WO2008153068A1 - 窒化物系半導体装置およびその製造方法 - Google Patents
窒化物系半導体装置およびその製造方法 Download PDFInfo
- Publication number
- WO2008153068A1 WO2008153068A1 PCT/JP2008/060696 JP2008060696W WO2008153068A1 WO 2008153068 A1 WO2008153068 A1 WO 2008153068A1 JP 2008060696 W JP2008060696 W JP 2008060696W WO 2008153068 A1 WO2008153068 A1 WO 2008153068A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- nitride semiconductor
- semiconductor layer
- type impurity
- semiconductor device
- manufacturing
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 13
- 150000004767 nitrides Chemical class 0.000 title abstract 12
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 title abstract 2
- 239000012535 impurity Substances 0.000 abstract 7
- 239000012159 carrier gas Substances 0.000 abstract 1
- 239000007789 gas Substances 0.000 abstract 1
- 239000001257 hydrogen Substances 0.000 abstract 1
- 229910052739 hydrogen Inorganic materials 0.000 abstract 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 abstract 1
- 229910052738 indium Inorganic materials 0.000 abstract 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 230000003685 thermal hair damage Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/811—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
- H10H20/812—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
- H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3086—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer
- H01S5/309—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer doping of barrier layers that confine charge carriers in the laser structure, e.g. the barriers in a quantum well structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
Landscapes
- Led Devices (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
低温でp型半導体層(4)を形成して活性層(3)への熱ダメージを低減させ、かつ順方向電圧(Vf)を低下させ、発光効率を向上させる。 インジウムを含む多重量子井戸からなる活性層(3)と、p型不純物を含む第1窒化物系半導体層(41)と、第1窒化物系半導体層(41)のp型不純物よりも低濃度のp型不純物を含む第2窒化物系半導体層(42)と、第2窒化物系半導体層(42)のp型不純物よりも高濃度のp型不純物を含む第3窒化物系半導体層(43)と、第3窒化物系半導体層(43)のp型不純物よりも低濃度のp型不純物を含む第4窒化物系半導体層(44)とを備え、その製造方法において、水素を含まないキャリアガスによって原料ガスを供給して、第1窒化物系半導体層(41)~第4窒化物系半導体層(44)の少なくとも一部を形成する窒化物系半導体装置およびその製造方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009519280A JP5579435B2 (ja) | 2007-06-15 | 2008-06-11 | 窒化物系半導体装置およびその製造方法 |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007158567 | 2007-06-15 | ||
JP2007-158567 | 2007-06-15 | ||
JP2007-158557 | 2007-06-15 | ||
JP2007158557 | 2007-06-15 | ||
JP2007-238048 | 2007-09-13 | ||
JP2007238048 | 2007-09-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008153068A1 true WO2008153068A1 (ja) | 2008-12-18 |
Family
ID=40129673
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/060696 WO2008153068A1 (ja) | 2007-06-15 | 2008-06-11 | 窒化物系半導体装置およびその製造方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5579435B2 (ja) |
TW (1) | TW200905931A (ja) |
WO (1) | WO2008153068A1 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2012063735A1 (ja) * | 2010-11-09 | 2014-05-12 | 株式会社ニコン | カーボン薄膜、光学素子成形用金型及び光学素子の製造方法 |
WO2016092822A1 (ja) * | 2014-12-08 | 2016-06-16 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子の製造方法 |
JP2016111370A (ja) * | 2014-12-08 | 2016-06-20 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子の製造方法およびiii族窒化物半導体発光素子 |
JP2016111235A (ja) * | 2014-12-08 | 2016-06-20 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子の製造方法およびiii族窒化物半導体発光素子 |
