TWI827063B - Processing apparatus, detecting method and handler - Google Patents
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- 230000032258 transport Effects 0.000 abstract 2
- 238000012546 transfer Methods 0.000 description 10
- 238000003384 imaging method Methods 0.000 description 6
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- 239000000463 material Substances 0.000 description 6
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Abstract
Description
本發明提供一種可使作業器準確位移,以提高作業精準性之作業裝置及檢知方法。The present invention provides an operating device and a detection method that can accurately displace an operating device to improve operating accuracy.
在現今,電子元件作業機之作業機構設置複數個作業器(如移料器或載台),以供執行取放電子元件之移料作業或運送電子元件之送料作業;在電子元件日趨精密微小之設計下,對於複數個作業器同步位移至預設作業位置之精準度要求相當高。以作業機構之移料器而言,作業機構之驅動器經由馬達 、皮帶輪組及螺桿螺座組等構件而連結驅動一承載具作X-Y-Z方向位移,承載具裝配複數支為吸嘴之移料器,並帶動複數支移料器同步位移至供料盤以取出複數個電子元件。 Nowadays, the operating mechanism of electronic component working machines is equipped with a plurality of operators (such as transfer machines or carriers) to perform the transfer operation of picking up and placing electronic components or the feeding operation of transporting electronic components; as electronic components become increasingly sophisticated and tiny, Under the design, the accuracy requirements for the simultaneous movement of multiple operators to the preset operating positions are quite high. In terms of the material transfer device of the operating mechanism, the driver of the operating mechanism is driven by the motor , pulley set, screw screw seat set and other components are connected to drive a carrier to move in the X-Y-Z direction. The carrier is equipped with a plurality of feeders that are suction nozzles, and drives the plurality of feeders to synchronously move to the feed tray to take out multiple materials. electronic components.
然而,承載具若因驅動器之構件作動偏差或組裝偏差等因素,而無法帶動複數支移料器準確位移至預設作業位置,即無法使複數支移料器精準對位拾取供料盤上之複數個電子元件,進而影響取放料作業之精準性。However, if the carrier cannot drive the plurality of feeders to accurately move to the preset operating position due to factors such as deviations in the driver's components or assembly deviations, it will not be able to accurately align the plurality of feeders to pick up the materials on the supply tray. Multiple electronic components affect the accuracy of picking and placing operations.
再者,承載具於更換一批次複數支移料器,複數支移料器也可能因組裝位置偏差或傾斜組裝等因素,導致複數支移料器之間距發生異常,以致無法精準對位取放複數個電子元件。Furthermore, when the carrier replaces a batch of multiple transfer devices, the multiple transfer devices may also be assembled in an abnormal position due to factors such as assembly position deviation or tilted assembly, resulting in abnormal spacing between the multiple transfer devices, making it impossible to accurately align and take them. Place multiple electronic components.
又,複數支移料器若因組裝高度偏差或Z方向位移作動不確實等因素,導致取放料之作業高度位置異常,即會發生過壓電子元件受損或者未取放電子元件之問題,進而影響電子元件良率及作業順暢性。In addition, if the working height of multiple material transfer devices is abnormal due to factors such as assembly height deviation or inaccurate Z-direction displacement, problems such as damage to electronic components due to overvoltage or failure to pick and place electronic components may occur. This in turn affects the yield rate of electronic components and the smoothness of operations.
本發明之目的一,提供一種作業裝置,包含作業機構及檢知機構 ,作業機構設置可作至少一方向位移之承載具,承載具裝配第一取像器及至少一作業器,並能夠載送第一取像器至第一檢位,至少一作業器以供對電子元件執行預設作業,檢知機構設有第二取像器及處理器,第二取像器位於第二檢位 ,藉以位於第一檢位之第一取像器及位於第二檢位之第二取像器其中一者能夠朝向另一者取像,並將取像之第一檢知資料傳輸至處理器,以供分析第一取像器與第二取像器之第一偏差值,而可檢知承載具載送第一取像器及作業器位移之第一偏差值,進而將第一偏差值補償調整於作業器之位移值,使作業器準確位移至預設作業位置,達到提高作業精準性之使用效益。 One object of the present invention is to provide an operating device, including an operating mechanism and a detecting mechanism. The operating mechanism is provided with a carrier that can move in at least one direction. The carrier is equipped with a first image pickup device and at least one operator, and can carry the first image pickup device to the first inspection position, and the at least one operator is used for alignment. The electronic component performs the preset operation. The detection mechanism is equipped with a second image pickup and a processor. The second image pickup is located at the second detection position. , whereby one of the first image pickup device located at the first detection position and the second image pickup device located at the second detection position can capture an image toward the other, and transmit the captured first detection data to the processor , for analyzing the first deviation value between the first image pickup device and the second image pickup device, and detecting the first deviation value of the displacement of the carrier carrying the first image pickup device and the operator, and then converting the first deviation value The compensation is adjusted to the displacement value of the operator, so that the operator can accurately move to the preset operating position, thereby improving the accuracy of the operation.
本發明之目的二,提供一種作業裝置,其檢知機構設置高度變位器,以供裝配第二取像器,利用高度變位器調整第二取像器之檢知高度位置,而預設第二取像器取像作業器之影像銳利度,使得處理器分析複數個作業器之第二檢知資料的影像銳利度是否一致,藉以檢知複數個作業器之實際高度位置是否相同,達到提高檢知效能之實用效益。The second object of the present invention is to provide a working device, the detection mechanism of which is provided with a height shifter for assembling a second image pickup device, and the height shifter is used to adjust the detection height position of the second image pickup device, and the preset The second image pickup device captures the image sharpness of the operating devices, causing the processor to analyze whether the image sharpness of the second detection data of the plurality of operating devices is consistent, thereby detecting whether the actual height positions of the plurality of operating devices are the same, to achieve Practical benefits of improving detection efficiency.
本發明之目的三,提供一種檢知方法,包含第一作動手段、第一檢知手段及調校手段;第一作動手段以作業機構之承載具帶動第一取像器位移到至少一第一檢位;第一檢知手段以位於第一檢位之第一取像器與檢知機構位於第二檢位之第二取像器其中一者能夠朝向另一者取像,並將取像之第一檢知資料傳輸至檢知機構之處理器;調校手段以處理器分析第一取像器與第二取像器之第一偏差值,並將第一偏差值補償調整於作業機構之作業器的位移值,使作業器準確位移至預設作業位置,進而提高作業品質。The third object of the present invention is to provide a detection method, which includes a first actuation means, a first detection means and an adjustment means; the first actuation means uses the carrier of the operating mechanism to drive the first image pickup device to move to at least one first Detection position; the first detection means uses the first image pickup device located at the first detection position and the second image pickup device located at the second detection position of the detection mechanism, one of which can take an image toward the other, and will take the image The first detection data is transmitted to the processor of the detection mechanism; the adjustment method uses the processor to analyze the first deviation value of the first image pickup device and the second image pickup device, and compensates and adjusts the first deviation value to the operating mechanism The displacement value of the operator enables the operator to accurately move to the preset operating position, thereby improving the quality of the operation.
本發明之目的四,提供一種檢知方法,更包含第二作動手段及第二檢知手段,第二作動手段以作業機構之承載具帶動作業器位移一預設間距值 ,第二檢知手段以檢知機構之第二取像器取像作業器,並將取像之第二檢知資料傳輸至處理器,調校手段以處理器分析取得位於實際位置之作業器中心與第二取像器中心的第二偏差值,並將第二偏差值補償調整於作業器之位移值,使作業器準確位移至預設作業位置,進而提高檢知效能。 The fourth object of the present invention is to provide a detection method, which further includes a second actuating means and a second detecting means. The second actuating means uses the carrier of the operating mechanism to drive the operator to move by a preset distance value. , the second detection means uses the second image pickup device of the detection mechanism to capture the image of the operator, and transmits the captured second detection data to the processor, and the adjustment means uses the processor to analyze and obtain the actual position of the operator The second deviation value between the center and the center of the second image pickup device is compensated and adjusted to the displacement value of the operator, so that the operator can accurately move to the preset operating position, thereby improving detection performance.
本發明之目的五,提供一種檢知方法,包含架置手段、第三作動手段、第三檢知手段及調校手段;架置手段以檢知機構之高度變位器驅動第二取像器位移調整架置於所需之檢知高度;第三作動手段以第二取像器及至少一作業器其中一者能夠朝向另一者位移;第三檢知手段以檢知機構之第二取像器能夠取像作業器,並將取像之第三檢知資料傳輸至檢知機構之處理器;調校手段以處理器分析作業器之實際高度位置是否異常,進而提高檢知效能。The fifth object of the present invention is to provide a detection method, which includes a mounting means, a third actuation means, a third detection means and an adjustment means; the mounting means drives the second image pickup device with the height shifter of the detection mechanism. The displacement adjustment frame is placed at the required detection height; the third actuation means uses the second image pickup device and at least one operating device to be able to move toward the other; the third detection means uses the second pickup of the detection mechanism. The imager can capture the image of the operating device and transmit the captured third detection data to the processor of the detection mechanism; the adjustment method uses the processor to analyze whether the actual height position of the operating device is abnormal, thereby improving detection efficiency.
本發明之目的六,提供一種檢知方法,其第三檢知手段可利用第二取像器取像複數個作業器,並將複數個第三檢知資料傳輸至處理器,調校手段之處理器可分析複數個第三檢知資料之影像銳利度是否一致,以檢知複數個作業器之實際高度位置是否等高,進而提高檢知效能。The sixth object of the present invention is to provide a detection method in which the third detection means can use the second image pickup device to capture a plurality of workers and transmit a plurality of third detection data to the processor. The adjustment means The processor can analyze whether the image sharpness of a plurality of third detection data is consistent to detect whether the actual height positions of a plurality of operating devices are the same, thereby improving detection efficiency.
本發明之目的七,提供一種作業機,包含機台、供料裝置、收料裝置、本發明作業裝置及中央控制裝置,供料裝置配置於機台,並設有至少一供料器,以供容納待作業之電子元件;收料裝置配置於機台,並設有至少一收料器,以供容納已作業之電子元件;本發明作業裝置配置於機台,並設有作業機構及檢知機構,作業機構設有承載具、第一取像器及至少一作業器,以供對電子元件執行預設作業,檢知機構設有第二取像器及處理器,以供檢知補償作業器之位移值;中央控制裝置用以控制及整合各裝置作動,以執行自動化作業 ,達到提升作業效能之實用效益。 The seventh object of the present invention is to provide a working machine, which includes a machine platform, a feeding device, a collecting device, an operating device of the present invention and a central control device. The feeding device is arranged on the machine platform and is provided with at least one feeder. It is used to accommodate the electronic components to be operated; the collecting device is arranged on the machine platform and is provided with at least one collecting device for accommodating the electronic components that have been operated; the operating device of the present invention is arranged on the machine platform and is provided with an operating mechanism and an inspection mechanism. The detection mechanism is provided with a carrier, a first image pickup device and at least one operator for performing preset operations on electronic components. The detection mechanism is provided with a second image pickup device and a processor for detection and compensation. The displacement value of the operator; the central control device is used to control and integrate the actions of each device to perform automated operations , to achieve practical benefits of improving operating efficiency.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable the review committee to have a further understanding of the present invention, a preferred embodiment is cited together with the drawings, and the details are as follows:
請參閱圖1至3,作業機包含機台10、供料裝置20、收料裝置30、作業裝置40及中央控制裝置(圖未示出);供料裝置20配置於機台10,並設有至少一供料器21,以供容納待作業之電子元件;收料裝置30配置於機台10,並設有至少一收料器31,以供容納已作業之電子元件;中央控制裝置用以控制及整合各裝置作動,以執行自動化作業。Please refer to Figures 1 to 3. The working machine includes a machine table 10, a
作業裝置40配置於機台10,包含作業機構及檢知機構,作業機構包含承載具、第一取像器及至少一作業器。The
承載具可作至少一方向位移,更進一步,承載具可為移動臂或移動台,作業機構設有驅動器以供驅動該承載具位移,驅動器可為線性馬達、壓缸或包含馬達及至少一傳動組;例如驅動器可帶動一為移動臂之承載具於機台10之上方空間作第一、二、三方向(如X-Y-Z方向)位移;例如驅動器可帶動一為移動台之承載具於機台10之頂面作第一方向位移;又驅動器可驅動單一或複數個承載具位移;因此,承載具為一可移動式之器件,不受限於本實施例。於本實施例,作業機構於機台10設置複數個驅動器,以分別驅動複數個承載具作至少一方向位移,以第一承載具411為例,第一承載具411為移動臂,並由第一驅動器412驅動作第一、二、三方向(如X-Y-Z方向)位移。The carrier can move in at least one direction. Furthermore, the carrier can be a moving arm or a moving platform. The operating mechanism is provided with a driver to drive the carrier to move. The driver can be a linear motor, a cylinder, or include a motor and at least one transmission. group; for example, the driver can drive a carrier that is a movable arm to move in the space above the
第一取像器42裝配於承載具,並由承載具帶動作至少一方向位移
,以供執行預設取像作業;然並非每一個承載具配置有第一取像器42,可視作業需求配置;於本實施例,作業機構於第一承載具411配置第一取像器42,第一取像器42為CCD,並由第一承載具411帶動作X-Y方向位移,以供取像供料裝置20之供料器21的待作業電子元件。
The first
依檢知作業需求,第一取像器42能夠由第一承載具411載送到至少一第一檢位,更進一步,第一檢位可為一基準件周側之水平面上的任意一個檢知位置,亦即可令第一承載具411帶動第一取像器42作水平位移一預設之檢知行程(例如1mm),並以第一取像器42所在之實際位置作為第一檢位;例如第一承載具411載送第一取像器42作X方向水平位移預設之1mm第一檢知行程,並以第一取像器42所在之實際位置作為X方向第一檢位;同樣地,第一承載具411載送第一取像器42作Y方向水平位移預設之1mm第二檢知行程,並以第一取像器42所在之實際位置作為Y方向第一檢位;因此,依檢知作業需求,第一承載具411可載送第一取像器42到一個或複數個之第一檢位。According to the inspection operation requirements, the
至少一作業器裝配於承載具,並由承載具帶動作至少一方向位移 ,以供對電子元件執行預設作業;更進一步,作業器能夠由承載具載送位移一預設間距值;作業器可為移料器、壓移器、載台或測試器等,以對電子元件執行取放料、壓接且取放料、承置或測試等預設作業。 At least one operating device is assembled on the carrier and is driven by the carrier to move in at least one direction. , to perform preset operations on electronic components; further, the operator can be carried by the carrier and displaced by a preset distance value; the operator can be a material transfer device, a pressure shifter, a carrier or a tester, etc., to perform Electronic components perform preset operations such as pick and place, crimping and pick and place, placement or testing.
於本實施例中,作業機構於第一承載具411設置複數個為吸嘴之第一作業器431A、431B…,並由第一驅動器412驅動作Z方向位移,而於供料裝置20之供料器21取出待作業之電子元件,並移載至第二作業器432,第二作業器432為一具容置槽之載台,以供複數個第一作業器431A、431B…移入複數個待作業之電子元件,並可作X方向位移載送至第三作業器433之下方,複數個為壓移器之第三作業器433可作Y-Z方向位移,於第二作業器432取出複數個待作業電子元件,並移入且壓接於第四作業器434,第四作業器434為測試器,並設有電性連接之電路板及測試座,以供對電子元件執行測試作業,於測試完畢,第三作業器433將已作業電子元件移入第五作業器435,第五作業器435為一具容置槽之載台,並可作X方向位移載出已作業之電子元件,第六作業器436為吸嘴,並可作X-Y-Z方向位移於第五作業器435取出已作業電子元件,並依作業結果,將已作業之電子元件移載至收料裝置30之收料器31而分類收置。In this embodiment, the operating mechanism is provided with a plurality of
檢知機構設置第二取像器44及處理器(圖未示出),第二取像器44位於第二檢位B,位於第二檢位B之第二取像器44及位於第一檢位之第一取像器42其中一者能夠朝向另一者取像,並將取像之第一檢知資料傳輸至處理器,以供分析第一取像器42與第二取像器44之第一偏差值,而可檢知承載具載送作業器位移之第一偏差值,並將第一偏差值補償調整於作業器之位移值,使作業器準確位移至預設作業位置。The detection mechanism is provided with a
於本實施例,檢知機構於機台10上且位於第一取像器42之移動區域設置一為CCD之第二取像器44,第二取像器44位於第一取像器42之下方,以第二取像器44之中心位置界定作為第一取像器42水平位移的起始基準位置,亦即第一取像器42以第二取像器44之中心位置朝X方向水平位移預設之1mm第一檢知行程,並以第一取像器42所在實際位置作為X方向之第一檢位A1,又可預設第一取像器42以第二取像器44之中心位置朝Y方向水平位移預設之1mm第二檢知行程,並以第一取像器42所在實際位置作為Y方向之第一檢位A2;然依作業需求,第一取像器42可朝向水平X方向之正、反向及水平Y方向之正、反向位移預設之檢知行程,使第一取像器42可位於不同位置之第一檢位,亦無不可。In this embodiment, the detection mechanism is provided with a second
承上述,檢知機構之第二取像器44能夠取像作業器,並將取像之第二檢知資料傳輸至處理器,以供分析位於實際位置之作業器中心與第二取像器中心之第二偏差值,並將第二偏差值補償調整於作業器之位移值,使作業器準確位移至預設作業位置,達到提高作業精準性之使用效益。Based on the above, the second
承上述,檢知機構設置高度變位器45,以供裝配第二取像器44而可調整所需之檢知高度,以利預設第二取像器44取像作業器之影像銳利度,例如可預設第二取像器44取像複數個第一作業器431A、431B…之影像銳利度相同為清楚或模糊;更進一步,高度變位器45可為線性馬達、壓缸或包含馬達及至少一傳動組;更佳者,高度變位器45可沿一軸線作旋轉角度,以調整第二取像器之取像角度;於本實施例,高度變位器45配置於機台10,並可連結驅動第二取像器44作第三方向(如Z方向)位移而調整檢知高度。Based on the above, the detection mechanism is provided with a
依作業需求,檢知機構設置水平變位器(圖未示出),以供裝配第二取像器44而可調整水平檢知位置。According to the operation requirements, the detection mechanism is equipped with a horizontal shifter (not shown) for assembling the second
請參閱圖1、4至8,一種檢知方法,包含第一作動手段、第一檢知手段及調校手段;更包含第一對位手段。Please refer to Figures 1, 4 to 8. A detection method includes a first actuation means, a first detection means and an adjustment means; it also includes a first alignment means.
於執行第一作動手段之前,第一對位手段係使第一取像器之中心對位第二取像器之中心;於本實施例,作業機構之第一驅動器412利用第一承載具411帶動第一取像器42及複數個第一作業器431A、431B…同步作X方向位移,令第一取像器42之中心對位第二取像器44之中心,使第一取像器42以此中心位置作為朝向水平X方向及Y方向位移之起始基準位置。Before executing the first operating means, the first alignment means aligns the center of the first image pickup device with the center of the second image pickup device; in this embodiment, the
第一作動手段以作業機構之承載具帶動第一取像器位移到至少一第一檢位;於本實施例,第一取像器42以第二取像器44之中心位置作為起始基準位置,第一驅動器412經由第一承載具411帶動第一取像器42朝向水平X方向位移預設之1mm第一檢知行程,而以第一取像器42所在之實際位置作為第一檢位A1。The first actuation means uses the carrier of the operating mechanism to drive the first image pickup device to at least a first detection position; in this embodiment, the first
然為確保第一承載具411帶動複數個第一作業器431A、431B…精確位移至預設作業位置,必須檢知複數個第一作業器431A、431B…之實際作業位置是否偏差。第一檢知手段以位於第一檢位之第一取像器42與檢知機構位於第二檢位之第二取像器44其中一者能夠朝向另一者取像,並將取像之第一檢知資料傳輸至處理器(圖未示出)。更進一步,位於第一檢位之第一取像器42與位於第二檢位之第二取像器44都在彼此的取像區域內,不論是第一取像器42朝向第二取像器44取像,或者是第二取像器44朝向第一取像器42取像,均可取得第一檢知資料。於本實施例,第一取像器42位於第一檢位A1,並朝向下方取像位於第二檢位B之第二取像器44,將取得水平X方向之第一檢知資料傳輸至處理器
;同樣地,當第一承載具411帶動第一取像器42朝向水平Y方向位移預設之1mm第二檢知行程,以第一取像器42所在之實際位置作為另一第一檢位A2,並朝向下方取像位於第二檢位B之第二取像器44,將取得水平Y方向之另一第一檢知資料傳輸至處理器。
However, in order to ensure that the
調校手段以處理器分析第一取像器與第二取像器之第一偏差值,並將第一偏差值補償調整於作業機構之作業器的位移值,使作業器準確位移至預設作業位置。依作業需求,可於處理器之資料庫(圖未示出)設置第一取像器位於預設第一檢位朝向位於第二檢位之第二取像器取像之第一基準資料,或者設置第二取像器位於預設第二檢位朝向位於第一檢位之第一取像器取像之第一基準資料,以供處理器將第一檢知資料與第一基準資料作一比對分析。於本實施例,處理器將第一取像器42之第一檢知資料與資料庫之第一基準資料作一比對分析,可檢知第一取像器42之中心與第二取像器44之中心的第一偏差值,由於第一取像器42與複數個第一作業器431A、431B…均由第一承載具411帶動同步位移,易言之,第一取像器42作水平X方向位移之第一偏差值,即為複數個第一作業器431A、431B…作水平X方向位移之第一偏差值,而可將第一偏差值補償調整於複數個第一作業器431A、431B…之X方向位移值,以此類推,可將第一取像器42作水平Y方向位移之第一偏差值補償調整於複數個第一作業器431A、431B…之Y方向位移值,使得複數個第一作業器431A、431B…精準位移至預設作業位置。The adjustment means uses the processor to analyze the first deviation value of the first image pickup device and the second image pickup device, and compensates and adjusts the first deviation value to the displacement value of the operating device of the operating mechanism, so that the operating device accurately moves to the preset Job location. According to the operation requirements, the first reference data captured by the first image pickup device at the preset first detection position facing the second image pickup device at the second detection position can be set in the database of the processor (not shown in the figure). Or set the second image pickup device at the preset second detection position to capture the first reference data toward the first image pickup device at the first detection position, so that the processor can compare the first detection data with the first reference data. A comparative analysis. In this embodiment, the processor performs a comparative analysis on the first detection data of the first
承上述,檢知方法更包含第二作動手段及第二檢知手段,第二作動手段以作業機構之承載具帶動至少一作業器位移一預設間距值,第二檢知手段以檢知機構之第二取像器能夠取像作業器,並將取像之第二檢知資料傳輸至處理器,調校手段以處理器分析作業器實際位置之第二偏差值,並將第二偏差值補償調整於作業器之位移值。Based on the above, the detection method further includes a second actuation means and a second detection means. The second actuation means uses the carrier of the operating mechanism to drive at least one operator to displace a preset distance value. The second detection means uses the detection mechanism to The second image capturer can capture the image of the operator and transmit the captured second detection data to the processor. The adjustment means uses the processor to analyze the second deviation value of the actual position of the operator and calculate the second deviation value. The compensation is adjusted to the displacement value of the operator.
於本實施例,由於第一對位手段可令第一取像器42之中心對位第二取像器44之中心,而作為X方向位移之起始基準位置;第二作動手段以第一承載具411帶動第一取像器42及複數個第一作業器431A、431B…同步作X方向位移一預設間距值;由於第一作業器431A位於第二取像器42之上方,第二檢知手段以第二取像器44朝向上方取像位於實際位置之第一作業器431A,並將取像之第二檢知資料傳輸至處理器;然處理器之資料庫可設置複數個第一作業器431A
、431B…之第二基準資料,調校手段係為處理器將第二檢知資料與第二基準資料作一比對分析,以取得位於實際位置之第一作業器431A中心與預設位置之第一作業器431A中心的第二偏差值,並將第二偏差值補償調整於第一作業器431A之位移值,以此類推,使得複數個第一作業器431A、431B…精準位移至預設作業位置。
In this embodiment, since the first alignment means can align the center of the
一種檢知方法,包含架置手段、第三作動手段、第三檢知手段及調校手段。A detection method includes a mounting means, a third action means, a third detection means and an adjustment means.
架置手段係為檢知機構以高度變位器驅動第二取像器位移調整架置於所需之檢知高度;於本實施例,檢知機構以高度變位器45驅動第二取像器44作Z方向位移,而可調整第二取像器44至所需之檢知高度,使第二取像器44以同一取像位置條件加以取像複數個第一作業器431A、431B…,更加可依作業需求,而預設第二取像器44取像複數個第一作業器431A、431B…之基準影像銳利度為清楚或模糊或影像畫素值等比對條件,而利於擴增比對條件,以提高檢知效能。The mounting means is that the detection mechanism uses a height shifter to drive the second image pickup device to adjust the displacement to the required detection height; in this embodiment, the detection mechanism uses a
第三作動手段係為第二取像器44及作業機構之作業器其中一者能夠朝向另一者位移;例如作業器可朝向第二取像器44作水平位移,且位於第二取像器44之上方,或者第二取像器44朝向作業器作水平位移,且位於作業器之下方,均可使作業器相對於第二取像器44;於本實施例,第一承載具411帶動複數個第一作業器431A、431B…朝向第二取像器44作水平位移,令複數個第一作業器431A、431B…依序逐一通過第二取像器44的上方。The third actuation means is that one of the second
第三檢知手段係為檢知機構之第二取像器能夠取像作業器,並將取像之第三檢知資料傳輸至檢知機構之處理器;於本實施例,由於複數個第一作業器431A、431B…位於第二取像器44之上方,第二取像器44可對通過上方之複數個第一作業器431A、431B…作逐一取像,或者一次取像複數個第一作業器431A、431B…,均可取得第三檢知資料,並將第三檢知資料傳輸至檢知機構之處理器。The third detection means is that the second image pickup device of the detection mechanism can capture the image of the operating device and transmit the captured third detection data to the processor of the detection mechanism; in this embodiment, due to the plurality of third detection means, A working
調校手段係為處理器分析作業器之實際高度位置是否異常;更進一步,處理器之資料庫包含作業器之基準高度影像資料,處理器可比對第三檢知資料與基準高度影像資料的影像銳利度是否符合。The adjustment method is for the processor to analyze whether the actual height position of the operator is abnormal; further, the processor's database contains the reference height image data of the operator, and the processor can compare the images of the third detection data and the reference height image data Whether the sharpness is consistent.
依作業需求,第三作動手段亦可以第二取像器及複數個作業器其中一者能夠朝向另一者位移;第三檢知手段以檢知機構之第二取像器能夠取像複數個作業器,並將取像之複數個第三檢知資料傳輸至處理器;調校手段以處理器分析複數個第三檢知資料是否相同,以檢知複數個作業器之實際高度位置是否等高,亦無不可。Depending on the operation requirements, the third actuation means can also be a second image pickup device and one of the plurality of operating devices can be displaced toward the other; the third detection means can be a second image pickup device of the detection mechanism that can capture a plurality of images. The operator, and transmits the plurality of third detection data captured to the processor; the adjustment method uses the processor to analyze whether the plurality of third detection data are the same, so as to detect whether the actual height positions of the plurality of operators are equal. It's okay to be high.
於本實施例,調校手段以處理器接收第二取像器44所傳輸之複數個第一作業器431A、431B…的複數個第三檢知資料,而可直接將複數個第三檢知資料作一比對分析影像銳利度是否相同,例如複數個第三檢知資料均相同為清楚影像,可檢知複數個第一作業器431A、431B…的實際高度位置為等高,反之,若其中一個第三檢知資料為模糊,則可檢知此一第一作業器431B的實際高度位置相異於其他複數個第一作業器431A…,而必須排除異常,進而提高檢知效能。In this embodiment, the calibration means uses the processor to receive the plurality of third detection data of the plurality of
機台10
供料裝置20
供料器21
收料裝置30
收料器31
作業裝置40
第一承載具411
第一驅動器412
第一取像器42
第一作業器431A、431B
第二作業器432
第三作業器433
第四作業器434
第五作業器435
第六作業器436
第二取像器44
高度變位器45
第一檢位A1、A2
第二檢位B
圖1:本發明作業裝置應用於作業機之示意圖。 圖2:本發明作業機構及檢知機構之配置圖。 圖3:本發明檢知機構之局部示意圖。 圖4至圖8:本發明檢知方法之使用示意圖。 Figure 1: Schematic diagram of the working device of the present invention applied to a working machine. Figure 2: Configuration diagram of the operating mechanism and detection mechanism of the present invention. Figure 3: A partial schematic diagram of the detection mechanism of the present invention. Figure 4 to Figure 8: Schematic diagram of the use of the detection method of the present invention.
第一承載具411
第一取像器42
第一作業器431A、431B
第二取像器44
第一檢位A1
第二檢位B
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