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TWI874863B - Display detection device, detection method, and detection system - Google Patents

Display detection device, detection method, and detection system Download PDF

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TWI874863B
TWI874863B TW111148567A TW111148567A TWI874863B TW I874863 B TWI874863 B TW I874863B TW 111148567 A TW111148567 A TW 111148567A TW 111148567 A TW111148567 A TW 111148567A TW I874863 B TWI874863 B TW I874863B
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detection
panel
display
board
generate
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TW111148567A
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TW202401022A (en
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鄭德勝
李俊雨
廖柏凱
李玫憶
郭豫杰
洪春長
周上傑
呂侑儒
林裕勛
陳俊碩
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友達光電股份有限公司
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Priority to CN202211639240.7A priority Critical patent/CN115938255A/en
Priority to US18/148,155 priority patent/US12288491B2/en
Publication of TW202401022A publication Critical patent/TW202401022A/en
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Publication of TWI874863B publication Critical patent/TWI874863B/en

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Abstract

A display detection device includes a panel, a detection board, and a detection adapter board. The panel is configured to display. The detection board is coupled to the panel, and is configured to input a detection signal. The detection adapter board is coupled to the panel, and is configured to respond to the detection signal to generate a detection result.

Description

顯示檢測裝置、檢測方法及檢測系統Display detection device, detection method and detection system

本案涉及顯示檢測領域。詳細而言,本案涉及一種顯示檢測裝置、檢測方法及檢測系統。This case involves the field of display detection. Specifically, this case involves a display detection device, a detection method, and a detection system.

現有顯示檢測裝置設計為透過控制面板陣列電路的電晶體形成檢測的封閉迴路,以量測電流或電壓判斷面板陣列電路的電晶體是否損壞。然而,使用量測電流或電壓方式,會因為電晶體損壞程度較不嚴重,如微小漏電,而無法被檢測出來。因此,控制電晶體形成檢測的封閉迴路,使用量測電流或電壓方式判斷面板陣列電路的電晶體是否損壞,無法完整模擬面板之情況。Existing display detection devices are designed to form a closed loop for detection through the transistors of the panel array circuit to measure current or voltage to determine whether the transistors of the panel array circuit are damaged. However, using the current or voltage measurement method will not be able to detect the less serious degree of transistor damage, such as a small leakage. Therefore, the closed loop for detection by controlling the transistors to form a detection, and using the current or voltage measurement method to determine whether the transistors of the panel array circuit are damaged, cannot fully simulate the panel situation.

再者,由於顯示裝置中之微發光二極體之成本昂貴,於檢測過程中可能造成微發光二極體之損壞。Furthermore, since the cost of the micro-luminescent diode in the display device is high, the micro-luminescent diode may be damaged during the detection process.

因此,上述技術尚存諸多缺陷,而有待本領域從業人員研發出其餘適合的檢測電路設計。Therefore, the above technology still has many defects, and it is necessary for practitioners in this field to develop other suitable detection circuit designs.

本案的一面向涉及一種顯示檢測裝置。顯示檢測裝置包含面板、檢測板及檢測轉接板。面板用以進行顯示。檢測板耦接於面板,並用以輸入檢測訊號。檢測轉接板耦接於面板,並用以響應檢測訊號,藉以產生檢測結果。One aspect of the case involves a display detection device. The display detection device includes a panel, a detection board and a detection adapter board. The panel is used for display. The detection board is coupled to the panel and used to input a detection signal. The detection adapter board is coupled to the panel and used to respond to the detection signal to generate a detection result.

本案的另一面向涉及一種檢測方法。檢測方法包含以下步驟:結合檢測轉接板之檢測迴路至顯示檢測裝置之面板;藉由顯示檢測裝置之檢測板輸入檢測訊號至面板;以及藉由檢測轉接板之檢測迴路響應檢測訊號,以產生檢測結果。Another aspect of the case involves a detection method. The detection method includes the following steps: combining a detection circuit of a detection adapter board with a panel of a display detection device; inputting a detection signal to the panel through the detection board of the display detection device; and responding to the detection signal through the detection circuit of the detection adapter board to generate a detection result.

本案的另一面向涉及一種檢測系統。檢測系統用以檢測顯示檢測裝置。檢測系統包含顯示檢測裝置及測試機台。顯示檢測裝置包含面板、檢測板及檢測轉接板。面板用以進行顯示,並用以自檢測系統之點燈治具傳輸檢測訊號。檢測板耦接於面板,並用以傳輸自面板之檢測訊號。檢測轉接板耦接於面板,並用以響應檢測訊號,藉以產生檢測結果。測試機台包含探針平台及感測器。探針平台用以定位及校準顯示檢測裝置之面板。感測器耦接於探針平台,並用以擷取檢測轉接板之檢測結果,以產生特徵影像,藉以根據特徵影像評估顯示檢測裝置是否異常。Another aspect of the present case involves a detection system. The detection system is used to detect a display detection device. The detection system includes a display detection device and a test machine. The display detection device includes a panel, a detection board, and a detection adapter board. The panel is used for display and for transmitting detection signals from a lighting fixture of the detection system. The detection board is coupled to the panel and is used to transmit detection signals from the panel. The detection adapter board is coupled to the panel and is used to respond to the detection signal to generate a detection result. The test machine includes a probe platform and a sensor. The probe platform is used to locate and calibrate the panel of the display detection device. The sensor is coupled to the probe platform and is used to capture the detection result of the detection adapter board to generate a feature image, so as to evaluate whether the display detection device is abnormal based on the feature image.

