのポリエチレン製ミクロフィルターを用いてろ過して、接着剤用組成物を調製した。
合成例15で得られたポリマーを含む溶液を、陽イオン交換樹脂(15JWET、オルガノ(株))及び陰イオン交換樹脂(モノスフィアー(登録商標)550A、ムロマチテクノス(株))が充填されたボトル中に注入し、4時間撹拌させた。その後、孔径3μmのポリエチレン製ミクロフィルターを用いてろ過した。ろ液に、前記溶液中のポリマー(固形分)質量に対し9分の1の質量のオルガノシリカゾル(MEK-AC-2101、日産化学工業(株)製)を加え、攪拌し接着剤用組成物を調製した。
合成例16で得られたポリマーを含む溶液を、陽イオン交換樹脂(15JWET、オルガノ(株))及び陰イオン交換樹脂(モノスフィアー(登録商標)550A、ムロマチテクノス(株))が充填されたボトル中に注入し、4時間撹拌させた。その後、孔径3μmのポリエチレン製ミクロフィルターを用いてろ過した。ろ液に、前記溶液中のポリマー(固形分)質量に対し9分の1の質量のオルガノシリカゾル(MEK-AC-2101、日産化学工業(株)製)を加え、攪拌し接着剤用組成物を調製した。
ポリイミド前駆体である、ポリ(ピロメリット酸二無水物-co-4,4’-オキシジアニリン)アミック酸溶液(Pyre-ML RC-5019 16質量%N-メチル-2-ピロリドン溶液、シグマアルドリッチジャパン(株))10gに、N-メチル-2-ピロリドン10gを加え、接着剤用組成物を調製した。
実施例9、10、11、13、14及び比較例5で調製した接着剤用組成物を、石英基板上にスピンコーターを用いて塗布し、ホットプレート上において、200℃で5分間ベークを行い、膜厚1μmの膜を形成した。この膜を紫外線可視分光光度計UV-2550((株)島津製作所製)を用いて波長500nmの透過率を測定した。
さらに、前記実施例9及び10及び比較例5で調製した接着剤用組成物から形成した膜を270℃で5分間ベークした後、波長500nmの透過率を測定した。
測定結果を下記表7に示す。表7に示すように、実施例9及び10で調製した接着剤用組成物から形成した膜は、比較例5で調製した接着剤用組成物から形成した膜よりも高い透過率を示し、且つ270℃でベーク後も高い透過率を維持し、耐熱性を有することを示唆する結果を得た。
実施例9、10、11、13、14及び比較例5で調製した接着剤用組成物を、シリコンウェハー上にスピンコーターを用いて塗布し、ホットプレート上において200℃で5分間ベークを行い、膜厚1μmの膜を形成した。この膜をN-メチル-2-ピロリドンに、23℃にて2分間浸漬した。実施例9、10、11、13、14で調製した接着剤用組成物から形成された膜は浸漬前後での膜厚変化が1%以下であることを確認したが、比較例5で調製した接着剤用組成物から形成された膜はN-メチル-2-ピロリドンに浸漬後、浸漬前の膜厚の20%以上が溶解してしまった。
実施例9、10、11で調製した接着剤用組成物を、シリコンウェハー上にスピンコーターを用いて塗布し、100℃及び160℃でそれぞれ4分間ずつベークを行って、膜厚5μmの膜を形成した。その後、貼り合せ装置(アユミ工業(株)製、VJ-300)を使用して、真空度10Pa以下、温度160℃、貼り合せ圧力800Kgの条件下で、前記シリコンウェハー上に形成した膜とウェハー径4インチのガラスウェハーとを接着させた。その後、接着したウェハーをダイシング装置(ディスコ(株)製、DAD321)で1cm角に切断し、接着力評価サンプルを作製した。
得られた接着力評価サンプルの両面にアラルダイト(登録商標)2014(ハンツマン・アドバンスト・マテリアルズ社製)を塗布し、接着力(せん断)測定用専用冶具に両面を接着後、オートグラフ((株)島津製作所製、オートグラフAGS-100NX)で接着力(せん断)を評価試験した。接着力は1mm/分の引っ張り速度で測定した。その結果を下記表8に示す。表8中、接着力の値が1000N以上とは、上記接着力測定機の測定限界以上であることを示す。実施例9、10、11で調製した接着剤用組成物を用いて得られたサンプルは、十分な接着性を有することが確認された。
Claims (17)
- 下記式(1)で表される構造単位を有する重量平均分子量1,000乃至100,000の重合体。
で表される二価の基であって、前記Qが前記式(2)で表される二価の基又は式(3)で表され且つnが1を表す二価の基である場合、該式(2)及び式(3)の一部を構成するカルボニル基は前記式(1)の窒素原子と結合し、
R1は炭素原子数1乃至10のアルキレン基、炭素原子数2乃至10のアルケニレン基若しくはアルキニレン基、炭素原子数6乃至14のアリーレン基、炭素原子数4乃至10の環状アルキレン基、又は下記式(4)若しくは式(5):
で表される基を表す。} - 前記アリーレン基はフェニレン基であり、前記脂環式炭化水素基はシクロヘキシレン基である、請求項4に記載の重合体。
- 前記アルキル基は、少なくとも1つの水素原子がフッ素原子で置換されていてもよいメチル基である、請求項4に記載の重合体。
- 請求項1乃至請求項6のいずれか一項に記載の重合体を含む組成物。
- さらに界面活性剤を含む請求項7に記載の組成物。
- さらに熱酸発生剤を含む請求項7又は請求項8に記載の組成物。
- さらに溶剤を含む請求項7乃至請求項請求項9のいずれか一項に記載の組成物。
- 接着剤用、絶縁膜形成用又はレジスト下層膜形成用である請求項7乃至請求項10のいずれか一項に記載の組成物。
- 絶縁インクである請求項10に記載の組成物。
- 前記アリーレン基はフェニレン基であり、前記脂環式炭化水素基はシクロヘキシレン基である、請求項15に記載の接着剤用組成物。
- 前記アルキル基は、少なくとも1つの水素原子がフッ素原子で置換されていてもよいメチル基である、請求項15に記載の接着剤用組成物。
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TW201323486A (zh) | 2013-06-16 |
EP2754681A1 (en) | 2014-07-16 |
TWI593719B (zh) | 2017-08-01 |
KR20140060331A (ko) | 2014-05-19 |
US20140228488A1 (en) | 2014-08-14 |
MY168166A (en) | 2018-10-11 |
SG11201400480SA (en) | 2014-06-27 |
EP2754681B1 (en) | 2018-01-03 |
US20160222262A1 (en) | 2016-08-04 |
JPWO2013035787A1 (ja) | 2015-03-23 |
TW201702286A (zh) | 2017-01-16 |
JP6098825B2 (ja) | 2017-03-22 |
EP2754681A4 (en) | 2015-01-28 |
US10202528B2 (en) | 2019-02-12 |
TWI660979B (zh) | 2019-06-01 |
CN103781821A (zh) | 2014-05-07 |
EP3235853A1 (en) | 2017-10-25 |
CN103781821B (zh) | 2016-09-07 |
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