WO2004092440A1 - 多孔質薄膜の形成方法 - Google Patents
多孔質薄膜の形成方法 Download PDFInfo
- Publication number
- WO2004092440A1 WO2004092440A1 PCT/JP2004/005378 JP2004005378W WO2004092440A1 WO 2004092440 A1 WO2004092440 A1 WO 2004092440A1 JP 2004005378 W JP2004005378 W JP 2004005378W WO 2004092440 A1 WO2004092440 A1 WO 2004092440A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- thin film
- metal
- metal component
- forming
- porous
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
- C23C14/5873—Removal of material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J37/00—Processes, in general, for preparing catalysts; Processes, in general, for activation of catalysts
- B01J37/02—Impregnation, coating or precipitation
- B01J37/0238—Impregnation, coating or precipitation via the gaseous phase-sublimation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J37/00—Processes, in general, for preparing catalysts; Processes, in general, for activation of catalysts
- B01J37/34—Irradiation by, or application of, electric, magnetic or wave energy, e.g. ultrasonic waves ; Ionic sputtering; Flame or plasma spraying; Particle radiation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/86—Inert electrodes with catalytic activity, e.g. for fuel cells
- H01M4/90—Selection of catalytic material
- H01M4/92—Metals of platinum group
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J37/00—Processes, in general, for preparing catalysts; Processes, in general, for activation of catalysts
- B01J37/02—Impregnation, coating or precipitation
- B01J37/0215—Coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/50—Fuel cells
Definitions
- the present invention relates to a method for forming a porous metal compound thin film such as a porous metal oxide thin film used for an electrode or a photocatalyst of a solar cell, and a porous thin film such as a porous metal thin film used for a catalyst layer of a fuel cell.
- a porous metal compound thin film such as a porous metal oxide thin film used for an electrode or a photocatalyst of a solar cell
- a porous thin film such as a porous metal thin film used for a catalyst layer of a fuel cell.
- a porous thin film of a metal oxide or metal is suitable for a member in which a large number of active sites (action points) are required to be dispersed per unit volume because of its large specific surface area. Therefore, it is applied to members such as electrodes and catalysts that require a large number of active points (action points) in a limited volume, and is used in fields such as electrodes for solar cells and catalysts such as photocatalysts.
- a porous metal oxide thin film is used for a metal oxide semiconductor electrode, and a solar cell using an oxide semiconductor sensitized with an organic dye without using silicon as a light conversion material is known.
- Japanese Unexamined Patent Application Publication No. Hei 11-220308 Japanese Unexamined Patent Application Publication No. 5-504203
- Japanese Patent Application Laid-Open No. H10-92447 discloses a solar cell using an oxide semiconductor film made of a baked product of an aggregate of oxide semiconductor fine particles as an organic dye-sensitized metal oxide semiconductor electrode.
- the semiconductor film is formed by applying a slurry of oxide semiconductor fine powder on a transparent electrode, drying the slurry, and then firing.
- a porous metal oxide thin film which is a fired product of an aggregate of oxide semiconductor fine particles, is formed by a so-called sol-gel method, but an organic dye-sensitized metal oxide semiconductor electrode having high light energy conversion efficiency is obtained.
- sol-gel method an organic dye-sensitized metal oxide semiconductor electrode having high light energy conversion efficiency is obtained.
- T I_ ⁇ 2, Z N_ ⁇ 2, W0 metal oxides such as 3 are known as having a photocatalytic function of providing the absorbent to act was One had been superhydrophilic reduction and oxidation ultraviolet, It is widely used for water purification, air purification, deodorization, oil decomposition, etc. In the case of its use, such a metal oxide having a photocatalytic action is formed into a thin film on a substrate. Immobilization is often performed.
- a method of forming a metal oxide thin film as described above for example, a method of mixing a powder with a resin or rubber as a binder, applying the mixture to a substrate, and sintering the mixture is used.
- a method of forming a gel coating film using a metal alkoxide solution and baking it to form a film by a so-called sol-gel method; and a method of forming a metal oxide thin film by sputtering Japanese Patent Application Laid-Open No. H11-9121776). No.
- a catalyst layer is provided between an electrolyte membrane and a porous support.
- this catalyst layer is obtained by supporting a metal such as platinum on a carrier such as activated carbon.
- the supported catalyst particles are applied to a porous support such as a carbon sheet.However, in order to improve the power generation efficiency of the fuel cell, it is necessary to further disperse the active points of the catalyst. is necessary. Disclosure of the invention
- the present invention has been made in view of the above circumstances, and has been made of a metal oxide thin film or a metal thin film such as a metal oxide semiconductor thin film for a solar cell electrode, a photocatalytic thin film, or a fuel cell catalyst layer, which is formed and used on a substrate. It is an object of the present invention to provide a porous metal compound thin film having a high specific surface area and a method capable of forming a porous metal thin film.