以下將以圖式及詳細敘述清楚說明本案之精神,任何所屬技術領域中具有通常知識者在瞭解本案之實施例後,當可由本案所教示之技術,加以改變及修飾,其並不脫離本案之精神與範圍。The following will clearly illustrate the spirit of the present invention with diagrams and detailed descriptions. After understanding the embodiments of the present invention, any person with ordinary knowledge in the relevant technical field can make changes and modifications based on the techniques taught by the present invention without departing from the spirit and scope of the present invention.

本文之用語只為描述特定實施例,而無意為本案之限制。單數形式如“一”、“這”、“此”、“本”以及“該”,如本文所用,同樣也包含複數形式。The terms used herein are only for describing specific embodiments and are not intended to be limiting of the present invention. Singular forms such as "a", "this", "here", "this" and "the" as used herein also include plural forms.

關於本文中所使用之『包含』、『包括』、『具有』、『含有』等等,均為開放性的用語,即意指包含但不限於。The words "include", "including", "have", "contain", etc. used in this article are open terms, meaning including but not limited to.

關於本文中所使用之用詞(terms),除有特別註明外,通常具有每個用詞使用在此領域中、在本案之內容中與特殊內容中的平常意義。某些用以描述本案之用詞將於下或在此說明書的別處討論,以提供本領域技術人員在有關本案之描述上額外的引導。The terms used in this document generally have the ordinary meanings of each term used in this field, in the context of this case, and in the specific context, unless otherwise specified. Certain terms used to describe this case will be discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art in describing this case.

第1圖為根據本案一些實施例繪示的顯示檢測裝置100之電路方塊示意圖。在一些實施例中,請參閱第1圖,顯示檢測裝置100包含面板110、檢測板120及檢測轉接板130。在一些實施例中,面板110包含複數個面板陣列電路111。FIG. 1 is a circuit block diagram of a display detection device 100 according to some embodiments of the present invention. In some embodiments, referring to FIG. 1 , the display detection device 100 includes a panel 110, a detection board 120, and a detection adapter board 130. In some embodiments, the panel 110 includes a plurality of panel array circuits 111.

在一些實施例中,面板110用以進行顯示。檢測板120耦接於面板110,並用以輸入檢測訊號。檢測轉接板130直接或間接耦接於面板110,並用以響應檢測訊號,藉以產生檢測結果。In some embodiments, the panel 110 is used for display. The detection board 120 is coupled to the panel 110 and used to input a detection signal. The detection adapter board 130 is directly or indirectly coupled to the panel 110 and used to respond to the detection signal to generate a detection result.

在一些實施例中,複數個面板陣列電路111用以進行顯示。In some embodiments, a plurality of panel array circuits 111 are used for display.

在一些實施例中,複數個面板陣列電路111皆包含控制電晶體(例如:控制電晶體T1)及成對電極板(例如:電極板E1)。須說明的是,成對電極板E1之間具有空隙,成對電極板E1之空隙用以設置發光元件。進一步說明的是,複數個面板陣列電路111於檢測過程中因無設置發光元件而無法顯示,因此,本案面板110顯示為全黑畫面。In some embodiments, the plurality of panel array circuits 111 all include control transistors (e.g., control transistor T1) and paired electrode plates (e.g., electrode plates E1). It should be noted that there is a gap between the paired electrode plates E1, and the gap between the paired electrode plates E1 is used to set the light-emitting element. It should be further noted that the plurality of panel array circuits 111 cannot display during the detection process because no light-emitting element is set, so the panel 110 in this case displays a completely black screen.

在一些實施例中,檢測轉接板130包含複數個檢測迴路(例如:檢測二極體D1透過薄膜探針P1耦接於面板陣列電路111之迴路、檢測二極體D2透過薄膜探針P2耦接於面板陣列電路111之迴路及檢測二極體DN透過薄膜探針PN耦接於面板陣列電路111之迴路)。複數個檢測迴路分別耦接於每一複數個面板陣列電路111,以響應檢測訊號,藉以產生檢測結果。藉由光學檢測系統900擷取檢測結果以進行分析。In some embodiments, the detection adapter board 130 includes a plurality of detection loops (for example: a detection diode D1 coupled to a loop of the panel array circuit 111 through a film probe P1, a detection diode D2 coupled to a loop of the panel array circuit 111 through a film probe P2, and a detection diode DN coupled to a loop of the panel array circuit 111 through a film probe PN). The plurality of detection loops are respectively coupled to each of the plurality of panel array circuits 111 to respond to the detection signal to generate a detection result. The detection result is captured by the optical detection system 900 for analysis.

在一些實施例中,每一複數個檢測迴路包含至少一薄膜探針(例如:薄膜探針P1)及檢測二極體(例如:檢測二極體D1)。須說明的是,主要以圖式中最左側之檢測迴路作舉例,複數個檢測迴路皆相同,薄膜探針(例如:薄膜探針P1)耦接於每一複數個檢測迴路及每一複數個面板陣列電路111,以形成封閉迴路。檢測二極體D1耦接於薄膜探針P1,並用以根據檢測訊號進行發光,藉以判定面板110之複數個面板陣列電路111是否異常。In some embodiments, each of the plurality of detection loops includes at least one film probe (e.g., film probe P1) and a detection diode (e.g., detection diode D1). It should be noted that, mainly taking the detection loop on the far left in the figure as an example, the plurality of detection loops are the same, and the film probe (e.g., film probe P1) is coupled to each of the plurality of detection loops and each of the plurality of panel array circuits 111 to form a closed loop. The detection diode D1 is coupled to the film probe P1 and is used to emit light according to the detection signal to determine whether the plurality of panel array circuits 111 of the panel 110 are abnormal.

