WO2002103373A1 - Conductive contactor and electric probe unit - Google Patents
Conductive contactor and electric probe unit Download PDFInfo
- Publication number
- WO2002103373A1 WO2002103373A1 PCT/JP2001/005224 JP0105224W WO02103373A1 WO 2002103373 A1 WO2002103373 A1 WO 2002103373A1 JP 0105224 W JP0105224 W JP 0105224W WO 02103373 A1 WO02103373 A1 WO 02103373A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- support hole
- conductive contact
- conductor
- plunger
- holder
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims description 28
- 239000012212 insulator Substances 0.000 claims abstract description 36
- 239000004020 conductor Substances 0.000 claims description 49
- 239000000758 substrate Substances 0.000 claims description 6
- 230000000717 retained effect Effects 0.000 claims description 2
- 238000000926 separation method Methods 0.000 abstract 1
- 238000003475 lamination Methods 0.000 description 7
- 238000007689 inspection Methods 0.000 description 6
- 239000011295 pitch Substances 0.000 description 6
- 238000007747 plating Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 229910001315 Tool steel Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 210000003298 dental enamel Anatomy 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
Definitions
- the present invention relates to a conductive contact and an electric probe unit.
- a plunger as a needle portion is brought into contact with a contact object such as a crystal display substrate, a TAB, or a package substrate (PKG) to take out an electric signal, and through an external circuit through a signal transmission line such as a lead conductor.
- a contact object such as a crystal display substrate, a TAB, or a package substrate (PKG)
- PKG package substrate
- Conductive contacts such as small conductive contacts, socket pins (SCP), thin probes (THP), etc.
- SCP socket pins
- TTP thin probes
- a conventional electric probe unit used for electrical inspection of a conductor pattern or an electronic element of a printed wiring board includes a plunger as a conductive needle portion, and a holder for supporting the plunger so that it can be protruded and retracted in an axial direction. ⁇ The protruding end of the plunger is protruded from the front end (one axial end) of the holder. The object is brought into resilient contact with the contacted object.
- a conductive contact 100 shown in FIG. 7 is known.
- the conductive contact 100 is provided with a plunger assembly 5 in which a pair of plungers 3, 4 are connected to both ends of a coil spring 2, into a support hole 7 provided in an insulating holder 6, and into the plunger 3. It is mounted by allowing and reciprocating the plungers 3 and 4, and the plungers 3 and 4 are prevented from falling out when they protrude outward.
- the holder 6 is composed of an intermediate insulator 8, an upper insulator 9 and a lower insulator 10 stacked one above the other with the intermediate insulator 8 interposed therebetween, and the plungers 1 and 4 are Each part has a stepped body with different diameters, and this step is The diameter is fixed to the side insulator 9 and the lower insulator 10 to prevent it from falling off.
- the projecting end of the upper plunger 3 is elastically connected to a lead conductor (not shown) fixed to a wiring plate (not shown) stacked on the holder 6.
- the protruding end of the lower plunger 4 is resiliently brought into contact with a contact object (not shown) to be inspected, thereby forming a printed circuit formed on the substrate. Is inspected for short circuit or disconnection.
- the conductive contact 100 is provided when foreign matter is interposed between the plunger 3 or 4 and the holder 6 to prevent the plunger 3 or 4 from coming and going, or the plunger 3 or 4 When the is broken, replace the plunger assembly 5 in order to avoid a decrease in inspection accuracy due to poor contact with the lead conductors or the contact object to be inspected.
- the arrangement pitch is set to, for example, 0.1 in order to cope with the fine pitch of the contacted object (higher processing speed, finer pitch with the miniaturization and thinner chip).
- the upper insulator 9 (or lower insulator 10) must be detached from the intermediate insulator 8, positioned, and re-attached. Disassembly and reassembly are required, requiring a high degree of skill. Disclosure of the invention
- An object of the present invention is to provide a conductive contact that can easily replace a plunger assembly without disassembling and reassembling a holder.
- the present invention provides an insulator having a support hole, a lead conductor exposed at one end of the support hole, a first conductor portion exposed to the outside at the other end of the support hole, and A resilient conductor assembly comprising a second conductor portion in contact with the lead conductor, the resilient conductor assembly being retained in the support hole and being attached thereto;
- the insulator is characterized in that the insulator is separated to allow access to the inside of the support hole.
- FIG. 1 is a perspective view of an electric probe unit according to one embodiment of the present invention.
- FIG. 2 is a sectional view of a conductive contact of the electric probe unit of FIG. 1 of the present invention.
- FIG. 3 is a perspective view of a lead conductor of the conductive contact of FIG.
- FIG. 5 is a cross-sectional view of a conductive contact of an electric utility unit according to another embodiment of the present invention.
- FIG. 7 is a sectional view of a main part of a conductive contact of a conventional electric probe unit.
- FIG. 1 shows an electric unit PU according to a first embodiment of the present invention.
- the probe unit PU is configured as a probe card and has a relatively large board, a double-sided performance board H2, and a relatively flat transformer board, a relatively small relay board screwed under the performance port H2.
- H1 and one or more electrical probe modules PM are screwed under the transformer H1.
- Professional united PU The probe module PM is supported by a computer-assisted multi-axis positioning robot (not shown) called “Tesu”, and can be mounted on a printed circuit board, microchip, or semiconductor wafer at any position in the design space area. Inspection body
- the electric probe module PM is incorporated in a substantially flat insulating module housing MH fixed to the transformer H1 and in a module housing MH, for example, with a contact lower end at a design distance of about 0.15 mm. It consists of a plurality (four in this embodiment) of electric probe blocks PB arranged exclusively for the target as a matrix of hundreds and thousands of conductive contacts 1 exposed to the outside. Each probe 1 is connected to a corresponding lead conductor of a wiring board stacked on the transformer H1.
- FIG. 2 shows an optional conductive contact 1 of the electric probe unit PU of FIG.
- the probe unit PU is composed of a probe holder 6 as an insulating plate fixed to the module housing MH and a wiring plate 11 as an insulating substrate on which a lead conductor 12 is laminated and formed on the probe holder 6.
- a probe holder 6 as an insulating plate fixed to the module housing MH
- a wiring plate 11 as an insulating substrate on which a lead conductor 12 is laminated and formed on the probe holder 6.
- the conductive contact 1 has a plunger assembly 5 having a pair of plungers 3 and 4 fixed to both ends of a coil spring 2, and a supporting hole 7 provided in an insulating holder 6 and a plunger 3 and 4.
- the reciprocating movement is allowed and received.
- the one end side of the banger 4 protrudes outward and is installed in a state where it is prevented from falling out.
- the other end of the banger 3 is mounted on the holder 6 and the wiring plate 11 laminated on the holder 6 1
- the lead conductor 1 of the wiring plate 1 Elastic contact with 2 and connect it electrically.
- Plungers 3 and 4 are made of 0.1 mm outer diameter tool steel (SK), which is pre-treated with Ni plating and finished with Au plating.
- the coil spring 2 is made of a spiral piano wire (SWP A) which is ground-treated with a 0.3 mm thick M plating and finished with a 0.3 mm to 0.5 m thick Au plating.
- SWP A spiral piano wire
- the plunger assembly 5 is inserted into and removed from the support hole 7 through the opening 9a on the lamination side of the wiring plate 11 of the support hole ⁇ .
- the holder 6 includes an intermediate insulator 8 and an upper insulator 9 and a lower insulator 10 which are vertically stacked with the intermediate insulator 8 interposed therebetween.
- the support hole 7 is constituted by mutually communicating through holes 8a, 9a, 10a formed concentrically with the insulators 8, 9, 10 respectively.
- the support hole 7 has the through holes 9a and 10a communicating with the upper side and the lower side of the through hole 8a, respectively, so that the through holes 8a and 9a have substantially the same diameter, and the through hole 10a
- the hole diameter of a is set smaller than the through hole 8a.
- the end of the support hole 7 on the side of the wiring plate 11 is constituted by the through hole 9a.
- the plungers 3 and 4 are provided with enlarged diameter body portions 3 a and 4 a having a diameter that can be slid while being guided by the through holes 8 a and 9 a, and a diameter capable of winding the coil end of the coil spring 2.
- the needle portion 4c is guided by the through hole 10a of the lower insulator 10 and has a diameter capable of moving up and down.
- the plunger assembly 5 is fixed to the plungers 3 and 4 by press-fitting the bosses 3 b and 4 b into both ends of the coil spring 2.
- the connection of plungers 3 and 4 can also be made by brazing, soldering or using an adhesive.
- the plunger assembly 5 is inserted into the support hole 7 from the opening 9 a side of the support hole 7, with the needle 4 c of the plunger 4 leading, and the end face of the body 4 a is placed on the lower insulator 10.
- the needle portion 4c is received in the support hole 7 with the needle portion 4c protruding outward from the lower insulator 10 through the through hole 10a.
- the plunger 3 connected to the other end of the coil spring 2 is not prevented from coming off. It protrudes outward from the opening 9a of the support hole 7 by the free length of the coil spring 2.
- a wiring plate 11 which is also a part of the holder 6 is laminated on the upper surface of the upper insulator 9, and the wiring plate 11 has a large-diameter holding hole at a portion facing the opening 9 a of the support hole 7.
- 11a is provided at a predetermined depth.
- the holding hole 11a receives a substantially circular flat portion 12a formed at the end of a lead conductor 12 made of a single wire such as an enamel wire as a signal transmission line.
- the flat portion 1 2 a may be formed by press-working the end of the lead conductor 12 in a direction perpendicular to the axis and plastically deforming the end portion, as shown in FIG.
- the outer diameter of the lead conductor 12 (the outer diameter of the enameled wire) is formed larger than the outer diameter d (d + c) of a substantially circular shape.
- the lead conductor 12 extends outward through a lead conductor ⁇ through hole 1 1b as a small-diameter hole provided in the wiring plate 11 so as to communicate with the holding hole 11a, and as a measuring instrument. Connected to the external circuit 13.
- the lead conductor through-hole 11 b is large enough to prevent the flat portion 12 a from coming off, and has a diameter that allows the lead conductor 12 to pass through.
- the flat portion 1 2a received in the holding hole 1 1a is prevented from falling off in the extending direction of the lead conductor 1 2 by the step portion of the holding hole 11 1a and the lead conductor ⁇ through hole 1 1b. .
- the retaining holes are considered part of the support holes.
- the axial end face 1 2 b of the lead conductor 12 in which the flat portion 9 a is received in the holding hole 8 a is positioned so as to face the opening 9 a of the support hole 7 from within the holding hole 11 a.
- the needle portion 3c of the plunger 3 comes into contact with the end surface 1 2b temporarily.
- a probe unit is formed by arranging a plurality of conductive contacts 1 at predetermined pitches in the vertical and horizontal directions, and by bringing the probe close to the inspection target, for example, the semiconductor chip mounting substrate 14, the probe needle can be used as an inspection needle.
- the protruding end of the needle portion 4c of the plunger 4 on the side is made to abut on the electrode 14a as the contacted body.
- the electric signal picked up by the plunger 4 reaches the end surface 12 b of the lead conductor 12 via the plunger assembly 5 and passes through the lead conductor 12. Transmitted to external circuit 13.
- the conductive contact 1 is attached to the holder 6 when it is necessary to replace the defective plunger, such as when the plunger 3 or 4 does not come and go or when the plunger 3 or 4 is broken.
- the opening 9 a of the support hole 7 can be opened, and the plunger assembly 5 having the defective plunger is pulled out through the opening 9 a. Can be eliminated.
- a new plunger assembly 5 is inserted into the empty support hole 7, and the wiring plate 11 is stacked on the holder 6, so that the plunger assembly 5 can be replaced. This replacement operation does not require disassembly and reassembly of the holder 6 itself, and therefore can be easily performed without requiring a high level of skill.
- the lead conductor 12 need not be made thinner than necessary. Therefore, a conductor having a diameter of 0.8 mm or more can be used without using a conductor having a diameter of 0.07 mm or less, at which the conductor resistance is relatively large.
- the width (d + h) of the flat portion 9a is about 0.10 to 0.11 mm, and the fine pitch is reduced. Even if the pitch is about 0.15 mm, the holding hole 11a can be formed without interference between adjacent conductive contacts.
- FIG. 4 shows a conductive contact 20 according to a second embodiment of the present invention from which the wiring plate 11 is omitted.
- This conductive contact 20 differs from the conductive contact 1 in the shape of one plunger 3 constituting the plunger assembly 5.
- a needle portion 3f electrically connected to the lead conductor 12 is formed as a tip of the rod-shaped body 3d.
- the needle portion 3f is formed by forming the tip of the rod-shaped body 3d into a sharp conical portion. This may be a flat surface or the like, and an appropriate shape is selected.
- the plunger 3 has a connecting boss 3 e protruding from the rear end of the rod-shaped body 3 d, and is press-fitted to the connecting boss 3 e and connected to the end of the coil spring 2. .
- the plunger 4 is connected to the other end of the coil spring 2 as in the above embodiment.
- the holder 6 of the conductive contact 20 is composed of two intermediate insulators 15 and 16, an upper insulator 9 and a lower insulator 9 which are vertically stacked with the intermediate insulators 15 and 16 interposed therebetween. It is composed of an insulator 10.
- the support hole 7 is formed by mutually communicating through holes 9 a, 10 a, 15 a, and 16 a formed concentrically with the insulators 9, 10, 15, and 16, respectively.
- the through holes 9a, 15a, 16a are formed to have substantially the same hole diameter, and the through hole 10a is formed to be smaller than that.
- the opening of the support hole 7 on the lamination side of the wiring plate 11 is formed by the through hole 9a, and the rod-shaped body 3d of the plunger 3 is formed by L9a, 15a, and 16a are formed so that they can move while being guided in the plunger assembly 5, so that the plunger assembly 5 has an opening 9a on the lamination side of the wiring plate 11 of the support hole 7.
- the conductive contact 20 can provide the same function and effect as the above-described embodiment, and can be easily processed because the plunger 13 is not a stepped body, and cost can be reduced.
- FIG. 5 shows a conductive contact 21 according to a third embodiment as a modification of the second embodiment.
- the configuration of the holder 6 of the conductive contact 21 is different from that of the conductive contact 20.
- the holder 6 of the conductive contact 21 is composed of only two intermediate insulators 15 and 16 laminated in two layers, and the support hole 7 has through holes 15 a, 16a and 16b are connected to each other.
- the through hole 16 b is a small hole for guiding the needle portion 4 c of the plunger 4 so as to be slidable, and a through hole 16 a is formed below the intermediate insulator 16.
- the opening of the support hole 7 on the lamination side of the wiring plate 11 is constituted by a through hole 15a, and the plunger assembly 5 is connected to the lamination side of the wiring plate 11 of the support hole 7 on the lamination side. It can be inserted into and removed from the support hole 7 through the opening 15.
- the conductive contact 21 has the same effect as the conductive contact 20 described above, and has a smaller number of parts because the upper insulator 9 and the lower insulator 10 are not used. The assemblability is improved, and the relative positional relationship between the through hole 16a and the through hole 16b forming the support hole 7 can be accurately maintained.
- FIG. 6 shows a conductive contact 22 according to a fourth embodiment as a modification of the third embodiment. The configuration of the wiring plate 11 of the conductive contact 22 differs from that of the conductive contact 21.
- a circuit board or an FPC flexible board
- an example using a circuit board is described. Show.
- a circuit board configured by embedding circuit conductors 26 in the base 25 is used as the wiring plate 11, and the plunger 3 of the plunger assembly 5 has a needle portion 3 f is resiliently brought into contact with the exposed surface 26 a of the circuit conductor 26 exposed on the outer surface of the base 25, thereby achieving electrical connection with the circuit conductor 26.
- the other end 26 b of the circuit conductor 26 is connected to an external circuit 13 as a measuring instrument (see FIG. 1) via an appropriate lead conductor (not shown).
- the conductive contact 22 has the same function and effect as the conductive contact 21.
- a needle-like body having a pair of conductive needles joined to both ends of a coil panel is provided in a support hole provided in a holder made of an insulator. It is received while allowing the body to reciprocate, and the conductive needle-like body at one end protrudes outward and is attached so as not to come off. And a conductive contact having the conductive needle at the other end electrically connected to and attached to a wiring plate laminated on the holder. The wiring plate is inserted into and removed from the support hole through an opening on the lamination side of the wiring plate.
- the opening on the wiring plate stacking side of the support hole can be opened, and the insertion and removal of the plunger assembly into and from the support hole can be performed through this opening.
- a defect occurs in the conductive contact, it is only necessary to remove the wiring plate stacked on the holder without disassembling and reassembling the holder itself, and to remove the defect plunger assembly from the support hole.
- the new plunger assembly can be inserted into the empty support hole, and the wiring plate can be stacked on the holder to complete the replacement of the plunger assembly.
- the conductive needle on the other end side of the needle-shaped body has a needle portion electrically connected to the wiring plate as a tip of a rod-shaped body. Therefore, since the plunger on the other end is not a stepped body portion, the plunger can be easily processed, and the cost can be reduced. Industrial applicability
- the conductive contact which can replace
- the electric probe unit using the conductive contact can be comprised. Can be configured.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
A conductive contactor, wherein a plunger assembly (5) formed by connecting a pair of plungers (3, 4) to both ends of a coiled spring (2) is accepted by a support hole (7) provided in a holder (6) formed of an insulator so that the pair of plungers (3, 4) can be moved reciprocably, the plunger (4) at one end of the coiled spring is projected to the outside and locked, the plunger (3) at the other end is installed so as to be electrically connected to a wiring plate (11) stacked on the holder (6), and the plunger assembly (5) can be inserted into and extracted from the support hole (7) through an opening part (9a) on the wiring plate (11) side of the support hole (7) and the opening part (9a) of the support hole (7) is opened by the separation of the wiring plate (11).
Description
明細書 Specification
導電性接触子及び電気プローブュニット 発明の属する技術分野 TECHNICAL FIELD The present invention relates to a conductive contact and an electric probe unit.
本発明は、 針部としてのプランジャ一を、 ^晶ディスプレイ用基板、 T A B、 あるいはパッケージ基板 (P K G) 等の接触対象に接触させて電気 信号を取り出しリード導体等の信号伝送線を介して外部回路に伝送する、 導電性の小型接触子、 ソケットピン (S C P ) 、 シンプローブ (T H P ) 等の、 導電性接触子 (microcontactor probe)に関する。 本発明はさらに、 複 数の導電性接触子で構成する電気プローブュニットに関する。 背景技術 According to the present invention, a plunger as a needle portion is brought into contact with a contact object such as a crystal display substrate, a TAB, or a package substrate (PKG) to take out an electric signal, and through an external circuit through a signal transmission line such as a lead conductor. Conductive contacts (microcontactor probes), such as small conductive contacts, socket pins (SCP), thin probes (THP), etc. The present invention further relates to an electric probe unit comprising a plurality of conductive contacts. Background art
プリント配線板の導体パターン或いは電子素子等の電気的検査のために 用いられる従来の電気プローブュニットは、 導電性針部としてのプランジ ヤーと、 このプランジャーを軸方向出没自在に支持するホルダと、 プラン ジャーの突出端をホルダの前端 (一方の軸方向端) から突出させる向きに 弹発付勢するコイルばねとからなる導電性接触子をを備えて構成され、 プ ランジャーの突出端を検査対象の被接触体へ弾発的に接触させる。 A conventional electric probe unit used for electrical inspection of a conductor pattern or an electronic element of a printed wiring board includes a plunger as a conductive needle portion, and a holder for supporting the plunger so that it can be protruded and retracted in an axial direction.導電 The protruding end of the plunger is protruded from the front end (one axial end) of the holder. The object is brought into resilient contact with the contacted object.
一例として、 図 7に示す導電性接触子 1 0 0が知られている。 この導電 性接触子 1 0 0は、 コイルばね 2の両端に一対のプランジャー 3 , 4を結 合したプランジャ一アセンブリ 5が、 絶縁性のホルダ 6に設けられた支持 孔 7に、 プランジャー 3 , 4の往復動を許容して受容することにより取り 付けられ、 プランジャー 3, 4が外方へ突出した状態で抜け止めされる。 ホルダ 6は、 中間絶縁体 8と、 この中間絶縁体 8を間に挟んで上下に積 層された上側絶縁体 9および下側絶縁体 1 0とにより構成され、 プランジ ャ一3, 4は、 それぞれ胴部を異径に段付した部分を有し、 この段部を上
側絶縁体 9および下側絶縁体 1 0に径止して抜け止めする。 As an example, a conductive contact 100 shown in FIG. 7 is known. The conductive contact 100 is provided with a plunger assembly 5 in which a pair of plungers 3, 4 are connected to both ends of a coil spring 2, into a support hole 7 provided in an insulating holder 6, and into the plunger 3. It is mounted by allowing and reciprocating the plungers 3 and 4, and the plungers 3 and 4 are prevented from falling out when they protrude outward. The holder 6 is composed of an intermediate insulator 8, an upper insulator 9 and a lower insulator 10 stacked one above the other with the intermediate insulator 8 interposed therebetween, and the plungers 1 and 4 are Each part has a stepped body with different diameters, and this step is The diameter is fixed to the side insulator 9 and the lower insulator 10 to prevent it from falling off.
導電性接触子 1 0 0は、 その使用時、 上側のプランジャー 3の突出端を、 ホルダ 6に積層される配線プレート (図示せず) に固定されたリード導体 (図示せず) へ弾接させて電気的に接続した状態で、 下側のプランジャー 4の突出端を検査対象の被接触体 (図示せず) へ弾発的に接触させ、 これ により、 基板上に形成された印刷回路の短絡或いは断線の有無を検査する。 導電性接触子 1 0 0は、 プランジャー 3又は 4とホルダ 6との間に異物 が介在してプランジャー 3又は 4の弹発的な出没を阻害したとき、 あるい はプランジャー 3又は 4が折損したときに、 リード導体又は検査対象の被 接触体との接触不良に起因した検査精度の低下を回避すべく、 プランジャ —アセンブリ 5を交換する。 When the conductive contact 100 is used, the projecting end of the upper plunger 3 is elastically connected to a lead conductor (not shown) fixed to a wiring plate (not shown) stacked on the holder 6. In this state, the protruding end of the lower plunger 4 is resiliently brought into contact with a contact object (not shown) to be inspected, thereby forming a printed circuit formed on the substrate. Is inspected for short circuit or disconnection. The conductive contact 100 is provided when foreign matter is interposed between the plunger 3 or 4 and the holder 6 to prevent the plunger 3 or 4 from coming and going, or the plunger 3 or 4 When the is broken, replace the plunger assembly 5 in order to avoid a decrease in inspection accuracy due to poor contact with the lead conductors or the contact object to be inspected.
この交換作業は、 被接触体のファインピッチ化 (処理速度の高速化ゃチ ップの小型化,薄型化に伴って、 ファインピッチ化が進んでいる) に対応 すべく配列ピッチを例えば 0 . 2〜0 . 1 5 mmと狭くした導電性接触子 の場合には、 中間絶縁体 8に対する上側絶縁体 9 (または下側絶縁体 1 0 ) の離脱、 位置決め、 再固着作業を伴い、 ホルダの解体および再組付け が必要となって、 高度の熟練が要求される。 発明の開示 In this replacement work, the arrangement pitch is set to, for example, 0.1 in order to cope with the fine pitch of the contacted object (higher processing speed, finer pitch with the miniaturization and thinner chip). In the case of a conductive contact narrowed to 2 to 0.15 mm, the upper insulator 9 (or lower insulator 10) must be detached from the intermediate insulator 8, positioned, and re-attached. Disassembly and reassembly are required, requiring a high degree of skill. Disclosure of the invention
この発明は、 ホルダの解体および再組付けを行うことなく、 プランジャ 一アセンブリを容易に交換できる導電性接触子を提供することを目的とす る。 An object of the present invention is to provide a conductive contact that can easily replace a plunger assembly without disassembling and reassembling a holder.
この目的を達成すべく、 本発明は、 支持孔を備えた絶縁体と、 前記支持 孔の一端に露出するリード導体と、 前記支持孔の他端で外部へ露出する第 1の導体部と前記リ一ド導体に接触する第 2の導体部とからなり前記支持 孔に抜け止め装着された弾発性の導体アセンブリと、 からなる導電性接触
子において、 前記絶縁体を分離して前記支持孔内にアクセス可能にしたこ とを特徴とする。 To achieve this object, the present invention provides an insulator having a support hole, a lead conductor exposed at one end of the support hole, a first conductor portion exposed to the outside at the other end of the support hole, and A resilient conductor assembly comprising a second conductor portion in contact with the lead conductor, the resilient conductor assembly being retained in the support hole and being attached thereto; The insulator is characterized in that the insulator is separated to allow access to the inside of the support hole.
図面の簡単な説明 BRIEF DESCRIPTION OF THE FIGURES
図 1は本発明の一実施形態にかかる電気プローブュニットの斜視図で ある。 FIG. 1 is a perspective view of an electric probe unit according to one embodiment of the present invention.
図 2は本発明の図 1の電気プローブュニットの導電性接触子の断面図 である。 FIG. 2 is a sectional view of a conductive contact of the electric probe unit of FIG. 1 of the present invention.
図 3は図 2の導電性接触子のリ―ド導体の斜視図である。 FIG. 3 is a perspective view of a lead conductor of the conductive contact of FIG.
図 4は本発明の別の実施形態にかかる電気プローブユニットの導電性 接触子の要部断面図である。 FIG. 4 is a cross-sectional view of a main part of a conductive contact of an electric probe unit according to another embodiment of the present invention.
図 5は本発明の別の実施形態にかかる電気プロ一ブュニットの導電性 接触子の断面図である。 FIG. 5 is a cross-sectional view of a conductive contact of an electric utility unit according to another embodiment of the present invention.
図 6は本発明の別の実施形態にかかる電気プローブュニッ卜の導電性 接触子の断面図である。 FIG. 6 is a cross-sectional view of a conductive contact of an electric probe unit according to another embodiment of the present invention.
図 7は従来の電気プローブュニッ卜の導電性接触子の要部断面図であ る。 発明の実施の形態 FIG. 7 is a sectional view of a main part of a conductive contact of a conventional electric probe unit. Embodiment of the Invention
以下、 この発明の実施の形態を添付図面に基づき説明する。 同じ部材は 同じ符号で表わす。 Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. The same members are represented by the same reference numerals.
図 1は本発明の第 1の実施形態にかかる電気プロ一ブュニット P Uを示 す。 このプローブユニット P Uはプローブカードとして構成され、 比較的 大きな基板である両面パフォーマンスボード H 2と、 パフォーマンスポー ド H 2の下側にねじ止めされた比較的小さな中継基板であるほぼ平らなト ランスフォーマ H 1とを備え、 1つ以上の電気プローブモジュール P Mが トランスフォーマ H 1の下側にねじ止めされる。 プロ一ブュニット P Uは
「テス夕」 と呼ばれるコンピュータ援用多軸位置決めロボット (図示せ ず) に支持されて、 プローブモジュール P Mを設計空間領域内の任意な位 置で、 印刷回路基板、 マイクロチップ、 又は半導体ウェハ等の被検査体FIG. 1 shows an electric unit PU according to a first embodiment of the present invention. The probe unit PU is configured as a probe card and has a relatively large board, a double-sided performance board H2, and a relatively flat transformer board, a relatively small relay board screwed under the performance port H2. H1 and one or more electrical probe modules PM are screwed under the transformer H1. Professional united PU The probe module PM is supported by a computer-assisted multi-axis positioning robot (not shown) called “Tesu”, and can be mounted on a printed circuit board, microchip, or semiconductor wafer at any position in the design space area. Inspection body
(図示せず) の検査に最適な姿勢に設定され、 電気接触による探針により、 導通又は性能チェック等の電流データ又は信号を取得又は抽出する。 (Not shown) It is set to the optimal posture for the inspection, and acquires or extracts current data or signals such as continuity or performance check by the probe by electric contact.
電気プローブモジュール P Mは、 トランスフォーマ H 1に固定されたほ ぼ平らな絶縁性のモジユールハウジング MHと、 モジユールハゥジング M Hに組み込まれ、 例えば約 0 . 1 5 mmの設計距離で接触下端部が外側に露 出する数百数千の導電性接触子 1のマトリックスとして対象専用に配列さ れた複数 (本形態では 4つ) の電気プローブブロック P Bとからなる。 各 プローブ 1はトランスフォーマ H 1に積層される配線基板の対応するリー ド導体に接続される。 The electric probe module PM is incorporated in a substantially flat insulating module housing MH fixed to the transformer H1 and in a module housing MH, for example, with a contact lower end at a design distance of about 0.15 mm. It consists of a plurality (four in this embodiment) of electric probe blocks PB arranged exclusively for the target as a matrix of hundreds and thousands of conductive contacts 1 exposed to the outside. Each probe 1 is connected to a corresponding lead conductor of a wiring board stacked on the transformer H1.
図 2は、 図 1の電気プローブュニット P Uの任意な導電性接触子 1を示 す。 FIG. 2 shows an optional conductive contact 1 of the electric probe unit PU of FIG.
プローブユニット P Uはモジュ一ルハゥジング M Hに固定された絶縁板 部としてのプローブホルダ 6と、 プローブホルダ 6上に積層されリ一ド導 体 1 2が形成された絶縁基板としての配線プレート 1 1とを有する。 The probe unit PU is composed of a probe holder 6 as an insulating plate fixed to the module housing MH and a wiring plate 11 as an insulating substrate on which a lead conductor 12 is laminated and formed on the probe holder 6. Have.
この導電性接触子 1は、 コイルばね 2の両端に一対のプランジャー 3 , 4を固着したプランジャーアセンブリ 5を、 絶縁性のホルダ 6に設けた支 持孔 7に、 プランジャー 3, 4の往復動を許容して受容し、 一端側のブラ ンジャー 4は外方へ突出させ抜け止めした状態で取り付け、 他端側のブラ ンジャー 3はホルダ 6に積層された配線プレート 1 1のリード導体 1 2へ 弾接させ電気的に接続して取り付ける。 プランジャー 3 , 4は Niメツキで 下地処理し Auメツキで仕上げた外径 0 . 1 mmの工具鋼 (S K) からなる。 コイルばね 2は厚さ 0 . 3 / mの Mメツキで下地処理し厚さ 0 . 3〜 0 . 5 mの Auメツキで仕上げた螺旋状のピアノ線 (S WP A) からなる。
プランジャーアセンブリ 5は、 支持孔 Ίの配線プレート 1 1の積層側の 開口部 9 aを介して、 支持孔 7に挿抜自在に組み付けられる。 The conductive contact 1 has a plunger assembly 5 having a pair of plungers 3 and 4 fixed to both ends of a coil spring 2, and a supporting hole 7 provided in an insulating holder 6 and a plunger 3 and 4. The reciprocating movement is allowed and received. The one end side of the banger 4 protrudes outward and is installed in a state where it is prevented from falling out. The other end of the banger 3 is mounted on the holder 6 and the wiring plate 11 laminated on the holder 6 1 The lead conductor 1 of the wiring plate 1 Elastic contact with 2 and connect it electrically. Plungers 3 and 4 are made of 0.1 mm outer diameter tool steel (SK), which is pre-treated with Ni plating and finished with Au plating. The coil spring 2 is made of a spiral piano wire (SWP A) which is ground-treated with a 0.3 mm thick M plating and finished with a 0.3 mm to 0.5 m thick Au plating. The plunger assembly 5 is inserted into and removed from the support hole 7 through the opening 9a on the lamination side of the wiring plate 11 of the support hole Ί.
ホルダ 6は中間絶縁体 8と、 この中間絶縁体 8を間に挟んで上下に積層 した上側絶縁体 9および下側絶縁体 1 0とにより構成される。 支持孔 7は 各絶縁体 8, 9, 1 0に同心に穿設された貫通孔 8 a, 9 a, 1 0 aを相 互に連通させて構成する。 The holder 6 includes an intermediate insulator 8 and an upper insulator 9 and a lower insulator 10 which are vertically stacked with the intermediate insulator 8 interposed therebetween. The support hole 7 is constituted by mutually communicating through holes 8a, 9a, 10a formed concentrically with the insulators 8, 9, 10 respectively.
すなわち、 支持孔 7は、 貫通孔 8 aの上側および下側にそれぞれ貫通孔 9 aおよび 1 0 aを連通させ、 貫通孔 8 aと 9 aとを略同径とし、 かつ貫 通孔 1 0 aの孔径を貫通孔 8 aより小さく設定する。 このため本実施形態 では支持孔 7の配線プレート 1 1の側の端部は貫通孔 9 aで構成される。 プランジャー 3, 4は、 貫通孔 8 a, 9 aで案内されつつ摺動可能な径 を有する拡径胴部 3 a , 4 aと、 コイルばね 2のコイル端部を巻き付け可 能な径を有する胴部 3 a , 4 aに突設された結合ボス部 3 b , 4 bと、 結 合ボス部 3 b , 4 bに対向して拡径胴部 3 a, 4 aに突設された針部 3 c , 4 cとからなる。 針部 4 cは下側絶縁体 1 0の貫通孔 1 0 aで案内されつ つ上下動可能な径を有する。 That is, the support hole 7 has the through holes 9a and 10a communicating with the upper side and the lower side of the through hole 8a, respectively, so that the through holes 8a and 9a have substantially the same diameter, and the through hole 10a The hole diameter of a is set smaller than the through hole 8a. For this reason, in the present embodiment, the end of the support hole 7 on the side of the wiring plate 11 is constituted by the through hole 9a. The plungers 3 and 4 are provided with enlarged diameter body portions 3 a and 4 a having a diameter that can be slid while being guided by the through holes 8 a and 9 a, and a diameter capable of winding the coil end of the coil spring 2. Connecting bosses 3 b, 4 b projecting from the trunks 3 a, 4 a, and projecting from the enlarged diameter body 3 a, 4 a facing the coupling bosses 3 b, 4 b Needle portions 3c and 4c. The needle portion 4c is guided by the through hole 10a of the lower insulator 10 and has a diameter capable of moving up and down.
プランジャーアセンブリ 5は、 コイルばね 2の両端部にボス部 3 b, 4 bを圧入してプランジャー 3および 4に固着する。 このプランジャー 3お よび 4の結合は他にロー付け、 半田付け、 あるいは接着剤を用いて行うこ ともできる。 The plunger assembly 5 is fixed to the plungers 3 and 4 by press-fitting the bosses 3 b and 4 b into both ends of the coil spring 2. The connection of plungers 3 and 4 can also be made by brazing, soldering or using an adhesive.
プランジャーアセンブリ 5は、 支持孔 7の開口部 9 a側から、 プランジ ヤー 4の針部 4 cを先頭にして支持孔 7に揷入し、 胴部 4 aの端面を下側 絶縁体 1 0の内面に突き当てて抜け止めし、 針部 4 cを貫通孔 1 0 aを介 して下側絶縁体 1 0の外方へ突出させた状態で、 支持孔 7に受容する。 こ の受容状態では、 配線プレート 1 1が積層されていないので、 コイルばね 2の他方の端部に結合したプランジャー 3は、 抜け止めされることなく、
コイルばね 2の自由長の分だけ支持孔 7の開口部 9 aから外方へ突出する。 上側絶縁体 9の上面には、 ホルダ 6の一部ともなる配線プレート 1 1が 積層され、 その配線プレート 1 1には、 支持孔 7の開口部 9 aに対向する 部分に大径な保持孔 1 1 aが所定深さにて設けられる。 保持孔 1 1 aには、 信号伝送線としてエナメル線などの単線からなるリ一ド導体 1 2の端部に 形成された略円形扁平部 1 2 aが受容される。 この扁平部 1 2 aは、 図 2 に示されるように、 リード導体 1 2の端部を軸線に直交する向きにプレス 加工して塑性変形させたものでも良く、 それにより、 図に示されるように リード導体 1 2の外径 (エナメル線の外径) dよりも拡径 (d + c され た略円形の形状に形成される。 The plunger assembly 5 is inserted into the support hole 7 from the opening 9 a side of the support hole 7, with the needle 4 c of the plunger 4 leading, and the end face of the body 4 a is placed on the lower insulator 10. The needle portion 4c is received in the support hole 7 with the needle portion 4c protruding outward from the lower insulator 10 through the through hole 10a. In this receiving state, since the wiring plate 11 is not laminated, the plunger 3 connected to the other end of the coil spring 2 is not prevented from coming off. It protrudes outward from the opening 9a of the support hole 7 by the free length of the coil spring 2. A wiring plate 11 which is also a part of the holder 6 is laminated on the upper surface of the upper insulator 9, and the wiring plate 11 has a large-diameter holding hole at a portion facing the opening 9 a of the support hole 7. 11a is provided at a predetermined depth. The holding hole 11a receives a substantially circular flat portion 12a formed at the end of a lead conductor 12 made of a single wire such as an enamel wire as a signal transmission line. As shown in FIG. 2, the flat portion 1 2 a may be formed by press-working the end of the lead conductor 12 in a direction perpendicular to the axis and plastically deforming the end portion, as shown in FIG. The outer diameter of the lead conductor 12 (the outer diameter of the enameled wire) is formed larger than the outer diameter d (d + c) of a substantially circular shape.
リード導体 1 2は、 保持孔 1 1 aに連通するように配線プレート 1 1に 設けられた小径孔部としてのリード導体揷通孔 1 1 bを介して外方に延出 し、 測定器としての外部回路 1 3に接続される。 リード導体揷通孔 1 1 b は、 上記扁平部 1 2 aを抜け止めする大きさであってリード導体 1 2を揷 通可能な程度の径で開口する。 保持孔 1 1 aに受容された扁平部 1 2 aが、 保持孔 1 1 aとリード導体揷通孔 1 1 bとの段部により、 リード導体 1 2 の延出方向に対し抜け止めされる。 保持穴は支持穴の一部と見なす。 , 保持孔 8 aに扁平部 9 aが受容されたリ一ド導体 1 2の軸線方向端面 1 2 b力 保持孔 1 1 a内から支持孔 7の開口部 9 aに臨むよう位置になり、 その端面 1 2 bにプランジャー 3の針部 3 cが弹発的に当接する。 The lead conductor 12 extends outward through a lead conductor 揷 through hole 1 1b as a small-diameter hole provided in the wiring plate 11 so as to communicate with the holding hole 11a, and as a measuring instrument. Connected to the external circuit 13. The lead conductor through-hole 11 b is large enough to prevent the flat portion 12 a from coming off, and has a diameter that allows the lead conductor 12 to pass through. The flat portion 1 2a received in the holding hole 1 1a is prevented from falling off in the extending direction of the lead conductor 1 2 by the step portion of the holding hole 11 1a and the lead conductor 揷 through hole 1 1b. . The retaining holes are considered part of the support holes. The axial end face 1 2 b of the lead conductor 12 in which the flat portion 9 a is received in the holding hole 8 a is positioned so as to face the opening 9 a of the support hole 7 from within the holding hole 11 a. The needle portion 3c of the plunger 3 comes into contact with the end surface 1 2b temporarily.
複数の導電性接触子 1を縦横に所定ピッチで配設してプローブュニット を構成し、 そのプローブを検査対象である例えば半導体チップ搭載用基板 1 4に近接させることにより、 検査針としての下側のプランジャー 4の針 部 4 cの突出端を、 被接触体としての電極 1 4 aに弹発的に当接させる。 このプランジャー 4で取り出した電気信号は、 プランジャ一アセンブリ 5 を介して、 リード導体 1 2の端面 1 2 bに達し、 リード導体 1 2を介して
外部回路 1 3に伝送される。 A probe unit is formed by arranging a plurality of conductive contacts 1 at predetermined pitches in the vertical and horizontal directions, and by bringing the probe close to the inspection target, for example, the semiconductor chip mounting substrate 14, the probe needle can be used as an inspection needle. The protruding end of the needle portion 4c of the plunger 4 on the side is made to abut on the electrode 14a as the contacted body. The electric signal picked up by the plunger 4 reaches the end surface 12 b of the lead conductor 12 via the plunger assembly 5 and passes through the lead conductor 12. Transmitted to external circuit 13.
導電性接触子 1は、 プランジャー 3又は 4が弹発的な出没しない場合、 あるいはプランジャー 3又は 4が折損した場合等、 欠陥プランジャーの交 換の必要が生じたときに、 ホルダ 6に積層された配線プレート 1 1を離脱 させることにより、 支持孔 7の開口部 9 aを開放することができ、 この開 口部 9 aを介して、 欠陥プランジャーを備えたプランジャーアセンブリ 5 を引き抜いて排除することができる。 また空になった支持孔 7に新たなプ ランジャーアセンブリ 5を揷入し、 配線プレート 1 1をホルダ 6に積層し て、 プランジャーアセンブリ 5の交換作業を行える。 この交換作業は、 ホ ルダ 6自体の解体および再組付けを伴うことがないので、 高度の熟練を要 することなく容易に行うことができる。 The conductive contact 1 is attached to the holder 6 when it is necessary to replace the defective plunger, such as when the plunger 3 or 4 does not come and go or when the plunger 3 or 4 is broken. By detaching the stacked wiring plates 11, the opening 9 a of the support hole 7 can be opened, and the plunger assembly 5 having the defective plunger is pulled out through the opening 9 a. Can be eliminated. In addition, a new plunger assembly 5 is inserted into the empty support hole 7, and the wiring plate 11 is stacked on the holder 6, so that the plunger assembly 5 can be replaced. This replacement operation does not require disassembly and reassembly of the holder 6 itself, and therefore can be easily performed without requiring a high level of skill.
また、 この導電性接触子 1にあっては、 リード導体 1 2を必要以上に細 いものにしなくて良い。 したがって、 導線抵抗が比較的大きくなる直径 0 . 0 7 mm以下の導線を用いずに、 直径 0 8 mm以上の導線を使用する ことができる。 例えば直径 0 . 0 8〜0 . 0 9 mmの導線の場合には、 扁 平部 9 aの幅 (d +ひ) は 0 . 1 0〜0 . 1 1 mm程度になり、 ファイン ピッチ化によりピッチが 0 . 1 5 mm程度になつても、 隣り合う導電性接 触子間で干渉することなく保持孔 1 1 aを形成することができる。 In the conductive contact 1, the lead conductor 12 need not be made thinner than necessary. Therefore, a conductor having a diameter of 0.8 mm or more can be used without using a conductor having a diameter of 0.07 mm or less, at which the conductor resistance is relatively large. For example, in the case of a conductor having a diameter of 0.08 to 0.09 mm, the width (d + h) of the flat portion 9a is about 0.10 to 0.11 mm, and the fine pitch is reduced. Even if the pitch is about 0.15 mm, the holding hole 11a can be formed without interference between adjacent conductive contacts.
図 4は、 本発明の第 2の実施形態としての、 配線プレート 1 1を省略し た導電性接触子 2 0を示す。 この導電性接触子 2 0は、 導電性接触子 1に 較べ、 プランジャーアセンブリ 5を構成する一方のプランジャー 3の形状 が異なる。 · 本実施形態のブランジャー 3は、 棒状胴部 3 dの先端部として、 リ一ド 導体 1 2に電気的に接続する針部 3 fが形成されている。 本実施形態では、 針部 3 fは、 棒状胴部 3 dの先端部を先鋭状の円錐部に形成して構成する。 これは平坦面その他でもよく、 適宜形状を選択する。
このプランジャー 3は、 棒状胴部 3 dの後端に結合ボス部 3 eが突出形 成されており、 この結合ボス部 3 eを圧入させてコイルばね 2の端部に結 合されている。 コイルばね 2の他方の端部には、 前記実施形態と同様にプ ランジャー 4が結合される。 FIG. 4 shows a conductive contact 20 according to a second embodiment of the present invention from which the wiring plate 11 is omitted. This conductive contact 20 differs from the conductive contact 1 in the shape of one plunger 3 constituting the plunger assembly 5. · In the plunger 3 of the present embodiment, a needle portion 3f electrically connected to the lead conductor 12 is formed as a tip of the rod-shaped body 3d. In the present embodiment, the needle portion 3f is formed by forming the tip of the rod-shaped body 3d into a sharp conical portion. This may be a flat surface or the like, and an appropriate shape is selected. The plunger 3 has a connecting boss 3 e protruding from the rear end of the rod-shaped body 3 d, and is press-fitted to the connecting boss 3 e and connected to the end of the coil spring 2. . The plunger 4 is connected to the other end of the coil spring 2 as in the above embodiment.
この導電性接触子 20のホルダ 6は、 二層に積層された中間絶縁体 15, 16と、 この中間絶縁体 15, 16を間に挟んで上下に積層された上側絶 縁体 9および下側絶縁体 10とにより構成される。 支持孔 7は、 各絶縁体 9, 10, 15, 16にそれぞれ同心に穿設した貫通孔 9 a, 10 a, 1 5 a, 16 aを相互に連通させて構成する。 貫通孔 9 a, 15 a, 16 a は略同一孔径に形成し、 貫通孔 10 aはそれより縮怪して形成する。 The holder 6 of the conductive contact 20 is composed of two intermediate insulators 15 and 16, an upper insulator 9 and a lower insulator 9 which are vertically stacked with the intermediate insulators 15 and 16 interposed therebetween. It is composed of an insulator 10. The support hole 7 is formed by mutually communicating through holes 9 a, 10 a, 15 a, and 16 a formed concentrically with the insulators 9, 10, 15, and 16, respectively. The through holes 9a, 15a, 16a are formed to have substantially the same hole diameter, and the through hole 10a is formed to be smaller than that.
本実施形態でも、 支持孔 7の配線プレート 11の積層側の開口部は、 貫 通孔 9 aで構成されており、 かつプランジャー 3の棒状胴部 3 dは、 貫通 ? L9 a, 15 a, 16 a内にガイドされつつ移動可能な程度の径に形成さ れているので、 プランジャ一アセンブリ 5は、 支持孔 7の配線プレート 1 1の積層側の開口部 9 aを介して、 支持孔 7に揷抜自在に組み付けられる。 導電性接触子 20は、 前述した実施形態と同様な作用効果を奏すること ができることに加え、 プランジャ一 3が段付き胴部でない分、 容易に加工 することができ、 コストの低減化を図れる。 Also in the present embodiment, the opening of the support hole 7 on the lamination side of the wiring plate 11 is formed by the through hole 9a, and the rod-shaped body 3d of the plunger 3 is formed by L9a, 15a, and 16a are formed so that they can move while being guided in the plunger assembly 5, so that the plunger assembly 5 has an opening 9a on the lamination side of the wiring plate 11 of the support hole 7. Through the support hole 7 so that it can be pulled out freely. The conductive contact 20 can provide the same function and effect as the above-described embodiment, and can be easily processed because the plunger 13 is not a stepped body, and cost can be reduced.
図 5は、 第 2の実施形態の変形例としての第 3の実施形態にかかる導電 性接触子 21を示す。 この導電性接触子 21は、 導電性接触子 20に較べ、 ホルダ 6の構成が異なる。 FIG. 5 shows a conductive contact 21 according to a third embodiment as a modification of the second embodiment. The configuration of the holder 6 of the conductive contact 21 is different from that of the conductive contact 20.
この導電性接触子 21のホルダ 6は、 二層に積層された中間絶縁体 15, 16のみにより構成され、 支持孔 7は各中間絶縁体 15, 16に同心に穿 設した貫通孔 15 a, 16 a, 16 bを相互に連通させて構成される。 貫 通孔 16 bはプランジャー 4の針部 4 cを摺動可能に案内する細孔とし、 中間絶縁体 16の下部に縮怪した貫通孔 16 aを形成する。
本実施形態では、 支持孔 7の配線プレート 1 1の積層側の開口部は、 貫 通孔 1 5 aで構成され、 プランジャーアセンブリ 5は支持孔 7の配線プレ ート 1 1の積層側の開口部 1 5 を介して支持孔 7に挿抜自在に組み付け られる。 The holder 6 of the conductive contact 21 is composed of only two intermediate insulators 15 and 16 laminated in two layers, and the support hole 7 has through holes 15 a, 16a and 16b are connected to each other. The through hole 16 b is a small hole for guiding the needle portion 4 c of the plunger 4 so as to be slidable, and a through hole 16 a is formed below the intermediate insulator 16. In the present embodiment, the opening of the support hole 7 on the lamination side of the wiring plate 11 is constituted by a through hole 15a, and the plunger assembly 5 is connected to the lamination side of the wiring plate 11 of the support hole 7 on the lamination side. It can be inserted into and removed from the support hole 7 through the opening 15.
導電性接触子 2 1は、 前述した導電性接触子 2 0と同様な作用効果を奏 することができることに加え、 上側絶縁体 9および下側絶縁体 1 0を用い ない分、 部品点数が少なく、 組付性が向上し、 支持孔 7を構成する貫通孔 1 6 aと貫通孔 1 6 bとの相対的な位置関係を精度良く保つことができる。 図 6は、 第 3の実施形態の変形例としての第 4の実施形態にかかる導電 性接触子 2 2を示す。 この導電性接触子 2 2は、 導電性接触子 2 1に較べ、 配線プレート 1 1の構成が異なる。 The conductive contact 21 has the same effect as the conductive contact 20 described above, and has a smaller number of parts because the upper insulator 9 and the lower insulator 10 are not used. The assemblability is improved, and the relative positional relationship between the through hole 16a and the through hole 16b forming the support hole 7 can be accurately maintained. FIG. 6 shows a conductive contact 22 according to a fourth embodiment as a modification of the third embodiment. The configuration of the wiring plate 11 of the conductive contact 22 differs from that of the conductive contact 21.
配線プレート 1 1として、 前記したリード導体 1 2を用いたリ一ド導体 構造の他に、 回路基盤や F P C (フレキシブル基盤) も使用可能であるが、 本変形例では回路基盤を用いた例を示す。 As the wiring plate 11, in addition to the lead conductor structure using the lead conductors 12 described above, a circuit board or an FPC (flexible board) can be used. In this modification, an example using a circuit board is described. Show.
すなわち、 本変形例では、 配線プレート 1 1として、 回路導体 2 6を基 盤 2 5内に埋め込んで構成される回路基盤が用いられており、 プランジャ 一アセンブリ 5のプランジャー 3は、 その針部 3 f を、 基盤 2 5の外表面 に露出した回路導体 2 6の露出面 2 6 aに弾発的に当接させて、 回路導体 2 6との電気的な接続を図る。 回路導体 2 6の他方の端部 2 6 bは、 適宜 リード導体 (図示せず) を介して測定器としての外部回路 1 3 (図 1参 •照) に接続する。 That is, in this modified example, a circuit board configured by embedding circuit conductors 26 in the base 25 is used as the wiring plate 11, and the plunger 3 of the plunger assembly 5 has a needle portion 3 f is resiliently brought into contact with the exposed surface 26 a of the circuit conductor 26 exposed on the outer surface of the base 25, thereby achieving electrical connection with the circuit conductor 26. The other end 26 b of the circuit conductor 26 is connected to an external circuit 13 as a measuring instrument (see FIG. 1) via an appropriate lead conductor (not shown).
導電性接触子 2 2も導電性接触子 2 1と同様な作用効果を奏する。 The conductive contact 22 has the same function and effect as the conductive contact 21.
以上の実施形態によれば、 コイルパネの両端に一対の導電性針状体を結 合した針状体アツシが、 絶縁体からなるホルダに設けられた支持孔に、 前 記一対の導電性針状体の往復動を許容して受容されるとともに、 一端側の 導電性針状体が外方へ突出すると共に抜け止めされて取り付けられており、
かつ他端側の導電性針状体が、 前記ホルダに積層される配線プレートに電 気的に接続して取り付けられている導電性接触子において、 前記針状体ァ ッシは、 前記支持孔の前記配線プレートの積層側の開口部を介して、 前記 支持孔に挿抜自在に組み付けられている。 According to the above-described embodiment, a needle-like body having a pair of conductive needles joined to both ends of a coil panel is provided in a support hole provided in a holder made of an insulator. It is received while allowing the body to reciprocate, and the conductive needle-like body at one end protrudes outward and is attached so as not to come off. And a conductive contact having the conductive needle at the other end electrically connected to and attached to a wiring plate laminated on the holder. The wiring plate is inserted into and removed from the support hole through an opening on the lamination side of the wiring plate.
ホルダに積層された配線プレートを離脱させることにより、 支持孔の配 線プレート積層側の開口部を開放することができ、 この開口部を介してプ ランジャーアセンブリの支持孔に対する挿入および引き抜きが可能となる。 したがって、 導電性接触子に欠陥が生じた場合には、 ホルダ自体の解体 および再組付けを伴うことなく、 ホルダに積層された配線プレ一トを離脱 させるのみで、 支持孔から欠陥プランジャーアセンブリを引き抜いて排除 することができると共に、 空になった支持孔に新プランジャーアセンブリ を揷入すると共に配線プレートをホルダに積層してプランジャーァセンブ リの交換を完了することができる。 By detaching the wiring plate stacked on the holder, the opening on the wiring plate stacking side of the support hole can be opened, and the insertion and removal of the plunger assembly into and from the support hole can be performed through this opening. Becomes Therefore, if a defect occurs in the conductive contact, it is only necessary to remove the wiring plate stacked on the holder without disassembling and reassembling the holder itself, and to remove the defect plunger assembly from the support hole. The new plunger assembly can be inserted into the empty support hole, and the wiring plate can be stacked on the holder to complete the replacement of the plunger assembly.
また、 前記針状体アツシの他端側の導電性針状体は、 棒状胴部の先端部 として、 前記配線プレートに電気的に接続する針部が形成されている。 このため、 他端側のプランジャーが、 段付き胴部でない分、 容易に加工 することができ、 ひいてはコストの低減化を図ることができる。 産業上の利用可能性 The conductive needle on the other end side of the needle-shaped body has a needle portion electrically connected to the wiring plate as a tip of a rod-shaped body. Therefore, since the plunger on the other end is not a stepped body portion, the plunger can be easily processed, and the cost can be reduced. Industrial applicability
この発明によれば、 ホルダの解体および再組付けを行うことなく、 ブラ ンジャーアセンブリを容易に交換できる導電性接触子を構成することがで き、 その導電性接触子を用いた電気プローブユニットを構成できる。
ADVANTAGE OF THE INVENTION According to this invention, the conductive contact which can replace | exchange a plunger assembly easily without disassembling and reassembling a holder can be comprised, The electric probe unit using the conductive contact can be comprised. Can be configured.
Claims
1 . 支持孔を備えた絶縁体と、 1. an insulator with support holes;
前記支持孔の一端に露出するリード導体と、 A lead conductor exposed at one end of the support hole,
前記支持孔の他端で外部へ露出する第 1の導体部と、 前記リー ド導体に接触する第 2の導体部とからなり前記支持孔に抜け止め装着され る弾発性の導体アセンブリと、 A resilient conductor assembly comprising a first conductor portion exposed to the outside at the other end of the support hole, and a second conductor portion contacting the lead conductor, the resilient conductor assembly being retained in the support hole and attached;
からなる導電性接触子において、 In the conductive contact comprising:
前記絶縁体を分離して前記支持孔内にアクセス可能にしたこと を特徴とする導電性接触子。 A conductive contact, wherein the insulator is separated so as to be accessible in the support hole.
2 . 請求項 1に記載の導電性接触子において、 前記絶縁体は前記支 持孔の一端が形成された基板と、 前記支持孔の他端が形成されたホルダと の分離可能な積層体からなることを特徴とする導電性接触子。 2. The conductive contact according to claim 1, wherein the insulator is formed of a separable laminate of a substrate having one end of the support hole and a holder having the other end of the support hole. A conductive contact, characterized in that:
3 . 請求項 1又は 2に記載の導電性接触子において、 前記導体ァセ ンブリはコイルパネと、 このコィルバネの両端に固着した一対のプランジ ヤーとからなることを特徴とする導電性接触子。 3. The conductive contact according to claim 1, wherein the conductor assembly includes a coil panel and a pair of plungers fixed to both ends of the coil spring.
4 . 請求項 1から 3のいずれかに記載の導電性接触子において、 前 記第 2の導体部に接触するリ一ド導体の端部に係止部を設け、 前記支持孔 の一端に係合させたことを特徴とする導電性接触子。 4. The conductive contact according to any one of claims 1 to 3, wherein a locking portion is provided at an end of the lead conductor that contacts the second conductor, and the end is connected to one end of the support hole. A conductive contact characterized by being combined.
5 . 請求項 1から 4のいずれかに記載の導電性接触子において、 前 記第 2の導体部を前記支持孔の一端から抜去可能な形状にしたことを特徴 とする導電性接触子。
5. The conductive contact according to any one of claims 1 to 4, wherein the second conductor is shaped to be removable from one end of the support hole.
6 . 請求項 1〜 5のいずれかに記載の導電性接触子を複数個備えて成 ることを特徴とする電気プローブュニット。
6. An electric probe unit comprising a plurality of the conductive contacts according to any one of claims 1 to 5.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000132688A JP2001318107A (en) | 2000-05-01 | 2000-05-01 | Conductive contact |
PCT/JP2001/005224 WO2002103373A1 (en) | 2000-05-01 | 2001-06-19 | Conductive contactor and electric probe unit |
CN01823375.9A CN1267733C (en) | 2000-05-01 | 2001-06-19 | Conductive contactor and electric probe unit |
KR1020037016215A KR100583794B1 (en) | 2000-05-01 | 2001-06-19 | Conductive Contactor and Electrical Probe Unit |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2000132688A JP2001318107A (en) | 2000-05-01 | 2000-05-01 | Conductive contact |
PCT/JP2001/005224 WO2002103373A1 (en) | 2000-05-01 | 2001-06-19 | Conductive contactor and electric probe unit |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002103373A1 true WO2002103373A1 (en) | 2002-12-27 |
Family
ID=26345095
Family Applications (1)
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PCT/JP2001/005224 WO2002103373A1 (en) | 2000-05-01 | 2001-06-19 | Conductive contactor and electric probe unit |
Country Status (3)
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JP (1) | JP2001318107A (en) |
KR (1) | KR100583794B1 (en) |
WO (1) | WO2002103373A1 (en) |
Families Citing this family (5)
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MY131059A (en) * | 2001-12-28 | 2007-07-31 | Nhk Spring Co Ltd | Socket for inspection |
JP4900843B2 (en) | 2008-12-26 | 2012-03-21 | 山一電機株式会社 | Electrical connection device for semiconductor device and contact used therefor |
KR101696240B1 (en) * | 2011-01-14 | 2017-01-13 | 리노공업주식회사 | Probe |
KR101306049B1 (en) * | 2011-10-14 | 2013-09-09 | (주)다솔이엔지 | 4 point probe |
CN106226562A (en) * | 2016-07-11 | 2016-12-14 | 无锡宏纳科技有限公司 | Spring downward cake core test fixture |
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JPS5691492A (en) * | 1979-12-26 | 1981-07-24 | Hitachi Ltd | Method of mounting lead wire |
JPH06180328A (en) * | 1992-12-14 | 1994-06-28 | Ibiden Co Ltd | Printed wiring board inspecting jig |
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KR100583794B1 (en) | 2006-05-25 |
KR20040007691A (en) | 2004-01-24 |
JP2001318107A (en) | 2001-11-16 |
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