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WO2008123608A1 - 導電性接触子ホルダおよび導電性接触子ユニット - Google Patents

導電性接触子ホルダおよび導電性接触子ユニット Download PDF

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Publication number
WO2008123608A1
WO2008123608A1 PCT/JP2008/056769 JP2008056769W WO2008123608A1 WO 2008123608 A1 WO2008123608 A1 WO 2008123608A1 JP 2008056769 W JP2008056769 W JP 2008056769W WO 2008123608 A1 WO2008123608 A1 WO 2008123608A1
Authority
WO
WIPO (PCT)
Prior art keywords
conductive contact
holder
holder substrate
floating member
substrate
Prior art date
Application number
PCT/JP2008/056769
Other languages
English (en)
French (fr)
Inventor
Kohei Hironaka
Toru Nakamura
Mitsuhiro Kondo
Original Assignee
Nhk Spring Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co., Ltd. filed Critical Nhk Spring Co., Ltd.
Priority to EP08739875.6A priority Critical patent/EP2138852A4/en
Priority to US12/450,602 priority patent/US8096840B2/en
Priority to JP2009509323A priority patent/JP5490529B2/ja
Priority to KR1020097022794A priority patent/KR101093044B1/ko
Priority to TW097112470A priority patent/TW200907350A/zh
Publication of WO2008123608A1 publication Critical patent/WO2008123608A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0458—Details related to environmental aspects, e.g. temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

　正確な温度設定環境で検査を行うことができる導電性接触子ホルダおよび導電性接触子ユニットを提供する。この目的のため、複数の導電性接触子を個別に収容可能な複数のホルダ孔を有するホルダ基板４と、このホルダ基板４の表面との距離が外力によって所定の範囲で変化自在となるようにホルダ基板４に取り付けられ、ホルダ基板４に収容された複数の導電性接触子２の先端部をそれぞれ挿通可能な複数の孔部を有するフローティング部材５と、を備え、ホルダ基板４とフローティング部材５との隙間Ｓｐが、外部から流入する流体の流路の少なくとも一部をなすように構成する。
PCT/JP2008/056769 2007-04-04 2008-04-04 導電性接触子ホルダおよび導電性接触子ユニット WO2008123608A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP08739875.6A EP2138852A4 (en) 2007-04-04 2008-04-04 Conductive contact holder and conductive contact unit
US12/450,602 US8096840B2 (en) 2007-04-04 2008-04-04 Conductive contact holder and conductive contact unit
JP2009509323A JP5490529B2 (ja) 2007-04-04 2008-04-04 導電性接触子ユニット
KR1020097022794A KR101093044B1 (ko) 2007-04-04 2008-04-04 도전성 접촉자 홀더 및 도전성 접촉자 유닛
TW097112470A TW200907350A (en) 2007-04-04 2008-04-07 Conductive contact holder and conductive contact unit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007098726 2007-04-04
JP2007-098726 2007-04-04

Publications (1)

Publication Number Publication Date
WO2008123608A1 true WO2008123608A1 (ja) 2008-10-16

Family

ID=39831063

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/056769 WO2008123608A1 (ja) 2007-04-04 2008-04-04 導電性接触子ホルダおよび導電性接触子ユニット

Country Status (6)

Country Link
US (1) US8096840B2 (ja)
EP (1) EP2138852A4 (ja)
JP (1) JP5490529B2 (ja)
KR (1) KR101093044B1 (ja)
TW (1) TW200907350A (ja)
WO (1) WO2008123608A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009258100A (ja) * 2008-03-28 2009-11-05 Panasonic Corp 導電性接触子および半導体検査装置
EP2360482A4 (en) * 2008-11-26 2014-05-28 Nhk Spring Co Ltd BASIC ELEMENT FOR A PROBE UNIT AND PROBE UNIT
JPWO2013051099A1 (ja) * 2011-10-04 2015-03-30 富士通株式会社 試験用治具及び半導体装置の試験方法
WO2023084612A1 (ja) * 2021-11-09 2023-05-19 株式会社アドバンテスト 温度調整装置及び電子部品試験装置
JP2024040236A (ja) * 2023-06-09 2024-03-25 穎▲うぇい▼科技股▲ふん▼有限公司 テストソケット

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2958756B1 (fr) * 2010-04-09 2013-02-08 European Aeronautic Defence & Space Co Eads France Systeme de test d'un composant electronique haute frequence
JP5582995B2 (ja) * 2010-12-14 2014-09-03 新光電気工業株式会社 ソケット
KR101149759B1 (ko) * 2011-03-14 2012-06-01 리노공업주식회사 반도체 디바이스의 검사장치
JP5848182B2 (ja) * 2012-04-05 2016-01-27 トヨタ自動車株式会社 車両
JP2015224989A (ja) * 2014-05-28 2015-12-14 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
US11209477B2 (en) * 2019-10-31 2021-12-28 Nanya Technology Corporation Testing fixture and testing assembly
CN112630480B (zh) * 2020-07-01 2022-08-16 强一半导体（苏州）有限公司 一种具有侧出气孔的功率器件高温高压测试用探针卡
KR102769691B1 (ko) * 2022-10-25 2025-02-19 주식회사 엔티에스 플로팅플레이트 및 이를 포함하는 반도체 테스트 장치