在一些實施例中,當面板110顯示全暗畫面時,每一複數個檢測迴路之檢測二極體用以根據檢測訊號判斷每一複數個面板陣列電路111是否產生漏電流。須說明的是,面板110通常由面板陣列電路111中的控制電晶體T1至TN進行驅動。於全暗畫面下,控制電晶體T1至TN根據顯示檢測裝置100之控制訊號不驅動面板110。In some embodiments, when the panel 110 displays a completely dark image, the detection diodes of each of the plurality of detection loops are used to determine whether each of the plurality of panel array circuits 111 generates leakage current according to the detection signal. It should be noted that the panel 110 is usually driven by the control transistors T1 to TN in the panel array circuit 111. In a completely dark image, the control transistors T1 to TN do not drive the panel 110 according to the control signal of the display detection device 100.

在一些實施例中,若複數個面板陣列電路111其中一者產生漏電流,則藉由檢測二極體(例如:檢測二極體D1、檢測二極體D2及檢測二極體D3)根據漏電流之大小進行發光,以產生複數種光強度(例如:第一光強度L1、第二光強度L2至第N個光強度LN)。In some embodiments, if one of the plurality of panel array circuits 111 generates a leakage current, a detection diode (e.g., detection diode D1, detection diode D2, and detection diode D3) emits light according to the size of the leakage current to generate a plurality of light intensities (e.g., a first light intensity L1, a second light intensity L2 to an Nth light intensity LN).

在一些實施例中,若複數個面板陣列電路111並未產生漏電流,則藉由顯示檢測裝置100外部之電性檢測板910對檢測轉接板130進行電壓檢測或進行電流檢測,以判斷複數個面板陣列電路111是否缺損。須說明的是,顯示檢測裝置100外部之電性檢測板910會另外電性連接於複數個檢測迴路。於檢測完後,電性檢測板910會被移除。In some embodiments, if the plurality of panel array circuits 111 do not generate leakage current, the electrical detection board 910 outside the display detection device 100 performs voltage detection or current detection on the detection adapter board 130 to determine whether the plurality of panel array circuits 111 are defective. It should be noted that the electrical detection board 910 outside the display detection device 100 is electrically connected to the plurality of detection loops. After the detection, the electrical detection board 910 is removed.

在一些實施例中,為使本案之顯示檢測裝置100之操作易於理解,請一併參閱第1圖至第2圖,第2圖為根據本案一些實施例繪示的檢測方法200之步驟流程示意圖。在一些實施例中,檢測方法200可由第1圖之顯示檢測裝置100所執行。本案之檢測方法200之步驟如後所述。In some embodiments, in order to make the operation of the display detection device 100 of the present case easier to understand, please refer to Figures 1 and 2 together. Figure 2 is a schematic diagram of the step flow of the detection method 200 drawn according to some embodiments of the present case. In some embodiments, the detection method 200 can be executed by the display detection device 100 of Figure 1. The steps of the detection method 200 of the present case are described below.

於步驟210中,結合檢測轉接板之檢測迴路至顯示檢測裝置之面板。在一些實施例中,請參閱第1圖至第2圖,以第1圖最左側電路舉例,透過檢測轉接板130之檢測迴路之至少一薄膜探針P1耦接於面板110之面板陣列電路111,以形成封閉迴路。In step 210, the detection circuit of the detection adapter board is combined with the panel of the display detection device. In some embodiments, please refer to Figures 1 to 2, taking the leftmost circuit of Figure 1 as an example, at least one film probe P1 of the detection circuit of the detection adapter board 130 is coupled to the panel array circuit 111 of the panel 110 to form a closed loop.

於步驟220中,藉由顯示檢測裝置之檢測板輸入檢測訊號至面板。在一些實施例中,請參閱第1圖至第2圖,以第1圖最左側電路舉例,當面板110顯示全黑畫面時,藉由顯示檢測裝置100之檢測板120輸入檢測訊號至面板110,並藉由檢測轉接板130之檢測迴路之檢測二極體D1響應檢測訊號,以產生檢測結果。In step 220, a detection signal is input to the panel via the detection board of the display detection device. In some embodiments, please refer to FIG. 1 to FIG. 2, and take the leftmost circuit of FIG. 1 as an example, when the panel 110 displays a completely black screen, a detection signal is input to the panel 110 via the detection board 120 of the display detection device 100, and the detection diode D1 of the detection loop of the detection adapter board 130 responds to the detection signal to generate a detection result.

在一些實施例中,請參閱第1圖,顯示檢測裝置100之面板110包含第一區域及第二區域(圖中未示)。第一區域及第二區域不重疊。在一些實施例中,藉由顯示檢測裝置100之檢測板120分別輸入檢測訊號至第一區域及第二區域。須說明的是,面板110通常包含陣列式的顯示畫素。陣列式的顯示畫素通常為由複數行及複數列所組成。此處區域指的是一行或一列或感興趣區域(region of interest, ROI)。區域之形狀及大小由使用者根據實際需求設計,並不以本案實施例為限。In some embodiments, please refer to FIG. 1, the panel 110 of the display detection device 100 includes a first area and a second area (not shown). The first area and the second area do not overlap. In some embodiments, the detection signal is input to the first area and the second area respectively by the detection board 120 of the display detection device 100. It should be noted that the panel 110 usually includes array-type display pixels. The array-type display pixels are usually composed of a plurality of rows and a plurality of columns. Here, the area refers to a row or a column or a region of interest (ROI). The shape and size of the area are designed by the user according to actual needs and are not limited to the embodiments of this case.

在一些實施例中,請參閱第1圖,藉由顯示檢測裝置100之檢測板120同時輸入檢測訊號至第一區域及第二區域(圖中未示)。In some embodiments, please refer to FIG. 1 , the detection board 120 of the detection device 100 simultaneously inputs the detection signal to the first area and the second area (not shown in the figure).

於步驟230中,藉由檢測轉接板之檢測迴路響應檢測訊號,以產生檢測結果。在一些實施例中,請參閱第1圖至第2圖,以第1圖最左側電路舉例,藉由檢測二極體D1根據檢測訊號判斷面板110之最左側面板陣列電路111是否產生漏電流。In step 230, the detection circuit of the detection adapter board responds to the detection signal to generate a detection result. In some embodiments, please refer to Figures 1 to 2, and take the leftmost circuit in Figure 1 as an example, the detection diode D1 determines whether the leftmost panel array circuit 111 of the panel 110 generates leakage current according to the detection signal.

接著,若面板陣列電路111產生漏電流,則藉由檢測二極體D1根據漏電流之大小進行發光,以產生複數種光強度(例如:第一光強度L1)。Next, if the panel array circuit 111 generates a leakage current, the detection diode D1 emits light according to the size of the leakage current to generate a plurality of light intensities (eg, the first light intensity L1).

再者,若複數個面板陣列電路111並未產生漏電流,則藉由顯示檢測裝置100外部之電性檢測板910對檢測轉接板130進行電壓檢測或進行電流檢測,以判斷複數個面板陣列電路111是否缺損。Furthermore, if the plurality of panel array circuits 111 do not generate leakage current, the electrical property detection board 910 outside the display detection device 100 performs voltage detection or current detection on the detection adapter board 130 to determine whether the plurality of panel array circuits 111 are defective.

第3圖為根據本案一些實施例繪示的檢測系統2000之電路方塊示意圖。在一些實施例中,請參閱第3圖,檢測系統2000用以檢測顯示檢測裝置2100。檢測系統2000包含顯示檢測裝置2100及測試機台2200。FIG. 3 is a schematic diagram of a circuit block of a detection system 2000 according to some embodiments of the present invention. In some embodiments, please refer to FIG. 3 , the detection system 2000 is used to detect a display detection device 2100. The detection system 2000 includes a display detection device 2100 and a test machine 2200.

在一些實施例中,顯示檢測裝置2100包含面板2110、檢測板2120及檢測轉接板2130。面板2110用以進行顯示,並用以自檢測系統2000之點燈治具(圖中未示)傳輸檢測訊號。檢測板2120耦接於面板2110,並用以傳輸自面板2110之檢測訊號。檢測轉接板2130直接或間接耦接於面板2110,並用以響應檢測訊號,藉以產生檢測結果。In some embodiments, the display detection device 2100 includes a panel 2110, a detection board 2120, and a detection adapter board 2130. The panel 2110 is used for display and for transmitting a detection signal from a lighting fixture (not shown) of the detection system 2000. The detection board 2120 is coupled to the panel 2110 and is used to transmit the detection signal from the panel 2110. The detection adapter board 2130 is directly or indirectly coupled to the panel 2110 and is used to respond to the detection signal to generate a detection result.

在一些實施例中,測試機台2200包含探針平台2210、感測器2220及輔助感測器2211~2213。探針平台2210用以定位及校準顯示檢測裝置2100之面板2110。感測器2220耦接於探針平台2210,並用以擷取檢測轉接板2130之檢測結果,以產生特徵影像,藉以根據特徵影像評估顯示檢測裝置2100是否異常。In some embodiments, the test machine 2200 includes a probe platform 2210, a sensor 2220, and auxiliary sensors 2211-2213. The probe platform 2210 is used to position and calibrate the panel 2110 of the display detection device 2100. The sensor 2220 is coupled to the probe platform 2210 and is used to capture the detection result of the detection adapter board 2130 to generate a feature image, so as to evaluate whether the display detection device 2100 is abnormal according to the feature image.

須說明的是,第3圖之顯示檢測裝置2100對應至第1圖之顯示檢測裝置100,其餘結構及操作已於上述段落進行解說,於此不作贅述。It should be noted that the display detection device 2100 in FIG. 3 corresponds to the display detection device 100 in FIG. 1 , and the remaining structures and operations have been explained in the above paragraphs and will not be elaborated here.

在一些實施例中,測試機台2200可為自動化光學檢測系統(Automated Optical Inspection, AOI)。測試機台2200透過感測器2220擷取顯示檢測裝置2100之檢測轉接板2130檢測結果之光學影像,將亮度、顏色、畫素分佈等訊息轉換為數位影像訊號,再由電腦與程式對數位影像訊號進行各種數學運算,以抽取目標的特徵、分析及解釋影像內容,再根據預設的容許度和其他要求條件輸出結果。藉此透過檢測轉接板2130之檢測二極體D1~DN之發光強度(例如:第一光強度L1、第二光強度L2至第N個光強度LN)來檢測面板2110。In some embodiments, the test machine 2200 may be an automated optical inspection system (AOI). The test machine 2200 captures the optical image of the detection result of the detection adapter board 2130 of the display detection device 2100 through the sensor 2220, converts the information such as brightness, color, pixel distribution into a digital image signal, and then the computer and program perform various mathematical operations on the digital image signal to extract the characteristics of the target, analyze and interpret the image content, and then output the result according to the preset tolerance and other required conditions. In this way, the panel 2110 is detected by the light intensity of the detection diodes D1~DN of the detection adapter board 2130 (for example: the first light intensity L1, the second light intensity L2 to the Nth light intensity LN).

第4圖為根據本案一些實施例繪示的檢測系統3000之電路方塊示意圖。在一些實施例中,請參閱第4圖,第4圖之檢測系統3000及第3圖之檢測系統2000之差異在於檢測板3120之位置改變以及測試機台3200之探針平台3210包含點燈治具3213及鋁擠型支架3214,其餘結構與第3圖之檢測系統2000相似。FIG. 4 is a schematic diagram of a circuit block of a detection system 3000 according to some embodiments of the present invention. In some embodiments, please refer to FIG. 4. The difference between the detection system 3000 of FIG. 4 and the detection system 2000 of FIG. 3 is that the position of the detection board 3120 is changed and the probe platform 3210 of the test machine 3200 includes a lighting fixture 3213 and an aluminum extrusion bracket 3214. The rest of the structure is similar to the detection system 2000 of FIG. 3.

在一些實施例中,檢測系統3000包含顯示檢測裝置3100及測試機台3200。在一些實施例中,顯示檢測裝置3100包含面板3110、檢測板3120及檢測轉接板3130。在一些實施例中,測試機台3200包含探針平台3210、檢測感測器3220、對位感測器3211及對位感測器3212、點燈治具3213及鋁擠型支架3214。In some embodiments, the detection system 3000 includes a display detection device 3100 and a test machine 3200. In some embodiments, the display detection device 3100 includes a panel 3110, a detection board 3120, and a detection adapter board 3130. In some embodiments, the test machine 3200 includes a probe platform 3210, a detection sensor 3220, an alignment sensor 3211 and an alignment sensor 3212, a lighting fixture 3213, and an aluminum extrusion bracket 3214.

在一些實施例中,面板3110用以進行顯示,並用以自檢測系統3000之測試機台3200之探針平台3210之點燈治具3213傳輸檢測訊號。檢測板3120耦接於面板3110,並用以傳輸自面板3110之檢測訊號。檢測轉接板3130透過檢測板3120間接耦接於面板3110,並用以響應檢測訊號,藉以產生檢測結果。In some embodiments, the panel 3110 is used for display and for transmitting a detection signal from a lighting fixture 3213 of a probe platform 3210 of a test machine 3200 of a self-detection system 3000. The detection board 3120 is coupled to the panel 3110 and is used for transmitting a detection signal from the panel 3110. The detection adapter board 3130 is indirectly coupled to the panel 3110 through the detection board 3120 and is used for responding to the detection signal to generate a detection result.

在一些實施例中,探針平台3210之點燈治具3213用以產生檢測訊號至面板3110,再藉由檢測板3120傳輸至上方之檢測轉接板3130之檢測二極體D1至檢測二極體DN之中。In some embodiments, the lighting fixture 3213 of the probe platform 3210 is used to generate a detection signal to the panel 3110, which is then transmitted to the detection diode D1 of the upper detection adapter board 3130 through the detection board 3120 to the detection diode DN.

在一些實施例中,檢測感測器3220、對位感測器3211及對位感測器3212分別設置於鋁擠型支架3214上。In some embodiments, the detection sensor 3220, the alignment sensor 3211, and the alignment sensor 3212 are respectively disposed on the aluminum extrusion bracket 3214.

第5圖為根據本案一些實施例繪示的第4圖之檢測系統3000之局部區域Z放大示意圖。在一些實施例中,請參閱第4圖及第5圖,檢測板3120更包含探針卡頭3121及探針卡印刷電路板3122。探針卡頭3121包含複數個線針N1。複數個線針N1之底部與第4圖之面板3110接觸(圖中未示)。複數個線針N1之頂部與探針卡印刷電路板3122接觸。探針卡印刷電路板3122內部具有多組連接第4圖之面板3110及檢測轉接板3130之線路。FIG. 5 is an enlarged schematic diagram of a local area Z of the detection system 3000 of FIG. 4 according to some embodiments of the present invention. In some embodiments, please refer to FIG. 4 and FIG. 5, the detection board 3120 further includes a probe card head 3121 and a probe card printed circuit board 3122. The probe card head 3121 includes a plurality of wire pins N1. The bottom of the plurality of wire pins N1 contacts the panel 3110 of FIG. 4 (not shown in the figure). The top of the plurality of wire pins N1 contacts the probe card printed circuit board 3122. The probe card printed circuit board 3122 has a plurality of sets of lines connecting the panel 3110 of FIG. 4 and the detection adapter board 3130.

在一些實施例中,檢測轉接板3130包含檢測二極體D1至檢測二極體DN、彈簧針3131及印刷電路板3132。檢測轉接板3130內部具有從第4圖之面板3110向上延伸之多組線路。檢測轉接板3130之底部採用彈簧針3131進行連結。彈簧針3131之頂部與檢測轉接板3130之印刷電路板3132之接觸。In some embodiments, the detection adapter board 3130 includes detection diodes D1 to DN, spring pins 3131, and a printed circuit board 3132. The detection adapter board 3130 has multiple sets of lines extending upward from the panel 3110 in FIG. 4. The bottom of the detection adapter board 3130 is connected using spring pins 3131. The top of the spring pin 3131 contacts the printed circuit board 3132 of the detection adapter board 3130.

在一些實施例中,請參閱第3圖至第5圖,第5圖之檢測二極體D1至檢測二極體DN之位置將對應第4圖之面板3110之面板陣列電路(或稱為畫素)位置,其位置對應方式相似於第3圖中複數個面板陣列電路2111及檢測轉接板2130之檢測二極體D1之位置對應方式。因此,可藉由檢測二極體D1至檢測二極體DN之發光強度來檢測第4圖之面板3110。In some embodiments, referring to FIG. 3 to FIG. 5, the positions of the detection diodes D1 to the detection diodes DN in FIG. 5 correspond to the positions of the panel array circuits (or pixels) of the panel 3110 in FIG. 4, and the position correspondence is similar to the position correspondence of the detection diodes D1 of the plurality of panel array circuits 2111 and the detection adapter board 2130 in FIG. 3. Therefore, the panel 3110 in FIG. 4 can be detected by the light intensity of the detection diodes D1 to the detection diodes DN.

