[go: up one dir, main page]

TWI776380B - Method for bonding dielectric material of electrostatic chuck and device thereof - Google Patents

Method for bonding dielectric material of electrostatic chuck and device thereof Download PDF

Info

Publication number
TWI776380B
TWI776380B TW110103375A TW110103375A TWI776380B TW I776380 B TWI776380 B TW I776380B TW 110103375 A TW110103375 A TW 110103375A TW 110103375 A TW110103375 A TW 110103375A TW I776380 B TWI776380 B TW I776380B
Authority
TW
Taiwan
Prior art keywords
dielectric material
material layer
electrostatic chuck
vacuum suction
height adjustment
Prior art date
Application number
TW110103375A
Other languages
Chinese (zh)
Other versions
TW202230591A (en
Inventor
陳茂雄
Original Assignee
得立亞科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 得立亞科技有限公司 filed Critical 得立亞科技有限公司
Priority to TW110103375A priority Critical patent/TWI776380B/en
Publication of TW202230591A publication Critical patent/TW202230591A/en
Application granted granted Critical
Publication of TWI776380B publication Critical patent/TWI776380B/en

Links

Images

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Adhesives Or Adhesive Processes (AREA)

Abstract

This invention relates to a device for bonding a dielectric material of an electrostatic chuck. In one embodiment, the device comprises: a frame, a plurality of guide pins, a vacuum suction system, and a height adjustment mechanism. The frame comprises a plurality of posts, a top plate, and a bottom plate. The plurality of guide pins protrudes from a top surface of the bottom plate for assisting in positioning. The vacuum suction system comprises a vacuum suction member and a vacuum generator in fluid communication with the vacuum suction member, for enabling the adhesion of the dielectric material to the vacuum suction member. The height adjustment mechanism is mounted to the frame and connected to the vacuum suction member, for adjusting the height of the vacuum suction member. This invention also relates to a method for bonding a dielectric material of an electrostatic chuck.

Description

用於靜電吸盤的介電材料貼合方法及其裝置Dielectric material bonding method and device for electrostatic chuck

本發明係關於靜電吸盤,更具體而言,係關於用於靜電吸盤的介電材料之貼合方法及其裝置。 The present invention relates to electrostatic chucks, and more particularly, to a method and apparatus for laminating dielectric materials for electrostatic chucks.

靜電吸盤被廣泛使用於半導體處理設備(例如,電漿處理腔室)中,以提供對基板(例如,半導體晶圓)的支撐。在進行基板處理的期間,靜電吸盤可利用靜電力吸附基板,從而將其固持於處理設備中的適當位置。 Electrostatic chucks are widely used in semiconductor processing equipment (eg, plasma processing chambers) to provide support for substrates (eg, semiconductor wafers). During substrate processing, electrostatic chucks can use electrostatic forces to attract the substrate, thereby holding it in place in the processing equipment.

靜電吸盤之頂部通常包含一介電材料層,該介電材料層在基板處理期間與上方的基板相接觸。該介電材料層係經由貼合膠而貼合至靜電吸盤的基座。在進行基板處理的過程中,位於靜電吸盤的介電材料層與基座之間的貼合膠會遭受侵蝕(例如,被基板處理期間產生的電漿所侵蝕)而受損。因此,必須定期地更換貼合膠,以維持靜電吸盤的性能。在更換貼合膠的過程中,首先需將靜電吸盤的介電材料層移去,然後對貼合膠進行更換,最後再將該介電材料層重新貼合至更換後的貼合膠上。習知上,介電材料層之貼合步驟係透過人工方式進行。然而,以人工方式進行此步驟存在人為不確定性,因此經常導致對位不準確等問題,進而增加各種重製成本。 The top of the electrostatic chuck typically includes a layer of dielectric material that is in contact with the overlying substrate during substrate processing. The dielectric material layer is attached to the base of the electrostatic chuck via a laminating glue. During substrate processing, the adhesive between the dielectric material layer of the electrostatic chuck and the susceptor can be damaged by erosion (eg, by plasma generated during substrate processing). Therefore, the adhesive must be replaced regularly to maintain the performance of the electrostatic chuck. In the process of replacing the adhesive, the dielectric material layer of the electrostatic chuck needs to be removed first, then the adhesive is replaced, and finally the dielectric material layer is re-applied to the replaced adhesive. Conventionally, the bonding step of the dielectric material layer is performed manually. However, performing this step manually has artificial uncertainty, which often leads to problems such as inaccurate alignment, which in turn increases various reconstruction costs.

在此背景下產生本發明。 It is against this background that the present invention arises.

有鑒於上述問題,本發明提供用於靜電吸盤之介電材料層的貼合裝置及方法,其可更容易地使介電材料層準確且平穩地貼合於靜電吸盤的基座上,使得相較於習知方法而能夠減少重製成本和減低人為不確定性。 In view of the above problems, the present invention provides a bonding device and method for a dielectric material layer of an electrostatic chuck, which can more easily make the dielectric material layer adhere to the base of the electrostatic chuck accurately and smoothly, so that the Compared with conventional methods, it can reduce the cost of remanufacturing and reduce the artificial uncertainty.

依據本發明之實施例而提供一種用於靜電吸盤之介電材料層的貼合裝置,其包含:一構架、複數導引銷、一真空吸附系統、以及一高度調整機構。該構架包含複數立柱、一頂板、以及一底板。複數導引銷從底板之上表面垂直向上突出,且用以協助靜電吸盤的基座及介電材料層之定位。真空吸附系統包含一真空吸附件、以及與真空吸附件流體連通的真空產生器,其中真空吸附系統係配置以藉由真空吸附的方式使介電材料層吸附於真空吸附件。高度調整機構係裝設於構架上並且與真空吸附件連接,其中高度調整機構係配置以調整真空吸附件的高度。 According to an embodiment of the present invention, there is provided a bonding device for a dielectric material layer of an electrostatic chuck, which includes: a frame, a plurality of guide pins, a vacuum adsorption system, and a height adjustment mechanism. The frame includes a plurality of uprights, a top plate, and a bottom plate. A plurality of guide pins protrude vertically upward from the upper surface of the base plate, and are used for assisting the positioning of the base of the electrostatic chuck and the dielectric material layer. The vacuum adsorption system includes a vacuum adsorption member and a vacuum generator in fluid communication with the vacuum adsorption member, wherein the vacuum adsorption system is configured to adsorb the dielectric material layer on the vacuum adsorption member by means of vacuum adsorption. The height adjustment mechanism is installed on the frame and connected with the vacuum suction member, wherein the height adjustment mechanism is configured to adjust the height of the vacuum suction member.

在一實施例中,高度調整機構包含高度調整旋鈕及螺桿,且其中高度調整機構係配置成透過轉動高度調整旋鈕而沿著該螺桿調整真空吸附件的高度。在一實施例中,高度調整機構更包含一高度計,用以量測真空吸附件的高度變化。在一實施例中,真空吸附件的形狀呈U形。 In one embodiment, the height adjustment mechanism includes a height adjustment knob and a screw rod, and wherein the height adjustment mechanism is configured to adjust the height of the vacuum suction member along the screw rod by rotating the height adjustment knob. In one embodiment, the height adjustment mechanism further includes an altimeter for measuring the height change of the vacuum suction member. In one embodiment, the shape of the vacuum suction member is U-shaped.

依據本發明之實施例而提供一種用於靜電吸盤之介電材料層的貼合方法,該方法係使用如本文所述之貼合裝置,該方法包含下列步驟:將塗佈有貼合膠的靜電吸盤之基座放置在貼合裝置的底板上,其中靜電吸盤之基座中的定位孔係與複數導引銷互相對準;啟動真空吸附系統,以藉由真空吸附的 方式使介電材料層吸附於真空吸附件;利用高度調整機構使真空吸附件向下移動,從而使吸附於該真空吸附件的介電材料層向下移動;當介電材料層與塗佈於靜電吸盤之基座上的貼合膠相接觸時,關閉真空吸附系統,以釋放介電材料層;以及將靜電吸盤從貼合裝置中移出。 According to an embodiment of the present invention, a method for laminating a dielectric material layer for an electrostatic chuck is provided. The method uses the laminating device as described herein. The method includes the following steps: The base of the electrostatic chuck is placed on the bottom plate of the laminating device, wherein the positioning holes in the base of the electrostatic chuck and the plurality of guide pins are aligned with each other; The method makes the dielectric material layer adsorb on the vacuum adsorption member; the height adjustment mechanism is used to move the vacuum adsorption member downward, so that the dielectric material layer adsorbed on the vacuum adsorption member moves downwards; When the lamination glue on the base of the electrostatic chuck is in contact, the vacuum suction system is turned off to release the dielectric material layer; and the electrostatic chuck is removed from the lamination device.

藉由以下配合隨附圖式所述之詳細說明,將更清楚本發明的其他態樣。 Other aspects of the present invention will become more apparent from the following detailed description in conjunction with the accompanying drawings.

100:靜電吸盤 100: Electrostatic chuck

102:介電材料層 102: Dielectric material layer

104:貼合膠 104: Lamination glue

106:基座 106: Pedestal

108:冷卻迴路通道 108: Cooling circuit channel

200:貼合裝置 200: Fitting device

202:頂板 202: Top Plate

204:底板 204: Bottom Plate

206:複數立柱 206: Plural columns

208:高度調整機構 208: Height adjustment mechanism

210:真空吸附件 210: Vacuum suction parts

212:複數導引銷 212: Plural guide pins

216:複數校平器 216: Complex Leveler

218:高度調整旋鈕 218: Height adjustment knob

220:高度計 220: Altimeter

222:真空吸附孔 222: Vacuum adsorption hole

400:方法 400: Method

402:步驟 402: Step

404:步驟 404: Step

406:步驟 406: Step

408:步驟 408: Step

410:步驟 410: Steps

A:圓圈 A: circle

圖1為例示性靜電吸盤之橫剖面圖。 1 is a cross-sectional view of an exemplary electrostatic chuck.

圖2為介電材料層之貼合操作的示意圖。 FIG. 2 is a schematic diagram of a bonding operation of a dielectric material layer.

圖3A顯示依據本發明之實施例之貼合裝置的立體圖。 3A shows a perspective view of a laminating device according to an embodiment of the present invention.

圖3B顯示依據本發明之實施例之貼合裝置的側視圖。 3B shows a side view of a laminating device according to an embodiment of the present invention.

圖3C顯示依據本發明之實施例之貼合裝置的俯視圖。 3C shows a top view of a laminating device according to an embodiment of the present invention.

圖3D顯示依據本發明之實施例之貼合裝置的底視圖。 3D shows a bottom view of a laminating device according to an embodiment of the present invention.

圖3E顯示圖3C中之一部分的放大圖。 Figure 3E shows an enlarged view of a portion of Figure 3C.

圖4為依據本發明之實施例的用於靜電吸盤之介電材料層的貼合方法之流程圖。 FIG. 4 is a flow chart of a method for attaching a dielectric material layer for an electrostatic chuck according to an embodiment of the present invention.

本發明之目的、優點和特色由以下數個實施例之詳細說明及伴隨的圖式當可更加明白。 The objects, advantages and features of the present invention will become more apparent from the following detailed description of several embodiments and the accompanying drawings.

圖1為例示性靜電吸盤100之橫剖面圖。如圖所示,靜電吸盤100的底部具有一基座106。此外,靜電吸盤100具有設置在基座106中的冷卻迴路通道108,用以對靜電吸盤100進行冷卻。如上所述,靜電吸盤100的頂部包含一介電材料層102,其在基板處理期間與上方的基板相接觸。 FIG. 1 is a cross-sectional view of an exemplary electrostatic chuck 100 . As shown, the bottom of the electrostatic chuck 100 has a base 106 . In addition, the electrostatic chuck 100 has a cooling circuit channel 108 disposed in the base 106 for cooling the electrostatic chuck 100 . As mentioned above, the top of the electrostatic chuck 100 includes a layer 102 of dielectric material that is in contact with the overlying substrate during substrate processing.

圖2為介電材料層102之貼合操作的示意圖。如圖所示,介電材料層102係透過貼合膠104而貼合至靜電吸盤的基座106。在一些實施例中,貼合膠104之材料為矽膠。在進行貼合的過程中,可將介電材料層102往下朝向基座106移動(如圖2中的箭頭所示之方向),以使介電材料層102與貼合膠104相接觸並貼合,進而使得介電材料層102貼合於靜電吸盤的基座106。 FIG. 2 is a schematic diagram of a bonding operation of the dielectric material layer 102 . As shown in the figure, the dielectric material layer 102 is attached to the base 106 of the electrostatic chuck through the lamination glue 104 . In some embodiments, the material of the adhesive 104 is silicone. During the lamination process, the dielectric material layer 102 can be moved downward toward the base 106 (in the direction shown by the arrow in FIG. 2 ), so that the dielectric material layer 102 is in contact with the lamination glue 104 and Then, the dielectric material layer 102 is attached to the base 106 of the electrostatic chuck.

如上所述,當更換貼合膠之後,習知上通常透過人工方式進行介電材料層之貼合步驟。然而,以人工方式進行此貼合步驟存在人為不確定性,因此經常導致對位不準確等問題,進而增加各種重製成本。 As mentioned above, after replacing the lamination adhesive, conventionally, the lamination step of the dielectric material layer is usually performed manually. However, there is artificial uncertainty in performing this lamination step manually, which often leads to problems such as inaccurate alignment, thereby increasing various reconstruction costs.

如本文所述,本發明揭示靜電吸盤之介電材料層的貼合方法及其裝置,以改善上述問題。在本文所述之實施例中,透過一貼合裝置進行貼合操作。與先前的貼合方式相比,本發明之貼合裝置及方法使得介電材料層能夠更準確且更平穩地貼合於靜電吸盤上,進而可使成本獲得改善。 As described herein, the present invention discloses a method and apparatus for attaching a dielectric material layer of an electrostatic chuck to improve the above problems. In the embodiments described herein, the lamination operation is performed by a lamination device. Compared with the previous lamination methods, the lamination device and method of the present invention enables the dielectric material layer to be attached to the electrostatic chuck more accurately and stably, thereby improving the cost.

依據本發明之實施例,圖3A顯示貼合裝置200的立體圖。從圖3A中可看出,貼合裝置200的構架包含頂板202、底板204、及複數立柱206,其界定出貼合裝置200的框架部分。其中,複數立柱206係用於為貼合裝置200提供支撐,且係環繞貼合裝置200而間隔設置。此外,頂板202位在貼合裝置200的頂部,並且與複數立柱206之每一者的上端連接,而底板204位在貼合裝置200的底部,並且與複數立柱206之每一者的下端連接。 FIG. 3A shows a perspective view of the laminating device 200 according to an embodiment of the present invention. As can be seen in FIG. 3A , the frame of the laminating device 200 includes a top plate 202 , a bottom plate 204 , and a plurality of uprights 206 , which define the frame portion of the laminating device 200 . The plurality of uprights 206 are used to provide support for the laminating device 200 and are arranged at intervals around the laminating device 200 . In addition, the top plate 202 is located at the top of the lamination device 200 and is connected to the upper end of each of the plurality of uprights 206, and the bottom plate 204 is located at the bottom of the lamination device 200 and is connected to the lower end of each of the plurality of uprights 206 .

依據本發明之實施例,圖3B顯示貼合裝置200的側視圖,其中靜電吸盤的基座106已被放置於該貼合裝置200中。如圖3B所示,貼合裝置200具有從其底板204之上表面垂直向上突出的複數導引銷212。該複數導引銷212係用以協助靜電吸盤的基座及介電材料層之定位。具體而言,靜電吸盤的基座及介電材料層各自具有上下貫穿的複數定位孔,其可與該複數導引銷212互相對準以促進定位。此外,貼合裝置200包含一真空吸附系統,其包含真空吸附件210、以及與真空吸附件210流體連通的真空產生器(未圖示)。該真空吸附系統係配置以藉由真空吸附的方式使介電材料層吸附於真空吸附件210。 FIG. 3B shows a side view of the lamination device 200 in which the base 106 of the electrostatic chuck has been placed, according to an embodiment of the present invention. As shown in FIG. 3B , the bonding device 200 has a plurality of guide pins 212 protruding vertically upward from the upper surface of the bottom plate 204 thereof. The plurality of guide pins 212 are used to assist the positioning of the base and the dielectric material layer of the electrostatic chuck. Specifically, the base of the electrostatic chuck and the dielectric material layer each have a plurality of positioning holes penetrating up and down, which can be aligned with the plurality of guide pins 212 to facilitate positioning. In addition, the laminating device 200 includes a vacuum suction system including a vacuum suction member 210 and a vacuum generator (not shown) in fluid communication with the vacuum suction member 210 . The vacuum adsorption system is configured to adsorb the dielectric material layer on the vacuum adsorption member 210 by means of vacuum adsorption.

再者,貼合裝置200可包含一高度調整機構208,其係裝設於該貼合裝置200的構架上。該高度調整機構208係與真空吸附件210連接,且係配置以調整真空吸附件210的高度。因此,高度調整機構208可在貼合操作期間使吸附於真空吸附件210的介電材料層垂直地移動,以將介電材料層貼合至置於下方的基座106。在一些實施例中,高度調整機構208可包含高度調整旋鈕218及螺桿(未圖示),並且該高度調整機構208係配置成能夠透過轉動高度調整旋鈕218而沿著該螺桿調整真空吸附件210的高度。在此等實施例中,應用螺旋機制以將旋轉運動變換為直線運動,從而可透過手動地轉動高度調整旋鈕218而對高度進行調整。在一些實施例中,高度調整機構208可包含一高度計220,用以量測真空吸附件210的高度變化,亦即,用以量測介電材料層的高度變化。此外,在一些實施例中,貼合裝置200可包含複數校平器216,用以調整貼合裝置200的水平度。 Furthermore, the laminating device 200 may include a height adjustment mechanism 208 , which is installed on the frame of the laminating device 200 . The height adjustment mechanism 208 is connected to the vacuum suction member 210 and is configured to adjust the height of the vacuum suction member 210 . Therefore, the height adjustment mechanism 208 can move the dielectric material layer adsorbed on the vacuum suction member 210 vertically during the lamination operation to attach the dielectric material layer to the underlying base 106 . In some embodiments, the height adjustment mechanism 208 may include a height adjustment knob 218 and a screw (not shown), and the height adjustment mechanism 208 is configured to adjust the vacuum suction member 210 along the screw by rotating the height adjustment knob 218 the height of. In these embodiments, a helical mechanism is applied to convert rotational motion to linear motion so that height adjustments can be made by manually turning height adjustment knob 218 . In some embodiments, the height adjustment mechanism 208 may include an altimeter 220 for measuring the height change of the vacuum suction member 210 , that is, for measuring the height change of the dielectric material layer. In addition, in some embodiments, the bonding device 200 may include a plurality of levelers 216 for adjusting the levelness of the bonding device 200 .

依據本發明之實施例,圖3C顯示貼合裝置200的俯視圖。雖然在此圖式中繪示之複數導引銷212的數量為三個,但應理解,複數導引銷 212的數量未必為三個。在一些實施例中,真空吸附件210的形狀可呈U形(如圖3C所示),用以吸附介電材料層的邊緣區域。具體而言,將真空吸附件210的形狀選擇為U形,可避免在吸附時接觸介電材料層的非邊緣區域(用於支撐基板的主要區域)而對其造成影響或損害,但同時又可具有充足的吸附面積。應理解,雖然在此實施例中使用U形的真空吸附件210,但真空吸附件210亦可具有任何其他的形狀。在一些實施例中,真空吸附件210係配置成能夠將介電材料層吸附於真空吸附件210的下表面。在此等實施例中,真空吸附件210可具有在下表面上間隔排列的複數真空吸附孔。當啟動真空吸附系統時(例如啟動相關的真空產生器),可透過真空吸附件210上的該等真空吸附孔而吸附介電材料層。 FIG. 3C shows a top view of the laminating device 200 according to an embodiment of the present invention. Although the number of the plurality of guide pins 212 shown in this figure is three, it should be understood that the plurality of guide pins The number of 212 is not necessarily three. In some embodiments, the shape of the vacuum suction member 210 may be a U-shape (as shown in FIG. 3C ) for suctioning the edge region of the dielectric material layer. Specifically, the shape of the vacuum suction member 210 is selected to be U-shaped, so as to avoid contacting the non-edge area of the dielectric material layer (the main area for supporting the substrate) during suction and causing it to be affected or damaged, but at the same time Can have sufficient adsorption area. It should be understood that although the U-shaped vacuum suction member 210 is used in this embodiment, the vacuum suction member 210 may also have any other shape. In some embodiments, the vacuum suction member 210 is configured to be capable of attracting the dielectric material layer to the lower surface of the vacuum suction member 210 . In these embodiments, the vacuum suction member 210 may have a plurality of vacuum suction holes arranged at intervals on the lower surface. When the vacuum adsorption system is activated (eg, the related vacuum generator is activated), the dielectric material layer can be adsorbed through the vacuum adsorption holes on the vacuum adsorption member 210 .

依據本發明之實施例,圖3D顯示貼合裝置200的底視圖。可看出,貼合裝置200可包含複數定位銷(在圖中係以空心圓圈表示),用以協助靜電吸盤之定位。依據本發明之實施例,圖3E為圖3C中之一部分(在圓圈A內的部分)的放大圖,其顯示出例示性的真空吸附孔222。在此實施例中,複數的真空吸附孔222係位在真空吸附件210的下側,此處為了說明之目的而將其以虛線表示。 FIG. 3D shows a bottom view of the laminating device 200 according to an embodiment of the present invention. It can be seen that the bonding device 200 may include a plurality of positioning pins (represented by open circles in the figure) for assisting the positioning of the electrostatic chuck. FIG. 3E is an enlarged view of a portion of FIG. 3C (the portion within circle A) showing exemplary vacuum suction holes 222 in accordance with an embodiment of the present invention. In this embodiment, the plurality of vacuum suction holes 222 are located on the lower side of the vacuum suction member 210 , which are represented by dotted lines here for the purpose of illustration.

依據本發明之實施例,圖4為用於靜電吸盤之介電材料層的貼合方法400之流程圖,該方法400係使用如上所述之貼合裝置。如圖4所示,方法400包含步驟402、404、406、408、及410。在步驟402中,將塗佈有貼合膠的靜電吸盤之基座放置在該貼合裝置的底板上,其中該靜電吸盤之基座中的定位孔係與複數導引銷互相對準。在步驟404中,啟動該真空吸附系統,以藉由真空吸附的方式將介電材料層吸附於該真空吸附件。在步驟406中,利用 高度調整機構使真空吸附件向下移動,從而使吸附於該真空吸附件的介電材料層向下移動。在步驟408中,當介電材料層與塗佈於靜電吸盤之基座上的貼合膠相接觸並貼合時,關閉真空吸附系統,以釋放該介電材料層。在步驟410中,將靜電吸盤從貼合裝置中移出。 FIG. 4 is a flowchart of a method 400 for laminating a dielectric material layer for an electrostatic chuck, which method 400 uses the laminating apparatus described above, according to an embodiment of the present invention. As shown in FIG. 4 , method 400 includes steps 402 , 404 , 406 , 408 , and 410 . In step 402, the base of the electrostatic chuck coated with the adhesive is placed on the bottom plate of the laminating device, wherein the positioning holes in the base of the electrostatic chuck are aligned with the plurality of guide pins. In step 404, the vacuum adsorption system is activated to adsorb the dielectric material layer to the vacuum adsorption member by vacuum adsorption. In step 406, use The height adjustment mechanism moves the vacuum suction member downward, so that the dielectric material layer adsorbed on the vacuum suction member moves downward. In step 408, when the dielectric material layer is in contact with and adhered to the adhesive applied on the base of the electrostatic chuck, the vacuum suction system is turned off to release the dielectric material layer. In step 410, the electrostatic chuck is removed from the applicator.

如上所述,透過使用依據本發明之用於靜電吸盤之介電材料層的貼合裝置及方法,可使得貼合操作的準確性增加,進而達到減少重製成本之目的。此外,藉由使用依據本發明之貼合裝置及方法,亦可使貼合過程簡化,進而減低人為不確定性。再者,與其他機械式夾持方式相比,藉由真空吸附方式進行的貼合操作亦可使得拾取與釋放介電材料層的過程更為平穩。 As described above, by using the bonding apparatus and method for a dielectric material layer of an electrostatic chuck according to the present invention, the accuracy of the bonding operation can be increased, thereby reducing the remanufacturing cost. In addition, by using the lamination device and method according to the present invention, the lamination process can also be simplified, thereby reducing human uncertainty. Furthermore, compared with other mechanical clamping methods, the lamination operation performed by the vacuum adsorption method can also make the process of picking up and releasing the dielectric material layer more stable.

儘管上述實施例已為了清楚理解之目的而詳細地加以描述,但顯然地,在所附申請專利範圍之範疇中,可實行某些變更及修改。應當注意,有許多替代的方式來實施本案實施例之方法及設備。因此,本案實施例應被視為是用於說明的而不是限制性的,且本案實施例不應被限制於本文中所提出之特定細節。 Although the foregoing embodiments have been described in detail for purposes of clarity of understanding, it will be apparent that certain changes and modifications may be practiced within the scope of the appended claims. It should be noted that there are many alternative ways to implement the method and apparatus of the present embodiments. Accordingly, the present embodiments should be regarded as illustrative rather than restrictive, and the present embodiments should not be limited to the specific details set forth herein.

200:貼合裝置 202:頂板 204:底板 206:複數立柱 208:高度調整機構 200: Fitting device 202: Top Plate 204: Bottom Plate 206: Plural columns 208: Height adjustment mechanism

Claims (5)

一種用於靜電吸盤之介電材料層的貼合裝置,包含: 一構架,其包含: 複數立柱,用於為該貼合裝置提供支撐; 一頂板,位於該貼合裝置的頂部,且與該複數立柱之每一者的上端連接;以及 一底板,位於該貼合裝置的底部,且與該複數立柱之每一者的下端連接; 複數導引銷,其從該底板之上表面垂直向上突出,且用以協助該靜電吸盤的基座及該介電材料層之定位; 一真空吸附系統,其包含一真空吸附件、以及與該真空吸附件流體連通的真空產生器,其中該真空吸附系統係配置以藉由真空吸附的方式使該介電材料層吸附於該真空吸附件;以及 一高度調整機構,其係裝設於該構架上並且與該真空吸附件連接,其中該高度調整機構係配置以調整該真空吸附件的高度。 A bonding device for a dielectric material layer of an electrostatic chuck, comprising: A framework comprising: a plurality of uprights for providing support for the fitting device; a top plate located on top of the fitting device and connected to the upper end of each of the plurality of uprights; and a bottom plate located at the bottom of the fitting device and connected to the lower end of each of the plurality of uprights; a plurality of guide pins, which protrude vertically upward from the upper surface of the base plate, and are used for assisting the positioning of the base of the electrostatic chuck and the dielectric material layer; A vacuum adsorption system comprising a vacuum adsorption member and a vacuum generator in fluid communication with the vacuum adsorption member, wherein the vacuum adsorption system is configured to adsorb the dielectric material layer to the vacuum adsorption by means of vacuum adsorption pieces; and A height adjustment mechanism is installed on the frame and connected with the vacuum suction member, wherein the height adjustment mechanism is configured to adjust the height of the vacuum suction member. 如請求項1所述之用於靜電吸盤之介電材料層的貼合裝置,其中該高度調整機構包含高度調整旋鈕及螺桿,且其中該高度調整機構係配置成透過轉動該高度調整旋鈕而沿著該螺桿調整該真空吸附件的高度。The laminating device for a dielectric material layer of an electrostatic chuck according to claim 1, wherein the height adjustment mechanism comprises a height adjustment knob and a screw rod, and wherein the height adjustment mechanism is configured to rotate the height adjustment knob along the Adjust the height of the vacuum suction member along the screw. 如請求項1所述之用於靜電吸盤之介電材料層的貼合裝置,其中該高度調整機構更包含一高度計,用以量測該真空吸附件的高度變化。The bonding device for the dielectric material layer of the electrostatic chuck according to claim 1, wherein the height adjustment mechanism further comprises an altimeter for measuring the height change of the vacuum suction member. 如請求項1所述之用於靜電吸盤之介電材料層的貼合裝置,其中該真空吸附件的形狀呈U形。The bonding device for a dielectric material layer of an electrostatic chuck according to claim 1, wherein the shape of the vacuum suction member is U-shaped. 一種用於靜電吸盤之介電材料層的貼合方法,該方法係使用如請求項1至4其中任一項所述之用於靜電吸盤之介電材料層的貼合裝置,該方法包含下列步驟: 將塗佈有貼合膠的該靜電吸盤之基座放置在該貼合裝置的該底板上,其中該靜電吸盤之該基座中的定位孔係與該複數導引銷互相對準; 啟動該真空吸附系統,以藉由真空吸附的方式使該介電材料層吸附於該真空吸附件; 利用該高度調整機構使該真空吸附件向下移動,從而使吸附於該真空吸附件的該介電材料層向下移動; 當該介電材料層與塗佈於該靜電吸盤之該基座上的該貼合膠相接觸時,關閉該真空吸附系統,以釋放該介電材料層;以及 將該靜電吸盤從該貼合裝置中移出。 A bonding method for a dielectric material layer of an electrostatic chuck, the method using the bonding device for a dielectric material layer of an electrostatic chuck as described in any one of claims 1 to 4, the method comprising the following step: placing the base of the electrostatic chuck coated with the adhesive on the bottom plate of the laminating device, wherein the positioning holes in the base of the electrostatic chuck are aligned with the plurality of guide pins; Activate the vacuum adsorption system to adsorb the dielectric material layer on the vacuum adsorption member by vacuum adsorption; Use the height adjustment mechanism to move the vacuum suction member downward, so that the dielectric material layer adsorbed on the vacuum suction member moves downward; When the dielectric material layer is in contact with the adhesive coated on the base of the electrostatic chuck, turning off the vacuum suction system to release the dielectric material layer; and Remove the electrostatic chuck from the applicator.
TW110103375A 2021-01-29 2021-01-29 Method for bonding dielectric material of electrostatic chuck and device thereof TWI776380B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW110103375A TWI776380B (en) 2021-01-29 2021-01-29 Method for bonding dielectric material of electrostatic chuck and device thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110103375A TWI776380B (en) 2021-01-29 2021-01-29 Method for bonding dielectric material of electrostatic chuck and device thereof

Publications (2)

Publication Number Publication Date
TW202230591A TW202230591A (en) 2022-08-01
TWI776380B true TWI776380B (en) 2022-09-01

Family

ID=83782442

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110103375A TWI776380B (en) 2021-01-29 2021-01-29 Method for bonding dielectric material of electrostatic chuck and device thereof

Country Status (1)

Country Link
TW (1) TWI776380B (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180151402A1 (en) * 2016-11-25 2018-05-31 Applied Materials, Inc. Ceramic electrostatic chuck having a v-shape seal band

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180151402A1 (en) * 2016-11-25 2018-05-31 Applied Materials, Inc. Ceramic electrostatic chuck having a v-shape seal band

Also Published As

Publication number Publication date
TW202230591A (en) 2022-08-01

Similar Documents

Publication Publication Date Title
CN110544664B (en) Holding device and method for holding substrate
JP4545393B2 (en) Substrate fixing apparatus and substrate fixing method for thin film deposition apparatus
US10403490B2 (en) Wafer processing method
US20140009183A1 (en) Semiconductor testing jig and semiconductor testing method performed by using the same
JP2001298072A (en) Electrostatic chucking device and vacuum processing device using the same
CN113795907B (en) Substrate bonding device and substrate bonding method
TWI762978B (en) Grounding mechanism for multi-layer for electrostatic chuck, and related methods
CN109137029A (en) Lip seal and contact elements for semi-conductor electricity plating appts
JP2019121646A (en) Method of processing wafer
JP2014017380A (en) Heat transfer sheet pasting device and heat transfer sheet pasting method
TW200525599A (en) Attaching apparatus and method
TWI679293B (en) Film forming device
TWI776380B (en) Method for bonding dielectric material of electrostatic chuck and device thereof
TWI685556B (en) Cutting processing method of workpiece
JP2009302237A (en) Tape applying device
KR102176615B1 (en) Apparatus and Method for Transferring Disply Element
CN111834276B (en) Bare core ejector and bare core pickup device comprising same
JP2005166908A (en) Ball mounting apparatus
CN118658825A (en) Bonding device and bonding method
JP2020053473A (en) Method for manufacturing element chip
KR20120087462A (en) Substrate bonding apparatus and substrate bonding method
KR101288864B1 (en) Substrate bonding apparatus
JP2010182814A (en) Wafer holding mechanism
JPH1187419A (en) Method and apparatus for mounting conductive ball
KR20180124758A (en) Wafer processing method

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent