TWI782762B - Diffusion mechanism and thin-film-deposition equipment using the same - Google Patents
Diffusion mechanism and thin-film-deposition equipment using the same Download PDFInfo
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- 238000009792 diffusion process Methods 0.000 title claims abstract description 87
- 230000007246 mechanism Effects 0.000 title claims abstract description 38
- 238000000427 thin-film deposition Methods 0.000 title claims description 15
- 230000005540 biological transmission Effects 0.000 claims abstract description 159
- 230000004308 accommodation Effects 0.000 claims description 4
- 230000008021 deposition Effects 0.000 abstract description 4
- 239000002243 precursor Substances 0.000 description 15
- 238000006243 chemical reaction Methods 0.000 description 11
- 239000000758 substrate Substances 0.000 description 10
- 238000000231 atomic layer deposition Methods 0.000 description 6
- 239000010408 film Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 239000010409 thin film Substances 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000000151 deposition Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
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Abstract
Description
本發明有關於一種擴散機構及其薄膜沉積機台,可用以在擴散機構的下方輸出分布均勻的前驅物。 The invention relates to a diffusion mechanism and its thin film deposition machine, which can be used to output evenly distributed precursors under the diffusion mechanism.
隨著積體電路技術的不斷進步,目前電子產品朝向輕薄短小、高性能、高可靠性與智能化的趨勢發展。電子產品中電晶體的微縮技術至關重要,隨著電晶體的尺寸縮小,可減少電流傳輸時間及降低耗能,以達到快速運算及節能的目的。在現今微小化的電晶體中,部分關鍵的薄膜幾乎僅有幾個原子的厚度,而原子層沉積製程則是發展這些微量結構的主要技術之一。 With the continuous advancement of integrated circuit technology, the current electronic products are developing towards the trend of light, thin, small, high performance, high reliability and intelligence. The miniaturization technology of transistors in electronic products is very important. With the reduction of the size of transistors, the current transmission time and energy consumption can be reduced, so as to achieve the purpose of fast calculation and energy saving. In today's miniaturized transistors, some key thin films are almost only a few atoms thick, and the atomic layer deposition process is one of the main technologies for developing these microstructures.
原子層沉積製程是一種將物質以單原子的形式一層一層地鍍於基板表面的技術,原子層沉積的主要反應物有兩種化學物質,通常被稱作前驅物,並將兩種前驅物依序傳送至反應空間內。 The atomic layer deposition process is a technology that coats substances layer by layer on the surface of a substrate in the form of single atoms. The main reactants of atomic layer deposition are two chemical substances, usually called precursors, and the two precursors are used according to Sequentially sent to the reaction space.
具體而言,先將第一前驅物輸送至反應空間內,使得第一前驅物被導引至基板表面,化學吸附的過程直至表面飽和時就自動終止。將清潔氣體輸送至反應空間內,並抽出反應空間內的氣體,以去除反應空間內殘餘的第一前驅物。將第二前驅物注入反應空間,使得第二前驅物與化學吸 附於基板表面的第一前驅物反應生成所需薄膜,反應的過程直至吸附於基板表面的第一前驅物反應完成為止。之後再將清潔氣體注入反應空間,以去除反應空間內殘餘的第二前驅物。透過上述步驟的反覆進行,並可在基板上形成薄膜。 Specifically, the first precursor is delivered into the reaction space first, so that the first precursor is guided to the surface of the substrate, and the process of chemical adsorption is automatically terminated when the surface is saturated. The cleaning gas is delivered into the reaction space, and the gas in the reaction space is extracted to remove the residual first precursor in the reaction space. Injecting the second precursor into the reaction space, so that the second precursor and the chemisorbed The first precursor attached to the surface of the substrate reacts to form a desired film, and the reaction process is completed until the reaction of the first precursor adsorbed on the surface of the substrate is completed. Then inject cleaning gas into the reaction space to remove the residual second precursor in the reaction space. By repeating the above steps, a thin film can be formed on the substrate.
在實際應用時,反應空間內前驅物的均勻分布,以及基板的溫度都會對原子層沉積的薄膜均勻度造成相當大的影響,為此各大製程設備廠莫不極盡所能的改善擴散機構,以提高原子層沉積製程的品質。 In practical applications, the uniform distribution of precursors in the reaction space and the temperature of the substrate will have a considerable impact on the uniformity of the atomic layer deposition film. For this reason, the major process equipment manufacturers do their best to improve the diffusion mechanism. To improve the quality of the atomic layer deposition process.
如先前技術所述,習用的擴散機構往往無法使得前驅物均勻的分布在基板上,而影響沉積在基板表面的薄膜品質。為此本發明提出一種新穎的擴散機構及應用該擴散機構的薄膜沉積機台,可以在基板及或承載盤的上方形成均勻分布的前驅物,以利於在基板的表面形成厚度均勻的薄膜。 As mentioned in the prior art, the commonly used diffusion mechanism often cannot make the precursor uniformly distributed on the substrate, which affects the quality of the film deposited on the substrate surface. To this end, the present invention proposes a novel diffusion mechanism and a thin film deposition machine using the diffusion mechanism, which can form uniformly distributed precursors on the substrate and/or the carrier plate, so as to facilitate the formation of a thin film with uniform thickness on the surface of the substrate.
本發明的一目的,在於提出一種擴散機構,主要包括一傳輸管線、一導流單元及一擴散板,其中傳輸管線流體連接擴散板。導流單元設置在傳輸管線的傳輸空間內,並將傳輸空間區分為一第一傳輸空間及一第二傳輸空間。 An object of the present invention is to provide a diffusion mechanism, which mainly includes a transmission line, a flow guide unit and a diffusion plate, wherein the transmission line is fluidly connected to the diffusion plate. The diversion unit is arranged in the transmission space of the transmission pipeline, and divides the transmission space into a first transmission space and a second transmission space.
導流單元具有一凸起部及複數個導流管線,其中凸起部設置在導流單元的上表面,而導流管線則環繞設置在凸起部的周圍,且導流管線相對於導流單元的上表面及下表面傾斜。 The diversion unit has a raised part and a plurality of diversion pipelines, wherein the raised part is arranged on the upper surface of the diversion unit, and the diversion pipeline is arranged around the raised part, and the diversion pipeline is relatively The upper and lower surfaces of the unit are inclined.
氣體或電漿由第一傳輸空間經由導流單元傳輸至第二傳輸空間,氣體或電漿在經過傾斜的導流管線後會在第二傳輸空間形成漩渦,並 傳送至導流管線連接的擴散板。具體而言,透過導流單元的設置可提高氣體或電漿的傳送速率,並有利於在擴散板下方形成均勻分布的氣體或電漿,以在晶圓的表面形成厚度均勻的薄膜。 The gas or plasma is transported from the first transmission space to the second transmission space through the diversion unit, and the gas or plasma will form a vortex in the second transmission space after passing through the inclined diversion pipeline, and Delivered to the diffuser plate where the diversion line is connected. Specifically, the setting of the permeation guide unit can increase the transmission rate of the gas or plasma, and is beneficial to form uniformly distributed gas or plasma under the diffusion plate, so as to form a thin film with uniform thickness on the surface of the wafer.
傳輸管線的第一傳輸空間連接一輸入管線,其中輸入管線設置在凸起部的一側,並可相對於導流單元的上表面傾斜,使得由輸入管線進入第一傳輸空間的氣體或電漿,會以凸起部為中心旋轉,並在第一傳輸空間內形成漩渦,以利於第一傳輸空間內的氣體或電漿經由傾斜的導流管線傳送至第二傳輸空間。 The first transmission space of the transmission pipeline is connected to an input pipeline, wherein the input pipeline is arranged on one side of the raised part, and can be inclined relative to the upper surface of the flow guide unit, so that the gas or plasma entering the first transmission space from the input pipeline , will rotate around the convex part and form a vortex in the first transmission space, so as to facilitate the gas or plasma in the first transmission space to be transported to the second transmission space through the inclined diversion pipeline.
本發明的一目的,在於提出一種薄膜沉積機台,主要包括一腔體、一擴散機構及一承載盤,其中承載盤位於腔體的一容置空間內,而擴散機構則流體連接腔體的容置空間。承載盤用以承載至少一晶圓,而擴散機構面對承載盤及/或晶圓,並用以將前驅物氣體或電漿輸送至晶圓上方,以利於在晶圓的表面沉積厚度均勻的薄膜。 An object of the present invention is to provide a thin film deposition machine, which mainly includes a cavity, a diffusion mechanism and a carrier plate, wherein the carrier plate is located in an accommodating space of the cavity, and the diffusion mechanism is fluidly connected to the cavity. Accommodate space. The carrier plate is used to carry at least one wafer, and the diffusion mechanism faces the carrier plate and/or the wafer, and is used to deliver the precursor gas or plasma to the wafer, so as to facilitate the deposition of a film with uniform thickness on the surface of the wafer .
為了達到上述的目的,本發明提出一種擴散機構,包括:一傳輸管線,包括一傳輸空間;一導流單元,設置在傳輸管線的傳輸空間內,並將傳輸空間區分為一第一傳輸空間及一第二傳輸空間,導流單元包括:一主體部,包括一第一表面及一第二表面,其中第一表面朝向第一傳輸空間,而第二表面則朝向第二傳輸空間;一凸起部,設置在主體部的第一表面;複數個導流管線,位於主體部的凸起部的周圍,並連通主體部的第一表面及第二表面,其中導流管線相對於主體部的第一表面及第二表面傾斜;至少一輸入管線,流體連接傳輸管線的第一傳輸空間,並用以將至少一氣體或至少一電漿輸送至第一傳輸空間,其中進入第一傳輸空間的氣體或電漿 經由導流單元的複數個導流管線輸送至第二傳輸空間;及一擴散板,連接傳輸管線,擴散板包括一第一表面、一第二表面及複數個穿孔,穿孔連通擴散板的第一表面及第二表面,其中擴散板的第一表面流體連接第二傳輸空間,而第二傳輸空間內的氣體或電漿經由擴散板的複數個穿孔傳輸至擴散板的第二表面的一側。 In order to achieve the above object, the present invention proposes a diffusion mechanism, comprising: a transmission pipeline including a transmission space; a diversion unit arranged in the transmission space of the transmission pipeline, and dividing the transmission space into a first transmission space and A second transmission space, the flow guide unit includes: a main body, including a first surface and a second surface, wherein the first surface faces the first transmission space, and the second surface faces the second transmission space; a protrusion The part is arranged on the first surface of the main body; a plurality of diversion pipelines are located around the raised part of the main body and communicate with the first surface and the second surface of the main body, wherein the diversion pipeline is opposite to the first surface of the main body A surface and a second surface are inclined; at least one input pipeline is fluidly connected to the first transmission space of the transmission pipeline, and is used to transport at least one gas or at least one plasma to the first transmission space, wherein the gas entering the first transmission space or plasma A plurality of diversion pipelines of the diversion unit are transported to the second transmission space; and a diffusion plate is connected to the transmission pipeline. The diffusion plate includes a first surface, a second surface and a plurality of perforations, and the perforations communicate with the first surface of the diffusion plate. The surface and the second surface, wherein the first surface of the diffusion plate is fluidly connected to the second transmission space, and the gas or plasma in the second transmission space is transmitted to one side of the second surface of the diffusion plate through a plurality of perforations of the diffusion plate.
本發明提供一種薄膜沉積機台,包括:一腔體,包括一容置空間;一擴散機構,連接腔體,包括:一傳輸管線,包括一傳輸空間;一導流單元,設置在傳輸管線的傳輸空間內,並將傳輸空間區分為一第一傳輸空間及一第二傳輸空間,導流單元包括:一主體部,包括一第一表面及一第二表面,其中第一表面朝向第一傳輸空間,而第二表面則朝向第二傳輸空間;一凸起部,設置在主體部的第一表面;複數個導流管線,位於主體部的凸起部的周圍,並連通主體部的第一表面及第二表面,其中導流管線相對於主體部的第一表面及第二表面傾斜;至少一輸入管線,流體連接傳輸管線的第一傳輸空間,並用以將至少一氣體或至少一電漿輸送至第一傳輸空間,其中進入第一傳輸空間的氣體或電漿經由導流單元的複數個導流管線輸送至第二傳輸空間;一擴散板,連接傳輸管線,擴散板包括一第一表面、一第二表面及複數個穿孔,穿孔連通擴散板的第一表面及第二表面,其中擴散板的第一表面流體連接第二傳輸空間,而擴散板的第二表面則連接腔體的容置空間,而第二傳輸空間內的氣體或電漿經由擴散板的複數個穿孔傳輸至容置空間;一承載盤,位於容置空間內,面對擴散機構,並用以承載至少一晶圓。 The present invention provides a thin film deposition machine, comprising: a cavity, including an accommodating space; a diffusion mechanism, connected to the cavity, including: a transmission pipeline, including a transmission space; a flow guide unit, arranged on the transmission pipeline In the transmission space, and the transmission space is divided into a first transmission space and a second transmission space, the flow guide unit includes: a main body, including a first surface and a second surface, wherein the first surface faces the first transmission space space, while the second surface is facing the second transmission space; a raised part is arranged on the first surface of the main part; a plurality of diversion pipelines are located around the raised part of the main part and communicate with the first part of the main part The surface and the second surface, wherein the diversion pipeline is inclined relative to the first surface and the second surface of the main body; at least one input pipeline is fluidly connected to the first transmission space of the transmission pipeline, and is used to transfer at least one gas or at least one plasma transported to the first transmission space, wherein the gas or plasma entering the first transmission space is transported to the second transmission space through a plurality of diversion pipelines of the diversion unit; a diffusion plate is connected to the transmission pipeline, and the diffusion plate includes a first surface , a second surface and a plurality of perforations, the perforations connect the first surface and the second surface of the diffuser plate, wherein the first surface of the diffuser plate is fluidly connected to the second transmission space, and the second surface of the diffuser plate is connected to the container of the cavity The gas or plasma in the second transmission space is transported to the accommodation space through a plurality of perforations of the diffusion plate; a carrier plate is located in the accommodation space, faces the diffusion mechanism, and is used to carry at least one wafer.
所述的擴散機構及薄膜沉積機台,其中傳輸管線包括:一管體,包括一承載部用以承載導流單元,其中導流單元與管體形成第二傳輸空間;及一蓋體,用以連接管體,並覆蓋導流單元,其中蓋體與導流單元之間形成第一傳輸空間。 The diffusion mechanism and the thin film deposition machine described above, wherein the transmission pipeline includes: a pipe body, including a bearing part for carrying the flow guide unit, wherein the flow guide unit and the pipe body form a second transmission space; and a cover body, used for to connect the pipe body and cover the flow guide unit, wherein a first transmission space is formed between the cover body and the flow guide unit.
所述的擴散機構及薄膜沉積機台,其中蓋體包括一凹部,連接第一傳輸空間,而管體包括一第一端及一第二端,第一端連接導流單元,第二端則流體連接擴散板。 The diffusion mechanism and the thin film deposition machine, wherein the cover body includes a concave portion connected to the first transmission space, and the tube body includes a first end and a second end, the first end is connected to the flow guide unit, and the second end is Fluidically connect the diffuser plate.
所述的擴散機構及薄膜沉積機台,其中管體的第二端的截面積大於第一端的截面積。 In the diffusion mechanism and film deposition machine, the cross-sectional area of the second end of the tube body is larger than the cross-sectional area of the first end.
所述的擴散機構及薄膜沉積機台,包括一擴散空間位於擴散板的第一表面與管體的第二端之間,擴散空間的截面積由管體的第二端朝擴散板的第一表面的方向逐漸擴大。 The diffusion mechanism and film deposition machine include a diffusion space located between the first surface of the diffusion plate and the second end of the pipe body, the cross-sectional area of the diffusion space is from the second end of the pipe body to the first end of the diffusion plate. The direction of the surface gradually expands.
10:擴散機構 10: Diffusion agency
11:傳輸管線 11: Transmission pipeline
111:蓋體 111: cover body
1111:凹部 1111: concave part
113:管體 113: tube body
1131:承載部 1131: bearing part
1132:第一端 1132: first end
1134:第二端 1134: second end
12:傳輸空間 12: Transmission space
121:第一傳輸空間 121: The first transmission space
123:第二傳輸空間 123: Second transmission space
13:導流單元 13: diversion unit
131:主體部 131: Main body
132:第一表面 132: first surface
133:凸起部 133: Raised part
134:第二表面 134: second surface
135:導流管線 135: diversion pipeline
1351:第一開口 1351: first opening
1353:第二開口 1353: second opening
137:環形凸緣 137: ring flange
14:擴散空間 14: Diffusion space
15:擴散板 15: Diffusion plate
151:第一表面 151: first surface
153:第二表面 153: second surface
155:穿孔 155: perforation
17:輸入管線 17: Input pipeline
19:轉接單元 19: Transition unit
191:開口 191: opening
20:薄膜沉積機台 20: Thin film deposition machine
21:腔體 21: Cavity
22:容置空間 22:Accommodating space
23:承載盤 23: carrying plate
25:晶圓 25: Wafer
[圖1]為本發明擴散機構一實施例的立體剖面示意圖。 [ Fig. 1 ] is a three-dimensional cross-sectional schematic view of an embodiment of the diffusion mechanism of the present invention.
[圖2]為本發明擴散機構的導流單元一實施例的立體透視圖。 [ Fig. 2 ] is a three-dimensional perspective view of an embodiment of the flow guiding unit of the diffusion mechanism of the present invention.
[圖3]為本發明擴散機構的導流單元及蓋體一實施例的立體剖面示意圖。 [ Fig. 3 ] is a three-dimensional cross-sectional schematic view of an embodiment of the flow guide unit and the cover of the diffusion mechanism of the present invention.
[圖4]為本發明擴散機構的傳輸管線及導流單元一實施例的立體剖面示意圖。 [ Fig. 4 ] is a three-dimensional cross-sectional schematic view of an embodiment of the transmission pipeline and the flow guide unit of the diffusion mechanism of the present invention.
[圖5]為本發明應用該擴散機構的薄膜沉積機台一實施例的剖面示意圖。 [ FIG. 5 ] is a schematic cross-sectional view of an embodiment of a thin film deposition machine using the diffusion mechanism of the present invention.
[圖6]為本發明擴散機構傳輸氣體或電漿的模擬示意圖。 [ FIG. 6 ] is a schematic diagram of a simulation of gas or plasma transported by the diffusion mechanism of the present invention.
請參閱圖1,為本發明擴散機構一實施例的剖面示意圖。如圖所示,擴散機構10主要包括一傳輸管線11、一導流單元13、一擴散板15及至少一輸入管線17,其中輸入管線17透過傳輸管線11流體連接擴散板15,而導流單元13則設置在傳輸管線11內。
Please refer to FIG. 1 , which is a schematic cross-sectional view of an embodiment of the diffusion mechanism of the present invention. As shown in the figure, the
傳輸管線11可為空心柱狀體,並包括一傳輸空間12。導流單元13設置在傳輸管線11的傳輸空間12內,並將傳輸空間12區分成一第一傳輸空間121及一第二傳輸空間123。
The
請配合參閱圖2,導流單元13包括一主體部131、一凸起部133及複數個導流管線135,其中主體部131可為板狀,並包括一第一表面132及一第二表面134,例如第一表面132為上表面,而第二表面134為下表面。在將導流單元13設置在傳輸管線11的傳輸空間12後,主體部131的第一表面132會朝向第一傳輸空間121,而主體部131的第二表面134則會朝向第二傳輸空間123。
Please refer to FIG. 2 , the
凸起部133設置於主體部131的第一表面132上,例如主體部131的第一表面132可為圓形,而凸起部133則設置在第一表面132的圓心或中央區域上,並凸出主體部131的第一表面132。在本發明一實施例中,凸起部133可為截頂圓錐狀體、圓錐狀體及圓柱狀體。
The raised
複數個導流管線135環繞設置在凸起部133的周圍,並連通主體部131的第一表面132及第二表面134,其中導流管線135相對於主體部131的第
一表面132及第二表面134傾斜。例如導流管線135在主體部131的第一表面132上形成一第一開口1351,並在主體部131的第二表面134上形成一第二開口1353,其中第一表面132上的複數個第一開口1351環繞在凸起部133的周圍。例如第一開口1351及第二開口1353可位於同一個虛擬的圓的投影上,並形成傾斜的導流管線135。
A plurality of
在本發明一實施例中,主體部131的第一表面132上可設置一環形凸緣137,其中環形凸緣137凸出主體部131的第一表面132,並環繞設置在凸起部133及複數個導流管線135的第一開口1351周圍,例如環形凸緣137設置在主體部131的第一表面132的邊緣位置。
In one embodiment of the present invention, an
如圖3所示,輸入管線17流體連接傳輸管線11的第一傳輸空間121,並用以將至少一氣體或至少一電漿傳送至第一傳輸空間121。進入第一傳輸空間121的氣體或電漿會以凸起部133為中心在第一傳輸空間121內旋轉,並經由導流單元13的複數個導流管線135輸送至第二傳輸空間123。
As shown in FIG. 3 , the
例如輸入管線17的延伸線不對準凸起部133的中心,並略微偏向凸起部133的一側,以利於進入第一傳輸空間121的氣體或電漿以凸起部133為中心進行旋轉。
For example, the extension line of the
在本發明一實施例中,輸入管線17連接傳輸管線11的第一傳輸空間121的出口可等於或高於凸起部133的頂部。此外輸入管線17可相對於主體部131的第一表面132傾斜,使得由輸入管線17輸入第一傳輸空間121的氣體或電漿以凸起部133的中心向下旋轉,並形成漩渦。
In an embodiment of the present invention, the outlet of the
本發明所述的導流管線135相對於主體部131的第一表面132傾斜,例如導流管線135傾斜的方向與第一傳輸空間121內氣體或電漿的旋轉
方向相同,使得第一傳輸空間121內的氣體或電漿可沿著傾斜的導流管線135傳送至第二傳輸空間123,並在第二傳輸空間123內形成以傳輸管線11的軸心為旋轉中心的漩渦。
The
氣體或電漿在第二傳輸空間123內形成的漩渦除了以傳輸管線11的軸心為中心旋轉外,還具有向下位移的分量,使得氣體或電漿形成的漩渦朝擴散板15的方向位移,詳細的模擬圖會在後續的實施例說明。
The vortex formed by the gas or plasma in the
在本發明一實施例中,如圖4所示,傳輸管線11包括一管體113及一蓋體111,其中管體113包括一承載部1131用以承載導流單元13,例如承載部1131可以是位於管體113內表面的凸出部,其中承載部1131可沿著管體113的徑向,並朝管體113的軸心凸出。在將導流單元13放置在管體113的承載部1131後,導流單元13會與管體113形成第二傳輸空間123。
In an embodiment of the present invention, as shown in FIG. 4 , the
蓋體111用以連接管體113,並覆蓋設置在管體113上的導流單元13。具體而言,可先將導流單元13放置在管體113的承載部1131,而後再透過蓋體111覆蓋導流單元13,並透過螺絲將蓋體111鎖固在管體113上,以完成蓋體111、管體113及導流單元13之間的連接。
The
在本發明一實施例中,蓋體111的下表面可設置一凹部1111,並在蓋體111與導流單元13之間形成第一傳輸空間121,例如凹部1111的形狀與凸起部133的形狀相近,兩者皆為截頂圓錐狀體。
In an embodiment of the present invention, a
管體113為中空的管狀構件,並包括一第一端1132及一第二端1134,其中管體的第二端1134的截面積可大於第一端1132,使得管體113的第二傳輸空間123為一截頂圓錐狀體。管體113的第一端1132連接導流單元
13,例如導流單元13覆蓋管體113的第一端1132,而管體113的第二端1134則流體連接擴散板15。
The
擴散板15包括一第一表面151及一第二表面153,例如第一表面151及第二表面153分別是上表面及下表面,其中擴散板15的第一表面151流體連接傳輸管線11的第二傳輸空間123。在本發明一實施例中,如圖1所示,擴散板15的第一表面151流體連接管體113的第二端1134,並於擴散板15的第一表面151與管體113的第二端1134之間形成一擴散空間14。
The
具體而言,傳輸管線11可透過一轉接單元19連接擴散板15,其中轉接單元19為中空管體。轉接單元19的上表面具有一承載部,可將傳輸管線11的管體113放置在轉接單元19的承載部上,並透過螺絲將傳輸管線11固定在轉接單元19上,使得傳輸管線11的第二傳輸空間123連接轉接單元19的中空部。
Specifically, the
此外轉接單元19的下表面具有一開口191,其中開口191可以是喇叭狀、圓錐狀或截頂圓錐狀。轉接單元19連接擴散板15時,轉接單元19的開口191將會覆蓋擴散板15,並於轉接單元19與擴散板15之間形成擴散空間14,其中擴散空間14的截面積由管體113的第二端1134朝擴散板15的第一表面151的方向逐漸擴大。
In addition, the lower surface of the
擴散板15可為一板狀體,例如圓板狀,並包括複數個穿孔155,其中穿孔155連通擴散板15的第一表面151及第二表面153。在實際應用時,氣體或電漿會在傳輸管線11的第二傳輸空間123內形成漩渦,並傳送至擴散空間14,而後經由擴散板15的穿孔155傳輸至擴散板15的第二表面153的一側。
The
請參閱圖5,為本發明應用該擴散機構的薄膜沉積機台一實施例的剖面示意圖。如圖所示,可於薄膜沉積機台20上應用本發明上述實施例的擴散機構10,其中薄膜沉積機台20可以是原子層沉積機台或化學氣相沉積機台。
Please refer to FIG. 5 , which is a schematic cross-sectional view of an embodiment of a thin film deposition machine applying the diffusion mechanism of the present invention. As shown in the figure, the
薄膜沉積機台20主要包括一腔體21、一承載盤23及一擴散機構10,其中承載盤23位於腔體21的一容置空間22內,並用以承載至少一晶圓25。
The thin
擴散機構10設置在腔體21上,並流體連接腔體21的容置空間22,其中擴散機構10的擴散板15面對承載盤23,例如擴散板15的第二表面153連接腔體21的容置空間22。如圖6所示,擴散機構10可將氣體或電漿以漩渦的方式傳送至擴散板15,並經由擴散板15的穿孔155輸送至容置空間22內的承載盤23及/或晶圓25的上方。晶圓25的上方會形成一均勻分布的氣體或電漿,有利於在晶圓25的表面形成厚度均勻的薄膜。
The
以上所述者,僅為本發明之一較佳實施例而已,並非用來限定本發明實施之範圍,即凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。 The above is only one of the preferred embodiments of the present invention, and is not used to limit the scope of the present invention, that is, all changes and equal changes made according to the shape, structure, characteristics and spirit described in the patent scope of the present invention Modifications should be included in the patent application scope of the present invention.
10:擴散機構 10: Diffusion agency
11:傳輸管線 11: Transmission pipeline
1134:第二端 1134: second end
12:傳輸空間 12: Transmission space
121:第一傳輸空間 121: The first transmission space
123:第二傳輸空間 123: Second transmission space
13:導流單元 13: diversion unit
14:擴散空間 14: Diffusion space
15:擴散板 15: Diffusion plate
151:第一表面 151: first surface
153:第二表面 153: second surface
155:穿孔 155: perforation
17:輸入管線 17: Input pipeline
19:轉接單元 19: Transition unit
191:開口 191: opening
Claims (4)
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CN116411343A (en) * | 2023-06-12 | 2023-07-11 | 江苏微导纳米科技股份有限公司 | Reaction equipment, semiconductor coating equipment and coating method thereof |
CN116791065A (en) * | 2023-07-03 | 2023-09-22 | 拓荆科技(上海)有限公司 | Diffusion member and semiconductor process equipment |
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CN104115300A (en) * | 2012-02-15 | 2014-10-22 | 应用材料公司 | Method for depositing an encapsulating film |
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CN104115300A (en) * | 2012-02-15 | 2014-10-22 | 应用材料公司 | Method for depositing an encapsulating film |
CN103205733A (en) * | 2013-04-27 | 2013-07-17 | 南昌黄绿照明有限公司 | Vertical airflow type MOCVD (Metal-organic Chemical Vapor Deposition) spray head device with multiple gas mixing chambers |
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CN116791065A (en) * | 2023-07-03 | 2023-09-22 | 拓荆科技(上海)有限公司 | Diffusion member and semiconductor process equipment |
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