- the present inventor has conducted intensive studies to achieve the above object, and as a result, has found that a metal portion made of a first metal component and a second metal component different from the first metal component are provided on a substrate.
- this method is applied as a method for forming a metal oxide semiconductor thin film for a solar cell electrode, an organic dye-sensitized metal oxide semiconductor electrode having high light energy conversion efficiency can be obtained. It has been found that a photocatalyst thin film in which active sites having a high specific surface area are highly dispersed can be obtained if the method is applied as a method for forming a film.
- a composite is formed by mixing and dispersing a first metal portion made of a first metal component and a second metal portion made of a second metal component different from the first metal component on a substrate.
- a porous thin film formed by forming a thin film, and then removing only one of the first metal portion and the second metal portion in the composite thin film has a high specific surface area.
- the present invention provides the following method for forming a porous thin film.
- Claim 1 A composite thin film in which a metal portion composed of a first metal component and a metal compound portion composed of a compound of a second metal component different from the first metal component are mixed and dispersed on a substrate. Forming a porous thin film, and then removing only the metal portion in the composite thin film.
- the composite thin film is provided in a chamber with a metal compound made of a first metal component and a metal compound target made of a compound of a second metal component different from the first metal component.
- Claim 3 The method for forming a porous thin film according to claim 1 or 2, wherein the metal compound is a metal oxide, a metal nitride, or a metal oxynitride.
- the first metal component is Zn, Cr, A1, Cu, Si, Ti, Ag,
- Mn, Fe, Co, Cd, Ni, Zr, Nb, Mo, In, Sn, Sb, Hf, Cl aims characterized in that the second metal component is one selected from the group consisting of Ta, W and Mg, and the second metal component is one different from the first metal component selected from the above group. 4.
- the first metal component is Zn, Cr, A1, Cu, Si, Ti, Ag, Mn, Fe, Co, Cd, Ni, Zr, Nb, Mo, One selected from the group consisting of In, Sn, Sb, Hf, Ta, W and Mg, wherein the second metal component is Zn, Ti, Nb, In, Sn, Sb and The method for forming a porous thin film according to any one of claims 1 to 3, wherein the type is one kind different from the first metal component selected from the group consisting of W.
- Claim 6 The first metal component is Zn, Cr, A1, Cu, Si, Ag, Mn, Fe, Co, Cd, Ni, Zr, Nb, Mo, In, Sn, 4.
- Claim 7 The first metal component and the second metal component are a combination capable of eluting only the metal portion in the composite thin film in an acid aqueous solution or an alkaline aqueous solution. 7. The method for forming a porous thin film according to any one of claims 1 to 6.
- Claim 8 The method for forming a porous thin film according to claim 7, wherein the removal of the metal portion comprises dissolving the metal portion with an aqueous acid solution or an aqueous alkali solution.
- Claim 9 The method of forming a porous thin film according to any one of claims 1 to 8, further comprising firing after removing the metal portion.
- Claim 10 A first metal portion made of a first metal component and a second metal portion made of a second metal component different from the first metal component are mixed and dispersed on the substrate.
- a method of forming a porous thin film comprising: forming a composite thin film, and then removing only one of the first metal portion and the second metal portion in the composite thin film.
- Claim 11 A first metal target comprising a first metal component and a second metal target comprising a second metal component different from the first metal component, wherein the composite thin film is provided in a chamber with a first metal component.
- the first metal component is Pt, Ru, Ir, R, Zn, Cr, A1, Cu, Si, Ti, Ag, Mn, Fe, Co, Cd, N i, Zr, Nb, Mo, In, Sn, Sb, Hf, Ta, W, and Mg
- the second metal component is selected from the group consisting of 12.
- the first metal component and the second metal component are a combination capable of eluting only one of the metal portions in the composite thin film in an aqueous acid solution or aqueous alkali solution.
- a porous metal compound thin film and a porous metal thin film having the same can be formed.
- FIG. 1 is a schematic plan view of a sputtering apparatus for forming a composite thin film by sputtering in a method for forming a porous thin film according to an example of the first embodiment of the present invention.
- FIG. 2 is a schematic plan view of a sputtering apparatus for forming a composite thin film by sputtering in a method for forming a porous thin film according to an example of the second aspect of the present invention.
- the method for forming a porous thin film according to the first aspect of the present invention comprises the steps of: And a metal compound portion composed of a compound of a second metal component different from the first metal component to form a composite thin film in which the metal portion is mixed and dispersed, and then the metal portion in the composite thin film is formed.
- a porous thin film is formed by removing only these.
- the type of the target substrate is not particularly limited, and is appropriately selected according to the use of the porous thin film.
- a glass substrate coated with ITO or fluorinated tin oxide can be used as the substrate.
- a photocatalytic thin film is formed, ceramics, resin, and the like can be applied.
- the ceramic base material is glass such as non-alkali glass or quartz glass
- the resin base material is a hydrocarbon resin such as polyethylene, polypropylene, or polystyrene, a polyester resin such as polyethylene terephthalate, or a polyamide resin. , And polycarbonate resin.
- the composite thin film includes, in the chamber, a metal target composed of a first metal component and a metal compound composed of a compound of a second metal component different from the first metal component.
- the first metal component is made of an oxide, a nitride, or an oxidized metal
- the first metal component is made of an oxide, a nitride, or an oxide. It can be formed by providing a compound in which a compound such as a nitride is not easily formed and a second metal component in combination with a compound in which the compound is easily formed, and applying power to these targets at the same time to perform sputtering.
- a chamber 13 made of a first metal component and a second metal component different from the first metal component are placed in a chamber 13.
- Sputtering atmosphere generated by disposing a metal compound evening get 2 composed of a compound and applying power to these evening getters 1 and 2 simultaneously (mainly, a metal atmosphere and a metal oxide getter 1).
- the substrate 4 forming the composite thin film is directed toward the sputtering surfaces of the substrates 1 and 2 in the evening. It can be formed by sputtering while rotating.
- 5 is Magnet
- 6 is an evening get electrode
- 7 is a gas inlet
- 8 is a gas exhaust port (decompression port)
- 9 is a turntable
- 10a is an RF power supply
- 10b is a DC power supply.
- a fine metal portion composed of the first metal component and a fine metal compound portion composed of the compound of the second metal component are highly dispersed to each other.
- the film is formed in a state where it is formed.
- the dispersion state in the plane direction of the metal portion and the metal oxide portion of the composite thin film can be made uniform.
- it is also possible to change the ratio of the metal portion to the metal oxide portion by changing the power applied to each target.
- the first and second evening get as rectangular evening get and arranging them at a certain angle, roll-to-roll of film substrate (Ro 11 to Ro 11) and in-line coating of glass substrate Is also applicable.
- the metal compound is preferably a metal oxide, a metal nitride, or a metal oxynitride.
- an inert gas such as helium or argon can be used.
- an inert gas such as helium or argon
- oxygen gas is used when metal oxide is used
- nitrogen gas is used when metal nitride is used
- metal oxide is used when metal oxide is used.
- oxygen gas, nitrogen gas or nitric oxide gas can be used in combination if the amount is small.
- metal target composed of a first metal component and a metal target composed of a second metal component different from the first metal component are used in combination, metal oxide is used as a compound of the second metal component.
- the use of oxygen gas when forming a substance, the use of nitrogen gas when forming a metal nitride, and the use of oxygen gas, nitrogen gas or nitrogen oxide gas when forming a metal oxynitride, Compounds can be formed.
- the method of applying power to the target is not particularly limited and is selected according to the type of composite thin film to be formed, and any of RF, AC, and DC power supplies can be used, and a different power supply is used for each target. You may.
- the first and second metal components are Zn, Cr, A1, Cu, Si, Ti, Ag, Mn, Fe, Co, Cd, Ni, One selected from the group consisting of Zr, Nb, Mo, In, Sn, Sb, Hf, Ta, W and Mg
- the second metal component is one kind different from the first metal component selected from the above group, in particular, from the group consisting of Zn, Ti, Nb, In, Sn, Sb and W. It is preferable that the selected one is different from the first metal component.
- the metal compound is a titanium compound (when the second metal component is Ti)
- the first metal component is Zn, Cr, A1, Cu, Si, Ag, Mn, Fe , Co, Cd, Ni, Zr, Nb, Mo, In, Sn, Sb, Hf, Ta, W and Mg.
- the first metal component and the second metal component are formed only in the metal thin film in the composite thin film in an acid aqueous solution or an alkaline aqueous solution. Is preferable.
- the thickness of the composite thin film is appropriately selected according to the use of the porous thin film, but is preferably 10 ⁇ m to 20 m, particularly preferably 100 nm to 10 m.
- a porous thin film is formed by removing only the metal part in the composite thin film. Therefore, in this case, the porous thin film becomes a porous metal compound thin film.
- the first metal component and the second metal component are a combination that can elute only the metal part in the composite thin film in an acid aqueous solution or an alkaline aqueous solution.
- a method of dissolving the metal part with an acid aqueous solution or an aqueous solution of an alkali can be adopted, and a method of immersing the composite thin film in an acid aqueous solution or an alkaline aqueous solution can be applied.
- the aqueous acid solution and the aqueous alkaline solution are appropriately selected according to the types and combinations of the first and second metal components.
- Acids used include hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, acetic acid, hydrofluoric acid, chromic acid, hydrogen peroxide, perchloric acid, chloric acid, chlorous acid, hypochlorous acid, cunic acid, oxalic acid, odor Hydrogen and the like can be used, and these can be used alone or in a mixed acid obtained by mixing them as an aqueous solution.
- an aqueous mixed solution of a mixed acid and a metal chloride such as ferric chloride or a metal sulfide can be used.
- an aqueous solution of sodium hydroxide, potassium hydroxide or the like, ammonia water, or the like can be used.
- the concentration and composition of the acid aqueous solution and the alkaline aqueous solution can be appropriately selected according to the type of the metal to be dissolved.
- the method for forming a porous thin film according to the second aspect of the present invention comprises the steps of: forming, on a substrate, a first metal portion made of a first metal component; and a second metal component different from the first metal component. And forming a composite thin film in which the second metal portion is mixed and dispersed with each other, and then only the metal portion of either the first metal portion or the second metal portion in the composite thin film is removed. By doing so, a porous thin film is formed.
- the type of the target substrate is not particularly limited, and is appropriately selected according to the use of the porous thin film.
- the porous thin film is formed as a catalyst for a fuel cell
- a polymer electrolyte membrane used for a fuel cell can be used as a substrate.
- the composite thin film includes a first metal target made of a first metal component and a second metal made of a second metal component different from the first metal component in the chamber. It can be formed by providing targets and applying power to these targets simultaneously to perform sputtering.
- a first metal component 1 a made of a first metal component and a second metal component 1 a different from the first metal component are provided in a chamber 13.
- a second metal target 1b composed of the following metal components is disposed, and a sputtering atmosphere generated by simultaneously applying power to these targets la and 1b (mainly, the first metal target 1a and the second metal target 1b).
- the substrate 4 forming the composite thin film is targeted to the surface forming the composite thin J5 , Lb by sputtering while rotating toward the sputtering surface.
- 5 is a magnet
- 6 is a target electrode
- 7 is a gas inlet
- 8 is a gas outlet (decompression port)
- 9 is a turntable
- 10b indicates DC power supply.
- the composite thin film is composed of a fine first metal portion composed of the first metal component and a fine second metal portion composed of the second metal component.
- the film is formed in a highly dispersed state. Also, especially in this case, the substrate is rotated Therefore, the first metal portion and the second metal portion of the composite thin film can be uniformly dispersed in the plane direction. Further, in this case, it is also possible to change the ratio of the first metal portion to the second metal portion by changing the power applied to each target.
- an inert gas such as helium or argon can be used.
- the method of applying power to the evening get is not particularly limited, and is selected according to the type of the composite thin film to be formed, and any of RF, AC, and DC power supplies can be used. Different power supplies may be used.
- the first metal component is Pt, Ru, Ir, Rh, Zn, Cr, A1, Cu, Si, Ti, Ag, Mn, Fe, Co, Cd, Ni, Zr, Nb, Mo, In, Sn, Sb, Hf, Ta, W, and Mg. It is preferable that the metal component is one different from the first metal component selected from the above group.
- the first metal component and the second metal component may be any one of the composite thin film in an acid aqueous solution or an aqueous solution of an alkali. It is preferable that the combination can elute only the metal component.
- the thickness of the composite thin film is appropriately selected according to the use of the porous thin film, but is preferably from 1 to 500 nm, particularly preferably from 10 to 50 nm.
- the porous thin film is formed by removing only one of the first metal portion and the second metal portion in the composite thin film. To form Therefore, in this case, the porous thin film becomes a porous metal thin film.
- the first metal component and the second metal component are converted into either the first metal portion or the second metal portion in the composite thin film in an acid aqueous solution or an alkaline aqueous solution.
- a method of dissolving only the first or second metal portion with an aqueous acid solution or an aqueous solution of alkalinity can be adopted.
- a method of immersing the immersion in an acid aqueous solution or an aqueous solution of alkali can be applied.
- the acidic aqueous solution and the alkaline aqueous solution are based on the types and combinations of the first and second metal components Is appropriately selected in accordance with.
- Acids used include hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, acetic acid, hydrofluoric acid, chromic acid, hydrogen peroxide, perchloric acid, chloric acid, chlorous acid, hypochlorous acid, cunic acid, oxalic acid, odor Hydrogen and the like can be used, and these can be used alone or in a mixed acid obtained by mixing them as an aqueous solution.
- a mixed aqueous solution of a mixed acid and a metal chloride such as ferric chloride or a metal sulfide can also be used.
- a metal chloride such as ferric chloride or a metal sulfide
- an aqueous solution of sodium hydroxide, potassium hydroxide or the like, ammonia water, or the like can be used as the alkaline aqueous solution.
- concentration and composition of the acid aqueous solution and the alkaline aqueous solution can be appropriately selected according to the type of the metal to be dissolved. .
- porous thin film metal oxide semiconductor thin film for solar cell electrode
- a magnetron DC sputtering system was set with a Ti ⁇ x (Asahi Glass Ceramics TXO) target and a Zn target as targets, and a glass coated with fluorine-doped tin oxide was set as a substrate in a vacuum chamber, and a turbo molecular bonder was set.
- the Ar gas 99 sc cm introduced ⁇ 2 gas as a mixed gas at a flow rate of I sc cm, was adjusted such that the pressure becomes 0. 5 P a
- a thin film was formed.
- Zn is eluted and removed from the composite thin film by immersing the glass substrate coated with the fluorine-doped tin oxide on which the composite thin film has been formed in a 1N aqueous sulfuric acid solution at room temperature for 30 minutes. C was fired for 30 minutes to form a porous Ti ⁇ x thin film.
- a spectral sensitizing dye solution 3 x 10 4 mo 1 cis di (thiocyanato) -bis (2,2, -bipyridyl_-4 dicarboxylate-4, —tetrab (Ciammonium carboxylate) Ruthenium (II)
- a monoethanol solution is prepared, and a glass substrate coated with fluorine-doped tin oxide on which a porous thin film of Tiox is formed is immersed in this solution at room temperature for 18 hours.
- the metal oxide semiconductor electrode was obtained by adsorbing the spectral sensitizing dye.
- the adsorption amount of this spectral sensitizing dye was 8 X g per 1 cm 2 of surface area of the porous thin film of Tiox.
- the above metal oxide semiconductor electrode was used as one electrode, and as a counter electrode, a transparent conductive glass plate coated with fluorine-doped tin oxide and further supporting platinum thereon was used. An electrolyte was put between the two electrodes, and after sealing this side surface with a resin, a lead wire was attached thereto to produce a solar cell of the present invention.
- lithium iodide, 1,2-dimethyl-3-propylimidazolium iodide, iodine and t-butylpyridine were used in an acetonitrile solvent at a concentration of 0.1 mo1 / 1, Dissolved so that 0.3 mol / l, 0.05 mol Zl, and 0.5 mol 1/1 were used.
- a Ti Ox (Asahi Glass Ceramics TXO) target was set as an evening target in a magnetron DC sputtering device, and a glass coated with fluorine-doped tin oxide was set as a substrate in a vacuum chamber.
- eight: gas is introduced as a mixed-gas at a flow rate of 985 (0111, 0 2 gas 2 sc cm, was adjusted such that the pressure becomes 0. 5 P a
- a Ti i x thin film of about 1000 nm is formed on the conductive surface of the glass coated with fluorine-doped tin oxide. Further, it was baked at 450 ° C. for 30 minutes in an air atmosphere.
- the spectral sensitizing dye was adsorbed in the same manner as in Example 1.
- the adsorption amount of this spectral sensitizing dye was 0.6 g per 1 cm 2 of the surface area of the porous thin film of Tiox.
- a solar cell was manufactured in the same manner as in Example 1.
- the Voc of this solar cell is 0.58V, ⁇ ⁇ 0.52mAZcm 2 , FF (fill factor) is 0.50, 7] (conversion efficiency) is 1.51% Performance was inferior.
- Magnetron DC sputtering evening sets T i evening Getto as evening one target in the apparatus, and set the glass coated with fluorine-doped tin oxide as a substrate in a vacuum chamber and foremost, in the evening over port molecular pump 5 X 10- 4 P a after evacuating to a a r gas was introduced into the 80 sc cm, 0 2 gas as a mixed gas at a flow rate of 20 sc cm, was adjusted such that the pressure becomes 0.
- the T i evening one target By applying 1 kW of power and performing sputtering, a Ti Ox thin film of about 1 000 nm is formed on the conductive surface of the glass coated with fluorine-doped tin oxide, and furthermore, at 450 ° C in air atmosphere. Baked for 30 minutes.
- the spectral sensitizing dye was adsorbed in the same manner as in Example 1.
- the adsorption amount of this spectral sensitizing dye was 0.5 per 1 cm 2 of the surface area of the porous thin film of Tiox.
- a solar cell was manufactured in the same manner as in Example 1.
- the Voc of this solar cell is 0.56 V,] 3 (0.53 niA / cm 2 , FF (fill factor) is 0.47, and ⁇ (conversion efficiency) is 1.39%.
- the performance was inferior to that of. [Example 2]
- a Ti Ox (Asahi Glass Ceramics TXO) target and a Zn target were set as targets in a magnetron DC sputtering device, non-alkali glass was set as a substrate in a vacuum chamber, and 5 X was set using a molecular pump. After evacuated to 10- 4 P a, the a r gas was introduced as a mixed-gas 99 sc cm, 0 2 gas at a flow rate of 1 sc cm, was adjusted such that the pressure becomes 0. 5 P a, By applying 1 kW power to the Ti Ox gate and 100 W power to the Zn gate, and spattering, a T i ⁇ x / Zn composite of about 600 nm is applied to the surface of the non-algal glass. A thin film was formed.
- the non-alkali glass substrate on which the composite thin film is formed is immersed in a 1 N sulfuric acid aqueous solution at room temperature for 30 minutes to elute and remove Zn from the composite thin film.
- the mixture was calcined to form a porous thin film of Ti ⁇ x.
- the non-alkali glass substrate on which the porous thin film of Ti Ox was formed was immersed in a 22m1 amaranth (red pigment) solution (3m 1/1) and irradiated with a 250W ultra-high pressure mercury lamp (20 minutes).
- the change in concentration was measured with an ultraviolet-visible photometer, the degradation rate of the amarylase was as high as 87.2%.
- the T i evening Getto was set Bok as evening one Getting Bok magnetron DC sputtering device, and set the non ⁇ alkali glass vacuum Chiyanba one as a substrate, it was evacuated with a turbo molecular Bonn flop to 5 X 10- 4 P a , eight 1 "gas 803 (: 111, introduced ⁇ 2 gas as a mixed gas at a flow rate of 20 sc cm, was adjusted such that the pressure becomes 0. 5 Pa, T i evening one Getting Bok to 1 kW By applying an electric power of, a thin film of about 300 nm in thickness was formed on the surface of the non-alkali glass, and further baked at 450 ° C. for 30 minutes in an air atmosphere.
- a Pt target and a Zn target were set as targets in a magnetron DC sputtering device, and a naphion 112 (manufactured by DuPont) as an electrolyte membrane was set as a substrate in a vacuum chamber.
- X 10 After exhausting to 4 Pa, Ar gas was introduced at a flow rate of 100 sccm, and the pressure was adjusted to 0.5 Pa.
- a 2 Onm Pt / Zn composite thin film was formed on the surface of the Nafion 112 as an electrolyte film by applying a power of 100 W to the substrate and performing sputtering. Further, the above treatment was also performed on the surface on the opposite side of the electrolyte membrane to obtain an electrolyte membrane in which a Pt / Zn composite thin film of 20 nm was formed on both sides of the electrolyte membrane.
- the electrolyte membrane on which the above composite thin film was formed was immersed in a 1 N sulfuric acid aqueous solution at room temperature for 30 minutes.
- Zn was eluted and removed from the composite thin film to form a porous thin film of Pt.
- the obtained Pt porous thin film is formed on both sides of an electrolyte membrane, and carbon particles having a particle size of 50 nm are kneaded in a solution of Naphion 1117 (manufactured by Dupont) having the same components as the electrolyte membrane. A paste of bonbon paste was printed (applied).
- an anode and a carbon vapor serving as a cathode are superimposed on each side, and hot at a temperature of 120 ° C and a pressure of 5 MPa for 10 minutes. By pressing, a membrane electrode laminate was formed.
- a fuel cell is manufactured by sandwiching the obtained membrane electrode laminate between graphite separators, and humidified hydrogen is supplied from the anode side and humidified oxygen is supplied from the force side, respectively, and the fuel cell is operated.
- the open circuit voltage was 0.82 V and the limiting current density was 0.33 A / cm 2 .
- a membrane / electrode laminate was formed in the same manner as in Example 3.
- a fuel cell was fabricated in the same manner as in Example 3, and its current-voltage characteristics were measured. At this time, the open circuit voltage was 0.66 V, and the limiting current density was 0.17 AZcm 2 , which was inferior to the fuel cell performance as compared with Example 3.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Physical Vapour Deposition (AREA)
- Catalysts (AREA)
- Inert Electrodes (AREA)
- Oxygen, Ozone, And Oxides In General (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005505444A JPWO2004092440A1 (ja) | 2003-04-16 | 2004-04-15 | 多孔質薄膜の形成方法 |
US10/553,190 US20060189132A1 (en) | 2003-04-16 | 2004-04-15 | Method for forming porous thin film |
EP04727675A EP1614766A4 (en) | 2003-04-16 | 2004-04-15 | METHOD FOR PRODUCING A POROUS THIN FILM |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003111003 | 2003-04-16 | ||
JP2003-111003 | 2003-04-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004092440A1 true WO2004092440A1 (ja) | 2004-10-28 |
Family
ID=33295985
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2004/005378 WO2004092440A1 (ja) | 2003-04-16 | 2004-04-15 | 多孔質薄膜の形成方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20060189132A1 (ja) |
EP (1) | EP1614766A4 (ja) |
JP (1) | JPWO2004092440A1 (ja) |
WO (1) | WO2004092440A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005222782A (ja) * | 2004-02-04 | 2005-08-18 | Bridgestone Corp | 多孔質薄膜の形成方法、並びに色素増感型太陽電池及び多孔質薄膜光触媒 |
JP2007169766A (ja) * | 2005-12-26 | 2007-07-05 | Sumitomo Metal Mining Co Ltd | 多孔質金属箔およびその製造方法 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5342824B2 (ja) * | 2008-07-25 | 2013-11-13 | 株式会社東芝 | 触媒層担持基板の製造方法、触媒層担持基板、膜電極複合体、および燃料電池 |
US10995400B2 (en) * | 2010-04-16 | 2021-05-04 | Guardian Glass, LLC | Method of making coated article having antibacterial and/or antifungal coating and resulting product |
US8894825B2 (en) | 2010-12-17 | 2014-11-25 | Semiconductor Energy Laboratory Co., Ltd. | Sputtering target, method for manufacturing the same, manufacturing semiconductor device |
JP6045780B2 (ja) | 2011-09-26 | 2016-12-14 | 株式会社東芝 | 触媒担持基体およびその製造方法、膜電極接合体ならびに燃料電池 |
JP2015065183A (ja) * | 2014-12-24 | 2015-04-09 | 株式会社東芝 | 触媒担持基体およびその製造方法、膜電極接合体ならびに燃料電池 |
US10760156B2 (en) | 2017-10-13 | 2020-09-01 | Honeywell International Inc. | Copper manganese sputtering target |
US11035036B2 (en) | 2018-02-01 | 2021-06-15 | Honeywell International Inc. | Method of forming copper alloy sputtering targets with refined shape and microstructure |
CN112442669B (zh) * | 2020-11-23 | 2022-09-23 | 南京工程学院 | 一种自清洁减反射薄膜的制备方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6059063A (ja) * | 1983-09-12 | 1985-04-05 | Clarion Co Ltd | 多孔質薄膜の製造方法 |
JPH01123067A (ja) * | 1987-11-06 | 1989-05-16 | Nippon Kentetsu Co Ltd | ポーラス薄膜の製造方法 |
JPH07150356A (ja) * | 1993-11-25 | 1995-06-13 | Canon Inc | 光学薄膜の製造方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS573137B2 (ja) * | 1974-03-13 | 1982-01-20 | ||
JPS6059066A (ja) * | 1983-09-12 | 1985-04-05 | Clarion Co Ltd | 多孔質薄膜の製造方法 |
US4851096A (en) * | 1984-07-07 | 1989-07-25 | Kyocera Corporation | Method for fabricating a magneto-optical recording element |
JPS61238958A (ja) * | 1985-04-15 | 1986-10-24 | Hitachi Ltd | 複合薄膜形成法及び装置 |
US4851095A (en) * | 1988-02-08 | 1989-07-25 | Optical Coating Laboratory, Inc. | Magnetron sputtering apparatus and process |
EP0358779B1 (en) * | 1988-02-26 | 1993-04-14 | Mitsubishi Materials Corporation | High-strength superconductive wire and cable having high current density, and method of producing them |
AU650878B2 (en) * | 1990-04-17 | 1994-07-07 | Ecole Polytechnique Federale De Lausanne | Photovoltaic cells |
JP2999854B2 (ja) * | 1991-05-18 | 2000-01-17 | 株式会社堀場製作所 | 水素センサ、ガスセンサ用またはpH応答用金属薄膜製造方法 |
US6333084B1 (en) * | 1994-09-09 | 2001-12-25 | Southwall Technologies, Inc. | Double-sided reflector films |
JP3735461B2 (ja) * | 1998-03-27 | 2006-01-18 | 株式会社シンクロン | 複合金属の化合物薄膜形成方法及びその薄膜形成装置 |
CN1250766C (zh) * | 2000-03-13 | 2006-04-12 | 三井金属鉱业株式会社 | 制造复合材料的方法以及该方法制造的复合材料 |
JP3772194B2 (ja) * | 2000-08-31 | 2006-05-10 | 独立行政法人産業技術総合研究所 | 光制限材料 |
US20020144903A1 (en) * | 2001-02-09 | 2002-10-10 | Plasmion Corporation | Focused magnetron sputtering system |
US6596187B2 (en) * | 2001-08-29 | 2003-07-22 | Motorola, Inc. | Method of forming a nano-supported sponge catalyst on a substrate for nanotube growth |
US6770353B1 (en) * | 2003-01-13 | 2004-08-03 | Hewlett-Packard Development Company, L.P. | Co-deposited films with nano-columnar structures and formation process |
-
2004
- 2004-04-15 JP JP2005505444A patent/JPWO2004092440A1/ja active Pending
- 2004-04-15 WO PCT/JP2004/005378 patent/WO2004092440A1/ja active Application Filing
- 2004-04-15 US US10/553,190 patent/US20060189132A1/en not_active Abandoned
- 2004-04-15 EP EP04727675A patent/EP1614766A4/en not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6059063A (ja) * | 1983-09-12 | 1985-04-05 | Clarion Co Ltd | 多孔質薄膜の製造方法 |
JPH01123067A (ja) * | 1987-11-06 | 1989-05-16 | Nippon Kentetsu Co Ltd | ポーラス薄膜の製造方法 |
JPH07150356A (ja) * | 1993-11-25 | 1995-06-13 | Canon Inc | 光学薄膜の製造方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP1614766A4 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005222782A (ja) * | 2004-02-04 | 2005-08-18 | Bridgestone Corp | 多孔質薄膜の形成方法、並びに色素増感型太陽電池及び多孔質薄膜光触媒 |
JP2007169766A (ja) * | 2005-12-26 | 2007-07-05 | Sumitomo Metal Mining Co Ltd | 多孔質金属箔およびその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1614766A1 (en) | 2006-01-11 |
JPWO2004092440A1 (ja) | 2006-07-06 |
EP1614766A4 (en) | 2011-07-06 |
US20060189132A1 (en) | 2006-08-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102064367B (zh) | 半导体电极及其制造方法、和使用该半导体电极的光电池 | |
WO2004092440A1 (ja) | 多孔質薄膜の形成方法 | |
CN109569684A (zh) | 等离子体改性金属氧化物和g-氮化碳共修饰二氧化钛纳米棒复合光催化剂及其制备和应用 | |
CN1819314A (zh) | 包含金属磷酸盐的燃料电池电极及采用它的燃料电池 | |
CN111621807B (zh) | 准对称固体氧化物电解池的电极材料及其制备方法和应用 | |
JP2008104899A (ja) | 光触媒膜、光触媒膜の製造方法およびこれを用いた水素発生装置 | |
CN101299461A (zh) | 铂钌掺杂La系稀土元素多相催化剂的制备方法 | |
JP2014060137A (ja) | シリカ電極の二次電池モジュール、及び製造方法 | |
JP5428109B2 (ja) | 燃料電池 | |
JP2003123773A (ja) | 固体電解質型燃料電池用空気極およびそれを用いた燃料電池 | |
CN101048902A (zh) | 用于燃料电池的电极催化剂以及燃料电池 | |
JPWO2005078853A1 (ja) | 色素増感型太陽電池 | |
JP4185980B2 (ja) | 透光性を有する多孔質導電体及びその製法 | |
JP2001357859A (ja) | 燃料電池用セパレータ | |
CN110035822B (zh) | 制氧用光催化剂电极、制氧用光催化剂电极的制造方法及模块 | |
JP2005039013A (ja) | 多孔質金属化合物薄膜の成膜方法及び有機色素増感型太陽電池 | |
JP4725701B2 (ja) | 多孔質薄膜の形成方法 | |
CN111020501A (zh) | 一种铋酸铜薄膜的制备方法 | |
Dao | Highly transparent Pt-TiO2 as an efficient catalyst for triiodide reduction of bifacial liquid-junction photovoltaic devices | |
JP2002117912A (ja) | 半導体電極、半導体電極の製造方法および太陽電池 | |
CN1300877C (zh) | 质子交换膜氢与氧燃料电池碳载铂催化剂的制备方法 | |
JP2007042519A (ja) | 燃料電池用触媒及びその製造方法並びに燃料電池用電極及び燃料電池 | |
CN114255999A (zh) | 一种光生防腐电极材料及其制备方法和应用 | |
CN112058275A (zh) | 薄膜电极碱性光电解水催化剂及其制备方法和应用 | |
JP2001351643A (ja) | 燃料電池用セパレータ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): BW GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
DPEN | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed from 20040101) | ||
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 2005505444 Country of ref document: JP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2006189132 Country of ref document: US Ref document number: 10553190 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2004727675 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 2004727675 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 10553190 Country of ref document: US |