TWI734238B - Classification equipment and temperature control device - Google Patents
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Abstract
本創作提供一種溫控裝置,可組裝於電子元件分類設備以對電子元件 進行溫度控制,該溫控裝置具有兩治具與一加壓器,兩治具各具有一溫控器,加壓器設置於該二治具,用以對該二治具施加一接合壓力,使該二治具相互接觸且相互擠壓,從而提高該二治具之間的溫度傳導率。 This creation provides a temperature control device that can be assembled in electronic component sorting equipment to compare electronic components For temperature control, the temperature control device has two jigs and a pressurizer, each of the two jigs has a temperature controller, and the pressurizer is arranged on the two jigs to apply a joining pressure to the two jigs, The two jigs are made to contact and squeeze each other, thereby increasing the temperature conductivity between the two jigs.
Description
本創作是關於一種應用於電子元件測試分類設備中的溫控裝置,尤指能夠在電子元件的測試分類作業過程中對電子元件進行溫度控制者。 This creation is about a temperature control device used in electronic component testing and classification equipment, especially those who can control the temperature of electronic components during the testing and classification of electronic components.
由於電子裝置不斷地擴展應用至各種裝置,電子元件的品質與可靠度也備受挑戰,為確保在市面銷售的電子元件能在各種環境中正常運作,需要在電子元件生產完成後進行指定之高、低溫環境運作測試,以淘汰出不良品。 As electronic devices continue to be applied to various devices, the quality and reliability of electronic components are also challenged. To ensure that electronic components sold on the market can operate normally in various environments, it is necessary to specify a high level after the production of electronic components is completed. , Operation test in low temperature environment to eliminate defective products.
現有的電子元件測試分類設備,已有能夠控制電子元件的溫度並進行測試者,例如TWI403732號專利即利用測試分類機的下壓頭進行溫度控制,而能將電子元件保持於預定的測試溫度進行測試。 Existing electronic component testing and classification equipment, there are already those who can control the temperature of electronic components and perform testing. For example, the TWI403732 patent uses the lower pressure head of the test classification machine to perform temperature control, and can maintain the electronic components at a predetermined test temperature. test.
上述電子元件測試分類設備雖然能控制電子元件的溫度,但是當電子元件預定的測試溫度條件較嚴苛時,例如需要在-20℃甚或-40℃至-60℃之極低溫條件進行測試時,將需要在下壓頭中設置二組甚至多組溫度控制器,以串聯降溫達成低溫目標或區分多階段不同目標溫度進行控制,而各組溫度控制 器之間若溫度傳導效率不佳,將會使串聯降溫或溫度控制的效率與準確度下降,需要耗費更多能源才能達成預定的目標溫度。 Although the above-mentioned electronic component testing and classification equipment can control the temperature of electronic components, when the predetermined test temperature conditions of the electronic components are relatively strict, for example, when the test needs to be performed at -20°C or even extremely low temperature conditions of -40°C to -60°C, It will be necessary to set up two or even multiple sets of temperature controllers in the lower pressure head to achieve low-temperature targets in series for cooling or to distinguish between multiple stages and different target temperatures for control, and each set of temperature control If the temperature conduction efficiency between the devices is not good, the efficiency and accuracy of the series cooling or temperature control will be reduced, and more energy will be needed to achieve the predetermined target temperature.
因此,本創作的其中一項目的在於對電子元件測試分類設備的壓接設備或溫控設備進行改造,以期能提高壓接設備或溫控設備內部的溫度傳導效率。 Therefore, one of the purposes of this creation is to modify the crimping equipment or temperature control equipment of the electronic component testing and classification equipment, in order to improve the temperature conduction efficiency of the crimping equipment or the temperature control equipment.