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6165174A (ja) * 1984-09-06 1986-04-03 Hitachi Electronics Eng Co Ltd 電子部品加熱装置
JPS6165173A (ja) * 1984-09-06 1986-04-03 Hitachi Electronics Eng Co Ltd 電子部品検査用ソケツト
JP2000284020A (ja) * 1999-03-30 2000-10-13 Seiko Epson Corp 半導体装置検査装置用ソケット
JP2001051017A (ja) * 1999-08-16 2001-02-23 Nec Corp 半導体装置測定用ソケット及びそれを用いた測定方法
JP2002107377A (ja) 2000-09-28 2002-04-10 Nhk Spring Co Ltd 可動ガイドプレート付き導電性接触子
JP2002236140A (ja) * 2000-12-07 2002-08-23 Advantest Corp 電子部品試験用ソケットおよびこれを用いた電子部品試験装置

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US5325052A (en) * 1990-11-30 1994-06-28 Tokyo Electron Yamanashi Limited Probe apparatus
US5500605A (en) * 1993-09-17 1996-03-19 At&T Corp. Electrical test apparatus and method
JPH11145215A (ja) * 1997-11-11 1999-05-28 Mitsubishi Electric Corp 半導体検査装置およびその制御方法
US6208155B1 (en) * 1998-01-27 2001-03-27 Cerprobe Corporation Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit device
US6220870B1 (en) * 1998-02-27 2001-04-24 Cerprobe Corporation IC chip socket and method
JPH11287842A (ja) * 1998-04-02 1999-10-19 Advantest Corp Ｉｃ試験装置
US6292003B1 (en) * 1998-07-01 2001-09-18 Xilinx, Inc. Apparatus and method for testing chip scale package integrated circuits
SG98373A1 (en) * 1998-11-25 2003-09-19 Advantest Corp Device testing apparatus
US6998857B2 (en) 2001-09-20 2006-02-14 Yamaha Corporation Probe unit and its manufacture
JP4365066B2 (ja) * 2002-04-11 2009-11-18 株式会社エンプラス 電気部品用ソケット
KR200405297Y1 (ko) 2002-06-05 2006-01-10 야마하 가부시키가이샤 프로브 유닛
JP4886997B2 (ja) * 2005-04-06 2012-02-29 株式会社エンプラス 電気部品用ソケット

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6165174A (ja) * 1984-09-06 1986-04-03 Hitachi Electronics Eng Co Ltd 電子部品加熱装置
JPS6165173A (ja) * 1984-09-06 1986-04-03 Hitachi Electronics Eng Co Ltd 電子部品検査用ソケツト
JP2000284020A (ja) * 1999-03-30 2000-10-13 Seiko Epson Corp 半導体装置検査装置用ソケット
JP2001051017A (ja) * 1999-08-16 2001-02-23 Nec Corp 半導体装置測定用ソケット及びそれを用いた測定方法
JP2002107377A (ja) 2000-09-28 2002-04-10 Nhk Spring Co Ltd 可動ガイドプレート付き導電性接触子
JP2002236140A (ja) * 2000-12-07 2002-08-23 Advantest Corp 電子部品試験用ソケットおよびこれを用いた電子部品試験装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2138852A4

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009258100A (ja) * 2008-03-28 2009-11-05 Panasonic Corp 導電性接触子および半導体検査装置
EP2360482A4 (en) * 2008-11-26 2014-05-28 Nhk Spring Co Ltd BASIC ELEMENT FOR A PROBE UNIT AND PROBE UNIT
JPWO2013051099A1 (ja) * 2011-10-04 2015-03-30 富士通株式会社 試験用治具及び半導体装置の試験方法
WO2023084612A1 (ja) * 2021-11-09 2023-05-19 株式会社アドバンテスト 温度調整装置及び電子部品試験装置
TWI852121B (zh) * 2021-11-09 2024-08-11 日商阿德潘鐵斯特股份有限公司 溫度調整裝置以及電子元件測試裝置
JP2024040236A (ja) * 2023-06-09 2024-03-25 穎▲うぇい▼科技股▲ふん▼有限公司 テストソケット

Also Published As

Publication number Publication date
US8096840B2 (en) 2012-01-17
JPWO2008123608A1 (ja) 2010-07-15
EP2138852A1 (en) 2009-12-30
US20100184306A1 (en) 2010-07-22
TWI380021B (ja) 2012-12-21
TW200907350A (en) 2009-02-16
KR20090130304A (ko) 2009-12-22
KR101093044B1 (ko) 2011-12-13
EP2138852A4 (en) 2017-08-30
JP5490529B2 (ja) 2014-05-14

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