TWI871418B - Grain distinguishing device - Google Patents
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- TWI871418B TWI871418B TW110101905A TW110101905A TWI871418B TW I871418 B TWI871418 B TW I871418B TW 110101905 A TW110101905 A TW 110101905A TW 110101905 A TW110101905 A TW 110101905A TW I871418 B TWI871418 B TW I871418B
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Abstract
Description
本發明係關於一種判別穀粒的品質用的穀粒判別器。The present invention relates to a grain discriminator for discriminating the quality of grains.
往昔,已知一種穀粒判別器,用以根據照射於穀粒的光線之透射光,來判別穀粒有無裂縫等。例如,在專利文獻1中揭示一種穀粒判別器,其使光線由配置於透明托盤側方的光源,經由反射板照射至透明托盤的底面。
[先前技術文獻]
[專利文獻]In the past, a grain discriminator was known for discriminating whether the grain has cracks, etc., based on the transmitted light of the light irradiated on the grain. For example,
[專利文獻1]日本特開2014-173884號公報[Patent Document 1] Japanese Patent Application Publication No. 2014-173884
[發明所欲解決之問題][Identify the problem you want to solve]
在專利文獻1所揭示的穀粒判別器中,由於光源被設置於透明托盤的其中一側,故離透明托盤的光源較遠的區域,會變得比離光源近的區域暗。亦即,會造成照射至載置於透明托盤的穀粒之光線的強度產生不均,而有變得無法正確地進行穀粒的品質判別之虞。In the grain discriminator disclosed in
本發明之目的在於提供一種可抑制照射至穀粒的光線之強度產生不均的穀粒判別器。 [解決問題之技術手段]The purpose of the present invention is to provide a grain discriminator that can suppress the uneven intensity of light irradiating the grains. [Technical means for solving the problem]
本發明之穀粒判別器,具備:光源;透鏡,將光源發出的光線聚光;反射部,使藉由透鏡聚光之光線反射;以及盤構件,具有透光性並在其底面接受以反射部所反射的光線。 [發明之效果]The grain discriminator of the present invention comprises: a light source; a lens for focusing the light emitted by the light source; a reflecting part for reflecting the light focused by the lens; and a disk member having light-transmitting properties and receiving the light reflected by the reflecting part on its bottom surface. [Effects of the invention]
若依據本發明,能抑制照射至穀粒的光線之強度產生不均。According to the present invention, it is possible to suppress the unevenness of the intensity of light irradiating the grains.
以下,使用圖式針對依第一實施態樣的穀粒判別器加以說明。The following uses diagrams to illustrate the grain discriminator according to the first embodiment.
圖1係顯示第一實施態樣的穀粒判別器的立體圖。穀粒判別器1為用以向穀粒照射光線的裝置,並係為了判別米、麥、豆、以及玉米等穀粒的品質而使用。Fig. 1 is a perspective view showing a grain discriminator according to a first embodiment. The
例如,對產生龜裂的米照射光線時,光線會在龜裂部分反射。因此,透射龜裂部分的光線的強度會變弱,而使龜裂部分看起來黯淡。從而,藉由透射米的透射光之明暗,能進行龜裂的有無、及龜裂的大小等之判別。For example, when light is irradiated on cracked rice, the light is reflected by the cracked part. Therefore, the intensity of the light transmitted through the cracked part becomes weaker, making the cracked part appear darker. Therefore, the presence or absence of cracks and the size of the cracks can be determined by the brightness of the light transmitted through the rice.
穀粒判別器1具備本體2及盤構件3。The
本體2例如係製作成箱型。在本體2中,內建用以朝向盤構件3的底面照射光線的各種裝置。The
盤構件3為用以載置判別對象的穀粒之構件。盤構件3係以盤狀製成。盤構件3設置於本體2的頂面。盤構件3例如係以透明的合成樹脂所製成。然而,盤構件3只要係以具有透光性的材料製成即可。The
圖2係顯示第一實施態樣的穀粒判別器1的俯視圖。FIG. 2 is a top view showing the
本體2在俯視觀察下例如係呈矩形。本體2的形狀在俯視觀察下不限於矩形,亦可呈圓形、三角形、以及六角形等多角形。The
盤構件3在俯視觀察下例如係呈圓形。盤構件3的形狀在俯視觀察下不限於圓形,亦可呈橢圓形以及多角形。The
圖3係圖2的A-A線箭視圖。本體2在其內部具備光源容納部4、透鏡5以及反射部6。Fig. 3 is an arrow view of line A-A of Fig. 2. The
光源容納部4為沿著本體2的內側面配置的橫向較長的形狀之構件。光源容納部4係沿著本體2的4個所有的內側面配置。不過,光源容納部4只要係沿著複數個內側面當中的至少一個內側面配置即可。The light
透鏡5係配置成從各個光源容納部4觀看時,在本體2的內部方向上聯接於各個光源容納部4。The
反射部6係在本體2內部的中央,平行配置於本體2的底面。亦即,光源容納部4係配置成在反射部6的周圍區域圍繞反射部6。The
其次,針對光源容納部4、透鏡5、以及反射部6的各個結構詳細說明。Next, the structures of the light
圖4係圖3的部分放大視圖。FIG. 4 is a partially enlarged view of FIG. 3 .
光源容納部4為容納光源7的構件。光源容納部4具有:安裝部41、第一導光部42、以及第二導光部43。The light
安裝部41具有安裝光源7用的安裝面411。在安裝面411,安裝1個或是2個以上的光源7。The
安裝面411係使光線反射並將此光線引導至透鏡5的面。安裝面411例如為具有白色光澤的面。安裝面411例如為平面。安裝面411在穀粒判別器1被放置於水平面時,係朝向本體2的外側方向且為斜下方。The
第一導光部42係連接於「安裝部41的上緣」的部分。第一導光部42具有:使光線反射的第一導光面421。第一導光面421例如為具有白色光澤的面。第一導光面421例如為平面。第一導光部42係為了使第一導光面421與安裝面411,例如成為直角,而連接於安裝部41。The first
第二導光部43係連接於「第一導光部42的下緣」的部分。第二導光部43在與安裝面411對向側的位置,具有使光線反射的第二導光面431。第二導光面431例如係具有白色的光澤的面。第二導光面431例如為平面。The second
第二導光部43係以使第二導光面431與第一導光面421之間形成銳角的方式連接於第一導光部42。此外,第二導光面431相對於反射部6傾斜地形成。The second
由於第二導光面431係相對於反射部6傾斜,故相較於第二導光面431平行於反射部6而形成的情況,能將光源容納部4的寬度縮小。
在此,所謂光源容納部4的寬度,係指「光源容納部4的水平方向」且為「垂直於光源容納部4之長邊方向的方向」之寬度。亦即,圖4所圖示的光源容納部4之左右方向的寬度。藉由將光源容納部4的寬度縮小,能使穀粒判別器1小型化。Since the second
此外,由於係以形成銳角的方式配置第一導光面421與第二導光面431,故相較於第一導光面421以直角連接於第二導光面431的情況,能降低光源容納部4的高度。其結果,能使穀粒判別器1小型化。Furthermore, since the first
安裝面411、第一導光面421、以及第二導光面431係藉由上述結構形成容納光源7的容納空間。換言之,安裝面411、第一導光面421、以及第二導光面431係各自為形成容納光源7的容納空間的面之一部分。此外,在與第一導光面421對向側的區域,形成使光源7發出的光線通過的長孔狀的開口。The mounting
又,安裝面411、第一導光面421、以及第二導光面431亦可各自以曲面形成。此時,各個面係製作成平滑地連接。Furthermore, the mounting
光源7例如係以日光燈、LED(Light Emitting Diode,發光二極體)所構成。The
光源7發出的光線係利用安裝面411、第一導光面421、或是第二導光面431,反射一次或是複數次而前往開口。到達開口的光線會入射透鏡5。The light emitted by the
透鏡5係配置於光源容納部4的開口,並將光源7所發出而到達開口的光線聚光。透鏡5例如係受光面為凸狀的透鏡。透鏡5例如係以圓柱狀形成的柱狀透鏡。The
反射部6例如係製作成俯視看來呈大致矩形的板狀之構件。反射部6之一邊的長度係形成為較盤構件3的底面的直徑大。因此,如圖4所示,反射部6的外周部係位在較盤構件3的外周部外側。藉此,反射部6能使光線朝向盤構件3底面的全部區域反射。換言之,盤構件3的底面係被設定成能在其底面的全部區域接受來自反射部6的光線的大小。又,圖4所示的盤構件3係為了表示盤構件3在水平方向上的位置,而虛擬地表示於本體2中之物,實際上係如上述般載置於本體2之上。The reflecting
反射部6具有:反射面61,使藉由透鏡5聚光的光線朝向盤構件3的底面反射。反射面61係例如,製作成黑色。此外,反射面61係以沒有光澤的面所製作。藉此,能防止光源7的輪廓顯印於反射面61。此外,能防止載置於盤構件3的穀粒的影像顯印於反射面61。The reflecting
以反射面61所反射的光線,透射以透明的合成樹脂所製成的盤構件3,而照射載置於盤構件3中的穀粒。又,在本實施態樣中,依次切換來自「沿著本體2的四個內側面配置的光源容納部4」的光線,而照射盤構件3的底面。The light reflected by the reflecting
如上所述,當穀粒判別器1被放置於水平面時,安裝面411係朝向本體2的外側方向且為斜下方。換言之,光源7朝向與配置有反射面61的方向相異的方向發出光線;而透鏡5接受以安裝面411、第一導光面421、以及第二導光面431所反射後的光線。其結果,由於來自光源7的光線一定程度擴散,故能防止光源7的輪廓顯印於反射面61。As described above, when the
在此,使用圖5~圖8針對透鏡5的配置以及作用詳細說明。Here, the arrangement and function of the
圖5係顯示從開口射出的光線的最大亮度方向的圖式。圖5顯示在光源容納部4的開口未配置透鏡的穀粒判別器1的縱剖面的一部分。Fig. 5 is a diagram showing the direction of maximum brightness of light emitted from the opening. Fig. 5 shows a part of the longitudinal section of the
在光源容納部4的開口未配置透鏡的情況下,從開口射出的光線的最大亮度的方向,係大致平行於第二導光面431而朝向反射面61的方向(以粗箭頭A1所表示的方向)。換言之,由光源7所發出的光線,係最明亮地照射在反射面61的光源7側的端部附近,例如,照射在自反射面61的端部起算l1
[mm]的位置。其結果,使得以反射面61所反射的光線,明亮地照射在盤構件3的光源側。又,粗箭頭A2,係表示以反射面61所反射的光線的方向。When no lens is arranged at the opening of the light
圖6係顯示在圖5所示的結構的穀粒判別器1中,照射於盤構件3的光線之照度的圖式。橫軸表示從光源7起算的水平方向的距離,縱軸表示盤構件3接受的光線之照度。Fig. 6 is a graph showing the illuminance of light irradiated on the
在開口未配置透鏡5的情況,如圖6所示,在靠近光源7的區域照度變高,在遠離光源7的區域照度變低。亦即,在盤構件3的兩端之間,接受的光線之照度的差異較大。When the
圖7係顯示從開口射出的光線之最大亮度的方向之圖式。圖7顯示「在光源容納部4的開口配置有透鏡5」的穀粒判別器1之縱剖面的一部分。於光源容納部4的開口配置有透鏡5的情況下,透鏡5在將通過開口的光線聚光的同時,使光線行進的方向改變。Fig. 7 is a diagram showing the direction of maximum brightness of light emitted from the opening. Fig. 7 shows a part of the longitudinal section of the
如同圖7所示,安裝面411與第二導光面431之間的凸面成為透鏡5的受光面;透鏡5以受光面接受光線,而使此光線的最大亮度的方向改變。換言之,透鏡5係配置成使「入射至透鏡5的光線的最大亮度的方向」與「從透鏡5出射的光線的最大亮度的方向」相異。As shown in FIG7 , the convex surface between the mounting
如圖7所示,相較於在開口未配置透鏡5的情況,在開口配置有透鏡5的情況下,光線的最大亮度的方向(以粗箭頭A1表示的方向)會靠向反射面61的中心。換言之,被最明亮地照射的反射面61上的位置變為例如從反射面61的端部起算l2
[mm]的位置。此l2
[mm]係比圖5所示的l1
[mm]更大的值。As shown in FIG7 , when the
圖8係顯示在圖7所示之依第一實施態樣的穀粒判別器1中,盤構件3接受的光線的照度之圖式。橫軸表示從光源7起算的水平方向的距離,縱軸表示照度。Fig. 8 is a diagram showing the illumination of light received by the
與在開口未配置透鏡5的穀粒判別器1相比,在開口配置有透鏡5的穀粒判別器1,在盤構件3的兩端之間接受的光線的照度的差異較小。亦即,在依第一實施態樣的穀粒判別器1,能抑制照射至盤構件3的光線之強度產生不均。Compared with the
其結果,由於對載置於盤構件3的穀粒更均勻地照射光線,故能正確地進行穀粒的判別。As a result, since the grains placed on the
又,如圖7所示,在開口配置有透鏡5的情況,前往反射面61的光源側的最端部的光線,會藉由透鏡5聚光在靠向反射面61的中心。因此,如圖8所示,盤構件3的離光源7最近的區域的照度會變低。7, when the
其次,針對依第二實施態樣的穀粒判別器1加以說明。Next, the
圖9係第二實施態樣的穀粒判別器1之縱剖面的部分放大視圖。在第二實施態樣的穀粒判別器1中,在透鏡5與第二導光面431之間設置有間隙。關於此透鏡5的配置以外的結構,依第二實施態樣的穀粒判別器1係與依第一實施態樣的穀粒判別器1相同。Fig. 9 is a partially enlarged view of a longitudinal section of the
藉由透鏡5與第二導光面431之間的間隙,光源7所發出的光線之一部分,不會透射透鏡5而直接前往反射面61。換言之,此間隙係使來自容納空間的光線朝向反射部6而通過之。未透射透鏡5而以反射面61反射的光線,會透射透鏡5、或是不透射透鏡5而照射至盤構件3底面。又,此間隙的尺寸,例如,在將直徑為15[mm]的柱狀透鏡作為透鏡5使用的情況下,係設定成3[mm]左右。此時,安裝部41的下緣與第二導光面431的距離,亦即開口的上緣與下緣之間的尺寸,為18[mm]以下。換言之,此開口的上緣與下緣之間的尺寸,係依據透鏡5的大小等而設定,以使其與透鏡5的直徑和間隙的尺寸之合計值相同、或是變得比該合計值小。Due to the gap between the
圖10係顯示在圖9所示的依第二實施態樣的穀粒判別器1中,盤構件3所接受的光線的照度之圖式。橫軸表示從光源7起算之水平方向的距離,縱軸表示照度。Fig. 10 is a diagram showing the illumination of light received by the
如圖10所示,在依第二實施態樣的穀粒判別器1中,與依第一實施態樣的穀粒判別器1相同,盤構件3係跨越整體寬度大致均勻地接受光線。亦即,在依第二實施態樣的穀粒判別器1中,能抑制照射至盤構件3的光線之強度產生不均。As shown in Fig. 10, in the
此外,在依第二實施態樣的穀粒判別器1中,在透鏡5與第二導光面431之間設置有間隙。因此,未透射透鏡5的光線亦直接照射於反射面61的光源7側之端部。其結果,光線亦照射於盤構件3的光源7側的端部,亦即,亦照射於盤構件3底面的外周部分,使得盤構件3能跨越整體寬度更均勻地接受光線。In addition, in the
其結果,由於對載置於盤構件3的穀粒更均勻地照射光線,故能正確地進行穀粒的判別。As a result, since the grains placed on the
又,雖然在圖7及圖9中圖示出剖面形成為圓形的柱狀透鏡,但透鏡5中,只要其受光面係形成為凸狀即可。例如,如圖11所示,透鏡5亦可為出射面以平面形成之魚板形的透鏡5。此外,如圖12所示,透鏡5的剖面亦能以橢圓形成。亦即,透鏡的受光面的凸狀只要為具備彎曲面者即可。Furthermore, although FIG. 7 and FIG. 9 illustrate a cylindrical lens having a circular cross section, the
此外,如圖13所示,透鏡5亦可為圓形的凸透鏡。此時,係沿開口配置複數個透鏡5。當透鏡5係以圓形的凸透鏡製成的情況下,在透鏡5互相接連的接觸部附近,形成從開口前往反射面61的光線所通過的間隙。藉由從此間隙射出的光線,而將光線照射於反射面61的端部附近。因此,亦能將光線均勻地照射在盤構件3的外周部分。其結果,由於對載置於盤構件3的穀粒更均勻地照射光線,故能正確地進行穀粒的判別。In addition, as shown in FIG13 , the
又,儘管在上述各實施態樣中,係在穀粒判別器1之製作成箱型的本體2內部,另行設置光源容納部4並設置光源7,但並不限於此。亦可設成在本體的內部設置光源而形成光源容納部。此時,內建有光源的本體內部會形成容納光源的容納空間,即相當於本發明的光源容納部。Furthermore, although in the above-mentioned embodiments, the light
1:穀粒判別器 2:本體 3:盤構件 4:光源容納部 41:安裝部 411:安裝面 42:第一導光部 421:第一導光面 43:第二導光部 431:第二導光面 5:透鏡 6:反射部 61:反射面 7:光源 A1,A2:粗箭頭 l1 ,l2 :長度1: Grain discriminator 2: Body 3: Disc member 4: Light source housing 41: Mounting portion 411: Mounting surface 42: First light guide portion 421: First light guide surface 43: Second light guide portion 431: Second light guide surface 5: Lens 6: Reflection portion 61: Reflection surface 7: Light source A1, A2: Thick arrows l 1 , l 2 : Length
【圖1】係顯示第一實施態樣的穀粒判別器的立體圖。 【圖2】係顯示第一實施態樣的穀粒判別器的俯視圖。 【圖3】係圖2的A-A線箭視圖。 【圖4】係圖3的部分放大視圖。 【圖5】係顯示從開口射出的光線之最大亮度的方向之圖式。 【圖6】係顯示盤構件接受的光線之照度的圖式。 【圖7】係顯示從開口射出的光線之最大亮度的方向之圖式。 【圖8】係顯示在第一實施態樣中,盤構件接受的光線之照度的圖式。 【圖9】係第二實施態樣的穀粒判別器的縱剖面之部分放大視圖。 【圖10】係顯示在第二實施態樣中,盤構件接受的光線的照度的圖式。 【圖11】係顯示另一態樣的透鏡之圖式。 【圖12】係顯示又另一態樣的透鏡之圖式。 【圖13】係顯示又另一態樣的透鏡之圖式。[Figure 1] is a three-dimensional diagram showing the grain discriminator of the first embodiment. [Figure 2] is a top view showing the grain discriminator of the first embodiment. [Figure 3] is an arrow view of the A-A line of Figure 2. [Figure 4] is a partially enlarged view of Figure 3. [Figure 5] is a diagram showing the direction of the maximum brightness of the light emitted from the opening. [Figure 6] is a diagram showing the illuminance of the light received by the disk component. [Figure 7] is a diagram showing the direction of the maximum brightness of the light emitted from the opening. [Figure 8] is a diagram showing the illuminance of the light received by the disk component in the first embodiment. [Figure 9] is a partially enlarged view of the longitudinal section of the grain discriminator of the second embodiment. [Fig. 10] is a diagram showing the illumination of light received by the disk component in the second embodiment. [Fig. 11] is a diagram showing a lens in another embodiment. [Fig. 12] is a diagram showing a lens in yet another embodiment. [Fig. 13] is a diagram showing a lens in yet another embodiment.
1:穀粒判別器 1: Grain detector
3:盤構件 3: Disk components
4:光源容納部 4: Light source storage part
41:安裝部 41: Installation Department
411:安裝面 411: Mounting surface
42:第一導光部 42: First light guide unit
421:第一導光面 421: First light-guiding surface
43:第二導光部 43: Second light guide part
431:第二導光面 431: Second light-guiding surface
5:透鏡 5: Lens
6:反射部 6: Reflection part
61:反射面 61: Reflective surface
7:光源 7: Light source
Claims (8)
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JP2020012803A JP7404895B2 (en) | 2020-01-29 | 2020-01-29 | grain discriminator |
JP2020-012803 | 2020-06-25 |
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CN (1) | CN115004015A (en) |
BR (1) | BR112022015087A2 (en) |
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JP7679962B2 (en) * | 2021-07-15 | 2025-05-20 | 株式会社大一商会 | Gaming Machines |
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WO2021153235A1 (en) | 2021-08-05 |
CN115004015A (en) | 2022-09-02 |
JP2021117201A (en) | 2021-08-10 |
JP7404895B2 (en) | 2023-12-26 |
TW202130990A (en) | 2021-08-16 |
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