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TWI734238B - Classification equipment and temperature control device - Google Patents

Classification equipment and temperature control device Download PDF

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Publication number
TWI734238B
TWI734238B TW108139059A TW108139059A TWI734238B TW I734238 B TWI734238 B TW I734238B TW 108139059 A TW108139059 A TW 108139059A TW 108139059 A TW108139059 A TW 108139059A TW I734238 B TWI734238 B TW I734238B
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jig
temperature
temperature control
electronic components
joint surface
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TW108139059A
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Chinese (zh)
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TW202117337A (en
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謝旼達
游慶祥
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鴻勁精密股份有限公司
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Abstract

本創作提供一種溫控裝置,可組裝於電子元件分類設備以對電子元件 進行溫度控制,該溫控裝置具有兩治具與一加壓器,兩治具各具有一溫控器,加壓器設置於該二治具,用以對該二治具施加一接合壓力,使該二治具相互接觸且相互擠壓,從而提高該二治具之間的溫度傳導率。 This creation provides a temperature control device that can be assembled in electronic component sorting equipment to compare electronic components For temperature control, the temperature control device has two jigs and a pressurizer, each of the two jigs has a temperature controller, and the pressurizer is arranged on the two jigs to apply a joining pressure to the two jigs, The two jigs are made to contact and squeeze each other, thereby increasing the temperature conductivity between the two jigs.

Description

分類設備及其溫控裝置 Classification equipment and temperature control device

本創作是關於一種應用於電子元件測試分類設備中的溫控裝置,尤指能夠在電子元件的測試分類作業過程中對電子元件進行溫度控制者。 This creation is about a temperature control device used in electronic component testing and classification equipment, especially those who can control the temperature of electronic components during the testing and classification of electronic components.

由於電子裝置不斷地擴展應用至各種裝置,電子元件的品質與可靠度也備受挑戰,為確保在市面銷售的電子元件能在各種環境中正常運作,需要在電子元件生產完成後進行指定之高、低溫環境運作測試,以淘汰出不良品。 As electronic devices continue to be applied to various devices, the quality and reliability of electronic components are also challenged. To ensure that electronic components sold on the market can operate normally in various environments, it is necessary to specify a high level after the production of electronic components is completed. , Operation test in low temperature environment to eliminate defective products.

現有的電子元件測試分類設備,已有能夠控制電子元件的溫度並進行測試者,例如TWI403732號專利即利用測試分類機的下壓頭進行溫度控制,而能將電子元件保持於預定的測試溫度進行測試。 Existing electronic component testing and classification equipment, there are already those who can control the temperature of electronic components and perform testing. For example, the TWI403732 patent uses the lower pressure head of the test classification machine to perform temperature control, and can maintain the electronic components at a predetermined test temperature. test.

上述電子元件測試分類設備雖然能控制電子元件的溫度,但是當電子元件預定的測試溫度條件較嚴苛時,例如需要在-20℃甚或-40℃至-60℃之極低溫條件進行測試時,將需要在下壓頭中設置二組甚至多組溫度控制器,以串聯降溫達成低溫目標或區分多階段不同目標溫度進行控制,而各組溫度控制 器之間若溫度傳導效率不佳,將會使串聯降溫或溫度控制的效率與準確度下降,需要耗費更多能源才能達成預定的目標溫度。 Although the above-mentioned electronic component testing and classification equipment can control the temperature of electronic components, when the predetermined test temperature conditions of the electronic components are relatively strict, for example, when the test needs to be performed at -20°C or even extremely low temperature conditions of -40°C to -60°C, It will be necessary to set up two or even multiple sets of temperature controllers in the lower pressure head to achieve low-temperature targets in series for cooling or to distinguish between multiple stages and different target temperatures for control, and each set of temperature control If the temperature conduction efficiency between the devices is not good, the efficiency and accuracy of the series cooling or temperature control will be reduced, and more energy will be needed to achieve the predetermined target temperature.

因此,本創作的其中一項目的在於對電子元件測試分類設備的壓接設備或溫控設備進行改造,以期能提高壓接設備或溫控設備內部的溫度傳導效率。 Therefore, one of the purposes of this creation is to modify the crimping equipment or temperature control equipment of the electronic component testing and classification equipment, in order to improve the temperature conduction efficiency of the crimping equipment or the temperature control equipment.

為達成上述目的與其他目的,本創作提供一種溫控裝置,適於控制電子元件的溫度以供執行測試作業,該溫控裝置包括第一治具、第二治具與加壓器。第一治具具有第一接合面以及第一溫控器,該第一溫控器能改變該第一接合面的溫度。第二治具具有第二接合面、溫控面以及第二溫控器,該第二溫控器能改變該溫控面的溫度。加壓器受驅動以向該第一接合面與該第二接合面中至少一者提供接合壓力,使該第一接合面與該第二接合面其中一者朝向另一者接觸且擠壓而減少接觸表面縫隙,以致提高該第一接合面與該第二接合面之間的溫度傳導率。 In order to achieve the above and other objectives, the present invention provides a temperature control device suitable for controlling the temperature of electronic components for performing test operations. The temperature control device includes a first jig, a second jig and a pressurizer. The first jig has a first joint surface and a first temperature controller, and the first temperature controller can change the temperature of the first joint surface. The second jig has a second joint surface, a temperature control surface, and a second temperature controller, and the second temperature controller can change the temperature of the temperature control surface. The presser is driven to provide joining pressure to at least one of the first joining surface and the second joining surface, so that one of the first joining surface and the second joining surface contacts and presses toward the other. The contact surface gap is reduced, so as to increase the temperature conductivity between the first joint surface and the second joint surface.

