WO2006057385A1 - 感光性樹脂組成物、永久レジスト用感光性フィルム、レジストパターンの形成方法、プリント配線板及び半導体素子 - Google Patents
感光性樹脂組成物、永久レジスト用感光性フィルム、レジストパターンの形成方法、プリント配線板及び半導体素子 Download PDFInfo
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- WO2006057385A1 WO2006057385A1 PCT/JP2005/021796 JP2005021796W WO2006057385A1 WO 2006057385 A1 WO2006057385 A1 WO 2006057385A1 JP 2005021796 W JP2005021796 W JP 2005021796W WO 2006057385 A1 WO2006057385 A1 WO 2006057385A1
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- JYIZNFVTKLARKT-UHFFFAOYSA-N phenol;1,3,5-triazine-2,4,6-triamine Chemical compound OC1=CC=CC=C1.NC1=NC(N)=NC(N)=N1 JYIZNFVTKLARKT-UHFFFAOYSA-N 0.000 description 1
- 229950000688 phenothiazine Drugs 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- XNGIFLGASWRNHJ-UHFFFAOYSA-L phthalate(2-) Chemical compound [O-]C(=O)C1=CC=CC=C1C([O-])=O XNGIFLGASWRNHJ-UHFFFAOYSA-L 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 238000011417 postcuring Methods 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 description 1
- 229940116423 propylene glycol diacetate Drugs 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 230000009919 sequestration Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 239000012453 solvate Substances 0.000 description 1
- 239000001384 succinic acid Substances 0.000 description 1
- 229940014800 succinic anhydride Drugs 0.000 description 1
- 239000012970 tertiary amine catalyst Substances 0.000 description 1
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 1
- 239000013008 thixotropic agent Substances 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- 125000005628 tolylene group Chemical group 0.000 description 1
- DQFBYFPFKXHELB-VAWYXSNFSA-N trans-chalcone Chemical compound C=1C=CC=CC=1C(=O)\C=C\C1=CC=CC=C1 DQFBYFPFKXHELB-VAWYXSNFSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 150000003852 triazoles Chemical class 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- SRPWOOOHEPICQU-UHFFFAOYSA-N trimellitic anhydride Chemical compound OC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 SRPWOOOHEPICQU-UHFFFAOYSA-N 0.000 description 1
- BSVBQGMMJUBVOD-UHFFFAOYSA-N trisodium borate Chemical compound [Na+].[Na+].[Na+].[O-]B([O-])[O-] BSVBQGMMJUBVOD-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/031—Organic compounds not covered by group G03F7/029
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/285—Permanent coating compositions
- H05K3/287—Photosensitive compositions
Definitions
- Photosensitive resin composition photosensitive film for permanent resist, method for forming resist pattern, printed wiring board, and semiconductor element
- the present invention relates to a photosensitive resin composition, a photosensitive film for permanent resist, a method for forming a resist pattern, a printed wiring board, and a semiconductor element.
- halogen-free products that do not contain halogen atoms, which are considered to be the cause of dioxin generation, have a total halogen atom content of 1500 ppm or less, and one type of halogen. It must be 900 ppm or less per atom.
- a photopolymerization initiator having no halogen atom and excellent surface curability such as 2 methyl 1 [4 (methylthio) phenol] 2 morpholinopropane 1 on (1-907) and 2 Benzyl 1-methylamino 1- (4 morpholinophenol) 1-butano N-1 (I 369) is widely used as a material for photosensitive permanent resists and solder resists.
- Patent Document 1 a sensitizer (photopolymerization initiator) is intended to provide a visible light-sensitive composition containing a novel sensitizer that exhibits high sensitivity to light in the visible light region.
- a photosensitive composition using a titanocene compound having a large absorption wavelength in the vicinity of 405 nm has been proposed.
- Patent Document 1 Japanese Patent Laid-Open No. 3-223759
- the present invention has been made in view of the above circumstances, and even if a component such as a photopolymerization initiator does not have a halogen atom, it has sufficiently high fluorescence sensitivity and sufficiently high! It is an object of the present invention to provide a photosensitive resin composition that can satisfy both of the resolution simultaneously and has a cured product with sufficiently excellent solder heat resistance. Moreover, it aims at providing the photosensitive film for permanent resists using such a photosensitive resin composition, the formation method of a resist pattern, a printed wiring board, and a semiconductor element.
- the photosensitive resin composition of the present invention that achieves the above object comprises (A) a polymer having a carboxyl group (hereinafter also referred to as “component A”), (B) a hexoxide having no halogen atom.
- component A a polymer having a carboxyl group
- component B a hexoxide having no halogen atom.
- B component a polymer having a carboxyl group
- B component a hexoxide having no halogen atom.
- B component a hexoxide having no halogen atom.
- B component Hydrogen donating compound
- C component D Acrylic or methacrylic group And a photopolymerizable compound
- the photosensitive resin composition of the present invention exhibits sufficiently excellent photosensitivity.
- the inventors of the present invention coexisted a hexaarylbiimidazole compound having no halogen atom and a hydrogen donating compound.
- One of the main factors is the excellent photo-responsiveness that can be achieved when it is stored.
- the photosensitive resin composition of the present invention exhibits sufficiently excellent resolution.
- the present inventors consider as one of the main factors that the photoreactivity described above and the light absorption at the exposure wavelength of the hexaarylbiimidazole compound that does not have a norogen atom are small. ing.
- the photosensitive resin composition of the present invention exhibits sufficiently excellent solder heat resistance.
- the present inventors consider as one of the main factors that the photosensitive resin composition contains a thermosetting compound to improve adhesion with the underlayer.
- the photosensitive resin composition of the present invention contains all the components (A) to (D) described above, and is combined with the action of each component and the combination of each component. Based on the action, the present inventors presume that the object of the present invention can be achieved. Therefore, this photosensitive resin composition is sufficiently high in photosensitivity, sufficiently high in resolution, and sufficiently excellent in heat resistance even when a hexaarylbiimidazole compound having no halogen atom is used. Can be satisfied at the same time.
- E a heat capable of a thermosetting reaction at 140 to 200 ° C. It is preferable to further contain a curable compound (hereinafter also referred to as “E component”).
- the B component contains the following general formulas (1), (2), (3 ) And Z or a compound represented by (4) is preferred.
- R 2 and R 3 are each independently a hydrogen atom, an alkyl group, a methoxy group, an ethoxy group, a nitro group, an amino group, a hydroxy group, a dialkylamino group, a group represented by the following general formula (5), 1 group or atom selected from the group consisting of the group represented by formula (6) and a phenyl group
- R 4 represents an alkyl group
- two R 5 s each independently represent an alkyl group.
- R ⁇ R 2 and the alkyl group R 3 represents independently a methyl group, Echiru group, propyl group, butyl group, even also Yogu methyl group an amyl group or a hexyl group Good.
- the two alkyl groups in the dialkylamino group are each independently a methyl group or an ethyl group, which may be a methyl group, an ethyl group, a propyl group, a butyl group, an amyl group, or a hexyl group.
- R 4 may be a methyl group, an ethyl group, a propyl group, a butyl group, an amyl group, or a hexyl group, or may be a methyl group.
- R 5 may be a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, an amyl group, or a hexyl group, or a methyl group.
- the hexahexylbiimidazole compound having no halogen atom is represented by the above general formulas (1) and Z or (2).
- R 1 is an alkyl group, a methoxy group, an ethoxy group, a nitro group, an amino group, a hydroxy group, a dialkylamino group, a group represented by the above general formula (5)
- the above general formula ( 6) represents a group selected from the group consisting of a group represented by 6) and a phenyl group
- R 2 and R 3 each represent a hydrogen atom.
- Sarako is a compound represented by the above general formula (3) and Z or (4) in the photosensitive resin composition of the present invention, wherein the hexaarylbiimidazole compound having no halogen atom is represented by the above formula (3).
- R 2 and R 3 may each represent a hydrogen atom.
