USD294470S - Clearance gauge - Google Patents
Clearance gauge Download PDFInfo
- Publication number
- USD294470S USD294470S US06/735,789 US73578985F USD294470S US D294470 S USD294470 S US D294470S US 73578985 F US73578985 F US 73578985F US D294470 S USD294470 S US D294470S
- Authority
- US
- United States
- Prior art keywords
- clearance gauge
- clearance
- gauge
- ornamental design
- elevational view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front elevational view of a clearance gauge showing my design;
FIG. 2 is a right side elevational view thereof;
FIG. 3 is a left side elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof; and
FIG. 6 is a rear elevational view thereof.
Claims (1)
- The ornamental design for a clearance gauge, as shown.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/735,789 USD294470S (en) | 1985-05-20 | 1985-05-20 | Clearance gauge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/735,789 USD294470S (en) | 1985-05-20 | 1985-05-20 | Clearance gauge |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD294470S true USD294470S (en) | 1988-03-01 |
Family
ID=70151487
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US06/735,789 Expired - Lifetime USD294470S (en) | 1985-05-20 | 1985-05-20 | Clearance gauge |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD294470S (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6688017B2 (en) * | 2002-05-21 | 2004-02-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for aligning an extraction electrode to an arc chamber |
| US20070214743A1 (en) * | 2006-03-17 | 2007-09-20 | Alvarez David J | Tile spacer |
| US20210030520A1 (en) * | 2017-11-02 | 2021-02-04 | Sichuan University | Measuring system and method for analysis of space for dental implant restoration |
| USD938543S1 (en) * | 2019-06-11 | 2021-12-14 | Timothy L. Coggins | Scope mount measurement bar |
| USD996992S1 (en) * | 2021-03-23 | 2023-08-29 | Leo Capo | Level-correcting gauge block |
| USD1000297S1 (en) * | 2022-07-27 | 2023-10-03 | Jianfei Zhao | Measuring tool |
| USD1011939S1 (en) * | 2021-10-25 | 2024-01-23 | Chengdu UML-Lab Institute | Drill guide |
-
1985
- 1985-05-20 US US06/735,789 patent/USD294470S/en not_active Expired - Lifetime
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6688017B2 (en) * | 2002-05-21 | 2004-02-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for aligning an extraction electrode to an arc chamber |
| US20070214743A1 (en) * | 2006-03-17 | 2007-09-20 | Alvarez David J | Tile spacer |
| US7818923B2 (en) * | 2006-03-17 | 2010-10-26 | Alvarez David J | Tile spacer |
| US20210030520A1 (en) * | 2017-11-02 | 2021-02-04 | Sichuan University | Measuring system and method for analysis of space for dental implant restoration |
| US11672634B2 (en) * | 2017-11-02 | 2023-06-13 | Sichuan University | Measuring system and method for analysis of space for dental implant restoration |
| USD938543S1 (en) * | 2019-06-11 | 2021-12-14 | Timothy L. Coggins | Scope mount measurement bar |
| USD996992S1 (en) * | 2021-03-23 | 2023-08-29 | Leo Capo | Level-correcting gauge block |
| USD1011939S1 (en) * | 2021-10-25 | 2024-01-23 | Chengdu UML-Lab Institute | Drill guide |
| USD1000297S1 (en) * | 2022-07-27 | 2023-10-03 | Jianfei Zhao | Measuring tool |
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