為達成上述目的與其他目的,本創作還提供一種壓接裝置,適於對電子元件執行壓接作業,並控制該電子元件的溫度,該壓接裝置包括第一治具、第二治具與壓接臂。第一治具具有第一接合面以及第一溫控器,該第一溫控器能改變該第一接合面的溫度。第二治具具有第二接合面、溫控面以及第二溫控器,該第二溫控器能改變該溫控面的溫度。該第一治具設置於該壓接臂,該第一治具位於該壓接臂與該第二治具之間,該壓接臂能沿一作業方向移動以帶動該第一治具及該第二治具移動,使該第二治具壓抵該電子元件;其中該第二治具壓抵該電子元件時,該壓接臂帶動該第一治具以向該第一接合面提供接合壓力,使該第一接合面朝向該第二接合面接觸且擠壓而減少接觸表面縫隙,以致提高該第一接合面與該第二接合面之間的溫度傳導率。 In order to achieve the above and other objectives, the present invention also provides a crimping device suitable for performing crimping operations on electronic components and controlling the temperature of the electronic components. The crimping device includes a first jig, a second jig, and Crimping arm. The first jig has a first joint surface and a first temperature controller, and the first temperature controller can change the temperature of the first joint surface. The second jig has a second joint surface, a temperature control surface, and a second temperature controller, and the second temperature controller can change the temperature of the temperature control surface. The first jig is disposed on the crimping arm, the first jig is located between the crimping arm and the second jig, and the crimping arm can move in an operating direction to drive the first jig and the The second jig moves to make the second jig press against the electronic component; wherein when the second jig presses against the electronic component, the crimping arm drives the first jig to provide bonding to the first joint surface The pressure causes the first joint surface to contact and squeeze toward the second joint surface to reduce the contact surface gap, so as to increase the temperature conductivity between the first joint surface and the second joint surface.

藉此,本創作提供的溫控裝置與壓接裝置,能利用加壓器或壓接臂向第一治具與第二治具施加接合壓力,提高第一治具與第二治具之間的溫度傳導率,而能獲得降低能源消耗,提高溫度控制準確度的使用效果。 In this way, the temperature control device and crimping device provided by this creation can use a pressurizer or a crimping arm to apply a joining pressure to the first jig and the second jig, thereby improving the gap between the first jig and the second jig. High temperature conductivity, and can achieve the effect of reducing energy consumption and improving the accuracy of temperature control.

本實施例揭露一種壓接裝置,可供組裝於電子元件的分類設備中,進一步配合測試設備以對電子元件執行測試分類作業。請參考第1圖,電子元件的分類設備包括機台10、供料裝置20、收料裝置30、輸送裝置40、壓接裝置50以及中央控制裝置60,能夠設置並搭配測試設備70,共同執行電子元件的測試及分類作業。 This embodiment discloses a crimping device that can be assembled into a sorting device for electronic components, and further cooperates with a testing device to perform test sorting operations on the electronic components. Please refer to Figure 1. The electronic component classification equipment includes a machine 10, a feeding device 20, a receiving device 30, a conveying device 40, a crimping device 50, and a central control device 60, which can be set up and matched with a testing device 70 for common execution Testing and classification of electronic components.

機台10例如是平台式機架,具有作業平面11以供供料裝置20、收料裝置30、輸送裝置40與壓接裝置50安裝於其上,在作業平面11上輸送電子元件99並進行預定的測試作業,機台10於作業平面11中有測試區12,可供測試設備70安裝於測試區12中與測試區12下方。 The machine 10 is, for example, a platform-type rack with a working plane 11 for the feeding device 20, the receiving device 30, the conveying device 40, and the crimping device 50 to be installed on it, and the electronic components 99 are transported and performed on the working plane 11 For a predetermined test operation, the machine 10 has a test area 12 in the work plane 11 for the test equipment 70 to be installed in the test area 12 and below the test area 12.

供料裝置20配置於機台10的作業平面11,供設置一個或數個電子元件之料盤91,於料盤91容納一個至數個待測試之電子元件99。收料裝置30配置於機台10的作業平面11,供設置一個至數個可承載已測試電子元件之料盤92,於料盤92容納已測試之電子元件99’。輸送裝置40配置於機台10的作業平面11,具有一個至數個移料器而能輸送電子元件,具體而言,輸送裝置40包括能夠移載電子元件之取放器41、42與能夠承載電子元件橫向移動的滑軌載台組43、44,取放器41、42各自具有能橫向與縱向移動的滑軌,可由取放器41從供料裝置20處拿取電子元件99,將電子元件99放置於滑軌載台組43,滑軌載台組43將電子元件移送至測試區12旁側,以等待進行測試,完成測試作業的電子元件則可由另一滑軌載台組44從測試區12旁側移送至取放器42處,取放器42再從滑軌載台組44拿取電子元件並放置於收料裝置30處的料盤92。壓接裝置50配置於機台10,機台10另具有縱向延伸的驅動單元13,而能帶動壓接裝置50縱向移動,使壓接裝置50能在滑軌載台組43、44與測試區12之間移動,從滑軌載台組43拿取電子元件,移動並壓接於測試區12中設置的測試設備70進行測試,待測試完成後再將電子元件拿取、移動並放置於滑軌載台組44。 The feeding device 20 is disposed on the working plane 11 of the machine table 10 and is provided with a tray 91 of one or several electronic components, and the tray 91 contains one to several electronic components 99 to be tested. The receiving device 30 is disposed on the working plane 11 of the machine table 10, and is used for setting one to several trays 92 that can carry the tested electronic components, and the tested electronic components 99' are contained in the tray 92. The conveying device 40 is arranged on the working plane 11 of the machine table 10 and has one to several shifters to convey electronic components. Specifically, the conveying device 40 includes pick-and-place devices 41 and 42 capable of transferring electronic components and The slide rail carrier groups 43, 44 that move the electronic components horizontally. The pick-and-place devices 41, 42 each have slide rails that can move horizontally and longitudinally. The pick-and-place device 41 can pick up the electronic components 99 from the feeding device 20, The component 99 is placed on the slide rail carrier group 43. The slide rail carrier group 43 transfers the electronic components to the side of the test area 12 to wait for testing. The electronic components that have completed the test can be removed from another slide rail carrier group 44. The side of the test area 12 is moved to the pick-and-place device 42, and the pick-and-place device 42 picks up the electronic components from the slide rail carrier group 44 and places them on the tray 92 of the receiving device 30. The crimping device 50 is arranged on the machine table 10, and the machine table 10 has a longitudinally extending drive unit 13, which can drive the crimping device 50 to move longitudinally, so that the crimping device 50 can be placed on the slide rail carrier group 43, 44 and the test area Move between 12, take the electronic components from the slide rail carrier group 43, move and crimp the test equipment 70 set in the test area 12 for testing. After the test is completed, take, move and place the electronic components on the slide. Rail carrier group 44.

在本實施例中,壓接裝置50能受驅動單元13帶動而縱向移動,在滑軌載台組43、44與測試區12之間搬移電子元件,惟若省略驅動單元,改以滑軌載台組直接將電子元件輸送至測試區,並以壓接裝置升降取放電子元件,亦屬可行。 In this embodiment, the crimping device 50 can be driven by the drive unit 13 to move longitudinally to move the electronic components between the slide rail carrier groups 43, 44 and the test area 12. However, if the drive unit is omitted, the slide rail is used instead. It is also feasible for the platform group to directly transport the electronic components to the test area, and use the crimping device to lift and place the electronic components.

