US8873192B1 - Magnetic tape heads - Google Patents
Magnetic tape heads Download PDFInfo
- Publication number
- US8873192B1 US8873192B1 US13/954,209 US201313954209A US8873192B1 US 8873192 B1 US8873192 B1 US 8873192B1 US 201313954209 A US201313954209 A US 201313954209A US 8873192 B1 US8873192 B1 US 8873192B1
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- potential
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- 239000010936 titanium Substances 0.000 claims description 4
- 229910052719 titanium Inorganic materials 0.000 claims description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 3
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- MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 claims description 2
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- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
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Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/40—Protective measures on heads, e.g. against excessive temperature
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3103—Structure or manufacture of integrated heads or heads mechanically assembled and electrically connected to a support or housing
- G11B5/3106—Structure or manufacture of integrated heads or heads mechanically assembled and electrically connected to a support or housing where the integrated or assembled structure comprises means for conditioning against physical detrimental influence, e.g. wear, contamination
Definitions
- the tribocharging may cause current flows in various parts of the head. These currents may contribute to the electrochemical removal and deposition of material from the read/write elements and magnetic tape.
- the removal of material from the read/write elements and the surrounding dielectric is commonly referred to as pole tip recession (PTR). Over time, PTR spaces the active elements away from the magnetic tape, leading to reduced performance and head failure.
- FIG. 2 is a schematic view of a tape drive system
- FIG. 3 is a drawing of a tape surface, illustrating the saved bits
- FIG. 8 is a method for mitigating tribocharging in a magnetic tape system.
- potential is associated with voltage
- the term potential also encompasses measured and applied currents.
- any use of potential can be replaced with voltage and/or current.
- any circuits shown with a resistor to ground at an output or input point, for current to voltage conversion may be used without the resistor in a current mode.
- the techniques described herein can be used to mitigate tribocharging and compensate for variability in tribocharging.
- the techniques actively sense a potential downstream from the tribocharging and counteracting the tribocharging by injecting or removing current from the magnetic tape. This decreases the current flow into or out of the active elements and, therefore, decreases the pole tip erosion associated with electrochemical reactions driven by these currents.
- a potential is applied upstream of the active elements and a potential is sensed downstream of the active elements, after the magnetic tape has interacted with the tape bearing surface and other contact regions where tribocharging can occur. This helps minimize the current flow at the active elements and the dielectric separating them.
- These techniques may be used on any device where two surfaces pass by each other and induce current flow due to tribocharging.
- Tribocharging is a complex phenomenon that is influenced by a number of variables. These variables include, for example, the materials used in the magnetic tape and the physical characteristics of the magnetic tape, such as conductivity, surface roughness, and coefficient of friction, among others. Further, wear of the magnetic tape and read/write heads can affect properties such as the real area of contact, the interfacial lubrication between the materials, and the chemical composition of the interfacial region of the materials.
- a magnetic tape drive may be run at different speeds during drive operation, causing variation in the amount of tribocharging.
- the tension on a tape can also vary between units and during different points during operation. Wear and deposition of materials onto the head can affect the tape head interface and change the amount of tribocharging.
- the tribocharging of the tape can be related to the tape wind position.
- the variability from the beginning of tape (BOT) to the end of tape (EOT) can be in the 10s of volts. Fixed biases may not account for such large variability.
- Other discharge paths that are specific to the mechanical and material design can influence the buildup of potentials, such as the conduction path through rollers.
- Environmental conditions can influence the potentials as well. For example, humid environments can dissipate potentials.
- Passive systems may be used for mitigation of tribocharging.
- resistor networks can be used to control the potentials.
- the resistor networks may not eliminate a current flow that can cause PTR of the active region, as conditions can cause variations in the amount of tribocharging.
- Another system uses fixed potential biasing on the read/write elements to counteract the potential on the tape and mitigate current flows.
- the fixed biases may not vary in response to the potential, and may apply unnecessary potentials to the tape.
- the biases are applied to the active elements and are limited by other design constraints.
- the passive solutions may be insufficient as they do not take into the variable conditions that can change the amount of tribocharging.
- FIG. 1 is a drawing of a tape drive mechanism 100 with a tape cartridge 102 inserted.
- the tape cartridge 102 supplies the magnetic tape 104 , which is stored on a supply reel 106 .
- the magnetic tape 104 is automatically threaded around a number of tape guides 108 and drive rollers 110 , and across a read/write head 112 , to be collected on a take-up reel 114 .
- any number of the units depicted can contribute to tribocharging of the read/write head 112 .
- pulling the magnetic tape 104 from the supply reel 106 in the tape cartridge 102 can cause tribocharging as layers of the magnetic tape 104 are pulled away from other layers.
- a similar effect can occur as the magnetic tape 104 is removed from the take-up reel 114 and returned to the supply reel 106 .
- the tribocharging may be mitigated by an active system that is coupled to the read/write head 112 .
- the potential on the magnetic tape 104 is measured after the magnetic tape 104 has passed over the read/write elements in the read/write head 112 .
- a compensating potential is applied to the magnetic tape 104 before the magnetic tape 104 passes over the read/write elements in the read/write head 112 .
- the compensating potential may be adjusted to neutralize the potential at the measurement point or to achieve a set point potential at the measurement point.
- the tape drive mechanism 100 does not have to have the configuration shown in FIG. 1 .
- the tape drive mechanism 100 may have a tape cartridge 102 that includes both the supply reel 102 and take-up reel 114 .
- the magnetic tape 104 may be supplied from an open supply reel 102 to an open take-up reel 114 , without an enclosing cartridge.
- the mitigation circuitry may be useful for reducing or eliminating tribocharging.
- FIG. 2 is a schematic view of a tape drive system 200 . Like numbered items are as discussed with respect to FIG. 1 . The schematic view illustrates circuit and software blocks that can be used to mitigate tribocharging in a tape head 112 .
- the tape drive system 200 may have a processor 202 that is coupled to a number of other units over a bus 204 .
- the processor 202 may be a microprocessor, a multicore processor, or any number of other units.
- the bus 204 can be an ISA bus, an EISA bus, a microcontroller bus, a PCI bus, a PCIe bus, or any number of other types of buses.
- multiple tape drives may be controlled as part of a single tape drive system 200 , for example, using a multicore processor and a PCIe bus.
- a single core microprocessor using a microcontroller bus may be sufficient.
- a memory 206 may be coupled to the bus 204 to hold instructions for the processor 202 .
- the memory 206 holds instructions that direct the processor 202 to access a tribocharging compensation system 208 over the bus 204 .
- the tribocharging compensation system 208 is coupled to a sensor region and an effector region in a read/write head 112 by mitigation lines 210 .
- the tribocharging compensation system 208 may use an analog-to-digital convertor (ADC) to measure the potential on the read/write head 112 and a digital-to-analog convertor (DAC) to apply a potential to the read/write head 112 .
- ADC analog-to-digital convertor
- DAC digital-to-analog convertor
- the tribocharging compensation system 208 is not limited to a digital system, but may be an analog system, for example, as discussed with respect to FIG. 7 .
- the instructions can also direct the processor 202 to access a read/write circuit 212 , which is coupled to read/write elements in the read/write head 112 through R/W Lines 214 .
- the instructions can also direct the processor 202 to access a motor drive 216 over the bus 204 .
- the motor drive 216 is coupled through motor power lines 218 to motors that move the magnetic tape 104 between the reels 106 and 114 .
- the instructions in the memory 206 can direct the processor 202 to use the tribocharging compensation system 208 to measure a potential on a magnetic tape 104 , for example, using a sensor region in a read/write head 112 .
- the instructions may then direct the processor 202 to calculate a target potential to be applied to the read/write head 112 using a transfer function, e.g., to cancel a portion of the measured potential, decreasing current flows between the magnetic tape 104 and the read/write head.
- the processor 202 can then access the tribocharging compensation system 208 to apply the potential to the magnetic tape 104 , using an effector region on the read/write head 112 .
- the schematic view of FIG. 2 is not intended to indicate that the tape drive system 200 may only be configured as shown.
- the sensor and effector may be located in structures outside of the tape head 112 .
- the tape guides 108 may be coupled to the tribocharging compensation system 208 .
- the tape guide 108 located downstream of the tape head 112 which function as the sensor, measuring the potential on the tape 104 , while the tape guide 108 upstream of the head would function as the effector, applying a cancelling potential to the tape 104 .
- FIG. 3 is a drawing of a tape surface 300 , illustrating the saved bits 302 .
- the tape surface stores 16 bits at each data row 304 , with each bit corresponding to a read/write element in a read/write head.
- 32 read/write elements, or more can be used to provide even more bits per row. The resulting small size of a read/write element may make these vulnerable to damage.
- one or more bits may be used as parity bits 306 , even a small amount of intermittent failures to correctly read or write a bit may compromise the system. As greater damage accrues, for example, due to PTR, the system may become progressively unreliable.
- FIG. 4 is a drawing of a read/write head 400 that can be used to detect and mitigate tribocharging in magnetic tape systems.
- the tape motion is indicated by an arrow 402 .
- Two sets of read/write elements 404 are illustrated.
- the read/write elements 404 are embedded in an insulating region 406 , for example, formed from alumina (Al 2 O 3 ).
- On either side of the insulating region 406 are tape bearing surfaces (TBS) 408 .
- TBS 408 are hard surfaces that facilitate the smooth motion of the tape across the read/write elements 404 and act as reference planes.
- the TBS 408 are made from an alumina titanium carbide composite (AITiC).
- AITiC alumina titanium carbide composite
- Thin film magnetic heads are fabricated by building thin film devices on a ceramic substrate commonly referred to as a “wafer.”
- the base layer of the wafer is often AlTiC, which is alumina-titanium carbide (Al 2 O 3 —TiC) composite.
- AITiC is generally electrically conductive and typically includes approximately 30-35% by weight TiC, 24-28 wt. % Ti, 6-7 wt % C, with the remainder Al 2 O 3 .
- the read/write elements are deposited in an Al2O3 layer on top of the AlTiC wafer.
- the wafer is diced and another layer of AlTiC is then glued over the read/write elements layer, using, for example, an epoxy.
- the three-layer construct is then further processed to form the read/write heads.
- addition layers are deposited over the AlTiC wafers to form the structures shown.
- the structure shown in FIG. 4 may be formed by depositing a layer of conductive material, such as titanium, nickel, aluminum, and the like, over one side of the AlTiC wafer before forming the layer that includes the read/write heads on the other side.
- the second AlTiC wafer is glued over the read/write elements and a second metal layer is deposited on the opposite of the second AlTiC wafer from the read write elements.
- Other structures, such as the structure shown in FIG. 5 can be made by changing the order of the deposition of the metal. AlTiC, and read/write elements.
- a sensor region 410 located downstream in the direction of tape motion 402 from the read/write elements 404 , measures potential on the magnetic tape.
- An effector region 412 located or disposed upstream in the direction of tape motion from the read/write elements 404 , can be used to apply a potential to the magnetic tape, for example, to obtain a zero potential at the sensor region 410 .
- the sensor region 410 and effector region 412 are reversed, so that the sensor region 410 is always downstream of the read/write elements 404 .
- the sensor region 410 and effector region 412 may be made from any number of materials, such as aluminum, titanium, nickel, AlTiC, or any other appropriate conductive materials. Further, the sensor region 410 and effector region 412 may be electrically coupled to the adjacent AlTiC, or may be separated by an insulating layer.
- FIG. 6 is a drawing of another read/write head 600 that can be used to detect and mitigate tribocharging in magnetic tape systems.
- the TBS is a conductive material, such as the AlTiC alloy discussed with respect to FIG. 4 .
- the TBS is functioning as the sensor region 602 and effector region 604 . This can be used to minimize the changes needed to the design of the tape head 600 . It also provides a large surface area for each of the regions 602 and 604 . As discussed with respect to FIG. 4 , the regions 602 and 604 are reversed when the tape motion 402 is reversed.
- FIG. 7 is an example of an analog circuit 700 that can be used to detect and mitigate tribocharging in magnetic tape systems.
- the mitigation system described herein is not limited to a digital system, e.g., with a processor making the corrections using a transfer function stored in a memory, as discussed with respect to FIG. 2 .
- Analog circuits may also be used to cancel the tribocharging.
- FIG. 7 An example of an analog circuit 700 is shown in FIG. 7 .
- the analog circuit 700 uses two operation amplifier (op-amp) stages 702 and 704 to provide the potential, which, for this circuit, is measuring potentials from the magnetic tape and applying a potential to the magnetic tape.
- the first stage is an offset/filter stage 702 that uses an input voltage (Vin) 706 from a sensor region 708 .
- a reference voltage (Vp) 710 can be generated by placing a potentiometer 712 between a +15 v source 714 and a ⁇ 15 v source 716 .
- Adjusting the potentiometer 712 will adjust Vp 710 , changing the potential difference between Vin 706 and an output voltage (Vout′) 718 that is used as the input voltage for the next op-amp stage.
- Vout′ output voltage
- the use of a feedback capacitor, C 1 719 provides a low frequency bandpass filter, for example, blocking signals with a frequency of greater than about 1 KHz.
- the analog circuit 700 has a transfer function from the offset stage 702 that is represented by Eqn. 1.
- Vout′ Vin( R 4 /R 3)+Vp( R 4 /R 2) Eqn. 1
- Vp can be changed by adjusting the potentiometer. Further, the relationship can also be changed by the selection of the resistors for R 2 , R 3 , and R 4 in the offset stage 702 .
- the bandpass frequency of the op-amp stages 702 and 704 can be adjusted by appropriate selection of the feedback capacitors, C 1 719 and C 2 721 .
- the final output voltage Vout′′ 720 from the inverter stage 704 is related to the output voltage Vout′ 718 by the transfer function shown in Eqn. 2.
- Vout′′ ⁇ Vout′( R 5 /R 6) Eqn. 2
- analog circuit 700 shown in FIG. 7 and the values shown therein are merely exemplary. Any number of modifications can be made while remaining within the scope of the present claims. For example, different values may be selected for the resistors and capacitors to change the amplification, the bandpass filtration, and the like. Further, a greater or lesser number of operational amplifier stages may be used. In addition, the use of +15V and ⁇ 15V for the voltage sources is merely an example. Higher or lower voltages could be used depending on the system variability. The circuit could be modified to use current sources instead of voltage sources.
- FIG. 8 is a method 800 for mitigating tribocharging in a magnetic tape system.
- the method may be performed using a digital technique, for example, as described with respect to FIG. 2 , or using an analog circuit, for example, as described with respect to FIG. 7 .
- the method 800 begins at block 802 with the detection of a potential at a sensor region. This may be done using an ADC, as described with respect to FIG. 2 , or by coupling the sensor region to the input of an op-amp circuit, as described with respect to FIG. 7 .
- a target potential is calculated using a transfer function. This can be performed using instructions executed by a processor, as described with respect to FIG. 2 . In another example, the calculation can be performed using the analog circuit shown in FIG. 7 .
- the target potential is applied to the effector region to at least partly cancel the tribocharging.
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Abstract
Description
Vout′=Vin(R4/R3)+Vp(R4/R2) Eqn. 1
Vout″=−Vout′(R5/R6) Eqn. 2
Claims (20)
Priority Applications (1)
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US13/954,209 US8873192B1 (en) | 2013-07-30 | 2013-07-30 | Magnetic tape heads |
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US13/954,209 US8873192B1 (en) | 2013-07-30 | 2013-07-30 | Magnetic tape heads |
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US8873192B1 true US8873192B1 (en) | 2014-10-28 |
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Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5757591A (en) | 1996-11-25 | 1998-05-26 | International Business Machines Corporation | Magnetoresistive read/inductive write magnetic head assembly fabricated with silicon on hard insulator for improved durability and electrostatic discharge protection and method for manufacturing same |
US5903415A (en) | 1997-12-11 | 1999-05-11 | International Business Machines Corporation | AP pinned spin valve sensor with pinning layer reset and ESD protection |
US5963415A (en) | 1997-07-05 | 1999-10-05 | Polaroid Corporation | Electrostatic discharge protection device |
US6400534B1 (en) | 2000-03-21 | 2002-06-04 | International Business Machines Corporation | Resistive shunt ESD and EOS protection for recording heads |
US20060198057A1 (en) * | 2005-03-07 | 2006-09-07 | Headway Technologies, Inc. | ESD, cross talk and noise pickup minimizing scheme for CPP and TMR devices |
US7135203B2 (en) | 2001-03-29 | 2006-11-14 | 3M Innovative Properties Company | Flexible circuit with electrostatic damage limiting feature |
US7142398B2 (en) | 2002-03-06 | 2006-11-28 | Seagate Technology Llc | Electrostatic discharge and electrical overstress protection for magnetic heads |
US8130473B2 (en) * | 2008-10-30 | 2012-03-06 | Tdk Corporation | Multi-channel thin-film magnetic head and magnetic tape drive apparatus with the multi-channel thin-film magnetic head |
US20120092022A1 (en) * | 2008-04-28 | 2012-04-19 | International Business Machines Corporation | Methods for detecting damage to magnetoresistive sensors |
US8169751B2 (en) | 2006-06-27 | 2012-05-01 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetoresistive sensor having a structure for activating and deactivating electrostatic discharge prevention circuitry |
-
2013
- 2013-07-30 US US13/954,209 patent/US8873192B1/en active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5757591A (en) | 1996-11-25 | 1998-05-26 | International Business Machines Corporation | Magnetoresistive read/inductive write magnetic head assembly fabricated with silicon on hard insulator for improved durability and electrostatic discharge protection and method for manufacturing same |
US5963415A (en) | 1997-07-05 | 1999-10-05 | Polaroid Corporation | Electrostatic discharge protection device |
US5903415A (en) | 1997-12-11 | 1999-05-11 | International Business Machines Corporation | AP pinned spin valve sensor with pinning layer reset and ESD protection |
US6400534B1 (en) | 2000-03-21 | 2002-06-04 | International Business Machines Corporation | Resistive shunt ESD and EOS protection for recording heads |
US7135203B2 (en) | 2001-03-29 | 2006-11-14 | 3M Innovative Properties Company | Flexible circuit with electrostatic damage limiting feature |
US7142398B2 (en) | 2002-03-06 | 2006-11-28 | Seagate Technology Llc | Electrostatic discharge and electrical overstress protection for magnetic heads |
US20060198057A1 (en) * | 2005-03-07 | 2006-09-07 | Headway Technologies, Inc. | ESD, cross talk and noise pickup minimizing scheme for CPP and TMR devices |
US8169751B2 (en) | 2006-06-27 | 2012-05-01 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetoresistive sensor having a structure for activating and deactivating electrostatic discharge prevention circuitry |
US20120092022A1 (en) * | 2008-04-28 | 2012-04-19 | International Business Machines Corporation | Methods for detecting damage to magnetoresistive sensors |
US8130473B2 (en) * | 2008-10-30 | 2012-03-06 | Tdk Corporation | Multi-channel thin-film magnetic head and magnetic tape drive apparatus with the multi-channel thin-film magnetic head |
Non-Patent Citations (2)
Title |
---|
Iben, I.E.T. et al., Tribocharging of Materials Used in Tape Heads and Associated ESD Damage, (Research Paper), Sep. 8-16, 2005, pp. 1-10, https://www2.lirmm.fr/lirmm/interne/BIBLI/CDROM/MIC/2005/EOSESD-2005/pdffiles/papers/4A.7. |
Iben, I.E.T. et al., Tribocharging of Materials Used in Tape Heads and Associated ESD Damage, (Research Paper), Sep. 8-16, 2005, pp. 1-10, https://www2.lirmm.fr/lirmm/interne/BIBLI/CDROM/MIC/2005/EOSESD—2005/pdffiles/papers/4A.7. |
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