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TWM665949U - Cutting calibration device and electronic component cutting machine - Google Patents

Cutting calibration device and electronic component cutting machine Download PDF

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Publication number
TWM665949U
TWM665949U TW113213052U TW113213052U TWM665949U TW M665949 U TWM665949 U TW M665949U TW 113213052 U TW113213052 U TW 113213052U TW 113213052 U TW113213052 U TW 113213052U TW M665949 U TWM665949 U TW M665949U
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Taiwan
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cutting
electronic component
detector
operation path
alignment
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TW113213052U
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Chinese (zh)
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邱文國
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台灣暹勁股份有限公司
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Publication of TWM665949U publication Critical patent/TWM665949U/en

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Abstract

一種切割校位裝置,包含第一承置單元、第二承置單元、第一檢知器、第二檢知器及處理器,第一承置單元沿切割作業路徑設有第一承置器,第二承置單元沿切割作業路徑設有第二承置器,第一檢知器裝配於第一承置器,能夠由下方朝向上方取像電子元件之第一面的第一校位部而取得第一檢知資料,第二檢知器裝配於第二承置器,能夠由上方朝向下方取像電子元件之第二面的第二校位部而取得第二檢知資料,處理器能夠接收第一檢知器及第二檢知器的第一檢知資料及第二檢知資料,以分析校位電子元件之實際切割位置,進而提高切割精度及切割品質。A cutting alignment device comprises a first supporting unit, a second supporting unit, a first detector, a second detector and a processor. The first supporting unit is provided with a first supporting unit along a cutting operation path, and the second supporting unit is provided with a second supporting unit along the cutting operation path. The first detector is mounted on the first supporting unit and can image a first alignment portion of a first surface of an electronic component from bottom to top to obtain first detection data. The second detector is mounted on the second supporting unit and can image a second alignment portion of a second surface of an electronic component from top to bottom to obtain second detection data. The processor can receive the first detection data and the second detection data of the first detector and the second detector to analyze the actual cutting position of the alignment electronic component, thereby improving the cutting accuracy and cutting quality.

Description

切割校位裝置及電子元件切割機Cutting calibration device and electronic component cutting machine

本創作提供一種能夠提高切割電子元件之精度及切割品質的切割校位裝置。This invention provides a cutting alignment device capable of improving the cutting accuracy and cutting quality of electronic components.

在現今,一具有複數個IC或LED的電子元件(例如載板),需以切割機對載板進行切割作業,以切割出複數個獨立之IC封裝件或LED封裝件。請參閱圖1,載板10由複數層板片(例如12層板片)堆疊構成,於最上層板片之正面界定複數個具IC之封裝件11及複數個上靶點12,上靶點12以供切割機(圖未示出)之切割器對位切割用;載板10之最下層板片的背面且相對封裝件11之位置設有複數個接點13,並於相對上靶點12之位置設有下靶點14。於切割作業,切割機之切割器以上靶點12作為切割位置而切割載板10,以切割出複數個獨立具有IC之封裝件11。Nowadays, an electronic component (such as a carrier) with multiple ICs or LEDs needs to be cut by a cutting machine to cut out multiple independent IC packages or LED packages. Please refer to Figure 1. The carrier 10 is composed of multiple layers of plates (such as 12 layers of plates) stacked together. The front of the top plate defines multiple packages 11 with ICs and multiple upper targets 12. The upper targets 12 are used for alignment cutting by the cutter of the cutting machine (not shown); the back of the bottom plate of the carrier 10 is provided with multiple contacts 13 at a position relative to the package 11, and a lower target 14 is provided at a position relative to the upper target 12. During the cutting operation, the cutter of the cutting machine cuts the carrier 10 with the upper target 12 as the cutting position to cut out multiple independent packages 11 with ICs.

惟,載板10易因複數層板片的多層堆疊錯位誤差,導致上靶點12與下靶點14間具有位置偏差值A,以致切割器沿上靶點12切割載板10時,會發生載板10正、反面的封裝件11邊緣與接點13二者之間距超出容許公差範圍,進而影響切割品質。However, the carrier 10 is prone to misalignment due to the multi-layer stacking of multiple layers of plates, resulting in a position deviation value A between the upper target point 12 and the lower target point 14. As a result, when the cutter cuts the carrier 10 along the upper target point 12, the distance between the edge of the package 11 and the contact 13 on the front and back sides of the carrier 10 will exceed the allowable tolerance range, thereby affecting the cutting quality.