中央控制裝置60例如是晶片,較佳者為系統單晶片,配置於機台10,並且連接於供料裝置20、收料裝置30、輸送裝置40與壓接裝置50,並且預載了控制邏輯,而能控制及整合供料裝置20、收料裝置30、輸送裝置40與壓接裝置50動作,以執行自動化作業,將供料裝置20所容納的電子元件依序輸送至測試區12供測試設備70進行測試,再將測試完成的電子元件依序輸送並容納於收料裝置30中。 The central control device 60 is, for example, a chip, preferably a system-on-a-chip, which is arranged on the machine 10 and is connected to the feeding device 20, the receiving device 30, the conveying device 40 and the crimping device 50, and is preloaded with control logic , And can control and integrate the actions of the feeding device 20, the receiving device 30, the conveying device 40 and the crimping device 50 to perform automated operations, and sequentially transport the electronic components contained in the feeding device 20 to the test area 12 for testing The device 70 performs the test, and then sequentially transports and accommodates the electronic components that have been tested in the receiving device 30.

請參考第2圖,本創作壓接裝置包括壓接臂51與溫控裝置,溫控裝置則包括第一治具52、第二治具53與加壓器54。 Please refer to FIG. 2, the crimping device of this creation includes a crimping arm 51 and a temperature control device, and the temperature control device includes a first jig 52, a second jig 53 and a pressurizer 54.

壓接臂51為長直桿,於壓接臂51的底端設置該溫控裝置,於壓接臂51的頂端設有馬達螺桿組而能帶動壓接臂51沿作業方向升降移動,帶動溫控裝置一同升降移動,帶動壓接臂51升降移動的馬達螺桿組的具體結構,例如可參考TWI635551或TWI618667號專利所述。 The crimping arm 51 is a long straight rod. The temperature control device is provided at the bottom end of the crimping arm 51. A motor screw group is provided on the top of the crimping arm 51 to drive the crimping arm 51 to move up and down in the working direction, driving the temperature The control device moves up and down together, and the specific structure of the motor screw group that drives the crimping arm 51 to move up and down can refer to the patent No. TWI635551 or TWI618667, for example.

溫控裝置中的第一治具52,其頂部設置於壓接臂51,底部具有第一接合面521,其中,第一治具52包含殼體522、蓋體523與第一溫控器,蓋體523蓋闔於殼體522頂部並連接於壓接臂51與殼體522之間,第一接合面521則位於殼體522的底面,第一溫控器為冷卻器,包括穿伸於殼體522的流道524,供使用者將流道524連接於介質供應源,介質供應源例如是泵或壓縮機,能將冷水或冷媒等流體介質供應至流道524,以將第一治具52降溫,從而改變第一接合面521的溫度。在本創作其他可能的實施例中,第一溫控器也可改以熱水作為流體介質,或將第一溫控器改設置為其他加熱器或致冷晶片。 The first jig 52 in the temperature control device has its top set on the crimping arm 51 and a first joint surface 521 at the bottom. The first jig 52 includes a housing 522, a cover 523, and a first temperature controller. The cover 523 is closed on the top of the housing 522 and connected between the crimping arm 51 and the housing 522. The first joint surface 521 is located on the bottom surface of the housing 522. The first temperature controller is a cooler, including The flow channel 524 of the housing 522 is used by the user to connect the flow channel 524 to a medium supply source, such as a pump or a compressor, which can supply fluid media such as cold water or refrigerant to the flow channel 524 to reduce the first treatment. The temperature of the tool 52 is lowered, thereby changing the temperature of the first joint surface 521. In other possible embodiments of the present invention, the first temperature controller can also be changed to use hot water as the fluid medium, or the first temperature controller can be changed to other heaters or cooling chips.

需進一步說明的是,所述的改變第一接合面521的溫度,是指具有第一溫控器的情形與不具第一溫控器的情形相比,第一接合面521會有不同 的溫度,不限於第一溫控器具有主動升溫或降溫的能力,若省略流道524而改將被動散熱之散熱器或散熱漆作為第一溫控器,將散熱器或散熱漆設置於第一治具的表面進行散熱,仍可降低而改變第一接合面的溫度,均屬本創作第一溫控器所可能採用的具體實施方式。 It should be further explained that the change of the temperature of the first joint surface 521 means that the first joint surface 521 will be different in the case of the first temperature controller and the case without the first temperature controller. The temperature of the first thermostat is not limited to the ability of the first thermostat to actively raise or lower the temperature. If the runner 524 is omitted and a passive radiator or heat dissipating paint is used as the first thermostat, the radiator or heat dissipating paint is placed on the first thermostat. The surface of a jig can still reduce and change the temperature of the first joint surface to dissipate heat, which is a possible specific implementation of the first thermostat in this creation.

第二治具53位於第一治具52下方,第二治具53頂部具有第二接合面531,第二接合面531面對第一接合面521並且能與第一接合面521接觸,第二治具53底部具有溫控面532,第二治具53包括基座533、第二溫控器534與下壓治具535,第二接合面531位於基座533的頂面,第二溫控器534與下壓治具535設置於基座533,且第二溫控器534被夾抵於基座533與下壓治具535之間,第二溫控器534例如是加熱器或致冷晶片,或者第二溫控器534亦可為與第一溫控器相同或相似形式的冷卻器,溫控面532位於下壓治具535的底面,下壓治具535能利用例如真空吸引的方式拿取與釋放電子元件,而於拿取電子元件時以溫控面532接觸電子元件,藉此,第二溫控器534能加熱或冷卻下壓治具535,改變下壓治具535的溫度,從而改變溫控面532的溫度,對電子元件進行溫度控制。除上述結構之外,如果將基座533改變為環形,圍繞於第二溫控器周圍,或直接將基座533省略去除,僅以第二溫控器與下壓治具結合,第二接合面則位於第二溫控器的頂面,或者將第二溫控器設置於下壓治具535的底部,也均屬本創作可行的具體實施方式。 The second jig 53 is located below the first jig 52. The top of the second jig 53 has a second joining surface 531. The second joining surface 531 faces the first joining surface 521 and can contact the first joining surface 521. The bottom of the jig 53 has a temperature control surface 532. The second jig 53 includes a base 533, a second temperature controller 534 and a pressing jig 535. The second joint surface 531 is located on the top surface of the base 533. The second temperature control The second thermostat 534 and the pressing jig 535 are arranged on the base 533, and the second thermostat 534 is clamped between the base 533 and the pressing jig 535. The second thermostat 534 is, for example, a heater or a cooling device. The chip or the second temperature controller 534 can also be a cooler of the same or similar form as the first temperature controller. The temperature control surface 532 is located on the bottom surface of the pressing jig 535. The pressing jig 535 can be sucked by vacuum, for example. The electronic components are picked up and released by the method, and when the electronic components are picked up, the temperature control surface 532 touches the electronic components, so that the second thermostat 534 can heat or cool the pressing jig 535 and change the pressure of the pressing jig 535. The temperature, thereby changing the temperature of the temperature control surface 532, controls the temperature of the electronic components. In addition to the above structure, if the base 533 is changed to a ring shape and surrounds the second thermostat, or the base 533 is omitted and removed, only the second thermostat is combined with the pressing jig, and the second joint The surface is located on the top surface of the second thermostat, or the second thermostat is arranged at the bottom of the pressing jig 535, which are also feasible specific implementations of this creation.