為達成上述目的與其他目的,本創作提供一種溫控裝置,適於控制電子元件的溫度以供執行測試作業,該溫控裝置包括第一治具、第二治具與加壓器。第一治具具有第一接合面以及第一溫控器,該第一溫控器能改變該第一接合面的溫度。第二治具具有第二接合面、溫控面以及第二溫控器,該第二溫控器能改變該溫控面的溫度。加壓器受驅動以向該第一接合面與該第二接合面中至少一者提供接合壓力,使該第一接合面與該第二接合面其中一者朝向另一者接觸且擠壓而減少接觸表面縫隙,以致提高該第一接合面與該第二接合面之間的溫度傳導率。 In order to achieve the above and other objectives, the present invention provides a temperature control device suitable for controlling the temperature of electronic components for performing test operations. The temperature control device includes a first jig, a second jig and a pressurizer. The first jig has a first joint surface and a first temperature controller, and the first temperature controller can change the temperature of the first joint surface. The second jig has a second joint surface, a temperature control surface, and a second temperature controller, and the second temperature controller can change the temperature of the temperature control surface. The presser is driven to provide joining pressure to at least one of the first joining surface and the second joining surface, so that one of the first joining surface and the second joining surface contacts and presses toward the other. The contact surface gap is reduced, so as to increase the temperature conductivity between the first joint surface and the second joint surface.
為達成上述目的與其他目的,本創作還提供一種壓接裝置,適於對電子元件執行壓接作業,並控制該電子元件的溫度,該壓接裝置包括第一治具、第二治具與壓接臂。第一治具具有第一接合面以及第一溫控器,該第一溫控器能改變該第一接合面的溫度。第二治具具有第二接合面、溫控面以及第二溫控器,該第二溫控器能改變該溫控面的溫度。該第一治具設置於該壓接臂,該第一治具位於該壓接臂與該第二治具之間,該壓接臂能沿一作業方向移動以帶動該第一治具及該第二治具移動,使該第二治具壓抵該電子元件;其中該第二治具壓抵該電子元件時,該壓接臂帶動該第一治具以向該第一接合面提供接合壓力,使該第一接合面朝向該第二接合面接觸且擠壓而減少接觸表面縫隙,以致提高該第一接合面與該第二接合面之間的溫度傳導率。 In order to achieve the above and other objectives, the present invention also provides a crimping device suitable for performing crimping operations on electronic components and controlling the temperature of the electronic components. The crimping device includes a first jig, a second jig, and Crimping arm. The first jig has a first joint surface and a first temperature controller, and the first temperature controller can change the temperature of the first joint surface. The second jig has a second joint surface, a temperature control surface, and a second temperature controller, and the second temperature controller can change the temperature of the temperature control surface. The first jig is disposed on the crimping arm, the first jig is located between the crimping arm and the second jig, and the crimping arm can move in an operating direction to drive the first jig and the The second jig moves to make the second jig press against the electronic component; wherein when the second jig presses against the electronic component, the crimping arm drives the first jig to provide bonding to the first joint surface The pressure causes the first joint surface to contact and squeeze toward the second joint surface to reduce the contact surface gap, so as to increase the temperature conductivity between the first joint surface and the second joint surface.
藉此,本創作提供的溫控裝置與壓接裝置,能利用加壓器或壓接臂向第一治具與第二治具施加接合壓力,提高第一治具與第二治具之間的溫度傳導率,而能獲得降低能源消耗,提高溫度控制準確度的使用效果。 In this way, the temperature control device and crimping device provided by this creation can use a pressurizer or a crimping arm to apply a joining pressure to the first jig and the second jig, thereby improving the gap between the first jig and the second jig. High temperature conductivity, and can achieve the effect of reducing energy consumption and improving the accuracy of temperature control.
