TWM665949U - Cutting calibration device and electronic component cutting machine - Google Patents
Cutting calibration device and electronic component cutting machine Download PDFInfo
- Publication number
- TWM665949U TWM665949U TW113213052U TW113213052U TWM665949U TW M665949 U TWM665949 U TW M665949U TW 113213052 U TW113213052 U TW 113213052U TW 113213052 U TW113213052 U TW 113213052U TW M665949 U TWM665949 U TW M665949U
- Authority
- TW
- Taiwan
- Prior art keywords
- cutting
- electronic component
- detector
- operation path
- alignment
- Prior art date
Links
- 238000005520 cutting process Methods 0.000 title claims abstract description 128
- 238000001514 detection method Methods 0.000 claims abstract description 26
- 238000001444 catalytic combustion detection Methods 0.000 claims description 13
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000006073 displacement reaction Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
Images
Abstract
一種切割校位裝置,包含第一承置單元、第二承置單元、第一檢知器、第二檢知器及處理器,第一承置單元沿切割作業路徑設有第一承置器,第二承置單元沿切割作業路徑設有第二承置器,第一檢知器裝配於第一承置器,能夠由下方朝向上方取像電子元件之第一面的第一校位部而取得第一檢知資料,第二檢知器裝配於第二承置器,能夠由上方朝向下方取像電子元件之第二面的第二校位部而取得第二檢知資料,處理器能夠接收第一檢知器及第二檢知器的第一檢知資料及第二檢知資料,以分析校位電子元件之實際切割位置,進而提高切割精度及切割品質。A cutting alignment device comprises a first supporting unit, a second supporting unit, a first detector, a second detector and a processor. The first supporting unit is provided with a first supporting unit along a cutting operation path, and the second supporting unit is provided with a second supporting unit along the cutting operation path. The first detector is mounted on the first supporting unit and can image a first alignment portion of a first surface of an electronic component from bottom to top to obtain first detection data. The second detector is mounted on the second supporting unit and can image a second alignment portion of a second surface of an electronic component from top to bottom to obtain second detection data. The processor can receive the first detection data and the second detection data of the first detector and the second detector to analyze the actual cutting position of the alignment electronic component, thereby improving the cutting accuracy and cutting quality.
Description
本創作提供一種能夠提高切割電子元件之精度及切割品質的切割校位裝置。This invention provides a cutting alignment device capable of improving the cutting accuracy and cutting quality of electronic components.
在現今,一具有複數個IC或LED的電子元件(例如載板),需以切割機對載板進行切割作業,以切割出複數個獨立之IC封裝件或LED封裝件。請參閱圖1,載板10由複數層板片(例如12層板片)堆疊構成,於最上層板片之正面界定複數個具IC之封裝件11及複數個上靶點12,上靶點12以供切割機(圖未示出)之切割器對位切割用;載板10之最下層板片的背面且相對封裝件11之位置設有複數個接點13,並於相對上靶點12之位置設有下靶點14。於切割作業,切割機之切割器以上靶點12作為切割位置而切割載板10,以切割出複數個獨立具有IC之封裝件11。Nowadays, an electronic component (such as a carrier) with multiple ICs or LEDs needs to be cut by a cutting machine to cut out multiple independent IC packages or LED packages. Please refer to Figure 1. The
惟,載板10易因複數層板片的多層堆疊錯位誤差,導致上靶點12與下靶點14間具有位置偏差值A,以致切割器沿上靶點12切割載板10時,會發生載板10正、反面的封裝件11邊緣與接點13二者之間距超出容許公差範圍,進而影響切割品質。However, the
本創作之目的一,提供一種切割校位裝置,包含第一承置單元、第二承置單元、至少一第一檢知器、至少一第二檢知器及處理器,第一承置單元沿切割作業路徑設有第一承置器,第二承置單元沿切割作業路徑設有第二承置器,第一檢知器裝配於第一承置器,能夠由下方朝向上方取像電子元件之第一面的第一校位部而取得第一檢知資料,第二檢知器裝配於第二承置器,能夠由上方朝向下方取像電子元件之第二面的第二校位部而取得第二檢知資料,處理器能夠接收第一檢知器及第二檢知器的第一檢知資料及第二檢知資料,以分析校位電子元件之實際切割位置;藉以於執行切割電子元件作業時,可供切割器由校位界定後之實際切割位置將電子元件切割成複數個構件,而可使構件的邊緣與接點符合容許公差範圍,達到提高切割精度及切割品質之實用效益。The first object of the invention is to provide a cutting alignment device, comprising a first support unit, a second support unit, at least one first detector, at least one second detector and a processor, wherein the first support unit is provided with a first support unit along a cutting operation path, and the second support unit is provided with a second support unit along a cutting operation path, wherein the first detector is mounted on the first support unit and can image a first alignment portion of a first surface of an electronic component from below toward above to obtain first detection data, and the second detector is mounted on the second support unit and can image a first alignment portion of a first surface of an electronic component from above toward above to obtain first detection data. The processor can receive the first detection data and the second detection data of the first detector and the second detector to analyze the actual cutting position of the calibrated electronic component. When the electronic component cutting operation is performed, the cutter can cut the electronic component into a plurality of components at the actual cutting position defined by the calibration, and the edges and joints of the components can meet the allowable tolerance range, thereby achieving the practical benefit of improving the cutting accuracy and cutting quality.
本創作之目的二,提供一種切割校位裝置,其至少一第一檢知器包含複數個第一檢知器,以同步檢知取像電子元件之複數個第一校位部,並將複數個第一檢知資料傳輸至處理器而供分析判斷校位界定後之實際切割位置,以有效縮短校位作業時間,而供切割器迅速地且精準切割電子元件,達到提高使用效能及切割產能之實用效益。The second purpose of the present invention is to provide a cutting calibration device, wherein at least one first detector includes a plurality of first detectors to synchronously detect a plurality of first calibration parts of an imaged electronic component, and transmit the plurality of first detection data to a processor for analysis and determination of the actual cutting position after the calibration is defined, so as to effectively shorten the calibration operation time and allow the cutter to quickly and accurately cut the electronic component, thereby achieving the practical benefit of improving the use efficiency and cutting capacity.
本創作之目的三,提供一種電子元件切割機,包含置料裝置、輸送裝置、轉運裝置、切割裝置、本創作切割校位裝置及中央控制裝置;置料裝置沿切割作業路徑設有至少一置料器,以供承置至少一電子元件;輸送裝置沿切割作業路徑設有至少一輸送器,以供輸送至少一電子元件;轉運裝置沿切割作業路徑設有至少一轉運器,以供轉運至少一電子元件;切割裝置沿切割作業路徑設有至少一切割器,以供切割至少一電子元件;本創作切割校位裝置於切割作業路徑設有第一承置單元、第二承置單元、至少一第一檢知器、至少一第二檢知器及處理器,以供檢知校位電子元件之實際切割位置而提高切割精度;中央控制裝置以供控制及整合各裝置作動而執行自動化作業。The third object of the present invention is to provide an electronic component cutting machine, comprising a material placing device, a conveying device, a transfer device, a cutting device, a cutting alignment device of the present invention and a central control device; the material placing device is provided with at least one material placing device along the cutting operation path for placing at least one electronic component; the conveying device is provided with at least one conveyor along the cutting operation path for conveying at least one electronic component; the transfer device is provided with at least one transfer device along the cutting operation path for transferring at least one electronic component is transported; the cutting device is provided with at least one cutter along the cutting operation path for cutting at least one electronic component; the cutting positioning device of the invention is provided with a first supporting unit, a second supporting unit, at least one first detector, at least one second detector and a processor on the cutting operation path for detecting and positioning the actual cutting position of the electronic component to improve the cutting accuracy; the central control device is used to control and integrate the actions of each device to perform automated operations.
為使 貴審查委員對本新型作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to help you, the Review Committee, to have a better understanding of this new model, we will cite a preferred embodiment and provide a detailed description with drawings as follows:
請參閱圖2,本創作之電子元件切割機包含置料裝置20、輸送裝置30、轉運裝置40、切割裝置50、本創作切割校位裝置60及中央控制裝置(圖未示出)。依作業需求,更包含供料裝置70,設有至少一容置器,例如倉匣,以提供至少一待切割之電子元件。Please refer to FIG. 2 . The electronic component cutting machine of the invention includes a
待切割之電子元件可為晶圓、載板或導線架等。於本實施例,電子元件為載板80,載板80之第二面設有複數個構件81及複數個第二校位部(即上靶點82),於第一面設有複數個接點83及第一校位部(即下靶點84)。又,置料裝置20至切割裝置50間界定有切割作業路徑L,載板80沿切割作業路徑L位移。The electronic component to be cut can be a wafer, a carrier or a lead frame, etc. In this embodiment, the electronic component is a
置料裝置20沿切割作業路徑L設有至少一置料器,以供承置至少一電子元件。更進一步,置料器可為軌道或皮帶輪組等。於本實施例,置料裝置20配置於供料裝置70之側方,並包含第一機架21、置料器及托板23,第一機架21之頂面設有置料器,置料器包含二呈X方向相對配置之置料軌道22,二置料軌道22以供承置由供料裝置70輸出之待切割載板80,二置料軌道22間設有可作Z方向位移之托板23,以托移該置料軌道22上之載板80作Z方向位移。The
輸送裝置30沿切割作業路徑L設有至少一輸送器,以供輸送至少一電子元件。於本實施例,輸送裝置30包含第二機架31、第一輸送驅動器32、第二輸送驅動器33、第一輸送器34及第二輸送器35。第二機架31具有拱型立柱
,以供裝配呈X方向配置之第一輸送驅動器32,第一輸送驅動器32能夠帶動一呈Z方向配置之第二輸送驅動器33作X方向位移,第二輸送驅動器33裝配一具有複數個吸嘴341之第一輸送器34,以吸附移載該載板80,第一輸送器34之一側裝配第二輸送器35,第二輸送器35為可開合啟閉之夾具組,以夾持載板80位移,第一輸送驅動器32及第二輸送驅動器33能夠帶動第一輸送器34及第二輸送器35同步作X-Z方向位移,並沿切割作業路徑L位移於供料裝置70、置料裝置20及轉運裝置40。
The
然,第一機架21及第二機架31可為同一機架或者不同機架,不受限於本實施例。However, the
依作業需求,第一輸送器34及第二輸送器35能夠各別獨立配置,或者彼此相互組裝。According to the operation requirements, the
轉運裝置40沿切割作業路徑L設有至少一轉運器,以供轉運至少一電子元件。於本實施例,轉運裝置40配置於置料裝置20之側方,並包含第一轉運驅動器41、移動台42、第二轉運驅動器43及轉運器44,第一轉運驅動器41呈Y方向配置於第二機架31,以帶動移動台42作Y方向位移,移動台42上裝配第二轉運驅動器43,第二轉運驅動器43能夠帶動轉運器44作角度旋轉位移,轉運器44以供承置待切割之載板80,並設有複數個定位件441(例如吸孔)而可定位載板80,使得第一轉運驅動器41及第二轉運驅動器43能夠帶動轉運器44作Y方向位移及角度旋轉位移,以於輸送裝置30與切割裝置50間轉運該載板80,並可改變載板80之水平擺置角度。The
切割裝置50沿切割作業路徑L設有至少一切割器,以供切割電子元件。於本實施例,切割裝置50包含第一切割驅動器51、第二切割驅動器52、第一切割器53及第二切割器54;第一切割驅動器51及第二切割驅動器52呈X方向配置於第二機架31之拱型立柱,以分別帶動第一切割器53及第二切割器54作X-Z方向位移,能夠切割轉運器44上之載板80。The
切割校位裝置60設於切割作業路徑L,並包含第一承置單元、第二承置單元、至少一第一檢知器、至少一第二檢知器及處理器(圖未示出),以供取像校位電子元件之實際切割位置。The cutting
第一承置單元沿切割作業路徑L設有至少一第一承置器。The first receiving unit is provided with at least one first receiving device along the cutting operation path L.
依作業需求,第一承置器能夠為固定式或可移動式配置,例如第一承置器可固定配置於置料裝置20之第一機架12或第一機架12之其中一側方。例如第一承置器可作X-Y方向位移。According to the operation requirements, the first support can be fixed or movable. For example, the first support can be fixedly arranged on the first frame 12 of the
依作業需求,第一承置器能夠為獨立器件或相關裝置之器件。例如第一承置器可為獨立之支架;例如第一承置器可為置料裝置20之第一機架21
;亦無不可。
According to the operation requirements, the first support device can be an independent device or a device of a related device. For example, the first support device can be an independent bracket; for example, the first support device can be the
依作業需求,第一承置器沿切割作業路徑L能夠配置於置料裝置20之一側方、第一機架21之下方或者置料裝置20之另一側方,不受限於本實施例。According to the operation requirements, the first support device can be arranged on one side of the
依作業需求,第一承置單元設有至少一第一調整器(圖未示出),第一調整器能夠調整第一檢知器之取像高度位置。According to the operation requirements, the first supporting unit is provided with at least one first adjuster (not shown), and the first adjuster can adjust the imaging height position of the first detector.
於本實施例,第一承置器為置料裝置20之第一機架21,並於第一機架21且靠近供料裝置70的一側位置開設有複數個通孔61。In this embodiment, the first support is the
第二承置單元沿切割作業路徑L設有至少一第二承置器。The second receiving unit is provided with at least one second receiving device along the cutting operation path L.
依作業需求,第二承置器能夠為固定式或可移動式配置,例如第二承置器可固定配置於輸送裝置30之第二機架31的拱型立柱。例如第二承置器可配置於切割裝置50之至少一切割器的側面,使第二承置器隨同切割器作X-Z方向位移。According to the operation requirements, the second support can be fixed or movable. For example, the second support can be fixedly configured on the arch column of the
依作業需求,第二承置器能夠為獨立器件或相關裝置之器件。例如第二承置器可為獨立之支架;例如第二承置器可為切割裝置50之第一切割器53;亦無不可。According to the operation requirements, the second support can be an independent device or a device of a related device. For example, the second support can be an independent bracket; for example, the second support can be the
依作業需求,第二承置單元設有至少一第二調整器(圖未示出),第二調整器能夠調整第二檢知器之取像高度位置。According to the operation requirements, the second supporting unit is provided with at least one second adjuster (not shown), and the second adjuster can adjust the imaging height position of the second detector.
於本實施例,第二承置器為切割裝置50之第一切割器53,並於第一切割器53設置連結架62。In this embodiment, the second support is the
至少一第一檢知器設於第一承置器,以供檢知電子元件之第一面的至少一第一校位部,而取得第一檢知資料。At least one first detector is disposed on the first support for detecting at least one first alignment portion of the first surface of the electronic component to obtain first detection data.
依作業需求,至少一第一檢知器包含複數個第一檢知器,以供檢知電子元件之複數個第一校位部。According to the operation requirements, the at least one first detector includes a plurality of first detectors for detecting a plurality of first calibration parts of the electronic component.
於本實施例,切割校位裝置60設有複數個為第一CCD63之第一檢知器,第一CCD63固定裝配於置料裝置20之第一機架21的通孔61下方,且可由下方朝向上方取像載板80之下靶點84,以取得第一檢知資料。In this embodiment, the cutting
至少一第二檢知器設於第二承置器,以供檢知電子元件之第二面的至少一第二校位部,而取得第二檢知資料。At least one second detector is arranged on the second support device to detect at least one second calibration portion of the second surface of the electronic component to obtain second detection data.
於本實施例,切割校位裝置60設有為第二CCD64之第二檢知器,第二CCD64裝配於切割裝置50之第一切割器53的連結架62,且可由上方朝向下方取像載板80之上靶點82,以取得第二檢知資料。In this embodiment, the cutting
處理器(圖未示出)能夠接收第一檢知器之第一檢知資料及第二檢知器之第二檢知資料,而分析校位電子元件之實際切割位置;亦即處理器能夠接收第一CCD63及第二CCD64傳輸之第一檢知資料及第二檢知資料。The processor (not shown) can receive the first detection data from the first detector and the second detection data from the second detector, and analyze and calibrate the actual cutting position of the electronic component; that is, the processor can receive the first detection data and the second detection data transmitted by the first CCD63 and the second CCD64.
請參閱圖2至圖7,於切割作業,輸送裝置30之第一輸送驅動器32及第二輸送驅動器33驅動第一輸送器34及第二輸送器35沿切割作業路徑L同步作X-Z方向位移,令第二輸送器35於供料裝置70取出待切割之載板80,並移載至置料裝置20之置料軌道22;由於二第一CCD63裝配於置料裝置20,且位於切割作業路徑L上,第二輸送器35夾持載板80行經二第一CCD63之上方,二第一CCD63即透過位於第一機架21的通孔61,而由下方朝向上方取像載板80之下靶點84位置,並將取得之第一檢知資料傳輸至處理器。Please refer to Figures 2 to 7. During the cutting operation, the
第二輸送器35將待切割之載板80移載至置料裝置20之置料軌道22後,即釋放載板80,置料裝置20之托板23作Z方向位移托高載板80,輸送裝置30以第一輸送驅動器32及第二輸送驅動器33帶動第一輸送器34沿切割作業路徑L作X-Z方向位移,令第一輸送器34之吸嘴341拾取載板80。After the
輸送裝置30以第一輸送驅動器32及第二輸送驅動器33帶動第一輸送器34沿切割作業路徑L作X-Z方向位移,令第一輸送器34將待切割之載板80置放於轉運裝置40之轉運器44上,轉運器44以定位件441吸附載板80定位。The conveying
轉運裝置40以第一轉運驅動器41及移動台42帶動轉運器44及載板80沿切割作業路徑L作Y方向位移,並行經第一切割器53之下方,切割裝置50以第一切割驅動器51帶動第一切割器53及第二CCD64作X方向位移,令第二CCD64由上方朝向下方取像載板80之上靶點82位置,並將取得之第二檢知資料傳輸至處理器。The
處理器接收第一CCD63之第一檢知資料及第二CCD64之第二檢知資料,而分析校位界定第一切割器53對載板80之實際切割位置,例如處理器依第一、二檢知資料而可取得上靶點82與下靶點84間之位置平均值以界定作為載板80的實際切割位置,而非以上靶點82或下靶點84作為切割位置,使構件81的邊緣與接點83之間距符合容許公差範圍,以利第一切割器53精準切割載板80。The processor receives the first detection data of the first CCD63 and the second detection data of the second CCD64, and analyzes and calibrates to define the actual cutting position of the
於校位界定出載板80之實際切割位置後,轉運裝置40以第一轉運驅動器41帶動轉運器44及載板80沿切割作業路徑L作Y方向位移,切割裝置50以第一切割驅動器51及第二切割驅動器52分別帶動第一切割器53及第二切割器54作X方向位移,以於載板80上校位界定之實際切割位置精準切割載板80,而切割出複數個構件81,達到提高切割精度及切割品質之實用效益。After the actual cutting position of the
[習知] 10:載板 11:封裝件 12:上靶點 13:接點 14:下靶點 A:位置偏差值 [本創作] 20:置料裝置 21:第一機架 22:置料軌道 23:托板 30:輸送裝置 31:第二機架 32:第一輸送驅動器 33:第二輸送驅動器 34:第一輸送器 341:吸嘴 35:第二輸送器 40:轉運裝置 41:第一轉運驅動器 42:移動台 43:第二轉運驅動器 44:轉運器 441:定位件 50:切割裝置 51:第一切割驅動器 52:第二切割驅動器 53:第一切割器 54:第二切割器 60:切割校位裝置 61:通孔 62:連結架 63:第一CCD 64:第二CCD 70:供料裝置 80:載板 81:構件 82:上靶點 83:接點 84:下靶點 L:切割作業路徑 [Learning] 10: Carrier 11: Package 12: Upper target 13: Contact 14: Lower target A: Position deviation value [Original work] 20: Loading device 21: First rack 22: Loading track 23: Pallet 30: Conveyor 31: Second rack 32: First conveyor drive 33: Second conveyor drive 34: First conveyor 341: Suction nozzle 35: Second conveyor 40: Transfer device 41: First transfer drive 42: Moving table 43: Second transfer drive 44: Transfer 441: Positioning member 50: Cutting device 51: First cutting drive 52: Second cutting drive 53: First cutter 54: Second cutter 60: Cutting calibration device 61: Through hole 62: Connecting frame 63: First CCD 64: Second CCD 70: Feeding device 80: Carrier 81: Component 82: Upper target 83: Contact 84: Lower target L: Cutting operation path
圖1:習知具有複數個封裝件之載板的示意圖。 圖2:本創作切割校位裝置應用於電子元件切割機之示意圖。 圖3至圖7:切割機切割載板之使用示意圖。 Figure 1: Schematic diagram of a known carrier board with multiple packages. Figure 2: Schematic diagram of the cutting alignment device of the present invention applied to an electronic component cutting machine. Figures 3 to 7: Schematic diagram of the use of a cutting machine to cut a carrier board.
20:置料裝置 20: Material placement device
21:第一機架 21: First rack
22:置料軌道 22: Material placement track
23:托板 23: Pallet
30:輸送裝置 30: Transport device
31:第二機架 31: Second rack
32:第一輸送驅動器 32: First conveyor drive
33:第二輸送驅動器 33: Second transport drive
34:第一輸送器 34: First conveyor
341:吸嘴 341: Suction nozzle
35:第二輸送器 35: Second conveyor
40:轉運裝置 40:Transfer device
41:第一轉運驅動器 41: First transfer drive
42:移動台 42: Mobile platform
43:第二轉運驅動器 43: Second transfer drive
44:轉運器 44:Transfer Device
441:定位件 441: Positioning piece
50:切割裝置 50: Cutting device
51:第一切割驅動器 51: First cutting drive
52:第二切割驅動器 52: Second cutting drive
53:第一切割器 53: First cutter
54:第二切割器 54: Second cutter
60:切割校位裝置 60: Cutting calibration device
61:通孔 61:Through hole
62:連結架 62:Connecting frame
63:第一CCD 63: First CCD
64:第二CCD 64: Second CCD
70:供料裝置 70: Feeding device
80:載板 80: Carrier board
81:構件 81: Components
82:上靶點 82: On target
83:接點 83: Contact
84:下靶點 84: Target point
L:切割作業路徑 L: Cutting operation path
Claims (10)
Publications (1)
Publication Number | Publication Date |
---|---|
TWM665949U true TWM665949U (en) | 2025-01-21 |
Family
ID=
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3295529B2 (en) | IC component mounting method and device | |
US20090049681A1 (en) | Electronic component mounting apparatus and electronic component mounting method | |
US8789265B2 (en) | Electronic component mounting method providing a substrate standby area | |
WO1999012406A1 (en) | Parts mounting method and apparatus | |
WO2020008761A1 (en) | Screen-printing device and screen-printing method | |
CN218049111U (en) | Chip testing and sorting equipment | |
WO2018193773A1 (en) | Screen printing device and screen printing method | |
JP3545387B2 (en) | IC component mounting method and device | |
US10784130B2 (en) | Bonding apparatus | |
TWM665949U (en) | Cutting calibration device and electronic component cutting machine | |
KR20220097135A (en) | Semiconductor package sawing and sorting apparatus | |
JPH0792190A (en) | Inspection equipment for printed board | |
JP4128103B2 (en) | Screen printing method | |
JP3451189B2 (en) | Chip recognition device and chip mounting device provided with the same | |
CN204069625U (en) | Component mounting device | |
KR100803953B1 (en) | Auto Lead Attach / Press Units and Seat Blocks for Semiconductor Manufacturing Equipment | |
JPH06167459A (en) | Inspecting apparatus for semiconductor device, and loading, tray stacking, holding and positioning devices thereof | |
CN104284576A (en) | Component mounting device | |
KR101642659B1 (en) | Die Bonding Apparatus for Semiconductor Chip | |
JP3545386B2 (en) | IC component mounting method and device | |
CN222369487U (en) | A high-precision glue dispensing device for printed circuit board surface | |
CN117954353B (en) | Circuit board chip heat dissipation silica gel piece attaching and shielding cover buckling equipment | |
KR101968313B1 (en) | A robot for attaching flexible printed crcuit board and a method of attaching flexible printed crcuit using the same | |
JP4768318B2 (en) | IC handler | |
JP4860446B2 (en) | Printed circuit board delivery device |