加壓器54設置於第一治具52與第二治具53,以帶動第二治具53向第一治具52移動接觸並擠壓第一治具52,使第二接合面531接觸並擠壓第一接合面521,在第二接合面531與第一接合面521之間施加一接合壓力,降低第二接合面531與第一接合面521之間的接觸表面縫隙;更詳細地說,加壓器54包括驅動單元541與連結件542,驅動單元541例如是氣壓缸或馬達螺桿組,可受氣 壓或電力驅動而帶動連結件542移動,驅動單元541設置於第一治具的殼體522,連結件542設置於第二治具的基座533,而於連結件542移動時帶動第二治具53移動接近或遠離第一治具52,驅動單元541能在第二接合面531接觸第一接合面521後繼續施加壓力壓抵第一治具52,而對第一接合面521與第二接合面531施予接合壓力。在本創作其他可能的實施例中,也可以改將驅動單元設置於基座,並將連結件設置於殼體,而仍具本實施例相同的使用功能。 The presser 54 is disposed on the first jig 52 and the second jig 53, to drive the second jig 53 to move to the first jig 52 to contact and press the first jig 52, so that the second joint surface 531 is in contact and Squeeze the first joining surface 521 to apply a joining pressure between the second joining surface 531 and the first joining surface 521 to reduce the contact surface gap between the second joining surface 531 and the first joining surface 521; in more detail , The pressurizer 54 includes a drive unit 541 and a connecting member 542. The drive unit 541 is, for example, a pneumatic cylinder or a motor screw group, which can receive air The connecting member 542 is driven by pressure or electric power to move. The driving unit 541 is disposed on the housing 522 of the first jig. The connecting member 542 is disposed on the base 533 of the second jig. The tool 53 moves closer to or away from the first tool 52, and the driving unit 541 can continue to apply pressure to the first tool 52 after the second bonding surface 531 contacts the first bonding surface 521, so as to contact the first bonding surface 521 and the second bonding surface 521. The bonding surface 531 applies bonding pressure. In other possible embodiments of the present invention, the driving unit may be arranged on the base and the connecting member may be arranged on the housing, and still have the same use function as this embodiment.

請參考第3圖至第5圖,驅動單元541能帶動連結件542與第二治具移動,使第二接合面531與第一接合面521接觸,由於物體表面在微觀尺度下為粗糙起伏且不平整的表面,第一接合面521與第二接合面531雖然接觸,但其中仍會存在許多表面縫隙,如第4圖所示,表面縫隙有如許多的小型氣室,阻隔於第一接合面521與第二接合面531之間,而致第一接合面521與第二接合面531之間的溫度傳導率不佳,亦即熱傳導係數低落;驅動單元541對連結件542與第二治具繼續施加壓力後,會在第一接合面521與第二接合面531之間施加接合壓力,在微觀尺度下會使第一接合面521與第二接合面531的表面發生些微變形,擠壓表面縫隙而使其縮小,如第5圖所示,提高微觀尺度中第一接合面521與第二接合面531的接觸面積,從而提高第一接合面521與第二接合面531之間的溫度傳導率,亦即提高熱傳導係數。 Please refer to Figures 3 to 5, the drive unit 541 can drive the connecting member 542 and the second jig to move, so that the second joint surface 531 and the first joint surface 521 contact, because the surface of the object is rough and undulating on a microscopic scale. Uneven surface. Although the first joint surface 521 and the second joint surface 531 are in contact, there will still be many surface gaps. As shown in Figure 4, the surface gaps are like many small air chambers, which are blocked from the first joint surface. 521 and the second joint surface 531, so that the temperature conductivity between the first joint surface 521 and the second joint surface 531 is poor, that is, the thermal conductivity is low; the driving unit 541 pairs the connecting member 542 and the second jig After the pressure continues to be applied, the bonding pressure will be applied between the first bonding surface 521 and the second bonding surface 531, and the surfaces of the first bonding surface 521 and the second bonding surface 531 will be slightly deformed at a microscopic scale. As shown in Figure 5, the contact area between the first joint surface 521 and the second joint surface 531 is increased in the microscopic scale, thereby increasing the temperature conduction between the first joint surface 521 and the second joint surface 531 Rate, that is, increase the thermal conductivity.

藉此,當壓接裝置拿取電子元件並壓接進行測試時,可利用溫控裝置對電子元件的溫度進行控制。溫控裝置由第一溫控器、第一接合面、第二接合面、第二溫控器與溫控面串聯形成一熱流路徑,由加壓器驅動第二治具移動接觸第一治具,並且向第一接合面與第二接合面提供接合壓力,使第一接合面與第二接合面之間的溫度傳導率提高;第一溫控器可採用功率較大的冷卻器,利用冷媒等介質將第一接合面降溫,並藉由第一接合面與第二接合面之間 的溫度傳導而使第二治具降溫,第二溫控器則可以採用功率較小的冷卻器或致冷晶片,利用熱電效應引致連結件與下壓治具之間的溫度差,使下壓治具獲得進一步的降溫,從而使溫控面降溫,對電子元件進行溫度控制。 Thereby, when the crimping device takes the electronic components and crimps them for testing, the temperature control device can be used to control the temperature of the electronic components. The temperature control device is composed of a first temperature controller, a first joint surface, a second joint surface, a second temperature controller and a temperature control surface in series to form a heat flow path, and the second jig is driven by the pressurizer to move and contact the first jig , And provide bonding pressure to the first bonding surface and the second bonding surface, so that the temperature conductivity between the first bonding surface and the second bonding surface is improved; the first temperature controller can be a cooler with a larger power, using a refrigerant And other medium to cool the first joint surface, and through the gap between the first joint surface and the second joint surface The second thermostat can use a cooler or refrigerating chip with less power to cause the temperature difference between the connecting piece and the lower pressure jig to cause the lower pressure The fixture is further cooled, so that the temperature control surface is cooled down, and the temperature of the electronic components is controlled.

當電子元件達到目標溫度後,如果需要再將電子元件控制至另一溫度,例如將測試完成的低溫電子元件的溫度回升,避免結露,則第二溫控器可以採用加熱器或致冷晶片,利用第二溫控器加熱下壓治具,或控制連結件與下壓治具之間的溫度差,而將溫控面控制於另一預定的目標溫度,此時,可以控制加壓器釋放接合壓力,使第一接合面與第二接合面的溫度傳導率下降,甚或控制第二治具移動而使第一接合面與第二接合面分離,由如第3圖所示的狀態回復至如第2圖所示的狀態,單獨由第二溫控器控制溫控面與電子元件的溫度,減少第一治具的低溫影響。 When the electronic component reaches the target temperature, if the electronic component needs to be controlled to another temperature, for example, the temperature of the low-temperature electronic component after the test is raised to avoid condensation, the second temperature controller can be a heater or a cooling chip. Use the second thermostat to heat the pressing tool, or control the temperature difference between the connector and the pressing tool, and control the temperature control surface to another predetermined target temperature. At this time, the pressurizer can be controlled to release The bonding pressure reduces the temperature conductivity of the first bonding surface and the second bonding surface, or even controls the movement of the second jig to separate the first bonding surface from the second bonding surface, returning to the state shown in Figure 3 As shown in Figure 2, the second temperature controller alone controls the temperature of the temperature control surface and the temperature of the electronic components to reduce the low temperature effect of the first fixture.

利用上述裝置,溫控裝置能藉由第一溫控器提供較大功率的冷卻降溫效果,再由第二溫控器進行微幅的溫度控制,第一接合面與第二接合面之間藉由接合壓力提高溫度傳導率,能確保第一溫控器的溫度確實且有效率地經由熱流路徑傳導至溫控面,成為確實、有效率且精準的溫控裝置。 Using the above device, the temperature control device can provide a higher power cooling effect by the first temperature controller, and then the second temperature controller performs a slight temperature control, and the first joint surface and the second joint surface The temperature conductivity is increased by the bonding pressure, which can ensure that the temperature of the first thermostat is reliably and efficiently transferred to the temperature control surface through the heat flow path, and becomes a reliable, efficient and accurate temperature control device.

在上述實施例中,第一治具與第二治具經由加壓器連接而能相互分離,惟若改將第二治具設置於第一治具,而使第一接合面與第二接合面不能分離者,仍可利用加壓器在第一接合面與第二接合面之間施加接合壓力,從而提高第一接合面與第二接合面之間的溫度傳導率,具有與上述實施例相似的使用效果。 In the above-mentioned embodiment, the first jig and the second jig can be separated from each other by connecting with the presser, but if the second jig is arranged on the first jig, the first joint surface and the second joint If the surfaces cannot be separated, a pressurizer can still be used to apply the bonding pressure between the first bonding surface and the second bonding surface, thereby increasing the temperature conductivity between the first bonding surface and the second bonding surface. Similar use effect.

請參考第6圖,本創作第二實施例另揭露一種壓接裝置,其構造與上述之第一實施例大致相同,惟其中的壓接臂51底端具有一架體511,第二 治具53設置固定於該架體511,第一治具52位於第二治具53上方,第二治具53還包括一至數個彈性件536,彈性件536由第二接合面531向上凸伸而出並抵頂於第一治具的第一接合面521,彈性件536提供彈性力而使第一接合面521常態與第二接合面分離;加壓器設置於第一治具52與架體511之間,包括一彈性膜片543,彈性膜片543的周圍貼合於架體511或第一治具52而圍構出一封閉氣室544,可連接氣壓驅動單元,使封閉氣室544膨脹而頂撐於架體511與第一治具52之間,向下推擠移動第一治具52,致第一接合面521接觸並擠壓第二接合面531,而在第一接合面521與第二接合面531之間提供接合壓力,可獲致與前述第一實施例相似的使用效果。 Please refer to Fig. 6, the second embodiment of this creation also discloses a crimping device whose structure is roughly the same as that of the above-mentioned first embodiment, except that the crimping arm 51 has a frame 511 at the bottom end, and the second The jig 53 is fixed to the frame body 511. The first jig 52 is located above the second jig 53, and the second jig 53 further includes one or more elastic members 536. The elastic members 536 protrude upward from the second joint surface 531. The first joint surface 521 of the first jig comes out and abuts against the first joint surface 521, the elastic member 536 provides elastic force to separate the first joint surface 521 from the second joint surface normally; Between the bodies 511, an elastic diaphragm 543 is included. The periphery of the elastic diaphragm 543 is attached to the frame body 511 or the first jig 52 to form a closed air chamber 544, which can be connected with a pneumatic drive unit to close the air chamber 544 expands and supports between the frame body 511 and the first jig 52, pushes down the first jig 52, causes the first joint surface 521 to contact and press the second joint surface 531, and the first joint The bonding pressure is provided between the surface 521 and the second bonding surface 531, which can achieve a similar use effect as the first embodiment described above.

在上述第二實施例中,第二治具包括彈性件536,能提供彈性力而使第一治具與第二治具分離,惟若省略彈性件536,將彈性膜片黏合於第一治具52,改以氣壓驅動封閉氣室544收縮,使第一治具52向上移動,亦屬可行。 In the above-mentioned second embodiment, the second jig includes an elastic member 536, which can provide elastic force to separate the first jig from the second jig, but if the elastic member 536 is omitted, the elastic film is bonded to the first jig. It is also feasible to use air pressure to drive the closed air chamber 544 to contract the tool 52 to move the first tool 52 upward.