本實施例揭露一種壓接裝置,可供組裝於電子元件的分類設備中,進一步配合測試設備以對電子元件執行測試分類作業。請參考第1圖,電子元件的分類設備包括機台10、供料裝置20、收料裝置30、輸送裝置40、壓接裝置50以及中央控制裝置60,能夠設置並搭配測試設備70,共同執行電子元件的測試及分類作業。
This embodiment discloses a crimping device that can be assembled into a sorting device for electronic components, and further cooperates with a testing device to perform test sorting operations on the electronic components. Please refer to Figure 1. The electronic component classification equipment includes a
機台10例如是平台式機架,具有作業平面11以供供料裝置20、收料裝置30、輸送裝置40與壓接裝置50安裝於其上,在作業平面11上輸送電子元件99並進行預定的測試作業,機台10於作業平面11中有測試區12,可供測試設備70安裝於測試區12中與測試區12下方。
The
供料裝置20配置於機台10的作業平面11,供設置一個或數個電子元件之料盤91,於料盤91容納一個至數個待測試之電子元件99。收料裝置30配置於機台10的作業平面11,供設置一個至數個可承載已測試電子元件之料盤92,於料盤92容納已測試之電子元件99’。輸送裝置40配置於機台10的作業平面11,具有一個至數個移料器而能輸送電子元件,具體而言,輸送裝置40包括能夠移載電子元件之取放器41、42與能夠承載電子元件橫向移動的滑軌載台組43、44,取放器41、42各自具有能橫向與縱向移動的滑軌,可由取放器41從供料裝置20處拿取電子元件99,將電子元件99放置於滑軌載台組43,滑軌載台組43將電子元件移送至測試區12旁側,以等待進行測試,完成測試作業的電子元件則可由另一滑軌載台組44從測試區12旁側移送至取放器42處,取放器42再從滑軌載台組44拿取電子元件並放置於收料裝置30處的料盤92。壓接裝置50配置於機台10,機台10另具有縱向延伸的驅動單元13,而能帶動壓接裝置50縱向移動,使壓接裝置50能在滑軌載台組43、44與測試區12之間移動,從滑軌載台組43拿取電子元件,移動並壓接於測試區12中設置的測試設備70進行測試,待測試完成後再將電子元件拿取、移動並放置於滑軌載台組44。
The
在本實施例中,壓接裝置50能受驅動單元13帶動而縱向移動,在滑軌載台組43、44與測試區12之間搬移電子元件,惟若省略驅動單元,改以滑軌載台組直接將電子元件輸送至測試區,並以壓接裝置升降取放電子元件,亦屬可行。
In this embodiment, the
中央控制裝置60例如是晶片,較佳者為系統單晶片,配置於機台10,並且連接於供料裝置20、收料裝置30、輸送裝置40與壓接裝置50,並且預載了控制邏輯,而能控制及整合供料裝置20、收料裝置30、輸送裝置40與壓接裝置50動作,以執行自動化作業,將供料裝置20所容納的電子元件依序輸送至測試區12供測試設備70進行測試,再將測試完成的電子元件依序輸送並容納於收料裝置30中。
The
請參考第2圖,本創作壓接裝置包括壓接臂51與溫控裝置,溫控裝置則包括第一治具52、第二治具53與加壓器54。
Please refer to FIG. 2, the crimping device of this creation includes a
壓接臂51為長直桿,於壓接臂51的底端設置該溫控裝置,於壓接臂51的頂端設有馬達螺桿組而能帶動壓接臂51沿作業方向升降移動,帶動溫控裝置一同升降移動,帶動壓接臂51升降移動的馬達螺桿組的具體結構,例如可參考TWI635551或TWI618667號專利所述。
The crimping
溫控裝置中的第一治具52,其頂部設置於壓接臂51,底部具有第一接合面521,其中,第一治具52包含殼體522、蓋體523與第一溫控器,蓋體523蓋闔於殼體522頂部並連接於壓接臂51與殼體522之間,第一接合面521則位於殼體522的底面,第一溫控器為冷卻器,包括穿伸於殼體522的流道524,供使用者將流道524連接於介質供應源,介質供應源例如是泵或壓縮機,能將冷水或冷媒等流體介質供應至流道524,以將第一治具52降溫,從而改變第一接合面521的溫度。在本創作其他可能的實施例中,第一溫控器也可改以熱水作為流體介質,或將第一溫控器改設置為其他加熱器或致冷晶片。
The
需進一步說明的是,所述的改變第一接合面521的溫度,是指具有第一溫控器的情形與不具第一溫控器的情形相比,第一接合面521會有不同
的溫度,不限於第一溫控器具有主動升溫或降溫的能力,若省略流道524而改將被動散熱之散熱器或散熱漆作為第一溫控器,將散熱器或散熱漆設置於第一治具的表面進行散熱,仍可降低而改變第一接合面的溫度,均屬本創作第一溫控器所可能採用的具體實施方式。
It should be further explained that the change of the temperature of the first
