TWM616102U - Burn-in apparatus - Google Patents

Abstract

A burn-in equipment includes a cabinet, a plurality of connection devices and a burn-in test system. The cabinet includes a cabinet body and a plurality of carrier boards, the plurality of carrier boards are arranged at intervals in the accommodating space of the cabinet body, and the plurality of connection devices Installed in the cabinet, each of the connecting devices includes a circuit substrate and at least one adaptor, the circuit substrate has a plurality of load regions, the positions of the plurality of load regions are separated from each other, and the circuit substrate is provided with a plurality of load regions in each of the load regions. The at least one adaptor is detachably arranged on the circuit substrate and electrically connected to the plurality of contacts, each adaptor has at least one component under test connector, and each carrier board of the cabinet is provided with the At least one connecting device among the plurality of connecting devices, the burn-in test system is installed in the cabinet and electrically connected to the plurality of connecting devices.

Description

Burn-in equipment

This model relates to a burn-in equipment, especially a burn-in test equipment used for electronic components to execute the burn-in program.

Before the existing electronic components leave the factory, in order to ensure the correct and reliable functions of the electronic components, a burn-in procedure (burn in) is required to simulate the load status of the electronic components for testing.

Please refer to FIG. 9, the conventional burn-in method is to connect the electronic component to be tested (hereinafter referred to as the component under test 60) to a power supply 50, a load device 51 and a measurement device 52, respectively, and are controlled by a control device 53 The power supply 50 outputs the size of the test power supply to the component under test 60. The load device 51 can be an electronic load or a custom-made cement resistor. The measuring device 52 can be electrically connected to the component under test 60. The output terminal measures its output voltage and/or current, the control device 53 receives the measurement data from the measurement device 52, and the control device 52 can store the measurement data in a storage device (such as a hard disk), The measurement data can be presented to the user for viewing through the display.

However, due to the multiple models of the component under test 60, the load capacity of the component under test 60 of different models is also different from each other. It can be seen that the impedance of the load device 51 must be adjusted at any time according to the model of the component under test 60. Replacement or customized production makes it difficult to simplify the conventional burn-in process.

The purpose of the present invention is to provide a burn-in equipment, in order to improve the disadvantage that the conventional burn-in process is difficult to simplify.

In order to achieve the aforesaid purpose, the burn-in equipment proposed by the present model includes: A cabinet including a cabinet body and a plurality of carrier boards, the cabinet body has an accommodating space, and the plurality of carrier boards are arranged in the accommodating space of the cabinet body at intervals; a plurality of connecting devices are installed in the cabinet, Each of the connecting devices includes: a circuit substrate with a plurality of load regions, the positions of the plurality of load regions are separated from each other, the circuit substrate is provided with a plurality of contacts in each of the load regions; and at least one adaptor, which can be detachably arranged The circuit board is electrically connected to the plurality of contacts, and each of the adapters has at least one component under test connector; each of the carrier boards of the cabinet is provided with at least one of the plurality of connection devices; and a burn-in machine The test system is installed in the cabinet and electrically connected to the plurality of connection devices.

With the aforementioned burn-in equipment, it is only necessary to replace the corresponding adapters for different types of components to be tested, and the new burn-in equipment includes a burn-in test system installed in the cabinet and a shared circuit board structure, so it is aimed at Different types of components to be tested only need to replace the corresponding adapter, and the adapter is small in size and light in weight, allowing the operator to easily and effortlessly pick and place the adapter, which has the effect of simplifying the burn-in process .

In addition, the new type of burn-in equipment also has the characteristics of high space utilization. The new type of burn-in equipment uses the accommodating space in the cabinet to install a plurality of carrier boards arranged at intervals, and provides a universal circuit board setting with the carrier board, and Provide an adapter set that matches the component to be tested. During use, the component to be tested can be concentrated and layered above the carrier board, and electrically connected to the adapter on the circuit board, so that the burn-in equipment has The characteristic of making full use of high space.

10: Cabinet

11: Cabinet

110: accommodating space

12: Carrier board

13: Front side panel

14: Drawer slide

20: Connect the device

21: Circuit board

210: load area

211: Test the power contact

212: Load contact

213: pin seat

22: Adapter

220: Component under test connector

221: terminal block

30: component under test

31: Pin

41: control device

42: Human-machine interface device

43: power supply

44: Measuring device

45: load device

46: storage device

50: power supply

51: load device

52: Measuring device

53: control device

60: component under test

Figure 1: A schematic front plan view of an embodiment of the new burn-in equipment.

Figure 2: A partial enlarged schematic diagram of an embodiment of the new burn-in equipment.

Figure 3: In the present invention, a schematic top plan view of the circuit substrate.

Figure 4: A block diagram of an embodiment of the burn-in test system in the present invention.

Fig. 5: A schematic top plan view of the combined structure of the circuit substrate and the adaptor in the present invention (1).

Figure 6: The top plan view of the combined structure of the circuit substrate and the adaptor in the present invention (2).

Figure 7: The top plan view of the combined structure of the circuit substrate and the adaptor in the present invention (3).

Figure 8: The top plan view of the combined structure of the circuit substrate and the adaptor in the present invention (4).

Figure 9: A block diagram of a conventional burn-in test of a device under test.

The embodiment of the new burn-in equipment includes a cabinet, a plurality of connection devices and a burn-in test system, each of the connection devices is used to connect the component to be tested, and the burn-in test system performs a burn-in test on the component to be tested, Wherein, the component under test may be an integrated circuit component (Integrated Circuit, IC), such as an IC product of a DC/DC power converter or an AC/DC power converter.

As shown in Figure 1 and Figure 2, the cabinet 10 includes a cabinet body 11 and a plurality of carrier boards 12, the cabinet body 11 has one or more accommodating spaces 110, the plurality of carrier boards 12 are arranged in the cabinet at intervals The accommodating space 110 of the body 11. In the embodiment shown in Figures 1 and 2, it is disclosed that the cabinet 11 has an accommodating space 110 with an opening facing forward, and the front side of the cabinet 11 has a front side plate 13 at the side of the opening. A plurality of carrier boards 12 are arranged at intervals in the accommodating space, and a drawer slide rail 14 is connected to the side wall of the cabinet 11 on both sides of each carrier board 12, so that the carrier board 12 slides through the drawers on both sides. The rail 14 can be operated to be pulled forward from the accommodating space 110 of the cabinet 11 and pushed into the accommodating space 110.

As shown in FIGS. 1 and 2, the plurality of connecting devices 20 are installed in the cabinet 10, and each of the carrier boards 12 of the cabinet 10 is provided with at least one connecting device 20 of the plurality of connecting devices 20, as shown in FIG. 1 As in the embodiment shown in FIG. 2, each carrier board 12 may be provided with two connecting devices 20. Each of the connecting devices 20 includes a circuit substrate 21 and at least one adapter 22. The circuit substrate 21 and the at least one adapter 22 may be printed circuit boards (PCB), so the circuit substrate 21 and the at least one adapter 22 The socket 22 has an electronic circuit layout, and the at least one adapter socket 22 is used to connect the device under test 30. Wherein, the circuit board 21 is solid Set on the carrier board 12, please refer to FIG. 3. The top surface of the circuit substrate 21 has a plurality of load areas 210, and the positions of the plurality of load areas 210 are separated from each other. The circuit substrate 21 is provided with a plurality of connections on each load area 210. Point, the plurality of contacts includes a plurality of test power contacts 211 and a plurality of load contacts 212, which are electrically connected to the electronic circuit layout of the circuit board 21. As shown in the embodiment shown in FIG. 3, the circuit substrate 21 has eight load areas 210 in a matrix arrangement. The at least one adapter 22 is detachably arranged on the circuit substrate 21 and electrically connected to the plurality of contacts. Each adapter 22 has at least one DUT connector 220, which is electrically connected to the adapter 22. Electronic circuit layout, each of the component under test connectors 220 can be a plurality of terminal posts or conductive elastic clips, wherein each of the terminal posts is a hollow cylinder with conductivity, and each terminal post or conductive elastic clip stands on the On the top surface of the adapter 22, the position of the plurality of terminal posts or conductive elastic clips corresponds to the pin 31 (pin) position of the component under test 30, so one component under test 30 can be connected to a group of components under test Plug and unplug the device 220.

The connecting method of the adapter 22 and the circuit substrate 21 can be through pins and terminal blocks. For example, as shown in FIG. 2, the bottom surface of the adapter 22 can be arranged to electrically connect the component under test through its electronic circuit layout. For the terminal block 221 of the connector 220, the top surface of each load area 210 of the circuit substrate 21 can be provided with a pin seat 213 that electrically connects its test power contact 211 and a plurality of load contacts 212 through its electronic circuit layout. The terminal block 221 on the adapter 22 can be detachably connected to the pin block 213 on the circuit board 21, that is, the pins of the pin block 213 can be inserted into and connected to the socket of the terminal block 221, so that the adapter 22 The electronic circuit layout of the circuit board 21 is electrically connected to the electronic circuit layout of the circuit board 21. Therefore, through the above-mentioned connection structure, when the adapter 22 is disposed on the circuit substrate 21, the DUT connector 220 of the adapter 22 can be electrically connected to the test power connection of the load area 210 of the circuit substrate 21. Point 211 and load contact 212; and when the component under test 30 is set on the component under test connector 220 of the adapter 22, the component under test 30 can be electrically connected to the circuit substrate 21 through the adapter 22 The test power contact 211 and the load contact 212 of the load area 210.

The burn-in test system is installed in the cabinet 10 and is electrically connected to the plurality of connection devices 20. Please refer to FIG. 4. The burn-in test system may include a control device 41 and a man-machine interface device 42 electrically connected to the control device 41 , A plurality of power supplies 43, a plurality of measurement devices 44, a plurality of load devices 45 and a storage device 46, wherein, Figure 4 only a power supply 43, a measurement device 44 and a load device 45 for example, one connected The device 20 can be connected to a power supply 43, a measuring device 44 and a load device 45 correspondingly. The power supply 43, the measuring device 44 and the load device 45 can be electrically connected to the electronic circuit layout of the circuit board 21 of the connecting device 20 to form an electrical connection with the component under test 30. The control device 41 can Regulate the size of the test power output from the power supply 43 to each component under test. The load device 45 can be an electronic load. The measuring device 44 can be a digital meter to measure the output voltage of the component under test 30. And/or current, the control device 41 receives its measurement data from the measurement device 44, the control device 41 can store the measurement data in a storage device 46 (such as a hard disk), and can use the man-machine interface The display of the device 42 presents the measurement data for the user to view. As shown in FIG. 1, the man-machine interface device 42 can be installed on the front side panel 13 of the cabinet 11 for the operator to view and operate. For example, the man-machine interface device 42 can be a touch display panel.

The connecting device 20 of the present invention can include several aspects in response to various types of components 30 under test, and through the electronic circuit layout of the circuit board 21 and the adapter 22, the contacts of the plurality of load regions 210 are connected in parallel. Let the plurality of DUT connectors 220 form a parallel connection, so that the plurality of load areas 210 and the plurality of DUT connectors 220 can distribute or evenly distribute the load of the load device 45. Examples are as follows.

1. Aspect One

2 and 5, the at least one adapter 22 is a plurality of adapters 22, the number of the plurality of adapters 22 is the same as the number of the plurality of load areas 210 of the circuit board 21, for example, the The number of the plurality of adapters 22 can be eight, and the number of the plurality of load areas 210 of the circuit board 21 is also eight to form a one-to-one correspondence connection, that is, one adapter 22 is arranged in one load area. Domain 210. As mentioned above, each adaptor 22 can be provided with one or more DUT connectors 220. When each adaptor 22 is provided with a plurality of DUT connectors 220, please refer to Figures 2 and 5 Take, for example, that each adapter 22 is provided with two sets of DUT connectors 220, which are respectively provided for the DUT 30, and each DUT 30 passes through the adapter 22 and the electronic circuit layout of the circuit board 21 The power supply 43, the load device 45, and the measuring device 44 form a signal connection, so that each component under test 30 can be tested. Therefore, in the embodiment shown in FIG. 5, the circuit board There are eight adapter seats 22 on the 21, and each adapter seat 22 is equipped with two components to be tested 30, so the connecting device 20 is equipped with a total of sixteen components to be tested 30. When the load capacity of the load device 45 is 600 watts (W), each component under test 30 is equivalent to the load capacity allocated to 37.5 watts (W), and the load capacity refers to the load capacity simulated by the load device 45 Power limit. For another example, please refer to FIG. 6, when each adapter 22 is provided with only a single component under test 30, and the load capacity of the load device 45 is 600 watts (W), each component under test 30 is equivalent to Allocate to a load of 75 watts (W). Therefore, each adaptor 22 can be provided with a different number of DUT connectors 220 for connecting the DUT 30 according to requirements, and the load of the DUT 30 can be deduced according to the foregoing example.

2. Aspect Two

The at least one adapter 22 is a plurality of adapters 22, the number of the plurality of adapters 22 is less than the number of the plurality of load regions 210 of the circuit board 21, and the DUT connector 220 of each adapter 22 Electrically connect the contacts of at least two load areas 210 of the circuit board 21, that is, the DUT connector 220 of each adapter 22 is electrically connected to the test power contacts of a part of the load area 210 of the circuit board 21 211 and load contacts 212, that is, one adapter 22 can be correspondingly arranged in multiple load areas 210, and is a one-to-many arrangement structure. Please refer to FIG. 7 as an example. Each adapter 22 is arranged in two load areas 210, and the bottom surface of each adapter 22 is provided with a plurality of terminal blocks 221, and the position of the plurality of terminal blocks 221 corresponds to the two load areas 210. The position of the pin seat 213 can be inserted correspondingly. Each adapter 22 can be provided with a single or multiple DUT connectors 220. FIG. 7 only uses one DUT connector 220 as an example. Set up a component 30 to be tested. On the whole, the connecting device 20 shown in FIG. 7 has a total of four For the component under test 30, when the load capacity of the load device 45 is 600 watts (W), each component under test 30 is equivalent to a load assigned to 150 watts (W). Therefore, each adaptor 22 can be provided with a different number of DUT connectors 220 for connecting the DUT 30 according to requirements, and the load of the DUT 30 can be deduced according to the foregoing example.

3. Aspect Three

The at least one adaptor 22 is a single adaptor 22, and the DUT connector 220 of the adaptor 22 is electrically connected to all the contacts of the plurality of load areas 210 of the circuit board 21, that is, an adaptor 22 A plurality of terminal blocks 221 are provided on the bottom surface of the plurality of terminal blocks 221, and the position of the plurality of terminal blocks 221 corresponds to the position of the pin seat 213 of the plurality of load areas 210 and can be inserted correspondingly, and is a one-to-many arrangement structure. Please refer to FIG. 8 as an example. The adapter 22 may be provided with a single DUT connector 220 for setting a DUT 30. When the loading capacity of the load device 45 is 600 watts (W), the DUT connector 220 The element 30 corresponds to a load distributed to 600 watts (W). Therefore, each adaptor 22 can be provided with a different number of DUT connectors 220 for connecting the DUT 30 according to requirements, and the load of the DUT 30 can be deduced according to the foregoing example.

It should be noted that the circuit structure of the aforementioned aspect is only an example. In actual application, the electronic circuit layout on each adapter 22 can be designed in multiple and flexible ways according to the test requirements and the attributes of the various components under test 30. In addition, the size of each adapter 22 and its bottom surface are provided with corresponding numbers and corresponding positions of the terminal blocks 221 to provide energy for the corresponding pin sockets 213 inserted in the plurality of load areas 210.

To sum up, in the present invention, only the corresponding adaptor 22 needs to be set and replaced for different types of components 30 under test, and the burn-in equipment of the present invention includes a burn-in test system and a circuit substrate arranged in the cabinet 10 21 is a shared structure. For different types of components 30 to be tested, only the corresponding adapter 22 needs to be replaced. The adapter 22 is small in size and light in weight, allowing the operator to pick and place more easily and effortlessly. The adapter 22 has the effect of simplifying the burn-in process. The new burn-in equipment can further enable the cabinet body to have a accommodating space 110 with an opening facing forward. The cabinet body 11 has a front side plate 13 on the front side. Arranged at intervals, so that the cabinet 11 can fully benefit Use space to provide multiple sets of components under test 30 to execute the burn-in program. Furthermore, the burning machine equipment of the present invention can further enable the two sides of each carrier board 12 in the cabinet 11 to be connected to the cabinet 11 with drawer slide rails 14 respectively, so that the carrier board 12 can be operated from the cabinet. The accommodating space 110 of the body 11 is moved out and sent into the accommodating space 110 to facilitate the disassembly and assembly operation of the component 30 to be tested on the adapter 22 on the circuit board 21 in the cabinet 11.

10: Cabinet

11: Cabinet

110: accommodating space

12: Carrier board

13: Front side panel

14: Drawer slide

20: Connect the device

21: Circuit board

22: Adapter

30: component under test

42: Human-machine interface device

Claims (7)

A burn-in device, which includes: A cabinet including a cabinet body and a plurality of carrier boards, the cabinet body has an accommodating space, and the plurality of carrier boards are arranged at intervals in the accommodating space of the cabinet body; A plurality of connecting devices are installed in the cabinet, and each of the connecting devices includes: A circuit substrate having a plurality of load regions, the positions of the plurality of load regions are separated from each other, the circuit substrate is provided with a plurality of contacts in each of the load regions; and At least one adaptor, detachably arranged on the circuit substrate and electrically connected to the plurality of contacts, each adaptor has at least one DUT connector; Each carrier board of the cabinet is provided with at least one connecting device among the plurality of connecting devices; and A burn-in test system is installed in the cabinet and electrically connected to the plurality of connection devices. The burn-in device according to claim 1, wherein the front side of the cabinet body has a front side plate, and the plurality of carrier plates are arranged at an upper and lower interval in the accommodating space. The burn-in equipment according to claim 1 or 2, wherein two sides of each carrier board are respectively connected with a drawer slide rail to connect to the cabinet. The burn-in device according to claim 1, wherein the at least one component under test connector of each adapter is a plurality of component under test connectors. The burn-in device according to claim 1, wherein the at least one component under test connector of each adapter is a single component under test connector. The burn-in device according to claim 1, wherein the at least one adaptor is a plurality of adaptors, and the DUT connector of each adaptor is electrically connected to at least two of the load areas of the circuit substrate point. The burn-in device according to claim 1, wherein the at least one adapter is a single adapter, and the DUT connector is electrically connected to the contacts of the plurality of load areas of the circuit substrate.

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