請參考第7圖,本創作第三實施例另揭露一種壓接裝置,其構造與前述之第一實施例大致相同,惟略去其中的加壓器54,壓接臂51則進一步包括本體與推擠器55,推擠器55連接於壓接臂51本體與第一治具52之間,具體而言,推擠器55例如是氣壓缸及其推桿、可膨脹之氣囊或者是如上述第二實施例所述之彈性膜片,第二治具另外具有一至數個導桿537與彈性件538,導桿537由基座533向上延伸並且可滑動地穿設於第一治具52,使第二治具53可相對第一治具52移動,彈性件538夾抵於殼體522與基座533之間,使第二治具53常態與第一治具52分離。 Please refer to Fig. 7, the third embodiment of the present creation also discloses a crimping device whose structure is roughly the same as that of the aforementioned first embodiment, except that the pressurizer 54 is omitted, and the crimping arm 51 further includes a body and The pusher 55 is connected between the body of the crimping arm 51 and the first jig 52. Specifically, the pusher 55 is, for example, a pneumatic cylinder and its push rod, an inflatable airbag, or as described above In the elastic diaphragm described in the second embodiment, the second fixture additionally has one or more guide rods 537 and elastic members 538. The guide rods 537 extend upward from the base 533 and slidably penetrate through the first fixture 52, The second jig 53 can move relative to the first jig 52, and the elastic member 538 is clamped between the housing 522 and the base 533, so that the second jig 53 is normally separated from the first jig 52.

請參考第7圖與第8圖,當壓接裝置拿取電子元件99並且壓接於測試設備70時,壓接臂51帶動第一治具52與第二治具53向下移動且壓抵於電子元 件99及測試設備70,將使第二治具53受到電子元件99抵頂而相對於第一治具52移動,使第二接合面與第一接合面接觸,此時再啟動推擠器55進一步提供接合壓力,向下推擠第一治具52,即可於第一接合面與第二接合面之間施加接合壓力,獲致與前述第一實施例相似的使用效果。 Please refer to Figures 7 and 8, when the crimping device takes the electronic component 99 and crimps it to the test equipment 70, the crimping arm 51 drives the first jig 52 and the second jig 53 to move down and press against Yu Electronic Yuan The component 99 and the test equipment 70 will cause the second jig 53 to be pushed by the electronic component 99 and move relative to the first jig 52, so that the second joint surface is in contact with the first joint surface, and then the pusher 55 is restarted. The bonding pressure is further provided, and the first jig 52 is pushed downward to apply the bonding pressure between the first bonding surface and the second bonding surface, and the use effect similar to the foregoing first embodiment can be obtained.

在上述第三實施例中,彈性件538可向第二治具53提供彈性力,使第二治具53常態與第一治具52分離,惟若省去彈性件538,而利用第二治具53的自身重量,使第二治具53受重力影響向下移動而與第一治具52分離者,亦屬可行。 In the above third embodiment, the elastic member 538 can provide elastic force to the second jig 53 so that the second jig 53 is normally separated from the first jig 52. However, if the elastic member 538 is omitted, the second jig 53 can be used instead. It is also feasible for the weight of the tool 53 to cause the second tool 53 to move downward under the influence of gravity to separate from the first tool 52.

在上述第三實施例中,可由推擠器55向下推擠第一治具52提供接合壓力,惟若省去推擠器55,而於壓接臂51升降移動時,由壓接臂本體或壓接臂的馬達螺桿組提供向下推擠的接合壓力,亦無不可。 In the third embodiment described above, the first jig 52 can be pushed downward by the pusher 55 to provide the joining pressure. However, if the pusher 55 is omitted, and when the crimping arm 51 moves up and down, the crimping arm body Or the motor screw group of the crimping arm provides the joining pressure for pushing downwards.

需要進一步說明的是,由壓接臂或推擠器提供的接合壓力不僅會作用在第一接合面與第二接合面,也可能會向下傳遞而作用於電子元件,為避免接合壓力破壞電子元件,可以在電子元件周圍或測試區周圍設置限位器以阻擋第二治具,或者可以控制接合壓力小於電子元件的抗壓破壞強度,較佳者,接合壓力介於電子元件的抗壓破壞強度的0.3至1倍之間,又較佳者,接合壓力介於電子元件的抗壓破壞強度的0.5至1倍之間。 It should be further explained that the bonding pressure provided by the crimping arm or the pusher will not only act on the first bonding surface and the second bonding surface, but may also be transmitted downward and act on the electronic components. In order to prevent the bonding pressure from damaging the electronic components For components, stoppers can be set around the electronic components or around the test area to block the second jig, or the bonding pressure can be controlled to be less than the compressive failure strength of the electronic components. Preferably, the bonding pressure is within the compressive failure resistance of the electronic components The strength is between 0.3 and 1 times, and preferably, the bonding pressure is between 0.5 and 1 times the compressive failure strength of the electronic component.

請參考第9圖,本創作第四實施例另揭露一種壓接裝置,其構造可繼承自前述第一至第三任一實施例或其組合,惟其中的第一治具52與第二治具53各包括一傳導層525、539,第一治具的傳導層525設置於殼體522的底面,第一接合面521位於第一治具的傳導層525的底面,第二治具的傳導層539設置於基座533的頂面,第二接合面531位於第二治具的傳導層539的頂面,具體而 言,第一治具與第二治具的傳導層525、539例如是導熱片、導熱膠或軟性介面導熱材料,其中,導熱片是指具有較佳溫度傳導率的片體,例如銅片或石墨片,軟性介面導熱材料是指具有較佳彈性或延展性的導熱材料,例如銦片,藉此,當第一接合面521與第二接合面531接觸並且受到接合壓力擠壓時,能藉由傳導層525、539進一步提高第一治具與第二治具之間的溫度傳導率,而具有與前述第一實施例相似的使用功能。 Please refer to Figure 9. The fourth embodiment of the present creation also discloses a crimping device whose structure can be inherited from any one of the first to third embodiments or a combination thereof, except that the first fixture 52 and the second fixture Each tool 53 includes a conductive layer 525, 539. The conductive layer 525 of the first tool is disposed on the bottom surface of the housing 522. The first joint surface 521 is located on the bottom surface of the conductive layer 525 of the first tool. The layer 539 is disposed on the top surface of the base 533, and the second bonding surface 531 is located on the top surface of the conductive layer 539 of the second jig. In other words, the conductive layers 525, 539 of the first jig and the second jig are, for example, a thermally conductive sheet, a thermally conductive glue, or a soft interface thermally conductive material. The thermally conductive sheet refers to a sheet with better temperature conductivity, such as a copper sheet or Graphite sheet, soft interface thermally conductive material refers to a thermally conductive material with better elasticity or ductility, such as an indium sheet, whereby when the first bonding surface 521 is in contact with the second bonding surface 531 and is squeezed by the bonding pressure, it can be used The conductive layers 525 and 539 further improve the temperature conductivity between the first jig and the second jig, and have similar functions as the first embodiment described above.