第二治具53位於第一治具52下方,第二治具53頂部具有第二接合面531,第二接合面531面對第一接合面521並且能與第一接合面521接觸,第二治具53底部具有溫控面532,第二治具53包括基座533、第二溫控器534與下壓治具535,第二接合面531位於基座533的頂面,第二溫控器534與下壓治具535設置於基座533,且第二溫控器534被夾抵於基座533與下壓治具535之間,第二溫控器534例如是加熱器或致冷晶片,或者第二溫控器534亦可為與第一溫控器相同或相似形式的冷卻器,溫控面532位於下壓治具535的底面,下壓治具535能利用例如真空吸引的方式拿取與釋放電子元件,而於拿取電子元件時以溫控面532接觸電子元件,藉此,第二溫控器534能加熱或冷卻下壓治具535,改變下壓治具535的溫度,從而改變溫控面532的溫度,對電子元件進行溫度控制。除上述結構之外,如果將基座533改變為環形,圍繞於第二溫控器周圍,或直接將基座533省略去除,僅以第二溫控器與下壓治具結合,第二接合面則位於第二溫控器的頂面,或者將第二溫控器設置於下壓治具535的底部,也均屬本創作可行的具體實施方式。
The
加壓器54設置於第一治具52與第二治具53,以帶動第二治具53向第一治具52移動接觸並擠壓第一治具52,使第二接合面531接觸並擠壓第一接合面521,在第二接合面531與第一接合面521之間施加一接合壓力,降低第二接合面531與第一接合面521之間的接觸表面縫隙;更詳細地說,加壓器54包括驅動單元541與連結件542,驅動單元541例如是氣壓缸或馬達螺桿組,可受氣
壓或電力驅動而帶動連結件542移動,驅動單元541設置於第一治具的殼體522,連結件542設置於第二治具的基座533,而於連結件542移動時帶動第二治具53移動接近或遠離第一治具52,驅動單元541能在第二接合面531接觸第一接合面521後繼續施加壓力壓抵第一治具52,而對第一接合面521與第二接合面531施予接合壓力。在本創作其他可能的實施例中,也可以改將驅動單元設置於基座,並將連結件設置於殼體,而仍具本實施例相同的使用功能。
The
請參考第3圖至第5圖,驅動單元541能帶動連結件542與第二治具移動,使第二接合面531與第一接合面521接觸,由於物體表面在微觀尺度下為粗糙起伏且不平整的表面,第一接合面521與第二接合面531雖然接觸,但其中仍會存在許多表面縫隙,如第4圖所示,表面縫隙有如許多的小型氣室,阻隔於第一接合面521與第二接合面531之間,而致第一接合面521與第二接合面531之間的溫度傳導率不佳,亦即熱傳導係數低落;驅動單元541對連結件542與第二治具繼續施加壓力後,會在第一接合面521與第二接合面531之間施加接合壓力,在微觀尺度下會使第一接合面521與第二接合面531的表面發生些微變形,擠壓表面縫隙而使其縮小,如第5圖所示,提高微觀尺度中第一接合面521與第二接合面531的接觸面積,從而提高第一接合面521與第二接合面531之間的溫度傳導率,亦即提高熱傳導係數。
Please refer to Figures 3 to 5, the
藉此,當壓接裝置拿取電子元件並壓接進行測試時,可利用溫控裝置對電子元件的溫度進行控制。溫控裝置由第一溫控器、第一接合面、第二接合面、第二溫控器與溫控面串聯形成一熱流路徑,由加壓器驅動第二治具移動接觸第一治具,並且向第一接合面與第二接合面提供接合壓力,使第一接合面與第二接合面之間的溫度傳導率提高;第一溫控器可採用功率較大的冷卻器,利用冷媒等介質將第一接合面降溫,並藉由第一接合面與第二接合面之間 的溫度傳導而使第二治具降溫,第二溫控器則可以採用功率較小的冷卻器或致冷晶片,利用熱電效應引致連結件與下壓治具之間的溫度差,使下壓治具獲得進一步的降溫,從而使溫控面降溫,對電子元件進行溫度控制。 Thereby, when the crimping device takes the electronic components and crimps them for testing, the temperature control device can be used to control the temperature of the electronic components. The temperature control device is composed of a first temperature controller, a first joint surface, a second joint surface, a second temperature controller and a temperature control surface in series to form a heat flow path, and the second jig is driven by the pressurizer to move and contact the first jig , And provide bonding pressure to the first bonding surface and the second bonding surface, so that the temperature conductivity between the first bonding surface and the second bonding surface is improved; the first temperature controller can be a cooler with a larger power, using a refrigerant And other medium to cool the first joint surface, and through the gap between the first joint surface and the second joint surface The second thermostat can use a cooler or refrigerating chip with less power to cause the temperature difference between the connecting piece and the lower pressure jig to cause the lower pressure The fixture is further cooled, so that the temperature control surface is cooled down, and the temperature of the electronic components is controlled.
