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USD789223S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD789223S1
USD789223S1 US29/573,441 US201629573441F USD789223S US D789223 S1 USD789223 S1 US D789223S1 US 201629573441 F US201629573441 F US 201629573441F US D789223 S USD789223 S US D789223S
Authority
US
United States
Prior art keywords
probe pin
view
probe
pin
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/573,441
Other languages
English (en)
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TERANISHI, HIROTADA, SAKAI, TAKAHIRO
Application granted granted Critical
Publication of USD789223S1 publication Critical patent/USD789223S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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US29/573,441 2016-02-15 2016-08-05 Probe pin Active USD789223S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-003162 2016-02-15
JPD2016-3162F JP1567320S (zh) 2016-02-15 2016-02-15

Publications (1)

Publication Number Publication Date
USD789223S1 true USD789223S1 (en) 2017-06-13

Family

ID=57806280

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/573,441 Active USD789223S1 (en) 2016-02-15 2016-08-05 Probe pin

Country Status (2)

Country Link
US (1) USD789223S1 (zh)
JP (1) JP1567320S (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7789671B2 (en) * 2008-06-16 2010-09-07 Hon Hai Precision Ind. Co., Ltd. Electrical contact with overlapping structure
US7815440B2 (en) * 2008-08-11 2010-10-19 Hon Hai Precision Ind. Co., Ltd. Electrical contact with interlocking arrangement
US8033872B2 (en) * 2010-01-12 2011-10-11 Hon Hai Precision Ind. Co., Ltd. Contact terminal for test socket
US8547128B1 (en) * 2012-05-06 2013-10-01 Jerzy Roman Sochor Contact probe with conductively coupled plungers
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7789671B2 (en) * 2008-06-16 2010-09-07 Hon Hai Precision Ind. Co., Ltd. Electrical contact with overlapping structure
US7815440B2 (en) * 2008-08-11 2010-10-19 Hon Hai Precision Ind. Co., Ltd. Electrical contact with interlocking arrangement
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US8033872B2 (en) * 2010-01-12 2011-10-11 Hon Hai Precision Ind. Co., Ltd. Contact terminal for test socket
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US8547128B1 (en) * 2012-05-06 2013-10-01 Jerzy Roman Sochor Contact probe with conductively coupled plungers

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,425 filed Aug. 5, 2016, in the USPTO.
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,439 filed Aug. 5, 2016, in the USPTO.
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,446 filed Aug. 5, 2016, in the USPTO.

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
JP1567320S (zh) 2017-01-23

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