在上述第四實施例中,第一治具與第二治具均具有傳導層,惟若僅第一治具與第二治具的其中任一者具有傳導層,亦無不可。 In the above-mentioned fourth embodiment, both the first jig and the second jig have a conductive layer, but it is OK if only one of the first jig and the second jig has a conductive layer.

在本實施例中,輸送裝置40將電子元件從供料裝置20輸送至壓接裝置50,待測試完成後再將電子元件從壓接裝置輸送至收料裝置30,在本創作其他可能的實施例中,也可以在機台的作業平面另外設置暫置載台,供輸送裝置將待測的電子元件預先從供料裝置輸送到暫置載台,由暫置載台預先將電子元件升溫或降溫,再將電子元件輸送至壓接裝置。 In this embodiment, the conveying device 40 conveys the electronic components from the feeding device 20 to the crimping device 50. After the test is completed, the electronic components are conveyed from the crimping device to the receiving device 30. Other possible implementations in this creation In the example, it is also possible to additionally set a temporary stage on the working plane of the machine, for the conveying device to transport the electronic components to be tested from the feeding device to the temporary stage in advance, and the temporary stage will pre-heat the electronic components or Cool down, and then transport the electronic components to the crimping device.

承上述,前述實施例中的溫控裝置是裝設於壓接裝置中,以在執行壓接、測試作業時對電子元件進行溫控,然而,若改將溫控裝置裝設於上述的暫置載台或滑軌載台組,而在執行壓接、測試作業之前或之後對電子元件進行溫控,又或者在壓接裝置、暫置載台與滑軌載台組中的任兩者或全部均設置溫控裝置,均屬可行。 In view of the above, the temperature control device in the foregoing embodiment is installed in the crimping device to control the temperature of the electronic components during the crimping and testing operations. However, if the temperature control device is installed in the above temporary Place the stage or the slide rail stage group, and control the temperature of the electronic components before or after the crimping and test operations, or in any two of the crimping device, the temporary stage and the slide rail stage group Or all of them are equipped with temperature control devices, which is feasible.

綜上所述,本創作的壓接裝置及其溫控裝置能在兩組具有各自溫控器的治具之間施加接合壓力,提高兩組治具之間的溫度傳導率,而進行精確且有效率的溫度控制,實為相關業者所企盼,惟以上實施例僅在於說明並闡述本創作的技術內容,本專利的專利範圍應以後述的申請專利範圍為準。 To sum up, the crimping device and its temperature control device of this creation can apply bonding pressure between two sets of jigs with their own thermostats, improve the temperature conductivity between the two sets of jigs, and perform accurate and precise Efficient temperature control is really what the relevant industry hopes for, but the above embodiments are only to illustrate and illustrate the technical content of this creation. The patent scope of this patent shall prevail in the scope of the patent application described later.

機台10 作業平面11 測試區12 驅動單元13 供料裝置20 收料裝置30 輸送裝置40 取放器41、42 滑軌載台組43、44 壓接裝置50 壓接臂51 架體511 第一治具52 第一接合面521 殼體522 蓋體523 流道524 傳導層525   Machine 10 Operating plane 11 Test area 12 Drive unit 13 Feeding device 20 Receiving device 30 Conveyor 40 Pick and place 41, 42 Slide rail carrier group 43, 44 Crimping device 50 Crimping arm 51 Frame 511 The first fixture 52 First joint surface 521 Shell 522 Lid 523 Runner 524 Conductive layer 525 To 第二治具53 第二接合面531 溫控面532 基座533 第二溫控器534 下壓治具535 彈性件536 導桿537 彈性件538 傳導層539 加壓器54 驅動單元541 連結件542 彈性膜片543 封閉氣室544 推擠器55 中央控制裝置60 測試設備70 料盤91 料盤92 電子元件99、99’ The second fixture 53 Second joint surface 531 Temperature control surface 532 Base 533 Second thermostat 534 Down pressure fixture 535 Elastic 536 Guide rod 537 Elastic 538 Conductive layer 539 Pressurizer 54 Drive unit 541 Connector 542 Elastic diaphragm 543 Closed air chamber 544 Pusher 55 Central control unit 60 Test equipment 70 Reel 91 Reel 92 Electronic components 99, 99’

第1圖為本創作第一實施例分類設備之俯視示意圖。 Figure 1 is a schematic top view of the classification device according to the first embodiment of the creation.

第2圖為本創作第一實施例溫控裝置之剖面示意圖。 Figure 2 is a schematic cross-sectional view of the temperature control device of the first embodiment of the creation.

第3圖為本創作第一實施例溫控裝置之使用狀態示意圖。 Figure 3 is a schematic diagram of the use state of the temperature control device of the first embodiment of the creation.

第4圖為本創作第一實施例溫控裝置之第一接合面與第二接合面之剖面示意圖。 Figure 4 is a schematic cross-sectional view of the first joint surface and the second joint surface of the temperature control device of the first embodiment of the creation.

第5圖為本創作第一實施例溫控裝置施加接合壓力之第一接合面與第二接合面之剖面示意圖。 Figure 5 is a schematic cross-sectional view of the first joint surface and the second joint surface where the temperature control device of the first embodiment of the invention applies the joint pressure.

第6圖為本創作第二實施例溫控裝置之剖面示意圖。 Figure 6 is a schematic cross-sectional view of the temperature control device of the second embodiment of the creation.

第7圖為本創作第三實施例溫控裝置之剖面示意圖。 Figure 7 is a schematic cross-sectional view of the temperature control device according to the third embodiment of the creation.

第8圖為本創作第三實施例溫控裝置之使用狀態示意圖。 Figure 8 is a schematic diagram of the use state of the temperature control device of the third embodiment of the creation.

第9圖為本創作第四實施例溫控裝置之剖面示意圖。 Figure 9 is a schematic cross-sectional view of the temperature control device of the fourth embodiment of the creation.

51:壓接臂 51: crimping arm

52:第一治具 52: The first fixture

521:第一接合面 521: first joint surface

522:殼體 522: Shell

523:蓋體 523: Lid

524:流道 524: Runner

53:第二治具 53: Second Fixture

531:第二接合面 531: second joint surface

532:溫控面 532: Temperature Control Surface

533:基座 533: Pedestal

534:第二溫控器 534: second thermostat

535:下壓治具 535: Down Pressure Fixture

54:加壓器 54: Pressurizer

541:驅動單元 541: drive unit

542:連結件 542: link

Claims (7)

一種溫控裝置,適於控制電子元件的溫度以供執行測試作業,該溫控裝置包含:第一治具,具有第一接合面,該第一治具還具有第一溫控器,該第一溫控器能改變該第一接合面的溫度;第二治具,具有第二接合面與溫控面,第二治具還具有第二溫控器,該第二溫控器能改變該溫控面的溫度;加壓器,受驅動以向該第一接合面與該第二接合面中至少一者提供接合壓力,使該第一接合面與該第二接合面其中一者朝向另一者接觸且擠壓而減少接觸表面縫隙,以致提高該第一接合面與該第二接合面之間的溫度傳導率;其中該第一治具與該第二治具其中一者能相對於另一者移動而使該第一接合面與該第二接合面接觸或分離,該加壓器於該第一接合面與該第二接合面接觸時提供該接合壓力,以使該第一接合面與該第二接合面其中一者朝向另一者擠壓;其中該加壓器包含驅動單元與連結件,該驅動單元設置於該第一治具與該第二治具其中一者,該連結件設置於該第一治具與該第二治具其中另一者,該驅動單元能受驅動而帶動該連結件相對於該驅動單元移動。 A temperature control device suitable for controlling the temperature of electronic components for performing test operations. The temperature control device includes a first jig having a first joint surface, the first jig further having a first temperature controller, and the first jig A thermostat can change the temperature of the first joint surface; the second jig has a second joint surface and a temperature control surface, and the second jig also has a second thermostat that can change the The temperature of the temperature control surface; a pressurizer, driven to provide bonding pressure to at least one of the first bonding surface and the second bonding surface, so that one of the first bonding surface and the second bonding surface faces the other One contacts and squeezes to reduce the contact surface gap, so as to increase the temperature conductivity between the first joint surface and the second joint surface; wherein one of the first jig and the second jig can be opposed to The other moves to make the first joint surface contact or separate from the second joint surface, and the presser provides the joint pressure when the first joint surface contacts the second joint surface, so that the first joint One of the surface and the second joint surface is pressed toward the other; wherein the pressurizer includes a driving unit and a connecting member, the driving unit is disposed on one of the first jig and the second jig, the The connecting piece is arranged on the other of the first jig and the second jig, and the driving unit can be driven to drive the connecting piece to move relative to the driving unit. 如申請專利範圍第1項所述的溫控裝置,其中該加壓器包含一彈性膜片,該彈性膜片圍構封閉氣室,該封閉氣室供連接氣壓驅動單元以向該第一治具或該第二治具施加該接合壓力。 The temperature control device according to the first item of the patent application, wherein the pressurizer includes an elastic diaphragm, the elastic diaphragm encloses a closed air chamber, and the closed air chamber is connected to a pneumatic drive unit for the first treatment Or the second jig to apply the joining pressure. 如申請專利範圍第1項所述的溫控裝置,其中該驅動單元為氣壓缸或馬達螺桿組。 As for the temperature control device described in item 1 of the scope of patent application, the driving unit is a pneumatic cylinder or a motor screw group. 如申請專利範圍第1項所述的溫控裝置,其中該第一治具與該第二治具其中至少一者包含傳導層,該傳導層位於該第一溫控器與該第二溫控器之間,該傳導層為導熱片、導熱膠或軟性介面導熱材料。 The temperature control device according to claim 1, wherein at least one of the first jig and the second jig includes a conductive layer, and the conductive layer is located between the first temperature controller and the second temperature controller Between the devices, the conductive layer is a thermal conductive sheet, a thermal conductive glue or a soft interface thermal conductive material. 如申請專利範圍第1項所述的溫控裝置,其中該第一溫控器為冷卻器,該第二溫控器為加熱器、致冷晶片或功率低於該第一溫控器的冷卻器。 The temperature control device described in item 1 of the scope of patent application, wherein the first temperature controller is a cooler, and the second temperature controller is a heater, a cooling chip or a cooling power lower than that of the first temperature controller Device. 如申請專利範圍第1項所述的溫控裝置,其中該電子元件具有抗壓破壞強度,該接合壓力介於該抗壓破壞強度的0.3倍至1倍之間,或0.5倍至1倍之間。 The temperature control device described in item 1 of the scope of the patent application, wherein the electronic component has a compressive breaking strength, and the bonding pressure is between 0.3 times and 1 time of the compressive breaking strength, or 0.5 times to 1 times between. 一種分類設備,供設置測試設備以對電子元件執行測試分類作業,該測試設備供容納該電子元件以進行測試,該分類設備包含:機台,具有一測試區,該測試區供設置該測試設備;供料裝置,配置於該機台,該供料裝置具有至少一供料承置器,該供料承置器供容納待測試之電子元件;收料裝置,配置於該機台,該收料裝置具有至少一收料承置器,該收料承置器供容納已測試之電子元件;壓接裝置,配置於該機台以對容納於該測試設備的電子元件進行壓接作業;輸送裝置,配置於該機台,該輸送裝置具有至少一輸送器,該輸送器於該供料裝置、該收料裝置、該壓接裝置與該測試區中至少兩者 之間輸送電子元件;如申請專利範圍第1至6項中任一項所述的溫控裝置,該溫控裝置設置於該壓接裝置、該輸送裝置與該機台其中至少一者;中央控制裝置,連接以控制及整合該供料裝置、該收料裝置與該壓接裝置動作。 A sorting device for setting test equipment to perform test sorting operations on electronic components, the test device for accommodating the electronic components for testing, the sorting device includes: a machine, having a test area, the test area for setting the test equipment ; The feeding device is configured in the machine, the feeding device has at least one feeding holder, and the feeding holder is used to hold the electronic components to be tested; the receiving device is arranged in the machine, and the receiving The material receiving device has at least one receiving holder for accommodating the electronic components that have been tested; a crimping device arranged on the machine to perform crimping operations on the electronic components contained in the testing equipment; The device is arranged on the machine, the conveying device has at least one conveyor, and the conveyor is used in at least two of the feeding device, the receiving device, the crimping device, and the test area Electronic components are transported between; such as the temperature control device described in any one of items 1 to 6 in the scope of the patent application, the temperature control device is provided at at least one of the crimping device, the conveying device, and the machine; the center The control device is connected to control and integrate the actions of the feeding device, the receiving device and the crimping device.
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TW201031297A (en) * 2008-10-31 2010-08-16 Toray Industries Method for bonding electronic components and flexible film substrate and bonding device thereof
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