當電子元件達到目標溫度後,如果需要再將電子元件控制至另一溫度,例如將測試完成的低溫電子元件的溫度回升,避免結露,則第二溫控器可以採用加熱器或致冷晶片,利用第二溫控器加熱下壓治具,或控制連結件與下壓治具之間的溫度差,而將溫控面控制於另一預定的目標溫度,此時,可以控制加壓器釋放接合壓力,使第一接合面與第二接合面的溫度傳導率下降,甚或控制第二治具移動而使第一接合面與第二接合面分離,由如第3圖所示的狀態回復至如第2圖所示的狀態,單獨由第二溫控器控制溫控面與電子元件的溫度,減少第一治具的低溫影響。 When the electronic component reaches the target temperature, if the electronic component needs to be controlled to another temperature, for example, the temperature of the low-temperature electronic component after the test is raised to avoid condensation, the second temperature controller can be a heater or a cooling chip. Use the second thermostat to heat the pressing tool, or control the temperature difference between the connector and the pressing tool, and control the temperature control surface to another predetermined target temperature. At this time, the pressurizer can be controlled to release The bonding pressure reduces the temperature conductivity of the first bonding surface and the second bonding surface, or even controls the movement of the second jig to separate the first bonding surface from the second bonding surface, returning to the state shown in Figure 3 As shown in Figure 2, the second temperature controller alone controls the temperature of the temperature control surface and the temperature of the electronic components to reduce the low temperature effect of the first fixture.
利用上述裝置,溫控裝置能藉由第一溫控器提供較大功率的冷卻降溫效果,再由第二溫控器進行微幅的溫度控制,第一接合面與第二接合面之間藉由接合壓力提高溫度傳導率,能確保第一溫控器的溫度確實且有效率地經由熱流路徑傳導至溫控面,成為確實、有效率且精準的溫控裝置。 Using the above device, the temperature control device can provide a higher power cooling effect by the first temperature controller, and then the second temperature controller performs a slight temperature control, and the first joint surface and the second joint surface The temperature conductivity is increased by the bonding pressure, which can ensure that the temperature of the first thermostat is reliably and efficiently transferred to the temperature control surface through the heat flow path, and becomes a reliable, efficient and accurate temperature control device.
