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TWI808706B - Manufacturing method of circuit board structure and circuit board structure manufactured thereof - Google Patents

Manufacturing method of circuit board structure and circuit board structure manufactured thereof Download PDF

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TWI808706B
TWI808706B TW111112686A TW111112686A TWI808706B TW I808706 B TWI808706 B TW I808706B TW 111112686 A TW111112686 A TW 111112686A TW 111112686 A TW111112686 A TW 111112686A TW I808706 B TWI808706 B TW I808706B
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layer
copper
clad
metal
circuit board
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TW111112686A
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TW202341832A (en
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許議文
許日能
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嘉聯益科技股份有限公司
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Abstract

A manufacturing method of circuit board structure comprises: providing a substrate which comprising a substrate layer and two copper layers, wherein two copper layers are formed on opposite sides of the substrate layer; forming two metallic conductor layers separately covering the two copper layers by electroplating; drilling the metallic conductor layer on a first surface side to form holes until the copper layer on a second surface side of the substrate layer exposed; forming a metallization layer by chemical means, wherein the metallization layer covers the surface of the hole and the surface of the two metallic conductor layers; forming a copper-clad layer by electroplating, wherein the copper-clad layer covers the holes, the metallic conductor layer on the first surface side and the second surface side; removing part of the copper-clad layer that exceeds over the copper layer by chemical etching; and removing the two metallic conductor layers by chemical etching.

Description

電路板結構的製作方法及所製成的電路板結構Manufacturing method of circuit board structure and manufactured circuit board structure

一種電路板結構的製作方法,以及所製成電路板結構。 A method for manufacturing a circuit board structure, and the manufactured circuit board structure.

常見的電路板選擇性電鍍作法在遮蔽層材料選用上多為光阻材質,因遮蔽層採用光阻材料,光阻特性通常不是耐酸,就是耐鹼,無法同時耐酸或耐鹼,而在主流金屬化系統中同時存在酸性與鹼性的藥水,故流程上必須先做完金屬化才能去覆蓋光阻材料。流程在鑽孔、清孔後進行金屬化,再搭配使用光阻遮蔽、利用曝光、顯影將已完成金屬化的孔露出,再進行電鍍,因鑽孔製程與曝光製程均存在製程公差的問題,故在光阻開孔製程上必須依照鑽孔的位置進行開孔,須採用具有自動對位的設備(CCD曝光機或數位直接描繪曝光機),且因公差累進問題在開孔尺寸上必須將開孔放大,於電鍍後在洞口的周圍形成凸出部。在線路製作時,為了有效覆蓋凸出部,光阻選擇厚度無法薄化,導致解析度及蝕刻成型受到了限制,影響了電路板線路結構的細線路製作。 The common selective electroplating method for circuit boards mostly uses photoresist material for the masking layer material. Because the masking layer is made of photoresist material, the photoresist property is usually either acid resistance or alkali resistance, and it cannot be resistant to acid or alkali at the same time. In the mainstream metallization system, there are both acidic and alkaline solutions. Therefore, the metallization must be done before the photoresist material can be covered in the process. The process is to carry out metallization after drilling and clearing the holes, and then use photoresist masking, exposure and development to expose the metallized holes, and then electroplating. Because the drilling process and the exposure process have process tolerance problems, the photoresist hole opening process must be opened according to the position of the drilled hole, and equipment with automatic alignment (CCD exposure machine or digital direct drawing exposure machine) must be used. Due to the problem of progressive tolerance, the opening size must be enlarged. A protrusion is formed around the hole. In circuit fabrication, in order to effectively cover the protrusions, the thickness of the photoresist cannot be thinned, resulting in limitations in resolution and etching molding, which affects the fabrication of thin circuits in the circuit structure of the circuit board.

現行雖有新的金屬化系統,整體金屬化流程為中性或者弱酸性的系統,相對可以相容光阻可操作的條件,而帶著光阻進行金屬化的做法,會使光阻表面具有導電性,在電鍍過程中除了電路板本身的孔上鍍之 外,光阻上也會上鍍,故為了能順利移除光阻,須將光阻上上鍍材質移除,因光阻本身非導電材質,是透過金屬化後使光阻具有導電的特性,但畢竟非金屬材質,導電上均勻不如金屬導電性,容易形成在光阻上電鍍銅覆蓋不均勻的問題,而影響後續移除光阻上鍍層的難度,再者在基材銅上所增加的凸塊會因光阻厚度而形成在移除上的難度,且光阻材質僅能受限使用中性或弱酸性之金屬化系統,在使用性上受限。 Although there is a new metallization system, the overall metallization process is a neutral or weakly acidic system, which is relatively compatible with the operating conditions of the photoresist, and the metallization method with the photoresist will make the surface of the photoresist conductive. In addition, the photoresist will also be plated, so in order to remove the photoresist smoothly, it is necessary to remove the plating material on the photoresist. Because the photoresist itself is non-conductive, the photoresist is conductive after metallization, but after all, the non-metallic material is not as uniform as metal, and it is easy to cause uneven copper plating on the photoresist. The use of neutral or weakly acidic metallization systems is limited in applicability.

