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USD525207S1 - Sheet metal interconnect array - Google Patents

Sheet metal interconnect array Download PDF

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Publication number
USD525207S1
USD525207S1 US29/194,881 US19488103F USD525207S US D525207 S1 USD525207 S1 US D525207S1 US 19488103 F US19488103 F US 19488103F US D525207 S USD525207 S US D525207S
Authority
US
United States
Prior art keywords
sheet metal
metal interconnect
interconnect array
array
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/194,881
Inventor
January Kister
James Jaquette
Steve Fahrner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IDI SEMI LLC
Smiths Interconnect Americas Inc
Original Assignee
Antares Contech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US29/194,881 priority Critical patent/USD525207S1/en
Application filed by Antares Contech Inc filed Critical Antares Contech Inc
Assigned to KULICKE & SOFFA INTERCONNECT, INC. reassignment KULICKE & SOFFA INTERCONNECT, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KISTER, JANUARY, FAHRNER, STEVE, JAQUETTE, JAMES
Assigned to K&S INTERCONNECT, INC. reassignment K&S INTERCONNECT, INC. CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME "KULICKE & SOFFA INTERCONNECT, INC." TO "K&S INTERCONNECT, INC." PREVIOUSLY RECORDED ON REEL 015124 FRAME 0112. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT BY JANUARY KISTER, JAMES JAQUETTE, AND STEVE FAHRNER TO K&S INTERCONNECT, INC.. Assignors: KISTER, JANUARY, FAHRNER, STEVE, JAQUETTE, JAMES
Assigned to ANTARES CONTECH,INC. reassignment ANTARES CONTECH,INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: K&S INTERCONNECT, INC.
Assigned to SILICON VALLEY BANK reassignment SILICON VALLEY BANK SECURITY AGREEMENT Assignors: ANTARES CONTECH INC
Application granted granted Critical
Publication of USD525207S1 publication Critical patent/USD525207S1/en
Assigned to SILICON VALLEY BANK reassignment SILICON VALLEY BANK SECURITY AGREEMENT Assignors: ANTARES ADVANCED TEST TECHNOLOGIES, INC.
Assigned to ANTARES ADVANCED TEST TECHNOLOGIES, INC. reassignment ANTARES ADVANCED TEST TECHNOLOGIES, INC. MERGER (SEE DOCUMENT FOR DETAILS). Assignors: ANTARES CONTECH, INC.
Assigned to INTERCONNECT DEVICES, INC. reassignment INTERCONNECT DEVICES, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: IDI SEMI, LLC
Assigned to IDI SEMI, LLC reassignment IDI SEMI, LLC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ANTARES ADVANCED TEST TECHNOLOGIES, INC.
Assigned to ANTARES CONTECH, INC. reassignment ANTARES CONTECH, INC. RELEASE Assignors: SILICON VALLEY BANK
Assigned to ANTARES ADVANCED TEST TECHNOLOGIES, INC. reassignment ANTARES ADVANCED TEST TECHNOLOGIES, INC. RELEASE Assignors: SILICON VALLEY BANK
Assigned to MADISON CAPITAL FUNDING, LLC, AS AGENT reassignment MADISON CAPITAL FUNDING, LLC, AS AGENT FIRST AMENDMENT TO PATENT SECURITY AGREEMENT Assignors: INTERCONNECT DEVICES, INC.
Assigned to INTERCONNECT DEVICES, INC. reassignment INTERCONNECT DEVICES, INC. RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: MADISON CAPITAL FUNDING LLC, AS AGENT
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a top view of sheet metal interconnect array and fixed on an environmental carrier structure in exemplary number of four.
FIG. 2 is a bottom view thereof.
FIG. 3 is a front view thereof.
FIG. 4 is a side view thereof; and,
FIG. 5 is a perspective view thereof.
The broken line showing of the environment is for illustrative purposes only and forms no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a sheet metal interconnect array, substantially as shown and described.
US29/194,881 2003-12-02 2003-12-02 Sheet metal interconnect array Expired - Lifetime USD525207S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/194,881 USD525207S1 (en) 2003-12-02 2003-12-02 Sheet metal interconnect array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/194,881 USD525207S1 (en) 2003-12-02 2003-12-02 Sheet metal interconnect array

Publications (1)

Publication Number Publication Date
USD525207S1 true USD525207S1 (en) 2006-07-18

Family

ID=36659506

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/194,881 Expired - Lifetime USD525207S1 (en) 2003-12-02 2003-12-02 Sheet metal interconnect array

Country Status (1)

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US (1) USD525207S1 (en)