- the component A preferably has two or more photopolymerizable unsaturated double bonds in one molecule. According to this, when a cured product is formed on a substrate using the photosensitive resin composition of the present invention, it is possible to improve the adhesion with the substrate and greatly reduce the peeling of the cured product against the substrate. It becomes.
- the E component is one or more selected from a block isocyanate, an epoxy compound having two or more glycidyl groups in one molecule, bismaleimide, and oxetane. It is preferable that the compound is included. Thereby, a tough cured product having a high crosslinking density can be obtained.
- the E component is more preferably one containing one or more compounds selected from a block isocyanate, a bismaleimide compound and an oxetane compound, and one or more compounds selected from a block isocyanate and a bismaleimide force. More preferably, Powerful compounds are There is a tendency that the stability of the oil varnish or the photosensitive film is improved.
- an LDI (Lazer Direct Imaging) method in which a circuit pattern created by CAD without using a mask is directly drawn on a resist layer with a laser beam has attracted attention.
- a photomask is not necessary, and therefore, it is possible to efficiently produce a smaller variety of electronic parts than in the past.
- the mask alignment on the substrate and the management of adhesion, dirt, and scratches on the mask, which had been caused by the use of conventional photomasks, can be omitted, resulting in significant cost savings. Scaling correction can also be performed easily compared to mask exposure.
- DLP Digital Light Processing
- This DLP technology enables higher resolution and lower cost of the apparatus, but a laser beam with a wavelength of 405 nm (h line) is an essential requirement because of the mirror life of the exposure apparatus.
- the space of the apparatus can be saved as compared with a gas laser or the like, and a cooling device is also unnecessary.
- the resist material that is exposed to this laser beam can be handled in a yellow light (yellow lamp) environment, so that the working environment can be improved and the work can be simplified.
- a hexarylbiimidazole compound having no halogen atom as a photopolymerization initiator (component B) was employed, and the above-mentioned one was further contained as a thermosetting compound (component E).
- the photosensitive resin composition of the present invention tends to be hard to be cured even when exposed to a yellow lamp, and tends to be more stable than the conventional one.
- One of the factors is that the powerful photosensitive resin composition reacts selectively by irradiation with a laser beam having a wavelength of about 405 nm, is closer to visible light, and hardly reacts to light having a wavelength. Is inferred.
- the photosensitive resin composition of the present invention may further contain (F) a sensitizer that absorbs light having a wavelength range of 350 to 430 nm and exhibits a sensitizing action.
- the photosensitive resin composition of the present invention further comprises (G) an inorganic and Z or organic filler.
- G an inorganic and Z or organic filler.
- the photosensitive film for permanent resist of the present invention is characterized by comprising a support and a photosensitive layer containing the above-described photosensitive resin composition formed on the support.
- This photosensitive film for permanent resist may further comprise a peelable cover film on the photosensitive layer for permanent resist.
- the resist pattern forming method of the present invention includes an insulating substrate, a conductor layer having a circuit pattern formed on the insulating substrate, and a permanent resist layer formed on the insulating substrate so as to cover the conductor layer. And a permanent resist layer strength comprising a cured product of the above-described photosensitive resin composition, and the permanent resist layer has an opening so that a part of the conductor layer is exposed. It is characterized by having.
- the actinic ray is preferably a laser beam having a maximum wavelength in the range of 390 nm or more and less than 440 nm. This makes it possible to perform exposure using the LDI method using DLP technology.
- a printed wiring board of the present invention comprises an insulating substrate, a conductor layer having a circuit pattern formed on the insulating substrate, and a permanent resist layer formed on the insulating substrate so as to cover the conductor layer.
- a printed wiring board provided with a permanent resist layer comprising a cured product of the above-described photosensitive resin composition, and the permanent resist layer has an opening so that a part of the conductor layer is exposed. It is characterized by that.
- a semiconductor element of the present invention includes an insulating substrate and a circuit pattern formed on the insulating substrate.
- a semiconductor element comprising a conductive layer having a permanent resist layer formed on an insulating substrate so as to cover the conductive layer, the permanent resist layer strength comprising a cured product of the above-described photosensitive resin composition
- the permanent resist layer has an opening so that a part of the conductor layer is exposed.
- FIG. 1 is a schematic cross-sectional view showing one embodiment of a photosensitive film for permanent resist.
- FIG. 2 is a schematic cross-sectional view showing an embodiment of a printed wiring board.
- FIG. 3 is a process diagram showing a method for manufacturing the printed wiring board 2 shown in FIG. 2.
- the photosensitive resin composition includes (A) a polymer having a carboxyl group (hereinafter also referred to as “component A”), (B) hexaarylbiimidazole. A compound (hereinafter also referred to as “component B”), (C) a hydrogen-donating compound (hereinafter also referred to as “component C”), and (D) a photopolymerizable combination having an acryl group or a methacryl group. Product (hereinafter also referred to as “component D”).
- component D a polymer having a carboxyl group
- the component A is not particularly limited as long as it is a polymer having one or more carboxyl groups in one molecule, but from the viewpoint of good fluidity and alkali developability, the weight average molecular weight (Mw) force should be 5000-200000.
- the force S is preferably 10,000 to 150000, more preferably the force S, and more preferably 2000 to 100,000.
- Mw is less than 5000, good fluidity is hardly obtained, and it tends to be difficult to form a photosensitive layer described later.
- Mw exceeds 200,000 alkali developability becomes insufficient, and the resolution tends to decrease when used as a resist material.
- component A examples include, for example, (meth) acrylic polymer having a carboxyl group, phenoxy polymer having a strong carboxy group, and the like.
- a (meth) acrylic polymer having a carboxyl group is obtained by copolymerization of a bull polymerizable monomer having a carboxyl group and a bull polymerizable monomer having a molecular structure different from that of the monomer and capable of polymerizing with the monomer. What is obtained is preferred.
- Examples of the butyl polymerizable monomer having a carboxyl group include acrylic acid, metathalic acid, fumaric acid, cinnamic acid, crotonic acid, and itaconic acid.
- Examples of vinyl polymerizable monomers that can be polymerized with a vinyl polymerizable monomer having a carboxyl group include methyl (meth) acrylate, ethyl (meth) acrylate, n-propyl (meth) acrylate, butyl ( (Meth) acrylate, lauryl (meth) acrylate, 2-ethyl hexyl (meth) acrylate, butyltoluene, N-vinyl pyrrolidone, styrene, a-methyl styrene, 2-hydroxyethyl (meth) acrylate, Examples include acrylamide, acrylonitrile, dimethylaminoethyl (meth) acrylate.
- the (meth) acrylic polymer having a carboxyl group is an organic solvent containing these monomers. It can be obtained by general solution polymerization using a polymerization initiator such as azobisisobutyrate-tolyl, azobisdimethylvale-tolyl, or benzoyl peroxide.
- a polymerization initiator such as azobisisobutyrate-tolyl, azobisdimethylvale-tolyl, or benzoyl peroxide.
- the component A may be a photosensitive prepolymer having a carboxyl group! /.
- a photosensitive prepolymer a prepolymer obtained by adding a saturated or unsaturated polybasic acid anhydride to an ester obtained by reacting an epoxy compound and an unsaturated monocarboxylic acid is preferably used.
- ZFR-1185, ZAR-1035, TCR-1091, CCR-1115, PCR-1090, PCR-1150 (above, Nippon Kayaku Co., Ltd.) Product name).
- the epoxy compound for example, a bisphenol type epoxy compound obtained by reacting bisphenol A or bisphenol F with epichlorohydrin is preferable.
- Preferred specific examples of such an epoxy compound include, for example, bisphenol A type, bisphenol F type such as GY—260, GY—255, and XB—2615 (above, manufactured by Chinoku Gaigi Co., Ltd.).
- Examples include hydrogenated bisphenol A type, amino group-containing, alicyclic or polybutadiene-modified epoxy compounds.
