US5835049A - Amplifier for use in time-sharing applications - Google Patents
Amplifier for use in time-sharing applications Download PDFInfo
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- US5835049A US5835049A US08/828,977 US82897797A US5835049A US 5835049 A US5835049 A US 5835049A US 82897797 A US82897797 A US 82897797A US 5835049 A US5835049 A US 5835049A
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/72—Gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/122—Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages
- H03M1/1225—Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages using time-division multiplexing
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
- H03M1/442—Sequential comparisons in series-connected stages with change in value of analogue signal using switched capacitors
Definitions
- the present invention is related to electrical circuits, and, in particular, to amplifiers for use in analog-to-digital conversion.
- Pipelined analog-to-digital (A/D) converters are very commonly used in high-speed data converters.
- a switched-capacitor algorithmic pipelined A/D converter is described in Lewis et al., "A 10-b 20-Msample/s Analog-to-Digital Converter," IEEE Journal of Solid-State Circuits, Vol. 27, No. 3, pp. 351-358, March 1992, the teachings of which are incorporated herein by reference.
- Such a converter employs a pipeline of N-1 stages for an N-bit converter, where each stage comprises an analog arithmetic unit followed by a two-level decision circuit, and the analog arithmetic unit operation is performed by using a switched-capacitor network and an operational amplifier.
- the first stage accepts the analog input and produces a pair of decision bits (containing the equivalent of 1.5 binary bits of information) and an analog residue. These are passed on to the second stage, which treats the analog residue as its input and produces another 1.5 bits of information, as well as a new analog residue. This process continues until the residue reaches the last stage.
- the decision bits from all the stages represent a total of 1.5(N-1) bits of information. This means that redundancy exists within the bits of information. These are processed by a digital correction block that removes the redundancy and produces the final N-bit output. Any decision errors are corrected in this process.
- Nagaraj "Efficient Circuit Configurations For Algorithmic Analog-To-Digital Converters," IEEE Transactions On Circuits Systems-II: Analog and Digital Signal Processing, Vol. 40, No. 2, December, 1993, pp. 777-785
- the Nagaraj article describes an A/D converter in which each amplifier is time-shared between two stages of the A/D converter, thereby reducing the total number of amplifiers used in such an A/D converter by a factor of two. For example, for a 10-bit pipelined A/D converter, five amplifiers are employed using the time-sharing technique described in the Nagaraj article.
- each amplifier in the A/D converter is alternately used by two different stages of the A/D converter.
- input capacitance in amplifiers can lead to crosstalk between stages sharing a single amplifier. It is therefore important, for such A/D converters, to design amplifiers that reduce the effects of input capacitance in order to limit the adverse effects of crosstalk.
- Embodiments of the present invention are directed to integrated circuits having a differential amplifier comprising an inverting input terminal and a noninverting input terminal and at least one output terminal.
- Four transistors, forming an input stage of the differential amplifier are coupled to the inverting and noninverting input terminals and to the output terminal, such that at least two of the amplifiers are capable of being switched between the inverting and noninverting input terminals on different phases of a clock signal capable of driving the differential amplifier.
- FIG. 1 shows a block diagram of a pipelined analog-to-digital converter, according to one embodiment of the present invention
- FIG. 2 shows a schematic diagram of the initial stage of the A/D converter of FIG. 1;
- FIG. 3 shows a schematic diagram of each intermediate stage of the A/D converter of FIG. 1;
- FIG. 4 shows a schematic diagram of the final stage of the A/D converter of FIG. 1;
- FIG. 5 shows a schematic diagram of a circuit that may be used to replace the last three stages of the A/D converter of FIG. 1, according to an alternative embodiment of the present invention.
- FIG. 6 shows a schematic diagram of an amplifier that may be used in a time-shared manner in the initial and intermediate stages of the A/D converter of FIG. 1, according one embodiment of the present invention.
- Embodiments of the present invention are directed to an amplifier designed to be used, for example, in a time-sharing pipelined analog-to-digital converter.
- the amplifier is designed to have low input capacitance.
- such an amplifier can reduce crosstalk between stages that share a single amplifier.
- FIG. 1 shows a block diagram of a pipelined analog-to-digital converter 100, according to one embodiment of the present invention.
- A/D converter 100 is an N-stage converter that converts an analog input signal V IN , into an (N+1)-bit digital output signal.
- A/D converter 100 has three different types of stages: initial stage 102 (Stage 1), intermediate stages 104 (Stages 2 through N-1), and final stage 106 (Stage N).
- Initial stage 102 receives the analog input signal V IN and generates two output signals: an analog residue signal V RES (1) and a two-bit (one-of-three) digital output signal D 1 .
- the j th intermediate stage 104 receives the two output signals generated by the previous stage (i.e., the analog residue signal V RES (j-1) and the two-bit digital output signal D j-1 ) and generates two output signals: an analog residue signal V RES (j) and a two-bit digital output signal D j .
- the final stage 106 receives the two output signals from the (N-1) th stage (i.e., the analog residue signal V RES (N-1) and the two-bit digital output signal D N-1 ) and generates a two-bit digital output signal D N .
- encoding logic 108 receives N two-bit digital output signals (D 1 , . . . , D N ) from the N stages. Those skilled in the art will understand that each two-bit digital output signal corresponds to 1.5 bits of information. (In alternative implementations, each stage of an A/D converter of the present invention may generate a digital output signal having other than two bits (i.e., one bit or more than two bits).) Encoding logic 108 applies error-correction logic processing to the N two-bit digital output signals to remove redundancy and generate the (N+1)-bit digital equivalent to V IN . This approach to A/D conversion is described generally in the Nagaraj article.
- A/D converter 100 may be operated in a pipelined manner. Consider the sequence of analog input signals (V INA , V INB , V INC , V IND , . . . ), where V INA is the first input, V INB is the second input, and so forth. A/D converter 100 may be used to digitize that sequence in the following steps:
- Step (1) Stage 1 receives V INA and generates V RES (1) and D 1 for V INA .
- Step (2) While Stage 2 receives V RES (1) and D 1 for V INA and generates V RES (2) and D 2 for V INA , Stage 1 receives V INB and generates V RES (1) and D 1 for V INB .
- Step (3) While Stage 3 receives V RES (2) and D 2 for V INA and generates V RES (3) and D 3 for V INA , and while Stage 2 receives V RES (1) and D 1 for V INB and generates V RES (2) and D 2 for V INB , Stage 1 receives V INC and generates V RES (1) and D 1 for V INC .
- Step (4) While Stage 4 receives V RES (3) and D 3 for V INA and generates V RES (4) and D 4 for V INA , and while Stage 3 receives V RES (2) and D 2 for V INB and generates V RES (3) and D 3 for V INB , and while Stage 2 receives V RES (1) and D 1 for V INC and generates V RES (2) and D 2 for V INC , Stage 1 receives V IND and generates V RES (1) and D 1 for V IND .
- A/D converter 100 can efficiently convert a sequence of analog input signals V IN into a sequence of (N+1)-bit digital output signals. It will be understood, of course, that A/D converter 100 can be operated to convert analog input signals into digital output signals one at a time in a non-pipelined manner.
- FIG. 2 shows a schematic diagram of initial stage 102 of A/D converter 100 of FIG. 1, according one embodiment of the present invention.
- initial stage 102 receives the analog input signal V IN and generates the analog residue signal V RES (1) and the two-bit digital output signal D 1 .
- the operations of initial stage 102 are described in further detail in Nagaraj 17.
- FIG. 3 shows a schematic diagram of each intermediate stage 104 of A/D converter 100 of FIG. 1, according to one embodiment of the present invention.
- the j th intermediate stage 104 receives analog residue signal V RES (j-1) and digital output signal D j-1 from the previous stage of A/D converter 100 and generates analog residue signal V RES (j) and digital output signal D j .
- the operations of intermediate stage 104 are described in further detail in Nagaraj 17.
- FIG. 4 shows a schematic diagram of final stage 106 of A/D converter 100 of FIG. 1, according to one embodiment of the present invention.
- Final stage 106 receives analog residue signal V RES (N-1) and digital output signal D N-1 from the second-to-last stage (i.e., Stage N-1 of FIG. 1), and generates the final two-bit digital output signal D N .
- the operations of final stage 106 are described in further detail in Nagaraj 17.
- FIG. 5 shows a schematic diagram of circuit 500.
- circuit 500 may be used to replace the last three stages of A/D converter 100 of FIG. 1 (i.e., Stages N-2, N-1, and N).
- circuit 500 receives the analog residue signal V RES (N-3) and the two-bit digital output signal D N-3 from Stage N-3, and sequentially generates three two-bit digital output signals (i.e., D N-2 , D N-1 , and D N ).
- Circuit 500 has three parallel sub-stages (Sub-Stages A, B, and C) that operate in analogous fashion. The operations of circuit 500 are described in further detail in Nagaraj 17.
- A/D converter 100 employs the time-sharing technology described in the Nagaraj article. According to that technology, Stage 1 (initial stage 102) and Stage 2 (the first intermediate stage 104) of FIG. 1 share a single amplifier. Similarly, each subsequent pair of intermediate stages 104 shares a different single amplifier. According to this time-sharing technology, two stages that share a single amplifier operate out of phase with one another. That is, while one stage is sampling the residue voltage from its previous stage, the other stage is using the shared amplifier to generate a new residue voltage and a new two-bit digital output signal based on a previously sampled residue voltage and a previously received two-bit digital output signal from its previous stage.
- an amplifier that is time-shared between intermediate Stages j and j+1 may be said to operate as follows:
- Step (1) Stage j samples V RES (j-1) from Stage j-1 corresponding to the first input signal V INA .
- Step (2) While Stage j uses the amplifier to generate V RES (j) and D j corresponding to V INA , Stage j+1 samples V RES (j) from Stage j corresponding to V INA .
- Step (3) While Stage j+1 uses the amplifier to generate V RES (j+1) and D j+1 corresponding to V INA , Stage j samples V RES (j-1) from Stage j-1 corresponding to the second input signal V INB .
- Step (4) While Stage j uses the amplifier to generate V RES (j) and D j corresponding to V INB , Stage j+1 samples V RES (1) from Stage j corresponding to V INB .
- Step (5) While Stage j+1 uses the amplifier to generate V RES (j+1) and D j+1 , corresponding to V INB , Stage j samples V RES (j-1) from Stage j-1 corresponding to the third input signal V INC .
- Step (6) While Stage j uses the amplifier to generate V RES (j) and D j corresponding to V INC , Stage j+1 samples V RES (j) from Stage j corresponding to V INC .
- the same amplifier is alternately used by two different stages in the A/D converter to generate analog residual signals and two-bit digital output signals corresponding to successive input signals.
- the A/D converter has switches and other circuit elements to achieve this amplifier time-sharing feature.
- the input voltage of the amplifier assumes a non-zero value equal to -V OUT /A, wherein V OUT is the amplifier output (e.g., V RES ) and A is the amplifier gain.
- V OUT is the amplifier output (e.g., V RES )
- A is the amplifier gain.
- the input capacitance of the amplifier gets charged to this voltage.
- the amplifier gets switched from one stage to another and the charge carried by the amplifier input capacitance can result in a crosstalk between the two stages. This can be a serious problem in many signal-processing applications.
- FIG. 6 shows a schematic diagram of an amplifier 600 that may be used in a time-shared manner in the initial and intermediate stages of A/D converter 100 of FIG. 1, according one embodiment of the present invention.
- Amplifier 600 comprises load 602, current source 604, and four transistors 606, 608, 610, and 612 (e.g., metal-oxide semiconductor (MOS) transistors). These transistors operate as the input stage to amplifier 600, which receives a differential input V IN + , V IN - and generates an output V OUT .
- Amplifier 600 also has a plurality of switches 1 and 2, which may be implemented using additional MOS transistors. Switches 1 and 2 control the operations of amplifier 600 according to two phases of an input clock signal.
- MOS metal-oxide semiconductor
- switches 1 are closed and switches 2 are opened.
- the gates of transistors 606 and 608 are both coupled to the noninverting input signal terminal V IN +
- the gates of transistors 610 and 612 are both coupled to the inverting input signal terminal V IN - .
- the drains of transistors 606 and 608, are shorted together, while the drains of transistors 610 and 612 are shorted together.
- transistors 606 and 608 are connected in parallel to one another, while transistors 610 and 612 are connected in parallel to one another.
- switches 1 are opened and switches 2 are closed.
- the gates of transistors 606 and 610 are both coupled to the noninverting input signal terminal V IN +
- the gates of transistors 608 and 612 are both coupled to the inverting input signal terminal V IN - .
- the drains of transistors 606 and 610 are shorted together, while the drains of transistors 608 and 612 are shorted together.
- transistors 606 and 610 are connected in parallel to one another, while transistors 608 and 612 are connected in parallel to one another.
- Load 602 may be, but is not limited to being, a cascode load.
- Amplifier 600 of FIG. 6 may be used for each time-shared amplifier in A/D converter 100 of FIG. 1, where the phasing of amplifier 600 is controlled by the same clock signal that controls the phasing of the amplifier time-sharing described earlier.
- the phasing of amplifier 600 is controlled by the same clock signal that controls the phasing of the amplifier time-sharing described earlier.
- any charge associated with the input capacitances of transistors 606 and 612 is reduced and potentially neutralized, at the beginning of each clock phase, by an opposite charge associated with the input capacitances of transistors 608 and 610.
- crosstalk between amplifier-sharing stages of A/D converter 100 due to input amplifier capacitance can be reduced and potentially eliminated.
- transistor 608 is coupled in parallel with transistor 606. Because transistor 608 was coupled to the inverting input terminal V IN - during the previous clock phase 2, the charge on its input capacitance would be opposite and of potentially equal magnitude to the charge on the input capacitance of transistor 606. These cancel each other when transistor 608 is coupled in parallel with transistor 606. Similarly, the charge on transistor 610 cancels the charge on transistor 612 at the beginning of clock phase 1; the charge on transistor 610 cancels the charge on transistor 606 at the beginning of clock phase 2; and the charge on transistor 608 cancels the charge on transistor 612 at the beginning of clock phase 2.
- switches 1 and 2 of FIG. 6 can be merged with the switches used to implement the amplifier time-sharing described earlier.
- the present invention is applied to pipelined A/D converters having a final comparator-based stage as shown in either FIG. 4 or FIG. 5.
- the present invention may also be applied to pipelined A/D converters in which all of the stages are amplifier-based stages.
- the present invention may be applied to circuits other than A/D converters. In general, the present invention may be used for any circuit in which an amplifier is time-shared between two or more different operations.
- the present invention may be implemented as a single integrated circuit using solid-state technology or as a circuit having a plurality of discrete elements.
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US08/828,977 US5835049A (en) | 1997-03-27 | 1997-03-27 | Amplifier for use in time-sharing applications |
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US08/828,977 US5835049A (en) | 1997-03-27 | 1997-03-27 | Amplifier for use in time-sharing applications |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040183567A1 (en) * | 2003-03-20 | 2004-09-23 | Engler David W. | Isolated channel in an integrated circuit |
DE10344354A1 (en) * | 2003-09-24 | 2005-05-12 | Infineon Technologies Ag | Analog-to-digital converter and method for operating an analog-to-digital converter |
US20140368363A1 (en) * | 2013-06-12 | 2014-12-18 | University Of Macau | Sampling front-end for Analog to Digital Converter |
US20150374997A1 (en) * | 2013-03-15 | 2015-12-31 | Alfred E. Mann Foundation For Scientific Research | High voltage monitoring successive approximation analog to digital converter |
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US5212486A (en) * | 1991-12-26 | 1993-05-18 | At&T Bell Laboratories | Cyclic analog-to-digital converter |
US5594445A (en) * | 1992-11-19 | 1997-01-14 | Vlsi Technology, Inc. | Pipelined analog to digital converters and interstage amplifiers for such converters |
-
1997
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Patent Citations (3)
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US3586989A (en) * | 1968-12-31 | 1971-06-22 | Solartron Electronic Group | Time shared amplifiers |
US5212486A (en) * | 1991-12-26 | 1993-05-18 | At&T Bell Laboratories | Cyclic analog-to-digital converter |
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Non-Patent Citations (6)
Title |
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"A 10-b 20-Msample / s Analog-to-Digital Converter", by Stephen H. Lewis et al., IEEE Journal of of Solid-State Circuits, vol. 27. No. 3 Mar. 1992, pp. 351-358. |
"Efficient Circuit Configurations for Algorithmic Analog to Digital Converters", by Krishnaswami Nagaraj, IEEE Transactions on Circuits and Systems--II: Analog and Digital Signal Processing, vol. 40, No. 12, Dec. 1993, pp. 777-785. |
A 10 b 20 Msample / s Analog to Digital Converter , by Stephen H. Lewis et al., IEEE Journal of of Solid State Circuits, vol. 27. No. 3 Mar. 1992, pp. 351 358. * |
All MOS Charge Redistribution Analog to Digital Conversion Techniques Part 1, James L. McCreary and Paul R. Gray, IEEE Journal of Solid State Circuits, vol. SC 10, No. 6, Dec. 1975, pp. 371 379. * |
All -MOS Charge Redistribution Analog-to-Digital Conversion Techniques-Part 1, James L. McCreary and Paul R. Gray, IEEE Journal of Solid-State Circuits, vol. SC-10, No. 6, Dec. 1975, pp. 371-379. |
Efficient Circuit Configurations for Algorithmic Analog to Digital Converters , by Krishnaswami Nagaraj, IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol. 40, No. 12, Dec. 1993, pp. 777 785. * |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040183567A1 (en) * | 2003-03-20 | 2004-09-23 | Engler David W. | Isolated channel in an integrated circuit |
US6975136B2 (en) * | 2003-03-20 | 2005-12-13 | Hewlett-Packard Development Company, L.P. | Isolated channel in an integrated circuit |
DE10344354A1 (en) * | 2003-09-24 | 2005-05-12 | Infineon Technologies Ag | Analog-to-digital converter and method for operating an analog-to-digital converter |
US20050104762A1 (en) * | 2003-09-24 | 2005-05-19 | Dias Victor M.D. | Analog/digital converter and method for operating an analog/digital converter |
US7023373B2 (en) | 2003-09-24 | 2006-04-04 | Infineon Technologies Ag | Multi-stage ADC with shared amplifier and reference voltage selection |
US20060114143A1 (en) * | 2003-09-24 | 2006-06-01 | Dias Victor Manuel D F | Analog/digital converter and method for operating an analog/digital converter |
DE10344354B4 (en) * | 2003-09-24 | 2006-11-02 | Infineon Technologies Ag | Analog-to-digital converter and method for operating an analog-to-digital converter |
US7148834B2 (en) | 2003-09-24 | 2006-12-12 | Infineon Technologies Ag | Analog/digital converter and method for operating an analog/digital converter |
US20150374997A1 (en) * | 2013-03-15 | 2015-12-31 | Alfred E. Mann Foundation For Scientific Research | High voltage monitoring successive approximation analog to digital converter |
US9682237B2 (en) * | 2013-03-15 | 2017-06-20 | Alfred E. Mann Foundation For Scientific Research | High voltage monitoring successive approximation analog to digital converter |
US20140368363A1 (en) * | 2013-06-12 | 2014-12-18 | University Of Macau | Sampling front-end for Analog to Digital Converter |
US8947283B2 (en) * | 2013-06-12 | 2015-02-03 | University Of Macau | Sampling front-end for analog to digital converter |
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