[go: up one dir, main page]

US20010046834A1 - Pad surface texture formed by solid phase droplets - Google Patents

Pad surface texture formed by solid phase droplets Download PDF

Info

Publication number
US20010046834A1
US20010046834A1 US09/795,242 US79524201A US2001046834A1 US 20010046834 A1 US20010046834 A1 US 20010046834A1 US 79524201 A US79524201 A US 79524201A US 2001046834 A1 US2001046834 A1 US 2001046834A1
Authority
US
United States
Prior art keywords
droplets
polishing
pattern
layer
dispensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US09/795,242
Inventor
Anuradha Ramana
Elmer Jensen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DuPont Electronic Materials Holding Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to US09/795,242 priority Critical patent/US20010046834A1/en
Assigned to RODEL HOLDINGS, INC. reassignment RODEL HOLDINGS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: RAMANA, ANURADHA, JENSEN, ELMER W. JR.
Publication of US20010046834A1 publication Critical patent/US20010046834A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D11/00Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
    • B24D11/001Manufacture of flexible abrasive materials
    • B24D11/005Making abrasive webs
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28Resins or natural or synthetic macromolecular compounds
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C64/00Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
    • B29C64/10Processes of additive manufacturing
    • B29C64/106Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material
    • B29C64/124Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using layers of liquid which are selectively solidified
    • B29C64/129Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using layers of liquid which are selectively solidified characterised by the energy source therefor, e.g. by global irradiation combined with a mask
    • B29C64/135Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using layers of liquid which are selectively solidified characterised by the energy source therefor, e.g. by global irradiation combined with a mask the energy source being concentrated, e.g. scanning lasers or focused light sources