本創作之目的一,提供一種切割校位裝置,包含第一承置單元、第二承置單元、至少一第一檢知器、至少一第二檢知器及處理器,第一承置單元沿切割作業路徑設有第一承置器,第二承置單元沿切割作業路徑設有第二承置器,第一檢知器裝配於第一承置器,能夠由下方朝向上方取像電子元件之第一面的第一校位部而取得第一檢知資料,第二檢知器裝配於第二承置器,能夠由上方朝向下方取像電子元件之第二面的第二校位部而取得第二檢知資料,處理器能夠接收第一檢知器及第二檢知器的第一檢知資料及第二檢知資料,以分析校位電子元件之實際切割位置;藉以於執行切割電子元件作業時,可供切割器由校位界定後之實際切割位置將電子元件切割成複數個構件,而可使構件的邊緣與接點符合容許公差範圍,達到提高切割精度及切割品質之實用效益。The first object of the invention is to provide a cutting alignment device, comprising a first support unit, a second support unit, at least one first detector, at least one second detector and a processor, wherein the first support unit is provided with a first support unit along a cutting operation path, and the second support unit is provided with a second support unit along a cutting operation path, wherein the first detector is mounted on the first support unit and can image a first alignment portion of a first surface of an electronic component from below toward above to obtain first detection data, and the second detector is mounted on the second support unit and can image a first alignment portion of a first surface of an electronic component from above toward above to obtain first detection data. The processor can receive the first detection data and the second detection data of the first detector and the second detector to analyze the actual cutting position of the calibrated electronic component. When the electronic component cutting operation is performed, the cutter can cut the electronic component into a plurality of components at the actual cutting position defined by the calibration, and the edges and joints of the components can meet the allowable tolerance range, thereby achieving the practical benefit of improving the cutting accuracy and cutting quality.

本創作之目的二,提供一種切割校位裝置,其至少一第一檢知器包含複數個第一檢知器,以同步檢知取像電子元件之複數個第一校位部,並將複數個第一檢知資料傳輸至處理器而供分析判斷校位界定後之實際切割位置,以有效縮短校位作業時間,而供切割器迅速地且精準切割電子元件,達到提高使用效能及切割產能之實用效益。The second purpose of the present invention is to provide a cutting calibration device, wherein at least one first detector includes a plurality of first detectors to synchronously detect a plurality of first calibration parts of an imaged electronic component, and transmit the plurality of first detection data to a processor for analysis and determination of the actual cutting position after the calibration is defined, so as to effectively shorten the calibration operation time and allow the cutter to quickly and accurately cut the electronic component, thereby achieving the practical benefit of improving the use efficiency and cutting capacity.

本創作之目的三,提供一種電子元件切割機,包含置料裝置、輸送裝置、轉運裝置、切割裝置、本創作切割校位裝置及中央控制裝置;置料裝置沿切割作業路徑設有至少一置料器,以供承置至少一電子元件;輸送裝置沿切割作業路徑設有至少一輸送器,以供輸送至少一電子元件;轉運裝置沿切割作業路徑設有至少一轉運器,以供轉運至少一電子元件;切割裝置沿切割作業路徑設有至少一切割器,以供切割至少一電子元件;本創作切割校位裝置於切割作業路徑設有第一承置單元、第二承置單元、至少一第一檢知器、至少一第二檢知器及處理器,以供檢知校位電子元件之實際切割位置而提高切割精度;中央控制裝置以供控制及整合各裝置作動而執行自動化作業。The third object of the present invention is to provide an electronic component cutting machine, comprising a material placing device, a conveying device, a transfer device, a cutting device, a cutting alignment device of the present invention and a central control device; the material placing device is provided with at least one material placing device along the cutting operation path for placing at least one electronic component; the conveying device is provided with at least one conveyor along the cutting operation path for conveying at least one electronic component; the transfer device is provided with at least one transfer device along the cutting operation path for transferring at least one electronic component is transported; the cutting device is provided with at least one cutter along the cutting operation path for cutting at least one electronic component; the cutting positioning device of the invention is provided with a first supporting unit, a second supporting unit, at least one first detector, at least one second detector and a processor on the cutting operation path for detecting and positioning the actual cutting position of the electronic component to improve the cutting accuracy; the central control device is used to control and integrate the actions of each device to perform automated operations.

為使 貴審查委員對本新型作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to help you, the Review Committee, to have a better understanding of this new model, we will cite a preferred embodiment and provide a detailed description with drawings as follows:

請參閱圖2,本創作之電子元件切割機包含置料裝置20、輸送裝置30、轉運裝置40、切割裝置50、本創作切割校位裝置60及中央控制裝置(圖未示出)。依作業需求,更包含供料裝置70,設有至少一容置器,例如倉匣,以提供至少一待切割之電子元件。Please refer to FIG. 2 . The electronic component cutting machine of the invention includes a material placement device 20, a conveying device 30, a transfer device 40, a cutting device 50, a cutting alignment device 60 of the invention and a central control device (not shown). According to the operation requirements, it further includes a material feeding device 70, which is provided with at least one container, such as a magazine, to provide at least one electronic component to be cut.

待切割之電子元件可為晶圓、載板或導線架等。於本實施例,電子元件為載板80,載板80之第二面設有複數個構件81及複數個第二校位部(即上靶點82),於第一面設有複數個接點83及第一校位部(即下靶點84)。又,置料裝置20至切割裝置50間界定有切割作業路徑L,載板80沿切割作業路徑L位移。The electronic component to be cut can be a wafer, a carrier or a lead frame, etc. In this embodiment, the electronic component is a carrier 80, and the second surface of the carrier 80 is provided with a plurality of components 81 and a plurality of second alignment parts (i.e., upper target points 82), and the first surface is provided with a plurality of contacts 83 and a first alignment part (i.e., lower target points 84). In addition, a cutting operation path L is defined between the material placement device 20 and the cutting device 50, and the carrier 80 moves along the cutting operation path L.

置料裝置20沿切割作業路徑L設有至少一置料器,以供承置至少一電子元件。更進一步,置料器可為軌道或皮帶輪組等。於本實施例,置料裝置20配置於供料裝置70之側方,並包含第一機架21、置料器及托板23,第一機架21之頂面設有置料器,置料器包含二呈X方向相對配置之置料軌道22,二置料軌道22以供承置由供料裝置70輸出之待切割載板80,二置料軌道22間設有可作Z方向位移之托板23,以托移該置料軌道22上之載板80作Z方向位移。The material placement device 20 is provided with at least one material placement device along the cutting operation path L for holding at least one electronic component. Furthermore, the material placement device can be a track or a pulley assembly. In this embodiment, the material placement device 20 is arranged on the side of the feeding device 70, and includes a first frame 21, a material placement device and a pallet 23. The top surface of the first frame 21 is provided with a material placement device, and the material placement device includes two material placement rails 22 arranged opposite to each other in the X direction. The two material placement rails 22 are used to hold the carrier plate 80 to be cut output by the feeding device 70. A pallet 23 that can be displaced in the Z direction is provided between the two material placement rails 22 to support and move the carrier plate 80 on the material placement rails 22 for displacement in the Z direction.

輸送裝置30沿切割作業路徑L設有至少一輸送器,以供輸送至少一電子元件。於本實施例,輸送裝置30包含第二機架31、第一輸送驅動器32、第二輸送驅動器33、第一輸送器34及第二輸送器35。第二機架31具有拱型立柱 ,以供裝配呈X方向配置之第一輸送驅動器32,第一輸送驅動器32能夠帶動一呈Z方向配置之第二輸送驅動器33作X方向位移,第二輸送驅動器33裝配一具有複數個吸嘴341之第一輸送器34,以吸附移載該載板80,第一輸送器34之一側裝配第二輸送器35,第二輸送器35為可開合啟閉之夾具組,以夾持載板80位移,第一輸送驅動器32及第二輸送驅動器33能夠帶動第一輸送器34及第二輸送器35同步作X-Z方向位移,並沿切割作業路徑L位移於供料裝置70、置料裝置20及轉運裝置40。 The conveying device 30 is provided with at least one conveyor along the cutting operation path L for conveying at least one electronic component. In this embodiment, the conveying device 30 includes a second frame 31 , a first conveying driver 32 , a second conveying driver 33 , a first conveyor 34 and a second conveyor 35 . The second frame 31 has an arch-shaped column for assembling a first conveyor driver 32 arranged in the X direction. The first conveyor driver 32 can drive a second conveyor driver 33 arranged in the Z direction to move in the X direction. The second conveyor driver 33 is equipped with a first conveyor 34 having a plurality of suction nozzles 341 to absorb and transfer the carrier 80. One side of the first conveyor 34 is equipped with a second conveyor 35. The second conveyor 35 is an openable and closable clamping assembly to clamp the carrier 80 for displacement. The first conveyor driver 32 and the second conveyor driver 33 can drive the first conveyor 34 and the second conveyor 35 to move in the X-Z direction synchronously, and move along the cutting operation path L to the feeding device 70, the placing device 20 and the transfer device 40.

然,第一機架21及第二機架31可為同一機架或者不同機架,不受限於本實施例。However, the first rack 21 and the second rack 31 may be the same rack or different racks, and are not limited to this embodiment.

依作業需求,第一輸送器34及第二輸送器35能夠各別獨立配置,或者彼此相互組裝。According to the operation requirements, the first conveyor 34 and the second conveyor 35 can be configured independently or assembled with each other.

轉運裝置40沿切割作業路徑L設有至少一轉運器,以供轉運至少一電子元件。於本實施例,轉運裝置40配置於置料裝置20之側方,並包含第一轉運驅動器41、移動台42、第二轉運驅動器43及轉運器44,第一轉運驅動器41呈Y方向配置於第二機架31,以帶動移動台42作Y方向位移,移動台42上裝配第二轉運驅動器43,第二轉運驅動器43能夠帶動轉運器44作角度旋轉位移,轉運器44以供承置待切割之載板80,並設有複數個定位件441(例如吸孔)而可定位載板80,使得第一轉運驅動器41及第二轉運驅動器43能夠帶動轉運器44作Y方向位移及角度旋轉位移,以於輸送裝置30與切割裝置50間轉運該載板80,並可改變載板80之水平擺置角度。The transfer device 40 is provided with at least one transfer device along the cutting operation path L for transferring at least one electronic component. In this embodiment, the transfer device 40 is arranged on the side of the material placement device 20, and includes a first transfer driver 41, a moving platform 42, a second transfer driver 43 and a transfer device 44. The first transfer driver 41 is arranged on the second frame 31 in the Y direction to drive the moving platform 42 to move in the Y direction. The second transfer driver 43 is mounted on the moving platform 42. The second transfer driver 43 can drive the transfer device 44 to move in the Y direction. Angular rotation displacement, the conveyor 44 is used to support the carrier 80 to be cut, and is provided with a plurality of positioning parts 441 (such as suction holes) to position the carrier 80, so that the first transfer drive 41 and the second transfer drive 43 can drive the conveyor 44 to perform Y-direction displacement and angular rotation displacement to transfer the carrier 80 between the conveying device 30 and the cutting device 50, and the horizontal placement angle of the carrier 80 can be changed.

切割裝置50沿切割作業路徑L設有至少一切割器,以供切割電子元件。於本實施例,切割裝置50包含第一切割驅動器51、第二切割驅動器52、第一切割器53及第二切割器54;第一切割驅動器51及第二切割驅動器52呈X方向配置於第二機架31之拱型立柱,以分別帶動第一切割器53及第二切割器54作X-Z方向位移,能夠切割轉運器44上之載板80。The cutting device 50 is provided with at least one cutter along the cutting operation path L for cutting electronic components. In this embodiment, the cutting device 50 comprises a first cutting driver 51, a second cutting driver 52, a first cutter 53 and a second cutter 54; the first cutting driver 51 and the second cutting driver 52 are arranged in the X direction on the arch column of the second frame 31 to drive the first cutter 53 and the second cutter 54 to move in the X-Z direction respectively, so as to cut the carrier 80 on the conveyor 44.

切割校位裝置60設於切割作業路徑L,並包含第一承置單元、第二承置單元、至少一第一檢知器、至少一第二檢知器及處理器(圖未示出),以供取像校位電子元件之實際切割位置。The cutting position calibration device 60 is disposed in the cutting operation path L and includes a first supporting unit, a second supporting unit, at least one first detector, at least one second detector and a processor (not shown) for taking images to calibrate the actual cutting position of the electronic component.

第一承置單元沿切割作業路徑L設有至少一第一承置器。The first receiving unit is provided with at least one first receiving device along the cutting operation path L.

依作業需求,第一承置器能夠為固定式或可移動式配置,例如第一承置器可固定配置於置料裝置20之第一機架12或第一機架12之其中一側方。例如第一承置器可作X-Y方向位移。According to the operation requirements, the first support can be fixed or movable. For example, the first support can be fixedly arranged on the first frame 12 of the material placement device 20 or on one side of the first frame 12. For example, the first support can be displaced in the X-Y direction.

依作業需求,第一承置器能夠為獨立器件或相關裝置之器件。例如第一承置器可為獨立之支架;例如第一承置器可為置料裝置20之第一機架21 ;亦無不可。 According to the operation requirements, the first support device can be an independent device or a device of a related device. For example, the first support device can be an independent bracket; for example, the first support device can be the first frame 21 of the material placement device 20 ; it is also possible.

依作業需求,第一承置器沿切割作業路徑L能夠配置於置料裝置20之一側方、第一機架21之下方或者置料裝置20之另一側方,不受限於本實施例。According to the operation requirements, the first support device can be arranged on one side of the material placement device 20, below the first frame 21 or on the other side of the material placement device 20 along the cutting operation path L, which is not limited to this embodiment.

依作業需求,第一承置單元設有至少一第一調整器(圖未示出),第一調整器能夠調整第一檢知器之取像高度位置。According to the operation requirements, the first supporting unit is provided with at least one first adjuster (not shown), and the first adjuster can adjust the imaging height position of the first detector.

於本實施例,第一承置器為置料裝置20之第一機架21,並於第一機架21且靠近供料裝置70的一側位置開設有複數個通孔61。In this embodiment, the first support is the first frame 21 of the material placement device 20 , and a plurality of through holes 61 are opened on a side of the first frame 21 close to the material feeding device 70 .

第二承置單元沿切割作業路徑L設有至少一第二承置器。The second receiving unit is provided with at least one second receiving device along the cutting operation path L.

依作業需求,第二承置器能夠為固定式或可移動式配置,例如第二承置器可固定配置於輸送裝置30之第二機架31的拱型立柱。例如第二承置器可配置於切割裝置50之至少一切割器的側面,使第二承置器隨同切割器作X-Z方向位移。According to the operation requirements, the second support can be fixed or movable. For example, the second support can be fixedly configured on the arch column of the second frame 31 of the conveying device 30. For example, the second support can be configured on the side of at least one cutter of the cutting device 50, so that the second support moves in the X-Z direction with the cutter.

依作業需求,第二承置器能夠為獨立器件或相關裝置之器件。例如第二承置器可為獨立之支架;例如第二承置器可為切割裝置50之第一切割器53;亦無不可。According to the operation requirements, the second support can be an independent device or a device of a related device. For example, the second support can be an independent bracket; for example, the second support can be the first cutter 53 of the cutting device 50; it is also possible.

依作業需求,第二承置單元設有至少一第二調整器(圖未示出),第二調整器能夠調整第二檢知器之取像高度位置。According to the operation requirements, the second supporting unit is provided with at least one second adjuster (not shown), and the second adjuster can adjust the imaging height position of the second detector.

於本實施例,第二承置器為切割裝置50之第一切割器53,並於第一切割器53設置連結架62。In this embodiment, the second support is the first cutter 53 of the cutting device 50 , and a connecting frame 62 is provided on the first cutter 53 .

至少一第一檢知器設於第一承置器,以供檢知電子元件之第一面的至少一第一校位部,而取得第一檢知資料。At least one first detector is disposed on the first support for detecting at least one first alignment portion of the first surface of the electronic component to obtain first detection data.

依作業需求,至少一第一檢知器包含複數個第一檢知器,以供檢知電子元件之複數個第一校位部。According to the operation requirements, the at least one first detector includes a plurality of first detectors for detecting a plurality of first calibration parts of the electronic component.

於本實施例,切割校位裝置60設有複數個為第一CCD63之第一檢知器,第一CCD63固定裝配於置料裝置20之第一機架21的通孔61下方,且可由下方朝向上方取像載板80之下靶點84,以取得第一檢知資料。In this embodiment, the cutting alignment device 60 is provided with a plurality of first detectors, namely, first CCDs 63, which are fixedly mounted below the through hole 61 of the first frame 21 of the material placement device 20 and can image the target point 84 below the carrier 80 from the bottom to the top to obtain first detection data.

至少一第二檢知器設於第二承置器,以供檢知電子元件之第二面的至少一第二校位部,而取得第二檢知資料。At least one second detector is arranged on the second support device to detect at least one second calibration portion of the second surface of the electronic component to obtain second detection data.

於本實施例,切割校位裝置60設有為第二CCD64之第二檢知器,第二CCD64裝配於切割裝置50之第一切割器53的連結架62,且可由上方朝向下方取像載板80之上靶點82,以取得第二檢知資料。In this embodiment, the cutting alignment device 60 is provided with a second detector which is a second CCD 64. The second CCD 64 is mounted on the connecting frame 62 of the first cutter 53 of the cutting device 50 and can take an image of the target point 82 on the carrier 80 from top to bottom to obtain second detection data.

處理器(圖未示出)能夠接收第一檢知器之第一檢知資料及第二檢知器之第二檢知資料,而分析校位電子元件之實際切割位置;亦即處理器能夠接收第一CCD63及第二CCD64傳輸之第一檢知資料及第二檢知資料。The processor (not shown) can receive the first detection data from the first detector and the second detection data from the second detector, and analyze and calibrate the actual cutting position of the electronic component; that is, the processor can receive the first detection data and the second detection data transmitted by the first CCD63 and the second CCD64.

請參閱圖2至圖7,於切割作業,輸送裝置30之第一輸送驅動器32及第二輸送驅動器33驅動第一輸送器34及第二輸送器35沿切割作業路徑L同步作X-Z方向位移,令第二輸送器35於供料裝置70取出待切割之載板80,並移載至置料裝置20之置料軌道22;由於二第一CCD63裝配於置料裝置20,且位於切割作業路徑L上,第二輸送器35夾持載板80行經二第一CCD63之上方,二第一CCD63即透過位於第一機架21的通孔61,而由下方朝向上方取像載板80之下靶點84位置,並將取得之第一檢知資料傳輸至處理器。Please refer to Figures 2 to 7. During the cutting operation, the first conveyor driver 32 and the second conveyor driver 33 of the conveyor device 30 drive the first conveyor 34 and the second conveyor 35 to synchronously move in the X-Z direction along the cutting operation path L, so that the second conveyor 35 takes out the carrier 80 to be cut from the feeding device 70 and transfers it to the loading track 22 of the loading device 20. Since the two first CCDs 63 are mounted on the loading device 20 and are located on the cutting operation path L, the second conveyor 35 clamps the carrier 80 and passes over the two first CCDs 63. The two first CCDs 63 then pass through the through hole 61 located on the first frame 21 and take an image of the target point 84 below the carrier 80 from the bottom to the top, and transmit the obtained first detection data to the processor.

第二輸送器35將待切割之載板80移載至置料裝置20之置料軌道22後,即釋放載板80,置料裝置20之托板23作Z方向位移托高載板80,輸送裝置30以第一輸送驅動器32及第二輸送驅動器33帶動第一輸送器34沿切割作業路徑L作X-Z方向位移,令第一輸送器34之吸嘴341拾取載板80。After the second conveyor 35 transfers the carrier 80 to be cut to the loading track 22 of the loading device 20, the carrier 80 is released, and the support plate 23 of the loading device 20 is displaced in the Z direction to lift the carrier 80. The conveying device 30 drives the first conveyor 34 to move along the cutting operation path L in the X-Z direction with the first conveyor driver 32 and the second conveyor driver 33, so that the suction nozzle 341 of the first conveyor 34 picks up the carrier 80.

輸送裝置30以第一輸送驅動器32及第二輸送驅動器33帶動第一輸送器34沿切割作業路徑L作X-Z方向位移,令第一輸送器34將待切割之載板80置放於轉運裝置40之轉運器44上,轉運器44以定位件441吸附載板80定位。The conveying device 30 uses the first conveying driver 32 and the second conveying driver 33 to drive the first conveyor 34 to move along the cutting operation path L in the X-Z direction, so that the first conveyor 34 places the carrier 80 to be cut on the transfer device 44 of the transfer device 40, and the transfer device 44 uses the positioning member 441 to absorb the carrier 80 for positioning.

轉運裝置40以第一轉運驅動器41及移動台42帶動轉運器44及載板80沿切割作業路徑L作Y方向位移,並行經第一切割器53之下方,切割裝置50以第一切割驅動器51帶動第一切割器53及第二CCD64作X方向位移,令第二CCD64由上方朝向下方取像載板80之上靶點82位置,並將取得之第二檢知資料傳輸至處理器。The transfer device 40 uses the first transfer driver 41 and the moving platform 42 to drive the transfer device 44 and the carrier 80 to move in the Y direction along the cutting operation path L and pass under the first cutter 53. The cutting device 50 uses the first cutting driver 51 to drive the first cutter 53 and the second CCD 64 to move in the X direction, so that the second CCD 64 captures the position of the target point 82 on the carrier 80 from top to bottom, and transmits the obtained second detection data to the processor.

處理器接收第一CCD63之第一檢知資料及第二CCD64之第二檢知資料,而分析校位界定第一切割器53對載板80之實際切割位置,例如處理器依第一、二檢知資料而可取得上靶點82與下靶點84間之位置平均值以界定作為載板80的實際切割位置,而非以上靶點82或下靶點84作為切割位置,使構件81的邊緣與接點83之間距符合容許公差範圍,以利第一切割器53精準切割載板80。The processor receives the first detection data of the first CCD63 and the second detection data of the second CCD64, and analyzes and calibrates to define the actual cutting position of the first cutter 53 on the carrier 80. For example, the processor can obtain the average value of the position between the upper target point 82 and the lower target point 84 based on the first and second detection data to define the actual cutting position of the carrier 80, rather than using the upper target point 82 or the lower target point 84 as the cutting position, so that the distance between the edge of the component 81 and the contact point 83 meets the allowable tolerance range, so that the first cutter 53 can accurately cut the carrier 80.

於校位界定出載板80之實際切割位置後,轉運裝置40以第一轉運驅動器41帶動轉運器44及載板80沿切割作業路徑L作Y方向位移,切割裝置50以第一切割驅動器51及第二切割驅動器52分別帶動第一切割器53及第二切割器54作X方向位移,以於載板80上校位界定之實際切割位置精準切割載板80,而切割出複數個構件81,達到提高切割精度及切割品質之實用效益。After the actual cutting position of the carrier plate 80 is defined by calibration, the transfer device 40 drives the transfer device 44 and the carrier plate 80 to move in the Y direction along the cutting operation path L by the first transfer driver 41, and the cutting device 50 drives the first cutter 53 and the second cutter 54 to move in the X direction by the first cutting driver 51 and the second cutting driver 52 respectively, so as to accurately cut the carrier plate 80 at the actual cutting position defined by calibration on the carrier plate 80, and cut out a plurality of components 81, thereby achieving the practical benefit of improving the cutting accuracy and cutting quality.

[習知] 10:載板 11:封裝件 12:上靶點 13:接點 14:下靶點 A:位置偏差值 [本創作] 20:置料裝置 21:第一機架 22:置料軌道 23:托板 30:輸送裝置 31:第二機架 32:第一輸送驅動器 33:第二輸送驅動器 34:第一輸送器 341:吸嘴 35:第二輸送器 40:轉運裝置 41:第一轉運驅動器 42:移動台 43:第二轉運驅動器 44:轉運器 441:定位件 50:切割裝置 51:第一切割驅動器 52:第二切割驅動器 53:第一切割器 54:第二切割器 60:切割校位裝置 61:通孔 62:連結架 63:第一CCD 64:第二CCD 70:供料裝置 80:載板 81:構件 82:上靶點 83:接點 84:下靶點 L:切割作業路徑 [Learning] 10: Carrier 11: Package 12: Upper target 13: Contact 14: Lower target A: Position deviation value [Original work] 20: Loading device 21: First rack 22: Loading track 23: Pallet 30: Conveyor 31: Second rack 32: First conveyor drive 33: Second conveyor drive 34: First conveyor 341: Suction nozzle 35: Second conveyor 40: Transfer device 41: First transfer drive 42: Moving table 43: Second transfer drive 44: Transfer 441: Positioning member 50: Cutting device 51: First cutting drive 52: Second cutting drive 53: First cutter 54: Second cutter 60: Cutting calibration device 61: Through hole 62: Connecting frame 63: First CCD 64: Second CCD 70: Feeding device 80: Carrier 81: Component 82: Upper target 83: Contact 84: Lower target L: Cutting operation path

圖1:習知具有複數個封裝件之載板的示意圖。 圖2:本創作切割校位裝置應用於電子元件切割機之示意圖。 圖3至圖7:切割機切割載板之使用示意圖。 Figure 1: Schematic diagram of a known carrier board with multiple packages. Figure 2: Schematic diagram of the cutting alignment device of the present invention applied to an electronic component cutting machine. Figures 3 to 7: Schematic diagram of the use of a cutting machine to cut a carrier board.

20:置料裝置 20: Material placement device

21:第一機架 21: First rack

22:置料軌道 22: Material placement track

23:托板 23: Pallet

30:輸送裝置 30: Transport device

31:第二機架 31: Second rack

32:第一輸送驅動器 32: First conveyor drive

33:第二輸送驅動器 33: Second transport drive

34:第一輸送器 34: First conveyor

341:吸嘴 341: Suction nozzle

35:第二輸送器 35: Second conveyor

40:轉運裝置 40:Transfer device

41:第一轉運驅動器 41: First transfer drive

42:移動台 42: Mobile platform

43:第二轉運驅動器 43: Second transfer drive

44:轉運器 44:Transfer Device

441:定位件 441: Positioning piece

50:切割裝置 50: Cutting device

51:第一切割驅動器 51: First cutting drive

52:第二切割驅動器 52: Second cutting drive

53:第一切割器 53: First cutter

54:第二切割器 54: Second cutter

60:切割校位裝置 60: Cutting calibration device

61:通孔 61:Through hole

62:連結架 62:Connecting frame

63:第一CCD 63: First CCD

64:第二CCD 64: Second CCD

70:供料裝置 70: Feeding device

80:載板 80: Carrier board

81:構件 81: Components

82:上靶點 82: On target

83:接點 83: Contact

84:下靶點 84: Target point

L:切割作業路徑 L: Cutting operation path

Claims (10)

一種切割校位裝置,包含: 第一承置單元:沿切割作業路徑設有至少一第一承置器; 第二承置單元:沿該切割作業路徑設有至少一第二承置器; 至少一第一檢知器:設於該第一承置器,以供檢知電子元件之第一面的至少一第一校位部,而取得第一檢知資料; 至少一第二檢知器:設於該第二承置器,以供檢知該電子元件之第二面的至少一第二校位部,而取得第二檢知資料; 處理器:能夠接收該第一檢知器之該第一檢知資料及該第二檢知器之該第二檢知資料,而分析校位該電子元件之實際切割位置。 A cutting calibration device comprises: A first receiving unit: at least one first receiving device is provided along the cutting operation path; A second receiving unit: at least one second receiving device is provided along the cutting operation path; At least one first detector: provided on the first receiving device, for detecting at least one first calibration portion of the first surface of the electronic component, and obtaining first detection data; At least one second detector: provided on the second receiving device, for detecting at least one second calibration portion of the second surface of the electronic component, and obtaining second detection data; A processor: capable of receiving the first detection data of the first detector and the second detection data of the second detector, and analyzing and calibrating the actual cutting position of the electronic component. 如請求項1所述之切割校位裝置,其該第一承置單元之該第一承置 器能夠為固定式或可移動式配置。 In the cutting alignment device as described in claim 1, the first support of the first support unit can be configured in a fixed or movable manner. 如請求項1所述之切割校位裝置,其該第一承置單元設有至少一第 一調整器,該第一調整器能夠調整該第一檢知器之取像高度位置。 The cutting calibration device as described in claim 1, wherein the first supporting unit is provided with at least one first adjuster, and the first adjuster is capable of adjusting the imaging height position of the first detector. 如請求項1所述之切割校位裝置,其該第二承置單元之該第二承置 器能夠為固定式或可移動式配置。 In the cutting alignment device as described in claim 1, the second support of the second support unit can be configured in a fixed or movable manner. 如請求項1所述之切割校位裝置,其該第二承置單元設有至少一第 二調整器,該第二調整器能夠調整該第二檢知器之取像高度位置。 The cutting calibration device as described in claim 1, wherein the second supporting unit is provided with at least one second adjuster, and the second adjuster is capable of adjusting the imaging height position of the second detector. 如請求項1所述之切割校位裝置,其至少一該第一檢知器包含複數 個該第一檢知器,以供檢知該電子元件之複數個該第一校位部。 In the cutting alignment device as described in claim 1, at least one of the first detectors includes a plurality of first detectors for detecting a plurality of first alignment parts of the electronic component. 如請求項1所述之切割校位裝置,其該第一檢知器由下方朝向上方 取像該電子元件之該第一校位部。 In the cutting alignment device as described in claim 1, the first detector takes an image of the first alignment portion of the electronic component from bottom to top. 如請求項1所述之切割校位裝置,其該第二檢知器由上方朝向下方 取像該電子元件之該第二校位部。 In the cutting alignment device as described in claim 1, the second detector takes an image of the second alignment portion of the electronic component from top to bottom. 如請求項1所述之切割校位裝置,其該第一檢知器及該第二檢知器 為CCD。 In the cutting alignment device as described in claim 1, the first detector and the second detector are CCDs. 一種電子元件切割機,包含: 置料裝置:沿切割作業路徑設有至少一置料器,以供承置至少一電子元 件; 輸送裝置:沿該切割作業路徑設有至少一輸送器,以供輸送至少一該電子 元件; 轉運裝置:沿該切割作業路徑設有至少一轉運器,以供轉運至少一該電子 元件; 切割裝置:沿該切割作業路徑設有至少一切割器,以供切割至少一該電子 元件; 至少一如請求項1所述之切割校位裝置:設於該切割作業路徑,以供取像校位該電子元件之實際切割位置; 中央控制裝置:以控制及整合各裝置作動而執行自動化作業。 An electronic component cutting machine comprises: A material placing device: at least one material placing device is provided along the cutting operation path for placing at least one electronic component ; A conveying device: at least one conveyor is provided along the cutting operation path for conveying at least one electronic component; A transfer device: at least one transfer device is provided along the cutting operation path for transferring at least one electronic component; A cutting device: at least one cutter is provided along the cutting operation path for cutting at least one electronic component; At least one cutting calibration device as described in claim 1: provided in the cutting operation path for taking an image to calibrate the actual cutting position of the electronic component; A central control device: for controlling and integrating the actions of each device to perform an automated operation.
TW113213052U 2024-11-28 Cutting calibration device and electronic component cutting machine TWM665949U (en)

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