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070152686A1 (en) * 2004-05-21 2007-07-05 January Kister Knee probe having increased scrub motion
US20080001612A1 (en) * 2004-05-21 2008-01-03 January Kister Probes with self-cleaning blunt skates for contacting conductive pads
US20080068035A1 (en) * 2006-09-14 2008-03-20 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
USD573947S1 (en) * 2005-10-05 2008-07-29 Gs Yuasa Corporation Current collecting lead
US20090102495A1 (en) * 2007-10-19 2009-04-23 January Kister Vertical guided probe array providing sideways scrub motion
US7786740B2 (en) 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US7944224B2 (en) 2005-12-07 2011-05-17 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7952377B2 (en) 2007-04-10 2011-05-31 Microprobe, Inc. Vertical probe array arranged to provide space transformation
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US8230593B2 (en) 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
USRE44407E1 (en) 2006-03-20 2013-08-06 Formfactor, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
US20130220678A1 (en) * 2010-11-11 2013-08-29 Kitagawa Industries Co., Ltd. Conductive member and method for producing same
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US8784117B2 (en) * 2012-07-17 2014-07-22 Hon Hai Precision Industry Co., Ltd. Electrical connector with X-type dual spring contacts for lower profile and lattice shielding therewith
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
USD785854S1 (en) 2015-12-15 2017-05-02 Thomas M. DeBellis Concentric mounting plate for light fixtures
USD785853S1 (en) 2015-12-15 2017-05-02 Thomas M. DeBellis Concentric mounting plate for light fixtures
USD898985S1 (en) 2019-01-03 2020-10-13 Thomas M. DeBellis Rectilinear mounting plate for light fixtures
USD899673S1 (en) 2019-01-03 2020-10-20 Thomas M. DeBellis Rectilinear mounting plate for light fixtures

Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD268833S (en) * 1981-04-08 1983-05-03 Aavid Engineering, Inc. Sheet-metal heat sink for electronic semiconductor devices
US5015191A (en) 1990-03-05 1991-05-14 Amp Incorporated Flat IC chip connector
US5139427A (en) 1991-09-23 1992-08-18 Amp Incorporated Planar array connector and flexible contact therefor
US5152695A (en) * 1991-10-10 1992-10-06 Amp Incorporated Surface mount electrical connector
US5173055A (en) 1991-08-08 1992-12-22 Amp Incorporated Area array connector
US5228861A (en) * 1992-06-12 1993-07-20 Amp Incorporated High density electrical connector system
US5232372A (en) * 1992-05-11 1993-08-03 Amp Incorporated Land grid array connector and method of manufacture
US5462440A (en) * 1994-03-11 1995-10-31 Rothenberger; Richard E. Micro-power connector
US5629837A (en) 1995-09-20 1997-05-13 Oz Technologies, Inc. Button contact for surface mounting an IC device to a circuit board
US6029344A (en) 1993-11-16 2000-02-29 Formfactor, Inc. Composite interconnection element for microelectronic components, and method of making same
US6042387A (en) 1998-03-27 2000-03-28 Oz Technologies, Inc. Connector, connector system and method of making a connector
US6375474B1 (en) * 1999-08-09 2002-04-23 Berg Technology, Inc. Mezzanine style electrical connector
US6402526B1 (en) 2000-11-03 2002-06-11 Delphi Technologies, Inc. Microelectronic contact assembly
US6442039B1 (en) 1999-12-03 2002-08-27 Delphi Technologies, Inc. Metallic microstructure springs and method of making same
US20030060061A1 (en) 2001-09-21 2003-03-27 Gonzalez Carlos A. Contact array for semiconductor package
USD472880S1 (en) * 2001-07-23 2003-04-08 Hewlett-Packard Company Electrical contact
USD475021S1 (en) * 2001-07-23 2003-05-27 Hewlett Packard Development Company, L.P. Electrical contact
US6708399B2 (en) * 1999-03-25 2004-03-23 Micron Technology, Inc. Method for fabricating a test interconnect for bumped semiconductor components
US6890185B1 (en) * 2003-11-03 2005-05-10 Kulicke & Soffa Interconnect, Inc. Multipath interconnect with meandering contact cantilevers

