WO2001021393A1 - Materiaux thermoconducteur d'un compose hydrophobe devant etre soumis a une gestion thermique - Google Patents
Materiaux thermoconducteur d'un compose hydrophobe devant etre soumis a une gestion thermique Download PDFInfo
- Publication number
- WO2001021393A1 WO2001021393A1 PCT/US2000/025811 US0025811W WO0121393A1 WO 2001021393 A1 WO2001021393 A1 WO 2001021393A1 US 0025811 W US0025811 W US 0025811W WO 0121393 A1 WO0121393 A1 WO 0121393A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- thermally conductive
- particles
- alloys
- substituted
- boron nitride
- Prior art date
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- 150000001875 compounds Chemical class 0.000 title claims abstract description 43
- 239000004020 conductor Substances 0.000 title claims abstract description 34
- 230000002209 hydrophobic effect Effects 0.000 title claims abstract description 26
- 239000002245 particle Substances 0.000 claims abstract description 84
- 229910052582 BN Inorganic materials 0.000 claims abstract description 59
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims abstract description 59
- 239000000463 material Substances 0.000 claims abstract description 43
- 239000000945 filler Substances 0.000 claims abstract description 31
- 238000000034 method Methods 0.000 claims abstract description 21
- 238000000576 coating method Methods 0.000 claims abstract description 18
- 239000011248 coating agent Substances 0.000 claims abstract description 17
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- 239000010936 titanium Substances 0.000 claims description 25
- -1 carbons Substances 0.000 claims description 24
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- 229910052751 metal Inorganic materials 0.000 claims description 18
- 239000002184 metal Substances 0.000 claims description 18
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- 229920001296 polysiloxane Polymers 0.000 claims description 12
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 11
- 150000001336 alkenes Chemical class 0.000 claims description 10
- 125000000217 alkyl group Chemical group 0.000 claims description 10
- 125000003118 aryl group Chemical group 0.000 claims description 10
- 125000004432 carbon atom Chemical group C* 0.000 claims description 10
- 239000001257 hydrogen Substances 0.000 claims description 10
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- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 4
- 150000001247 metal acetylides Chemical class 0.000 claims description 4
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- KEQXNNJHMWSZHK-UHFFFAOYSA-L 1,3,2,4$l^{2}-dioxathiaplumbetane 2,2-dioxide Chemical compound [Pb+2].[O-]S([O-])(=O)=O KEQXNNJHMWSZHK-UHFFFAOYSA-L 0.000 claims description 3
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- YGANSGVIUGARFR-UHFFFAOYSA-N dipotassium dioxosilane oxo(oxoalumanyloxy)alumane oxygen(2-) Chemical compound [O--].[K+].[K+].O=[Si]=O.O=[Al]O[Al]=O YGANSGVIUGARFR-UHFFFAOYSA-N 0.000 claims description 3
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- 238000006731 degradation reaction Methods 0.000 description 2
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- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910002795 Si–Al–O–N Inorganic materials 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical group 0.000 description 1
- 229910001420 alkaline earth metal ion Chemical group 0.000 description 1
- JEWHCPOELGJVCB-UHFFFAOYSA-N aluminum;calcium;oxido-[oxido(oxo)silyl]oxy-oxosilane;potassium;sodium;tridecahydrate Chemical compound O.O.O.O.O.O.O.O.O.O.O.O.O.[Na].[Al].[K].[Ca].[O-][Si](=O)O[Si]([O-])=O JEWHCPOELGJVCB-UHFFFAOYSA-N 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229910052898 antigorite Inorganic materials 0.000 description 1
- 229910000278 bentonite Inorganic materials 0.000 description 1
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- SVPXDRXYRYOSEX-UHFFFAOYSA-N bentoquatam Chemical compound O.O=[Si]=O.O=[Al]O[Al]=O SVPXDRXYRYOSEX-UHFFFAOYSA-N 0.000 description 1
- 150000001639 boron compounds Chemical class 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- UNYSKUBLZGJSLV-UHFFFAOYSA-L calcium;1,3,5,2,4,6$l^{2}-trioxadisilaluminane 2,4-dioxide;dihydroxide;hexahydrate Chemical compound O.O.O.O.O.O.[OH-].[OH-].[Ca+2].O=[Si]1O[Al]O[Si](=O)O1.O=[Si]1O[Al]O[Si](=O)O1 UNYSKUBLZGJSLV-UHFFFAOYSA-L 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 229910052676 chabazite Inorganic materials 0.000 description 1
- 229910001919 chlorite Inorganic materials 0.000 description 1
- 229910052619 chlorite group Inorganic materials 0.000 description 1
- QBWCMBCROVPCKQ-UHFFFAOYSA-N chlorous acid Chemical compound OCl=O QBWCMBCROVPCKQ-UHFFFAOYSA-N 0.000 description 1
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- 239000011162 core material Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- GUJOJGAPFQRJSV-UHFFFAOYSA-N dialuminum;dioxosilane;oxygen(2-);hydrate Chemical compound O.[O-2].[O-2].[O-2].[Al+3].[Al+3].O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O GUJOJGAPFQRJSV-UHFFFAOYSA-N 0.000 description 1
- 229910001649 dickite Inorganic materials 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910001683 gmelinite Inorganic materials 0.000 description 1
- 238000005469 granulation Methods 0.000 description 1
- 230000003179 granulation Effects 0.000 description 1
- 229910052677 heulandite Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 229910052622 kaolinite Inorganic materials 0.000 description 1
- CYPPCCJJKNISFK-UHFFFAOYSA-J kaolinite Chemical compound [OH-].[OH-].[OH-].[OH-].[Al+3].[Al+3].[O-][Si](=O)O[Si]([O-])=O CYPPCCJJKNISFK-UHFFFAOYSA-J 0.000 description 1
- 229910052899 lizardite Inorganic materials 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 1
- 229910001723 mesolite Inorganic materials 0.000 description 1
- 150000001455 metallic ions Chemical class 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 1
- 229910052901 montmorillonite Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052674 natrolite Inorganic materials 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 229910000273 nontronite Inorganic materials 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 150000002892 organic cations Chemical class 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical class [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- SOQBVABWOPYFQZ-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical class [O-2].[O-2].[Ti+4] SOQBVABWOPYFQZ-UHFFFAOYSA-N 0.000 description 1
- 229910001743 phillipsite Inorganic materials 0.000 description 1
- 229920005596 polymer binder Polymers 0.000 description 1
- 239000002491 polymer binding agent Substances 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 229910052903 pyrophyllite Inorganic materials 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229910000275 saponite Inorganic materials 0.000 description 1
- 229910000276 sauconite Inorganic materials 0.000 description 1
- 229910052679 scolecite Inorganic materials 0.000 description 1
- 235000010339 sodium tetraborate Nutrition 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910052678 stilbite Inorganic materials 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- VLCLHFYFMCKBRP-UHFFFAOYSA-N tricalcium;diborate Chemical class [Ca+2].[Ca+2].[Ca+2].[O-]B([O-])[O-].[O-]B([O-])[O-] VLCLHFYFMCKBRP-UHFFFAOYSA-N 0.000 description 1
- IBPRKWGSNXMCOI-UHFFFAOYSA-N trimagnesium;disilicate;hydrate Chemical compound O.[Mg+2].[Mg+2].[Mg+2].[O-][Si]([O-])([O-])[O-].[O-][Si]([O-])([O-])[O-] IBPRKWGSNXMCOI-UHFFFAOYSA-N 0.000 description 1
- CWBIFDGMOSWLRQ-UHFFFAOYSA-N trimagnesium;hydroxy(trioxido)silane;hydrate Chemical compound O.[Mg+2].[Mg+2].[Mg+2].O[Si]([O-])([O-])[O-].O[Si]([O-])([O-])[O-] CWBIFDGMOSWLRQ-UHFFFAOYSA-N 0.000 description 1
- BSVBQGMMJUBVOD-UHFFFAOYSA-N trisodium borate Chemical class [Na+].[Na+].[Na+].[O-]B([O-])[O-] BSVBQGMMJUBVOD-UHFFFAOYSA-N 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- 229910003145 α-Fe2O3 Inorganic materials 0.000 description 1
- 229910006297 γ-Fe2O3 Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3737—Organic materials with or without a thermoconductive filler
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29199—Material of the matrix
- H01L2224/2929—Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/29386—Base material with a principal constituent of the material being a non metallic, non metalloid inorganic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/29393—Base material with a principal constituent of the material being a solid not provided for in groups H01L2224/293 - H01L2224/29391, e.g. allotropes of carbon, fullerene, graphite, carbon-nanotubes, diamond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
Definitions
- This invention relates to modified thermally conductive powders or particulates having a hydrophobic compound coating on substantially the entire surface thereof which can be used to produce thermally conductive materials.
- thermally conductive grease typically a silicone grease
- thermally conductive organic wax to aid in creating a low thermal resistance path between the opposed mating surfaces of the heat source and the heat sink.
- thermally conductive materials are based upon the use of a binder, preferably a resin binder, such as, a silicone, a thermoplastic rubber, a urethane, or an acrylic, into which one or more thermally conductive fillers are distributed.
- thermally conductive, electrically insulative or thermally conductive, electrically conductive fillers are one of two major types: thermally conductive, electrically insulative or thermally conductive, electrically conductive fillers.
- Aluminum oxide, magnesium oxide, zinc oxide, aluminum nitride, and boron nitride are the most often cited types of thermally conductive, electrically insulative fillers used in thermal products. Boron nitride is especially useful in that it has excellent heat transfer characteristics and is relatively inexpensive.
- thermally conductive fillers have a tendency to be hydroscopic.
- boron nitride is generally regarded as hydrophobic, but it inherently contains the hydroscopic impurity boric oxide
- boric oxide contained within the boron nitride powder or particulates adsorbs atmospheric water.
- the adsorbed water in turn, especially in the presence of heat, reacts with boron nitride to form boric acid, a hydrolytic oxidation product of boron nitride and water.
- Boric acid is also hydroscopic and adsorbs water from the atmosphere to accelerate degradation of the boron nitride particles through this autocatalytic reaction process. Over time, sufficient boron nitride degradation can occur in the powder or particulates due to boric acid production to cause insufficient thermal conductivity between the heat sink and the integrated circuit chip.
- the present invention relates to a moisture resistant, thermally conductive material comprising a particulate filler comprising thermally conductive particles having a hydrophobic compound coating, such as, silicone oil, and a binder effective to join together the filler particles.
- a hydrophobic compound coating such as, silicone oil
- Another aspect of the present invention includes an electronic apparatus comprising a heat source, a heat sink, and a layer of a moisture resistant, thermally conductive material made in accordance with the present invention disposed between and in contact with the heat source and the heat sink. Still, another aspect of the present invention includes a moisture resistant, thermally conductive material comprising particles of agglomerated boron nitride having a hydrophobic compound coating, such as, a silicone oil coating. Yet, another aspect of the present invention includes a method of removing heat from a heat source comprising providing a heat sink proximate the heat source and disposing a layer of the moisture resistant, thermally conductive interface material of the present invention between and in contact with the heat source and the heat sink.
- Figure 1 is a partial, perspective view of a layer of a moisture resistant, thermally conductive material made in accordance with the present invention disposed between an integrated circuit chip and a heat sink.
- the present invention relates to a moisture resistant, thermally conductive material which comprises a particulate filler comprising thermally conductive particles having a hydrophobic compound coating, such as, a silicone compound coating, and a binder effective to join together the filler particles.
- a moisture resistant, thermally conductive material has a water absorption rate of less than 1.24 parts per million per square centimeter of particle surface area per minute (ppm/cm •min.), preferably less than 0.12 ppm/cm 2 'min., and a thermal conductivity of at least 0.4 watts/meter °K, preferably at least 1 watt/meter °K.
- thermally conductive material of the present invention can be utilized as a moisture resistant, thermally conductive, and rigid potting compound or circuit board.
- Such binders include polyesters, silicone resins, polyolefins, epoxies, thermoplastics, thermoplastic rubbers, urethane resins, acrylic resins, polyimides, polyamides, waxes, greases, and combinations thereof.
- Thermally conductive particulate fillers of the present invention include both thermally conductive, electrically insulative and thermally conductive, electrically conductive powders and particulates.
- Such fillers comprise various kinds of powders or particulate materials of porous or non- porous inorganic pigments, organic pigments, pearlescent pigments, carbons, metals, mica, mineral silicates, metal oxides, metal hydroxides, metal borides, metal carbides, metal nitrides, ceramics, carbonate minerals, sulfate minerals, phosphate minerals, and combinations thereof.
- Any conventional particle size may be used.
- the particles range in size from about 1 ⁇ m to about 500 ⁇ m.
- the filler may contain a mixture of coarse (greater than about 100 ⁇ m) and fine (about 0.001 ⁇ m to about 100 ⁇ m) particle sizes.
- a compliant material i.e., flexible or low durometer
- the proportion of filler coated with the hydrophobic compound is from about 5 volume % to about 40 volume % of the moisture resistant material, preferably from about 12 volume % to about 30 volume %.
- the proportion of filler coated with the hydrophobic compound is from about 20 volume % to about 70 volume %, preferably from about 50 volume % to about 70 volume %.
- Thermally conductive materials made in accordance with the present invention can be formed or molded into any desired shape.
- the thermal conductivity of the thermally conductive material of the present invention has a direct relationship to the amount of filler contained therein. Accordingly, thermal conductivity of the thermally conductive material of the present invention can be tailored with respect to the amount of filler disposed therein.
- Suitable thermally conductive powders and particulates are described in U.S. Patent Nos. 4,801,445 to Fukui et al., which is incorporated herein by reference. Typical examples of such powder materials are explained below.
- inorganic pigments capable of being modified in accordance with the present invention include, but are not limited to, ultramarine blue (sodium aluminum silicate containing sulfur), prussian blue (ferri ferocyanide), manganese violet, titanium-coated mica, bismuth oxycloride, iron oxides, iron hydroxide, titanium dioxide, titanium lower oxides, chromium hydroxide, and combinations thereof.
- Organic pigments capable of being modified in accordance with the present invention include, but are not limited to, C.I. 15850, C.I. 15850:1, C.I. 15585:1, C.I. 15630, C.I. 15880:1, C.I. 73360, C.I. 12085, C.I. 15865:2, C.I. 12075, C.I. 21110, C.I. 21095, C.I. 11680, C.I. 74160 and zirconium, barium, and aluminum lakes of C.I. 45430, C.I. 45410, C.I. 45100, C.I. 17200, C.I. 45380, C.I. 45190, C.I. 14700, C.I. 15510, C.I. 19140, C.I. 15985, C.I. 45350, C.I. 47005, C.I. 42053, and C.I. 42090, and combinations thereof.
- Pearlescent pigments capable of being modified in accordance with the present invention include, but are not limited to, mica-titanium composite materials containing as a titanium component titanium dioxide, titanium lower oxides, and titanium oxynitride, mica-iron oxide composite materials, bismuth oxychloride, guanine, and combinations thereof. Carbons
- Examples of carbons capable of being modified in accordance with the present invention include, but are not limited to, activated carbon and carbon black particles conventionally used in, for example, coatings and fillers. Although there are no critical limitations to the sizes of the carbon powder particle, such carbon powders typically have a particle size of 0.001 ⁇ m to 200 ⁇ m.
- metals capable of being modified in accordance with the present invention include, but are not limited to, iron, cobalt, nickel, copper, zinc, aluminum, chromium, titanium, zirconium, molybdenum, silver, indium, tin, antimony, tungsten, platinum, gold, and alloys thereof.
- Mineral Silicate
- Examples of the mineral silicates capable of being modified according to the present invention include, but are not limited to, phyllosilicates, tectosilicates, natrolites, heulandites, and zeolites.
- Phyllosilicates and tectosilicates include pyrophyllite, talc, chlorite, chrysotile, antigorite, lizardite, kaolinite, dickite, nacrite, halloyxite, montmorillonite, nontronite, saponite, sauconite, and bentonite.
- Natrolites include natrolite, mesolite, scolecite, and thomsonite.
- Heulandites include heulandite, stilbite, and epistibite.
- Zeolites include analcite, harmontone, phillipsite, chabazite, and gmelinite. These silicate minerals may be used alone or in combination thereof.
- the phyllosilicates may have organic cations at the interface of the layers thereof or may be substituted with alkali metal or alkaline earth metal ions.
- the tectosilicates may include metallic ions in the fine pores thereof.
- Metal Oxide, Hydroxide, Nitride and Oxynitride Metal oxides, hydroxides, nitrides, and oxynitrides capable of being modified according to the present invention include, but are not limited to, boron, aluminum, silicon, titanium, zirconium, zinc, chromium, magnesium, calcium, iron, manganese, cobalt, nickel, and molybdenum oxides, hydroxides, nitrides, and oxynitrides.
- Examples of such compounds are magnesium oxide, magnesium hydroxide, calcium oxide, calcium hydroxides, aluminum oxide, aluminum hydroxide, aluminum nitride, boron nitride, silica, silicon nitride, iron oxides ( ⁇ -Fe 2 O 3 , ⁇ -Fe 2 O 3 , Fe 3 O 4 , FeO), iron hydroxides, titanium dioxide, titanium lower oxides, titanium nitride, zirconium oxide, chromium oxides, chromium hydroxides, chromium nitride, manganese oxides, cobalt oxides, nickel oxides, zinc oxides, boron nitride, Si-Al-O-N compounds, Al-O-N compounds, silicon carbide, titanium carbide and tungsten carbide.
- oxides, hydroxides, nitrides, and oxynitrides may be used alone or in any mixture thereof.
- composite oxides and composite hydroxides such as iron titanate, cobalt titanate, cobalt aluminate also can be used in the present invention.
- Composite materials comprising metal oxides, hydroxides, nitrides, or oxynitrides coated on the core materials (e.g., titanium oxides coated mica, iron oxides coated nylon) can also be used in the present invention.
- core materials e.g., titanium oxides coated mica, iron oxides coated nylon
- porous material in addition to the above-mentioned porous silicate minerals, mica, and metal oxides, examples of other porous materials capable of being modified in accordance with the present invention include, but are not limited to, ceramics and ceramic glasses, such as KA1 2 (A1, Si 3 )O] 0 F 2 , KMg(Al, Si 3 ) O] 0 F 2 , K(Mg, Fe 3 )(Al, Si 3 ) O ⁇ oF ; carbonate minerals, such as, CaCO 3 , MgCO 3 , FeCO 3 , MnCO 3 , ZnCO , CaMg(CO 3 ) 2 , Cu(OH) 2 CO 3 , Cu 3 (OH) 2 (CO 3 ) 2 ; sulfate minerals, such as, BaSO 4 , SrSO 4 , PbSO 4 , CaSO 4 , CaSO 4 -2H 2 O, CaSO 2 -5H 2 O, Cu 4 SO 4 (OH) 6 , KAl 3 (OH
- the preferred thermally conductive particles are boron nitride particles, including porous and bonded boron nitride particles. Particularly preferred are agglomerated boron nitride particles.
- boron nitride can be produced by direct nitriding of borate compounds, such as, boric oxide, boric acid, calcium borates, sodium borates, etc., with an ammonia compound, such as, ammonia and organic amines (e.g., melamine).
- borate compounds such as, boric oxide, boric acid, calcium borates, sodium borates, etc.
- an ammonia compound such as, ammonia and organic amines (e.g., melamine).
- Boron nitride can also be produced by carbothermic reduction of borate compounds in the presence of nitrogen.
- boron nitride can be produced by direct nitridation of elemental boron or boron compounds.
- the boron nitride produced from these methods is typically is in the form of a briquette.
- Boron nitride powder can thereafter be produced by conventional milling.
- Low density agglomerated boron nitride particulates can be made by crushing the briquettes and classifying the agglormerates to target particle size distribution.
- a method of producing high density agglomerated boron nitride particulates is disclosed in U.S. Patent No. 5,898,009 to Shaffer et al, which is incorporated herein by reference.
- Silicon nitride and aluminum nitride particulates are also particularly useful with the present invention. Like boron nitride, silicon nitride and aluminum nitride can also be produced by respective carbothermic reduction of silicon and aluminum compounds in the presence of nitrogen. Silicon nitride and aluminum nitride can as well be respectively produced by direct nitridation of elemental silicon or aluminum compounds. An example of a process for preparing silicon nitride powder is disclosed in U.S. Patent No. 4,514,370, which is incorporated herein by reference.
- Hydrophobic compounds utilized in the present invention include silicone compounds, preferably silicone oils.
- silicone oils are low molecular weight oligomeric siloxanes having the following general structure:
- n is 0-5
- each R is independently selected from hydrogen, a substituted or unsubstituted alkyl having 1 to 8 carbon atoms, a substituted or unsubstituted aryl, a substituted or unsubstituted alkene, OR 1 , and OSiR 1 , and each R is independently selected from hydrogen, a substituted or unsubstituted alkyl having 1 to 8 carbon atoms, a substituted or unsubstituted aryl, and a substituted or unsubstituted alkene.
- the siloxane comprises from about 1 to 4 % by weight of the filler.
- the amount of siloxane varies proportionally with the surface area of the particles. That is, the greater the surface area of the particles, the greater the amount of siloxane needed to coat the particles.
- Siloxanes well suited for use with the present invention are polydimethylsiloxane, polymethylhydrogen siloxane, and combinations thereof.
- polydimethylsiloxane and polymethylhydrogen siloxane preferably comprise about 3 % by weight of the filler when the filler is boron nitride having a particle size of about 5 ⁇ m.
- the siloxane can be coated on the surface of the boron nitride particles in a blender, such as, a ribbon blender, at a temperature between about 20 °C to about 100 °C under either a partial pressure or an inert gas purge.
- a blender such as, a ribbon blender
- the siloxane is introduced into the blender through a spray nozzle, such as, an atomizing nozzle, to produce fine particulates of siloxane.
- boron nitride contains the hydroscopic impurity boric oxide.
- boric oxide contained within the boron nitride particles adsorbs water.
- Boron nitride in turn, especially in the presence of heat, undergoes a hydrolytic oxidation reaction with the adsorbed water to form boric acid.
- Boric acid is also hydroscopic and further degrades the boron nitride particles through this autocatalytic reaction process through continued water adsorption.
- the thermally conductive material containing the boron nitride filler sufficiently degrades and fails to satisfactorily conduct heat away from a heat source. This can result in failure of the heat source due to heat build-up therein.
- aluminum nitride is known to hydrolyze slowly in the presence of atmospheric moisture to form aluminum oxide and/or aluminum hydroxide, materials with a substantially lower thermal conductivity than aluminum nitride. A coating of aluminum oxide and/or aluminum hydroxide on the surface of an aluminum nitride particle can act as a thermal diffusion barrier. For this reason it is desirable to minimize contact between the aluminum nitride particles and atmospheric moisture.
- the thermal conductivity of the thermally conductive material of the present invention is maintained regardless of the atmospheric relative humidity.
- agglomerated boron nitride particles are particularly preferred for the present invention.
- another aspect of the present invention is a moisture resistant, thermally conductive material comprising particles of agglomerated boron nitride having the hydrophobic compound coating.
- an electronic apparatus made in accordance with the present invention includes a heat source 12, such as, an integrated circuit chip, and a heat sink 14.
- a layer 16 of a moisture resistant, thermally conductive interface material made in accordance with the present invention is disposed between and in contact with the heat source 12 and the heat sink 14.
- the layer 16 of the interface material of the present invention can be formed in a variety of shapes and sizes to fill particular needs.
- the heat source 12 is mounted to a circuit board 18 made of a moisture resistant, thermally conductive material in accordance with the present invention to further assist in conducting heat away from the heat source 12.
- the heat source 12, or chip is operably connected to an electrical source (not shown) and operates conventionally.
- the heat is conducted from a heat source outer surface 13 across the layer of thermally conductive interface material of the present invention 16 to a heat sink inner surface 15.
- the heat is thereafter conventionally dissipated to the atmosphere through the heat sink 14, as known in the art.
- the layer of material 16 substantially covers the heat source outer surface 13 and the heat sink inner surface 15, thermal contact resistance is minimized.
- the layer of thermally conductive material 16 is hydrophobic, the thermal conductivity of the layer 16 is maintained regardless of the atmospheric relative humidity, thereby extending the useful life of the material and the apparatus 10.
- another aspect of the present invention includes an electronic apparatus comprising a heat source, a heat sink, and a layer of the moisture resistant, thermally conductive material of the present invention disposed between and in contact with the heat source and the heat sink. Still, another aspect of the present invention includes an electronic apparatus comprising a heat source and a moisture resistant, thermally conductive circuit board made in accordance with the present invention.
- another aspect of the present invention includes a method of removing heat from a heat source comprising providing a heat sink proximate the heat source and disposing a layer of the moisture resistant, thermally conductive interface material of the present invention between and in contact with the heat source and the heat sink.
- Coated and non-coated boron nitride powders were evaluated for hydroscopic affinity in a closed environment at 85 °C, 85 % relative humidity, and ambient pressure for an indicated period of time. The powders were weighted prior to and after moisture exposure to determine the percent increase in weight due to water. The results are reported in Table 1 below.
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Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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JP2001524797A JP2003509578A (ja) | 1999-09-21 | 2000-09-20 | 熱管理のための疎水性化合物における熱伝導性材料 |
GB0204971A GB2370040B (en) | 1999-09-21 | 2000-09-20 | Thermally conductive materials in a hydrophobic compound for thermal management |
DE10085011T DE10085011T1 (de) | 1999-09-21 | 2000-09-20 | Wärmeleitfähige Materialien in einer hydrophoben Verbindung für die Handhabung von Wärme |
AU38868/01A AU3886801A (en) | 1999-09-21 | 2000-09-20 | Thermally conductive materials in a hydrophobic compound for thermal management |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US40016999A | 1999-09-21 | 1999-09-21 | |
US09/400,169 | 1999-09-21 |
Publications (1)
Publication Number | Publication Date |
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WO2001021393A1 true WO2001021393A1 (fr) | 2001-03-29 |
Family
ID=23582496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/025811 WO2001021393A1 (fr) | 1999-09-21 | 2000-09-20 | Materiaux thermoconducteur d'un compose hydrophobe devant etre soumis a une gestion thermique |
Country Status (5)
Country | Link |
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JP (2) | JP2003509578A (fr) |
AU (1) | AU3886801A (fr) |
DE (1) | DE10085011T1 (fr) |
GB (1) | GB2370040B (fr) |
WO (1) | WO2001021393A1 (fr) |
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- 2000-09-20 DE DE10085011T patent/DE10085011T1/de not_active Ceased
- 2000-09-20 GB GB0204971A patent/GB2370040B/en not_active Expired - Fee Related
- 2000-09-20 AU AU38868/01A patent/AU3886801A/en not_active Abandoned
- 2000-09-20 JP JP2001524797A patent/JP2003509578A/ja not_active Withdrawn
- 2000-09-20 WO PCT/US2000/025811 patent/WO2001021393A1/fr active Application Filing
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CN109880043B (zh) * | 2019-01-07 | 2021-04-20 | 江苏大学 | 纳米钛酸铁改性聚氨酯预聚体的制备方法及其抗紫外应用 |
CN109880043A (zh) * | 2019-01-07 | 2019-06-14 | 江苏大学 | 纳米钛酸铁改性聚氨酯预聚体的制备方法及其抗紫外应用 |
US11984570B2 (en) * | 2019-03-06 | 2024-05-14 | Laird Technologies, Inc. | Thermal management and/or EMI mitigation materials including coated fillers |
WO2023250071A1 (fr) * | 2022-06-22 | 2023-12-28 | Henkel Ag & Co. Kgaa | Matériaux d'interface thermique avec dispersions de charge douce |
Also Published As
Publication number | Publication date |
---|---|
GB2370040A (en) | 2002-06-19 |
GB0204971D0 (en) | 2002-04-17 |
DE10085011T1 (de) | 2003-01-16 |
JP2003509578A (ja) | 2003-03-11 |
GB2370040A8 (en) | 2002-06-19 |
GB2370040B (en) | 2003-10-29 |
JP2006241470A (ja) | 2006-09-14 |
AU3886801A (en) | 2001-04-24 |
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