TWI719631B - Apparatus and method for scanning artificial structure - Google Patents

Abstract

A method for scanning artificial structure comprising following steps of: moving a scanning artificial structure apparatus along a scanning path within a to-be-tested area, in the meantime, measuring magnetic field by four magnetic field sensors, respectively, of the scanning artificial structure apparatus to obtain four magnetic field measurement sequences, and recording a position sequence when measuring magnetic field, wherein the four magnetic field sensors are non-coplanar configured; and calculating a magnetic field variation distribution from the four magnetic field measurement sequences and the position sequence, wherein the magnetic field variation distribution is corresponding to at least one artificial structure distribution.

Description

Man-made object structure scanning device and scanning method thereof

The invention relates to an artificial object structure scanning device and its scanning method, and refers to an artificial object structure scanning device and its scanning method having at least four magnetic field sensors arranged in a non-coplanar plane.

Please refer to Figure 12, which is a schematic diagram of conventional magnetic field measurement. The conventional technique is applied to accurately measure the BEAth (vector field) of a geomagnetic field. However, since the magnetic field measurement is easily interfered, the conventional technology is to suspend a precision magnetic field measuring instrument 91 under a helicopter 90, and the precision magnetic field measuring instrument 91 is suspended by the helicopter 90 to measure the magnetic field in the area to be measured. Measurement. The length of the suspension must be long enough to prevent an induced magnetic field induced by the helicopter 90 from affecting the measurement data of the precision magnetic field measuring instrument 91; and a high-precision precision magnetic field measuring instrument 91 is required to accurately measure magnetic field. However, the artificial object structure on the ground will generate an artificial object structure magnetic field BArtificial (vector field) due to induction, especially when the artificial object structure includes a conductive material, it is easier to generate an artificial object structure magnetic field BArtificial due to induction. Therefore, when performing magnetic field measurement in the prior art, the precision magnetic field measuring instrument 91 needs to be at a certain height from the ground to avoid being induced by some objects on the ground, especially man-made structures. BArtificial The impact.

Generally, during road excavation or excavation in some construction areas, some pipelines are often accidentally dug. Occasionally, accidentally digging into gas pipelines, etc., is very dangerous. How to find out whether there are pipelines underground before digging has been an unsolvable problem. Although the conventional technology can accurately measure the magnetic field, but its measurement of the magnetic field measured value (vector) comprising the sum of the geomagnetic field measuring position and BEarth BArtificial field of man-made structures. Therefore, the conventional technology using a precision magnetic field measuring instrument 91 cannot distinguish the magnitude and direction of the BEAth component of its magnetic field measurement value (vector), nor can it distinguish the magnitude and direction of the artificial structure magnetic field BArtificial component. direction. Therefore, the conventional technology cannot be used to measure the artificial structure magnetic field induced by the structure of the man-made object , BArtificial, and cannot be applied to scan the structure of the man-made object under the ground.

In view of this, the inventor has developed a design that is easy to assemble, which can scan the structure of man-made objects under the ground with the technology of measuring magnetic field. It is not only convenient to install, but also has the advantages of low cost, in order to take into account flexibility and economic considerations Therefore, the present invention was born.

The technical problem to be solved by the present invention is how to provide a man-made structure scanning device and a scanning method thereof to scan the man-made structure under the ground so as to avoid the man-made structure under the ground.

In order to solve the aforementioned problems and achieve the expected effect, the present invention provides a scanning method for man-made structures, wherein a scanning device for man-made structures includes a magnetic field sensor, and the magnetic field sensor includes a first magnetic field sensor and a second magnetic field sensor. The magnetic field sensor, a third magnetic field sensor, and a fourth magnetic field sensor. The first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are arranged on a non-coplanar plane. The object structure scanning method includes the following steps: Step A: Move the man-made object structure scanning device along a scanning path in an area to be measured, and use the first magnetic field sensor, the second magnetic field sensor, and the second magnetic field sensor respectively during the movement. Three magnetic field induction The device and the fourth magnetic field sensor perform magnetic field measurement to respectively measure a first magnetic field measurement value sequence, a second magnetic field measurement value sequence, a third magnetic field measurement value sequence, and a fourth magnetic field measurement value sequence , And record a position sequence during the magnetic field measurement; and Step B: From the first magnetic field measurement value sequence, the second magnetic field measurement value sequence, the third magnetic field measurement value sequence, the fourth magnetic field measurement value sequence, and the position The sequence calculation obtains a magnetic field variation distribution, where the magnetic field variation distribution corresponds to the structure distribution of an artificial object.

When implemented, the aforementioned artificial object structure scanning method further includes the following step: Step A0: measure by the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor respectively An instrument magnetic field generated by the man-made structure scanning device separately measures a first instrument magnetic field measurement value, a second instrument magnetic field measurement value, a third instrument magnetic field measurement value, and a fourth instrument magnetic field measurement Value; where in step B, the magnetic field variation distribution system is subtracted from the first magnetic field measurement value sequence minus the first instrument magnetic field measurement value, the second magnetic field measurement value sequence minus the second instrument magnetic field measurement value, the third magnetic field The measurement value sequence is calculated by subtracting the third instrument's magnetic field measurement value, the fourth magnetic field measurement value sequence subtracting the fourth instrument's magnetic field measurement value and the position sequence; the method's step execution sequence is (1) Sequential Perform step A0, step A, and step B, or (2) perform step A, step A0, and step B in sequence.

In the implementation, step B of the aforementioned artificial object structure scanning method includes the following steps: calculate a first magnetic field measurement value distribution from the position sequence and the first magnetic field measurement value sequence minus the first instrument magnetic field measurement value ; Calculate a second magnetic field measurement value distribution from the position sequence and the second magnetic field measurement value sequence minus the second instrument’s magnetic field measurement value; subtract the third instrument from the position sequence and the third magnetic field measurement value sequence The magnetic field measurement value calculates a third magnetic field measurement value distribution; from the position sequence and the fourth magnetic field measurement value sequence minus the fourth instrument’s magnetic field measurement value, a third magnetic field measurement value distribution is calculated. A fourth magnetic field measurement value distribution; and the magnetic field variation distribution is calculated from the first magnetic field measurement value distribution, the second magnetic field measurement value distribution, the third magnetic field measurement value distribution, and the fourth magnetic field measurement value distribution.

In the implementation of the aforementioned artificial object structure scanning method, the magnetic field sensor further includes a fifth magnetic field sensor, a sixth magnetic field sensor, a seventh magnetic field sensor, and an eighth magnetic field sensor; where step A It further includes the following steps: performing magnetic field measurements with the fifth magnetic field sensor, the sixth magnetic field sensor, the seventh magnetic field sensor, and the eighth magnetic field sensor during the movement to respectively measure a fifth magnetic field measurement value sequence, A sixth magnetic field measurement value sequence, a seventh magnetic field measurement value sequence, and an eighth magnetic field measurement value sequence; wherein in step B, the magnetic field variation distribution is determined by the first magnetic field measurement value sequence and the second magnetic field measurement value sequence Measured value sequence, third magnetic field measurement value sequence, fourth magnetic field measurement value sequence, fifth magnetic field measurement value sequence, sixth magnetic field measurement value sequence, seventh magnetic field measurement value sequence, and eighth magnetic field measurement value sequence Sequence and position sequence are calculated.

When implemented, the aforementioned scanning method for man-made structures further includes the following steps: Step A0: From the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, the fourth magnetic field sensor, and the fifth magnetic field sensor. The magnetic field sensor, the sixth magnetic field sensor, the seventh magnetic field sensor, and the eighth magnetic field sensor respectively measure an instrument magnetic field generated by the artificial object structure scanning device, and respectively measure a first instrument magnetic field measurement value and a first instrument magnetic field measurement value. The magnetic field measurement value of the second instrument, the magnetic field measurement value of the third instrument, the magnetic field measurement value of the fourth instrument, the magnetic field measurement value of the fifth instrument, the magnetic field measurement value of the sixth instrument, the magnetic field measurement value of the seventh instrument Measured value and an eighth instrument magnetic field measurement value; wherein in step B, the magnetic field variation distribution is the first magnetic field measurement value sequence minus the first instrument magnetic field measurement value, and the second magnetic field measurement value sequence minus the first Second, the magnetic field measurement value of the instrument, the third magnetic field measurement value sequence minus the third instrument magnetic field measurement value, the fourth magnetic field measurement value sequence subtracts the fourth instrument magnetic field measurement value, the fifth magnetic field measurement value sequence subtracts The fifth instrument magnetic field measurement value, the sixth magnetic field measurement value sequence minus the sixth Calculated by the instrument magnetic field measurement value, the seventh magnetic field measurement value sequence minus the seventh instrument magnetic field measurement value, the eighth magnetic field measurement value sequence minus the eighth instrument magnetic field measurement value and the position sequence; the steps of the method The execution sequence is (1) Step A0, Step A, and Step B are executed in sequence, or (2) Step A, Step A0, and Step B are executed in sequence.

In implementation, the aforementioned artificial object structure scanning method, wherein in step A0, the first magnetic field sensor measures the magnetic field of the instrument, including the following steps: Step A11: the artificial object structure scanning device is induced along the first magnetic field One of the first axis of the device is rotated at least 180°, and the first magnetic field sensor performs magnetic field measurement during the rotation to obtain a first axis measurement value sequence of the first magnetic field sensor; Step A12: Scan the man-made structure The sight device rotates at least 180° along a second axis of the first magnetic field sensor, and during the rotation, the first magnetic field sensor performs magnetic field measurement to obtain a sequence of first magnetic field sensor second axis measurement values, The first axis of the first magnetic field sensor is orthogonal to the second axis of the first magnetic field sensor; and Step A13: the first axis measurement sequence of the first magnetic field sensor and the second axis of the first magnetic field sensor The measured value sequence is used to calculate the magnetic field measurement value of the first instrument. The measurement of the instrument magnetic field by the second magnetic field sensor includes the following steps: Step A21: Move the man-made structure scanning device along one of the second magnetic field sensors One axis rotates at least 180°, and the second magnetic field sensor performs the magnetic field measurement during the rotation to obtain a second magnetic field sensor first axis measurement value sequence; Step A22: Move the artificial object structure scanning device along A second axis of the second magnetic field sensor rotates at least 180°, and during the rotation, the second magnetic field sensor performs magnetic field measurement to obtain a second axis measurement value sequence of the second magnetic field sensor, wherein the second magnetic field The first axis of the sensor is orthogonal to the second axis of the second magnetic field sensor; and Step A23: The first axis measurement value sequence of the second magnetic field sensor and the second axis measurement value sequence of the second magnetic field sensor Calculate the measured value of the magnetic field of the second instrument; wherein the third magnetic field sensor measures the magnetic field of the instrument, including the following steps: Step A31: Scanning the structure of the man-made object The third magnetic field sensor is rotated at least 180° along a first axis of the third magnetic field sensor, and the third magnetic field sensor performs magnetic field measurement during the rotation to obtain a measurement value sequence of the first axis of the third magnetic field sensor; step A32: Rotate the man-made structure scanning device at least 180° along one of the second axis of the third magnetic field sensor, and measure the magnetic field by the third magnetic field sensor during the rotation to obtain a third magnetic field sensor A sequence of two-axis measurement values, in which the first axis of the third magnetic field sensor is orthogonal to the second axis of the third magnetic field sensor; and Step A33: the sequence of the first axis measurement value of the third magnetic field sensor and the second axis The second-axis measurement value sequence of the three magnetic field sensor calculates the magnetic field measurement value of the third instrument; wherein the fourth magnetic field sensor measures the magnetic field of the instrument, including the following steps: Step A41: Move the man-made structure scanning device along the first The first axis of one of the four magnetic field sensors rotates at least 180°, and the fourth magnetic field sensor performs magnetic field measurement during the rotation to obtain a sequence of the first axis measurement values of the fourth magnetic field sensor; Step A42: Make artificial The object structure scanning device rotates at least 180° along one of the second axis of the fourth magnetic field sensor, and the fourth magnetic field sensor performs the magnetic field measurement during the rotation to obtain the second axis measurement of the fourth magnetic field sensor A sequence of values, in which the first axis of the fourth magnetic field sensor is orthogonal to the second axis of the fourth magnetic field sensor; and Step A43: the sequence of values measured by the first axis of the fourth magnetic field sensor and the fourth magnetic field sensor The second axis measurement value sequence calculates the fourth instrument magnetic field measurement value.

In implementation, the aforementioned artificial object structure scanning method, wherein in step A0, the fifth magnetic field sensor measures the magnetic field of the instrument, including the following steps: Step A51: Make the artificial object structure scanning device follow the fifth magnetic field The first axis of one of the sensors is rotated at least 180°, and the fifth magnetic field sensor performs the magnetic field measurement during the rotation to obtain a sequence of the first axis measurement value of the fifth magnetic field sensor; Step A52: Make the man-made object structure The scanning device rotates at least 180° along a second axis of the fifth magnetic field sensor, and the fifth magnetic field sensor performs magnetic field measurement during the rotation to obtain a sequence of the second axis measurement value of the fifth magnetic field sensor , The first axis of the fifth magnetic field sensor and the fifth magnetic field sensor The second axis of the sensor is orthogonal; and Step A53: Calculate the magnetic field measurement value of the fifth instrument from the first axis measurement value sequence of the fifth magnetic field sensor and the second axis measurement value sequence of the fifth magnetic field sensor; where The measurement of the magnetic field of the instrument by the sixth magnetic field sensor includes the following steps: Step A61: Rotate the man-made structure scanning device at least 180° along one of the first axis of the sixth magnetic field sensor, and use the sixth magnetic field during the rotation The sensor performs the magnetic field measurement to obtain a measurement value sequence of the first axis of the sixth magnetic field sensor; Step A62: Rotate the man-made structure scanning device at least 180° along the second axis of one of the sixth magnetic field sensors, During the rotation, the sixth magnetic field sensor performs the magnetic field measurement to obtain a sequence of the second axis measurement value of the sixth magnetic field sensor, where the first axis of the sixth magnetic field sensor and the second axis of the sixth magnetic field sensor Two-axis orthogonal; and step A63: calculate the sixth instrument magnetic field measurement value from the sixth magnetic field sensor first axis measurement value sequence and the sixth magnetic field sensor second axis measurement value sequence; where the seventh magnetic field The sensor measures the magnetic field of the instrument, including the following steps: Step A71: Rotate the artificial object structure scanning device at least 180° along the first axis of one of the seventh magnetic field sensors, and the seventh magnetic field sensor performs the magnetic field during the rotation A first axis measurement sequence of the seventh magnetic field sensor is obtained by measurement; Step A72: Rotate the man-made structure scanning device along a second axis of the seventh magnetic field sensor at least 180° during the rotation The seventh magnetic field sensor performs magnetic field measurement to obtain a seventh magnetic field sensor second axis measurement sequence, where the first axis of the seventh magnetic field sensor is orthogonal to the second axis of the seventh magnetic field sensor And Step A73: Calculate the magnetic field measurement value of the seventh instrument from the first axis measurement value sequence of the seventh magnetic field sensor and the second axis measurement value sequence of the seventh magnetic field sensor; wherein the eighth magnetic field sensor measures The magnetic field of the instrument includes the following steps: Step A81: Rotate the man-made structure scanning device at least 180° along one of the first axis of the eighth magnetic field sensor, and perform the magnetic field measurement by the eighth magnetic field sensor during the rotation Obtain a first axis measurement value sequence of the eighth magnetic field sensor; Step A82: Rotate the man-made structure scanning device along one of the second axis of the eighth magnetic field sensor at least 180°, and the eighth magnetic field sensor performs the magnetic field measurement during the rotation to obtain a sequence of the second axis measurement value of the eighth magnetic field sensor, where the first axis of the eighth magnetic field sensor and the eighth magnetic field sensor The second axis of the device is orthogonal; and Step A83: Calculate the eighth instrument magnetic field measurement value from the eighth magnetic field sensor first axis measurement value sequence and the eighth magnetic field sensor second axis measurement value sequence.

In the implementation, step B of the aforementioned artificial object structure scanning method includes the following steps: calculate a first magnetic field measurement value distribution from the position sequence and the first magnetic field measurement value sequence minus the first instrument magnetic field measurement value ; Calculate a second magnetic field measurement value distribution from the position sequence and the second magnetic field measurement value sequence minus the second instrument’s magnetic field measurement value; subtract the third instrument from the position sequence and the third magnetic field measurement value sequence The magnetic field measurement value calculates a third magnetic field measurement value distribution; a fourth magnetic field measurement value distribution is calculated from the position sequence and the fourth magnetic field measurement value sequence minus the fourth instrument magnetic field measurement value; from the position sequence And calculate a fifth magnetic field measurement value distribution by subtracting the fifth magnetic field measurement value sequence from the fifth magnetic field measurement value sequence; subtract the sixth instrument magnetic field measurement value from the position sequence and the sixth magnetic field measurement value sequence Calculate a sixth magnetic field measurement value distribution; calculate a seventh magnetic field measurement value distribution from the position sequence and the seventh magnetic field measurement value sequence subtracting the seventh instrument’s magnetic field measurement value; calculate the seventh magnetic field measurement value distribution from the position sequence and the eighth The magnetic field measurement value sequence subtracts the eighth instrument’s magnetic field measurement value to calculate an eighth magnetic field measurement value distribution; and from the first magnetic field measurement value distribution, the second magnetic field measurement value distribution, and the third magnetic field measurement value distribution , The fourth magnetic field measurement value distribution, the fifth magnetic field measurement value distribution, the sixth magnetic field measurement value distribution, the seventh magnetic field measurement value distribution, and the eighth magnetic field measurement value distribution to calculate the magnetic field variation distribution.

In the implementation of the aforementioned artificial object structure scanning method, the magnetic field variation distribution is a magnetic field gradient vector distribution, a magnetic field gradient vector size distribution, a magnetic field gradient vector and a horizontal component distribution or a magnetic field gradient vector. Size distribution.

In implementation, the aforementioned scanning method for man-made structures includes the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, the fourth magnetic field sensor, the fifth magnetic field sensor, and the sixth magnetic field sensor. The seventh magnetic field sensor and the eighth magnetic field sensor are respectively located at the eight vertices of a parallelepiped, the eight vertices of a rectangular parallelepiped, or the eight vertices of a regular hexahedron.

In the implementation of the aforementioned artificial object structure scanning method, the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are respectively located at the four vertices or one of a regular triangular pyramid. The four vertices of a regular tetrahedron.

In the implementation, in the aforementioned artificial object structure scanning method, the artificial object structure scanning device further includes a positioning part.

In implementation, the aforementioned artificial object structure scanning method, wherein the positioning part includes one selected from the following groups: a distance measuring wheel, a distance meter, a ruler, a tape measure, a laser positioning device, An ultrasonic positioning device, a radar wave positioning device, a GPS positioning device and an image positioning device.

In addition, the present invention further provides an artificial object structure scanning device, including: a magnetic field sensing part, wherein the magnetic field sensing part includes a first magnetic field sensor, a second magnetic field sensor, a third magnetic field sensor, and a fourth magnetic field sensor. The magnetic field sensor, the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor and the fourth magnetic field sensor are arranged on a non-coplanar plane; wherein the artificial object structure scanning device is used to perform the artificial Object structure scanning method.

In implementation, in the aforementioned artificial object structure scanning device, the magnetic field sensor further includes a fifth magnetic field sensor, a sixth magnetic field sensor, a seventh magnetic field sensor, and an eighth magnetic field sensor.

In implementation, the aforementioned artificial object structure scanning device, in which the first magnetic field induces The sensor, the second magnetic field sensor, the third magnetic field sensor, the fourth magnetic field sensor, the fifth magnetic field sensor, the sixth magnetic field sensor, the seventh magnetic field sensor, and the eighth magnetic field sensor are respectively located on a parallel six faces The eight vertices of a body, the eight vertices of a rectangular parallelepiped, or the eight vertices of a regular hexahedron.

In implementation, in the aforementioned artificial object structure scanning device, the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are respectively located at the four vertices or one of a regular triangular pyramid. The four vertices of a regular tetrahedron.

In implementation, the aforementioned artificial object structure scanning device further includes a positioning portion.

In implementation, the aforementioned artificial object structure scanning device, wherein the positioning part includes one selected from the following groups: a distance measuring wheel, a distance meter, a ruler, a tape measure, a laser positioning device, An ultrasonic positioning device, a radar wave positioning device, a GPS positioning device and an image positioning device.

In order to further understand the present invention, the following is a detailed description of the specific components of the present invention and the effects achieved by the preferred embodiments, in conjunction with the drawings and figure numbers.

1‧‧‧The first magnetic field sensor

2‧‧‧Second magnetic field sensor

3‧‧‧The third magnetic field sensor

4‧‧‧The fourth magnetic field sensor

5‧‧‧Fifth Magnetic Field Sensor

6‧‧‧The sixth magnetic field sensor

7‧‧‧The seventh magnetic field sensor

8‧‧‧The eighth magnetic field sensor

10‧‧‧Man-made object structure scanning device

20‧‧‧Positioning Department

30‧‧‧Carrier Department

31‧‧‧Front

40‧‧‧Mobile Department

50‧‧‧Magnetic field sensor

60‧‧‧Data Processing Department

61‧‧‧Transfer

70‧‧‧Area to be tested

71‧‧‧Scan Path

81,82,83,84‧‧‧Areas with large magnetic field variation

90‧‧‧Helicopter

91‧‧‧Precision magnetic field measuring instrument

K‧‧‧Rotating axis

T1, T2‧‧‧Metal water pipe

V,V _rot ‧‧‧vector

X1, Y1, Z1‧‧‧Three axes of the first magnetic field sensor

X2, Y2, Z2‧‧‧Three axis of the second magnetic field sensor

X3, Y3, Z3‧‧‧Three axis of the third magnetic field sensor

X4, Y4, Z4‧‧‧Three axis of the fourth magnetic field sensor

X5, Y5, Z5‧‧‧Three axis of the fifth magnetic field sensor

X6, Y6, Z6‧‧‧Three axis of the sixth magnetic field sensor

X7, Y7, Z7‧‧‧Three axis of the seventh magnetic field sensor

X8, Y8, Z8‧‧‧Three axis of the eighth magnetic field sensor

θ‧‧‧Rotation angle

FIG. 1 is a schematic diagram of a three-dimensional appearance of a specific embodiment of a scanning device for man-made structures according to the present invention.

Figure 2 is a schematic diagram of the scanning path and the magnetic field variation distribution in the area to be measured and the corresponding man-made structure distribution.

FIG. 3 is a schematic diagram of a three-dimensional appearance of another embodiment of the scanning device for man-made structures according to the present invention.

Figure 4 shows each of the magnetic field sensing parts of the specific embodiment of the man-made structure scanning device in Figure 3 Schematic diagram of the three axes of a magnetic field sensor.

Figure 5 is a schematic diagram of the vector V rotated by the angle θ along the K axis.

FIG. 6 is a schematic diagram of the specific embodiment of the artificial object structure scanning device of FIG. 3 rotating along the Z1 axis of the first magnetic field sensor.

Figure 7A is a specific embodiment of the man-made structure scanning device of Figure 3 during the rotation of the first magnetic field sensor along the Z1 axis of the X1 axis and Y1 axis of the magnetic field measured by the first magnetic field sensor Weight.

FIG 7B is based on the specific embodiment of the man-made structure of FIG. 3 scanning apparatus of embodiments of the Z1-axis component of the magnetic field detected along the first axis Z1 during magnetic field sensor by the amount of the first magnetic field sensor.

Fig. 8 is a schematic diagram of the specific embodiment of the man-made structure scanning device shown in Fig. 3 rotating along the X1 axis of the first magnetic field sensor.

FIG. 9 is a schematic diagram of a three-dimensional appearance of a specific embodiment of a scanning device for man-made structures according to the present invention.

FIG. 10 is a schematic diagram of a three-dimensional appearance of another specific embodiment of a scanning device for man-made structures according to the present invention.

Fig. 11 is a schematic diagram of the three axes of each magnetic field sensor of the magnetic field sensing part of the specific embodiment of the man-made structure scanning device of Fig. 10.

Figure 12 is a schematic diagram of conventional magnetic field measurement.

Please refer to FIG. 1, which is a schematic diagram of a three-dimensional appearance of a specific embodiment of a scanning device for man-made structures of the present invention. The present invention provides a scanning device 10 for man-made structures, which includes a carrying part 30 and a magnetic field sensing part 50. The magnetic field induction part 50 is arranged on the carrying part 30. The magnetic field sensor 50 is used to measure the magnetic field. The magnetic field sensor 50 includes a first magnetic field sensor 1, a second magnetic field sensor 2, a third magnetic field sensor 3, and a fourth magnetic field sensor 4, wherein the first magnetic field sensor 1, the second magnetic field sensor The device 2, the third magnetic field sensor 3 and the fourth magnetic field sensor 4 are arranged on a non-coplanar plane. In this embodiment, the carrying portion 30 of the man-made structure scanning device 10 is made of a material that can avoid generating an induced magnetic field, such as plastic or some non-metallic materials. Because the artificial structure will generate an artificial structure magnetic field BArtificial (vector field) due to induction, especially when the artificial structure includes a conductive material, it is easier to generate an artificial structure magnetic field BArtificial due to induction. When the man-made structure scanning device 10 is used to scan the man-made structure, for any magnetic field sensor, the measured magnetic field value (vector) includes the measured position of the geomagnetic field BEAth and The sum of artificial structure magnetic field BArtificial. For the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 on the man-made structure scanning device 10, the source of the geomagnetic field BEAth is very far away. Considering the geomagnetic field BEAth as a magnetic dipole, one pole is located near the geographic north pole and the other pole is located near the geographic south pole. Relatively speaking, the source of the artificial structure magnetic field BArtificial is relatively close. Since the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 of the present invention are arranged on a non-coplanar plane, the measurement by different magnetic field sensors The measured magnetic field value (including an earth magnetic field component and an artificial object structure magnetic field component), where the earth magnetic field component is almost the same, but the artificial object structure magnetic field component will be different. Please refer to Figure 2 at the same time, which is a schematic diagram of the scanning path and the distribution of magnetic field variation in the area to be measured and the corresponding structure distribution of man-made objects. The present invention provides an artificial object structure scanning method, which includes the following steps: Step A: Move the artificial object structure scanning device 10 along a scanning path 71 in an area to be measured 70, and respectively sense the first magnetic field during the movement. The first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 perform magnetic field measurement and record a position sequence [PS] during the magnetic field measurement. The first magnetic field sensor 1, The second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 respectively measure a first magnetic field measurement value sequence [BUC1] (vector sequence) and a second magnetic field measurement value sequence [BUC2] (Vector sequence), a third sequence of magnetic field measurement values [ BUC3] (vector sequence), and a fourth sequence of magnetic field measurement values [BUC4] (vector sequence); and Step B: From the first magnetic field measurement sequence [ BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , the fourth magnetic field measurement value sequence [BUC4], and the position sequence [PS] are calculated to obtain a magnetic field variation distribution BVarD. Because in a local area (for example, the area to be measured 70), the geomagnetic field BEAth will not change in a short time. And for the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4, the source of the geomagnetic field BEAth is very far away. Therefore, there is no difference in the BEAth component of the geomagnetic field measured by the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 , while the artificial object structure magnetic field BArtificial The component is because the artificial object structure magnetic field BArtificial source is closer, and because the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 of the present invention are arranged in different locations. On the plane, regardless of the vector direction of the artificial object structure magnetic field BArtificial, there are at least two magnetic field sensors among the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 The measured BArtificial component of the artificial structure magnetic field is not the same. Therefore, the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence can be obtained by the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 respectively. a magnetic field measurement value sequence [BUC2], a third magnetic field measurement value sequence [BUC3], fourth magnetic field measured value sequence [BUC4] to calculate the magnetic field-BArtificial artifact component of geomagnetic field can be calculated BEarth component. In this embodiment, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. The value sequence [BUC4] is calculated to obtain a magnetic field gradient vector size sequence (scalar sequence), and then combined with the magnetic field measurement position sequence [PS] to become a magnetic field gradient vector size distribution (scalar), and The magnetic field variation distribution BVarD is the part of the artificial object structure magnetic field BArtificial generated by the structure of the man-made object, that is, the magnetic field variation distribution BVarD corresponds to the structure distribution of an artificial object. Since the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 of the present invention are arranged on a non-coplanar plane, it does not matter what the vector direction of the artificial object structure magnetic field BArtificial is , The magnetic field gradient can be calculated in any direction (if the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 are arranged on a common plane, the common plane cannot be calculated. The magnetic field gradient on the normal vector of the plane). In Figure 2, the magnetic field variation distribution BVarD is shown in grayscale colors, where the darker the grayscale color, the greater the magnetic field variation. Among them, the four regions with large magnetic field variation are 81, 82, 83, and 84 in the figure. From this, it can be seen that there should be corresponding man-made structures under 81, 82, 83, and 84 in the area to be tested 70. Among them, the photo on the left at the top of Figure 2 has a metal water pipe T1 and the photo on the right has a metal water pipe T2. In the photo on the left, the metal water pipe T1 extends below the area corresponding to 82 in the area 70 to be tested. In the photo on the right, the metal water pipe T2 extends below the area corresponding to 84 in the area to be tested 70. Therefore, the man-made structure scanning method of the present invention can indeed scan the corresponding man-made structure distribution below the area to be tested 70, so as to avoid these man-made structures during construction and excavation.

In some embodiments, the man-made structure scanning device 10 can be moved by hand. In some embodiments, recording the position sequence [PS] during the magnetic field measurement can be achieved by a simple distance measuring tool, such as a distance measuring wheel, a distance meter, a ruler or a tape measure, etc. In some embodiments, the man-made structure scanning device 10 can be fixed on the handle of the distance measuring wheel, so as to measure the magnetic field and record the position while moving. In some embodiments, it is possible to plan the points to be measured on the scanning path 71 in the area to be measured 70 in advance, and first measure the positions of these points to obtain the position sequence [PS], and then The man-made structure scanning device 10 moves to these points and performs magnetic field measurement. In some embodiments, wheels may be installed under the carrying portion 30 to facilitate the stable movement of the artificial object structure scanning device 10, but the material of the wheels is made of materials that can avoid generating an induced magnetic field. In some embodiments, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. A magnetic field gradient vector sequence calculated by the value sequence [BUC4] , combined with the position sequence [PS] during magnetic field measurement, becomes a magnetic field gradient vector distribution (vector). In some embodiments, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. The value sequence [BUC4] is calculated to obtain a magnetic field gradient vector and a horizontal component sequence (vector sequence), and then combined with the magnetic field measurement position sequence [PS] to become a magnetic field gradient vector and a horizontal component distribution (vector ). In other embodiments, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. The measured value sequence [BUC4] is calculated to obtain a magnetic field gradient vector and a horizontal component size sequence (scalar sequence), and then combined with the magnetic field measurement position sequence [PS] to become a horizontal component of a magnetic field gradient vector Size distribution (scalar). From the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , the fourth magnetic field measurement value sequence [BUC4] and the position of the measurement position The sequence [PS] calculates the magnetic field variation distribution BVarD and is not limited to the above method. When the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , the fourth magnetic field measurement value sequence [BUC4] and the known quantity are measured By measuring the position sequence [PS] of the measured position, the magnetic field variation distribution BVarD can be easily calculated.

Please refer to FIG. 3, which is a schematic diagram of a three-dimensional appearance of a specific embodiment of a scanning device for man-made structures of the present invention. The main structure of the embodiment in FIG. 3 is substantially the same as that of the embodiment in FIG. 1, except that it further includes an adapter portion 61, a moving portion 40, and a positioning portion 20. The positioning portion 20 and the adapter portion 61 are arranged on the carrying portion 30. The positioning unit 20 is used for positioning the position to record the position sequence [PS] during the magnetic field measurement. One of the data processing unit 60 is connected to the adapter portion 61 in a wired manner, and is respectively connected to the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the second magnetic field sensor through the adapter portion 61. The four magnetic field sensors 4 and the positioning unit 20 are connected in a wired manner. The data processing unit 60 is used to record the magnetic field data measured by the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 and the positioning position data from the positioning unit 20 (Or to record data and process data). In this embodiment, the data processing unit 60 is disposed outside the artificial object structure scanning device 10. The man-made structure scanning device 10 has a front 31. The moving part 40 is disposed under the carrying part 30, and the moving part 40 is used to carry the man-made structure scanning device 10 and move the man-made structure scanning device 10. The moving part 40 can also rotate the direction so that the direction of the front 31 of the man-made structure scanning device 10 is turned. Please refer to Fig. 4 at the same time, which is a schematic diagram of the three axes of each magnetic field sensor of the magnetic field sensing part of the specific embodiment of the man-made structure scanning device in Fig. 3. Each magnetic field sensor of the magnetic field sensor 50 has three axes. For example, the first magnetic field sensor 1 has an X1 axis, a Y1 axis, and a Z1 axis; the second magnetic field sensor 2 has an X2 axis, one Y2 axis and a Z2 axis; the third magnetic field sensor 3 has an X3 axis, a Y3 axis, and a Z3 axis; the fourth magnetic field sensor 4 has an X4 axis, a Y4 axis, and a Z4 axis. Generally, the three axes of each magnetic field sensor of the magnetic field sensing unit 50 are already marked on the magnetic field sensor when the magnetic field sensor is shipped from the factory, so as to facilitate the use of the user. In this embodiment, the moving part 40 is a motor-powered and steerable wheel. Since the operation of the motor generates a magnetic field, the man-made structure scanning device 10 of the present invention generates an instrument magnetic field BInst (vector field). Therefore, when the man-made structure scanning device 10 is used to scan the man-made structure, for any magnetic field sensor, the measured magnetic field value (vector) includes the geomagnetic field of the measured position. The sum of BEarth , the artificial structure magnetic field BArtificial, and the instrument magnetic field BInst . The instrument magnetic field BInst will cause interference to each magnetic field sensor of the magnetic field induction part 50, so the interference of the instrument magnetic field BInst to each magnetic field sensor of the magnetic field induction part 50 must be removed first. Since the instrument magnetic field BInst is generated by the artificial object structure scanning device 10, the direction of the instrument magnetic field BInst will change according to where the front 31 of the artificial object structure scanning device 10 faces. The first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 are arranged on the carrying portion 30 of the man-made structure scanning device 10. When the direction of the front 31 of the scanning device 10 is changed, the X1 axis and Y1 axis of the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4, respectively , Z1 axis, X2 axis, Y2 axis, Z2 axis, X3 axis, Y3 axis, Z3 axis, X4 axis, Y4 axis, and Z4 axis will change according to the direction of the front 31 of the artificial structure scanning device 10. Therefore, no matter how the orientation of the front 31 of the artificial object structure scanning device 10 changes, for each magnetic field sensor of the magnetic field sensor 50, the instrument magnetic field BInst is a vector of constant magnitude and direction. For the different magnetic field sensors of the magnetic field sensor 50, the value (vector) of the instrument magnetic field BInst measured by the energy is different, that is, the first magnetic field sensor 1, the second magnetic field sensor 2, and the third magnetic field sensor are used respectively. The magnetic field sensor 3 and the fourth magnetic field sensor 4 measure the instrument magnetic field BInst (vector field), and the measured values are a first instrument magnetic field measurement value BInst1 (vector) and a second instrument magnetic field measurement value. BInst2 (vector), a third instrument magnetic field measurement value BInst3 (vector), and a fourth instrument magnetic field measurement value BInst4 (vector), wherein the first instrument magnetic field measurement value BInst1 , the second instrument magnetic field measurement value BInst2 , The third instrument magnetic field measurement value BInst3 and the fourth instrument magnetic field measurement value BInst4 are respectively four different vectors. However, the geomagnetic field BEAth does not change with the direction of the front 31 of the man-made structure scanning device 10. That is to say, if the front 31 of the man-made structure scanning device 10 turns from facing east to facing north (that is, turning 90 degrees counterclockwise), the direction of the instrument magnetic field BInst will also turn 90 degrees counterclockwise; but the geomagnetic field BEarth will not change its direction.

Using this feature, if the man-made structure scanning device 10 is rotated along the Z1 axis of the first magnetic field sensor 1 by an angle of θ, imagine that from the perspective of the first magnetic field sensor 1, we will see that the Earth’s magnetic field BEAth is When rotating around the Z1 axis of the first magnetic field sensor 1, and from the perspective of the first magnetic field sensor 1, the instrument magnetic field BInst is a fixed value (it will not rotate around the Z1 axis of the first magnetic field sensor 1 ). Please also refer to Figure 5, which is a schematic diagram of the vector V rotating by the angle θ along the K axis. For the relationship between the vector rotation around a rotation axis and the rotation angle θ, refer to Rodrigues' rotation formula: V _rot = V cos θ+( K × V )sin θ+ K ( K. V )(1-cos θ)...............(Equation 1) (where the vector V becomes V _rot after rotating by angle θ along the K axis; × is the outer product; ‧ is Inner product)

Please also refer to FIG. 6, which is a schematic diagram of the specific embodiment of the man-made structure scanning device in FIG. 3 rotating along the Z1 axis of the first magnetic field sensor. As shown in Figure 6, when the man-made structure scanning device 10 is rotated by the angle θ along the Z1 axis (first axis) of the first magnetic field sensor 1, if the first magnetic field sensor 1 is used for magnetic field measurement , The result measured by the first magnetic field sensor 1 is as follows: BZ1 _{total_θ} = BEarth _{rotate_Z1_θ} + BInst1 =( BEarth cos θ+( Z1 × BEarth )sin θ+ Z1 ( Z1．BEarth )(1-cos θ)) + BInst1 ................................................ ...(Equation 2)

In Equation 2, the first axis measurement value BZ1 _{total_θ} of the first magnetic field sensor is when the artificial object structure scanning device 10 rotates by the angle θ along the Z1 axis of the first magnetic field sensor 1, the first magnetic field sensor 1 Measured magnetic field measurement value (vector); BEarth _{rotate_Z1_θ} is the component of the geomagnetic field BEAth in the first axis measurement value BZ1 _{total_θ} of the first magnetic field sensor, that is, the man-made structure scanning device 10 moves along the first magnetic field When the Z1 axis of the sensor 1 is rotated by the angle θ, the measured value (vector) of the terrestrial magnetic field BEAth measured by the first magnetic field sensor 1; the measured value of the first instrument magnetic field BInst1 is the first magnetic field sensor The component of the instrument magnetic field BInst in the one-axis measurement value BZ1 _{total_θ} , that is, when the artificial object structure scanning device 10 rotates by the angle θ along the Z1 axis of the first magnetic field sensor 1, the first magnetic field sensor 1 measures The magnetic field measurement value (vector) of the obtained instrument magnetic field BInst. In fact, no matter the man-made structure scanning device 10 rotates a few degrees along the Z1 axis of the first magnetic field sensor 1, the magnetic field measurement value of the instrument magnetic field BInst measured by the first magnetic field sensor 1 is the first instrument magnetic field measurement. Measured value BInst1 . Utilizing the above-mentioned characteristics, the scanning method for man-made structures of the present invention further includes the following steps: Step A0: sensing by the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field The device 4 measures the instrument magnetic field BInst generated by the man-made structure scanning device 10 one by one, wherein the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 respectively measure A first instrument magnetic field measurement value BInst1 , a second instrument magnetic field measurement value BInst2 , a third instrument magnetic field measurement value BInst3, and a fourth instrument magnetic field measurement value BInst4 are measured. Among them, in step B, the magnetic field variation distribution BVarD is the first magnetic field measurement value sequence [BUC1] minus the first instrument magnetic field measurement value BInst1 , the second magnetic field measurement value sequence [BUC2] minus the second instrument magnetic field The measured value BInst2 , the third magnetic field measurement value sequence [BUC3] minus the third instrument magnetic field measurement value BInst3 , the fourth magnetic field measurement value sequence [BUC4] minus the fourth instrument magnetic field measurement value BInst4 , and the position sequence [ PS] is calculated to eliminate the interference of the instrument magnetic field BInst on the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4. The order of execution of the steps of the scanning method for man-made structures of the present invention can be (1) execute step A0, step A, and step B in sequence, or (2) execute step A, step A0, and step B in sequence. In step A0, measuring the instrument magnetic field BInst generated by the man-made structure scanning device 10 by the first magnetic field sensor 1 includes the following steps: step A11, step A12, and step A13. Step A11: (as shown in Figure 6) the man-made structure scanning device 10 is moved along the first axis of the first magnetic field sensor 1 (in this embodiment, the first axis of the first magnetic field sensor 1 is The Z1 axis or the axis that almost coincides with the Z1 axis) rotate at least 180°, and the first magnetic field sensor 1 performs the magnetic field measurement during the rotation, and a sequence of the first axis measurement value of the first magnetic field sensor is measured [ BZ1] (sequence of vectors); wherein the first axis measurement value sequence of the first magnetic field sensor [BZ1] is a sequence composed of the first axis measurement value BZ1 _{total_θ of} the first magnetic field sensor, that is, when it is an artificial structure During the rotation of the scanning device 10 along the Z1 axis of the first magnetic field sensor 1, at different angles θ, a sequence of magnetic field measurement values (vectors) measured by the first magnetic field sensor 1 are formed. Please refer to Fig. 7A and Fig. 7B at the same time, which are the specific embodiments of the man-made structure scanning device in Fig. 3 during the rotation along the first axis (Z1 axis) of the first magnetic field sensor. The components of the X1 axis, Y1 axis, and Z1 axis of the magnetic field measured by the sensor. FIGS. 7A and 7B are examples in which the artificial object structure scanning device 10 rotates 360° along the first axis (Z1 axis) of the first magnetic field sensor 1. Figure 7A shows the components of the X1 axis and Y1 axis of the first axis measurement value BZ1 _{total_θ} of each first axis measurement value sequence [BZ1] of the first magnetic field sensor; in Section 7B The figure shows the Z1 axis component of each first axis measurement value BZ1 _{total_θ} of the first magnetic field sensor in the first axis measurement value sequence [BZ1] of the first magnetic field sensor. However, since the axis of actual rotation is the axis that almost coincides with the first axis ( Z1 axis) of the first magnetic field sensor 1, the first axis measurement value sequence of the first magnetic field sensor in Figure 7B [BZ1] is also There is a small change. The above formula 2 can be rewritten as the following formula 3: BZ1 _{total_θ} = ( BEarth cos θ+( Z1 × BEarth )sin θ- Z1 ( Z1．BEarth )cos θ)+( Z1 ( Z1．BEarth )+ BInst1 ).. .........(Equation 3)

In Equation 3, ( BEarth cos θ+( Z1 × BEarth )sin θ- Z1 ( Z1．BEarth )cos θ) is the component related to the θ angle, and ( Z1 ( Z1．BEarth )+ BInst1 ) is related to θ Angle-independent components. Without knowing the magnitude of the geomagnetic field BEAth , the instrument magnetic field BInst1 cannot be calculated from the measurement in step A11. Therefore, step A12 also needs to be performed. Please also refer to Fig. 8, which is a schematic diagram of the specific embodiment of the man-made structure scanning device in Fig. 3 rotating along the X1 axis of the first magnetic field sensor. Step A12: (as shown in Figure 8) the man-made structure scanning device 10 is moved along the second axis of the first magnetic field sensor 1 (in this embodiment, the second axis of the first magnetic field sensor 1 is Rotate at least 180° for the X1 axis or the axis that almost coincides with the X1 axis. During the rotation, the first magnetic field sensor 1 performs the magnetic field measurement, and a sequence of the second axis measurement values of the first magnetic field sensor is measured [ BX1] (sequence of vectors), where the second axis of the first magnetic field sensor 1 is orthogonal to the first axis of the first magnetic field sensor 1. The second axis measurement value sequence of the first magnetic field sensor [BX1] is a sequence composed of the second axis measurement value BX1 _{total_θ of} the first magnetic field sensor, that is, when the artificial object structure scanning device 10 moves along the first During the rotation of the second axis ( X1 axis) of the magnetic field sensor 1, at different angles θ, a sequence of magnetic field measurement values (vectors) measured by the first magnetic field sensor 1 are formed. Wherein the second-axis measurement values of the first magnetic field induction device _BX1 total_θ, see below Formula _{4: BX1 total_θ = BEarth rotate_X1_θ +} BInst1 = (BEarth cos θ + (X1 × BEarth) sin θ + X1 (X1.BEarth) (1 -cos θ))+ BInst1 =( BEarth cos θ+( X1 × BEarth )sin θ- X1 ( X1．BEarth )cos θ)+( X1 ( X1．BEarth )+ BInst1 )......... ...............(Equation 4) In Equation 4, the measured value of the second axis of the first magnetic field sensor BX1 _{total_θ} is the artificial structure scanning device 10 along the first magnetic field When the second axis ( X1 axis) of the sensor 1 rotates by the angle θ, the measured value (vector) of the magnetic field measured by the first magnetic field sensor 1; BEarth _{rotate_X1_θ} is the measured value of the second axis of the first magnetic field sensor _BX1 total_θ component among the geomagnetic field BEarth, i.e. man-made structures scanning apparatus of the second shaft 10 is 1 (X1 axis) of the rotation angle θ, the first magnetic field sensor measuring a first magnetic field along the inductor The magnetic field measurement value (vector) of the obtained geomagnetic field BEAth ; the first instrument magnetic field measurement value BInst1 is the component of the instrument magnetic field BInst in the second axis measurement value BX1 _{total_θ of the first magnetic field sensor.} Step A13: Calculate the first instrument magnetic field measurement BInst1 from the first-axis measurement value sequence of the first magnetic field sensor [BZ1] and the second-axis measurement value sequence of the first magnetic field sensor [BX1] .

Similarly, in step A0, measuring the instrument magnetic field BInst generated by the man-made structure scanning device 10 by the second magnetic field sensor 2 includes the following steps: Step A21: moving the man-made structure scanning device 10 along the second The first axis (Z2 axis) of the magnetic field sensor 2 is rotated at least 180°, and the second magnetic field sensor 2 performs the magnetic field measurement during the rotation, and a sequence of the first axis measurement value of the second magnetic field sensor is measured [ BZ2] (vector sequence); Step A22: Rotate the artificial object structure scanning device 10 along the second axis ( X2 axis) of the second magnetic field sensor 2 by at least 180°, and during the rotation, the second magnetic field sensor 2 Perform magnetic field measurement, and obtain a second-axis measurement value sequence of a second magnetic field sensor [BX2] (a sequence of vectors), where the second-axis system of the second magnetic field sensor 2 and the second magnetic field sensor 2 The first axis is orthogonal to each other; and Step A23: Calculate the magnetic field of the second instrument from the first axis measurement value sequence of the second magnetic field sensor [BZ2] and the second axis measurement value sequence of the second magnetic field sensor [BX2] Measured value BInst2 . In step A0, measuring the instrument magnetic field BInst generated by the man-made structure scanning device 10 by the third magnetic field sensor 3 includes the following steps: Step A31: Move the man-made structure scanning device 10 along the third magnetic field sensor The first axis ( Z3 axis) of 3 rotates at least 180°, and the third magnetic field sensor 3 performs the magnetic field measurement during the rotation, and a measurement value sequence of the first axis of the third magnetic field sensor is measured [BZ3] ( Vector sequence); Step A32: Rotate the artificial structure scanning device 10 at least 180° along the second axis (X3 axis) of the third magnetic field sensor 3, and perform the magnetic field by the third magnetic field sensor 3 during the rotation Measured, and measured a third magnetic field sensor second axis measurement value sequence [BX3] (vector sequence), where the second axis of the third magnetic field sensor 3 and the first of the third magnetic field sensor 3 Axis orthogonal; and Step A33: Calculate the third instrument magnetic field measurement value BInst3 from the third magnetic field sensor first axis measurement value sequence [BZ3] and the third magnetic field sensor second axis measurement value sequence [BX3] . In step A0, the fourth magnetic field sensor 4 measures the instrument magnetic field BInst generated by the man-made structure scanning device 10, including the following steps: Step A41: Move the man-made structure scanning device 10 along the fourth magnetic field sensor The first axis ( Z4 axis) of 4 is rotated at least 180°, and the fourth magnetic field sensor 4 performs magnetic field measurement during the rotation, and a fourth magnetic field sensor first axis measurement value sequence is measured [BZ4] ( Vector sequence); Step A42: Rotate the man-made structure scanning device 10 at least 180° along the second axis (X4 axis) of the fourth magnetic field sensor 4, and perform the magnetic field by the fourth magnetic field sensor 4 during the rotation Measured, and measured a fourth magnetic field sensor second axis measurement value sequence [BX4] (vector sequence), where the second axis of the fourth magnetic field sensor 4 and the first of the fourth magnetic field sensor 4 The axes are orthogonal; and Step A33: Calculate the fourth instrument magnetic field measurement value BInst4 from the first axis measurement value sequence of the fourth magnetic field sensor [BZ4] and the second axis measurement value sequence of the fourth magnetic field sensor [BX4] .

In some embodiments, the data processing unit 60 and the positioning unit 20 are connected wirelessly. In some embodiments, the data processing unit 60 is respectively connected to the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 in a wireless manner. In some embodiments, the data processing part 60 is not disposed on the carrying part 30 of the artificial structure scanning device 10. In some embodiments, the moving part 40 is a wheel. In some embodiments, the positioning unit 20 includes one selected from the following groups: a distance measuring wheel, a distance meter, a ruler, a tape measure, a laser positioning device, an ultrasonic positioning device, a Radar wave positioning device, a GPS positioning device and an image positioning device. In some embodiments, the artificial structure scanning device 10 moves the artificial structure scanning device 10 along the scanning path 71 in the area to be measured 70 by the positioning function of the positioning portion 20. In a preferred embodiment, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 can perform magnetic field measurement simultaneously, and the positioning unit 20 can be synchronized Record the position when the magnetic field was measured. Therefore, in each of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3], and the fourth magnetic field measurement value sequence [BUC4] The measured value of the magnetic field corresponds to the position of one of the magnetic field measurements in the position sequence [PS].

In some embodiments, step B includes the following steps: calculate a first magnetic field measurement value distribution from the position sequence [PS] and the first magnetic field measurement value sequence [BUC1] minus the first instrument magnetic field measurement value BInst1 BCD1 (that is, the distribution of the first magnetic field measurement value and its measurement position); calculate one from the position sequence [PS] and the second magnetic field measurement value sequence [BUC2] minus the second instrument magnetic field measurement value BInst2 second magnetic field distribution measured values BCD2; the position in the sequence [the PS] and the third magnetic field measurement value sequence [BUC3] subtracting the third measurement field instrument BInst3 value calculating a third magnetic field distribution measuring value BCD3; a The position sequence [PS] and the fourth magnetic field measurement value sequence [BUC4] minus the fourth instrument magnetic field measurement value BInst4 to calculate a fourth magnetic field measurement value distribution BCD4 ; and the first magnetic field measurement value distribution BCD1 , second magnetic field distribution measured value BCD2, third magnetic field distribution measuring value BCD3 and fourth magnetic field distribution of the measured values calculated from the magnetic field variation distribution BCD4 BVarD.

In some embodiments, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 are respectively located at the four vertices of a regular triangular pyramid. In other embodiments, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 are respectively located at the four vertices of a regular tetrahedron.

Please refer to FIG. 9, which is a three-dimensional schematic diagram of another embodiment of the scanning device for man-made structures of the present invention. The main structure of the embodiment in Fig. 9 is roughly the same as that of the embodiment in Fig. 1. However, the magnetic field sensor 50 further includes a fifth magnetic field sensor 5, a sixth magnetic field sensor 6, and a seventh magnetic field sensor. The magnetic field sensor 7 and an eighth magnetic field sensor 8, wherein the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, and the The six magnetic field sensors 6, the seventh magnetic field sensor 7, and the eighth magnetic field sensor 8 are arranged on the eight vertices of a regular hexahedron (disposed on non-coplanar surfaces). In this embodiment, the present invention provides an artificial object structure scanning method, including the following steps: Step A: Move the artificial object structure scanning device 10 along a scanning path 71 in an area to be measured 70, during the movement The first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, and the seventh magnetic field sensor 7 And the eighth magnetic field sensor 8 performs magnetic field measurement for magnetic field measurement, and records a position sequence [PS] during the magnetic field measurement, where the first magnetic field sensor 1, the second magnetic field sensor 2, and the third magnetic field sensor 3. The fourth magnetic field sensor 4, the fifth magnetic field sensor 5, a sixth magnetic field sensor 6, a seventh magnetic field sensor 7 and an eighth magnetic field sensor 8 respectively measure a first magnetic field measurement value sequence [BUC1] (vector sequence), a second magnetic field measurement value sequence [BUC2] (vector sequence), a third magnetic field measurement value sequence [BUC3] (vector sequence), a fourth magnetic field measurement value sequence [BUC4 ] (Vector sequence), a fifth magnetic field measurement value sequence [BUC5] (vector sequence), a sixth magnetic field measurement value sequence [BUC6] (vector sequence), a seventh magnetic field measurement value sequence [BUC7] ( Vector sequence) and an eighth magnetic field measurement value sequence [BUC8] (vector sequence); and step B: from the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , and the third magnetic field Measurement value sequence [BUC3] , fourth magnetic field measurement value sequence [BUC4] , fifth magnetic field measurement value sequence [BUC5] , sixth magnetic field measurement value sequence [BUC6] , seventh magnetic field measurement value sequence [BUC7 ] , the eighth magnetic field measurement value sequence [BUC8] and the position sequence [PS] are calculated to obtain a magnetic field variation distribution BVarD, wherein the magnetic field variation distribution BVarD corresponds to the structure distribution of an artificial object. In this embodiment, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. The value sequence [BUC4] , the fifth magnetic field measurement value sequence [BUC5] , the sixth magnetic field measurement value sequence [BUC6] , the seventh magnetic field measurement value sequence [BUC7] , the eighth magnetic field measurement value sequence [BUC8] A magnetic field gradient vector size sequence (scalar sequence) is calculated, and then combined with the position sequence [PS] during magnetic field measurement to become a magnetic field gradient vector size distribution (scalar). In other embodiments, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. Measured value sequence [BUC4] , the fifth magnetic field measurement value sequence [BUC5] , the sixth magnetic field measurement value sequence [BUC6] , the seventh magnetic field measurement value sequence [BUC7] , the eighth magnetic field measurement value sequence [BUC8] The calculated magnetic field gradient vector sequence is combined with the position sequence [PS] during magnetic field measurement to become a magnetic field gradient vector distribution (vector). In some embodiments, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. The value sequence [BUC4] , the fifth magnetic field measurement value sequence [BUC5] , the sixth magnetic field measurement value sequence [BUC6] , the seventh magnetic field measurement value sequence [BUC7] , the eighth magnetic field measurement value sequence [BUC8] A horizontal component sequence (vector sequence) of a magnetic field gradient vector is calculated, and then combined with the position sequence [PS] during magnetic field measurement to become a horizontal component distribution (vector) of a magnetic field gradient vector. In other embodiments, the magnetic field variation distribution BVarD is composed of the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , and the fourth magnetic field measurement value sequence. Measured value sequence [BUC4] , the fifth magnetic field measurement value sequence [BUC5] , the sixth magnetic field measurement value sequence [BUC6] , the seventh magnetic field measurement value sequence [BUC7] , the eighth magnetic field measurement value sequence [BUC8] The calculated size sequence of the horizontal component of a magnetic field gradient vector (scalar sequence) is combined with the position sequence of the magnetic field measurement [PS] to become the size distribution of the horizontal component of a magnetic field gradient vector (scalar) . From the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , the fourth magnetic field measurement value sequence [BUC4] , and the fifth magnetic field measurement sequence The value sequence [BUC5] , the sixth magnetic field measurement value sequence [BUC6] , the seventh magnetic field measurement value sequence [BUC7] , and the eighth magnetic field measurement value sequence [BUC8] to calculate the magnetic field variation distribution BVarD are not limited to the above methods. When the first magnetic field measurement value sequence [BUC1] , the second magnetic field measurement value sequence [BUC2] , the third magnetic field measurement value sequence [BUC3] , the fourth magnetic field measurement value sequence [BUC4] and the known quantity are measured By measuring the position sequence [PS] of the measured position, the magnetic field variation distribution BVarD can be easily calculated.

In some embodiments, the magnetic field sensing part 50 includes four magnetic field sensors or more than four magnetic field sensors, wherein at least four of the magnetic field sensing parts 50 are provided On non-coplanar.

Please refer to FIG. 10, which is a perspective view of another embodiment of the scanning device for man-made structures of the present invention. The main structure of the embodiment in FIG. 10 is roughly the same as that of the embodiment in FIG. 3. However, the magnetic field sensor 50 further includes a fifth magnetic field sensor 5, a sixth magnetic field sensor 6, and a seventh magnetic field sensor. The magnetic field sensor 7 and an eighth magnetic field sensor 8, wherein the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, and the The six magnetic field sensors 6, the seventh magnetic field sensor 7, and the eighth magnetic field sensor 8 are arranged at the eight vertices of a regular hexahedron (this part is the same as the embodiment in Fig. 9); the data processing unit 60 is arranged at Above the carrying portion 30; and this embodiment does not include the adapter portion 61; wherein the data processing portion 60 is respectively connected with the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field The sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, the seventh magnetic field sensor 7, the eighth magnetic field sensor 8 and the positioning unit 20 are connected in a wired manner to record the first magnetic field sensor 1. The second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, the seventh magnetic field sensor 7, and the eighth magnetic field sensor 8 The measured magnetic field data and the positioning position data from the positioning unit 20 (or used to record data and process data). Please also refer to Fig. 11, which is a schematic diagram of the three axes of each magnetic field sensor of the magnetic field sensing part of the specific embodiment of the man-made structure scanning device in Fig. 10. Each magnetic field sensor of the magnetic field sensor 50 has three axes. For example, the first magnetic field sensor 1 has an X1 axis, a Y1 axis, and a Z1 axis; the second magnetic field sensor 2 has an X2 axis, one Y2 axis and a Z2 axis; the third magnetic field sensor 3 has an X3 axis, a Y3 axis, and a Z3 axis; the fourth magnetic field sensor 4 has an X4 axis, a Y4 axis, and a Z4 axis; the fifth magnetic field sensor 5 has an X5 axis, a Y5 axis, and a Z5 axis; the sixth magnetic field sensor 6 has an X6 axis, a Y6 axis, and a Z6 axis; the seventh magnetic field sensor 7 has an X7 axis, a Y7 axis, and a Z7 axis Axis; the eighth magnetic field sensor 8 has an X8 axis, a Y8 axis, and a Z8 axis. Similarly, the artificial object structure scanning device 10 of the present invention also generates an instrument magnetic field BInst (vector field), especially when the moving part 40 is a wheel with motor power, the operation of the motor generates a magnetic field. The instrument magnetic field BInst will cause interference to each magnetic field sensor of the magnetic field induction part 50, so the interference of the instrument magnetic field BInst to each magnetic field sensor of the magnetic field induction part 50 must be removed first. Therefore, in this embodiment, the present invention provides a method for scanning man-made structures. The steps are roughly the same as those of the embodiment in Fig. 9, except that it further includes the following steps: Step A0: From the first magnetic field sensor 1 , The second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, the seventh magnetic field sensor 7, and the eighth magnetic field sensor 8, respectively Measure the instrument magnetic field BInst generated by the man-made structure scanning device 10 one by one, in which the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, and the fifth magnetic field sensor The device 5, the sixth magnetic field sensor 6, the seventh magnetic field sensor 7 and the eighth magnetic field sensor 8 respectively measure a first instrument magnetic field measurement value BInst1 , a second instrument magnetic field measurement value BInst2 , and a third instrument magnetic field measurement value BInst2. Instrument magnetic field measurement value BInst3 , a fourth instrument magnetic field measurement value BInst4 , a fifth instrument magnetic field measurement value BInst5 , a sixth instrument magnetic field measurement value BInst6 , a seventh instrument magnetic field measurement value BInst7, and an eighth The measured value of the magnetic field of the instrument BInst8 . Among them, in step B, the magnetic field variation distribution BVarD is the first magnetic field measurement value sequence [BUC1] minus the first instrument magnetic field measurement value BInst1 , the second magnetic field measurement value sequence [BUC2] minus the second instrument magnetic field Measured value BInst2 , the third magnetic field measurement value sequence [BUC3] minus the third instrument’s magnetic field measurement value BInst3 , the fourth magnetic field measurement sequence [BUC4] minus the fourth instrument’s magnetic field measurement value BInst4 , the fifth magnetic field The measured value sequence [BUC5] minus the fifth instrument magnetic field measurement value BInst5 , the sixth magnetic field measurement value sequence [BUC6] minus the sixth instrument magnetic field measurement value BInst6 , the seventh magnetic field measurement value sequence [BUC7] is subtracted The seventh instrument magnetic field measurement value BInst7 , the eighth magnetic field measurement value sequence [BUC8] minus the eighth instrument magnetic field measurement value BInst8 , and the position sequence [PS] are calculated to remove the instrument magnetic field BInst to the first A magnetic field sensor 1, a second magnetic field sensor 2, a third magnetic field sensor 3, a fourth magnetic field sensor 4, a fifth magnetic field sensor 5, a sixth magnetic field sensor 6, a seventh magnetic field sensor 7 and an eighth magnetic field sensor Interference of magnetic field sensor 8. The order of execution of the steps of the scanning method for man-made structures of the present invention can be (1) execute step A0, step A, and step B in sequence, or (2) execute step A, step A0, and step B in sequence.

In step A0, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, and the fourth magnetic field sensor 4 respectively measure the instrument magnetic field BInst generated by the artificial object structure scanning device 10 Please refer to the above description for the steps. Similarly, in step A0, the fifth magnetic field sensor 5 measures the instrument magnetic field BInst generated by the artificial object structure scanning device 10, including the following steps: Step A51: Move the artificial object structure scanning device 10 along the fifth The first axis (Z5 axis) of the magnetic field sensor 5 is rotated at least 180°, and the fifth magnetic field sensor 5 performs the magnetic field measurement during the rotation, and a sequence of the first axis measurement value of the fifth magnetic field sensor is measured [ BZ5] (vector sequence); Step A52: Rotate the man-made structure scanning device 10 at least 180° along the second axis (X5 axis) of the fifth magnetic field sensor 5, and during the rotation, the fifth magnetic field sensor 5 Perform magnetic field measurement, and obtain a fifth magnetic field sensor second axis measurement value sequence [BX5] (vector sequence), where the second axis system of the fifth magnetic field sensor 5 and the fifth magnetic field sensor 5 The first axis is orthogonal; and Step A53: Calculate the fifth instrument's magnetic field from the fifth magnetic field sensor's first-axis measurement sequence [BZ5] and the fifth magnetic field sensor's second-axis measurement sequence [BX5] Measured value BInst5 . In step A0, measuring the instrument magnetic field BInst generated by the artificial object structure scanning device 10 by the sixth magnetic field sensor 6 includes the following steps: Step A61: Move the artificial object structure scanning device 10 along the sixth magnetic field sensor The first axis ( Z6 axis) of 6 is rotated at least 180°, and the sixth magnetic field sensor 6 performs magnetic field measurement during the rotation, and a sequence of the first axis measurement value of the sixth magnetic field sensor is measured [BZ6] ( Vector sequence); Step A62: Rotate the man-made structure scanning device 10 along the second axis ( X6 axis) of the sixth magnetic field sensor 6 by at least 180°, and perform the magnetic field by the sixth magnetic field sensor 6 during the rotation The second axis measurement value sequence of the sixth magnetic field sensor [BX6] (vector sequence) is measured, and the second axis system of the sixth magnetic field sensor 6 is the first of the sixth magnetic field sensor 6 The axes are orthogonal; and Step A63: Calculate the sixth instrument magnetic field measurement value BInst6 from the sixth magnetic field sensor first-axis measurement value sequence [BZ6] and the sixth magnetic field sensor second-axis measurement value sequence [BX6] . In step A0, the seventh magnetic field sensor 7 measures the instrument magnetic field BInst generated by the man-made structure scanning device 10, including the following steps: Step A71: Move the man-made structure scanning device 10 along the seventh magnetic field sensor The first axis ( Z7 axis) of 7 is rotated at least 180°, and the seventh magnetic field sensor 7 performs the magnetic field measurement during the rotation, and a sequence of the first axis measurement value of the seventh magnetic field sensor is measured [BZ7] ( Vector sequence); Step A72: Rotate the man-made structure scanning device 10 along the second axis ( X7 axis) of the seventh magnetic field sensor 7 by at least 180°, and perform the magnetic field by the seventh magnetic field sensor 7 during the rotation The second axis measurement value sequence of the seventh magnetic field sensor [BX7] (the sequence of vectors) is measured, and the second axis of the seventh magnetic field sensor 7 is the first of the seventh magnetic field sensor 7 The axes are orthogonal; and Step A73: Calculate the seventh instrument magnetic field measurement value BInst7 from the seventh magnetic field sensor first axis measurement value sequence [BZ7] and the seventh magnetic field sensor second axis measurement value sequence [BX7] . In step A0, measuring the instrument magnetic field BInst generated by the artificial object structure scanning device 10 by the eighth magnetic field sensor 8 includes the following steps: Step A81: Move the artificial object structure scanning device 10 along the eighth magnetic field sensor The first axis ( Z8 axis) of 8 rotates at least 180°, and the eighth magnetic field sensor 8 performs magnetic field measurement during the rotation, and an eighth magnetic field sensor first axis measurement value sequence is measured [BZ8] ( Vector sequence); Step A82: Rotate the artificial object structure scanning device 10 at least 180° along the second axis (X8 axis) of the eighth magnetic field sensor 8, and perform the magnetic field by the eighth magnetic field sensor 8 during the rotation Measured, and measured an eighth magnetic field sensor second axis measurement value sequence [BX8] (a sequence of vectors), in which the second axis of the eighth magnetic field sensor 8 and the first of the eighth magnetic field sensor 8 Axis orthogonal; and Step A83: Calculate the eighth instrument magnetic field measurement value BInst8 from the eighth magnetic field sensor first axis measurement value sequence [BZ8] and the eighth magnetic field sensor second axis measurement value sequence [BX8] .

In some embodiments, step B includes the following steps: calculate a first magnetic field measurement value distribution from the position sequence [PS] and the first magnetic field measurement value sequence [BUC1] minus the first instrument magnetic field measurement value BInst1 BCD1 (that is, the distribution of the first magnetic field measurement value and its measurement position); calculate one from the position sequence [PS] and the second magnetic field measurement value sequence [BUC2] minus the second instrument magnetic field measurement value BInst2 second magnetic field distribution measured values BCD2; the position in the sequence [the PS] and the third magnetic field measurement value sequence [BUC3] subtracting the third measurement field instrument BInst3 value calculating a third magnetic field distribution measuring value BCD3; a Position sequence [PS] and the fourth magnetic field measurement value sequence [BUC4] minus the fourth instrument magnetic field measurement value BInst4 to calculate a fourth magnetic field measurement value distribution BCD4 ; from the position sequence [PS] and the fifth magnetic field The measurement value sequence [BUC5] subtracts the fifth instrument magnetic field measurement value BInst5 to calculate a fifth magnetic field measurement value distribution BCD5 ; from the position sequence [PS] and the sixth magnetic field measurement value sequence [BUC6] minus the first Sixth instrument magnetic field measurement value BInst6 calculates a sixth magnetic field measurement value distribution BCD6 ; from the position sequence [PS] and the seventh magnetic field measurement value sequence [BUC7] minus the seventh instrument magnetic field measurement value BInst7 to calculate a a seventh field distribution of measured values BCD7; the position in the sequence [the PS] and the eighth magnetic field measurement value sequence [BUC8] measured by subtracting the eighth field instrument calculating a value BInst8 eighth field distribution BCD8, measuring value; and a first magnetic field distribution of the measured values BCD1, the second magnetic field measurement value distribution BCD2, third magnetic field distribution measured value BCD3, fourth magnetic field measured value distribution BCD4, a fifth magnetic field distribution measured value BCD5, the amount of the sixth field measured value distribution BCD6, the seventh magnetic field distribution measuring value and an eighth field BCD7 measured magnetic field value distribution variation calculated distribution BCD8 BVarD.

In some embodiments, the first axis of the first magnetic field sensor 1 may be the Z1 axis or an axis that almost coincides with the Z1 axis, and the second axis of the first magnetic field sensor 1 is between the first axis of the first magnetic field sensor 1 and the Z1 axis. Any axis that is orthogonal to the first axis. In some embodiments, the first axis of the second magnetic field sensor 2 may be the Z2 axis or an axis that almost coincides with the Z2 axis, and the second axis of the second magnetic field sensor 2 is between the second axis of the second magnetic field sensor 2 and the Z2 axis. Any axis that is orthogonal to the first axis. In some embodiments, the first axis of the third magnetic field sensor 3 can be the Z3 axis or an axis that almost coincides with the Z3 axis, and the second axis of the third magnetic field sensor 3 is between the second axis of the third magnetic field sensor 3 and the third magnetic field sensor 3 Any axis that is orthogonal to the first axis. In some embodiments, the first axis of the fourth magnetic field sensor 4 can be the Z4 axis or an axis that almost coincides with the Z4 axis, and the second axis of the fourth magnetic field sensor 4 is between the fourth magnetic field sensor 4 and the Z4 axis. Any axis that is orthogonal to the first axis.

In some embodiments, the first axis of the first magnetic field sensor 1 can be any axis, and the second axis of the first magnetic field sensor 1 is any axis orthogonal to the first axis of the first magnetic field sensor 1 The axis. In some embodiments, the first axis of the second magnetic field sensor 2 can be any axis, and the second axis of the second magnetic field sensor 2 can be any axis orthogonal to the first axis of the second magnetic field sensor 2 The axis. In some embodiments, the first axis of the third magnetic field sensor 3 can be any axis, and the second axis of the third magnetic field sensor 3 is any axis orthogonal to the first axis of the third magnetic field sensor 3 The axis. In some embodiments, the first axis of the fourth magnetic field sensor 4 can be any axis, and the second axis of the fourth magnetic field sensor 4 is any axis orthogonal to the first axis of the fourth magnetic field sensor 4 The axis.

In some embodiments, the first axis of the fifth magnetic field sensor 5 can be the Z5 axis or an axis that almost coincides with the Z5 axis, and the second axis of the fifth magnetic field sensor 5 is between the second axis of the fifth magnetic field sensor 5 and the fifth magnetic field sensor 5 Any axis that is orthogonal to the first axis. In some embodiments, the first axis of the sixth magnetic field sensor 6 can be the Z6 axis or an axis that almost coincides with the Z6 axis, and the second axis of the sixth magnetic field sensor 6 is between the second axis of the sixth magnetic field sensor 6 and the sixth magnetic field sensor 6 Any axis that is orthogonal to the first axis. In some embodiments, the first axis of the seventh magnetic field sensor 7 can be the Z7 axis or an axis that almost coincides with the Z7 axis, and the second axis of the seventh magnetic field sensor 7 is between the seventh magnetic field sensor 7 and the Z7 axis. Any axis that is orthogonal to the first axis. In some embodiments, the first axis of the eighth magnetic field sensor 8 can be the Z8 axis or an axis that almost coincides with the Z8 axis, and the second axis of the eighth magnetic field sensor 8 is between the eighth magnetic field sensor 8 Any axis that is orthogonal to the first axis.

In some embodiments, the first axis of the fifth magnetic field sensor 5 can be any axis, and the second axis of the fifth magnetic field sensor 5 is any axis orthogonal to the first axis of the fifth magnetic field sensor 5 The axis. In some embodiments, the first axis of the sixth magnetic field sensor 6 can be any axis, and the second axis of the sixth magnetic field sensor 6 is any axis orthogonal to the first axis of the sixth magnetic field sensor 6 The axis. In some embodiments, the first axis of the seventh magnetic field sensor 7 can be any axis, and the second axis of the seventh magnetic field sensor 7 is any axis orthogonal to the first axis of the seventh magnetic field sensor 7 The axis. In some embodiments, the first axis of the eighth magnetic field sensor 8 can be any axis, and the second axis of the eighth magnetic field sensor 8 is any one orthogonal to the first axis of the eighth magnetic field sensor 8 The axis.

In some embodiments, the data processing unit 60 is connected to the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, and the sixth magnetic field sensor respectively. The magnetic field sensor 6, the seventh magnetic field sensor 7, and the eighth magnetic field sensor 8 are connected wirelessly. In some embodiments, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, the seventh magnetic field sensor The magnetic field sensor 7 and the eighth magnetic field sensor 8 are respectively located at the eight vertices of a parallelepiped. In other embodiments, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, and the The seven magnetic field sensor 7 and the eighth magnetic field sensor 8 are respectively located at the eight vertices of a rectangular parallelepiped. In another In some embodiments, the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, the sixth magnetic field sensor 6, and the seventh magnetic field sensor The inductor 7 and the eighth magnetic field sensor 8 are respectively located at the eight vertices of a regular hexahedron.

Therefore, the man-made structure scanning method of the present invention can indeed scan the corresponding man-made structure distribution below the area to be measured 70, so as to avoid these man-made structures during construction and excavation. And the feature of the present invention is that the first magnetic field sensor 1, the second magnetic field sensor 2, the third magnetic field sensor 3, the fourth magnetic field sensor 4, the fifth magnetic field sensor 5, and the sixth magnetic field sensor of the present invention 6. The seventh magnetic field sensor 7 and the eighth magnetic field sensor 8 can use semiconductor chip-type magnetic field sensors, which are very cheap, but they are sufficient for the scanning method of man-made structures according to the present invention. .

The above are the specific embodiments of the present invention and the technical means used. Many changes and corrections can be derived from the disclosure or teaching of this article. They can still be regarded as equivalent changes made to the concept of the present invention. The function of the invention does not exceed the essential spirit covered by the specification and the drawings, and it should be regarded as within the technical scope of the present invention, and shall be explained first.

In summary, based on the content disclosed above, this invention clearly achieves the intended purpose of the invention. It provides a scanning device for man-made structures and a scanning method thereof, which is extremely valuable for industrial use. The invention is proposed in accordance with the law. patent application.

1‧‧‧The first magnetic field sensor

2‧‧‧Second magnetic field sensor

3‧‧‧The third magnetic field sensor

4‧‧‧The fourth magnetic field sensor

10‧‧‧Man-made object structure scanning device

30‧‧‧Carrier Department

50‧‧‧Magnetic field sensor

Claims (17)

An artificial object structure scanning method, in which an artificial object structure scanning device includes a positioning portion and a magnetic field sensing portion. The magnetic field sensing portion includes a first magnetic field sensor, a second magnetic field sensor, and a third magnetic field sensor And a fourth magnetic field sensor. The first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are arranged on a non-coplanar plane. The method includes the following steps: A0: The first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor respectively measure an instrument magnetic field generated by the artificial object structure scanning device. A first instrument magnetic field measurement value, a second instrument magnetic field measurement value, a third instrument magnetic field measurement value, and a fourth instrument magnetic field measurement value; Step A: Move the artificial object structure scanning device along a A scanning path in the area to be measured moves, and the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are used to measure the magnetic field during the movement. A first magnetic field measurement value sequence, a second magnetic field measurement value sequence, a third magnetic field measurement value sequence, and a fourth magnetic field measurement value sequence, and a position sequence during the magnetic field measurement is recorded; and step B : Subtract the first instrument magnetic field measurement value from the first magnetic field measurement value sequence, the second magnetic field measurement value sequence minus the second instrument magnetic field measurement value, and the third magnetic field measurement value sequence subtract The third instrument magnetic field measurement value, the fourth magnetic field measurement value sequence minus the fourth instrument magnetic field measurement value and the position sequence are calculated to obtain a magnetic field variation distribution, wherein the magnetic field variation distribution corresponds to an artificial object Structure distribution; wherein the step execution sequence of the method is (1) step A0, step A, and step B are executed in sequence, or (2) step A, step A0, and step B are executed in sequence. According to the scanning method of man-made object structure according to the first item of the scope of patent application, the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor and the fourth magnetic field sensor are respectively located at a positive three The four vertices of a pyramid or the four vertices of a regular tetrahedron. The scanning method for the structure of the man-made object as described in item 1 of the scope of patent application, wherein in step A0, measuring the magnetic field of the instrument by the first magnetic field sensor includes the following steps: Step A11: scanning the structure of the man-made object The sighting device rotates at least 180° along a first axis of the first magnetic field sensor, and the first magnetic field sensor performs a magnetic field measurement during the rotation to obtain a first axis measurement value of the first magnetic field sensor Sequence; Step A12: Rotate the man-made structure scanning device at least 180° along a second axis of the first magnetic field sensor, and measure a magnetic field by the first magnetic field sensor during the rotation The second axis measurement sequence of the first magnetic field sensor, wherein the first axis of the first magnetic field sensor is non-parallel to the second axis of the first magnetic field sensor; and step A13: start from the first magnetic field The first-axis measurement value sequence of the sensor and the second-axis measurement value sequence of the first magnetic field sensor calculate the magnetic field measurement value of the first instrument; wherein the second magnetic field sensor measures the magnetic field of the instrument, including the following Steps: Step A21: Rotate the man-made structure scanning device at least 180° along a first axis of the second magnetic field sensor, and measure a magnetic field by the second magnetic field sensor during the rotation. The first axis measurement sequence of the second magnetic field sensor; Step A22: Rotate the artificial object structure scanning device at least 180° along a second axis of the second magnetic field sensor, and the second magnetic field sensor is rotated by the second axis during the rotation. The magnetic field sensor performs the magnetic field measurement to obtain a second-axis measurement value sequence of the second magnetic field sensor, wherein the first axis of the second magnetic field sensor and the second axis of the second magnetic field sensor are not Parallel; and Step A23: Calculate the magnetic field measurement value of the second instrument from the first axis measurement value sequence of the second magnetic field sensor and the second axis measurement value sequence of the second magnetic field sensor; wherein the third magnetic field sensor Measuring the magnetic field of the instrument includes the following steps: Step A31: Rotate the artificial object structure scanning device at least 180° along a first axis of the third magnetic field sensor, and use the third magnetic field sensor during the rotation Performing magnetic field measurement to obtain a measurement value sequence of the first axis of a third magnetic field sensor; Step A32: Rotate the man-made structure scanning device at least 180° along a second axis of the third magnetic field sensor, During the rotation, the third magnetic field sensor performs magnetic field measurement to obtain a third magnetic field sensor second axis measurement value sequence, wherein the first axis of the third magnetic field sensor and the third magnetic field The second axis of the sensor is non-parallel; and Step A33: Calculate the third instrument magnetic field from the first axis measurement value sequence of the third magnetic field sensor and the second axis measurement value sequence of the third magnetic field sensor Measured value; wherein measuring the magnetic field of the instrument by the fourth magnetic field sensor includes the following steps: Step A41: Rotate the man-made structure scanning device at least 180° along a first axis of the fourth magnetic field sensor, And during the rotation, the fourth magnetic field sensor performs the magnetic field measurement to obtain a sequence of the first axis measurement value of the fourth magnetic field sensor; Step A42: Make the artificial object structure scanning device sense along the fourth magnetic field The second axis of one of the devices is rotated at least 180°, and the fourth magnetic field sensor performs magnetic field measurement during the rotation to obtain a sequence of second axis measurement values of the fourth magnetic field sensor, wherein the fourth magnetic field sensor The first axis is non-parallel to the second axis of the fourth magnetic field sensor; and Step A43: the measurement sequence of the first axis of the fourth magnetic field sensor and the second axis of the fourth magnetic field sensor The measured value sequence calculates the magnetic field measured value of the fourth instrument. The scanning method for man-made structures as described in item 3 of the scope of patent application, wherein the first axis of the first magnetic field sensor is orthogonal to the second axis of the first magnetic field sensor, and the second magnetic field sensor The first axis of the device is orthogonal to the second axis of the second magnetic field sensor, the first axis of the third magnetic field sensor is orthogonal to the second axis of the third magnetic field sensor, the The first axis of the fourth magnetic field sensor is orthogonal to the second axis of the fourth magnetic field sensor. The artificial object structure scanning method described in the scope of patent application 1, wherein the step B includes the following steps: calculating from the position sequence and the first magnetic field measurement value sequence subtracting the first instrument magnetic field measurement value Obtain a first magnetic field measurement value distribution; calculate a second magnetic field measurement value distribution from the position sequence and the second magnetic field measurement value sequence subtracting the second instrument magnetic field measurement value; from the position sequence and The third magnetic field measurement value sequence is subtracted from the third instrument magnetic field measurement value to calculate a third magnetic field measurement value distribution; the fourth instrument is subtracted from the position sequence and the fourth magnetic field measurement value sequence A fourth magnetic field measurement value distribution is calculated from the magnetic field measurement values; and from the first magnetic field measurement value distribution, the second magnetic field measurement value distribution, the third magnetic field measurement value distribution, and the fourth magnetic field measurement value distribution The value distribution calculates the distribution of the magnetic field variation. An artificial object structure scanning method, in which an artificial object structure scanning device includes a positioning portion and a magnetic field sensing portion. The magnetic field sensing portion includes a first magnetic field sensor, a second magnetic field sensor, and a third magnetic field sensor , A fourth magnetic field sensor, a fifth magnetic field sensor, a sixth magnetic field sensor, a seventh magnetic field sensor, and an eighth magnetic field sensor, the first magnetic field sensor, the second magnetic field sensor, The third magnetic field sensor and the fourth magnetic field sensor are arranged on a non-coplanar plane. The method includes the following steps: Step A0: Induction of the first magnetic field sensor, the second magnetic field sensor, and the third magnetic field sensor器, the fourth magnetic field sensor, the fifth magnetic field sensor, the sixth magnetic field sensor, the seventh magnetic field sensor The field sensor and the eighth magnetic field sensor respectively measure an instrument magnetic field generated by the man-made structure scanning device, and respectively measure a first instrument magnetic field measurement value, a second instrument magnetic field measurement value, and a second instrument magnetic field measurement value. Three instrument magnetic field measurement values, a fourth instrument magnetic field measurement value, a fifth instrument magnetic field measurement value, a sixth instrument magnetic field measurement value, a seventh instrument magnetic field measurement value, and an eighth instrument magnetic field measurement value Value; Step A: Make the man-made structure scanning device move along a scanning path in a to-be-measured area, and respectively sense the first magnetic field sensor, the second magnetic field sensor, and the third magnetic field during the movement The magnetic field sensor, the fourth magnetic field sensor, the fifth magnetic field sensor, the sixth magnetic field sensor, the seventh magnetic field sensor, and the eighth magnetic field sensor perform a magnetic field measurement to respectively measure a first magnetic field measurement Value sequence, a second magnetic field measurement value sequence, a third magnetic field measurement value sequence, a fourth magnetic field measurement value sequence, a fifth magnetic field measurement value sequence, a sixth magnetic field measurement value sequence, a first Seven magnetic field measurement value sequences and an eighth magnetic field measurement value sequence, and record a position sequence during the magnetic field measurement; and Step B: a magnetic field variation distribution is obtained by subtracting the first magnetic field measurement value sequence from the first magnetic field measurement value sequence Instrument magnetic field measurement value, the second magnetic field measurement value sequence minus the second instrument magnetic field measurement value, the third magnetic field measurement value sequence subtracts the third instrument magnetic field measurement value, the fourth magnetic field measurement Value sequence minus the fourth instrument magnetic field measurement value, the fifth magnetic field measurement value sequence minus the fifth instrument magnetic field measurement value, and the sixth magnetic field measurement value sequence minus the sixth instrument magnetic field measurement value , The seventh magnetic field measurement value sequence is calculated by subtracting the seventh instrument magnetic field measurement value, the eighth magnetic field measurement value sequence subtracting the eighth instrument magnetic field measurement value and the position sequence, wherein the magnetic field variation The distribution corresponds to the distribution of a man-made object structure; wherein the step execution sequence of the method is (1) Step A0, Step A, and Step are executed in sequence B, or (2) Step A, Step A0, and Step B are executed in sequence. The scanning method for the structure of an artificial object as described in item 6 of the scope of patent application, wherein in step A0, measuring the magnetic field of the instrument by the first magnetic field sensor includes the following steps: Step A11: scanning the structure of the artificial object The sighting device rotates at least 180° along a first axis of the first magnetic field sensor, and the first magnetic field sensor performs a magnetic field measurement during the rotation to obtain a first axis measurement value of the first magnetic field sensor Sequence; Step A12: Rotate the man-made structure scanning device at least 180° along a second axis of the first magnetic field sensor, and measure a magnetic field by the first magnetic field sensor during the rotation The second axis measurement sequence of the first magnetic field sensor, wherein the first axis of the first magnetic field sensor is non-parallel to the second axis of the first magnetic field sensor; and step A13: start from the first magnetic field The first-axis measurement value sequence of the sensor and the second-axis measurement value sequence of the first magnetic field sensor calculate the magnetic field measurement value of the first instrument; wherein the second magnetic field sensor measures the magnetic field of the instrument, including the following Steps: Step A21: Rotate the man-made structure scanning device at least 180° along a first axis of the second magnetic field sensor, and measure a magnetic field by the second magnetic field sensor during the rotation. The first axis measurement sequence of the second magnetic field sensor; Step A22: Rotate the artificial object structure scanning device at least 180° along a second axis of the second magnetic field sensor, and the second magnetic field sensor is rotated by the second axis during the rotation. The magnetic field sensor performs the magnetic field measurement to obtain a second-axis measurement value sequence of the second magnetic field sensor, wherein the first axis of the second magnetic field sensor and the second axis of the second magnetic field sensor are not Parallel; and step A23: calculating the second instrument magnetic field measurement value from the first axis measurement value sequence of the second magnetic field sensor and the second axis measurement value sequence of the second magnetic field sensor; The measurement of the magnetic field of the instrument by the third magnetic field sensor includes the following steps: Step A31: Rotate the man-made structure scanning device at least 180° along a first axis of the third magnetic field sensor and rotate During the period, the third magnetic field sensor performs the magnetic field measurement to obtain a measurement value sequence of the first axis of the third magnetic field sensor; Step A32: Make the man-made structure scanning device follow one of the third magnetic field sensors The second axis rotates at least 180°, and the third magnetic field sensor performs magnetic field measurement during the rotation to obtain a second axis measurement value sequence of the third magnetic field sensor, wherein the second axis of the third magnetic field sensor An axis is non-parallel to the second axis of the third magnetic field sensor; and Step A33: a sequence of measured values from the first axis of the third magnetic field sensor and a sequence of measured values from the second axis of the third magnetic field sensor Calculate the magnetic field measurement value of the third instrument; wherein the fourth magnetic field sensor measures the magnetic field of the instrument, including the following steps: Step A41: Make the man-made structure scanning device follow one of the fourth magnetic field sensors The first axis rotates at least 180°, and the fourth magnetic field sensor performs magnetic field measurement during the rotation to obtain a sequence of the first axis measurement values of the fourth magnetic field sensor; Step A42: Scan the man-made structure The device rotates at least 180° along a second axis of the fourth magnetic field sensor, and during the rotation, the fourth magnetic field sensor performs magnetic field measurement to obtain a sequence of the second axis measurement value of the fourth magnetic field sensor , Wherein the first axis of the fourth magnetic field sensor is non-parallel to the second axis of the fourth magnetic field sensor; and Step A43: the first axis measurement value sequence of the fourth magnetic field sensor and the second axis The second axis measurement value sequence of the four magnetic field sensor calculates the magnetic field measurement value of the fourth instrument; wherein the measurement of the instrument magnetic field by the fifth magnetic field sensor includes the following steps: Step A51: Scan the structure of the man-made object The device is along a first axis of the fifth magnetic field sensor Rotate at least 180°, and during the rotation, the fifth magnetic field sensor performs magnetic field measurement to obtain a sequence of first axis measurement values of the fifth magnetic field sensor; Step A52: Move the artificial object structure scanning device along A second axis of the fifth magnetic field sensor rotates at least 180°, and the fifth magnetic field sensor performs magnetic field measurement during the rotation to obtain a second axis measurement value sequence of the fifth magnetic field sensor, wherein the The first axis of the fifth magnetic field sensor is non-parallel to the second axis of the fifth magnetic field sensor; and Step A53: the first axis measurement sequence of the fifth magnetic field sensor and the fifth magnetic field induction The second axis measurement value sequence of the instrument calculates the magnetic field measurement value of the fifth instrument; wherein the measurement of the instrument magnetic field by the sixth magnetic field sensor includes the following steps: Step A61: Move the man-made structure scanning device along A first axis of the sixth magnetic field sensor is rotated at least 180°, and the sixth magnetic field sensor performs magnetic field measurement during the rotation to obtain a sequence of measurement values for the first axis of the sixth magnetic field sensor; step A62 : The man-made structure scanning device is rotated at least 180° along a second axis of the sixth magnetic field sensor, and the sixth magnetic field sensor performs magnetic field measurement during the rotation to obtain a sixth magnetic field induction The second axis measurement value sequence of the sixth magnetic field sensor, wherein the first axis of the sixth magnetic field sensor is not parallel to the second axis of the sixth magnetic field sensor; and Step A63: the sixth magnetic field sensor first The axis measurement value sequence and the second axis measurement value sequence of the sixth magnetic field sensor calculate the sixth instrument magnetic field measurement value; wherein the seventh magnetic field sensor measures the instrument magnetic field, including the following steps: Step A71 : The man-made structure scanning device is rotated at least 180° along a first axis of the seventh magnetic field sensor, and a seventh magnetic field sensor is measured by the seventh magnetic field sensor during the rotation. Measured value sequence of the first axis of the device; Step A72: Rotate the man-made structure scanning device at least 180° along a second axis of the seventh magnetic field sensor, and measure a seventh magnetic field by the seventh magnetic field sensor during the rotation. The second axis measurement sequence of the magnetic field sensor, wherein the first axis of the seventh magnetic field sensor is not parallel to the second axis of the seventh magnetic field sensor; and step A73: the seventh magnetic field sensor The first axis measurement value sequence and the second axis measurement value sequence of the seventh magnetic field sensor calculate the seventh instrument magnetic field measurement value; wherein the eighth magnetic field sensor measures the instrument magnetic field, including the following steps: Step A81: Rotate the man-made structure scanning device at least 180° along a first axis of the eighth magnetic field sensor, and perform magnetic field measurement by the eighth magnetic field sensor during the rotation to obtain an eighth Sequence of measuring values of the first axis of the magnetic field sensor; Step A82: Rotate the artificial object structure scanning device at least 180° along a second axis of the eighth magnetic field sensor, and be induced by the eighth magnetic field during the rotation The second axis of the eighth magnetic field sensor is measured by the magnetic field sensor to obtain a sequence of measurement values for the second axis of the eighth magnetic field sensor, wherein the first axis of the eighth magnetic field sensor is non-parallel to the second axis of the eighth magnetic field sensor; And step A83: calculating the eighth instrument magnetic field measurement value from the eighth magnetic field sensor first axis measurement value sequence and the eighth magnetic field sensor second axis measurement value sequence. The artificial object structure scanning method described in claim 7, wherein the first axis of the first magnetic field sensor is orthogonal to the second axis of the first magnetic field sensor, and the second magnetic field sensor The first axis of the device is orthogonal to the second axis of the second magnetic field sensor, the first axis of the third magnetic field sensor is orthogonal to the second axis of the third magnetic field sensor, the The first axis of the fourth magnetic field sensor is orthogonal to the second axis of the fourth magnetic field sensor, the first axis of the fifth magnetic field sensor and the second axis of the fifth magnetic field sensor Orthogonal, the first of the sixth magnetic field sensor The axis is orthogonal to the second axis of the sixth magnetic field sensor, the first axis of the seventh magnetic field sensor is orthogonal to the second axis of the seventh magnetic field sensor, and the eighth magnetic field sensor The first axis is orthogonal to the second axis of the eighth magnetic field sensor. The artificial object structure scanning method as described in item 6 of the scope of patent application, wherein the step B includes the following steps: calculating from the position sequence and the first magnetic field measurement value sequence minus the first instrument magnetic field measurement value Obtain a first magnetic field measurement value distribution; calculate a second magnetic field measurement value distribution from the position sequence and the second magnetic field measurement value sequence subtracting the second instrument magnetic field measurement value; from the position sequence and The third magnetic field measurement value sequence is subtracted from the third instrument magnetic field measurement value to calculate a third magnetic field measurement value distribution; the fourth instrument is subtracted from the position sequence and the fourth magnetic field measurement value sequence A fourth magnetic field measurement value distribution is calculated from the magnetic field measurement value; a fifth magnetic field measurement value distribution is calculated from the position sequence and the fifth magnetic field measurement value sequence minus the fifth instrument magnetic field measurement value; A sixth magnetic field measurement value distribution is calculated from the position sequence and the sixth magnetic field measurement value sequence subtracting the sixth instrument magnetic field measurement value; and the seventh magnetic field measurement value sequence is subtracted from the position sequence and the seventh magnetic field measurement value sequence. Calculate a seventh magnetic field measurement value distribution from the seventh instrument magnetic field measurement value; subtract the eighth instrument magnetic field measurement value from the position sequence and the eighth magnetic field measurement sequence to calculate an eighth magnetic field Measurement value distribution; and from the first magnetic field measurement value distribution, the second magnetic field measurement value distribution, the third magnetic field measurement value distribution, the fourth magnetic field measurement value distribution, and the fifth magnetic field measurement value distribution The distribution, the sixth magnetic field measurement value distribution, the seventh magnetic field measurement value distribution, and the eighth magnetic field measurement value distribution are used to calculate the magnetic field variation distribution. For example, the artificial object structure scanning method described in any one of items 1 to 9 of the scope of patent application, wherein the magnetic field variation distribution is a magnetic field gradient vector distribution, a magnetic field gradient vector size distribution, and a magnetic field The distribution of a horizontal component of a gradient vector or a level of a magnetic field gradient vector Component size distribution. For example, the scanning method for man-made structures according to any one of items 1 to 9 of the scope of patent application, wherein the positioning portion includes one selected from the group consisting of: a distance measuring wheel, a distance measuring instrument, A ruler, a tape measure, a laser positioning device, an ultrasonic positioning device, a radar wave positioning device, a GPS positioning device and an image positioning device. An artificial object structure scanning device, including: a magnetic field sensor, wherein the magnetic field sensor includes a first magnetic field sensor, a second magnetic field sensor, a third magnetic field sensor, and a fourth magnetic field sensor. The first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are arranged on a non-coplanar plane; wherein the artificial object structure scanning device is used to implement the scope of the patent application The man-made structure scanning method described in any one of items 1 to 5. The artificial object structure scanning device as described in claim 12, wherein the magnetic field sensor further includes a fifth magnetic field sensor, a sixth magnetic field sensor, a seventh magnetic field sensor, and an eighth magnetic field sensor The man-made object structure scanning device is used to implement the man-made object structure scanning method as described in any one of the 6th to 9th items in the scope of the patent application. The artificial object structure scanning device as described in the scope of patent application, wherein the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, the fourth magnetic field sensor, and the fifth magnetic field The sensor, the sixth magnetic field sensor, the seventh magnetic field sensor, and the eighth magnetic field sensor are located at the eight vertices of a parallelepiped, the eight vertices of a rectangular parallelepiped, or the eight vertices of a regular hexahedron, respectively vertex. The artificial object structure scanning device as described in item 12 of the scope of patent application, wherein the first magnetic field sensor, the second magnetic field sensor, the third magnetic field sensor, and the fourth magnetic field sensor are divided into Do not lie at the four vertices of a regular triangular pyramid or the four vertices of a regular tetrahedron. The scanning device for man-made structures as described in item 12 of the scope of patent application further includes a positioning part. As described in item 16 of the scope of patent application, the man-made structure scanning device, wherein the positioning part includes one selected from the following groups: a distance measuring wheel, a distance measuring instrument, a ruler, a tape measure, and a Laser positioning device, an ultrasonic positioning device, a radar wave positioning device, a GPS positioning device and an image positioning device.

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