Definitions

  • the present invention relates to a polishing pad and a process for making a polishing surface on a polishing pad that polishes articles, such as, semiconductors, integrated circuits, and glass substrates.
  • a polishing process is performed by rubbing a moving polishing pad against a surface of an article being polished, while a fluid polishing composition is applied at an interface of the polishing pad and the article being polished. Polishing removes material from the article at a controlled rate, and produces a smooth, planar polished surface on the article.
  • the polishing composition includes an aqueous solution of chemical constituents that react selectively with the material of the article to enhance its removal by polishing.
  • the polishing composition can include a liquid suspension of particulates of polishing abrasives for abrading the article.
  • the polishing composition can include a liquid suspension of particulates of substances that chemically bond to selected material on the article being polished to inhibit polishing and removal of the selected material.
  • the pads themselves can include particulates of abrasives or can be free of particulates of abrasives.
  • U.S. Pat. 5,489,233 discloses known polishing pads having polishing surfaces on which surface texture is provided to transport polishing composition across the polishing surfaces, and provide active polishing activity of the pads.
  • the surface texture is identified as either macrotexture or microtexture.
  • Macrotexture is texture in the form of recesses with dimensions of depths and spacings apart that are clearly visible to the unaided eye.
  • Microtexture is texture in the form of recesses of smaller dimensions that those of macrotexture.
  • the surface texture, including macrotexture and microtexture, of known polishing pads is provided by mechanical production and/or by the material structure of the polishing pads.
  • polishing pads are fabricated of materials in bulk that are bulk processed, for example, by combining particulates and fluid phase materials with fibrous materials, and by agglomerating, depositing, molding, casting or sintering nonfibrous materials. Further, bulk processing is performed by a series of batch processes that result in batch to batch variation among the pads. Such pads are intended to have the same surface texture. However the surface textures vary, which produce different polishing performances that are difficult to predict. What is desired is a manufacturing process that produces a desired surface texture on a polishing surface, with minimized variation of the surface texture among multiple pads intended to have the same surface texture. Further, what is desired is a surface texture on a polishing surface of a polishing pad, which surface texture has recesses of controlled dimensions and controlled spacings apart to minimize variations among multiple pads intended to have the same surface texture.
  • the invention advantageously provides a polishing surface on a polishing pad and a surface texture.
  • the invention is directed to polishing surface on a polishing pad, wherein the polishing surface is constructed of successive layers of solidified droplets of material, the droplets are arranged in a pattern of droplets in each of the layers, and a surface texture of the polishing surface is provided by recesses bounded by the droplets in the pattern of droplets.
  • the invention is directed to a process for making a polishing surface on a polishing pad by; building successive layers of droplets of material one layer on another layer by dispensing the material in fluid phase as droplets arranged in a droplet pattern, and solidifying the droplets in the droplet pattern to provide the polishing surface with a surface texture having recesses bounded by the droplets in the droplet pattern.
  • FIG. 1 is a schematic view of apparatus including a piezoelectric delivery system for making a polishing surface on a polishing pad.
  • FIG. 2 is bottom view disclosing multiple nozzles of a piezoelectric printer head for producing droplets of material in liquid phase that are solidified to provide a surface texture that has recesses of controlled dimensions and controlled spacings apart to minimize variations among multiple pads intended to have the same surface texture.
  • FIG. 3 is a magnified top view of part of a polishing surface having a surface texture with recesses bounded by solidified droplets of material arranged in a first pattern of droplets.
  • FIG. 3A is a magnified top view of part of another polishing surface having a surface texture with recesses bounded by solidified droplets of material arranged in a second pattern of droplets.
  • FIG. 1 discloses a piezoelectric delivery system 10 for dispensing material of liquid phase as droplets. Such material is solidifiable subsequent to being dispensed.
  • the delivery system 10 includes an apparatus having a reservoir 11 connected by a flexible conduit 12 to a computer controlled, piezoelectric printer 13 that is controlled by a conventional computer 14 to which the printer 13 is connected by an electrical communications cable 15 .
  • the computer 14 has a central processing unit, CPU, 14 a , a video display screen 14 b and command input devices 14 c , 14 d , such as a keyboard and a mouse.
  • the computer 14 is programmed for the computer 14 to actuate the various parts of the delivery system 10 according to a sequence of process steps.
  • the reservoir 11 stores material in liquid phase and supplies such material under pressure along the conduit 12 to the printer 13 .
  • the delivery system 10 includes a computer controlled work station 16 .
  • a flexible continuous base layer or substrate 17 of a polishing pad 18 is provided as a continuous roll on a supply spool 18 , and is driven by a series of rotating drive rollers 19 across the work station 16 and to a take up spool 20 .
  • the computer 14 controls the drive rollers 19 to turn and supply the base layer or substrate 17 of the polishing pad 18 under a piezoelectric printer head 13 a of the printer 13 , while the printer head 13 a dispenses the material of fluid phase as droplets 18 b , FIGS. 3 and 3A, arranged in a pattern of droplets 18 b onto the base layer or substrate 17 that is disclosed in FIGS. 3 and 3A as being under the droplets 18 b .
  • the printer head 13 a has multiple dispensing nozzles 13 b that dispense the material of liquid phase.
  • Each of the nozzles 13 b has an opening of sufficient size to pass large molecules of material of liquid phase as droplets 18 b .
  • the computer 14 controls the printer 13 to generate a piezoelectric pulse at the printer head 13 a , to exert a pulsed increase in pressure on the material of fluid phase, which causes a droplet 18 b of the material to dispense from each nozzle 13 b .
  • the computer 14 controls the printer head 13 a to traverse back and forth, making a predetermined number of back and forth passes, as determined by the computer 14 .
  • the printer 13 dispenses droplets 18 b in a pattern of droplets 18 b , for example, one of the exemplary patterns, as disclosed by FIGS. 3 and 3A.
  • the droplets 18 b in each of the patterns are solidified, for example, by drying.
  • a polishing layer 18 c is provided on the polishing pad 18 , with an exterior surface of the polishing layer 18 c providing a polishing surface on the polishing pad 18 .
  • the polishing surface is provided with a surface texture having recesses 18 a bounded by the droplets 18 b in the pattern of droplets 18 b .
  • the recesses 18 a are disclosed as dark recesses 18 a bounded by the solidified droplets 18 b that are disclosed as light areas.
  • the dark recesses 18 a are disclosed with dotted shapes, they may also include other shapes, such as grooves or channels.
  • Those recesses 18 a that are visible to the unaided eye provide the polishing surface with macrotexture.
  • Those recesses 18 a of smaller dimensions than those that are visible to the unaided eye provide the polishing surface with microtexture.
  • a process of printing provides, either macrotexture or microtexture, or both macrotexture and microtexture.
  • Such a process is repeatable by the computer controlled, piezoelectric delivery system 10 , to minimize variation of surface texture among multiple pads 18 made by such a delivery system 10 .
  • the piezoelectric delivery system 10 eliminates a need for production of the surface texture by mechanical production on a prior manufactured polishing surface.
  • droplets 18 b are solidified by air drying, or are cured by an energy providing, curing apparatus, such as, a gun 21 or a conventional oven 21 .
  • the gun 21 is either a heat gun providing radiant heat or a UV (ultraviolet light) gun or a laser gun (D).
  • the computer 14 controls the gun 21 to provide either a continuous curing cycle or an intermittent curing cycle, as needed to solidify the droplets 18 b for permanent location within a desired pattern of droplets 18 b .
  • the droplets 18 b are cured by the heat of a conventional oven 22 .
  • the material of liquid phase includes, an hydrophilic polymer mixture of the polymer or precursor thereto and a solvent of the polymer.
  • the material of liquid phase further includes a liquid suspension of submicron size particulates of abrasives.
  • the material of liquid phase includes, polymer/solvent mixtures, low molecular weight liquid polymers or oligomers on appropriate substrates resulting in films or coatings with unique surface properties (adhesion, wettability, electrical conductivity and the like).
  • the piezoelectric delivery system 10 makes a pattern of droplets 18 b that extends through the thickness of an entire polishing layer 18 c on the base layer or substrate 17 .
  • the pattern of droplets 18 b is retained on the polishing surface of the polishing layer 18 c , as the polishing layer 18 c wears during use.
  • the polishing layer 18 c is built up to a thickness in the range of 0.05 to 0.2 millimeters by a number of repeated passes of the printer head 13 a .
  • the desired thickness of the polishing is layer 18 c determines the number of times the printer head 13 a traverses over the substrate 17 .
  • a polishing pad 18 made this process can be used for conventional polishing in which the pad 18 is used in combination with a fluid polishing composition. either containing particulates of a polishing abrasive or other material, or that is free of abrasive type of particulates.
  • the work station 16 includes a cutter/plotter, and is commercially available from Roland Inc.
  • the piezoelectric printer head 13 a is supplied by On-Target Technology, Inc.
  • An embodiment of a laser gun 21 is typically an Argon ion laser (intensity of 1 kW per sq.cm.) or Nd: YAG laser with a pulse energy of 250 mJ, pulse duration of 10 ns and a frequency of 10 Hz..
  • An embodiment of the substrate 17 can comprise a single layer or multiple layers and can comprise of a combination of layers that are bonded together.
  • the substrate 17 is preferably a flexible web capable of being pulled from a roll or easily wound into a roll.
  • Preferred substrates 17 are plastics, such as engineered plastics, for example a polyamide, polyimide, and/or polyester, particularly “PET” poly(ethylene terephthalate). Woven and non-woven webs of polyamide fibers, polyimide fibers, polyester fibers such as PET also can be used.
  • the substrate 17 has a thickness of about 0.5-1.5 millimeters.
  • the polishing layer 18 c material comprises: rigid domains which resist plastic flow during polishing; and less rigid domains which are less resistant to plastic flow during polishing. The hard domains rigorously engage the article being polished.
  • the rigid and non-rigid domain sizes in any dimension is preferably in the range of 0.05 to 0.1 millimeters.
  • Preferred dual domain materials include polyurethane polymers having a soft segment (which provides the non-rigid phase) and a hard segment (which provides the rigid phase). The domains may be produced during the forming of the polishing layer by a phase separation, due to incompatibility between the two (hard and soft) polymer segments.
  • Hard and soft domains within the pad material can also be created: by hard and soft segments along a polymer backbone; by crystalline and non-crystalline regions within the pad material; by alloying a hard polymer with a soft polymer; or by combining a polymer with an organic (latex spheres) or abrasives such as ceric oxide, silicon dioxide, zirconium oxide and the like.
  • the preferred technique for generating hard and soft domains in polishing pads generated by the process of this invention is to use a combination of an organic polymer and abrasives described above.
  • thin polishing layers 18 c in the range of 0.05 to 0.2 millimeters comprise a random surface texture comprising recesses 18 a of varying sizes and dimensions.
  • the polishing layer 18 a contains about 30 to 75% by weight abrasives in the form of particulates.
  • Other components can include organic fillers (e.g. latex spheres), organic binders (e.g. acrylic polymers), viscosity modifiers (e.g. polyethylene glycol) and organic additives to control the evaporation rate of the material.
  • Abrasives used in the polishing layer are ceric oxide, silicon dioxide, aluminum oxide, zirconium oxide or any mixtures thereof. A combination of these abrasives may also be used to give the polishing layer 18 c appropriate hardness and density.
  • the substrate 17 can be treated.
  • Treatment for this purpose includes UV curing (to promote wettability) or a coating with an adhesion promoter (solvent-based binder).
  • Commercially available substrates 17 can be coated with binders to enhance adhesion of a hydrophilic polishing layer 18 c .
  • a composition was prepared for deposition via a piezoelectric material delivery system 10 .
  • the composition is a mixture of an abrasive (ceric oxide), a solvent and a solvent based acrylic polymer having a Tg (glass transition temperature) of 50-60° C.
  • the composition was charged into the reservoir 11 (FIG.1) and deposited via the piezoelectric printer head 13 a .
  • the substrate 17 is a polyethylene terephthalate film precoated with an adhesion promoting material.
  • the droplets 18 b are deposited on the substrate 17 , and are solidified by being thermally cured by a conventional forced air oven 22 .
  • polishing layer 18 c of a polishing pad 18 can be deposited via the piezoelectric material delivery system 10 on a variety of substrates 17 and after deposition cured thermally or via a laser gun 21 to form polishing pads 18 .
  • the pattern of the droplets 18 b and the thickness of the polishing layer 18 c can be changed, as controlled by the computer 14 .
  • the resulting polishing pads 18 should be useful for polishing articles, such as, electrical devices, silicon wafers, semiconductor substrates and glass.
  • the invention applies to the manufacture of a polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having: a hardness of about 40-70 Shore D, a tensile Modulus of about 150-2,000 Mpa at 40° C, an energy loss factor, KEL, of about 100-1,100 (1/Pa at 40° C), and an elastic storage modulus, E′, ratio at 30° C-90° C of about 1-4.6, as described in U.S. Pat. Application Ser. No. 09/608,537 filed Jun. 30, 2000, which claims the benefit of provisional application 60/207,938 filed May 27, 2000, hereby incorporated by reference herein.
  • the invention applies to the manufacture of a polishing pad 18 for planarizing a surface of a semiconductor device or precursor thereto, said surface having a 10 micron width metal line, the pad 18 comprising a stiff polishing layer 18 c containing a polymer system which provides sufficient energy dissipation and low elastic recovery to provide less than 500 Angstroms of dishing on the metal line, as described in U.S. Pat. Application Ser. No. 09/608,537 filed Jun. 30, 2000, that claims the benefit of provisional application Ser. No. 60/207,938 filed May 27, 2000, hereby incorporated by reference herein.
  • the invention applies to the manufacture of a polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 further including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having: a thickness of about 250 to 5,100 micrometers, a hardness of about 40-70 Shore D, a tensile Modulus of about 150-2,000 Mpa at 40° C, an energy loss factor, KEL, of about 100-1,100 (1/Pa at 40° C), and an elastic storage modulus, E′, ratio at 30° C and 90° C of about 1-5, wherein said polishing layer 18 c is further defined as having a macro-texture comprising a groove pattern having one or more grooves, said groove pattern having: a groove depth of about 75 to about 2,540 micrometers, a groove width of about 125 to about 1,270 micrometers, and a groove pitch of about 500 to 3,600 micrometers, and said groove pattern being concentric,
  • the invention applies to the manufacture of a hydrolytically stable polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having: a thickness of about 250 to 5,100 micrometers, a hardness of about 40-70 Shore D, a tensile Modulus of about 150-2,000 Mpa at 40° C, an energy loss factor, KEL, of about 100-1,100 (1/Pa at 40° C), and an elastic storage modulus, E′, ratio at 30° C and 90° C of about 1-5, wherein said polishing layer 18 c is further defined as having a macro-texture comprising a groove pattern having one or more grooves, said groove pattern having: a groove depth of about 75 to about 2,540 micrometers, a groove width of about 125 to about 1,270 micrometers, and a groove pitch of about 500 to 3,600 micrometers and said groove pattern being random
  • patent application Ser. No. 09/665,841 filed Sep. 20, 2000 applies to the manufacture of a polishing pad 18 for planarizing a surface of a semiconductor device or precursor thereto, said surface having a 10 micron width metal line, the pad 18 comprising a stiff polishing layer 18 c containing a polymer system which provides sufficient energy dissipation and low elastic recovery to provide less than 0.5 micrometers of dishing on the metal line, as described in U.S. Patent Application Ser. No. 09/665,841 filed Sep. 20, 2000, hereby incorporated by reference herein.

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

A polishing pad is made by a piezoelectric delivery system, and a method of making the pad includes, building successive layers of droplets of material one layer on another layer by dispensing the material in fluid phase as droplets arranged in a droplet pattern, and solidifying the droplets in the droplet pattern to provide the polishing surface with a surface texture having recesses bounded by the droplets in the droplet pattern.

Description

    CROSS REFERENCE TO RELATED APPLICATION
  • This application claims the benefit of provisional application Ser. No. 60/185,483 filed Feb. 28, 2000.[0001]
  • BACKGROUND OF THE INVENTION
  • 1. Field Of The Invention [0002]
  • The present invention relates to a polishing pad and a process for making a polishing surface on a polishing pad that polishes articles, such as, semiconductors, integrated circuits, and glass substrates. [0003]
  • 2. Discussion Of Related Art [0004]
  • A polishing process is performed by rubbing a moving polishing pad against a surface of an article being polished, while a fluid polishing composition is applied at an interface of the polishing pad and the article being polished. Polishing removes material from the article at a controlled rate, and produces a smooth, planar polished surface on the article. The polishing composition includes an aqueous solution of chemical constituents that react selectively with the material of the article to enhance its removal by polishing. Further the polishing composition can include a liquid suspension of particulates of polishing abrasives for abrading the article. Further the polishing composition can include a liquid suspension of particulates of substances that chemically bond to selected material on the article being polished to inhibit polishing and removal of the selected material. The pads themselves can include particulates of abrasives or can be free of particulates of abrasives. [0005]
  • U.S. Pat. 5,489,233 discloses known polishing pads having polishing surfaces on which surface texture is provided to transport polishing composition across the polishing surfaces, and provide active polishing activity of the pads. The surface texture is identified as either macrotexture or microtexture. Macrotexture is texture in the form of recesses with dimensions of depths and spacings apart that are clearly visible to the unaided eye. Microtexture is texture in the form of recesses of smaller dimensions that those of macrotexture. The surface texture, including macrotexture and microtexture, of known polishing pads is provided by mechanical production and/or by the material structure of the polishing pads. [0006]
  • Known polishing pads are fabricated of materials in bulk that are bulk processed, for example, by combining particulates and fluid phase materials with fibrous materials, and by agglomerating, depositing, molding, casting or sintering nonfibrous materials. Further, bulk processing is performed by a series of batch processes that result in batch to batch variation among the pads. Such pads are intended to have the same surface texture. However the surface textures vary, which produce different polishing performances that are difficult to predict. What is desired is a manufacturing process that produces a desired surface texture on a polishing surface, with minimized variation of the surface texture among multiple pads intended to have the same surface texture. Further, what is desired is a surface texture on a polishing surface of a polishing pad, which surface texture has recesses of controlled dimensions and controlled spacings apart to minimize variations among multiple pads intended to have the same surface texture. [0007]
  • SUMMARY OF THE INVENTION
  • The invention advantageously provides a polishing surface on a polishing pad and a surface texture. The invention is directed to polishing surface on a polishing pad, wherein the polishing surface is constructed of successive layers of solidified droplets of material, the droplets are arranged in a pattern of droplets in each of the layers, and a surface texture of the polishing surface is provided by recesses bounded by the droplets in the pattern of droplets. [0008]
  • Further, the invention is directed to a process for making a polishing surface on a polishing pad by; building successive layers of droplets of material one layer on another layer by dispensing the material in fluid phase as droplets arranged in a droplet pattern, and solidifying the droplets in the droplet pattern to provide the polishing surface with a surface texture having recesses bounded by the droplets in the droplet pattern. [0009]
  • An embodiment of the invention will now be described by way of example, with reference to the accompanying drawings, according to which:[0010]
  • DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a schematic view of apparatus including a piezoelectric delivery system for making a polishing surface on a polishing pad. [0011]
  • FIG. 2 is bottom view disclosing multiple nozzles of a piezoelectric printer head for producing droplets of material in liquid phase that are solidified to provide a surface texture that has recesses of controlled dimensions and controlled spacings apart to minimize variations among multiple pads intended to have the same surface texture. [0012]
  • FIG. 3 is a magnified top view of part of a polishing surface having a surface texture with recesses bounded by solidified droplets of material arranged in a first pattern of droplets. [0013]
  • FIG. 3A is a magnified top view of part of another polishing surface having a surface texture with recesses bounded by solidified droplets of material arranged in a second pattern of droplets.[0014]
  • DETAILED DESCRIPTION
  • FIG. 1 discloses a piezoelectric delivery system [0015] 10 for dispensing material of liquid phase as droplets. Such material is solidifiable subsequent to being dispensed. The delivery system 10 includes an apparatus having a reservoir 11 connected by a flexible conduit 12 to a computer controlled, piezoelectric printer 13 that is controlled by a conventional computer 14 to which the printer 13 is connected by an electrical communications cable 15. The computer 14 has a central processing unit, CPU, 14 a, a video display screen 14 b and command input devices 14 c, 14 d, such as a keyboard and a mouse. The computer 14 is programmed for the computer 14 to actuate the various parts of the delivery system 10 according to a sequence of process steps. The reservoir 11 stores material in liquid phase and supplies such material under pressure along the conduit 12 to the printer 13. Further, the delivery system 10, as disclosed by FIG. 1, includes a computer controlled work station 16. A flexible continuous base layer or substrate 17 of a polishing pad 18 is provided as a continuous roll on a supply spool 18, and is driven by a series of rotating drive rollers 19 across the work station 16 and to a take up spool 20. The computer 14 controls the drive rollers 19 to turn and supply the base layer or substrate 17 of the polishing pad 18 under a piezoelectric printer head 13 a of the printer 13, while the printer head 13 a dispenses the material of fluid phase as droplets 18 b, FIGS. 3 and 3A, arranged in a pattern of droplets 18 b onto the base layer or substrate 17 that is disclosed in FIGS. 3 and 3A as being under the droplets 18 b.
  • As disclosed by FIG. 2, the printer head [0016] 13 a has multiple dispensing nozzles 13 b that dispense the material of liquid phase. Each of the nozzles 13 b has an opening of sufficient size to pass large molecules of material of liquid phase as droplets 18 b. According to a known operation of a piezoelectric printer head 13 a, the computer 14 controls the printer 13 to generate a piezoelectric pulse at the printer head 13 a, to exert a pulsed increase in pressure on the material of fluid phase, which causes a droplet 18 b of the material to dispense from each nozzle 13 b. While such droplets 18 b are being dispensed from respective nozzles 13 b, the computer 14 controls the printer head 13 a to traverse back and forth, making a predetermined number of back and forth passes, as determined by the computer 14. Thereby, the printer 13 dispenses droplets 18 b in a pattern of droplets 18 b, for example, one of the exemplary patterns, as disclosed by FIGS. 3 and 3A. The droplets 18 b in each of the patterns are solidified, for example, by drying. By solidifying the droplets 18 b in the patterns, a polishing layer 18 c is provided on the polishing pad 18, with an exterior surface of the polishing layer 18 c providing a polishing surface on the polishing pad 18. Further, the polishing surface is provided with a surface texture having recesses 18 a bounded by the droplets 18 b in the pattern of droplets 18 b. In each of FIGS. 3 and 3A, the recesses 18 a are disclosed as dark recesses 18 a bounded by the solidified droplets 18 b that are disclosed as light areas. Although the dark recesses 18 a are disclosed with dotted shapes, they may also include other shapes, such as grooves or channels. Those recesses 18 a that are visible to the unaided eye provide the polishing surface with macrotexture. Those recesses 18 a of smaller dimensions than those that are visible to the unaided eye provide the polishing surface with microtexture. According to the invention, a process of printing provides, either macrotexture or microtexture, or both macrotexture and microtexture. Such a process is repeatable by the computer controlled, piezoelectric delivery system 10, to minimize variation of surface texture among multiple pads 18 made by such a delivery system 10. Additionally, the piezoelectric delivery system 10 eliminates a need for production of the surface texture by mechanical production on a prior manufactured polishing surface.
  • With reference to FIG. 1, after droplets [0017] 18 b are dispensed on the substrate 17, they are solidified by air drying, or are cured by an energy providing, curing apparatus, such as, a gun 21 or a conventional oven 21. The gun 21 is either a heat gun providing radiant heat or a UV (ultraviolet light) gun or a laser gun (D). The computer 14 controls the gun 21 to provide either a continuous curing cycle or an intermittent curing cycle, as needed to solidify the droplets 18 b for permanent location within a desired pattern of droplets 18 b. Alternatively, the droplets 18 b are cured by the heat of a conventional oven 22.
  • According to an embodiment, the material of liquid phase includes, an hydrophilic polymer mixture of the polymer or precursor thereto and a solvent of the polymer. According to another embodiment, the material of liquid phase further includes a liquid suspension of submicron size particulates of abrasives. [0018]
  • According to a further embodiment, the material of liquid phase includes, polymer/solvent mixtures, low molecular weight liquid polymers or oligomers on appropriate substrates resulting in films or coatings with unique surface properties (adhesion, wettability, electrical conductivity and the like). [0019]
  • According to an embodiment, the piezoelectric delivery system [0020] 10 makes a pattern of droplets 18 b that extends through the thickness of an entire polishing layer 18 c on the base layer or substrate 17. The pattern of droplets 18 b is retained on the polishing surface of the polishing layer 18 c, as the polishing layer 18 c wears during use. The polishing layer 18 c is built up to a thickness in the range of 0.05 to 0.2 millimeters by a number of repeated passes of the printer head 13 a. The desired thickness of the polishing is layer 18 c determines the number of times the printer head 13 a traverses over the substrate 17. Surface texture is obtained by controlling the number and location of nozzles 13 b, and by the sizes and locations of the dispensed droplets 18 b. A polishing pad 18 made this process can be used for conventional polishing in which the pad 18 is used in combination with a fluid polishing composition. either containing particulates of a polishing abrasive or other material, or that is free of abrasive type of particulates.
  • According to an embodiment, the work station [0021] 16 includes a cutter/plotter, and is commercially available from Roland Inc. The piezoelectric printer head 13 a is supplied by On-Target Technology, Inc. An embodiment of a laser gun 21 is typically an Argon ion laser (intensity of 1 kW per sq.cm.) or Nd: YAG laser with a pulse energy of 250 mJ, pulse duration of 10 ns and a frequency of 10 Hz..
  • An embodiment of the [0022] substrate 17 can comprise a single layer or multiple layers and can comprise of a combination of layers that are bonded together. The substrate 17 is preferably a flexible web capable of being pulled from a roll or easily wound into a roll. Preferred substrates 17 are plastics, such as engineered plastics, for example a polyamide, polyimide, and/or polyester, particularly “PET” poly(ethylene terephthalate). Woven and non-woven webs of polyamide fibers, polyimide fibers, polyester fibers such as PET also can be used. The substrate 17 has a thickness of about 0.5-1.5 millimeters.
  • In another embodiment of this invention, the polishing layer [0023] 18 c material comprises: rigid domains which resist plastic flow during polishing; and less rigid domains which are less resistant to plastic flow during polishing. The hard domains rigorously engage the article being polished.
  • The rigid and non-rigid domain sizes in any dimension (height, width or length) is preferably in the range of 0.05 to 0.1 millimeters. Preferred dual domain materials include polyurethane polymers having a soft segment (which provides the non-rigid phase) and a hard segment (which provides the rigid phase). The domains may be produced during the forming of the polishing layer by a phase separation, due to incompatibility between the two (hard and soft) polymer segments. Hard and soft domains within the pad material can also be created: by hard and soft segments along a polymer backbone; by crystalline and non-crystalline regions within the pad material; by alloying a hard polymer with a soft polymer; or by combining a polymer with an organic (latex spheres) or abrasives such as ceric oxide, silicon dioxide, zirconium oxide and the like. The preferred technique for generating hard and soft domains in polishing pads generated by the process of this invention is to use a combination of an organic polymer and abrasives described above. [0024]
  • In another embodiment of this invention, thin polishing layers [0025] 18 c in the range of 0.05 to 0.2 millimeters comprise a random surface texture comprising recesses 18 a of varying sizes and dimensions. In another embodiment, the polishing layer 18 a contains about 30 to 75% by weight abrasives in the form of particulates. Other components can include organic fillers (e.g. latex spheres), organic binders (e.g. acrylic polymers), viscosity modifiers (e.g. polyethylene glycol) and organic additives to control the evaporation rate of the material. Abrasives used in the polishing layer are ceric oxide, silicon dioxide, aluminum oxide, zirconium oxide or any mixtures thereof. A combination of these abrasives may also be used to give the polishing layer 18 c appropriate hardness and density.
  • To obtain adequate adhesion of a hydrophilic type of polishing layer [0026] 18 c to the flexible base substrate 17, the substrate 17 can be treated. Treatment for this purpose includes UV curing (to promote wettability) or a coating with an adhesion promoter (solvent-based binder). Commercially available substrates 17 can be coated with binders to enhance adhesion of a hydrophilic polishing layer 18 c.
  • EXAMPLE 1
  • A composition was prepared for deposition via a piezoelectric material delivery system [0027] 10. The composition is a mixture of an abrasive (ceric oxide), a solvent and a solvent based acrylic polymer having a Tg (glass transition temperature) of 50-60° C. The composition was charged into the reservoir 11 (FIG.1) and deposited via the piezoelectric printer head 13 a. The substrate 17 is a polyethylene terephthalate film precoated with an adhesion promoting material. The droplets 18 b are deposited on the substrate 17, and are solidified by being thermally cured by a conventional forced air oven 22.
  • It is expected that a variety of different compositions used for forming the polishing layer [0028] 18 c of a polishing pad 18 can be deposited via the piezoelectric material delivery system 10 on a variety of substrates 17 and after deposition cured thermally or via a laser gun 21 to form polishing pads 18. The pattern of the droplets 18 b and the thickness of the polishing layer 18 c can be changed, as controlled by the computer 14. The resulting polishing pads 18 should be useful for polishing articles, such as, electrical devices, silicon wafers, semiconductor substrates and glass.
  • The invention applies to the manufacture of a [0029] polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having: a hardness of about 40-70 Shore D, a tensile Modulus of about 150-2,000 Mpa at 40° C, an energy loss factor, KEL, of about 100-1,100 (1/Pa at 40° C), and an elastic storage modulus, E′, ratio at 30° C-90° C of about 1-4.6, as described in U.S. Pat. Application Ser. No. 09/608,537 filed Jun. 30, 2000, which claims the benefit of provisional application 60/207,938 filed May 27, 2000, hereby incorporated by reference herein.
  • Further, the invention applies to the manufacture of a [0030] polishing pad 18 for planarizing a surface of a semiconductor device or precursor thereto, said surface having a 10 micron width metal line, the pad 18 comprising a stiff polishing layer 18 c containing a polymer system which provides sufficient energy dissipation and low elastic recovery to provide less than 500 Angstroms of dishing on the metal line, as described in U.S. Pat. Application Ser. No. 09/608,537 filed Jun. 30, 2000, that claims the benefit of provisional application Ser. No. 60/207,938 filed May 27, 2000, hereby incorporated by reference herein.
  • Further, the invention applies to the manufacture of a [0031] polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 further including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having: a thickness of about 250 to 5,100 micrometers, a hardness of about 40-70 Shore D, a tensile Modulus of about 150-2,000 Mpa at 40° C, an energy loss factor, KEL, of about 100-1,100 (1/Pa at 40° C), and an elastic storage modulus, E′, ratio at 30° C and 90° C of about 1-5, wherein said polishing layer 18 c is further defined as having a macro-texture comprising a groove pattern having one or more grooves, said groove pattern having: a groove depth of about 75 to about 2,540 micrometers, a groove width of about 125 to about 1,270 micrometers, and a groove pitch of about 500 to 3,600 micrometers, and said groove pattern being concentric, spiral, cross-hatched, X-Y grid, hexagonal, triangular, fractal or a combination thereof, as described in U.S. Pat. Application Ser. No. 09/631,783 filed Aug. 3, 2000. Further, the invention applies to the manufacture of a polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having, an Elastic Storage Modulus, E′, ratio at 30° C and 90° C of about 1-3.6, as described in U.S. patent application Ser. No. 09/631,783 filed Aug.3, 2000, that claims the benefit of provisional application Ser. No. 60/207,938 filed May 27, 2000, and that claims the benefit of provisional application Ser. No. 60/222,099 filed Jul. 28, 2000, hereby incorporated by reference herein.
  • Further, the invention applies to the manufacture of a hydrolytically [0032] stable polishing pad 18 for planarizing a surface of a semiconductor device or a precursor thereto, said pad 18 including, for example, a polishing layer 18 c for planarizing said surface, said layer 18 c having: a thickness of about 250 to 5,100 micrometers, a hardness of about 40-70 Shore D, a tensile Modulus of about 150-2,000 Mpa at 40° C, an energy loss factor, KEL, of about 100-1,100 (1/Pa at 40° C), and an elastic storage modulus, E′, ratio at 30° C and 90° C of about 1-5, wherein said polishing layer 18 c is further defined as having a macro-texture comprising a groove pattern having one or more grooves, said groove pattern having: a groove depth of about 75 to about 2,540 micrometers, a groove width of about 125 to about 1,270 micrometers, and a groove pitch of about 500 to 3,600 micrometers and said groove pattern being random, concentric, spiral, cross-hatched, X-Y grid, hexagonal, triangular, fractal or a combination thereof, as described in U.S. patent application Ser. No. 09/665,841 filed Sep. 20, 2000. Further, the invention applies to the manufacture of a polishing pad 18 for planarizing a surface of a semiconductor device or precursor thereto, said surface having a 10 micron width metal line, the pad 18 comprising a stiff polishing layer 18 c containing a polymer system which provides sufficient energy dissipation and low elastic recovery to provide less than 0.5 micrometers of dishing on the metal line, as described in U.S. Patent Application Ser. No. 09/665,841 filed Sep. 20, 2000, hereby incorporated by reference herein.
  • Preferred embodiments having been described, other embodiments and modifications of the invention are intended to be covered by the spirit and scope of the appended claims. [0033]

Claims (10)

What is claimed is:
1. A process for making polishing pads useful in the manufacture of a semiconductor device or a precursor thereto, comprising applying a material comprising a hydrophilic polymer and abrasive to a flexible base substrate using a piezoelectric material delivery system to form a polishing layer on the substrate and curing the deposited polishing layer.
2. The process of
claim 1
in which a multiplicity of layers are applied to a desired pattern and thickness to form the polishing layer and the layer is cured thermally or with a laser.
3. The process of
claim 2
in which the piezoelectric material delivery system comprises a piezoelectric printer.
4. A method for making a polishing surface on a polishing pad, comprising the steps of: building successive layers of droplets of material one layer on another layer by dispensing the material in fluid phase as droplets arranged in a droplet pattern, and solidifying the droplets in the droplet pattern to provide the polishing surface with a surface texture having recesses bounded by the droplets in the droplet pattern.
5. The method of
claim 4
wherein, the step of building successive layers of material further comprises the step of: dispensing the material in fluid phase as droplets of different sizes.
6. The method of
claim 4
wherein, the step of dispensing the material in fluid phase as droplets, further comprises the step of; dispensing the material in fluid phase as droplets of polymeric material in a solvent of the polymeric material.
7. The method of
claim 4
wherein, the step of building successive layers of material further comprises the step of, dispensing particulates in suspension with the material in fluid phase; and the step of solidifying the droplets in the droplet pattern further comprises the step of, solidifying the droplets in the droplet pattern to retain the particulates in the droplets.
8. The method of
claim 4
wherein, the step of solidifying the droplets in the droplet pattern further comprises the step of curing the droplets.
9. A polishing surface on a polishing pad comprising: successive layers of droplets of material, the droplets being arranged in a pattern of solidified droplets in each of the layers, and a surface texture of the polishing surface provided by recesses bounded by the droplets arranged in the pattern of droplets.
10. A system for making a polishing surface on a polishing pad comprising: a reservoir supplying solidifyable material of fluid phase to a computer controlled piezoelectric printer, a printer head of the printer dispensing droplets of the material in a pattern of droplets onto a substrate of a polishing pad, and a curing apparatus curing the droplets to solid phase to retain the droplets in the pattern.
US09/795,242 2000-02-28 2001-02-28 Pad surface texture formed by solid phase droplets Abandoned US20010046834A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US09/795,242 US20010046834A1 (en) 2000-02-28 2001-02-28 Pad surface texture formed by solid phase droplets

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US18548300P 2000-02-28 2000-02-28
US09/795,242 US20010046834A1 (en) 2000-02-28 2001-02-28 Pad surface texture formed by solid phase droplets

Publications (1)

Publication Number Publication Date
US20010046834A1 true US20010046834A1 (en) 2001-11-29

Family

ID=22681163

Family Applications (1)

Application Number Title Priority Date Filing Date
US09/795,242 Abandoned US20010046834A1 (en) 2000-02-28 2001-02-28 Pad surface texture formed by solid phase droplets

Country Status (2)

Country Link
US (1) US20010046834A1 (en)
WO (1) WO2001064396A1 (en)

Cited By (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050020082A1 (en) * 2000-05-27 2005-01-27 Arun Vishwanathan Polishing pads for chemical mechanical planarization
US20080248719A1 (en) * 2007-04-03 2008-10-09 Schweitzer Marc O Apparatus, method and computer program product for modifying a surface of a component
CN104285281A (en) * 2012-04-25 2015-01-14 应用材料公司 Printed CMP Pads
WO2016061544A1 (en) 2014-10-17 2016-04-21 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
WO2016061585A1 (en) * 2014-10-17 2016-04-21 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US20160136787A1 (en) * 2014-10-17 2016-05-19 Applied Materials, Inc. Advanced polishing pad materials and formulations
US9421666B2 (en) 2013-11-04 2016-08-23 Applied Materials, Inc. Printed chemical mechanical polishing pad having abrasives therein
US20160375550A1 (en) * 2015-06-26 2016-12-29 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Controlled-porosity method for forming polishing pad
US20170087688A1 (en) * 2015-09-25 2017-03-30 Cabot Microelectronics Corporation Polyurethane cmp pads having a high modulus ratio
WO2017155969A1 (en) * 2016-03-09 2017-09-14 Applied Materials, Inc. Pad structure and fabrication methods
US10384330B2 (en) 2014-10-17 2019-08-20 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
US10399201B2 (en) 2014-10-17 2019-09-03 Applied Materials, Inc. Advanced polishing pads having compositional gradients by use of an additive manufacturing process
US10596763B2 (en) 2017-04-21 2020-03-24 Applied Materials, Inc. Additive manufacturing with array of energy sources
US10821573B2 (en) 2014-10-17 2020-11-03 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10875145B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US11002530B2 (en) 2016-09-20 2021-05-11 Applied Materials, Inc. Tiltable platform for additive manufacturing of a polishing pad
US11072050B2 (en) 2017-08-04 2021-07-27 Applied Materials, Inc. Polishing pad with window and manufacturing methods thereof
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11524384B2 (en) 2017-08-07 2022-12-13 Applied Materials, Inc. Abrasive delivery polishing pads and manufacturing methods thereof
US11685014B2 (en) 2018-09-04 2023-06-27 Applied Materials, Inc. Formulations for advanced polishing pads
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US11806829B2 (en) 2020-06-19 2023-11-07 Applied Materials, Inc. Advanced polishing pads and related polishing pad manufacturing methods
US11813712B2 (en) 2019-12-20 2023-11-14 Applied Materials, Inc. Polishing pads having selectively arranged porosity
US11878389B2 (en) 2021-02-10 2024-01-23 Applied Materials, Inc. Structures formed using an additive manufacturing process for regenerating surface texture in situ
US11964359B2 (en) 2015-10-30 2024-04-23 Applied Materials, Inc. Apparatus and method of forming a polishing article that has a desired zeta potential
US11986922B2 (en) 2015-11-06 2024-05-21 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US12023853B2 (en) 2014-10-17 2024-07-02 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7524345B2 (en) 2005-02-22 2009-04-28 Saint-Gobain Abrasives, Inc. Rapid tooling system and methods for manufacturing abrasive articles
US7875091B2 (en) * 2005-02-22 2011-01-25 Saint-Gobain Abrasives, Inc. Rapid tooling system and methods for manufacturing abrasive articles
US7867302B2 (en) * 2005-02-22 2011-01-11 Saint-Gobain Abrasives, Inc. Rapid tooling system and methods for manufacturing abrasive articles
FI20105606A7 (en) 2010-05-28 2010-11-25 Oy Kwh Mirka Ab Abrasive product and method for making the same
WO2017156342A1 (en) 2016-03-09 2017-09-14 Applied Materials, Inc. Correction of fabricated shapes in additive manufacturing
US10882160B2 (en) 2017-05-25 2021-01-05 Applied Materials, Inc. Correction of fabricated shapes in additive manufacturing using sacrificial material
US10967482B2 (en) 2017-05-25 2021-04-06 Applied Materials, Inc. Fabrication of polishing pad by additive manufacturing onto mold

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5451164A (en) * 1991-06-12 1995-09-19 Atlantic Richfield Company Method and system for geophysical and geologic modeling
US5555176A (en) * 1994-10-19 1996-09-10 Bpm Technology, Inc. Apparatus and method for making three-dimensional articles using bursts of droplets
WO1996015887A1 (en) * 1994-11-23 1996-05-30 Rodel, Inc. Polishing pads and methods for their manufacture
JP4163756B2 (en) * 1997-01-13 2008-10-08 ローム アンド ハース エレクトロニック マテリアルズ シーエムピー ホウルディングス インコーポレイテッド Polymer polishing pad having a surface pattern formed by photolithography and method related thereto

Cited By (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050020082A1 (en) * 2000-05-27 2005-01-27 Arun Vishwanathan Polishing pads for chemical mechanical planarization
US6860802B1 (en) * 2000-05-27 2005-03-01 Rohm And Haas Electric Materials Cmp Holdings, Inc. Polishing pads for chemical mechanical planarization
US20080248719A1 (en) * 2007-04-03 2008-10-09 Schweitzer Marc O Apparatus, method and computer program product for modifying a surface of a component
US8073572B2 (en) * 2007-04-03 2011-12-06 Tara Technologies, Inc. Apparatus, method and computer program product for modifying a surface of a component
US11207758B2 (en) 2012-04-25 2021-12-28 Applied Materials, Inc. Printing a chemical mechanical polishing pad
US10843306B2 (en) 2012-04-25 2020-11-24 Applied Materials, Inc. Printing a chemical mechanical polishing pad
CN107030595A (en) * 2012-04-25 2017-08-11 应用材料公司 Manufacture the method and apparatus of the grinding layer of grinding pad
KR20210158884A (en) * 2012-04-25 2021-12-31 어플라이드 머티어리얼스, 인코포레이티드 Printed chemical mechanical polishing pad
TWI731225B (en) * 2012-04-25 2021-06-21 美商應用材料股份有限公司 Apparatus for fabricating polishing layer of polishing pad and method of forming polishing layer of chemical mechanical polishing pad
KR102460581B1 (en) 2012-04-25 2022-10-27 어플라이드 머티어리얼스, 인코포레이티드 Printed chemical mechanical polishing pad
US12011801B2 (en) 2012-04-25 2024-06-18 Applied Materials, Inc. Printing a chemical mechanical polishing pad
US11673225B2 (en) 2012-04-25 2023-06-13 Applied Materials, Inc. Printing a chemical mechanical polishing pad
CN104285281A (en) * 2012-04-25 2015-01-14 应用材料公司 Printed CMP Pads
US9421666B2 (en) 2013-11-04 2016-08-23 Applied Materials, Inc. Printed chemical mechanical polishing pad having abrasives therein
US11794308B2 (en) 2013-11-04 2023-10-24 Applied Materials, Inc. Printed chemical mechanical polishing pad having particles therein
US10016877B2 (en) 2013-11-04 2018-07-10 Applied Materials, Inc. Printed chemical mechanical polishing pad having abrasives therein and system for printing
US10537974B2 (en) 2014-10-17 2020-01-21 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
JP7003104B2 (en) 2014-10-17 2022-01-20 アプライド マテリアルズ インコーポレイテッド Polishing pad manufactured by additional manufacturing process
US11724362B2 (en) 2014-10-17 2023-08-15 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US11958162B2 (en) 2014-10-17 2024-04-16 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US12023853B2 (en) 2014-10-17 2024-07-02 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
US10384330B2 (en) 2014-10-17 2019-08-20 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US11446788B2 (en) 2014-10-17 2022-09-20 Applied Materials, Inc. Precursor formulations for polishing pads produced by an additive manufacturing process
US10399201B2 (en) 2014-10-17 2019-09-03 Applied Materials, Inc. Advanced polishing pads having compositional gradients by use of an additive manufacturing process
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
TWI688451B (en) * 2014-10-17 2020-03-21 美商應用材料股份有限公司 Additive manufacturing system and method of forming a polishing pad
US20160136787A1 (en) * 2014-10-17 2016-05-19 Applied Materials, Inc. Advanced polishing pad materials and formulations
JP2020074408A (en) * 2014-10-17 2020-05-14 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated Polishing pad manufactured by additive manufacturing process
WO2016061585A1 (en) * 2014-10-17 2016-04-21 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10821573B2 (en) 2014-10-17 2020-11-03 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
WO2016061544A1 (en) 2014-10-17 2016-04-21 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
US10875145B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10953515B2 (en) 2014-10-17 2021-03-23 Applied Materials, Inc. Apparatus and method of forming a polishing pads by use of an additive manufacturing process
US10005172B2 (en) * 2015-06-26 2018-06-26 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Controlled-porosity method for forming polishing pad
KR102514354B1 (en) * 2015-06-26 2023-03-28 다우 글로벌 테크놀로지스 엘엘씨 Controlled-porosity method for forming polishing pad
US20160375550A1 (en) * 2015-06-26 2016-12-29 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Controlled-porosity method for forming polishing pad
KR20170001624A (en) * 2015-06-26 2017-01-04 다우 글로벌 테크놀로지스 엘엘씨 Controlled-porosity method for forming polishing pad
JP2017052077A (en) * 2015-06-26 2017-03-16 ローム アンド ハース エレクトロニック マテリアルズ シーエムピー ホウルディングス インコーポレイテッド Controlled-porosity method for forming polishing pad
JP2018531157A (en) * 2015-09-25 2018-10-25 キャボット マイクロエレクトロニクス コーポレイション Polyurethane CMP pad with high modulus ratio
JP7066608B2 (en) 2015-09-25 2022-05-13 シーエムシー マテリアルズ,インコーポレイティド Chemical mechanical polishing pads, methods for chemically polishing substrates, and methods for manufacturing chemical mechanical polishing pads.
US10562149B2 (en) * 2015-09-25 2020-02-18 Cabot Microelectronics Corporation Polyurethane CMP pads having a high modulus ratio
US20170087688A1 (en) * 2015-09-25 2017-03-30 Cabot Microelectronics Corporation Polyurethane cmp pads having a high modulus ratio
US11964359B2 (en) 2015-10-30 2024-04-23 Applied Materials, Inc. Apparatus and method of forming a polishing article that has a desired zeta potential
US11986922B2 (en) 2015-11-06 2024-05-21 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US11772229B2 (en) 2016-01-19 2023-10-03 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
CN109075057A (en) * 2016-03-09 2018-12-21 应用材料公司 Pad structure and manufacturing method
KR20180115336A (en) * 2016-03-09 2018-10-22 어플라이드 머티어리얼스, 인코포레이티드 Pad structures and fabrication methods
WO2017155969A1 (en) * 2016-03-09 2017-09-14 Applied Materials, Inc. Pad structure and fabrication methods
KR102302564B1 (en) * 2016-03-09 2021-09-15 어플라이드 머티어리얼스, 인코포레이티드 Pad structure and manufacturing methods
US10773509B2 (en) 2016-03-09 2020-09-15 Applied Materials, Inc. Pad structure and fabrication methods
US11002530B2 (en) 2016-09-20 2021-05-11 Applied Materials, Inc. Tiltable platform for additive manufacturing of a polishing pad
US10596763B2 (en) 2017-04-21 2020-03-24 Applied Materials, Inc. Additive manufacturing with array of energy sources
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11980992B2 (en) 2017-07-26 2024-05-14 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11072050B2 (en) 2017-08-04 2021-07-27 Applied Materials, Inc. Polishing pad with window and manufacturing methods thereof
US11524384B2 (en) 2017-08-07 2022-12-13 Applied Materials, Inc. Abrasive delivery polishing pads and manufacturing methods thereof
US11685014B2 (en) 2018-09-04 2023-06-27 Applied Materials, Inc. Formulations for advanced polishing pads
US11813712B2 (en) 2019-12-20 2023-11-14 Applied Materials, Inc. Polishing pads having selectively arranged porosity
US11806829B2 (en) 2020-06-19 2023-11-07 Applied Materials, Inc. Advanced polishing pads and related polishing pad manufacturing methods
US11878389B2 (en) 2021-02-10 2024-01-23 Applied Materials, Inc. Structures formed using an additive manufacturing process for regenerating surface texture in situ

Also Published As

Publication number Publication date
WO2001064396A1 (en) 2001-09-07

Similar Documents

Publication Publication Date Title
US20010046834A1 (en) Pad surface texture formed by solid phase droplets
US11958162B2 (en) CMP pad construction with composite material properties using additive manufacturing processes
KR102351409B1 (en) Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
US6736869B1 (en) Method for forming a planarizing pad for planarization of microelectronic substrates
CN109075057B (en) Pad structure and manufacturing method
TW491755B (en) Polishing pad having an advantageous micro-texture and methods relating thereto
JP2023153812A (en) Cmp pad construction with composite material properties using additive manufacturing processes
KR101539462B1 (en) Laminated-filament lattice for chemical mechanical polishing
TW201946940A (en) Hydrophilic and zeta potential tunable chemical mechanical polishing pads
CN105453232A (en) CMP pads having material composition that facilitates controlled conditioning
US6838382B1 (en) Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates

Legal Events

Date Code Title Description
AS Assignment

Owner name: RODEL HOLDINGS, INC., DELAWARE

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:RAMANA, ANURADHA;JENSEN, ELMER W. JR.;REEL/FRAME:011935/0210;SIGNING DATES FROM 20010611 TO 20010619

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION