US4691975B1 - Integrated circuit tester socket - Google Patents
Integrated circuit tester socket Download PDFInfo
- Publication number
- US4691975B1 US4691975B1 US92125586A US4691975B1 US 4691975 B1 US4691975 B1 US 4691975B1 US 92125586 A US92125586 A US 92125586A US 4691975 B1 US4691975 B1 US 4691975B1
- Authority
- US
- United States
- Prior art keywords
- integrated circuit
- circuit tester
- tester socket
- socket
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1007—Plug-in assemblages of components, e.g. IC sockets with means for increasing contact pressure at the end of engagement of coupling parts
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60235054A JPS6293964A (en) | 1985-10-21 | 1985-10-21 | Ic testing socket |
JP60-235054 | 1985-10-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
US4691975A US4691975A (en) | 1987-09-08 |
US4691975B1 true US4691975B1 (en) | 2000-10-31 |
Family
ID=16980401
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US06921255 Expired - Lifetime US4691975B1 (en) | 1985-10-21 | 1986-10-21 | Integrated circuit tester socket |
Country Status (2)
Country | Link |
---|---|
US (1) | US4691975B1 (en) |
JP (1) | JPS6293964A (en) |
Cited By (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4750890A (en) * | 1987-06-18 | 1988-06-14 | The J. M. Ney Company | Test socket for an integrated circuit package |
EP0295046A1 (en) * | 1987-06-09 | 1988-12-14 | Texas Instruments Incorporated | Test socket with improved contact engagement |
US4799897A (en) * | 1985-12-30 | 1989-01-24 | Dai-Ichi Seiko Kabushiki Kaisha | IC tester socket |
US4886470A (en) * | 1988-05-24 | 1989-12-12 | Amp Incorporated | Burn-in socket for gull wing integrated circuit package |
US4919623A (en) * | 1989-02-13 | 1990-04-24 | Amp Incorporated | Burn-in socket for integrated circuit device |
EP0379365A1 (en) * | 1989-01-18 | 1990-07-25 | E.I. Du Pont De Nemours And Company | Low insertion force connector and electrical contact therefor |
EP0385314A1 (en) * | 1989-02-28 | 1990-09-05 | The Whitaker Corporation | Zero insertion force connector for cable to board applications |
EP0390543A1 (en) * | 1989-03-30 | 1990-10-03 | Yamaichi Electronics Co., Ltd. | Contact structure in socket with IC carrier placed thereon |
EP0413240A1 (en) * | 1989-08-18 | 1991-02-20 | The Whitaker Corporation | Electrical contact |
EP0425110A2 (en) * | 1989-10-24 | 1991-05-02 | Yamaichi Electronics Co., Ltd. | Shutter mechanism of contact in IC socket |
EP0450211A1 (en) * | 1988-09-30 | 1991-10-09 | Yamaichi Electronics Co., Ltd. | Contact shutter device in ic socket |
US5108302A (en) * | 1991-06-17 | 1992-04-28 | Pfaff Wayne | Test socket |
US5114358A (en) * | 1991-03-11 | 1992-05-19 | Wells Electronics, Inc. | Chip carrier socket |
US5147212A (en) * | 1990-06-15 | 1992-09-15 | Yamaichi Electric Co., Ltd. | Socket for electric part |
EP0539073A1 (en) * | 1991-10-15 | 1993-04-28 | Yamaichi Electronics Co., Ltd. | Socket for electric part |
US5240429A (en) * | 1992-03-06 | 1993-08-31 | Wells Electronics, Inc. | Chip carrier socket |
US5261832A (en) * | 1990-06-15 | 1993-11-16 | Yamaichi Electric Co., Ltd. | Socket for electric part |
DE4243056A1 (en) * | 1992-07-06 | 1994-01-13 | Wells Electronics | Socket for integrated circuit carriers |
US5288240A (en) * | 1992-12-16 | 1994-02-22 | Minnesota Mining And Manufacturing Company | Top-load socket for integrated circuit device |
US5290192A (en) * | 1992-09-28 | 1994-03-01 | Wells Electronics, Inc. | Chip carrier socket |
US5387118A (en) * | 1993-04-30 | 1995-02-07 | Chichibu Fuji Co., Ltd. | Socket for IC package |
GB2286490A (en) * | 1994-02-10 | 1995-08-16 | Hsu Fu Yu | Contact for ZIF socket |
US5443396A (en) * | 1993-03-31 | 1995-08-22 | Enplas Corporation | IC socket |
US5564932A (en) * | 1994-11-14 | 1996-10-15 | Castleman; Mark-Andrew B. | Customizeable interconnect device for stacking electrical components of varying configuration |
US5746608A (en) * | 1995-11-30 | 1998-05-05 | Taylor; Attalee S. | Surface mount socket for an electronic package, and contact for use therewith |
US5829989A (en) * | 1996-03-06 | 1998-11-03 | Enplas Corporation | IC socket |
US5908324A (en) * | 1996-03-22 | 1999-06-01 | Enplas Corporation | Socket for electric parts |
US6109944A (en) * | 1997-12-01 | 2000-08-29 | Yamaichi Electronics Co., Ltd. | IC socket having forwardly displaceable contacts with upper and lower contact pieces |
US6146173A (en) * | 1997-09-05 | 2000-11-14 | Molex Incorporated | IC socket |
US6213803B1 (en) | 1998-02-02 | 2001-04-10 | Yamaichi Electronics Co., Ltd. | IC socket |
US6449165B1 (en) * | 1999-04-07 | 2002-09-10 | Samsung Electronics Co., Ltd. | Electrical interconnecting device for a semiconductor assembly |
US20040171292A1 (en) * | 2001-07-13 | 2004-09-02 | Toshiaki Watanabe | Self-aligning socket connector |
EP1471780A2 (en) * | 1996-09-30 | 2004-10-27 | Berg Electronics Manufacturing B.V. | Socket for connecting an integrated circuit to a printed wiring board |
US20050186808A1 (en) * | 2004-02-24 | 2005-08-25 | Victor Prokofiev | Via grid array sockets for electronics applications |
US7871283B2 (en) | 2007-12-03 | 2011-01-18 | Yamaichi Electronics Co., Ltd. | Semiconductor package socket |
US8167630B2 (en) | 1996-10-10 | 2012-05-01 | Fci Americas Technology Llc | High density connector and method of manufacture |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3805212A (en) * | 1971-05-03 | 1974-04-16 | Berg Electronic Inc | Terminal housing for substrate |
US3907394A (en) * | 1973-07-02 | 1975-09-23 | Du Pont | Circuit socket and removable package |
JPS5645581A (en) * | 1979-09-20 | 1981-04-25 | Nippon Electric Co | Lsi socket |
US4491377A (en) * | 1982-04-19 | 1985-01-01 | Pfaff Wayne | Mounting housing for leadless chip carrier |
US4553206A (en) * | 1983-10-03 | 1985-11-12 | Wang Laboratories, Inc. | Image storage and retrieval |
US4533192A (en) * | 1984-04-25 | 1985-08-06 | Minnesota Mining And Manufacturing Company | Integrated circuit test socket |
US4623208A (en) * | 1985-04-03 | 1986-11-18 | Wells Electronic, Inc. | Leadless chip carrier socket |
-
1985
- 1985-10-21 JP JP60235054A patent/JPS6293964A/en active Granted
-
1986
- 1986-10-21 US US06921255 patent/US4691975B1/en not_active Expired - Lifetime
Cited By (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4799897A (en) * | 1985-12-30 | 1989-01-24 | Dai-Ichi Seiko Kabushiki Kaisha | IC tester socket |
EP0295046A1 (en) * | 1987-06-09 | 1988-12-14 | Texas Instruments Incorporated | Test socket with improved contact engagement |