有鑑於此,本案於一實施例提供一種電路板結構的製作方法,包括提供基板,基板包括基材層及二銅層,各銅層形成於基材層相對之第一表面及第二表面;透過電鍍形成二覆金屬導體層,二覆金屬導體層分別覆蓋於二銅層之表面。自位於第一表面側的覆金屬導體層之表面進行鑽孔,形成孔洞,孔洞導通至露出位於基材層之第二表面之銅層;透過化學方式形成金屬化層,金屬化層覆蓋於孔洞之表面及二覆金屬導體層之表面;透過電鍍形成覆銅層,覆銅層覆蓋於孔洞之表面並延伸至位於第一表面側的覆金屬導體層之表面,及覆蓋第二表面之一側的覆金屬導體層之表面。透過化學咬蝕去除部分超過銅層之高度的覆銅層。透過化學咬蝕去除二覆金屬導體層。 In view of this, the present case provides a manufacturing method of a circuit board structure in one embodiment, including providing a substrate, the substrate includes a base material layer and two copper layers, each copper layer is formed on the first surface and the second surface opposite to the base material layer; two metal-clad conductor layers are formed by electroplating, and the two metal-clad conductor layers cover the surfaces of the two copper layers respectively. Drilling holes from the surface of the metal-clad conductor layer on the first surface side to form holes, the holes are connected to expose the copper layer on the second surface of the base layer; forming a metallization layer by chemical means, the metallization layer covers the surface of the hole and the surface of the second metal-clad conductor layer; forming a copper-clad layer by electroplating, the copper-clad layer covers the surface of the hole and extends to the surface of the metal-clad conductor layer on the first surface side, and covers the surface of the metal-clad conductor layer on one side of the second surface. The portion of the copper clad layer that exceeds the height of the copper layer is removed by chemical etching. The overlying metallic conductor layer is removed by chemical etching.

在一些實施例中,覆金屬導體層係為鉻、鎳、鋁、鈦、錫、白金、金或銀。 In some embodiments, the metal-clad conductor layer is chromium, nickel, aluminum, titanium, tin, platinum, gold or silver.

在一些實施例中,透過至少一孔洞的覆銅層連結二銅層。 In some embodiments, two copper layers are connected through the copper clad layer through at least one hole.

在一些實施例中,在鑽孔過程中,至少一孔洞導通至第二表面之一側的覆金屬導體層。 In some embodiments, during the drilling process, at least one hole is connected to the metal-clad conductor layer on one side of the second surface.

在一些實施例中,在透過化學咬蝕去除部分超過銅層之高度的覆銅層的過程中,透過化學咬蝕使覆銅層與銅層的高度大致切齊。 In some embodiments, during the process of removing part of the copper clad layer exceeding the height of the copper layer by chemical etching, the height of the copper clad layer and the copper layer are substantially aligned by chemical etching.

在一些實施例中,至少一孔洞係利用雷射鑽孔、機械鑽孔或沖孔方式形成。 In some embodiments, at least one hole is formed by laser drilling, mechanical drilling or punching.

在一些實施例中,二覆金屬導體層材質為可耐酸鹼之金屬材料,厚度為0.1至20μm。 In some embodiments, the material of the second metal-clad conductor layer is a metal material resistant to acid and alkali, and the thickness is 0.1 to 20 μm.

在一些實施例中,在完成透過化學咬蝕去除二覆金屬導體層後;覆蓋二光阻層於二銅層之表面,並透過曝光及顯影,使二光阻層形成線路圖案結構;進行蝕刻製程以去除未被各光阻層所覆蓋之各銅層之表面;以及去除二光阻層。 In some embodiments, after removing the two metal-clad conductor layers through chemical etching; covering the two photoresist layers on the surface of the two copper layers, and through exposure and development, the two photoresist layers form a circuit pattern structure; performing an etching process to remove the surface of each copper layer not covered by each photoresist layer; and removing the two photoresist layers.

另外,依據一實施例中提供一種電路板結構,係由如上述各實施例之製造方法所製成的電路板結構。 In addition, according to an embodiment, a circuit board structure is provided, which is a circuit board structure manufactured by the manufacturing methods of the above-mentioned embodiments.

綜上所述,藉由在基板鍍上覆金屬導體層,由於材質為耐酸鹼之金屬導電體,且覆金屬導體層不受限於中性或弱酸性之金屬化系統,亦可以選用現行主流之金屬化系統,提高了電路板結構製作的效率及增加了製作方法的多元性,覆金屬導體層採用化學沉積或電鍍方式覆蓋於兩銅層上為現有容易取得的作法,且厚度上不會受限於光阻本身製作厚度的限制,因本身材質導電,在電鍍過程中的行為將從傳統圖形電鍍轉變為整板電鍍之特性,使得整體電鍍均勻性比圖形電鍍更容易控制,在後續移除覆金屬導體層上的電鍍層時,不會因過大的厚度差異導致移除不易的現象。 To sum up, by plating the metal conductor layer on the substrate, since the material is an acid and alkali resistant metal conductor, and the metal conductor layer is not limited to neutral or weak acid metallization systems, the current mainstream metallization system can also be used, which improves the efficiency of circuit board structure manufacturing and increases the diversity of manufacturing methods. The metal-clad conductor layer is covered by chemical deposition or electroplating on the two copper layers. The characteristics of changing from traditional pattern plating to full plate plating make the overall plating uniformity easier to control than pattern plating. When removing the plating layer on the metal conductor layer later, it will not be difficult to remove due to excessive thickness differences.

100:電路板結構 100: Circuit board structure

10:基板 10: Substrate

11:基材層 11: Substrate layer

111:第一表面 111: first surface

112:第二表面 112: second surface

12a、12b:銅層 12a, 12b: copper layer

13a、13b:覆金屬導體層 13a, 13b: metal clad conductor layer

14:金屬化層 14: Metallization layer

15:覆銅層 15: Copper clad layer

16:光阻層 16: Photoresist layer

161:線路圖案結構 161: Line pattern structure

20:孔洞 20: hole

21:孔壁 21: hole wall

22:孔底 22: Hole bottom

30:孔洞 30: hole

31:孔壁 31: hole wall

S10-S19:步驟 S10-S19: Steps

[圖1]為根據一第一實施例的電路板結構製作方法之結構示意圖(一)。 [FIG. 1] is a structural schematic diagram (1) of a method for fabricating a circuit board structure according to a first embodiment.

[圖2]為根據一第一實施例的電路板結構製作方法之結構示意圖(二)。 [ Fig. 2 ] is a structural schematic diagram (2) of a method for manufacturing a circuit board structure according to a first embodiment.

[圖3]為根據一第一實施例的電路板結構製作方法之結構示意圖(三)。 [ FIG. 3 ] is a structural schematic diagram (3) of a method for fabricating a circuit board structure according to a first embodiment.

[圖4]為根據一第一實施例的電路板結構製作方法之結構示意圖(四)。 [ FIG. 4 ] is a structural schematic view (four) of a method for fabricating a circuit board structure according to a first embodiment.

[圖5]為根據一第一實施例的電路板結構製作方法之結構示意圖(五)。 [ FIG. 5 ] is a structural schematic diagram (5) of a method for fabricating a circuit board structure according to a first embodiment.

[圖6a]為根據一第一實施例的電路板結構製作方法之結構示意圖(六)。 [FIG. 6a] is a structural schematic diagram (6) of a method for fabricating a circuit board structure according to a first embodiment.

[圖6b]為根據一第一實施例另一態樣的電路板結構製作方法之覆銅層結構示意圖(一)。 [ FIG. 6 b ] is a schematic diagram (1) of the structure of the copper clad layer according to another form of the circuit board structure manufacturing method of the first embodiment.

[圖7]為根據一第一實施例的電路板結構製作方法之結構示意圖(七)。 [ FIG. 7 ] is a structural schematic diagram (7) of a method for fabricating a circuit board structure according to a first embodiment.

[圖7a]為根據一第一實施例的電路板結構製作方法之結構示意圖(八)。 [FIG. 7a] is a structural schematic view (eight) of a method for fabricating a circuit board structure according to a first embodiment.

[圖7b]為根據一第一實施例的電路板結構製作方法之結構示意圖(九)。 [FIG. 7b] is a structural schematic diagram (9) of a method for fabricating a circuit board structure according to a first embodiment.

[圖7c]為根據一第一實施例另一態樣的電路板結構製作方法之覆銅層結構示意圖(二)。 [FIG. 7c] is a schematic diagram (2) of the structure of the copper clad layer according to another form of the circuit board structure manufacturing method of the first embodiment.

[圖8]為根據一第二實施例的電路板結構製作方法之結構示意圖(一)。 [ FIG. 8 ] is a structural schematic view (1) of a method for fabricating a circuit board structure according to a second embodiment.

[圖9]為根據一第二實施例的電路板結構製作方法之結構示意圖(二)。 [ Fig. 9 ] is a structural schematic diagram (2) of a method for manufacturing a circuit board structure according to a second embodiment.

[圖10]為根據一第二實施例的電路板結構製作方法之結構示意圖(三)。 [ Fig. 10 ] is a structural schematic diagram (3) of a circuit board structure manufacturing method according to a second embodiment.

[圖11]為根據一第一實施例的電路板結構製作方法之流程圖(一)。 [ FIG. 11 ] is a flow chart (1) of a method for manufacturing a circuit board structure according to a first embodiment.

[圖12]為根據一第一實施例的電路板結構製作方法之流程圖(二)。 [ FIG. 12 ] is a flow chart (2) of a circuit board structure manufacturing method according to a first embodiment.

請先參閱圖1至圖6a、圖7及圖11,圖1至圖6a為根據一第一實施例的電路板結構製作方法之結構示意圖(一)至(六),圖7為根據一第一實施例的電路板結構製作方法之結構示意圖(七),圖11為根據一第一實施例的具導通孔之電路板結構製作方法之流程圖(一)。如圖1及圖11所示,本實施例之電路板結構100的製造方法包括提供基板10(步驟S10),基板10包括基材層11及二銅層12a、12b。基材層11具有相對之第一表面111及第二表面112,二銅層12a、12b分別形成於基材層11之第一表面111及第二表面112。為方便後續說明,位於第一表面111側的銅層以銅層12a示意,位於第二表面112側的銅層以銅層12b示意。也就是說,可以利用基材層11的第一表面111及第二表面112同時製作相同或不同規格的電路板結構100,或是僅利用單一側表面來製作電路板結構100。在第一實施例中,以單一側表面製作電路板結構100作為示例,但不以此為限。 Please refer to Fig. 1 to Fig. 6a, Fig. 7 and Fig. 11 first, Fig. 1 to Fig. 6a are the schematic structural diagrams (1) to (6) of the circuit board structure manufacturing method according to a first embodiment, Fig. 7 is the structural schematic diagram (7) of the circuit board structure manufacturing method according to a first embodiment, Fig. 11 is the flow chart (1) of the circuit board structure manufacturing method according to a first embodiment. As shown in FIG. 1 and FIG. 11 , the manufacturing method of the circuit board structure 100 of this embodiment includes providing a substrate 10 (step S10 ), and the substrate 10 includes a base material layer 11 and two copper layers 12a, 12b. The substrate layer 11 has a first surface 111 and a second surface 112 opposite to each other, and two copper layers 12a and 12b are respectively formed on the first surface 111 and the second surface 112 of the substrate layer 11 . For the convenience of subsequent description, the copper layer on the side of the first surface 111 is shown as a copper layer 12a, and the copper layer on the side of the second surface 112 is shown as a copper layer 12b. That is to say, the first surface 111 and the second surface 112 of the substrate layer 11 can be used to fabricate the circuit board structure 100 with the same or different specifications at the same time, or only a single side surface can be used to fabricate the circuit board structure 100 . In the first embodiment, the circuit board structure 100 is fabricated on a single side surface as an example, but not limited thereto.

如圖2及圖11所示,透過化鍍、濺鍍或電鍍形成二覆金屬導 體層13a、13b,二覆金屬導體層13a、13b分別覆蓋於二銅層12a、12b之表面(步驟S11)。為方便後續說明,將位於第一表面111側的覆金屬導體層以覆金屬導體層13a示意,位於第二表面112側的覆金屬導體層以覆金屬導體層13b示意。在第一實施例中,各覆金屬導體層13a、13b的材質為可耐酸鹼之金屬材料,厚度為0.1至20μm,由於各覆金屬導體層13a、13b的厚度較薄,後續在剝除作業上能夠較有效率且方便地剝除。在第一實施例中,可耐酸鹼之金屬材料例如為鎳,但不限於此,亦可以為鉻、鋁、鈦、錫、白金、金或銀。 As shown in Figure 2 and Figure 11, a double-clad metal conductor is formed by electroless plating, sputtering or electroplating. The bulk layers 13a, 13b and the two metal-clad conductor layers 13a, 13b respectively cover the surfaces of the two copper layers 12a, 12b (step S11). For the convenience of subsequent description, the metal-clad conductor layer on the side of the first surface 111 is represented by the metal-clad conductor layer 13a, and the metal-clad conductor layer on the side of the second surface 112 is represented by the metal-clad conductor layer 13b. In the first embodiment, the material of each metal-clad conductor layer 13a, 13b is a metal material that can withstand acid and alkali, and the thickness is 0.1 to 20 μm. Since the thickness of each metal-clad conductor layer 13a, 13b is relatively thin, it can be stripped more efficiently and conveniently in the subsequent stripping operation. In the first embodiment, the acid and alkali resistant metal material is nickel, but not limited thereto, and may also be chromium, aluminum, titanium, tin, platinum, gold or silver.

如圖3及圖11所示,自位於第一表面111之一側的覆金屬導體層13a之表面進行鑽孔(步驟S12),形成孔洞20,孔洞20導通至露出位於基材層11之第二表面112之銅層12b。在第一實施例中,藉由雷射鑽孔的方式形成孔洞20,但不以此為限,亦可以藉由機械鑽孔或沖孔方式形成孔洞20。在此孔洞20以兩個為示例,但不以此為限。孔洞20從第一表面111之一側的覆金屬導體層13a至第二表面112之一側的銅層12b,依序經過覆金屬導體層13a、銅層12a及基材層11並形成孔洞20。孔洞20包括孔壁21及孔底22,孔壁21包括鑽孔而外露之覆金屬導體層13a、銅層12a及基材層11的側表面。孔底22包括與第二表面112接合之銅層12b的表面。 As shown in FIG. 3 and FIG. 11 , the surface of the metal-clad conductor layer 13a located on one side of the first surface 111 is drilled (step S12) to form a hole 20, and the hole 20 is connected to expose the copper layer 12b located on the second surface 112 of the base material layer 11. In the first embodiment, the holes 20 are formed by laser drilling, but not limited thereto, and the holes 20 may also be formed by mechanical drilling or punching. Here, two holes 20 are used as an example, but not limited thereto. The hole 20 passes through the metal-clad conductor layer 13a, the copper layer 12a and the substrate layer 11 sequentially from the metal-clad conductor layer 13a on one side of the first surface 111 to the copper layer 12b on one side of the second surface 112 to form a hole 20 . The hole 20 includes a hole wall 21 and a hole bottom 22 , and the hole wall 21 includes the side surfaces of the metal-clad conductor layer 13 a , the copper layer 12 a and the substrate layer 11 that are drilled and exposed. The hole bottom 22 includes a surface of the copper layer 12 b bonded to the second surface 112 .

如圖4及圖11所示,透過化學方式形成金屬化層14(步驟S13),金屬化層14覆蓋於孔洞20之表面及二覆金屬導體層13a、13b之表面。在第一實施例中,覆金屬導體層13a、13b不受限於中性或弱酸性之金屬化系統,亦可以選用鹼性之金屬化系統。此外,覆金屬導體層在金屬化過程能夠平均吸附金屬化層14。在第一實施例中,透過弱鹼性、中性或弱 酸性之金屬化系統形成並覆蓋孔洞20之表面及二覆金屬導體層13a、13b之表面。也就是說金屬化層14覆蓋了第一表面111之一側的覆金屬導體層13a之表面及第二表面112之一側的覆金屬導體層13b之表面。此外,金屬化層14之覆蓋範圍不包括銅材之部份,例如因鑽孔外露之銅層12a的側表面及因鑽孔外露之銅層12b的表面。 As shown in FIG. 4 and FIG. 11 , the metallization layer 14 is chemically formed (step S13 ), and the metallization layer 14 covers the surface of the hole 20 and the surfaces of the two metal-clad conductor layers 13 a and 13 b. In the first embodiment, the metal-clad conductor layers 13a, 13b are not limited to neutral or weakly acidic metallization systems, and alkaline metallization systems can also be selected. In addition, the metal-clad conductor layer can evenly absorb the metallization layer 14 during the metallization process. In the first embodiment, through weak alkaline, neutral or weak An acidic metallization system is formed and covers the surface of the hole 20 and the surfaces of the two metal-clad conductor layers 13a, 13b. That is to say, the metallization layer 14 covers the surface of the metal-clad conductor layer 13 a on one side of the first surface 111 and the surface of the metal-clad conductor layer 13 b on one side of the second surface 112 . In addition, the coverage of the metallization layer 14 does not include parts of the copper material, such as the side surface of the copper layer 12a exposed by the drill holes and the surface of the copper layer 12b exposed by the drill holes.

如圖5及圖11所示,形成金屬化層14後,透過電鍍形成覆銅層15(步驟S14),覆銅層15覆蓋孔洞20之表面並延伸至位於第一表面111之一側的覆金屬導體層13a之表面,及覆蓋第二表面112之一側的覆金屬導體層13b之表面。在第一實施例中,透過電鍍方式形成並覆蓋孔洞20之表面,即因鑽孔而外露之覆金屬導體層13a、銅層12a及基材層11的側表面。在第一實施例中,透過形成於孔洞20的覆銅層15,將第一表面111側的銅層12a及第二表面112側的銅層12b連接。 As shown in FIGS. 5 and 11 , after the metallization layer 14 is formed, a copper-clad layer 15 is formed by electroplating (step S14). The copper-clad layer 15 covers the surface of the hole 20 and extends to the surface of the metal-clad conductor layer 13a on one side of the first surface 111, and the surface of the metal-clad conductor layer 13b on one side of the second surface 112. In the first embodiment, the surface of the hole 20 is formed and covered by electroplating, that is, the side surfaces of the metal-clad conductor layer 13a, the copper layer 12a and the base material layer 11 exposed due to drilling. In the first embodiment, the copper layer 12 a on the first surface 111 side and the copper layer 12 b on the second surface 112 side are connected through the copper clad layer 15 formed in the hole 20 .

如圖6a、圖6b及圖11所示,完成電鍍後,透過化學咬蝕去除部分超過位於第一表面111之一側的銅層12a之高度的覆銅層15及第二表面112之一側的覆銅層15(步驟S15)。在第一實施例中,咬蝕去除的覆銅層15,可以如圖6a所示,為了方便後續線路製作,將超過位於第一表面111之一側的銅層12a之高度的覆銅層15及第二表面112之一側的覆銅層15去除,且使第一表面111之一側的覆銅層15與銅層12a之高度大致切齊。此外,覆銅層15與銅層12a之高度可以具有些微公差,例如,覆銅層15的高度略高於銅層12a或略低於銅層12a之高度。又或者,咬蝕去除的覆銅層15可以是如圖6b所示,圖6b為根據一第一實施例另一態樣的電路板結構製作方法之覆銅層結構示意圖(一)。如圖6b所示,在另一實施態樣 中,為了後續線路的製作,透過化學咬蝕去除部分超過位於第一表面111之一側的銅層12a之高度的覆銅層15至與覆金屬導體層13a切齊。此種方式適用於在覆金屬導體層13a的厚度較薄(例如5μm或更薄)的情況下,此時亦可以僅去除延伸至位於第一表面111之一側的覆金屬導體層13a之表面的覆銅層15,而形成如圖6b所示,覆銅層15的高度會略高於銅層12a。而當覆金屬導體層13a移除後,雖會有略微凸出於銅層12a之覆銅層15,但因其厚度很薄,尚不會對後續線路製程產生影響。 As shown in Figures 6a, 6b and 11, after the electroplating is completed, the copper clad layer 15 that exceeds the height of the copper layer 12a on one side of the first surface 111 and the copper clad layer 15 on one side of the second surface 112 are removed by chemical etching (step S15). In the first embodiment, the copper clad layer 15 removed by bite etching can be removed as shown in FIG. 6a. In order to facilitate subsequent circuit fabrication, the copper clad layer 15 exceeding the height of the copper layer 12a on one side of the first surface 111 and the copper clad layer 15 on one side of the second surface 112 are removed, and the height of the copper clad layer 15 on one side of the first surface 111 is roughly aligned with the height of the copper layer 12a. In addition, the heights of the copper clad layer 15 and the copper layer 12a may have a slight tolerance, for example, the height of the copper clad layer 15 is slightly higher than that of the copper layer 12a or slightly lower than that of the copper layer 12a. Alternatively, the copper clad layer 15 removed by etching may be as shown in FIG. 6 b , which is a schematic diagram (1) of the structure of the copper clad layer according to another aspect of the circuit board structure manufacturing method of the first embodiment. As shown in Figure 6b, in another implementation Among them, for subsequent circuit fabrication, the part of the copper clad layer 15 exceeding the height of the copper layer 12a on one side of the first surface 111 is removed by chemical etching until it is aligned with the metal clad conductor layer 13a. This method is applicable when the thickness of the metal-clad conductor layer 13a is relatively thin (for example, 5 μm or less), at this time, only the copper-clad layer 15 extending to the surface of the metal-clad conductor layer 13a located on one side of the first surface 111 can be removed to form the copper-clad layer 15 slightly higher than the copper layer 12a as shown in FIG. 6b. After the metal-clad conductor layer 13a is removed, although the copper-clad layer 15 slightly protrudes from the copper layer 12a, it will not affect the subsequent circuit process because of its thin thickness.

繼續以圖6a之步驟續行說明,如圖7及圖12所示,完成化學咬蝕後,去除二覆金屬導體層13a、13b(步驟S16),便完成電路板結構100。 Continuing with the steps in FIG. 6a, as shown in FIG. 7 and FIG. 12, after the chemical etching is completed, the two metal-clad conductor layers 13a, 13b are removed (step S16), and the circuit board structure 100 is completed.

具體來說,藉由二覆金屬導體層13a、13b將金屬化及電鍍範圍增大,當在電鍍的過程時,覆銅層15延伸至覆金屬導體層13a之表面,接著一併去除超過覆金屬導體層13a之高度範圍的覆銅層15以及去除二覆金屬導體層13a、13b,使得覆銅層15與銅層12a高度大致一致,避免了電鍍孔洞20時,電鍍層溢出孔洞20,在孔洞20周圍形成凸出部,而影響了電路板結構100的製作。此外,由於覆金屬導體層13a、13b具導電性,在金屬化過程能夠平均吸附金屬化層14,解決了傳統製程中使用光阻較難平均吸附金屬化層14的問題。此外,光阻因為不具有抗鹼效果,僅能透過中性或弱酸性之金屬化系統進行金屬化,而覆金屬導體層13a、13b則不受限於中性或弱酸性之金屬化系統,亦可以選用鹼性之金屬化系統,提高了電路板結構100製作的效率及增加了製作方法的多元性。覆金屬導體層13a、13b透過化學沉積或電鍍方式覆蓋於二銅層12a、12b上的作法,厚度上不 會受限於光阻本身製作厚度的限制,因覆金屬導體層13a、13b的材質導電,在電鍍過程中的行為將從傳統圖形電鍍轉變為整板電鍍之特性,使得整體電鍍均勻性比圖形電鍍更容易控制,在後續移除覆金屬導體層13a、13b上的電鍍層時,不會因過大的厚度差異導致移除不易的現象。 Specifically, the range of metallization and electroplating is increased by the two metal-clad conductor layers 13a, 13b. During the electroplating process, the copper-clad layer 15 extends to the surface of the metal-clad conductor layer 13a, and then the copper-clad layer 15 exceeding the height range of the metal-clad conductor layer 13a and the two metal-clad conductor layers 13a, 13b are removed together, so that the height of the copper-clad layer 15 is approximately the same as that of the copper layer 12a, and the electroplating layer overflows the hole 20 during the electroplating process. Protrusions are formed around the hole 20 , which affects the fabrication of the circuit board structure 100 . In addition, since the metal-clad conductor layers 13a and 13b are conductive, the metallization layer 14 can be evenly adsorbed during the metallization process, which solves the problem that it is difficult to evenly adsorb the metallization layer 14 when using photoresist in the traditional manufacturing process. In addition, since the photoresist has no anti-alkali effect, it can only be metallized through a neutral or weakly acidic metallization system, while the metal-clad conductor layers 13a, 13b are not limited to neutral or weakly acidic metallization systems, and can also use alkaline metallization systems, which improves the production efficiency of the circuit board structure 100 and increases the diversity of production methods. The metal-clad conductor layers 13a, 13b are covered on the two copper layers 12a, 12b through chemical deposition or electroplating, and the thickness is different. It will be limited by the thickness of the photoresist itself. Since the material of the metal-clad conductor layers 13a and 13b is conductive, the behavior during the electroplating process will change from the traditional pattern plating to the characteristics of the whole board plating, making the overall plating uniformity easier to control than pattern plating. When removing the electroplating layers on the metal-clad conductor layers 13a and 13b later, it will not be difficult to remove due to excessive thickness differences.