Patent Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD268833S (en) * 1981-04-08 1983-05-03 Aavid Engineering, Inc. Sheet-metal heat sink for electronic semiconductor devices
US5015191A (en) 1990-03-05 1991-05-14 Amp Incorporated Flat IC chip connector
US5173055A (en) 1991-08-08 1992-12-22 Amp Incorporated Area array connector
US5139427A (en) 1991-09-23 1992-08-18 Amp Incorporated Planar array connector and flexible contact therefor
US5152695A (en) * 1991-10-10 1992-10-06 Amp Incorporated Surface mount electrical connector
US5232372A (en) * 1992-05-11 1993-08-03 Amp Incorporated Land grid array connector and method of manufacture
US5228861A (en) * 1992-06-12 1993-07-20 Amp Incorporated High density electrical connector system
US6029344A (en) 1993-11-16 2000-02-29 Formfactor, Inc. Composite interconnection element for microelectronic components, and method of making same
US5462440A (en) * 1994-03-11 1995-10-31 Rothenberger; Richard E. Micro-power connector
US5629837A (en) 1995-09-20 1997-05-13 Oz Technologies, Inc. Button contact for surface mounting an IC device to a circuit board
US6042387A (en) 1998-03-27 2000-03-28 Oz Technologies, Inc. Connector, connector system and method of making a connector
US6708399B2 (en) * 1999-03-25 2004-03-23 Micron Technology, Inc. Method for fabricating a test interconnect for bumped semiconductor components
US6375474B1 (en) * 1999-08-09 2002-04-23 Berg Technology, Inc. Mezzanine style electrical connector
US6442039B1 (en) 1999-12-03 2002-08-27 Delphi Technologies, Inc. Metallic microstructure springs and method of making same
US6402526B1 (en) 2000-11-03 2002-06-11 Delphi Technologies, Inc. Microelectronic contact assembly
USD472880S1 (en) * 2001-07-23 2003-04-08 Hewlett-Packard Company Electrical contact
USD475021S1 (en) * 2001-07-23 2003-05-27 Hewlett Packard Development Company, L.P. Electrical contact
US20030060061A1 (en) 2001-09-21 2003-03-27 Gonzalez Carlos A. Contact array for semiconductor package
US6890185B1 (en) * 2003-11-03 2005-05-10 Kulicke & Soffa Interconnect, Inc. Multipath interconnect with meandering contact cantilevers

Cited By (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US20070152686A1 (en) * 2004-05-21 2007-07-05 January Kister Knee probe having increased scrub motion
US20080001612A1 (en) * 2004-05-21 2008-01-03 January Kister Probes with self-cleaning blunt skates for contacting conductive pads
US8111080B2 (en) 2004-05-21 2012-02-07 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US9316670B2 (en) 2004-05-21 2016-04-19 Formfactor, Inc. Multiple contact probes
US7733101B2 (en) 2004-05-21 2010-06-08 Microprobe, Inc. Knee probe having increased scrub motion
US7759949B2 (en) 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US8203353B2 (en) 2004-07-09 2012-06-19 Microprobe, Inc. Probes with offset arm and suspension structure
USD573947S1 (en) * 2005-10-05 2008-07-29 Gs Yuasa Corporation Current collecting lead
US8415963B2 (en) 2005-12-07 2013-04-09 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7944224B2 (en) 2005-12-07 2011-05-17 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
USRE44407E1 (en) 2006-03-20 2013-08-06 Formfactor, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US7659739B2 (en) 2006-09-14 2010-02-09 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
US20080068035A1 (en) * 2006-09-14 2008-03-20 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
US7786740B2 (en) 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US9310428B2 (en) 2006-10-11 2016-04-12 Formfactor, Inc. Probe retention arrangement
US9274143B2 (en) 2007-04-10 2016-03-01 Formfactor, Inc. Vertical probe array arranged to provide space transformation
US7952377B2 (en) 2007-04-10 2011-05-31 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US8324923B2 (en) 2007-04-10 2012-12-04 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US7671610B2 (en) 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US20090102495A1 (en) * 2007-10-19 2009-04-23 January Kister Vertical guided probe array providing sideways scrub motion
US8230593B2 (en) 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
US20130220678A1 (en) * 2010-11-11 2013-08-29 Kitagawa Industries Co., Ltd. Conductive member and method for producing same
US9196395B2 (en) * 2010-11-11 2015-11-24 Kitagawa Industries Co., Ltd. Conductive member and method for producing same
US8784117B2 (en) * 2012-07-17 2014-07-22 Hon Hai Precision Industry Co., Ltd. Electrical connector with X-type dual spring contacts for lower profile and lattice shielding therewith
USD785854S1 (en) 2015-12-15 2017-05-02 Thomas M. DeBellis Concentric mounting plate for light fixtures
USD785853S1 (en) 2015-12-15 2017-05-02 Thomas M. DeBellis Concentric mounting plate for light fixtures
USD898985S1 (en) 2019-01-03 2020-10-13 Thomas M. DeBellis Rectilinear mounting plate for light fixtures
USD899673S1 (en) 2019-01-03 2020-10-20 Thomas M. DeBellis Rectilinear mounting plate for light fixtures

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