- novolak-type epoxy compounds examples include YDCN-701, YDCN-704, YDPN-638, YDPN-602 (above, manufactured by Tohto Kasei Co., Ltd., trade name), DEN-431, DEN-439 (above, Dow Chemical Company) Product name), EPN— 1299 (Chinoku, manufactured by Gaigi, product name;), N— 730, N— 770, N— 865, N— 665, N— 673, VH— 4150, VH — 4240 ( As mentioned above, Dainippon Ink & Chemicals, Inc., trade name), EOCN-120, BREN (Nippon Gyaku, trade name), and the like.
- Epicourt 828, Epicourt 1007, Epicourt 807 (above, made by Japan Epoxy Resin Co., Ltd., trade name), Epiclon 840, Epicron 860, Epiclon 3050 (above, Dainippon Ink & Chemicals, trade name), DER—330, DER—337, DER—361 (above, Dow Chemical Co., trade name), Celoxide 2021 (Daicel Seogyo Kogyo) (Trade name), TETRAD—X, TETRAD—C (Mitsubishi Gas Chemical Co., Ltd., trade name), EPB-13, EPB-27 (Nippon Soda Co., Ltd., trade name), or JP-A-8 — Polyamides and polyamide-imide type epoxy compounds described in Japanese Patent No. 260008 can also be used.
- the epoxy compound according to the present embodiment can be used as a block copolymer obtained by normal copolymerization, one kind alone or a mixture of two or more kinds, or two or more kinds. .
- Examples of the unsaturated monocarboxylic acid include (meth) acrylic acid; crotonic acid; kaycin acid; saturated or unsaturated dicarboxylic acid and (meth) acrylate having one hydroxyl group in one molecule. Or a monocarboxylic acid obtained by reacting with an unsaturated monoglycidyl compound; reacting a saturated or unsaturated polyvalent carboxylic acid anhydride with a (meth) atrelate having one hydroxyl group in one molecule Or a monocarboxylic acid obtained by reacting a saturated or unsaturated dicarboxylic acid with an unsaturated monoglycidyl compound, and a saturated or unsaturated polycarboxylic acid anhydride. And monocarboxylic acid obtained by reacting with.
- phthalic acid tetrahydrophthalic acid, hexahydrophthalic acid, maleic acid or succinic acid
- hydroxyethyl (meth) acrylate hydroxypropyl (meth) acrylate
- tris Monocarboxylic acid force obtained by reacting (hydroxyethyl) isocyanurate di (meth) acrylate or glycidyl (meth) acrylate in an equimolar ratio by a conventional method. It is done.
- These unsaturated monocarboxylic acids can be used singly or in combination of two or more.
- acrylic acid is preferably used from the viewpoint of good photopolymerizability and heat resistance.
- the saturated or unsaturated polybasic acid anhydride is preferably a polycarboxylic acid anhydride, specifically, phthalic acid, tetrahydrophthalic acid, hexahydrophthalic acid, maleic acid, succinic acid. And anhydrides such as trimellitic acid.
- a polycarboxylic acid anhydride specifically, phthalic acid, tetrahydrophthalic acid, hexahydrophthalic acid, maleic acid, succinic acid.
- anhydrides such as trimellitic acid.
- Examples of the phenoxy polymer having a carboxyl group include those having the oxyphenylene group in the main chain and the carboxyl group in the side chain among the above-mentioned polymers.
- a photopolymerizable unsaturated double bond that is, a polymer having two or more unsaturated double bonds that can be polymerized by light or a photopolymerization initiator is used as the polymer.
- a photopolymerizable unsaturated double bond that is, a polymer having two or more unsaturated double bonds that can be polymerized by light or a photopolymerization initiator is used as the polymer.
- Examples of such an unsaturated double bond or a group or compound having an unsaturated double bond include an ethylenically unsaturated double bond (ethylene group), a furfuryl acrylate group, a maleimide group, an acetylene group, a key. Cinnamic acid and the like.
- an ester bond was formed in the molecule by polymerization reaction of diglycidyl ether type epoxy compound with dibasic acid in the presence of a tertiary amine catalyst having a pKa of 9.0 or less as component A.
- An acid-modified polyester resin containing a carboxyl group, obtained by adding an acid anhydride to an intermediate having a chain structure, may be used.
- the acid-modified polyester resin containing the carboxyl group As the component A, it is preferable to use the acid-modified polyester resin containing the carboxyl group as the component A.
- the cured product of the photosensitive resin composition has good solubility in an alkali developer and improved crack resistance.
- one of the factors that improve the reliability such as solubility in alkali developer and crack resistance is considered as follows. However, the factor is not limited to this.
- the intermediate of the acid-modified polyester resin containing the carboxyl group has a pKa of 9.0 or less as a catalyst at the time of production, that is, at the polymerization reaction of the diglycidyl ether type epoxy compound and the dibasic acid. Since the tertiary amine is used, the polymer has a structure with little branching. Then, since the intermediate has a linear structure, when an acid anhydride is attached, a carboxyl group is easily introduced uniformly into the intermediate molecule. From this, it is speculated that the above effect can be obtained.
- the weight average molecular weight (Mw) of the acid-modified polyester resin is preferably 20000 to 70000, more preferably 30000 to 50000!
- a method for producing an acid-modified polyester resin includes a step of obtaining an intermediate by a polymerization reaction between a diglycidyl ether type epoxy compound having two glycidyl groups in one molecule and a dibasic acid, A step of obtaining an acid-modified polyester resin by adding an acid anhydride to the intermediate.
- the diglycidyl ether type epoxy compound used as a raw material is not particularly limited, but it is preferable to have one or more phenoxy groups in one molecule, and two or more phenoxy in one molecule. More preferred to have a group.
- Examples of the epoxy compound include bisphenol A type epoxy resin such as bisphenol A diglycidyl ether, bisphenol F type epoxy resin such as bisphenol F diglycidyl ether, and bisphenol S diglycidyl ether.
- Bisphenol type epoxy resin such as S-type epoxy resin, biphenol diglycidyl ether, bixylenol type epoxy resin, such as bixylenol diglycidyl ether, hydrogenated bisphenol A, hydrogenated bisphenol A, such as glycidyl ether Type epoxy resin or dibasic acid-modified diglycidyl ether type epoxy resin.
- bisphenol A type epoxy resin is preferable because it is excellent in heat resistance and chemical resistance and does not relatively shrink due to curing. These may be used alone or in combination of two or more.
- Examples of bisphenol S diglycidyl ether include EBPS-200 (trade name, manufactured by Nippon Kayaku Co., Ltd.) and Epiclone EXA-1514 (trade name, manufactured by Dainippon Ink & Chemicals, Inc.).
- Examples of biphenol diglycidyl ether include YL-6121 (trade name, manufactured by Japan Epoxy Resin Co., Ltd.).
- Examples of the bixylenol diglycidyl ether include YX-4000 (trade name, manufactured by Japan Epoxy Resin Co., Ltd.).
- Hydrogenated bi Examples of sufenol A glycidyl ether include ST-2004, ST-2007 (above, manufactured by Toto Kasei Co., Ltd., trade name).
- Examples of the dibasic acid-modified diglycidyl ether type epoxy resin include ST-5100, ST-5080 (above, trade name, manufactured by Tohto Kasei Co., Ltd.) and the like.
- the dibasic acid used as a raw material is preferably a dicarboxylic acid.
- a dicarboxylic acid for example, maleic acid, succinic acid, phthalic acid, tetrahydrophthalic acid, methyltetrahydrophthalic acid, hexahydrophthalic acid, methylhexahydrophthalic acid, endomethylenetetrahydrophthalic acid or methylendomethylenetetrahydrophthalic acid.
- An acid etc. are mentioned.
- the dibasic acid is more preferably tetrahydrophthalic acid. These may be used alone or in combination of two or more.
- the catalyst used in the polymerization reaction of the diglycidyl ether-type epoxy compound and the dibasic acid is a tertiary amine having a pKa of 9.0 or less, and a tertiary having a pKa of 7.3 or less. Amine is preferred.
- a tertiary amine having a pKa of more than 9.0 or a phosphine such as triphenylphosphine is used as a catalyst, the resulting acid-modified polyester resin has a bond type (ether type network bond and Z or ester-type network bonds) lead to a polymer having many branched chains, and thus tends to gel and immediately develop.