JP2019040962A (ja) * | 2017-08-23 | 2019-03-14 | 豊田合成株式会社 | Iii族窒化物半導体発光素子の製造方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7741131B2 (en) * | 2007-05-25 | 2010-06-22 | Electro Scientific Industries, Inc. | Laser processing of light reflective multilayer target structure |
TWI420696B (zh) * | 2009-11-19 | 2013-12-21 | Epistar Corp | 發光元件及其製造方法 |
KR101734558B1 (ko) | 2011-02-28 | 2017-05-11 | 엘지이노텍 주식회사 | 발광 소자 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09153642A (ja) * | 1995-09-29 | 1997-06-10 | Nichia Chem Ind Ltd | 窒化物半導体発光素子 |
JP2000307149A (ja) * | 1999-04-21 | 2000-11-02 | Nichia Chem Ind Ltd | 窒化物半導体素子 |
JP2002026388A (ja) * | 2000-07-06 | 2002-01-25 | Nichia Chem Ind Ltd | 端面発光型発光素子 |
JP2002319702A (ja) * | 2001-04-19 | 2002-10-31 | Sony Corp | 窒化物半導体素子の製造方法、窒化物半導体素子 |
JP2004087930A (ja) * | 2002-08-28 | 2004-03-18 | Nichia Chem Ind Ltd | 窒化物半導体発光素子 |
JP2006120856A (ja) * | 2004-10-21 | 2006-05-11 | Hitachi Cable Ltd | 半導体発光素子の製造方法 |
JP2007134415A (ja) * | 2005-11-08 | 2007-05-31 | Rohm Co Ltd | 窒化物半導体発光素子及び窒化物半導体発光素子製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4457826B2 (ja) * | 2004-09-22 | 2010-04-28 | 三菱化学株式会社 | 窒化物半導体を用いた発光ダイオード |
-
2008
- 2008-06-11 WO PCT/JP2008/060696 patent/WO2008153068A1/ja active Application Filing
- 2008-06-11 JP JP2009519280A patent/JP5579435B2/ja not_active Expired - Fee Related
- 2008-06-13 TW TW097122320A patent/TW200905931A/zh unknown
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09153642A (ja) * | 1995-09-29 | 1997-06-10 | Nichia Chem Ind Ltd | 窒化物半導体発光素子 |
JP2000307149A (ja) * | 1999-04-21 | 2000-11-02 | Nichia Chem Ind Ltd | 窒化物半導体素子 |
JP2002026388A (ja) * | 2000-07-06 | 2002-01-25 | Nichia Chem Ind Ltd | 端面発光型発光素子 |
JP2002319702A (ja) * | 2001-04-19 | 2002-10-31 | Sony Corp | 窒化物半導体素子の製造方法、窒化物半導体素子 |
JP2004087930A (ja) * | 2002-08-28 | 2004-03-18 | Nichia Chem Ind Ltd | 窒化物半導体発光素子 |
JP2006120856A (ja) * | 2004-10-21 | 2006-05-11 | Hitachi Cable Ltd | 半導体発光素子の製造方法 |
JP2007134415A (ja) * | 2005-11-08 | 2007-05-31 | Rohm Co Ltd | 窒化物半導体発光素子及び窒化物半導体発光素子製造方法 |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2012063735A1 (ja) * | 2010-11-09 | 2014-05-12 | 株式会社ニコン | カーボン薄膜、光学素子成形用金型及び光学素子の製造方法 |
WO2016092822A1 (ja) * | 2014-12-08 | 2016-06-16 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子の製造方法 |
JP2016111370A (ja) * | 2014-12-08 | 2016-06-20 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子の製造方法およびiii族窒化物半導体発光素子 |
JP2016111235A (ja) * | 2014-12-08 | 2016-06-20 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子の製造方法およびiii族窒化物半導体発光素子 |
CN107004745A (zh) * | 2014-12-08 | 2017-08-01 | 同和电子科技有限公司 | 第iii族氮化物半导体发光器件的制造方法 |
US10147842B2 (en) | 2014-12-08 | 2018-12-04 | Dowa Electronics Materials Co., Ltd. | Method of producing III nitride semiconductor light-emitting device |
US10283671B2 (en) | 2014-12-08 | 2019-05-07 | Dowa Electronics Materials Co., Ltd. | Method of producing III nitride semiconductor light-emitting device |
JP2019040962A (ja) * | 2017-08-23 | 2019-03-14 | 豊田合成株式会社 | Iii族窒化物半導体発光素子の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JP5579435B2 (ja) | 2014-08-27 |
JPWO2008153068A1 (ja) | 2010-08-26 |
TW200905931A (en) | 2009-02-01 |
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