在上述實施例中,第一治具與第二治具經由加壓器連接而能相互分離,惟若改將第二治具設置於第一治具,而使第一接合面與第二接合面不能分離者,仍可利用加壓器在第一接合面與第二接合面之間施加接合壓力,從而提高第一接合面與第二接合面之間的溫度傳導率,具有與上述實施例相似的使用效果。 In the above-mentioned embodiment, the first jig and the second jig can be separated from each other by connecting with the presser, but if the second jig is arranged on the first jig, the first joint surface and the second joint If the surfaces cannot be separated, a pressurizer can still be used to apply the bonding pressure between the first bonding surface and the second bonding surface, thereby increasing the temperature conductivity between the first bonding surface and the second bonding surface. Similar use effect.
請參考第6圖,本創作第二實施例另揭露一種壓接裝置,其構造與上述之第一實施例大致相同,惟其中的壓接臂51底端具有一架體511,第二
治具53設置固定於該架體511,第一治具52位於第二治具53上方,第二治具53還包括一至數個彈性件536,彈性件536由第二接合面531向上凸伸而出並抵頂於第一治具的第一接合面521,彈性件536提供彈性力而使第一接合面521常態與第二接合面分離;加壓器設置於第一治具52與架體511之間,包括一彈性膜片543,彈性膜片543的周圍貼合於架體511或第一治具52而圍構出一封閉氣室544,可連接氣壓驅動單元,使封閉氣室544膨脹而頂撐於架體511與第一治具52之間,向下推擠移動第一治具52,致第一接合面521接觸並擠壓第二接合面531,而在第一接合面521與第二接合面531之間提供接合壓力,可獲致與前述第一實施例相似的使用效果。
Please refer to Fig. 6, the second embodiment of this creation also discloses a crimping device whose structure is roughly the same as that of the above-mentioned first embodiment, except that the crimping
在上述第二實施例中,第二治具包括彈性件536,能提供彈性力而使第一治具與第二治具分離,惟若省略彈性件536,將彈性膜片黏合於第一治具52,改以氣壓驅動封閉氣室544收縮,使第一治具52向上移動,亦屬可行。
In the above-mentioned second embodiment, the second jig includes an
請參考第7圖,本創作第三實施例另揭露一種壓接裝置,其構造與前述之第一實施例大致相同,惟略去其中的加壓器54,壓接臂51則進一步包括本體與推擠器55,推擠器55連接於壓接臂51本體與第一治具52之間,具體而言,推擠器55例如是氣壓缸及其推桿、可膨脹之氣囊或者是如上述第二實施例所述之彈性膜片,第二治具另外具有一至數個導桿537與彈性件538,導桿537由基座533向上延伸並且可滑動地穿設於第一治具52,使第二治具53可相對第一治具52移動,彈性件538夾抵於殼體522與基座533之間,使第二治具53常態與第一治具52分離。
Please refer to Fig. 7, the third embodiment of the present creation also discloses a crimping device whose structure is roughly the same as that of the aforementioned first embodiment, except that the
請參考第7圖與第8圖,當壓接裝置拿取電子元件99並且壓接於測試設備70時,壓接臂51帶動第一治具52與第二治具53向下移動且壓抵於電子元
件99及測試設備70,將使第二治具53受到電子元件99抵頂而相對於第一治具52移動,使第二接合面與第一接合面接觸,此時再啟動推擠器55進一步提供接合壓力,向下推擠第一治具52,即可於第一接合面與第二接合面之間施加接合壓力,獲致與前述第一實施例相似的使用效果。
Please refer to Figures 7 and 8, when the crimping device takes the
在上述第三實施例中,彈性件538可向第二治具53提供彈性力,使第二治具53常態與第一治具52分離,惟若省去彈性件538,而利用第二治具53的自身重量,使第二治具53受重力影響向下移動而與第一治具52分離者,亦屬可行。
In the above third embodiment, the
在上述第三實施例中,可由推擠器55向下推擠第一治具52提供接合壓力,惟若省去推擠器55,而於壓接臂51升降移動時,由壓接臂本體或壓接臂的馬達螺桿組提供向下推擠的接合壓力,亦無不可。
In the third embodiment described above, the
需要進一步說明的是,由壓接臂或推擠器提供的接合壓力不僅會作用在第一接合面與第二接合面,也可能會向下傳遞而作用於電子元件,為避免接合壓力破壞電子元件,可以在電子元件周圍或測試區周圍設置限位器以阻擋第二治具,或者可以控制接合壓力小於電子元件的抗壓破壞強度,較佳者,接合壓力介於電子元件的抗壓破壞強度的0.3至1倍之間,又較佳者,接合壓力介於電子元件的抗壓破壞強度的0.5至1倍之間。 It should be further explained that the bonding pressure provided by the crimping arm or the pusher will not only act on the first bonding surface and the second bonding surface, but may also be transmitted downward and act on the electronic components. In order to prevent the bonding pressure from damaging the electronic components For components, stoppers can be set around the electronic components or around the test area to block the second jig, or the bonding pressure can be controlled to be less than the compressive failure strength of the electronic components. Preferably, the bonding pressure is within the compressive failure resistance of the electronic components The strength is between 0.3 and 1 times, and preferably, the bonding pressure is between 0.5 and 1 times the compressive failure strength of the electronic component.
請參考第9圖,本創作第四實施例另揭露一種壓接裝置,其構造可繼承自前述第一至第三任一實施例或其組合,惟其中的第一治具52與第二治具53各包括一傳導層525、539,第一治具的傳導層525設置於殼體522的底面,第一接合面521位於第一治具的傳導層525的底面,第二治具的傳導層539設置於基座533的頂面,第二接合面531位於第二治具的傳導層539的頂面,具體而
言,第一治具與第二治具的傳導層525、539例如是導熱片、導熱膠或軟性介面導熱材料,其中,導熱片是指具有較佳溫度傳導率的片體,例如銅片或石墨片,軟性介面導熱材料是指具有較佳彈性或延展性的導熱材料,例如銦片,藉此,當第一接合面521與第二接合面531接觸並且受到接合壓力擠壓時,能藉由傳導層525、539進一步提高第一治具與第二治具之間的溫度傳導率,而具有與前述第一實施例相似的使用功能。
Please refer to Figure 9. The fourth embodiment of the present creation also discloses a crimping device whose structure can be inherited from any one of the first to third embodiments or a combination thereof, except that the
在上述第四實施例中,第一治具與第二治具均具有傳導層,惟若僅第一治具與第二治具的其中任一者具有傳導層,亦無不可。 In the above-mentioned fourth embodiment, both the first jig and the second jig have a conductive layer, but it is OK if only one of the first jig and the second jig has a conductive layer.
在本實施例中,輸送裝置40將電子元件從供料裝置20輸送至壓接裝置50,待測試完成後再將電子元件從壓接裝置輸送至收料裝置30,在本創作其他可能的實施例中,也可以在機台的作業平面另外設置暫置載台,供輸送裝置將待測的電子元件預先從供料裝置輸送到暫置載台,由暫置載台預先將電子元件升溫或降溫,再將電子元件輸送至壓接裝置。
In this embodiment, the conveying
承上述,前述實施例中的溫控裝置是裝設於壓接裝置中,以在執行壓接、測試作業時對電子元件進行溫控,然而,若改將溫控裝置裝設於上述的暫置載台或滑軌載台組,而在執行壓接、測試作業之前或之後對電子元件進行溫控,又或者在壓接裝置、暫置載台與滑軌載台組中的任兩者或全部均設置溫控裝置,均屬可行。 In view of the above, the temperature control device in the foregoing embodiment is installed in the crimping device to control the temperature of the electronic components during the crimping and testing operations. However, if the temperature control device is installed in the above temporary Place the stage or the slide rail stage group, and control the temperature of the electronic components before or after the crimping and test operations, or in any two of the crimping device, the temporary stage and the slide rail stage group Or all of them are equipped with temperature control devices, which is feasible.