- the amount of the catalyst used is a diglycidyl ether type epoxy resin from the viewpoints of the polymerization reaction rate and the heat resistance, electric corrosion resistance, insulation, etc. of the cured film obtained from the photosensitive resin composition.
- the total amount of the compound and dibasic acid is preferably 1 to: LO parts by mass with respect to 100 parts by mass.
- the reaction temperature is preferably 100 to 150 ° C from the viewpoint of the polymerization reaction rate and the prevention of the side reaction. /.
- Examples of acid anhydrides for acid modification to be added to the intermediate include maleic anhydride, succinic anhydride, itaconic anhydride, phthalic anhydride, tetrahydrophthalic anhydride, hexahydrophthalic anhydride, methylhexahydro Dibasic acid anhydrides such as phthalic anhydride, endomethylenetetrahydrophthalic anhydride, methylendomethylenetetrahydrophthalic anhydride, chlorendic anhydride, methyltetrahydrophthalic anhydride, trimellitic anhydride, pyromellitic anhydride, benzophenone Aromatic polyhydric carboxylic acid anhydrides such as tetracarboxylic dianhydride and other incidental substances such as 5- (2,5 dioxotetrahydrofuryl) 3-methyl 3 cyclohex And polycarboxylic acid anhydride derivatives such as sen 1,2-dicarboxylic acid anhydride.
- the reaction temperature in the addition reaction between the intermediate and the acid anhydride is preferably 80 to 130 ° C from the viewpoint of the reaction rate and the prevention of side reactions.
- the acid value of the component A is preferably 30 to 250 mg KOHZg, more preferably 50 to 150 mg KOHZg, considering the balance of properties such as alkali developability and electrical properties.
- the acid value of the solid content contained in the photosensitive resin composition of the present embodiment is preferably adjusted to 10 to 120 mgKOH / g from the same viewpoint! It is preferably adjusted to 20 to 80 mgKOHZg. It is more preferable.
- the component B is not particularly limited as long as it is a hexaarylbimidazolyl compound that is a dimer of a triarylimidazole compound and does not have a halogen atom in the molecule.
- the compounds represented by the general formulas (1) to (4) function more sufficiently as a photopolymerization initiator of the photosensitive resin composition.
- R 1 R 2 and R 3 are each independently an alkyl group, a methoxy group, an ethoxy group, a nitro group, an amino group, a hydroxy group, a dialkylamino group, A group represented by the general formula (5), a group represented by the general formula (6), a phenyl group, and one group or atom selected from the group consisting of hydrogen and nuclear power.
- R 4 represents an alkyl group
- two R 5 each independently represents an alkyl group.
- the alkyl group independently represented by RR 2 and R 3 is not particularly limited, and examples thereof include a methyl group, an ethyl group, a propyl group, a butyl group, an amyl group, and a hexyl group.
- a methyl group that is relatively inexpensive to obtain may be used.
- the two alkyl groups in dialkylamino are each independently a methyl group, an ethyl group, a propyl group, a butyl group, an amyl group or a hexyl group, or a methyl group or It may be an ethyl group.
- R 4 is a methyl group, Echiru group, propyl group, butyl group, may be filed in amyl group or a hexyl group may be a methyl group.
- R 5 may be a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, an amyl group, or a hexyl group, or a methyl group.
- R 1 is an alkyl group, Methoxy group, ethoxy group, nitro group, amino group, hydroxy group, dialkylamino group, group represented by the above general formula (5), group represented by the above general formula (6), and phenyl group power
- R 2 and R 3 may each represent a hydrogen atom!
- R 2 and R 3 may each represent a hydrogen atom.
- the atom or group represented by R 1 is not particularly limited as long as it is as described above, and examples thereof include a hydrogen atom, a methyl group, a methoxy group, an ethoxy group, a -COOCH group, and a -tro group.
- the group represented by R 2 is not particularly limited as long as it is as described above, and examples thereof include a hydrogen atom and a methoxy group.
- the group represented by R 3 is not particularly limited as long as it is as described above, and examples thereof include a hydrogen atom and a methoxy group.
- hexarylbiimidazole compounds having no halogen atom include 2, 2'-bis (2-methylphenol) 1, 4, 4 ', 5, 5 , 1 tetraphenyl 1, 1, 1'-biimidazole 2, 2, 1 bis (2-methoxyphenol) 1, 4, 4, 5, 5, 1 tetraphenyl — 1, 1, 1 biimidazole, 2, 2, 1-bis (2 ethoxy file) 1, 4, 4, 5, 5, 1 teraph 1,2-biimidazole, 2, 2, -bis (2-methyl ester) — 4, 4, 5, 5, 5, 1 tetraphenyl 1, 1, 1 biimidazole, 2, 2, 1 bis (2-trope) — 4, 4, 5, 5, 5, 5, -Lu-1, 1, -biimidazole, 2- (1-Naphtyl) -4,5 Diphenyl- 1,2, -biimidazole, 2,2,1-bis (2,3,4-trimethoxyphenol) 4, 4, 5, 5, 5, 1 tetra
- the hydrogen donating compound of component C is not particularly limited as long as it is a compound that can donate hydrogen to a photopolymerization initiator that has been photoexcited or a compound that can donate hydrogen to a radical that has generated photopolymerization initiator power.
- it may be disclosed as “photooxidant” in US Pat. No. 3,390,996.
- component C include alkanolamines such as triethanolamine and methyljetanolamine; 2-dimethylaminoethylbenzoic acid, 4-dimethylaminobenzoic acid ethyl, 4-dimethylaminobenzoic acid isobutyl, 4,4 dimethylaminobenzophenone And thiol compounds such as 2-mercaptobenzothiazole, 2-mercaptobenzoimidazole, and 2-mercaptobenzoxazole.
- alkanolamines such as triethanolamine and methyljetanolamine
- 2-dimethylaminoethylbenzoic acid 4-dimethylaminobenzoic acid ethyl
- 4-dimethylaminobenzoic acid isobutyl 4-4 dimethylaminobenzophenone
- thiol compounds such as 2-mercaptobenzothiazole, 2-mercaptobenzoimidazole, and 2-mercaptobenzoxazole.
- a leuco dye can also be used as the hydrogen-donating compound, and by adjusting the blending amount of the leuco dye in the photosensitive resin composition, the degree of cure of the entire resist layer can be increased. Can be improved.
- leuco dyes leuco crystal violet, N-phenol glycine, N— (p cyanophyl) glycine, N— (p-methylphenol) glycine, Arylglycine compounds such as N-butyl-N-felglycine, N-ethyl N-felglycine, N-propyl-one N-felglycine, N-propyne-N-felglycine, N-methyl-N-felglycine, or mercapto Benzoxazole, mercaptobenzothiazole, mercaptobenzoimidazole, 2, 5 mercapto 1, 3, 4 thiadiazole, 1-phenol 5 mercapto 1H-tetrazole, 5-
- the component D is not particularly limited as long as it is a photopolymerizable polymer having an acryl group or a methacryl group, and can be variously selected depending on required properties.
- the photopolymerizable compound having an acryl group or a methacryl group include 2-hydroxyethyl (meth) acrylate, trimethylol propane tri (meth) acrylate, pentaerythritol tri (meth) acrylate, and dipentaerythritol.
- These photopolymerizable compounds having an acrylic group or a methacryl group can be used singly or in combination of two or more.
- thermosetting compound capable of thermosetting reaction at 140 to 200 ° C. (Hereinafter, also referred to as “E component”).
- the E component is not particularly limited as long as it is a thermosetting compound capable of a thermosetting reaction at 140 to 200 ° C.
- a thermosetting compound for example, a block isocyanate compound, an epoxy compound, a bismaleimide compound, an oxetane capable of a thermosetting reaction at 140 to 200 ° C.
- examples thereof include compounds, benzoxazine compounds and melamine fats.
- block isocyanate compound epoxy compound having two or more glycidyl groups in one molecule Products
- bismaleimide compounds and oxetane compounds One or more compounds selected by block isocyanate compounds, bismaleimide compounds and oxetane compounds are also selected.
- One or more compounds are a resin varnish or a photosensitive film. The viewpoint power such as stability is also preferred.
- the block isocyanate compound is a compound that is generated by the reaction of the isocyanate compound and the blocking agent, and is temporarily inactivated by a group derived from the blocking agent. When heated, the group derived from the blocking agent dissociates to form an isocyanate group.
- isocyanate compounds that can react with blocking agents include 4,4'-diphenylmethane diisocyanate, 2,4 tolylene diisocyanate, 2,6 tolylene diisocyanate, naphthalene 1,5 diisocyanate.
- Examples of the blocking agent include active methylene compounds, diketone compounds, oxime compounds, phenol compounds, alkane compounds, and prolactam compounds that preferably have active hydrogen. Specifically, methyl ethyl ketone oxime, epsilon prolactam, etc. can be used.
- Block isocyanate compounds may be commercially available. For example, Sumidur BL — 3175, BL — 4165, BL — 1100, BL — 1265, Desmodur TPLS — 2957, ⁇ PLS-2062, TPLS -2957, TPLS— 2078, TPLS— 2117, Desmotherm 217 0, Desmotherm 2265 (above, Sumitomo Bayer Urethane, trade name), Coronate 2512, Coronate 2513, Coronate 2520 (above, made by Nippon Polyurethane Industry, trade name) Etc.
- epoxy compound a molecule having two or more glycidyl groups in one molecule is bisphenol ⁇ type, bisphenol F type, biphenyl type, bisphenol S type, phenol monovolak type.
- epoxy compounds such as cresol novolac type, triglycidyl isocyanate type, heterocyclic type, bixylenol type, and tetraglycidyl xylylene ethane type.
- Epoxy Coat 828 is sold as an epoxy compound.
- Examples of the oxetane compound include those having two or more oxetane rings in one molecule. Specific examples thereof include the Alonoxetane series (trade name, manufactured by Toagosei Co., Ltd.), Examples include the Nacole oxetane series (trade name, manufactured by Ube Industries). In the case of using an oxetane compound, since the reactivity is low, a curing catalyst such as triphenylphosphine may be used.
- the bismaleimide compound may be a compound having two or more maleimide groups in the molecule, for example, a compound represented by the following general formula (7).
- R 4 represents an alkylene group, an arylene group, or a divalent group containing an alkylene group and an arylene group.
- alkylene group an alkylene group having 1 to 10 carbon atoms is preferable, and an alkylene group having 1 to 6 carbon atoms is more preferable! /.
- arylene group an arylene group having 6 to 16 carbon atoms, which is preferably an arylene group having 6 to 20 carbon atoms, is more preferable.
- divalent group containing an alkylene group and an arylene group those represented by the following general formula (8) or (9) are preferable.
- R 9 and R 1C each independently represents an alkyl group
- R 7 , R 8 , 1 , R 12 , R 13 and R 14 each independently represents an alkyl group or a halogen atom.
- N, m, o, p, q and r each represent an integer of 1 to 4.
- R 7 , R 8 , R 11 , R 12 , R 13 and R 14 may be the same or different! / But! /
- R 6 , R 9 and R 1C) are an alkyl group
- the alkyl group is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms.
- bismaleimide compounds include 1-methyl-2,4 bismaleimidebenzene, N, N, 1 m phenylene balemaleimide, N, N, 1 p phenylene balemaleimide, N, N, 1 m-toluylene bismaleimide, N, N, 1,4,4, bibiene-lene bismaleimide, N, N'-4,4,-[3,3,1 dimethyl monobiphenyl) bismaleimide, N, N, 1,4,4,-[3,3,1 dimethyldiphenylmethane] bismaleimide, N, N, 1,4,4,-[3,3,1 jetyl diphenylmethane] bismaleimide, N, N, 1 4, 4, 1-diphenylmethane bismaleimide, N, N, 1, 4, 4, — Diphenylpropane bismaleimide, N, N, — 4, 4, — Diphenyl terbismaleimide, N, N, 1,3,1 diphenylsulfone bismaleimide
- These bismaleimide compounds may be synthesized by conventional methods or commercially available products may be used. [0099] Among these bismaleimide compounds, from the viewpoint of further suppressing the generation of harmful substances, compounds having no halogen atom in the molecule are preferable. These can be used alone or in combination of two or more.
- (F) in addition to the above-described components A to D and E, (F); light having a wavelength range of 350 to 430 nm is further added.
- a sensitizer that absorbs and exhibits a sensitizing action hereinafter also referred to as “F component”
- G component an inorganic and / or organic filler (hereinafter also referred to as “G component”). It may contain.
- the F component is not particularly limited as long as it is a sensitizer that absorbs light in the wavelength range of 350 to 430 nm and exhibits a sensitizing action.
- inorganic G and Z or organic fillers are preferred from the viewpoint of cost reduction.
- inorganic fillers for component G include barium sulfate, barium titanate, powdered oxide, amorphous silica, talc, clay, calcined kaolin, magnesium carbonate, calcium carbonate, aluminum oxide, hydroxide ⁇ Inorganic fillers such as aluminum and mica powder.
- organic filler of G component for example, diallyl phthalate, diallyl phthalate prepolymer, acrylic rubber, nitrile rubber (NBR), silicone powder, nylon powder, air outlet gill, opener, benton, montmorillonite, etc. Can be mentioned.
- diallyl phthalate diallyl phthalate prepolymer
- acrylic rubber acrylic rubber
- nitrile rubber NBR
- silicone powder nylon powder
- air outlet gill, opener benton, montmorillonite, etc.
- the photosensitive resin composition of the present embodiment is more preferably 20 to 60% by mass, which is preferably 10 to 70% by mass of the component A with respect to the total amount of the total solid content. 30 to 50% by mass is more preferable. If the blending ratio of component A is less than 10% by mass, the resulting photosensitive resin composition has excessively high fluidity, or the tackiness after drying the photosensitive resin composition is strong. There is a tendency to go down. If the proportion of component A exceeds 70% by mass, the fluidity will be low and the coverage and adhesion of the conductor circuit will decrease, and if used for a photosensitive film, the tack will be low. There is a tendency to crack.
- the photosensitive resin composition of the present embodiment is preferably blended with 1 to 10% by mass of component B with respect to the total amount of the above-mentioned total solid content. 2 to 5% by mass is more preferred, and even more preferred. If the blending ratio of component B is less than 1% by mass, sufficient sensitivity and the desired resist shape tend to be difficult to obtain. If it exceeds 10% by mass, various properties such as solder heat resistance of the resulting cured product are lowered. There is a tendency.
- the blending ratio of component C is 0.1 to 100 parts by mass of the total amount of component B: preferably 1 to 5 parts by mass, more preferably 2 to 4 parts by mass. Part is particularly preferred. If the C component content is less than 0.1 parts by mass, the sensitivity tends to be insufficient and good resolution cannot be obtained. If it exceeds 10 parts by mass, the solder heat resistance tends to decrease.
- the photosensitive resin composition of the present embodiment is preferably blended in an amount of 5 to 40% by mass when the D component is blended in an amount of 1 to 60% by mass with respect to the total amount of the total solid content. More preferably 10 to 30% by mass is added. If the blending ratio of component D is less than 1% by mass, the photopolymerizable bur group concentration in the composition will be low, and the photosensitivity tends to be insufficient in developing solution resistance and the strength of the resulting cured film. If the amount exceeds 60% by mass, the resulting cured product becomes brittle, or the tack after drying the photosensitive resin composition becomes strong.
- the blending ratio of the E component is preferably 1 to 40% by mass with respect to the total amount of the total solid content. It is more preferable that it is 10 to 25% by mass. E component content is less than 1% by mass If this is the case, the resulting cured product becomes brittle, and it becomes difficult to obtain sufficient insulating properties and strength. In addition, when the cured product is formed on the substrate, the adhesion to the substrate tends to decrease. When the proportion of component E exceeds 40% by mass, the crosslinking density becomes too high, and the crack resistance of the resulting cured product tends to decrease.
- the blending ratio of the component F when used as a material for the photosensitive resin composition is not particularly limited, but from the viewpoint of sensitivity and resolution, 0.01 to 5 quality with respect to the total amount of the total solids.
- the amount is preferably 0.05 to 2% by mass, and more preferably 0.1 to 1% by mass. Further, it may be adjusted by the molar absorption coefficient and the molecular weight at a wavelength of 365 nm when i-line exposure is performed.
- the blending ratio of the F component is adjusted so that the dried photosensitive resin composition has an optical density of 0.1 to 1.0. I like it.
- the blending ratio is obtained to such an extent that each function of the photosensitive resin composition according to the present embodiment described above or below is not impaired. From the viewpoint of improving the adhesion, curability and the like with other members of the cured product, it is preferably 70% by mass or less with respect to the total amount of the total solid content.
- the photosensitive resin composition of the present embodiment may contain a photopolymerization initiator different from the component B.
- photopolymerization initiators include radical photopolymerization initiators such as benzophenone, acetophenone, benzoin ether, ketal, acylphosphine oxide, peroxide, and titanocene.
- the photosensitive resin composition of the present embodiment further contains a melamine compound, a triazine compound, or a derivative thereof as an adhesion improver
- the resulting cured product with a metal such as copper is used.
- Adhesion improvers include, for example, melamine, acetateguanamine, benzoguanamine, melamine monophenol monoformalin fat, ethyl diamino-S-triazine, 2,4 diamino-S-triazine, 2,4 diamino-6-xylinole —S-triazine, dicyandiamide, etc. Can be mentioned.
- adhesion improvers examples include 2MZ-AZINE, 2E4MZ-AZINE, C11Z-AZINE, and 2MA-OK (above, manufactured by Shikoku Kasei Kogyo Co., Ltd., trade name).
- These adhesion improvers have the effect of improving the electrical corrosion resistance, not only improving the PCT resistance by enhancing the adhesion between the photosensitive layer and the metal circuit such as copper. From the viewpoint of improving the above-mentioned adhesion to such an extent that other functions of the photosensitive resin composition are not impaired, these adhesion improvers are 0.1 to: LO mass relative to the total amount of the photosensitive resin composition. It is preferred to be formulated with
- the photosensitive resin composition of the present embodiment may further include colorants such as phthalocyanine blue, phthalocyanine green, iodine green, disazo yellow, titanium oxide, carbon black, and naphthalene black as necessary.
- colorants such as phthalocyanine blue, phthalocyanine green, iodine green, disazo yellow, titanium oxide, carbon black, and naphthalene black as necessary.
- Polymerization inhibitors such as hydroquinone, hydroquinone monomethyl ether, tert-butylcatechol, pyrogallol, phenothiazine; thixotropic agents such as benton, montmorillonite, air mouth gill, amide wax; silicone, fluorine, polymer, etc.
- Various additives such as foaming agents; leveling agents; adhesion-imparting agents such as imidazole-based, thiazole-based, triazole-based, and silane coupling agents may be contained.
- the photosensitive resin composition of the present embodiment may be an aliphatic alcohol such as methanol, ethanol, n-propanol, i-propanol, n-butanol, n-pentanol, and hexanol, if necessary.
- Aromatic hydrocarbons such as benzyl alcohol; hydrocarbons such as cyclohexane and toluene; diacetone alcohol, 3-methoxy 1-butanol, acetone, methyl ethyl ketone, methyl propyl ketone, jetyl ketone, methyl isobutyl ketone, methyl pentyl Ketone, methyl hexyl ketone, ethyl butyl ketone, dibutyl ketone, cyclopentanone, cyclohexanone, ⁇ -butyroratatone, 3 hydroxy 2 buta Non, 4-hydroxy-1,2-pentanone, 6-hydroxy-1,2-hexanone, ethylene glycol, diethylene glycol, triethylene glycol, tetraethylene dalycol, propylene glycol, ethylene glycol monoacetate, ethylene glycol Cetate, Propylene glycol monoacetate, Propylene glycol diacetate, Methyl cello nolev,
- the photosensitive resin composition according to a preferred embodiment of the present invention described above has sufficiently high photosensitivity and resolution, and has a wavelength around 405 nm (the maximum wavelength is 390 nm or more and less than 440 nm). It tends to have superior sensitivity and resolution to light (within the range) as compared to conventional ones. Furthermore, the photosensitive layer formed using this photosensitive resin composition tends to be sufficiently excellent in solder heat resistance and resistance to plating such as electroless NiZAu plating. In addition, the photosensitive layer shows sufficiently good results for durability tests such as pressure tacker test (PCT), temperature cycle test (TCT), and super accelerated high temperature and high humidity life test (HAST). .
- PCT pressure tacker test
- TCT temperature cycle test
- HAST super accelerated high temperature and high humidity life test
- the photosensitive resin composition of the present invention can form a cured product such as a solder resist with sufficiently high photosensitivity even if only a component having no halogen atom is used.
- the cured product can be formed with sufficiently high resolution, and further, the solder heat resistance of the cured product can be made sufficiently excellent. Therefore, the photosensitive resin of this embodiment Yarn and synthetic products are excellent from the viewpoint of global environmental conservation because they can sufficiently suppress the generation of halogen-derived harmful substances such as dioxin.
- the photosensitive resin composition of the present invention comprises a rigid and flexible printed wiring board, a solder resist for packages such as BGA, CSP, and TCP, a photosensitive resin coating layer used in a photovia method, or a multilayer
- a solder resist for packages such as BGA, CSP, and TCP
- a photosensitive resin coating layer used in a photovia method or a multilayer
- it can also be used for coating materials such as paint, glass, ceramics, plastics and paper.
- FIG. 1 is a schematic cross-sectional view showing a photosensitive film for permanent resist of this embodiment.
- a photosensitive film 1 for permanent resist shown in FIG. 1 includes a support 11, a photosensitive layer 12 containing the photosensitive resin composition formed on the support, and a cover laminated on the photosensitive layer 12. And Finorem 13.
- the support 11 it is preferable to use a plastic film such as a polyester film such as polyethylene terephthalate, a polyimide film, a polyamideimide film, a polypropylene film, or a polystyrene film.
- a plastic film such as a polyester film such as polyethylene terephthalate, a polyimide film, a polyamideimide film, a polypropylene film, or a polystyrene film.
- the thickness of the support is appropriately selected within the range of 10 to 150 ⁇ m.
- the photosensitive layer 12 contains at least the photosensitive resin composition as a component.
- the thickness is not particularly limited, but the thickness after drying is preferably in the range of 1 to: LOO m.
- Photosensitive layer 12 is a photosensitive resin composition prepared in a solution with a solid content of about 30 to 70% by mass, as a support with a comma coater, blade coater, lip coater, rod coater, squeeze coater, reno coat coater, transfer roll coater, etc. 11 can be applied to a uniform thickness, heated and dried to volatilize the solvent, and formed.
- cover film 13 examples include polyethylene film, polypropylene film, and Teflon.
- the cover film 13 preferably has a lower adhesive strength between the photosensitive layer 12 and the cover film 13 than the adhesive strength between the photosensitive layer 12 and the support 11.
- the peelable cover film 13 for protecting the adhesive surface is stacked and wound.
- the photosensitive layer 12 is stacked on a substrate or a printed wiring board, and a hot roll laminator or the like is used. By bonding, the photosensitive layer 12 can be easily formed on the substrate or the wiring board. Usually, the thickness of the photosensitive layer 12 is appropriately selected within the range of 10 to 150 m with no particular limitation.
- Exposure and development of the formed photosensitive layer 12 can be carried out by conventional methods.
- an ultrahigh pressure mercury lamp or a high pressure mercury lamp can be used as a light source, and imagewise exposure can be performed through a negative mask directly on the photosensitive layer 12 or through a transparent film such as a polyethylene terephthalate film. If a transparent film remains after exposure, peel it off before developing.
- the photosensitive layer 12 can be formed with an image resin film by a printing method, a laser drilling method using a carbon dioxide laser, a YAG laser, an excimer laser, or the like.
- the above-mentioned photosensitive film for permanent resist has sufficiently excellent solder heat resistance, and can satisfy both sufficiently high photosensitivity and sufficiently high resolution.
- This photosensitive film tends to have superior sensitivity and resolution compared to the conventional film even for light having a wavelength of about 400 nm.
- this photosensitive film has a tendency to be sufficiently excellent in resistance to plating such as electroless NiZAu plating.
- this photosensitive film shows sufficiently good results even in durability tests such as pressure tacker test (PCT), temperature cycle test (TCT), and super accelerated high temperature high humidity life test (HAST). .
- the photosensitive film of the present invention can form a cured product such as a solder resist with sufficiently high photosensitivity, even if only the component having no halogen atom can be used.
- the cured product can be formed with sufficiently high resolution, and furthermore, the heat resistance of the cured product can be made sufficiently excellent. Therefore, the photosensitive film of the present embodiment is extremely excellent from the viewpoint of global environmental conservation because it can sufficiently suppress the generation of halogen-derived harmful substances such as dioxin.
- the photosensitive substrate is formed so as to cover the conductor layer on the insulating substrate of the multilayer substrate having the insulating substrate and the conductor layer having the circuit pattern formed on the insulating substrate.
- Form a photosensitive layer containing a fat composition irradiate a predetermined portion of the photosensitive layer with actinic rays to form an exposed portion, and then remove portions other than the exposed portion Is.
- a force for directly applying the photosensitive resin composition of the present embodiment a pressure-sensitive adhesive layer on the photosensitive film for permanent resist is heated and pressed against an insulating substrate.
- the forming method are: Therefore, when the photosensitive resin composition contains a volatile component such as a solvent, the photosensitive layer formed on the substrate is mainly composed of the component after most of the solvent is removed.
- an exposed portion is formed by irradiating a predetermined portion of the photosensitive layer while operating an actinic ray.
- the method for forming the exposed portion include a method of irradiating actinic rays by the LDI method, a method of irradiating actinic rays by the DLP method, and the like.
- Examples of active light sources include carbon arc lamps, mercury vapor arc lamps, ultra-high pressure mercury lamps, high-pressure mercury lamps, xenon lamps, and the like that effectively emit ultraviolet rays, photographic flood bulbs, solar lamps, etc. However, it may be one that effectively emits yellow light such as a yellow lamp.
- the photosensitive resin composition tends to be cured with sufficiently high sensitivity and high resolution. When such a laser beam is used, the DLP technique described above can be used.
- an alkaline aqueous solution (alkaline developer) is used, and development is performed by removing portions other than the exposed portion by a known method such as spraying, rocking immersion, brushing, scraping, etc. Form.
- post-curing may be further performed by exposure at 1 to 5 J Zcm 2 or Z and heating at 100 to 200 ° C. for 30 minutes to 12 hours (post-heating step).
- the developer used in the development process is an alkaline developer as a standard, but the type is not particularly limited as long as it does not damage the exposed area and selectively elutes the unexposed area. It is determined according to the development type of the Hanaguri resin composition, and general ones such as a semi-aqueous developer and a solvent developer can be used.
- a semi-aqueous developer and a solvent developer can be used.
- an emulsion developer containing water and an organic solvent as described in JP-A-7-234524 can be used.
- Particularly useful emulsion developers include, for example, propylene glycol as the organic solvent component.
- an alkaline aqueous solution such as potassium hydroxide, sodium hydroxide, sodium carbonate, potassium carbonate, sodium phosphate, sodium silicate, sodium monoborate, ammonia, amines and the like and An emulsion developer with an organic solvent can also be used.
- a resist pattern can be formed on the photosensitive layer laminated on the conductor layer on which the circuit pattern is formed.
- the photosensitive layer on which the resist pattern is formed can be used as a solder resist that prevents the solder from adhering to unnecessary portions on the conductor layer when bonding the mounted components.
- solder resist uses the photosensitive resin composition of the present embodiment or the photosensitive film for permanent resist, the mechanical properties, particularly the tensile strength, are sufficiently high. .
- FIG. 2 is a schematic cross-sectional view showing the printed wiring board of the present embodiment.
- the printed wiring board 2 shown in FIG. 2 includes an insulating substrate 22, a conductor layer 23 having a circuit pattern formed on one surface of the insulating substrate 22, and a circuit pattern formed on the other surface of the insulating substrate 22.
- the permanent resist layer 241 is made of a cured product of the photosensitive resin composition, and the permanent resist layer 241 has an opening 26 so that at least a part of the conductor layer 23 having a circuit pattern is exposed.
- RU cured product of the photosensitive resin composition
- FIG. 3 is a process diagram schematically showing a manufacturing method of the printed wiring board 2 shown in FIG.
- FIG. 3 (a) shows an insulating substrate 22 having a conductor layer 23 having a circuit pattern on one side and a conductor layer 21 having no circuit pattern on the other side.
- FIG. 3 (b) and FIG. (C) and (d) show the printed wiring board 4 after the photosensitive layer 24 is laminated on the insulating substrate 22, the state in which the photosensitive layer 24 is irradiated with the active ray, and the printed wiring after development. Plate 2 is shown.
- the pattern of the conductor layer 23 is formed on the insulating substrate 22 by a known method for etching one side of a double-sided metal laminate (eg, double-sided copper-clad laminate). To obtain the printed wiring board 3 on which the conductor layer 23 is formed.
- the photosensitive resist film for permanent resist according to the present embodiment is formed so as to cover the conductor layer 23 on the printed wiring board 3 on which the conductor layer 23 is formed.
- a photosensitive layer 24 containing the resin composition is formed, and the printed wiring board 4 on which the photosensitive layer 24 is formed is obtained.
- a predetermined portion of the photosensitive layer 24 is cured by irradiating the laminated photosensitive layer 24 while moving the laser beam 5 as shown in FIG.
- a printed wiring board 2 is obtained by forming a permanent resist layer 241 having an opening 26 as shown in FIG. 3 (d).
- the photosensitive resin composition contains a volatile component such as an organic solvent
- the permanent resist layer 241 has a photosensitive resin composition after most of the volatile component is removed. It is a cured product.
- the permanent resist layer 241 in the printed wiring board 2 obtained in this manner contains a cured product of the photosensitive resin composition of the present embodiment, it has a sufficiently high-resolution shape. Yes, both the strength and the solder heat resistance are sufficiently excellent.
- the photosensitive resin composition of the present invention can also be used for the formation of a photovia that is a kind of microvia. That is, after the photosensitive layer according to the present invention is formed on the core substrate, it is exposed and developed by light irradiation such as UV using a mask. As a result, a photo via is formed. Since this photo via is formed from the photosensitive resin composition of the present invention, the mechanical properties, particularly the tensile strength, are sufficiently high.
- the above-described photosensitive resin composition, a photosensitive film for permanent resist, a printed wiring board, and the like can be used for a semiconductor element in the same manner as conventional photosensitive resin compositions.
- a semiconductor element formed using the photosensitive resin composition or the like of the present invention is sufficiently excellent in mechanical properties, and further tends to be excellent in thermal shock resistance and electric corrosion resistance.
- the compounds shown below were mixed at the blending ratios (unit: parts by mass) shown in Table 1 or Table 2, respectively.
- a characteristic rosin composition was prepared.
- Tables 1 and 2 the blending ratio of commercial products in a state where the solid content is mixed with the solvent indicates the blending ratio in terms of solid content.
- a radical is generated by heating to initiate the reaction with the bismaleimide compound, and to provide potential.
- As a component 2.1 parts by mass of an organic peroxide (trade name; Perhexine 25B, manufactured by NOF Corporation) was blended.
- A-2 Tetrahydroxyphthalic anhydride modified epoxy acrylate (trade name; ZFR-1185, manufactured by Nippon Kayaku Co., Ltd.)
- A-3 Polyester modified with tetrahydroxyphthalic anhydride (weight average molecular weight 34000, solid content 62%, acid value 130mgKOH, g)
- Hitachi L-6000 product name, manufactured by Hitachi, Ltd.
- Hitachi L-3300 type RI manufactured by Hitachi, Ltd., trade name
- Hitachi L-6000 product name, manufactured by Hitachi, Ltd.
- Hitachi L 4000 type UV (manufactured by Hitachi, Ltd., trade name)
- B—1 2, 2, monobis (2-methylphenol) 1, 4, 4, 5, 5, monotetraphenyl 1, 1, biimidazole (manufactured by Kurokin Kasei Co., Ltd.)
- B-2 2, 2, monobis (2-methoxyphenyl) 1, 4, 4, 5, 5, monotetraphenyl 1, 1, bibiimidazole (manufactured by HAMPFORD RESEARCH, INC.)
- B-3 2, 2, 1bis (2-methyl ester file) 1, 4, 4, 5, 5, 1 tetraphenyl 1, 1, 1 biimidazole (manufactured by Kurokin Kasei Co., Ltd.)
- B—4 2, 2, one bis (2-trope) 1, 4, 4, 5, 5, one tetraphenyl 1, 1, 1 biimidazole (manufactured by Kurokin Kasei Co., Ltd.)
- B—6 2, 2, 1bis (2—black mouth) 1, 4, 4, 5, 5, 1 tetraphenyl 1, 1, 1 biimidazole (trade name; B—CIM, (Tsuchiya Chemical Co., Ltd.)
- D—1 Dipentaerythritol hexaatalylate (trade name; DPHA, manufactured by Nippon Kayaku Co., Ltd.)
- D—2 Bisphenol A Polyoxyethylene dimetatalylate (trade name; FA321M, manufactured by Hitachi Chemical Co., Ltd.)
- E-1 Block isocyanate compound (trade name; BL-3175, manufactured by Sumika Bayer Urethane Co., Ltd.)
- E-2 2, 2-bis [4— (4-N-maleimidophenoxy) phenol] propane (trade name; BBMI, manufactured by Hitachi Chemical Co., Ltd.)
- E-3 Bisphenol F-type epoxy compound (trade name; ESLV-80XY, manufactured by Nippon Steel Chemical Co., Ltd.)
- ⁇ -4 Biphenyl epoxy compound (trade name; ⁇ —4000, manufactured by Japan Epoxy Resin Co., Ltd.)
- ⁇ —5 Tetraglycidylxylenolethane-type epoxy compound (trade name; GTR—180, manufactured by Nippon Kayaku Co., Ltd.)
- E-6 Bi-phenol type oxetane compound (trade name; Etanacol OXBP, manufactured by Ube Industries)
- Type Composition 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
- A-2 40 (Solid content :)
- the obtained photosensitive resin composition was uniformly applied onto a polyethylene terephthalate (PET) film having a film thickness of 16 m, and dried for 10 minutes with a hot air convection dryer at 95 ° C to obtain a solvent.
- a solvent was removed to form a photosensitive layer.
- a polyethylene film having a film thickness of 25 m was pasted on the photosensitive layer as a protective film to obtain photosensitive films according to Examples 1 to 20 and Comparative Examples 1 to 7, respectively.
- the film thickness after drying of the photosensitive layer was 30 m.
- the photosensitive film is placed on one side of the polished double-sided copper-clad laminate with the photosensitive layer side facing the surface.
- a laminated body was obtained by thermocompression bonding.
- a phototool having a stove 21 step tablet manufactured by Eastman Kodak Company
- the laminate was adhered onto the PET film, and exposure was performed with a predetermined amount of energy that resulted in 8 steps remaining in the 21-step tablet.
- the laminate After exposure, the laminate further room temperature and after standing for 10 minutes in the atmosphere, the laminated strength also peeled PET film arm, 60 seconds the photosensitive layer 1, w 0/0 aqueous sodium carbonate 30 ° C Spraying was performed to remove unexposed areas.
- the laminate obtained after development is irradiated with ljZcm 2 ultraviolet rays using an ultraviolet irradiation device (trade name: QRM-2317-F-00, manufactured by Oak Manufacturing Co., Ltd.), and then 1 at 160 ° C in the air. A time heat treatment was applied to form a permanent resist layer.
- thermocompression bonding was performed to obtain a laminate.
- a negative mask having a predetermined wiring pattern with a line width Z space width of 30Z400 200Z400 (unit: ⁇ m) is placed on the PET film of the laminate. Adhered.
- the laminate was exposed from the photosensitive film side with the predetermined amount of energy through the above-described sharp cut filter using an exposure machine (trade name: EMX-1201, manufactured by Oak Manufacturing Co., Ltd.).
- the laminate was further allowed to stand in the atmosphere at room temperature for 10 minutes, and then the PET film was peeled off.
- the photosensitive layer was sprayed with a 1% by weight aqueous sodium carbonate solution at 30 ° C for 40 seconds to remove the unexposed areas and develop.
- Ultraviolet irradiation device made by oak Irradiated with lj / cm 2 ultraviolet rays using a product name manufactured by Sakusho Co., Ltd., product name; QRM-2317-F-00), and then heat-treated at 160 ° C for 1 hour in the atmosphere to form a permanent resist layer. Formed.
- the solder bath strength is also immersed after being immersed in a 260 ° C solder bath for 10 seconds.
- the removal operation was repeated three times to perform soldering.
- the degree of floating, swelling and peeling of the permanent resist layer of the evaluation substrate thus soldered was visually observed and evaluated according to the following criteria. That is, “A” indicates that the permanent resist layer could not be lifted, swollen, or peeled off, and “B” indicates that the! / “C” was confirmed in many parts.
- the results are shown in Tables 3 and 4.
- the obtained evaluation board is immersed for 15 minutes in a 85 ° C plating bath containing an electroless Ni plating solution (Melplate NI—865T, manufactured by Meltex, Inc.), followed by electroless Au plating It was immersed for 10 minutes in a 90 ° C simmering bath containing the liquid (Melplate AU-601, product name, manufactured by Meltex Co., Ltd.) for squeezing treatment.
- the degree of floating, swelling, and peeling of the permanent resist layer of the evaluation substrate thus plated with electroless NiZAu was visually observed and evaluated according to the following criteria. In other words, “A” indicates that the permanent resist layer could not be lifted, swollen, or peeled off, and “B” indicates that any of them was confirmed in a small portion. What was confirmed in many parts was designated as “C”. The results are shown in Tables 3 and 4.
- the obtained evaluation substrate was allowed to stand in an atmosphere of 121 ° C, 100% RH, 2.1 atm for 100 hours, and then the degree of floating, swelling and peeling of the permanent resist layer was visually observed, and the following criteria were used. evaluated. That is, “A” indicates that the permanent resist layer could not be lifted, swollen, and peeled off, and “B” indicates that any of them could be confirmed.
- the results are shown in Tables 3 and 4.
- the obtained evaluation substrate is exposed to 55 ° C atmosphere for 15 minutes, then heated at a rate of 180 ° CZ, then exposed to 125 ° C for 15 minutes, and then 180 ° CZ.
- a thermal cycle test (TCT) was conducted in which the thermal cycle was performed 1000 times with a temperature decrease rate of 1 minute.
- the degree of cracking and peeling of the permanent resist layer of the evaluation substrate after exposure to such an environment was observed with a 100-fold metal microscope and evaluated according to the following criteria. That is, “A” indicates that the permanent resist layer could not be confirmed for cracking and peeling, and “B” indicates that it was possible to confirm the deviation! /.
- the results are shown in Tables 3 and 4.
- the present invention it is possible to satisfy both sufficiently high photosensitivity and sufficiently high resolution at the same time even if the component such as the photopolymerization initiator does not have a halogen atom.
- the photosensitive film for permanent resists using such a photosensitive resin composition, the formation method of a resist pattern, a printed wiring board, and a semiconductor element can be provided.
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Materials For Photolithography (AREA)
Abstract
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