依據前述實施例,本案提供一種顯示檢測裝置、檢測方法及檢測系統,藉以於全暗畫面下檢測面板中電路是否產生漏電流,並根據漏電流轉換之光強度判別面板之瑕疵。According to the above-mentioned embodiments, the present case provides a display detection device, a detection method and a detection system, which are used to detect whether the circuit in the panel generates leakage current under a completely dark screen, and to determine the defects of the panel based on the light intensity converted by the leakage current.

雖然本案以詳細之實施例揭露如上,然而本案並不排除其他可行之實施態樣。因此,本案之保護範圍當視後附之申請專利範圍所界定者為準,而非受於前述實施例之限制。Although the present invention is disclosed in detail with the embodiments as above, the present invention does not exclude other feasible embodiments. Therefore, the protection scope of the present invention shall be subject to the scope of the attached patent application, and shall not be limited by the aforementioned embodiments.

對本領域技術人員而言,在不脫離本案之精神和範圍內,當可對本案作各種之更動與潤飾。基於前述實施例,所有對本案所作的更動與潤飾,亦涵蓋於本案之保護範圍內。For those skilled in the art, various modifications and improvements can be made to the present invention without departing from the spirit and scope of the present invention. Based on the above embodiments, all modifications and improvements made to the present invention are also covered by the protection scope of the present invention.

100:顯示檢測裝置 110:面板 111:面板陣列電路 120:檢測板 130:檢測轉接板 T1~TN:控制電晶體 E1~EN:電極板 P1~PN:薄膜探針 D1~DN:檢測二極體 L1~LN:光強度 900:光學檢測系統 910:電性檢測板 200:方法 210~230:步驟 2000:檢測系統 2100:顯示檢測裝置 2110:面板 2111:面板陣列電路 D1:檢測二極體 2120:檢測板 2130:檢測轉接板 2200:測試機台 2210:探針平台 2220:感測器 2211~2213:輔助感測器 P1~P2:站點 B:基板 3000:檢測系統 3100:顯示檢測裝置 3110:面板 2120:檢測板 3130:檢測轉接板 3200:測試機台 3210:探針平台 3220:檢測感測器 3211~3212:對位感測器 3213:點燈治具 3214:鋁擠型支架 Z:局部區域 3121:探針卡頭 3122:探針卡印刷電路板 3131:彈簧針 3132:印刷電路板 N1:線針 100: Display detection device 110: Panel 111: Panel array circuit 120: Detection board 130: Detection adapter board T1~TN: Control transistor E1~EN: Electrode plate P1~PN: Thin film probe D1~DN: Detection diode L1~LN: Light intensity 900: Optical detection system 910: Electrical detection board 200: Method 210~230: Steps 2000: Detection system 2100: Display detection device 2110: Panel 2111: Panel array circuit D1: Detection diode 2120: Detection board 2130: Detection adapter board 2200: Test machine 2210: Probe platform 2220: Sensor 2211~2213: Auxiliary sensor P1~P2: Station B: Substrate 3000: Detection system 3100: Display detection device 3110: Panel 2120: Detection board 3130: Detection adapter board 3200: Test machine 3210: Probe platform 3220: Detection sensor 3211~3212: Alignment sensor 3213: Lighting fixture 3214: Aluminum extrusion bracket Z: Local area 3121: Probe card head 3122: Probe card printed circuit board 3131: Spring needle 3132: Printed circuit board N1: Wire needle

參照後續段落中的實施方式以及下列圖式,當可更佳地理解本案的內容: 第1圖為根據本案一些實施例繪示的顯示檢測裝置之電路方塊示意圖; 第2圖為根據本案一些實施例繪示的檢測方法之步驟流程示意圖; 第3圖為根據本案一些實施例繪示的檢測系統之電路方塊示意圖; 第4圖為根據本案一些實施例繪示的檢測系統之電路方塊示意圖;以及 第5圖為根據本案一些實施例繪示的檢測系統之局部區域放大示意圖。 The content of the present invention can be better understood by referring to the implementation methods in the subsequent paragraphs and the following figures: Figure 1 is a schematic diagram of a circuit block of a display detection device according to some embodiments of the present invention; Figure 2 is a schematic diagram of a step flow of a detection method according to some embodiments of the present invention; Figure 3 is a schematic diagram of a circuit block of a detection system according to some embodiments of the present invention; Figure 4 is a schematic diagram of a circuit block of a detection system according to some embodiments of the present invention; and Figure 5 is a schematic diagram of a local area enlargement of a detection system according to some embodiments of the present invention.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic storage information (please note in the order of storage institution, date, and number) None Foreign storage information (please note in the order of storage country, institution, date, and number) None

100:顯示檢測裝置 100: Display detection device

110:面板 110: Panel

111:面板陣列電路 111: Panel array circuit

120:檢測板 120:Test board

130:檢測轉接板 130: Detection adapter board

T1~TN:控制電晶體 T1~TN: control transistor

E1~EN:電極板 E1~EN: Electrode plate

P1~PN:薄膜探針 P1~PN: Thin film probe

D1~DN:檢測二極體 D1~DN: detection diode

L1~LN:光強度 L1~LN: Light intensity

900:光學檢測系統 900: Optical detection system

910:電性檢測板 910: Electrical test board

Claims (20)

一種顯示檢測裝置,包含:一面板,用以進行顯示;一檢測板,耦接於該面板,並用以輸入一檢測訊號;以及一檢測轉接板,耦接於該面板,並用以響應該檢測訊號以產生一檢測結果,其中該檢測結果係為該檢測轉接板之複數個檢測二極體響應於該面板之一漏電流的複數個光強度。 A display detection device includes: a panel for display; a detection board coupled to the panel and used to input a detection signal; and a detection adapter board coupled to the panel and used to respond to the detection signal to generate a detection result, wherein the detection result is a plurality of light intensities of a plurality of detection diodes of the detection adapter board in response to a leakage current of the panel. 如請求項1所述之顯示檢測裝置,其中該面板包含:複數個面板陣列電路,用以進行顯示。 A display detection device as described in claim 1, wherein the panel includes: a plurality of panel array circuits for display. 如請求項2所述之顯示檢測裝置,其中該檢測轉接板包含:複數個檢測迴路,分別耦接於每一該些面板陣列電路,以響應該檢測訊號,藉以產生該檢測結果。 The display detection device as described in claim 2, wherein the detection adapter board includes: a plurality of detection loops, respectively coupled to each of the panel array circuits to respond to the detection signal to generate the detection result. 如請求項3所述之顯示檢測裝置,其中每一該些檢測迴路包含:至少一薄膜探針,耦接於每一該些檢測迴路及每一該些面板陣列電路,以形成一封閉迴路;以及該檢測二極體,耦接於該至少一薄膜探針,並用以根 據該檢測訊號進行發光,藉以判定該面板之該些面板陣列電路是否異常。 The display detection device as described in claim 3, wherein each of the detection loops comprises: at least one film probe coupled to each of the detection loops and each of the panel array circuits to form a closed loop; and the detection diode coupled to the at least one film probe and used to emit light according to the detection signal to determine whether the panel array circuits of the panel are abnormal. 如請求項4所述之顯示檢測裝置,其中當該面板顯示一全暗畫面時,每一該些檢測迴路之該檢測二極體用以根據該檢測訊號判斷每一該些面板陣列電路是否產生該漏電流。 The display detection device as described in claim 4, wherein when the panel displays a completely dark screen, the detection diode of each of the detection loops is used to determine whether each of the panel array circuits generates the leakage current according to the detection signal. 如請求項5所述之顯示檢測裝置,其中若該些面板陣列電路其中一者產生該漏電流,則藉由該檢測二極體根據該漏電流之大小進行發光,以產生該些光強度。 The display detection device as described in claim 5, wherein if one of the panel array circuits generates the leakage current, the detection diode emits light according to the magnitude of the leakage current to generate the light intensities. 如請求項5所述之顯示檢測裝置,其中若該些面板陣列電路並未產生該漏電流,則藉由該顯示檢測裝置外部之一電性檢測板對該檢測轉接板進行電壓檢測或進行電流檢測,以判斷每一該些面板陣列電路是否缺損。 As described in claim 5, if the panel array circuits do not generate the leakage current, an electrical property test board outside the display test device performs voltage test or current test on the test adapter board to determine whether each of the panel array circuits is defective. 一種檢測方法,包含:結合一檢測轉接板之一檢測迴路至一顯示檢測裝置之一面板;藉由該顯示檢測裝置之一檢測板輸入一檢測訊號至該面板;以及藉由該檢測轉接板之該檢測迴路響應該檢測訊號,以產生一檢測結果,其中該檢測結果係為該檢測轉接板之複 數個檢測二極體響應於該面板之一漏電流的複數個光強度。 A detection method includes: combining a detection circuit of a detection adapter board to a panel of a display detection device; inputting a detection signal to the panel through a detection board of the display detection device; and responding to the detection signal through the detection circuit of the detection adapter board to generate a detection result, wherein the detection result is a plurality of light intensities of a plurality of detection diodes of the detection adapter board in response to a leakage current of the panel. 如請求項8所述之檢測方法,其中該結合該檢測轉接板之該檢測迴路至該顯示檢測裝置之該面板之步驟包含:透過該檢測轉接板之該檢測迴路之至少一薄膜探針耦接於該面板之複數個面板陣列電路其中一者,以形成一封閉迴路。 The detection method as described in claim 8, wherein the step of combining the detection circuit of the detection adapter board with the panel of the display detection device includes: coupling at least one film probe of the detection circuit of the detection adapter board to one of the plurality of panel array circuits of the panel to form a closed loop. 如請求8所述之檢測方法,其中藉由該顯示檢測裝置之該檢測板輸入該檢測訊號之步驟包含:當該面板顯示一全黑畫面時,藉由該顯示檢測裝置之該檢測板輸入該檢測訊號至該面板,並藉由該檢測轉接板之該檢測迴路各者之該檢測二極體響應該檢測訊號,以產生該檢測結果。 The detection method as described in claim 8, wherein the step of inputting the detection signal through the detection board of the display detection device includes: when the panel displays a completely black screen, the detection signal is input to the panel through the detection board of the display detection device, and the detection diodes of each detection circuit of the detection adapter board respond to the detection signal to generate the detection result. 如請求項10所述之檢測方法,其中藉由該檢測轉接板之該檢測迴路響應該檢測訊號,以產生該檢測結果之步驟包含:藉由該些檢測二極體各者根據該檢測訊號判斷該面板之複數面板陣列電路是否產生一漏電流;以及若該些面板陣列電路其中一者產生該漏電流,則藉由該些檢測二極體各者根據該漏電流之大小進行發光,以產 生該些光強度。 The detection method as described in claim 10, wherein the step of generating the detection result by the detection circuit of the detection adapter board responding to the detection signal includes: determining whether the plurality of panel array circuits of the panel generate a leakage current according to the detection signal by each of the detection diodes; and if one of the panel array circuits generates the leakage current, each of the detection diodes emits light according to the size of the leakage current to generate the light intensities. 如請求項10所述之檢測方法,其中藉由該檢測轉接板之該檢測迴路響應該檢測訊號,以產生該檢測結果之步驟更包含:若複數個面板陣列電路並未產生該漏電流,則藉由該顯示檢測裝置外部之一電性檢測板對該檢測轉接板進行電壓檢測或進行電流檢測,以判斷該些面板陣列電路是否缺損。 As described in claim 10, the step of generating the detection result by the detection circuit of the detection adapter board responding to the detection signal further includes: if the plurality of panel array circuits do not generate the leakage current, then the detection adapter board is subjected to voltage detection or current detection by an electrical detection board outside the display detection device to determine whether the panel array circuits are defective. 如請求項8所述之檢測方法,其中該顯示檢測裝置之該面板包含一第一區域及一第二區域,其中該第一區域及該第二區域不重疊,其中藉由該顯示檢測裝置之該檢測板輸入該檢測訊號之步驟包含:藉由該顯示檢測裝置之該檢測板分別輸入該檢測訊號至該第一區域及該第二區域。 The detection method as described in claim 8, wherein the panel of the display detection device includes a first area and a second area, wherein the first area and the second area do not overlap, wherein the step of inputting the detection signal through the detection board of the display detection device includes: inputting the detection signal to the first area and the second area respectively through the detection board of the display detection device. 如請求13項所述之檢測方法,其中藉由該顯示檢測裝置之該檢測板輸入該檢測訊號之步驟更包含:藉由該顯示檢測裝置之該檢測板同時輸入該檢測訊號之該第一區域及該第二區域。 As described in claim 13, the step of inputting the detection signal through the detection board of the display detection device further includes: simultaneously inputting the first area and the second area of the detection signal through the detection board of the display detection device. 一種檢測系統,包含:一顯示檢測裝置,包含: 一面板,用以進行顯示,並用以自該檢測系統之一點燈治具傳輸一檢測訊號;一檢測板,耦接於該面板,並用以傳輸自該面板之該檢測訊號;以及一檢測轉接板,耦接於該面板,並用以響應該檢測訊號,藉以產生一檢測結果,其中該檢測結果係為該檢測轉接板之複數個檢測二極體響應於該面板之一漏電流的複數個光強度;以及一測試機台,包含:一探針平台,用以定位及校準該顯示檢測裝置之該面板;以及一感測器,耦接於該探針平台,並用以擷取該檢測轉接板之該檢測結果之該些光強度,以產生一特徵影像,藉以根據該特徵影像評估該顯示檢測裝置是否異常。 A detection system, comprising: a display detection device, comprising: a panel for displaying and transmitting a detection signal from a lighting fixture of the detection system; a detection board coupled to the panel and transmitting the detection signal from the panel; and a detection adapter board coupled to the panel and responding to the detection signal to generate a detection result, wherein the detection result is the detection adapter board A plurality of detection diodes respond to a plurality of light intensities of a leakage current of the panel; and a testing machine, comprising: a probe platform for positioning and calibrating the panel of the display detection device; and a sensor coupled to the probe platform and used to capture the light intensities of the detection result of the detection adapter board to generate a characteristic image, so as to evaluate whether the display detection device is abnormal according to the characteristic image. 如請求項15所述之檢測系統,其中該面板包含:複數個面板陣列電路,用以進行顯示。 A detection system as described in claim 15, wherein the panel comprises: a plurality of panel array circuits for display. 如請求項16所述之檢測系統,其中該檢測轉接板包含:複數個檢測迴路,分別耦接於每一該些面板陣列電路,以響應該檢測訊號,藉以產生該檢測結果。 The detection system as described in claim 16, wherein the detection adapter board includes: a plurality of detection loops, respectively coupled to each of the panel array circuits to respond to the detection signal to generate the detection result. 如請求項17所述之檢測系統,其中每一該些檢測迴路包含:至少一薄膜探針,耦接於每一該些檢測迴路及每一該些面板陣列電路,以形成一封閉迴路;以及該檢測二極體,耦接於該至少一薄膜探針,並用以根據該檢測訊號進行發光,藉以判定該面板之該些面板陣列電路是否異常。 The detection system as described in claim 17, wherein each of the detection loops comprises: at least one film probe coupled to each of the detection loops and each of the panel array circuits to form a closed loop; and the detection diode coupled to the at least one film probe and used to emit light according to the detection signal to determine whether the panel array circuits of the panel are abnormal. 如請求項18所述之檢測系統,其中當該面板顯示一全暗畫面時,每一該些檢測迴路之該檢測二極體用以根據該檢測訊號判斷該些面板陣列電路是否產生該漏電流,其中若該些面板陣列電路其中一者產生該漏電流,則藉由該檢測二極體根據該漏電流之大小進行發光,以產生該些光強度,該測試機台之該感測器更用以根據該些光強度產生該特徵影像。 As described in claim 18, when the panel displays a completely dark screen, the detection diode of each of the detection loops is used to determine whether the panel array circuits generate the leakage current according to the detection signal, and if one of the panel array circuits generates the leakage current, the detection diode emits light according to the size of the leakage current to generate the light intensities, and the sensor of the test machine is further used to generate the characteristic image according to the light intensities. 如請求項19所述之檢測系統,其中若該些面板陣列電路並未產生該漏電流,則藉由該顯示檢測裝置外部之一電性檢測板對該檢測轉接板進行電壓檢測或進行電流檢測,以判斷每一該些面板陣列電路是否缺損。 As described in claim 19, if the panel array circuits do not generate the leakage current, an electrical property test board outside the display test device performs voltage test or current test on the test adapter board to determine whether each of the panel array circuits is defective.
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