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WO2002003450A3 - Automated determination and display of the physical location of a failed cell in an array of memory cells - Google Patents

Automated determination and display of the physical location of a failed cell in an array of memory cells Download PDF

Info

Publication number
WO2002003450A3
WO2002003450A3 PCT/US2001/018729 US0118729W WO0203450A3 WO 2002003450 A3 WO2002003450 A3 WO 2002003450A3 US 0118729 W US0118729 W US 0118729W WO 0203450 A3 WO0203450 A3 WO 0203450A3
Authority
WO
WIPO (PCT)
Prior art keywords
array
display
memory cells
physical location
failed cell
Prior art date
Application number
PCT/US2001/018729
Other languages
French (fr)
Other versions
WO2002003450A2 (en
Inventor
Suntra Anuntapong
Surasit Phurikhup
Wannee Soiluck
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Priority to AU2001268294A priority Critical patent/AU2001268294A1/en
Priority to JP2002507433A priority patent/JP4698119B2/en
Priority to KR10-2003-7000076A priority patent/KR20030019553A/en
Priority to EP01946216A priority patent/EP1307912A2/en
Priority to BR0112154-5A priority patent/BR0112154A/en
Publication of WO2002003450A2 publication Critical patent/WO2002003450A2/en
Publication of WO2002003450A3 publication Critical patent/WO2002003450A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • User Interface Of Digital Computer (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
PCT/US2001/018729 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell in an array of memory cells WO2002003450A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
AU2001268294A AU2001268294A1 (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell inan array of memory cells
JP2002507433A JP4698119B2 (en) 2000-07-03 2001-06-08 Automatic determination and display of the physical location of defective cells in an array of memory cells
KR10-2003-7000076A KR20030019553A (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell in an array of memory cells
EP01946216A EP1307912A2 (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell in an array of memory cells
BR0112154-5A BR0112154A (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell in a memory cell loop

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/609,793 US6560729B1 (en) 2000-07-03 2000-07-03 Automated determination and display of the physical location of a failed cell in an array of memory cells
US09/609,793 2000-07-03

Publications (2)

Publication Number Publication Date
WO2002003450A2 WO2002003450A2 (en) 2002-01-10
WO2002003450A3 true WO2002003450A3 (en) 2002-04-25

Family

ID=24442352

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/018729 WO2002003450A2 (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell in an array of memory cells

Country Status (9)

Country Link
US (1) US6560729B1 (en)
EP (1) EP1307912A2 (en)
JP (1) JP4698119B2 (en)
KR (1) KR20030019553A (en)
CN (1) CN1440570A (en)
AU (1) AU2001268294A1 (en)
BR (1) BR0112154A (en)
TW (1) TW494520B (en)
WO (1) WO2002003450A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6842534B1 (en) * 2000-09-28 2005-01-11 Itt Manufacturing Enterprises, Inc. Detecting material failures in ground locations
JP4246979B2 (en) * 2002-09-05 2009-04-02 株式会社日立製作所 Device management system
US6801470B2 (en) * 2002-12-23 2004-10-05 Intel Corporation Digital regulation circuit
US7418367B2 (en) 2003-10-31 2008-08-26 Hewlett-Packard Development Company, L.P. System and method for testing a cell
JP6657797B2 (en) * 2015-10-30 2020-03-04 富士ゼロックス株式会社 Printing system, display control device and program
CN110879931B (en) * 2018-09-05 2022-04-05 长鑫存储技术有限公司 Visual memory chip repair analysis program inspection method and device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4876685A (en) * 1987-06-08 1989-10-24 Teradyne, Inc. Failure information processing in automatic memory tester
US5720031A (en) * 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
DE19746695A1 (en) * 1996-10-22 1998-06-10 Advantest Corp Flash memory testing system
US5946250A (en) * 1998-02-20 1999-08-31 Advantest Corporation Memory testing apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04278556A (en) * 1991-03-07 1992-10-05 Nec Corp Visual defect analysis system of lsi
JP3256555B2 (en) * 1991-03-18 2002-02-12 株式会社日立製作所 Semiconductor memory failure analysis system and defective cell display output method
JP3526894B2 (en) * 1993-01-12 2004-05-17 株式会社ルネサステクノロジ Nonvolatile semiconductor memory device
US5943437A (en) * 1995-10-09 1999-08-24 Kabushiki Kaisha Kobe Seiko Sho Method and apparatus for classifying a defect on a semiconductor wafer
JPH09270200A (en) * 1996-03-29 1997-10-14 Ando Electric Co Ltd Device and method of failure anaysis of memory cell array
JPH10104314A (en) * 1996-09-27 1998-04-24 Ando Electric Co Ltd Wafer defect analyzer
KR100278926B1 (en) * 1998-05-25 2001-01-15 김영환 Pulley on-chip wafer level burn-in test circuit and its method
US6367042B1 (en) * 1998-12-11 2002-04-02 Lsi Logic Corporation Testing methodology for embedded memories using built-in self repair and identification circuitry
US6294918B1 (en) * 1999-09-23 2001-09-25 Taiwan Semiconductor Manufacturing Company, Ltd Method for locating weak circuit having insufficient driving current in IC chips

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4876685A (en) * 1987-06-08 1989-10-24 Teradyne, Inc. Failure information processing in automatic memory tester
US5720031A (en) * 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
DE19746695A1 (en) * 1996-10-22 1998-06-10 Advantest Corp Flash memory testing system
US5946250A (en) * 1998-02-20 1999-08-31 Advantest Corporation Memory testing apparatus

Also Published As

Publication number Publication date
AU2001268294A1 (en) 2002-01-14
BR0112154A (en) 2003-07-01
JP4698119B2 (en) 2011-06-08
KR20030019553A (en) 2003-03-06
JP2004503041A (en) 2004-01-29
US6560729B1 (en) 2003-05-06
WO2002003450A2 (en) 2002-01-10
CN1440570A (en) 2003-09-03
TW494520B (en) 2002-07-11
EP1307912A2 (en) 2003-05-07

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