在第一實施例中,可透過完成之電路板結構,繼續製作後續各線路的圖案。圖7a為根據一第一實施例的電路板結構製作方法之結構示意圖(八)。圖7b為根據一第一實施例的電路板結構製作方法之結構示意圖(九)。圖12為根據一第一實施例的電路板結構製作方法之流程圖(二)。如圖7a、圖7b及圖12,覆蓋二光阻層16於二銅層12a、12b之表面,並透過曝光及顯影,使二光阻層16形成線路圖案結構161(步驟S17)。進行蝕刻製程以去除未被各光阻層16所覆蓋之各銅層12a、12b之表面(步驟S18)。接著去除二光阻層16(步驟S19),便完成電路板結構100的線路圖案。在第一實施例中,光阻層16可以例如為乾膜光阻或濕膜光阻。 In the first embodiment, through the completed circuit board structure, the patterns of subsequent circuits can be continued to be produced. Fig. 7a is a structural schematic diagram (8) of a method for fabricating a circuit board structure according to a first embodiment. Fig. 7b is a structural schematic diagram (9) of a method for fabricating a circuit board structure according to a first embodiment. FIG. 12 is a flow chart (2) of a method for fabricating a circuit board structure according to a first embodiment. 7a, 7b and 12, cover the two photoresist layers 16 on the surface of the two copper layers 12a, 12b, and through exposure and development, the two photoresist layers 16 form a circuit pattern structure 161 (step S17). An etching process is performed to remove the surfaces of the copper layers 12a, 12b not covered by the photoresist layers 16 (step S18). Then the second photoresist layer 16 is removed (step S19 ), and the circuit pattern of the circuit board structure 100 is completed. In the first embodiment, the photoresist layer 16 can be, for example, a dry film photoresist or a wet film photoresist.

進一步地,請參閱圖7c。圖7c為根據一第一實施例另一態樣的電路板結構製作方法之覆銅層結構示意圖(二)。接續圖6b之說明,透過化學咬蝕去除部分超過位於第一表面111之一側的銅層12a之高度的覆銅層15至與覆金屬導體層13a切齊,並去除二覆金屬導體層13a、13b所完成之電路板結構100,在後續製作線路圖案時,將形成如圖7c中覆銅層15略高於銅層12a的形式。 Further, please refer to Fig. 7c. Fig. 7c is a schematic diagram (2) of the structure of the copper clad layer of the manufacturing method of the circuit board structure according to another aspect of the first embodiment. Continuing the description of FIG. 6b, the copper clad layer 15 that exceeds the height of the copper layer 12a on one side of the first surface 111 is removed through chemical etching until it is aligned with the metal clad conductor layer 13a, and the two metal clad conductor layers 13a, 13b are removed. The completed circuit board structure 100 will be formed in the form of the copper clad layer 15 slightly higher than the copper layer 12a as shown in FIG. 7c when making circuit patterns later.

接著,請參閱圖8、圖9及圖10。圖8為根據一第二實施例的電路板結構製作方法之結構示意圖(一)。圖9為根據一第二實施例的電路板結構製作方法之結構示意圖(二)。圖10為根據一第二實施例的電路 板結構製作方法之結構示意圖(三)。在第二實施例中,至少一孔洞30係貫穿基板10而形成貫通孔。部分與第一實施例中相同之部分將不再贅述,僅描述部分不同之處。如圖8,藉由機械鑽孔、沖孔或雷射鑽孔形成孔洞30,孔洞30從第一表面111之一側的覆金屬導體層13a至第二表面112之一側的覆金屬導體層13b,依序經過了覆金屬導體層13a、銅層12a、基材層11、銅層12b、及覆金屬導體層13b。孔洞30包括孔壁31,孔壁31包括鑽孔而外露之覆金屬導體層13a、銅層12a、基材層11、銅層12b及覆金屬導體層13b的側表面。金屬化層14覆蓋孔洞30之表面、位於第一表面111之一側的覆金屬導體層13a之表面及位於第二表面112之一側的覆金屬導體層13b之表面。一般來說,金屬化層14之覆蓋範圍不包括銅材之部份,例如因鑽孔外露之銅層12a的側表面及因鑽孔外露之銅層12b的側表面。如圖9,在電鍍的階段時,覆銅層15覆蓋孔洞30之表面及延伸至位於第一表面111之一側的覆金屬導體層13a之表面及第二表面112之一側的覆金屬導體層13b之表面。如圖10,接著透過化學咬蝕去除部分超過位於第一表面111之一側的銅層12a之高度的覆銅層15及部分超過位於第二表面112之一側的銅層12b之高度的覆銅層15。再去除覆金屬導體層13a、13b後,便完成如圖10所示以覆銅層15填滿孔洞30(貫通孔)的基板10。 Next, please refer to FIG. 8 , FIG. 9 and FIG. 10 . FIG. 8 is a structural schematic view (1) of a method for fabricating a circuit board structure according to a second embodiment. FIG. 9 is a structural schematic diagram (2) of a method for fabricating a circuit board structure according to a second embodiment. Figure 10 is a circuit according to a second embodiment Schematic diagram of the fabrication method of the plate structure (3). In the second embodiment, at least one hole 30 penetrates through the substrate 10 to form a through hole. Parts that are the same as those in the first embodiment will not be repeated, and only some differences will be described. As shown in FIG. 8, holes 30 are formed by mechanical drilling, punching or laser drilling. The holes 30 pass through the metal-clad conductor layer 13a, the copper layer 12a, the substrate layer 11, the copper layer 12b, and the metal-clad conductor layer 13b from the metal-clad conductor layer 13a on one side of the first surface 111 to the metal-clad conductor layer 13b on one side of the second surface 112. The hole 30 includes a hole wall 31 , and the hole wall 31 includes the side surfaces of the metal-clad conductor layer 13 a , the copper layer 12 a , the substrate layer 11 , the copper layer 12 b , and the metal-clad conductor layer 13 b exposed through drilling. The metallization layer 14 covers the surface of the hole 30 , the surface of the metal-clad conductor layer 13 a on one side of the first surface 111 and the surface of the metal-clad conductor layer 13 b on one side of the second surface 112 . Generally, the coverage of the metallization layer 14 does not include parts of the copper material, such as the side surface of the copper layer 12a exposed by the drill holes and the side surface of the copper layer 12b exposed by the drill holes. As shown in FIG. 9 , during the electroplating stage, the copper-clad layer 15 covers the surface of the hole 30 and extends to the surface of the metal-clad conductor layer 13 a on one side of the first surface 111 and the surface of the metal-clad conductor layer 13 b on one side of the second surface 112 . As shown in Figure 10, the copper clad layer 15 partially exceeding the height of the copper layer 12a on one side of the first surface 111 and the copper clad layer 15 partially exceeding the height of the copper layer 12b located on one side of the second surface 112 are removed by chemical etching. After removing the metal-clad conductor layers 13a, 13b, the substrate 10 with the holes 30 (through-holes) filled with the copper-clad layer 15 as shown in FIG. 10 is completed.

綜上所述,根據一實施例的一種電路板結構100的製作方法藉由二覆金屬導體層13a、13b將金屬化及電鍍範圍增大,當在電鍍的過程時,覆銅層15延伸至覆金屬導體層13a之表面,接著一併去除超過覆金屬導體層13a之高度範圍的覆銅層15以及去除二覆金屬導體層13a、13b,使得覆銅層15與銅層12a高度大致一致,避免了電鍍孔洞時,電鍍層溢出孔 洞,在孔洞周圍形成凸出部,而影響了電路板結構100的製作。此外,由於覆金屬導體層13a、13b具導電性,不須依賴金屬化系統吸附之效果即可滿足電鍍時的電需求,且覆金屬導體層13a、13b不受限於中性或弱酸性之金屬化系統,亦可以選用鹼性之金屬化系統,提高了電路板結構100製作的效率及增加了製作方法的多元性。覆金屬導體層13a、13b透過化學沉積、濺鍍或電鍍方式覆蓋於二銅層12a、12b上的作法,厚度上不會受限於光阻本身製作厚度的限制,因覆金屬導體層13a、13b的材質導電,在電鍍過程中的行為將從傳統圖形電鍍轉變為整板電鍍之特性,使得整體電鍍均勻性比圖形電鍍更容易控制,在後續移除覆金屬導體層13a、13b上的電鍍層時,不會因過大的厚度差異導致移除不易的現象。 In summary, according to an embodiment of a method for fabricating a circuit board structure 100, the two metal-clad conductor layers 13a and 13b are used to increase the range of metallization and electroplating. During the electroplating process, the copper-clad layer 15 extends to the surface of the metal-clad conductor layer 13a, and then the copper-clad layer 15 exceeding the height range of the metal-clad conductor layer 13a and the two metal-clad conductor layers 13a and 13b are removed together, so that the height of the copper-clad layer 15 is approximately the same as that of the copper layer 12a. When plating a hole, the plating overflows the hole A hole is formed around the hole, which affects the fabrication of the circuit board structure 100 . In addition, since the metal-clad conductor layers 13a and 13b are conductive, they can meet the electrical requirements during electroplating without relying on the adsorption effect of the metallization system, and the metal-clad conductor layers 13a and 13b are not limited to neutral or weakly acidic metallization systems, and can also use alkaline metallization systems, which improves the production efficiency of the circuit board structure 100 and increases the diversity of production methods. The metal-clad conductor layers 13a, 13b are covered on the two copper layers 12a, 12b through chemical deposition, sputtering or electroplating. The thickness is not limited by the thickness of the photoresist itself. Because the material of the metal-clad conductor layers 13a, 13b is conductive, the behavior during the electroplating process will change from the traditional pattern plating to the characteristics of the whole board plating, so that the overall plating uniformity is easier to control than the pattern plating. When layering, it will not be difficult to remove due to excessive thickness differences.

S10-S16:步驟 S10-S16: Steps

Claims (9)

一種電路板結構的製作方法,包括: 提供一基板,該基板包括一基材層及二銅層,該基材層具有相對之一第一表面及一第二表面,各該銅層形成於該基材層之該第一表面及該第二表面; 透過化鍍、濺鍍或電鍍形成二覆金屬導體層,該二覆金屬導體層分別覆蓋於該二銅層之表面; 自位於該第一表面之一側的該覆金屬導體層之表面進行鑽孔,形成至少一孔洞,該至少一孔洞導通至露出位於該基材層之該第二表面之該銅層; 透過化學方式形成一金屬化層,該金屬化層覆蓋於該至少一孔洞之表面及該二覆金屬導體層之表面; 透過電鍍形成一覆銅層,該覆銅層覆蓋於該至少一孔洞之表面並延伸至位於該第一表面之一側的該覆金屬導體層之表面,及覆蓋該第二表面之一側的該覆金屬導體層之表面; 透過化學咬蝕去除部分超過該銅層之高度的該覆銅層;以及 透過化學咬蝕去除該二覆金屬導體層。 A method for manufacturing a circuit board structure, comprising: A substrate is provided, the substrate includes a base material layer and two copper layers, the base material layer has a first surface and a second surface opposite, each of the copper layers is formed on the first surface and the second surface of the base material layer; Forming two metal-clad conductor layers through electroless plating, sputtering or electroplating, and the two metal-clad conductor layers respectively cover the surfaces of the two copper layers; Drilling from the surface of the metal-clad conductor layer on one side of the first surface to form at least one hole, the at least one hole is connected to the copper layer exposed on the second surface of the base layer; chemically forming a metallization layer covering the surface of the at least one hole and the surfaces of the two metal-clad conductor layers; forming a copper-clad layer by electroplating, the copper-clad layer covers the surface of the at least one hole and extends to the surface of the metal-clad conductor layer on one side of the first surface, and covers the surface of the metal-clad conductor layer on one side of the second surface; removing portions of the copper clad layer exceeding the height of the copper layer by chemical etching; and The overlying metal conductor layer is removed by chemical etching. 如請求項1所述之電路板結構的製作方法,其中,各該覆金屬導體層係為鉻、鎳、鋁、鈦、錫、白金、金或銀。The manufacturing method of the circuit board structure according to claim 1, wherein each metal-clad conductor layer is chromium, nickel, aluminum, titanium, tin, platinum, gold or silver. 如請求項1所述之電路板結構的製作方法,其中,透過該至少一孔洞的該覆銅層連接該二銅層。The manufacturing method of the circuit board structure according to claim 1, wherein the copper clad layer through the at least one hole is connected to the two copper layers. 如請求項1所述之電路板結構的製作方法,其中,在鑽孔過程中,該至少一孔洞導通至該第二表面之一側的該覆金屬導體層。The manufacturing method of the circuit board structure as claimed in claim 1, wherein, during the drilling process, the at least one hole is connected to the metal-clad conductor layer on one side of the second surface. 如請求項1所述之電路板結構的製作方法,其中,在透過化學咬蝕去除部分超過該銅層之高度的該覆銅層的過程中,透過化學咬蝕使該覆銅層與該銅層的高度大致切齊。The manufacturing method of the circuit board structure as claimed in claim 1, wherein, during the process of removing part of the copper clad layer exceeding the height of the copper layer by chemical etching, the height of the copper clad layer and the copper layer are roughly aligned by chemical etching. 如請求項1所述之電路板結構的製作方法,其中,該至少一孔洞係利用一雷射鑽孔、機械鑽孔或沖孔方式形成。The method for manufacturing a circuit board structure as claimed in claim 1, wherein the at least one hole is formed by laser drilling, mechanical drilling or punching. 如請求項1所述之電路板結構的製作方法,其中,該二覆金屬導體層的厚度為0.1至20μm。The manufacturing method of the circuit board structure according to claim 1, wherein the thickness of the two metal-clad conductor layers is 0.1 to 20 μm. 如請求項1所述之電路板結構的製作方法,在完成透過化學咬蝕去除該二覆金屬導體層後; 覆蓋二光阻層於該二銅層之表面,並透過曝光及顯影,使該二光阻層形成一線路圖案結構; 進行蝕刻製程以去除未被各該光阻層所覆蓋之各該銅層之表面;以及 去除該二光阻層。 The manufacturing method of the circuit board structure as described in Claim 1, after removing the two metal-clad conductor layers through chemical etching; Covering two photoresist layers on the surface of the two copper layers, and forming a circuit pattern structure on the two photoresist layers through exposure and development; performing an etching process to remove the surface of each of the copper layers not covered by each of the photoresist layers; and removing the two photoresist layers. 一種如請求項1至8任一項所述之電路板結構的製作方法製作而成之電路板結構。A circuit board structure manufactured by the method for manufacturing the circuit board structure described in any one of Claims 1 to 8.
TW111112686A 2022-03-31 2022-03-31 Manufacturing method of circuit board structure and circuit board structure manufactured thereof TWI808706B (en)

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CN214381571U (en) * 2021-02-20 2021-10-08 嘉联益电子(昆山)有限公司 Circuit board circuit structure with through hole
TWI747751B (en) * 2021-02-20 2021-11-21 嘉聯益科技股份有限公司 Manufacturing circuit board circuit structure with through hole and circuit board circuit structure with through hole manufactured thereof
TWI752834B (en) * 2021-02-20 2022-01-11 嘉聯益科技股份有限公司 Manufacturing method of circuit board circuit structure with through hole

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201440590A (en) * 2013-04-10 2014-10-16 Tripod Technology Corp Method for manufacturing printed circuit board having copper wrap layer
CN214381571U (en) * 2021-02-20 2021-10-08 嘉联益电子(昆山)有限公司 Circuit board circuit structure with through hole
TWI747751B (en) * 2021-02-20 2021-11-21 嘉聯益科技股份有限公司 Manufacturing circuit board circuit structure with through hole and circuit board circuit structure with through hole manufactured thereof
TWI752834B (en) * 2021-02-20 2022-01-11 嘉聯益科技股份有限公司 Manufacturing method of circuit board circuit structure with through hole

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