US4750890A (en) * | 1987-06-18 | 1988-06-14 | The J. M. Ney Company | Test socket for an integrated circuit package |
US4886470A (en) * | 1988-05-24 | 1989-12-12 | Amp Incorporated | Burn-in socket for gull wing integrated circuit package |
EP0450211A1 (en) * | 1988-09-30 | 1991-10-09 | Yamaichi Electronics Co., Ltd. | Contact shutter device in ic socket |
US5015196A (en) * | 1989-01-18 | 1991-05-14 | E. I. Du Pont De Nemours And Company | Low insertion force connector and electrical contact therefor |
EP0379365A1 (en) * | 1989-01-18 | 1990-07-25 | E.I. Du Pont De Nemours And Company | Low insertion force connector and electrical contact therefor |
US4919623A (en) * | 1989-02-13 | 1990-04-24 | Amp Incorporated | Burn-in socket for integrated circuit device |
EP0385314A1 (en) * | 1989-02-28 | 1990-09-05 | The Whitaker Corporation | Zero insertion force connector for cable to board applications |
EP0390543A1 (en) * | 1989-03-30 | 1990-10-03 | Yamaichi Electronics Co., Ltd. | Contact structure in socket with IC carrier placed thereon |
EP0413240A1 (en) * | 1989-08-18 | 1991-02-20 | The Whitaker Corporation | Electrical contact |
US5076798A (en) * | 1989-10-24 | 1991-12-31 | Yamaichi Electric Mfg. Co., Ltd. | Shutter mechanism of a contact in an ic socket |
EP0425110A3 (en) * | 1989-10-24 | 1992-07-15 | Yamaichi Electric Mfg. Co. Ltd.. | Shutter mechanism of contact in ic socket |
EP0425110A2 (en) * | 1989-10-24 | 1991-05-02 | Yamaichi Electronics Co., Ltd. | Shutter mechanism of contact in IC socket |
US5147212A (en) * | 1990-06-15 | 1992-09-15 | Yamaichi Electric Co., Ltd. | Socket for electric part |
US5261832A (en) * | 1990-06-15 | 1993-11-16 | Yamaichi Electric Co., Ltd. | Socket for electric part |
US5114358A (en) * | 1991-03-11 | 1992-05-19 | Wells Electronics, Inc. | Chip carrier socket |
US5108302A (en) * | 1991-06-17 | 1992-04-28 | Pfaff Wayne | Test socket |
US5304072A (en) * | 1991-10-15 | 1994-04-19 | Yamaichi Electronics Co., Ltd. | Socket for electric part |
EP0539073A1 (en) * | 1991-10-15 | 1993-04-28 | Yamaichi Electronics Co., Ltd. | Socket for electric part |
US5240429A (en) * | 1992-03-06 | 1993-08-31 | Wells Electronics, Inc. | Chip carrier socket |
DE4243056A1 (en) * | 1992-07-06 | 1994-01-13 | Wells Electronics | Socket for integrated circuit carriers |
US5290192A (en) * | 1992-09-28 | 1994-03-01 | Wells Electronics, Inc. | Chip carrier socket |
US5288240A (en) * | 1992-12-16 | 1994-02-22 | Minnesota Mining And Manufacturing Company | Top-load socket for integrated circuit device |
US5443396A (en) * | 1993-03-31 | 1995-08-22 | Enplas Corporation | IC socket |
US5387118A (en) * | 1993-04-30 | 1995-02-07 | Chichibu Fuji Co., Ltd. | Socket for IC package |
GB2286490A (en) * | 1994-02-10 | 1995-08-16 | Hsu Fu Yu | Contact for ZIF socket |
US5564932A (en) * | 1994-11-14 | 1996-10-15 | Castleman; Mark-Andrew B. | Customizeable interconnect device for stacking electrical components of varying configuration |
US5746608A (en) * | 1995-11-30 | 1998-05-05 | Taylor; Attalee S. | Surface mount socket for an electronic package, and contact for use therewith |
US5829989A (en) * | 1996-03-06 | 1998-11-03 | Enplas Corporation | IC socket |
US5908324A (en) * | 1996-03-22 | 1999-06-01 | Enplas Corporation | Socket for electric parts |
