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USD563247S1 - Three-dimensional measuring instrument - Google Patents

Three-dimensional measuring instrument Download PDF

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Publication number
USD563247S1
USD563247S1 US29/274,516 US27451607F USD563247S US D563247 S1 USD563247 S1 US D563247S1 US 27451607 F US27451607 F US 27451607F US D563247 S USD563247 S US D563247S
Authority
US
United States
Prior art keywords
measuring instrument
dimensional measuring
instrument
view
dimensional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/274,516
Inventor
Mitsuo Ishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Assigned to KABUSHIKI KAISHA TOPCON reassignment KABUSHIKI KAISHA TOPCON ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ISHII, MITSUO
Application granted granted Critical
Publication of USD563247S1 publication Critical patent/USD563247S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

The article is a three-dimensional measuring instrument for lands, structures, vehicles, aircrafts and the like, wherein a laser beam scans on the objects.
FIG. 1 is a perspective view of the instrument taken in front, right-side, upper direction of the three-dimensional measuring instrument;
FIG. 2 is a perspective view of the instrument taken in rear, left-side, upper direction of the instrument;
FIG. 3 is a front view of the instrument;
FIG. 4 is a rear view of the instrument;
FIG. 5 is a left-side view of the instrument;
FIG. 6 is a right-side view of the instrument;
FIG. 7 is a plan view of the instrument; and,
FIG. 8 is a bottom view of the instrument.
In the perspective views of FIGS. 1 and 2, sectioned narrow lines on ridge lines indicate a contour, not indicate patterns. Rectangles in the front view of FIG. 3 and the rear view of FIG. 4 are transparent.

Claims (1)

    CLAIM
  1. The ornamental design for a three-dimensional measuring instrument, as shown.
US29/274,516 2006-10-30 2007-04-30 Three-dimensional measuring instrument Expired - Lifetime USD563247S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006029574 2006-10-30
JP2006-29574 2006-10-30

Publications (1)

Publication Number Publication Date
USD563247S1 true USD563247S1 (en) 2008-03-04

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Family Applications (1)

Application Number Title Priority Date Filing Date
US29/274,516 Expired - Lifetime USD563247S1 (en) 2006-10-30 2007-04-30 Three-dimensional measuring instrument

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US (1) USD563247S1 (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD581819S1 (en) * 2007-06-19 2008-12-02 Sokkia Co., Ltd. Automatic leveling laser marking instrument
USD638318S1 (en) * 2010-03-18 2011-05-24 Riegl Laser Measurement Systems Gmbh Laser scanner
USRE44112E1 (en) * 2009-09-18 2013-04-02 Riegl Laser Measurement Systems Gmbh Laser scanner
USRE44751E1 (en) * 2009-09-18 2014-02-11 Riegl Laser Measurement Systems Gmbh Laser scanner
USD708969S1 (en) * 2013-02-01 2014-07-15 Kabushiki Kaisha Topcon Surveying instrument
USD723398S1 (en) * 2013-08-06 2015-03-03 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension
USD766753S1 (en) * 2015-03-20 2016-09-20 Kabushiki Kaisha Topcon Optical measuring thedolite using light wave
USD788624S1 (en) * 2015-07-16 2017-06-06 Konica Minolta, Inc. Laser emitter/receiver
US10324073B2 (en) 2015-01-16 2019-06-18 Industrial Scientific Corporation Modular gas monitoring system
USD933507S1 (en) * 2019-06-14 2021-10-19 Skope Magnetic Resonance Technologies Ag Measuring instrument for measuring magnetic fields
USD980734S1 (en) 2016-01-15 2023-03-14 Industrial Scientific Corporation Gas monitoring device
USD998478S1 (en) * 2016-01-15 2023-09-12 Industrial Scientific Corporation Gas monitoring device
USD1051965S1 (en) * 2023-05-18 2024-11-19 Topcon Corporation Laser marking instrument for construction
USD1051742S1 (en) * 2020-03-18 2024-11-19 Abb Schweiz Ag Ultrasonic level meter
USD1081415S1 (en) * 2023-04-11 2025-07-01 Pro sp. z o.o. Laser level
USD1081416S1 (en) * 2023-04-11 2025-07-01 Pro sp. z o.o. Laser level

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD504831S1 (en) * 2004-06-02 2005-05-10 Black & Decker Inc. Laser level

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD504831S1 (en) * 2004-06-02 2005-05-10 Black & Decker Inc. Laser level

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD581819S1 (en) * 2007-06-19 2008-12-02 Sokkia Co., Ltd. Automatic leveling laser marking instrument
USRE44112E1 (en) * 2009-09-18 2013-04-02 Riegl Laser Measurement Systems Gmbh Laser scanner
USRE44751E1 (en) * 2009-09-18 2014-02-11 Riegl Laser Measurement Systems Gmbh Laser scanner
USD638318S1 (en) * 2010-03-18 2011-05-24 Riegl Laser Measurement Systems Gmbh Laser scanner
USD708969S1 (en) * 2013-02-01 2014-07-15 Kabushiki Kaisha Topcon Surveying instrument
USD723398S1 (en) * 2013-08-06 2015-03-03 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension
US11408876B2 (en) 2015-01-16 2022-08-09 Industrial Scientific Corporation Modular gas monitoring system
US10324073B2 (en) 2015-01-16 2019-06-18 Industrial Scientific Corporation Modular gas monitoring system
USD766753S1 (en) * 2015-03-20 2016-09-20 Kabushiki Kaisha Topcon Optical measuring thedolite using light wave
USD788624S1 (en) * 2015-07-16 2017-06-06 Konica Minolta, Inc. Laser emitter/receiver
USD799993S1 (en) * 2015-07-16 2017-10-17 Konica Minolta, Inc. Laser emitter/receiver
USD980734S1 (en) 2016-01-15 2023-03-14 Industrial Scientific Corporation Gas monitoring device
USD998478S1 (en) * 2016-01-15 2023-09-12 Industrial Scientific Corporation Gas monitoring device
USD933507S1 (en) * 2019-06-14 2021-10-19 Skope Magnetic Resonance Technologies Ag Measuring instrument for measuring magnetic fields
USD1051742S1 (en) * 2020-03-18 2024-11-19 Abb Schweiz Ag Ultrasonic level meter
USD1081415S1 (en) * 2023-04-11 2025-07-01 Pro sp. z o.o. Laser level
USD1081416S1 (en) * 2023-04-11 2025-07-01 Pro sp. z o.o. Laser level
USD1051965S1 (en) * 2023-05-18 2024-11-19 Topcon Corporation Laser marking instrument for construction

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