綜上所述,本創作的壓接裝置及其溫控裝置能在兩組具有各自溫控器的治具之間施加接合壓力,提高兩組治具之間的溫度傳導率,而進行精確且有效率的溫度控制,實為相關業者所企盼,惟以上實施例僅在於說明並闡述本創作的技術內容,本專利的專利範圍應以後述的申請專利範圍為準。 To sum up, the crimping device and its temperature control device of this creation can apply bonding pressure between two sets of jigs with their own thermostats, improve the temperature conductivity between the two sets of jigs, and perform accurate and precise Efficient temperature control is really what the relevant industry hopes for, but the above embodiments are only to illustrate and illustrate the technical content of this creation. The patent scope of this patent shall prevail in the scope of the patent application described later.
第1圖為本創作第一實施例分類設備之俯視示意圖。 Figure 1 is a schematic top view of the classification device according to the first embodiment of the creation.
第2圖為本創作第一實施例溫控裝置之剖面示意圖。 Figure 2 is a schematic cross-sectional view of the temperature control device of the first embodiment of the creation.
第3圖為本創作第一實施例溫控裝置之使用狀態示意圖。 Figure 3 is a schematic diagram of the use state of the temperature control device of the first embodiment of the creation.
第4圖為本創作第一實施例溫控裝置之第一接合面與第二接合面之剖面示意圖。 Figure 4 is a schematic cross-sectional view of the first joint surface and the second joint surface of the temperature control device of the first embodiment of the creation.
第5圖為本創作第一實施例溫控裝置施加接合壓力之第一接合面與第二接合面之剖面示意圖。 Figure 5 is a schematic cross-sectional view of the first joint surface and the second joint surface where the temperature control device of the first embodiment of the invention applies the joint pressure.
第6圖為本創作第二實施例溫控裝置之剖面示意圖。 Figure 6 is a schematic cross-sectional view of the temperature control device of the second embodiment of the creation.
第7圖為本創作第三實施例溫控裝置之剖面示意圖。 Figure 7 is a schematic cross-sectional view of the temperature control device according to the third embodiment of the creation.
第8圖為本創作第三實施例溫控裝置之使用狀態示意圖。 Figure 8 is a schematic diagram of the use state of the temperature control device of the third embodiment of the creation.
第9圖為本創作第四實施例溫控裝置之剖面示意圖。 Figure 9 is a schematic cross-sectional view of the temperature control device of the fourth embodiment of the creation.
51:壓接臂 51: crimping arm
52:第一治具 52: The first fixture
521:第一接合面 521: first joint surface
522:殼體 522: Shell
523:蓋體 523: Lid
524:流道 524: Runner
53:第二治具 53: Second Fixture
531:第二接合面 531: second joint surface
532:溫控面 532: Temperature Control Surface
533:基座 533: Pedestal
534:第二溫控器 534: second thermostat
535:下壓治具 535: Down Pressure Fixture
54:加壓器 54: Pressurizer
541:驅動單元 541: drive unit
542:連結件 542: link
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WO2007010610A1 (en) * | 2005-07-21 | 2007-01-25 | Advantest Corporation | Pusher, pusher unit and semiconductor testing apparatus |
TW201031297A (en) * | 2008-10-31 | 2010-08-16 | Toray Industries | Method for bonding electronic components and flexible film substrate and bonding device thereof |
WO2016069800A1 (en) * | 2014-10-28 | 2016-05-06 | Essai, Inc. | Systems and methods for conforming device testers to integrated circuit device with pressure relief valve |
TW201619623A (en) * | 2014-11-27 | 2016-06-01 | Seiko Epson Corp | Electronic component conveying device, electronic component inspection device, and electronic component pressing device |
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