EP1471780A2 (en) * | 1996-09-30 | 2004-10-27 | Berg Electronics Manufacturing B.V. | Socket for connecting an integrated circuit to a printed wiring board |
EP1471780A3 (en) * | 1996-09-30 | 2005-08-24 | Berg Electronics Manufacturing B.V. | Socket for connecting an integrated circuit to a printed wiring board |
US8167630B2 (en) | 1996-10-10 | 2012-05-01 | Fci Americas Technology Llc | High density connector and method of manufacture |
US6146173A (en) * | 1997-09-05 | 2000-11-14 | Molex Incorporated | IC socket |
US6109944A (en) * | 1997-12-01 | 2000-08-29 | Yamaichi Electronics Co., Ltd. | IC socket having forwardly displaceable contacts with upper and lower contact pieces |
US6213803B1 (en) | 1998-02-02 | 2001-04-10 | Yamaichi Electronics Co., Ltd. | IC socket |
US6449165B1 (en) * | 1999-04-07 | 2002-09-10 | Samsung Electronics Co., Ltd. | Electrical interconnecting device for a semiconductor assembly |
US20040171292A1 (en) * | 2001-07-13 | 2004-09-02 | Toshiaki Watanabe | Self-aligning socket connector |
US6902418B2 (en) * | 2001-07-13 | 2005-06-07 | Molex Incorporated | Self-aligning socket connector |
US20050186808A1 (en) * | 2004-02-24 | 2005-08-25 | Victor Prokofiev | Via grid array sockets for electronics applications |
US7470147B2 (en) * | 2004-02-24 | 2008-12-30 | Intel Corporation | Spring biased socket system |
US7871283B2 (en) | 2007-12-03 | 2011-01-18 | Yamaichi Electronics Co., Ltd. | Semiconductor package socket |
Also Published As
Publication number | Publication date |
---|---|
US4691975A (en) | 1987-09-08 |
JPH0324035B2 (en) | 1991-04-02 |
JPS6293964A (en) | 1987-04-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: DAI-ICHI SEIKO KABUSHIKI KAISHA, NAMIKI 2-30-1, KA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNORS:FUKUNAGA, MASAMI;YAMAGUCHI, TOMOYOSHI;REEL/FRAME:004619/0868 Effective date: 19861016 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FEPP | Fee payment procedure |
Free format text: PAYMENT IS IN EXCESS OF AMOUNT REQUIRED. REFUND SCHEDULED (ORIGINAL EVENT CODE: F169); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
REFU | Refund |
Free format text: REFUND - PAYMENT OF MAINTENANCE FEE, 4TH YR, SMALL ENTITY, PL 97-247 (ORIGINAL EVENT CODE: R273); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Free format text: REFUND - PAYMENT OF MAINTENANCE FEE, 4TH YEAR, PL 97-247 (ORIGINAL EVENT CODE: R173); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FEPP | Fee payment procedure |
Free format text: PAT HOLDER CLAIMS SMALL ENTITY STATUS - SMALL BUSINESS (ORIGINAL EVENT CODE: SM02); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
RR | Request for reexamination filed |
Effective date: 19980827 |
|
FPAY | Fee payment |
Year of fee payment: 12 |
|
SULP | Surcharge for late payment | ||
AS | Assignment |
Owner name: ENPLAS CORPORATION, JAPAN Free format text: CHANGE OF NAME;ASSIGNOR:DAI-ICHI SEIKO KABUSHIKI KAISHA;REEL/FRAME:009893/0070 Effective date: 19990209 |
|
FEPP | Fee payment procedure |
Free format text: PAT HLDR NO LONGER CLAIMS SMALL ENT STAT AS SMALL BUSINESS (ORIGINAL EVENT CODE: LSM2); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
REFU | Refund |
Free format text: REFUND - PAYMENT OF MAINTENANCE FEE, 12TH YR, SMALL ENTITY (ORIGINAL EVENT CODE: R285); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |